Testing equipment

Abstract

This invention provides an inspection device, comprising a gripping mechanism including grippers for gripping devices; multiple grippers are interconnected and movably arranged; an inspection mechanism including an inspection disk movably arranged, the inspection disk being provided with a clamping component and an inspection component, the clamping component being used to clamp the device; and the inspection component being used to monitor the device. This invention solves the problem of low inspection efficiency for electronic components in the prior art.

Description

Technical Field

[0001] This invention relates to the field of electrical component inspection, and more specifically, to an inspection device. Background Technology

[0002] With the development and advancement of surface mount technology for electronic circuits, the variety and quantity of electronic components are increasing. Individual components such as high-frequency transformers, chokes, and filters have advantages such as small size and relatively light weight. These items are generally inspected by manual handling.

[0003] However, while manual inspection is generally easier, it becomes increasingly time-consuming and energy-intensive when dealing with large quantities or high sampling rates. Furthermore, manual material inspection is susceptible to variations in skill level, physical condition, and mental state, making it prone to occasional missed inspections and quality issues. These problems, carried over to subsequent production lines, are difficult for assembly personnel to detect, posing a potential hazard. Summary of the Invention

[0004] The main objective of this invention is to provide an inspection device to solve the problem of low inspection efficiency of electronic components in the prior art.

[0005] To achieve the above objectives, according to one aspect of the present invention, an inspection device is provided, comprising: a gripping mechanism including grippers for gripping devices; the grippers are multiple and interconnected, and the multiple grippers are movably disposed; an inspection mechanism including an inspection disc movably disposed, the inspection disc being provided with a clamping component and an inspection component, the clamping component being used to clamp the device; and the inspection component being used to monitor the device.

[0006] Furthermore, the gripping mechanism also includes: a fixed arm, a connecting arm, the connecting arm being rotatably connected to the fixed arm, and grippers being mounted on the fixed arm.

[0007] Furthermore, the gripping mechanism includes a connecting part, which is connected to the connecting arm, and the grippers are disposed on the connecting part.

[0008] Furthermore, the connecting part is rotatably connected to the connecting arm; and / or, there are multiple grippers, which are connected to the connecting part at intervals.

[0009] Furthermore, the gripper includes: a first link, one end of which is connected to the connecting portion; and a second link, one end of which is connected to the end of the first link away from the connecting portion, and the other end of which is used to connect to the device.

[0010] Furthermore, the second link includes: a first rod body, one end of which is rotatably connected to the first link; and a second rod body, one end of which is connected to the first link, and the other end of which is used to connect to a device.

[0011] Furthermore, there are two second links, with the second rods of the two second links spaced apart; the distance between the second rods of the two second links is adjustable to grip the device by driving the second rods of the two second links; or, the extension direction of the second rods of the two second links is parallel to the extension direction of the first link, and both second links are used to be inserted into the device.

[0012] Furthermore, the inspection disc is rotatably mounted; and / or, the inspection disc has a mounting plane for mounting the clamp components and the inspection components, the mounting plane being annular in structure.

[0013] Furthermore, the inspection tray includes a first inspection tray and a second inspection tray, which are disposed on the ground at a distance from each other to form an inspection space between them for the movement of the grippers. The first and second inspection trays are respectively provided with clamping components and inspection components.

[0014] Furthermore, the inspection plate includes multiple inspection sections connected in sequence, each inspection section including a first inspection section for setting up clamping components and a second inspection section for setting up inspection components; wherein, there are multiple first inspection sections.

[0015] Applying the technical solution of this invention, the inspection equipment in this embodiment includes a gripping mechanism, which includes grippers for gripping devices; there are multiple grippers, which are interconnected and movably arranged; an inspection mechanism includes an inspection disk, which is movably arranged, and a clamping component and an inspection component are provided on the inspection disk. The clamping component is used to clamp the devices; the inspection component is used to monitor the devices. With the above arrangement, multiple grippers grip multiple devices. During the movement of the multiple devices by the grippers, the inspection component on the inspection mechanism performs inspection operations on the multiple devices. The clamping component is connected or fixed to the contacts on the multiple devices as needed to cooperate with the inspection operation of the inspection mechanism. In this way, the inspection of multiple devices is completed during the movement of multiple devices, improving the inspection efficiency and solving the problem of low inspection efficiency of electronic components in the prior art. Attached Figure Description

[0016] The accompanying drawings, which form part of this application, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an undue limitation of the invention. In the drawings:

[0017] Figure 1A schematic diagram of an embodiment of the testing equipment of the present invention is shown;

[0018] Figure 2 A schematic diagram of the gripping mechanism of the inspection device of the present invention is shown;

[0019] Figure 3 A schematic diagram of the gripper of the gripping mechanism of the inspection device of the present invention is shown;

[0020] Figure 4 A schematic diagram of another embodiment of the gripper of the gripping mechanism of the inspection device of the present invention is shown;

[0021] Figure 5 A schematic diagram of the structure of several components applicable to the testing equipment of the present invention is shown;

[0022] Figure 6 A schematic diagram of one embodiment of a device suitable for the testing equipment of the present invention is shown;

[0023] Figure 7 A schematic diagram of another embodiment of a device suitable for the testing equipment of the present invention is shown.

