Fitting in place testing method and related apparatus

Abstract

The application provides a method for testing in-place accessories and related equipment. The method is applied to a testing device, and includes: obtaining accessory testing information, and generating a control instruction according to the accessory testing information, wherein the accessory testing information is used to indicate accessories to be tested corresponding to each port in the device to be tested; sending the control instruction to the device to be tested, wherein the control instruction is used to instruct the device to be tested to enable the accessories to be tested corresponding to each port, and disable non-accessories to be tested corresponding to each port; obtaining in-place information detected by the device to be tested, wherein the in-place information is used to indicate the accessories in use detected by the device to be tested; and determining a testing result corresponding to the accessory testing information according to the in-place information and the accessory testing information. The method can determine whether the communication of the device to be tested is disturbed when the device to be tested enables different permutations and combinations of accessories, thereby effectively saving time and labor input.

Description

Technical Field

[0001] This application relates to the field of new energy technology, specifically to an in-situ testing method for accessories, electronic equipment, testing system, and computer-readable storage medium. Background Technology

[0002] In related technologies, when multiple components are simultaneously connected to the same electronic device, the presence signals sent by different components to the electronic device may cause communication interference, leading to the test equipment malfunctioning. Therefore, in order to ensure that the electronic device functions properly and meets factory standards, it is necessary to conduct component presence testing on the electronic device in advance to detect whether the aforementioned defects exist.

[0003] In component presence testing, different components need to be connected to different ports on the electronic device to test whether communication interference will occur in the corresponding component combinations and whether the electronic device can normally detect the presence signals of each component. This test typically requires testers to repeatedly plug and unplug components and traverse all possible component combinations, making the operation tedious and time-consuming. Summary of the Invention

[0004] In view of this, this application provides an accessory in-situ testing method, electronic device, testing system, and computer-readable storage medium, which can detect the communication status of the electronic device when different combinations of accessories are enabled, saving time and manpower.

[0005] The first aspect of this application provides a method for testing accessories in place, applied to a test device, comprising: the test device acquiring accessory test information and generating control commands based on the accessory test information; the accessory test information being used to indicate the accessories to be tested corresponding to each port in the device under test; sending control commands to the device under test, the control commands being used to instruct the device under test to enable the accessories to be tested corresponding to each port and disable non-accessories to be tested corresponding to each port; acquiring in-place information detected by the device under test; the in-place information being used to indicate the accessories being enabled detected by the device under test; and determining the test result corresponding to the accessory test information based on the in-place information and the accessory test information.

[0006] In this way, after acquiring the accessory test information, the testing equipment can generate control commands based on the accessory test information and send the control commands to the device under test (DUT). This allows the DUT to enable the accessories corresponding to each port and disable the non-accessories corresponding to each port according to the control commands. Specifically, the accessories under test generate presence information, while non-accessories do not. Next, the testing equipment obtains the presence information from the DUT and compares the enabled accessories indicated by the presence information with the accessories under test indicated by the accessory test information to determine the test result. Based on the test result, it can be determined whether there is communication interference in the DUT with the accessories under test enabled. Simultaneously, by sequentially setting all permutations and combinations of accessories under test as accessory test information, and so on, the testing equipment iterates through different permutations and combinations to test the DUT, determining whether the communication of the DUT is interfered with when different permutations and combinations of accessories are enabled. Through this method, the testing equipment can control the DUT to automatically enable accessories under test and disable non-accessories under test via control commands, eliminating the need for test personnel to manually plug and unplug corresponding accessories, greatly reducing the workload of test personnel and saving time and manpower.

[0007] In some embodiments, the testing equipment determines the test result corresponding to the accessory test information based on the in-situ information and the accessory test information, including: when the in-situ information and the accessory test information match, determining that the test result corresponding to the accessory test information is a test pass; when the in-situ information and the accessory test information do not match, determining that the test result corresponding to the accessory test information is a test failure.

[0008] In some embodiments, the test device acquires the presence information detected by the device under test, sends an information acquisition request to the server, the information acquisition request being used to request the server to return the presence information uploaded to the server by the device under test; and receives the presence information sent by the server.

[0009] A second aspect of this application provides a method for testing the presence of accessories, applied to a device under test. The method includes: the device under test receiving a control command sent by a test device, the control command carrying accessory testing information, the accessory testing information indicating the accessories to be tested corresponding to each port of the device under test; enabling the accessories to be tested corresponding to each port and disabling non-accessories to be tested corresponding to each port; detecting the presence signal corresponding to each port and generating presence information based on the presence signal corresponding to each port; and sending the presence information to the test device so that the test device determines the test result corresponding to the accessory testing information based on the presence information and the accessory testing information.

