Probe and probe assembly

Abstract

This invention discloses a probe and probe assembly. The tester has a connector, which includes a measured signal interface and a plug-in signal interface. The probe comprises a probe body and a circuit board. The probe body has a first end and a second end. The first end of the probe body has a coaxial interface and a first slot. The circuit board is disposed within the probe body and is located on one side of the first slot, with conductive contacts corresponding to the position of the first slot. The conductive contacts are arranged on at least one side of the circuit board. When the probe is inserted into the connector, the conductive contacts are electrically connected to the plug-in signal interface to enable the circuit board to obtain power from the tester and / or interact with the tester. The coaxial interface is electrically connected to the circuit board and is used to connect to the measured signal interface when the probe is inserted into the connector to transmit the measured signal to the tester. This invention solves the problems of large probe space occupation and difficult assembly.

Description

Technical Field

[0001] This invention relates to the field of testing instrument technology, and specifically to a probe and probe assembly. Background Technology

[0002] Currently, when transmitting multiple test signals from the device under test, existing probes often require multiple independent wiring structures such as spring pins to be set up for each of the multiple test signals. However, probes with multiple wiring structures set up in a centralized manner have the problems of occupying a large space and being difficult to assemble.

[0003] Furthermore, using spring pins can easily lead to problems such as unreliable contact and current limitation during contact. Summary of the Invention

[0004] One of the main objectives of this invention is to provide a probe that solves the problems of large space occupation and difficult assembly.

[0005] To achieve the above objectives, the present invention provides a probe for use in a testing instrument, the testing instrument having a connector, the connector having a measured signal interface and a plug-in signal interface, the probe comprising:

[0006] The probe body has a first end and a second end, the first end of which is provided with a coaxial interface and a first slot; and

[0007] A circuit board is disposed within the probe body. The circuit board extends out from one side of the first slot and has conductive contacts at positions corresponding to the first slot. The conductive contacts are arranged on at least one side of the circuit board.

[0008] The conductive contact is used to electrically connect with the plug signal interface when the probe is inserted into the plug interface, so that the circuit board can obtain power from the tester and / or interact with the tester;

[0009] The coaxial interface is electrically connected to the circuit board and is used to connect to the signal under test interface when the probe is inserted into the interface, so as to transmit the signal under test to the test instrument.

[0010] In one embodiment, the probe further includes a locking structure, the probe body is provided with a locking hole, and the locking structure is telescopically disposed in the locking hole to switch between a locked position and an unlocked position along the locking hole;

[0011] In the locked position, the locking structure extends out of the locking hole to lock the probe into the connector.

[0012] In the unlocked position, the locking structure retracts into the locking hole to separate the probe from the connector.

[0013] In one embodiment, the locking structure is provided with a manipulator for moving the locking structure between a locked position and an unlocked position.

[0014] In one embodiment, an elastic element is provided within the probe body, and the elastic element is connected to the locking structure to drive the locking structure to reset and switch from the unlocked position to the locked position.

[0015] In one embodiment, there are two locking structures, which are disposed opposite to each other on both sides of the probe body, and the elastic element is connected between the two locking structures.

[0016] In one embodiment, a fixing position is provided on the inner side of each of the two locking structures, and there are two elastic members, which correspond to the fixing positions. The two elastic members are respectively disposed on both sides of the circuit board and abut against the corresponding fixing positions.

[0017] In one embodiment, a fixing position is provided on the inner side of both locking structures, a through hole is provided in the middle of the circuit board, and the elastic element passes through the through hole and is connected to the fixing position at both ends respectively.

[0018] In one embodiment, the circuit board has a first connection end and a second connection end opposite to each other, the first slot surrounds the first connection end of the circuit board, and the first connection end of the circuit board is flush with the first end of the probe body.

[0019] In one embodiment, the second end of the probe body is provided with a clamping structure and a signal cable. The clamping structure is provided with a slot corresponding to the first slot. The circuit board is at least partially located in the slot and electrically connected to the signal cable.

[0020] In one embodiment, the circuit board is disposed on one side of the coaxial interface to make the probe body flat.

[0021] The second main objective of this invention is to provide a probe assembly that solves the problems of probes occupying a large space and being difficult to assemble.

[0022] To achieve the above objectives, the present invention provides a probe assembly, including a probe as described in one of the objectives of the present invention and a connection interface. One end of the probe is inserted into the interface of a test instrument; the other end of the probe is provided with a signal cable and coupled to the connection interface via the signal cable. The connection interface is electrically connected to the device under test and is used to transmit test signals to the test instrument.