[0024] The above figures include the following reference numerals:

[0025] 10. Gripping mechanism; 100. Component; 1. Gripper; 11. First link; 12. Second link; 121. First rod body; 122. Second rod body; 20. Inspection mechanism; 2. Inspection disc; 21. Fixture component; 22. Inspection component; 23. Inspection section; 231. First inspection section; 232. Second inspection section; 3. Fixed arm; 4. Connecting arm; 5. Inspection space; 6. Connecting part. Detailed Implementation

[0026] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0027] See Figures 1 to 7The inspection equipment in this embodiment includes: a gripping mechanism 10, which includes grippers 1 for gripping devices 100; there are multiple grippers 1 connected to each other, and all grippers 1 are movably arranged; and an inspection mechanism 20, which includes an inspection disk 2, which is movably arranged. The inspection disk 2 is provided with a clamping component 21 and an inspection component 22. The clamping component 21 is used to clamp the devices 100; and the inspection component 22 is used to monitor the devices 100. With the above arrangement, multiple grippers 1 grip multiple devices 100. During the movement of the multiple devices 100 by the grippers 1, the inspection component 22 on the inspection mechanism 20 performs inspection operations on the multiple devices 100. The clamping component 21 can be connected or fixed to the contacts on the multiple devices 100 as needed to cooperate with the inspection operation of the inspection mechanism 20. In this way, the inspection of multiple devices 100 is completed during the movement of the multiple devices 100, improving the inspection efficiency and solving the problem of low inspection efficiency of electronic components in the prior art.

[0028] In the inspection equipment of this embodiment, the gripping mechanism 10 further includes: a fixed arm 3 and a connecting arm 4, the connecting arm 4 being rotatably connected to the fixed arm 3, and the gripper 1 being disposed on the fixed arm 3. In this way, it is possible to move multiple devices 100, and by rotating the connecting arm 4, the multiple devices 100 can be moved up and down, thereby completing the inspection work of the devices 100 in the process.

[0029] In the inspection equipment of this embodiment, the gripping mechanism 10 includes a connecting part 6, which is connected to the connecting arm 4, and the gripper 1 is disposed on the connecting part 6.

[0030] In the inspection device of this embodiment, the connecting part 6 is rotatably connected to the connecting arm 4; a plurality of grippers 1 are connected to the connecting part 6 at intervals.

[0031] Specifically, the connecting part 6 has a rod-shaped structure, and multiple grippers 1 are connected side by side to the connecting part 6 along its extension direction. In this way, multiple devices 100 can be grasped and placed in an orderly manner, and the inspection mechanism 20 can also easily inspect the devices 100 without the multiple devices 100 blocking each other when moving.

[0032] In the inspection device of this embodiment, the gripper 1 includes: a first connecting rod 11, one end of which is connected to the connecting part 6; and a second connecting rod 12, one end of which is connected to the end of the first connecting rod 11 away from the connecting part 6, and the other end of which is used to connect to the device 100.

[0033] Specifically, the gripper is connected to the connecting part 6 by the first link 11, which simplifies the structure of the gripper 1 and reduces the weight of multiple grippers 1. This allows for more grippers 1 to be set on the gripping mechanism 10, thereby improving work efficiency.

[0034] In the inspection equipment of this embodiment, the second connecting rod 12 includes: a first rod body 121, one end of which is rotatably connected to the first connecting rod 11; and a second rod body 122, one end of which is connected to the first connecting rod 11, and the other end of which is used to connect to the device 100. This simplifies the structure of the gripper 1, thereby reducing the weight of multiple grippers 1, allowing for more grippers 1 to be installed on the gripping mechanism 10, and improving operational efficiency.

[0035] In the testing device of this embodiment, there are two second connecting rods 12, and the second rod bodies 122 of the two second connecting rods 12 are arranged at intervals. The distance between the second rod bodies 122 of the two second connecting rods 12 is adjustable so as to clamp the device 100 by driving the second rod bodies 122 of the two second connecting rods 12. Alternatively, the extension direction of the second rod bodies 122 of the two second connecting rods 12 is parallel to the extension direction of the first connecting rod 11, and the two second connecting rods 12 are used to be inserted into the device 100.