[0010] In this way, after receiving the control commands from the testing equipment, the device under test (DUT) can enable the corresponding accessories for each port and disable the non-accessories for each port according to the control commands. Next, the DUT detects the presence signal for each port and generates presence information based on the presence signal. Finally, the DUT sends the presence information to the testing equipment, so that the testing equipment can determine the test result by comparing the enabled accessories indicated in the presence information with the accessories under test indicated in the accessory test information. Based on the test result, it can determine whether there is communication interference with the DUT when the accessories under test are enabled. After setting all the permutations and combinations of accessories of the DUT sequentially as accessory test information, and so on, the testing equipment traverses different permutations and combinations to test the DUT, which can determine whether the communication of the DUT is interfered with when different permutations and combinations of accessories are enabled. Through the above method, the testing equipment and the DUT can automatically enable the accessories under test and disable the non-accessories after receiving control commands, without requiring testers to manually plug and unplug the corresponding accessories, greatly reducing the workload of testers and saving time and manpower.

[0011] In some embodiments, the device under test (DUT) enables the accessories under test corresponding to each port and disables the non-accessories under test corresponding to each port, including: sending an enable command to the accessories under test corresponding to each port, and sending a silence command to the non-accessories under test corresponding to each port; the enable command is used to instruct the accessories under test to send an in-situ signal to the DUT, and the silence command is used to instruct the non-accessories under test to stop sending an in-situ signal to the DUT.

[0012] In some embodiments, the device under test enables the accessories under test corresponding to each port and disables the non-accessories under test corresponding to each port, including: controlling the switch circuit connected to each port to close the switch connected to the accessory under test, and disconnecting the switch connected to the non-accessories under test.

[0013] A third aspect of this application provides an electronic device, including a processor and a memory. The memory is used to store instructions, and the processor is used to call the instructions in the memory to cause the electronic device to execute the method described in the first aspect.

[0014] The fourth aspect of this application provides an electronic device, including a processor and a memory. The electronic device includes multiple ports, each port being used to connect different types of accessories. The memory is used to store instructions, and the processor is used to call the instructions in the memory, causing the electronic device to execute the method involved in the second aspect above.

[0015] A fifth aspect of this application provides a testing system, including electronic devices as described in the third aspect and electronic devices as described in the fourth aspect.

[0016] A sixth aspect of this application provides a computer-readable storage medium having at least one computer instruction stored thereon, the computer instruction being loaded by a processor and used to perform the methods as described in the first aspect and the second aspect. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the structure of the device under test according to an embodiment of this application.

[0018] Figure 2 This is another structural schematic diagram of the device under test according to an embodiment of this application.

[0019] Figure 3 This is an application scenario diagram of the accessory in-situ testing method according to an embodiment of this application.

[0020] Figure 4 This is a flowchart illustrating the in-situ testing method for accessories according to an embodiment of this application.

[0021] Figure 5 This is a flowchart illustrating the in-situ testing method for accessories according to an embodiment of this application.

[0022] Figure 6 This is a flowchart illustrating the in-situ testing method for accessories according to an embodiment of this application.

[0023] Figure 7 This is another application scenario diagram of the accessory in-situ testing method according to the embodiments of this application.

[0024] Figure 8 This is a flowchart illustrating the in-situ testing method for accessories according to an embodiment of this application.

[0025] Figure 9 This is another application scenario diagram of the accessory in-situ testing method according to the embodiments of this application.

[0026] Figure 10 This is a schematic diagram of the structure of an electronic device according to an embodiment of this application.

[0027] Figure 11 This is a schematic diagram of the structure of another electronic device according to an embodiment of this application.

[0028] Figure 12 This is a schematic diagram of the structure of the test system according to an embodiment of this application.

[0029] Figure 13 This is an application scenario diagram of the test system in an embodiment of this application. Detailed Implementation

[0030] It should be noted that the terms "first" and "second" in the specification, claims and drawings of this application are used to distinguish similar objects, rather than to describe a specific order or sequence.

[0031] It should also be noted that the methods disclosed in the embodiments of this application or the methods shown in the flowcharts include one or more steps for implementing the method. Without departing from the scope of the claims, the execution order of multiple steps can be interchanged, and some steps can also be deleted.

[0032] Where there is no conflict, the following embodiments and features can be combined with each other.