[0023] Compared with the prior art, the present invention has the following beneficial effects:

[0024] 1. A coaxial interface and a first slot are provided at one end of the probe body. A circuit board is provided inside the probe body. The circuit board is located in the first slot of the probe body and conductive contacts are provided at the corresponding positions of the first slot. Data interaction between the device under test and the tester is realized by connecting the circuit board to the interface. The circuit board and the coaxial interface are both located inside the probe body, which can avoid the problem of too many interfaces and inconvenience of use caused by separate settings. It effectively simplifies the structure of the probe and avoids the problem of large probe space occupation and difficult processing and assembly caused by setting multiple wiring structures for multiple test signals of the device under test.

[0025] 2. For each of the multiple test signals of the device under test, multiple relatively independent conductive contacts are respectively set. The multiple conductive contacts are arranged on at least one side of the circuit board to expand the arrangement range of the conductive contacts and avoid mutual interference in data transmission. The conductive contacts are used to electrically connect with the plug signal interface when the probe is inserted into the plug interface, so that the circuit board can obtain power from the test instrument and / or interact with the test instrument to achieve reliable data interaction, avoid the problems of connection difficulties and inconvenient operation due to too many wiring structures, and avoid the problem of excessive space occupied by the probe due to the need to set an additional power supply device for the probe.

[0026] 3. The test signal is transmitted to the tester through the coaxial interface, and the tester receives and outputs multiple test signals from the device under test. Attached Figure Description

[0027] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0028] Figure 1 An exploded view of an embodiment of the probe of the present invention;

[0029] Figure 2 This is a schematic diagram of the structure of one embodiment of the probe assembly of the present invention;

[0030] Figure 3 An exploded view of an embodiment of the coaxial interface of the present invention;

[0031] In the diagram: 100, probe body; 101, first slot; 1021, locking hole; 1022, operating hole; 103, clamping structure; 1031, first housing; 1032, second housing; 1033, locking fastener; 1041, first package; 1042, second package; 105, baffle; 106, second slot; 200, circuit board; 201, through hole; 202, connecting hole; 300, coaxial interface; 301, pin; 302, insulating kit; 303, connecting sleeve; 3031, insertion position; 304, sleeve; 400, locking structure; 401, limiting protrusion; 402, operating part; 403, fixed position; 4031, connecting shaft; 500, elastic element; 600, signal cable; 700, connection interface.

[0032] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0033] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present invention.

[0034] It should be noted that if all directional indications in the embodiments of the present invention are only used to explain the relative positional relationship and movement of each component in a specific posture, the directional indications will also change accordingly if the specific posture changes.

[0035] In this invention, the use of terms such as "first," "second," etc., is for descriptive purposes only and should not be construed as indicating or implying their relative importance, or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. If the description in this invention refers to "A and / or B," it indicates that solution A or solution B is included, or that solutions A and B are included. Furthermore, the technical solutions of various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this invention.

[0036] This invention provides a probe and a probe assembly.

[0037] Reference Figures 1 to 3The present invention provides a probe for use in a testing instrument. The testing instrument has a plug interface, which includes a test signal interface and a plug signal interface. The probe includes a probe body 100 and a circuit board 200.

[0038] The probe body has a first end and a second end, and the first end of the probe body 100 is provided with a coaxial interface 300 and a first slot 101.

[0039] The circuit board 200 is disposed inside the probe body 100. The circuit board 200 extends out from one side of the first slot 101 and is provided with conductive contacts corresponding to the position of the first slot 101. The conductive contacts are arranged on at least one side of the circuit board.

[0040] The conductive contact is used to electrically connect with the plug signal interface when the probe is inserted into the plug interface, so that the circuit board can obtain power from the tester and / or interact with the tester;

[0041] The coaxial interface 300 is electrically connected to the circuit board 200 and is used to connect to the signal under test interface when the probe is inserted into the interface, so as to transmit the signal under test to the test instrument.

[0042] It is understandable that the circuit board 200 is positioned on one side of the first slot 101. Specifically, the circuit board 200 can be positioned on any side of the coaxial interface 300. Multiple conductive contacts are provided for multiple measured signals, and these conductive contacts are arranged on one or both sides of the circuit board 200, or other multiple sides, to avoid mutual interference between multiple signals during data interaction. The probe achieves electrical connection with the tester's plug-in signal interface through the circuit board 200, and achieves multi-channel data interaction through the conductive contacts of the circuit board 200. This avoids problems such as excessive probe size due to the use of spring-loaded probe structures and unstable connection due to insecure probe insertion.