[0036] Specifically, depending on the structure of the device 100, different types of grippers 1 can be adopted, and different gripping actions can be achieved through different structures of the second link 12, thereby satisfying the gripping and moving operations of different devices 100.

[0037] In the inspection equipment of this embodiment, the inspection disc 2 is rotatably mounted; and / or, the inspection disc 2 has a mounting plane for mounting the clamp component 21 and the inspection component 22, and the mounting plane has an annular structure. With the above arrangement, rotating the inspection disc 2 is more convenient, thereby making the structure of each part of the inspection disc 2 more uniform and facilitating the assembly and replacement of various devices on the inspection disc 2.

[0038] In order to improve the efficiency and accuracy of inspection, in the inspection equipment of this embodiment, the inspection plate 2 includes a first inspection plate 2 and a second inspection plate 2. The first inspection plate 2 and the second inspection plate 2 are arranged on the ground at a distance to form an inspection space 5 for the gripper 1 to move between the first inspection plate 2 and the second inspection plate 2.

[0039] In the inspection equipment of this embodiment, the inspection tray 2 includes a plurality of inspection sections 23 connected in sequence. Each inspection section 23 includes a first inspection section 231 for mounting a clamping component 21 and a second inspection section 232 for mounting inspection components 22; wherein there are multiple first inspection sections 231. The clamping component 21 and the inspection component 22 are respectively mounted on the first inspection tray 2 and the second inspection tray 2. This enables standardization of the device and saves production costs.

[0040] In some embodiments, the inspection equipment is designed to conform to the principle of AOI (Automated Optical Inspection) testing equipment for observing PCB boards, and integrates the four processes of material gripping, appearance inspection, performance testing, and material return. The multi-grip combination robotic arm replaces the manual arm for gripping, and can automatically control the start and stop of each step of the operation, which is convenient for batch inspection of some small materials.

[0041] In some embodiments, the inspection equipment, referencing existing observation equipment and industrial robots, provides a mode that integrates the functions of both, optimizing operation and achieving automation. The workflow involves first using a robot to grasp the object, then measuring it with a testing device, and finally inserting it onto a flat sponge mat.

[0042] An embodiment of the present invention is described below:

[0043] The inspection equipment utilizes technology to provide clamps suitable for small material sizes. Depending on the material placement, there are straight-insertion and double-hook types, with multiple clamps arranged in a row. The row of clamps is operated by a robotic arm, equipped with a vision system to inspect and position the clamps at the sample location. Individual small materials weigh between 14g and 68g, and 10 clamps combined weigh between 140g and 680g (the number of clamps can be adjusted for flexible insertion). The main components of the gripping mechanism 10 include a fixed arm 3 and a connecting arm 4. A rotating part is located between the fixed arm 3 and the connecting arm 4, controlling the overall rotational movement. The fixed arm 3 and the connecting arm 4 work together to control the rotation and movement of the end-effector gripper 1. The connecting part 6 realizes the pitch and swing axis movements. The inspection mechanism 20, combined with an embedded control system and a sophisticated sensing system, along with the end-effector vision inspection device (i.e., inspection component 22), can accurately locate the position area of ​​the device 100, and the back-and-forth movement process is freely controlled.

[0044] The inspection mechanism 20 consists of two opposing inspection trays 2, each divided into four inspection sections 23. One inspection section 23 is equipped with a planar scanner (i.e., inspection component 22), while the other three inspection sections 23 are equipped with two pin clamps (i.e., clamp components 21), suitable for clamping small materials (such as high-frequency transformers) with six pins at both the input and output ends. The working process is as follows: the uppermost planar scanner first scans the downward-moving individual device 100 to check its appearance; the pin clamps at the left and right ends clamp the corresponding pins to test inductance, resistance, etc. (the left and right movement order can be adjusted); then the lowermost pin clamp clamps the remaining pins for testing (if the number of input and output pins at the left and right ends does not match, some pin clamps can be added or removed). Compared to manual visual inspection, the time required for a single device 100 is approximately 30 to 40 seconds. Using the inspection tray 2, which automatically completes the entire operation, improves time efficiency, ensures accuracy, and saves the interval time between the inspection of multiple devices 100.

[0045] After testing the entire array of components 100, insert components 100 into the flat sponge pad.