[0033] The following is a brief explanation of the relevant technologies:

[0034] Electronic devices with multiple ports can connect to multiple accessories. These accessories can be connected simultaneously in different combinations. When multiple accessories are connected at the same time, the presence signals sent by different accessories to the electronic device may interfere with each other, causing the electronic device to fail to detect the corresponding presence signal or to detect an incorrect presence signal, resulting in the electronic device malfunctioning. For example, in some scenarios, if the electronic device cannot recognize the presence signal of an accessory after it is plugged in, the corresponding function of the accessory cannot be used normally. In other scenarios, if a user wants to upgrade the firmware of an accessory through the electronic device, and the accessory is plugged in, if the electronic device cannot recognize the presence signal of the accessory, the electronic device will not perform the firmware upgrade.

[0035] Therefore, in order for electronic devices to function properly and meet factory standards, it is necessary to conduct in-situ component testing on the electronic devices in advance to detect whether the aforementioned defects exist.

[0036] In component presence testing, different components need to be connected to different ports on the electronic device to test whether communication interference will occur in the corresponding component combinations and whether the electronic device can normally detect the presence signals of each component. This test typically requires testers to repeatedly plug and unplug components and traverse all possible component combinations, making the operation tedious and time-consuming.

[0037] For example, consider testing the accessory combinations of an electronic device. This device has four ports, one of each type. One port can connect to two different accessories, another to three different accessories, and the remaining two ports, while different, can connect to the same three accessories. Each port can only connect to one accessory. Testing all accessories connected to every port would require iterating through 188 possible combinations, taking at least one person a day. Furthermore, it's practically impossible for a person to manually iterate through all accessory combinations. The iteration formula is as follows:

[0038] M=2×C(a,1)×2×C(c,1)×2×A(e,f)

[0039] Where M represents the number of traversals, in this example M is 188; C() represents the mathematical symbol for combination, C(a,1) means that one port can connect to 'a' types of accessories, in this example C(a,1) can be C(3,1) meaning that one port can connect to 3 types of accessories; C(c,1) means that one port can connect to 'c' types of accessories, in this example C(c,1) can be C(2,1) meaning that one port can connect to 2 types of accessories; A() represents the mathematical symbol for permutation, A(a,c) can represent the permutation of f ports selecting f types of accessories from e types of accessories, in this example A(a,c) can be A(3,2) meaning the permutation of two ports selecting two types of accessories from three types of accessories.

[0040] In view of this, this application provides an accessory in-situ testing method, electronic device, testing system, and storage medium, which can detect the communication status of the electronic device when different combinations of accessories are enabled, saving time and manpower.

[0041] The accessory testing method provided in this application can be used to test the device under test. The device under test has multiple ports for electrically connecting accessories. The device under test can be an electronic device such as an energy storage device, a remote control, or a cooling device. Taking an energy storage device as an example, the accessories electrically connected to the ports of the energy storage device can include wireless access point (AP) devices, remote controls, charging guns, parallel operation components, distribution boxes, power supplies, air conditioners, and generators, etc.

[0042] In some examples, such as Figure 1As shown, the device under test 100 has a first port area 110, a second port area 120, a third port area 130, and a fourth port area 140. The first port area 110 has a communication output port, such as an RJ45 (Registered Jack 45, RJ45) port, which can be used to connect to a network. The second port area 120 has a port with 3+8 pins, the third port area 130 has a port with 4+8 pins, and the fourth port area 140 has another type of port with 4+8 pins.

[0043] In other examples, such as Figure 2 As shown, the device under test 200 has a fifth port area 210 at the upper end of the left side, a sixth port area 220 at the lower end of the left side, a seventh port area 230 at the upper end of the right side, and an eighth port area 240 at the lower end of the right side. The ports of the fifth port area 210, the sixth port area 220, the seventh port area 230, and the eighth port area 240 can be set according to actual needs.

[0044] Please see Figure 3 , Figure 3 This is an application scenario diagram of the accessory in-situ testing method according to an embodiment of this application. The accessory in-situ testing method can be applied to the test equipment 310 and the device under test 320.

[0045] The test device 310 can be a personal computer (PC), cloud server, desktop computer, network server, service cluster, handheld computer (PDA), mobile phone, wireless terminal device, embedded device or other device with data processing function.

[0046] Taking an energy storage device as an example, before the test device 310 and the device under test 320 perform the accessory in-situ test method, all accessories are connected to the ports of the device under test 320.