[0043] A coaxial interface 300 and a first slot 101 are provided at one end of the probe body 100. A circuit board 200 is provided inside the probe body 100. The circuit board 200 is located in the first slot 101 of the probe body 100 and conductive contacts are provided at the corresponding positions of the first slot 101. Data interaction between the device under test and the tester is realized by connecting the circuit board 200 to the interface. The circuit board 200 and the coaxial interface 300 are both located inside the probe body, which avoids the problem of too many interfaces and inconvenience caused by separate settings. It effectively simplifies the probe structure and avoids the problems of large probe space occupation and difficult processing and assembly caused by setting multiple wiring structures for multiple test signals of the device under test.

[0044] For each of the multiple test signals of the device under test, multiple relatively independent conductive contacts are respectively set. The multiple conductive contacts are arranged on at least one side of the circuit board 200 to expand the arrangement range of the conductive contacts and avoid mutual interference in data transmission. The conductive contacts are used to electrically connect with the plug signal interface when the probe is inserted into the plug interface, so that the circuit board can obtain power from the test instrument and / or interact with the test instrument to achieve reliable data interaction, avoid the problems of connection difficulties and inconvenient operation due to too many wiring structures, and avoid the problem of excessive space occupied by the probe due to the need to set an additional power supply device for the probe.

[0045] The test signal is transmitted to the test instrument via the coaxial interface 300, and the test instrument receives and outputs multiple test signals from the device under test.

[0046] In one embodiment, the probe further includes a locking structure 400, the probe body 100 is provided with a locking hole 1021, and the locking structure 400 is telescopically disposed in the locking hole 1021 to switch between a locked position and an unlocked position along the locking hole 1021.

[0047] When in the locked position, the locking structure 400 extends out of the locking hole 1021 to lock the probe into the connector.

[0048] In the unlocked position, the locking structure 400 retracts into the locking hole 1021 to separate the probe from the connector.

[0049] A locking structure 400 is provided on the probe to lock it in the locking position to the probe interface, making it compatible with different tester interfaces. This prevents the tester interface and probe from becoming loose or even experiencing poor contact due to long-term use, which could affect signal transmission. The locking structure 400 also helps to prevent loosening of the connection due to external impacts.

[0050] Specifically, the locking structure 400 can be housed within the probe body 100, and a locking hole 1021 can be provided on the probe body 100 at a position corresponding to the locking structure 400, such that the locking hole 1021 is formed on the side wall surface of the probe body 100. Corresponding to the locking hole 1021, a limiting protrusion 401 or similar element can be provided as a locking part at one end of the locking structure 400 near the first slot 101. Furthermore, the diameter of the locking hole 1021 can be set to be no smaller than that of the limiting protrusion 401 to achieve effective locking and unlocking.

[0051] In addition, depending on the actual situation, it is possible that a slot suitable for the locking structure is provided on the plug interface of the tester so that the locking structure is locked into the slot of the plug interface when it is in the locked position.

[0052] In one embodiment, the locking structure 400 is provided with an operating part 402 for moving the locking structure 400 between a locked position and an unlocked position.

[0053] As an example, refer to Figures 1 to 2 The operating part 402 can be configured as a press member, so that the locking structure 400 is retractably disposed in the locking hole 1021. Further, the operating part 402 and the locking structure 400 can be configured as an integral structure, and the operating part 402 can be disposed at the end of the locking structure 400 away from the first slot 101, to drive the locking structure 400 to switch between a locked position and an unlocked position, making operation easier and avoiding restrictions on the insertion of the probe body 100 due to improper placement of the operating part 402. In the locked position, the locking structure 400 extends outward from the locking hole 1021 along the first direction of the probe body 100 and engages with the connector of the tester, so that the probe and the connector are locked together; in the unlocked position, the locking structure 400 retracts inward from the locking hole 1021 along the first direction of the probe body 100 and exits the connector of the tester, so that the probe is separated from the connector. It should be noted that the first direction of the probe body 100 mentioned here refers to the direction from the central axis of the probe body 100 to its outer side wall.

