Evaluation method of thermal vacuum environmental adaptability of elements and components for spacecraft

Abstract

The invention relates to the technical field of the evaluation of thermal vacuum environmental adaptability, and discloses an evaluation method of the thermal vacuum environmental adaptability of elements and components for a spacecraft. The method comprises the following steps: S1, performing stress analysis to the thermal vacuum environment of the elements and components for the spacecraft, so as to fix the vacuum stress, thermal stress and electric stress of thermal vacuum environmental ground tests, S2, fixing the cycle index of the thermal vacuum environmental ground tests, S3, performing thermal vacuum ground testing to the elements and components for the spacecraft according to test conditions fixed through S1 and S2, so as to judge whether samples of the elements and components for the spacecraft are qualified, and S4, evaluating that the thermal vacuum environmental adaptability of the elements and components meets task requirements if the quantity of unqualified samples is smaller than or equal to the acceptance number regulated in a sampling scheme, or evaluating that the thermal vacuum environmental adaptability of the elements and components does not meet the task requirements. The method can rapidly and accurately evaluate performances of the elements and components for the spacecraft under the thermal vacuum environment, and provides a basis for reasonably selecting the elements and components for the spacecraft.

Description

technical field [0001] The invention relates to the technical field of thermal vacuum environment adaptability evaluation, in particular to a method for evaluating the thermal vacuum environment adaptability of spacecraft components. Background technique [0002] There have been many reports of satellite mission failures caused by component failures in thermal vacuum environments. For example, the International Ultraviolet Explorer (IUE) launched in 1978, due to thermal design errors and other reasons, made the 4K resolution of the computer on this ultraviolet detector satellite and 8K memory fragmentation; the Japanese Broadcasting Experimental Satellite (BSE) launched in 1978, because of the high-voltage arc discharge of the traveling wave tube power supply, caused the protection circuit to fail, and could not supply power to the traveling wave tube, resulting in the end of the life of the satellite in 1980; Land satellite (Landsat-4), 2 of the 4 solar cell arrays have dam...

AI Technical Summary

Problems solved by technology

[0004] The temperature cycle stress of spacecraft components during the mission is mainly modulated by the spacecraft’s periodic entry into the shadow area of ​​the earth. When the mission period of the model is long, if the thermal vacuum test is carried out on the components at a ratio of 1:1, the number of test cycles Many, not only time-consuming, but also high cost and inaccurate results

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