[0047] For example, such as Figure 3 As shown, the first port 321 of the device under test can be electrically connected to the wireless access point device and the remote control; the second port 322 can be electrically connected to the charging gun, the parallel assembly and the power distribution box; the third port 323 can be electrically connected to the power supply, the air conditioner and the generator; and the fourth port 324 can be electrically connected to the power supply, the air conditioner and the generator.

[0048] Typically, one port can only be connected to one accessory. Therefore, when it is necessary to connect multiple accessories to one port, the port can be connected to the first end of a multi-port hub (also known as a multi-port repeater), and the accessories corresponding to that port can be connected to the respective second ends of the multi-port hub.

[0049] Alternatively, when it is necessary to use one port to connect multiple accessories, the port can be connected to the first terminal of the switching circuit, and the accessories corresponding to the port can be connected to the respective second terminals of the switching circuit.

[0050] After establishing a communication connection between the test device 310 and the device under test 320, the test device 310 acquires accessory test information. Assume the accessory test information indicates that the accessory under test is the remote control corresponding to the first port 321 and the power distribution box corresponding to the second port 322. The test device 310 can generate control commands based on the accessory test information. Then, the test device 310 sends the control command to the device under test 320. After receiving the control command, the device under test 320 enables the remote control connected to the first port 321 and the power distribution box connected to the second port 322 according to the control command, and disables other connected accessories. Next, the device under test 320 detects the corresponding presence signal of each port and generates corresponding presence information based on the detected presence signals. For example, the presence information could indicate that the first port 321 has received the presence signal of the wireless access point device and the second port 322 has received the presence signal of the remote control. Finally, the device under test 320 sends the presence information to the test device 310. The test device 310 compares the in-situ information with the accessory test information and determines that the in-situ information is inconsistent with the accessory test information, thus confirming that the test result of the accessory test information is a test failure. Similarly, the test device 310 iterates through different accessory test information to test the device under test 320 to determine whether the communication of the device under test 320 is interfered with when different combinations of accessories are used.

[0051] Please see Figure 4 , Figure 4 This is a flowchart illustrating the in-situ testing method for components according to an embodiment of this application. The in-situ testing method for components according to an embodiment of this application can be applied in testing equipment. The in-situ testing method for components includes the following steps:

[0052] S101: Obtain accessory test information and generate control commands based on the accessory test information.

[0053] The testing equipment can obtain pre-stored accessory testing information from storage devices such as the internal memory of the testing equipment, the device under test, external memory, or cloud storage. It can also obtain information from information input by the testers in real time. There are no restrictions on the specific method of obtaining accessory testing information.

[0054] Accessory test information is used to indicate the accessories to be tested for each port in the device under test. Accessories to be tested refer to the accessories that need to be tested, for example, such as... Figure 3 The application scenario shown assumes that the remote control of the first port and the power distribution box of the second port of the device under test need to be tested. In this case, the remote control and the power distribution box are the accessories to be tested.

[0055] The component test information can indicate the arrangement and combination of components to be tested. Specifically, when the component test information indicates that one or several components are components to be tested, it indicates the combination of components to be tested. When the component test information indicates that a component of a certain port is a component to be tested or indicates that several components of several ports are components to be tested simultaneously, it indicates the arrangement and combination of components to be tested.

[0056] The arrangement and combination of the accessories to be tested in the accessory testing information can be set according to the actual testing requirements. All the accessories of the device to be tested can be set as the arrangement and combination of the accessories to be tested.

[0057] Understandably, each port of the device under test can be connected to an accessory. To test whether communication interference will occur when one or more accessories connected to multiple ports are enabled, the test information can be used to indicate which accessory(s) of the device under test are to be tested, thus distinguishing accessories that do not need to be tested. In other words, the permutation and combination of accessories to be tested can be obtained by setting accessory test information.

[0058] S102: Send control commands to the device under test.

[0059] Control commands are used to instruct the device under test to enable the accessories under test for each port and disable the non-accessories under test for each port.

[0060] Non-test accessories refer to accessories that do not need to be tested. This can be understood as the various accessories connected to the ports of the device under test, excluding the accessories to be tested. For example, such as... Figure 3 As shown, assuming that the test equipment indicates that the remote control on the first port and the power distribution box on the second port of the device under test are the accessories to be tested, all other accessories connected to each port of the device under test are not accessories to be tested. For example, accessories such as the wireless access point device connected to the first port, the charging gun connected to the second port, the parallel assembly connected to the second port, and the power supply pack connected to the third port are not accessories to be tested.