[0054] As another example, the operating part 402 can be configured as a push-pull member, allowing the locking structure 400 to be retractably disposed in the locking hole 1021. Further, the operating part 402 and the locking structure 400 can be integrated into a single structure, with the operating part 402 positioned at the end of the locking structure 400 furthest from the first slot 101, to move the locking structure 400 between a locked and unlocked position, making operation easier and preventing improper placement of the operating part 402 from restricting the insertion of the probe body 100. Even further, the locking hole 1021 can be located on the side wall of the probe body 100, extending from the center of the side wall to the first slot 101. In the locked position, the locking structure 400 extends outward from the locking hole 1021 along the second direction of the probe body 100 and engages with the connector of the tester, thereby locking the probe and the connector together. In the unlocked position, the locking structure 400 retracts inward from the locking hole 1021 along the second direction of the probe body 100 and exits the connector of the tester, thereby separating the probe from the connector. It should be noted that the second direction of the probe body 100 refers to the direction from one end of the probe body 100 with the coaxial interface 300 to the other end. Furthermore, depending on the actual situation, it is possible that a groove suitable for the locking structure 400 is provided on the side of the locking hole 1021 corresponding to the second direction to guide the movement of the locking structure 400.

[0055] Furthermore, based on the above example, an operation hole 1022 can be provided on the side wall of the probe body corresponding to the operation direction of the operation unit 402. The operation hole 1022 can be provided close to the locking hole 1021. Of course, according to actual needs, for ease of processing, the operation hole 1022 and the locking hole 1021 can also be provided in the same hole position of the probe body. When the operation hole 1022 and the locking hole 1021 are provided in the same hole position, it is possible that a baffle 105 can be provided on the side wall of the probe body 100. The baffle 105 divides the locking hole 1021 and the operation hole 1022 in the above hole position, so that the locking structure 400 extends out of the probe body 100 through the baffle 105.

[0056] Reference Figure 1 In one embodiment, an elastic element 500 is provided inside the probe body 100. The elastic element 500 is connected to the locking structure 400 and is used to drive the locking structure 400 to reset and switch from the unlocked position to the locked position.

[0057] As an example, the elastic element 500 can be disposed within the probe body 100 corresponding to the operating part 402. When a locking structure 400 is provided, one end of the elastic element 500 is fixed within the probe body 100, and the other end of the elastic element 500 is connected to the locking structure 400. When multiple locking structures 400 are provided, the elastic structure can have multiple free ends corresponding to the number and position of the locking structures 400, so that the multiple free ends of the elastic element 500 are connected one-to-one to the multiple locking structures 400.

[0058] It should be noted that the elastic element 500 here can be set as any elastic structure suitable for actual use, such as a compression spring or torsion spring, according to actual needs. Of course, the elastic element 500 can also be set as a structure with a certain degree of elasticity, and the material of the elastic element 500 can be metal, rubber, or plastic with a certain degree of elasticity.

[0059] Additionally, it is understood that the elastic element 500 can be configured to correspond to the unlocked and locked positions. Furthermore, the locking structure 400 can be configured to switch between the locked and unlocked positions along a first direction or a second direction. The elastic element 500 can be configured to be located in the middle of the probe body 100 corresponding to the first direction, or it can be configured to be located at the end of the operating part 402 away from the first slot 101 corresponding to the second direction.

[0060] Reference Figure 1 In one embodiment, there are two locking structures 400, which are disposed opposite to each other on both sides of the probe body 100, and the elastic member 500 is connected between the two locking structures 400.

[0061] The two locking structures 400 and the corresponding operating parts 402 are arranged opposite each other on both sides of the probe body 100. The user can press or push and pull the operating parts 402 on the side of the probe body 100 to drive the locking structure 400 to switch between the locked position and the unlocked position, which is convenient to use. When the probe body 100 is connected, it is effectively locked to the connector of the tester by the locking structure 400 in the locked position, so that the connection between the probe and the tester is more secure and reliable.

[0062] Understandably, depending on actual use, the two ends of the elastic element 500 can be respectively connected to the two locking structures 400. Furthermore, the two locking structures 400 can be configured as an H-shape, U-shape, or any other integrally molded structure suitable for actual use. In this way, the elastic element 500 can simultaneously drive the two locking structures 400 from the unlocked position to the locked position, avoiding situations where the probe is not properly locked when inserted into the tester interface; and by simultaneously driving the two locking structures 400 to switch positions, the elastic element 500 can prevent situations where the probe cannot be quickly removed from the tester interface when disconnecting, thus optimizing the user experience.

[0063] Optionally, a fixing position is provided on the inner side of both locking structures to fix the elastic element.

[0064] In one embodiment, a fixing position 403 is provided on the inner side of each of the two locking structures 400. There are two elastic members 500, which correspond to the fixing positions. The two elastic members 500 are respectively disposed on both sides of the circuit board 200 and respectively abut against the corresponding fixing positions 403.