[0046] As can be seen from the above description, the embodiments of the present invention achieve the following technical effects:

[0047] The inspection equipment in this embodiment includes a gripping mechanism 10, which includes grippers 1 for gripping devices 100. Multiple grippers 1 are interconnected and movably arranged. An inspection mechanism 20 includes an inspection disk 2, which is movably arranged. The inspection disk 2 is equipped with a clamping component 21 and an inspection component 22. The clamping component 21 is used to clamp the devices 100, and the inspection component 22 is used to monitor the devices 100. With this configuration, multiple grippers 1 grip multiple devices 100. During the movement of the multiple devices 100 by the grippers 1, the inspection component 22 on the inspection mechanism 20 performs inspection operations on the multiple devices 100. The clamping component 21 can be connected or fixed to the contacts on the multiple devices 100 as needed to cooperate with the inspection operation of the inspection mechanism 20. Thus, the inspection of multiple devices 100 is completed during the movement of the devices 100, improving inspection efficiency and solving the problem of low inspection efficiency for electronic components in the prior art.

[0048] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0049] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps described in these embodiments do not limit the scope of this application. It should also be understood that, for ease of description, the dimensions of the various parts shown in the drawings are not drawn to actual scale. Techniques, methods, and devices known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and devices should be considered part of the specification. In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters in the following drawings denote similar items; therefore, once an item is defined in one drawing, it need not be further discussed in subsequent drawings.

[0050] In the description of this application, it should be understood that the orientation or positional relationship indicated by directional terms such as "front, back, up, down, left, right", "horizontal, vertical, horizontal" and "top, bottom" is usually based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this application and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this application; the directional terms "inner" and "outer" refer to the inner and outer contours relative to the outline of each component itself.

[0051] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.

[0052] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore cannot be construed as limiting the scope of protection of this application.

[0053] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. An inspection device, characterized in that, include: The gripping mechanism (10) includes grippers (1) for gripping the device (100); there are multiple grippers (1), the multiple grippers (1) are interconnected, and the multiple grippers (1) are movably arranged; Inspection mechanism (20) includes inspection plate (2), which is movably arranged. The inspection plate (2) is provided with clamping component (21) and inspection component (22). The clamping component (21) is used to clamp the device (100). The inspection component (22) is used to monitor the device (100). The inspection plate (2) includes a first inspection plate and a second inspection plate, which are arranged at intervals to form an inspection space (5) between the first inspection plate and the second inspection plate for the gripper (1) to move; the first inspection plate and the second inspection plate are respectively provided with the clamping component (21) and the inspection component (22); the inspection component (22) is a planar scanning instrument.

2. The testing equipment according to claim 1, characterized in that, The gripping mechanism (10) further includes: Fixed arm (3); Connecting arm (4), which is rotatably connected to the fixed arm (3), and gripper (1) is disposed on the connecting arm (4).

3. The testing equipment according to claim 2, characterized in that, The gripping mechanism (10) includes a connecting part (6), which is connected to the connecting arm (4), and the gripper (1) is disposed on the connecting part (6).

4. The testing equipment according to claim 3, characterized in that, The connecting part (6) is rotatably connected to the connecting arm (4); and / or, The plurality of grippers (1) are connected to the connecting portion (6) at intervals; and / or, The connecting part (6) is a rod-shaped structure.

5. The testing equipment according to claim 3, characterized in that, The gripper (1) includes: The first link (11) has one end connected to the connecting part (6); The second link (12) has one end connected to the end of the first link (11) away from the connecting part (6), and the other end of the second link (12) is used to connect to the device (100).

6. The testing equipment according to claim 5, characterized in that, The second link (12) includes: The first rod (121) has one end rotatably connected to the first connecting rod (11); The second rod (122) has one end connected to the first rod (121) and the other end connected to the device (100).

7. The testing equipment according to claim 6, characterized in that, There are two second connecting rods (12), and the second rod bodies (122) of the two second connecting rods (12) are arranged at intervals; wherein, The distance between the second rod bodies (122) of the two second links (12) is adjustable to clamp the device (100) by driving the second rod bodies (122) of the two second links (12); or, The extension direction of the second rod body (122) of the two second connecting rods (12) is parallel to the extension direction of the first connecting rod (11), and the two second rod bodies (122) are both used to be inserted into the device (100).

8. The testing equipment according to claim 1, characterized in that, The inspection disc (2) is rotatably mounted; and / or, The inspection plate (2) has a mounting plane for setting the clamp component (21) and the inspection component (22), and the mounting plane is an annular structure.

9. The testing equipment according to any one of claims 1 to 8, characterized in that, The inspection plate (2) includes a plurality of inspection sections (23) connected in sequence. The plurality of inspection sections (23) include a first inspection section (231) for setting the clamp component (21) and a second inspection section (232) for setting the inspection component (22); wherein, there are a plurality of first inspection sections (231).

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