[0061] Understandably, the test equipment enables the accessory under test and disables the accessory not under test, thus making the states of the accessory under test and the accessory not under test different.

[0062] S103: Obtain the presence information detected by the device under test.

[0063] In-situ information is used to indicate which accessories are in use and detected by the device under test. For example, the test device obtains in-situ information from the device under test, which indicates that a wireless access point device connected to the first port of the device under test and a power distribution box connected to the second port are in use.

[0064] Understandably, the device under test (DUT) generates in-situ information based on the accessories that are currently in use. The DUT can then use this in-situ information to determine which specific accessories(s) it has detected as being in use.

[0065] S104: Determine the test results corresponding to the part test information based on the in-situ information and the part test information.

[0066] The test result can be either "test passed" or "test failed". A "test passed" means that the permutation and combination of the test components corresponding to the test information will not cause communication failure in the device under test. A "test failed" means that the permutation and combination of the test components corresponding to the test information will cause communication failure in the device under test.

[0067] Understandably, based on the accessory test information indicating the accessory under test, the device under test (DUT) should detect the presence signal of the corresponding accessory under test being enabled. If the presence signal acquired by the DUT does not include the presence signal of the accessory under test, or if it detects the presence signals of other accessories besides the accessory under test, it indicates that communication interference occurred after the DUT enabled the accessory under test, causing the accessory detected by the DUT to have a presence signal inconsistent with the accessory indicated in the accessory test information.

[0068] In this way, the test equipment acquires accessory test information, which instructs the device under test (DUT) to generate control commands based on the accessory test information and send them to the DUT. This allows the DUT to enable the accessories corresponding to each port according to the control commands. When enabled, the accessories send an presence signal to the DUT, while disabling non-accessories corresponding to each port, which do not send presence signals. Next, the test equipment acquires presence information from the DUT, indicating the presence signals detected by the DUT. The test equipment compares the enabled accessories indicated by the presence information with the accessories indicated by the accessory test information to determine the test result. The test result indicates that the presence signal sent by the accessory indicated by the accessory test information will cause communication interference in the DUT. Simultaneously, by configuring the corresponding accessory test information sequentially according to the permutation and combination of all accessories in the DUT, and so on, the test equipment iterates through the DUT, determining whether the communication of the DUT is interfered with when different permutations and combinations of accessories are enabled, saving time and manpower.

[0069] In some embodiments, please refer to Figure 5 Step S104 includes the following steps:

[0070] Step S201: When the location information matches the component test information, determine that the test result corresponding to the component test information is a test pass.

[0071] Matching the location information with the accessory test information means that the accessory being enabled as indicated in the location information is consistent with the accessory to be tested as indicated in the accessory test information. For example, if the accessory being enabled as indicated in the location information is the remote control for the first port and the distribution box for the second port, and the accessory to be tested in the accessory test information is the remote control for the first port and the distribution box for the second port, then the enabled accessory and the accessory to be tested are consistent, which means that the location information matches the accessory test information.

[0072] Understandably, when the location information matches the accessory test information, it means that the arrangement and combination of the accessories to be tested in the accessory test information will not interfere with the communication of the device under test. Therefore, the test result of the arrangement and combination of the accessories to be tested is that the test is passed.

[0073] Step S202: When the location information does not match the component test information, determine that the test result corresponding to the component test information is a test failure.

[0074] A mismatch between the location information and the accessory test information means that the accessories enabled in the location information are inconsistent with the accessories to be tested in the accessory test information. For example, the accessories enabled in the location information are the wireless access point device on the first port and the power distribution box on the second port, while the accessories to be tested in the accessory test information are the remote control on the first port and the power distribution box on the second port. The enabled accessories and the accessories to be tested are inconsistent, which is to say, the location information and the accessory test information are inconsistent.

[0075] Understandably, when the location information does not match the accessory test information, it means that the arrangement and combination of the accessory to be tested in the accessory test information will interfere with the communication of the device under test. Therefore, the test result of the arrangement and combination of the accessory to be tested is a test failure.

[0076] Understandably, repairs and other operations can be performed on the arrangement and combination of the components under test that cause the test to fail, so that the device under test can be connected to different combinations of components.

[0077] In some embodiments, such as Figure 6 As shown, step S103 includes the following steps:

[0078] Step S301: Send an information retrieval request to the server. The information retrieval request is used to request the server to return the on-premises information uploaded by the device under test to the server.

[0079] When acquiring presence information, the test device can directly receive the presence information sent by the device under test; alternatively, the device under test can send the presence information to the server, and the test device can obtain the corresponding presence information from the server.