[0065] Optionally, two of the elastic elements may be fixed to the circuit board and the corresponding fixing position 403 by means of bonding, welding, snap-fitting, plugging, etc.

[0066] In one embodiment, a fixing position 403 is provided on the inner side of each of the two locking structures 400, a through hole 201 is provided in the middle of the circuit board, and the elastic member 500 passes through the through hole 201 and is connected to the fixing position at both ends respectively.

[0067] A through hole 201 is provided in the middle of the circuit board 200 to limit the elastic element 500, preventing the elastic element 500 from shifting position during extension and retraction, thus affecting the reset switching effect. Optionally, the elastic element can be provided to pass through the through hole, and both ends can be fixed to the fixing position 403 by means of bonding, welding, snap-fitting, plugging, etc.

[0068] Reference Figure 1 In one embodiment, for ease of material sourcing and processing, the elastic element 500 is a spring. Each of the two locking structures 400 has a fixing position 403 on its inner side, and the spring passes through the through hole with both ends connected to the fixing position 403.

[0069] Furthermore, corresponding to the fixed position 403, limiting structures such as connecting shafts 4031 can be respectively provided on the inner side of the two locking structures 400. The fixed positions 403 and connecting shafts 4031 of the two locking structures 400 are all located on the same axis. The spring is limited by the connecting shafts 4031 of the two locking structures 400 to prevent the spring from being compressed, displaced or even deformed, and to a certain extent prevent the spring from being over-compressed and causing pressure on the circuit board 200.

[0070] In one embodiment, the circuit board 200 has a first connecting end and a second connecting end opposite to each other. The first slot 101 surrounds the first connecting end of the circuit board 200, and the first connecting end of the circuit board 200 is flush with the first end of the probe body 100. The probe body 100 is surrounded by the first slot 101 to protect the coaxial interface 300 and the circuit board 200.

[0071] Reference Figure 1 In one embodiment, the other end of the probe body 100 is provided with a clamping structure 103 and a signal cable 600. The clamping structure 103 is provided with a slot corresponding to the first slot 101. The circuit board 200 is at least partially located in the slot and electrically connected to the signal cable 600.

[0072] The slot limits the position of the circuit board 200 so that when the probe is inserted into the interface of the tester, the circuit board 200 in the first slot 101 can be stably connected to the plug signal interface, avoiding poor contact. Furthermore, the slot design can further prevent the circuit board 200 from shifting position due to the locking structure 400.

[0073] Furthermore, the clamping structure 103 includes a first housing 1031 and a second housing 1032. The first housing 1031 and the second housing 1032 can be disposed on both sides of the clamping structure 103 in the form of plug-in, snap-fit, sleeve, screw connection, etc., so that the slot is formed between the first housing 1031 and the second housing 1032. Further still, a locking fastener 1033 passing through the first housing 1031 and the second housing 1032 can be used to lock them together. Depending on the actual situation, it is possible that a corresponding connection hole 202 is provided on the circuit board 200, and the locking fastener 1033 passes through the first housing 1031, the connection hole 202, and the second housing 1032, so that the circuit board 200 is fixed in the slot.

[0074] As an example, the probe further includes a first package 1041 and a second package 1042 encapsulated outside the coaxial interface 300, the first slot 101, and the clamping structure 103. The first package 1041 and the second package 1042 can be connected as a single unit by means of plug-in, snap-fit, sleeve, screw connection, etc. The coaxial interface 300 and the first slot 101 are formed at the end of the first package 1041 opposite to the second package 1042. In addition, depending on the actual situation, a second slot 106 can be provided in the first package 1041 corresponding to the coaxial interface 300 for connecting the coaxial interface 300 to the test signal interface of the tester; the signal cable 600 is disposed at the end of the second package 1042 opposite to the first package 1041, and extends out of the probe body 100 through the second package 1042 for connection with the device under test.

[0075] Furthermore, sealing rings or gaskets can be installed on the signal cable 600, coaxial interface 300, etc., to prevent dust and water, and to prevent external contaminants from entering the probe body 100, affecting its performance and service life.

[0076] Reference Figures 1 to 2 In one embodiment, the circuit board 200 is disposed on one side of the coaxial interface 300 so that the probe body 100 is flat.

[0077] The probe is designed to compress its volume, reduce its space occupation, and be flat for easy packaging and transportation.

[0078] Reference Figure 3 In one embodiment, the coaxial interface 300 includes a pin 301 and an insulating sleeve 302 and a connecting sleeve 303 sequentially fitted around the pin 301. The connecting sleeve 303 has a insertion position 3031 at one end near the pin 301, which is suitable for insertion into the circuit board 200. The connecting sleeve 303 and the pin 301 are electrically connected to the circuit board 200.

[0079] The connecting sleeve 303 is fitted over the pin 301 via an insulating sleeve 302. The connecting sleeve 303 has a insertion point 3031, allowing the connecting sleeve 303 and the pin 301 to be securely inserted into and electrically connected to the circuit board 200. Furthermore, the coaxial interface 300 also includes a sleeve 304 fitted over the connecting sleeve 303 to secure the coaxial interface 300, ensuring stable connection to the test signal interface of the tester and protecting the coaxial interface 300 from wear and corrosion caused by the external environment.

[0080] Reference Figures 1 to 3 The present invention also provides a probe assembly, which includes a probe as shown in the example above and a connection interface 700. One end of the probe is inserted into the interface of the tester; the other end of the probe is provided with a signal cable 600 and coupled to the connection interface 700 via the signal cable 600. The connection interface 700 is electrically connected to the device under test and is used to transmit test signals to the tester. This solves the problems of large probe space occupation and difficult assembly.

[0081] Specific examples of the probes are shown above and will not be repeated here.

[0082] The above description is merely an optional embodiment of the present invention and does not limit the patent scope of the present invention. All equivalent structural transformations made using the contents of the present invention's specification and drawings under the inventive concept of the present invention, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present invention.

Claims

1. A probe used in a testing instrument, characterized in that, The tester has a connector, which includes a measured signal interface and a plug-in signal interface. The probe includes: The probe body has a first end and a second end, the first end of which is provided with a coaxial interface and a first slot; and A circuit board is disposed within the probe body. The circuit board extends out from one side of the first slot and has conductive contacts at positions corresponding to the first slot. The conductive contacts are arranged on at least one side of the circuit board. The conductive contact is used to electrically connect with the plug signal interface when the probe is inserted into the plug interface, so that the circuit board can obtain power from the tester and / or interact with the tester; The coaxial interface is electrically connected to the circuit board and is used to connect to the signal under test interface when the probe is inserted into the interface, so as to transmit the signal under test to the test instrument.

2. The probe according to claim 1, characterized in that, The probe also includes a locking structure. The probe body has a locking hole, and the locking structure is telescopically and translatably disposed in the locking hole to switch between a locked position and an unlocked position along the locking hole. In the locked position, the locking structure extends out of the locking hole to lock the probe into the connector. In the unlocked position, the locking structure retracts into the locking hole to separate the probe from the connector.

3. The probe according to claim 2, characterized in that, The locking structure is provided with a control part for moving the locking structure between the locked position and the unlocked position.

4. The probe according to claim 2, characterized in that, An elastic element is provided inside the probe body. The elastic element is connected to the locking structure and is used to drive the locking structure to reset and switch from the unlocked position to the locked position.

5. The probe according to claim 4, characterized in that, There are two locking structures, which are disposed opposite to each other on both sides of the probe body, and the elastic element is connected between the two locking structures.

6. The probe according to claim 4, characterized in that, Both locking structures have a fixing position on their inner sides. There are two elastic elements, which correspond to the fixing positions. The two elastic elements are respectively located on both sides of the circuit board and abut against the corresponding fixing positions.

7. The probe according to claim 6, characterized in that, Both locking structures have a fixing position on their inner sides, and the circuit board has a through hole in the middle. The elastic element passes through the through hole and its two ends are respectively connected to the fixing position.

8. The probe according to claim 1, characterized in that, The circuit board has a first connection end and a second connection end opposite to each other. The first slot surrounds the first connection end of the circuit board, and the first connection end of the circuit board is flush with the first end of the probe body.

9. The probe according to claim 1, characterized in that, The second end of the probe body is provided with a clamping structure and a signal cable. The clamping structure is provided with a slot corresponding to the first slot. The circuit board is at least partially located in the slot and is electrically connected to the signal cable.

10. The probe according to any one of claims 1-9, characterized in that, The circuit board is located on one side of the coaxial interface to make the probe body flat.

11. A probe assembly, characterized in that, Includes a probe and a connection interface as described in any one of claims 1-10, wherein one end of the probe is inserted into the interface of the tester; the other end of the probe is provided with a signal cable and coupled to the connection interface via the signal cable, and the connection interface is electrically connected to the device under test for transmitting test signals to the tester.

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