[0080] When the test device retrieves the corresponding in-situ information from the server, it can send an information retrieval request to the server, requesting the server to return the in-situ information uploaded to the server by the device under test.

[0081] A server can refer to the server of an Internet of Things (IoT) platform.

[0082] Step S302: Receive the presence information sent by the server.

[0083] The device under test can upload its on-site information to the server in real time. Therefore, such as Figure 7 As shown, after the test device can communicate with the server via a local area network or a wide area network, the test device can send an information retrieval request to the server. After receiving the information retrieval request, the server will send the available information to the test device.

[0084] Understandably, the test equipment can not only establish a communication connection with the device under test to receive the presence information sent by the device under test, but also directly obtain presence information from the server of the IoT platform to realize remote testing of the device under test.

[0085] This application also provides an in-situ testing method for accessories, applied to the device under test; please refer to [link / reference]. Figure 8 The in-situ testing method for components includes the following steps:

[0086] S401: Receives control commands sent by the test equipment, which carry accessory test information.

[0087] Accessory test information is used to indicate the accessories to be tested for each port of the device under test.

[0088] S402: Enable the accessories to be tested for each port, and disable the accessories not to be tested for each port.

[0089] S403: Detects the presence signal corresponding to each port and generates presence information based on the presence signal corresponding to each port.

[0090] When an accessory connected to a port of the device under test is enabled, that accessory's port will generate a presence signal; when the accessory is disabled, its port will not generate a presence signal. Therefore, the device under test can generate presence information based on the presence signals detected by the ports connected to the corresponding accessories. For example, based on the presence signal detected by the device under test through the first port for a remote control and the presence signal detected through the second port for a distribution box, presence information indicating that the remote control on the first port and the distribution box on the second port are enabled can be generated.

[0091] S404: Send presence information to the testing equipment so that the testing equipment can determine the test result corresponding to the accessory test information based on the presence information and accessory test information.

[0092] In this way, after receiving the control commands sent by the testing equipment, the device under test (DUT) can enable the corresponding accessories for each port and disable the non-accessories for each port. Next, the DUT detects the presence signal for each port and generates presence information based on the presence signal. Finally, the DUT sends the presence information to the testing equipment, allowing the testing equipment to determine the test result by comparing the enabled accessories indicated in the presence information with the accessories under test indicated in the accessory test information. Based on the test result, it can be determined whether communication interference exists when the DUT enables accessories. By sequentially setting all combinations of accessories for the DUT as accessory test information, and so on, the testing equipment can iterate through the DUT, determining whether communication is interfered with when different combinations of accessories are enabled, saving time and manpower.

[0093] In some embodiments, after step S403, the in-situ testing method for accessories includes: obtaining accessory testing information, and determining the test result corresponding to the accessory testing information based on the accessory testing information and the in-situ information.

[0094] Understandably, after generating the in-situ information, the device under test can also acquire the component test information, and then determine the test result corresponding to the component test information. In other words, the step of judging the test result can also be performed directly on the device under test.

[0095] In some embodiments, step S402 specifically includes: sending an enable command to the accessory to be tested corresponding to each port, and sending a silence command to the non-accessories to be tested corresponding to each port.

[0096] The enable command is used to instruct the accessory under test to send an in-situ signal to the device under test, while the silence command is used to instruct non-accessories under test to stop sending an in-situ signal to the device under test.

[0097] Please see Figure 9 The ports of the device under test (DUT) can be electrically connected to accessories via a multiport hub. Enable and mute commands sent by the DUT are transmitted to the corresponding accessory under test or test accessory via the multiport hub.

[0098] For example, the device under test (DUT) sends an enable command to the remote control of the first port. The enable command, after passing through a multi-port repeater, is transmitted to the remote control of the first port. The remote control enters an enabled state based on the enable command, generates a presence signal, and sends the presence signal to the DUT. The DUT then sends a mute command to the wireless access point device of the first port. The mute command, after passing through a multi-port repeater, is transmitted to the wireless access point device of the first port. The wireless access point device enters a mute state (i.e., enters a disabled state) based on the mute command and does not send a presence signal to the DUT.

[0099] Understandably, the device under test can send an enable command to the accessory under test and a mute command to the non-accessories under test through a multi-port repeater, thereby controlling the accessory under test to be turned on and the non-accessories under test to be turned off, thus simulating the state of different accessories connected to the device under test in different arrangements and combinations.

[0100] In some embodiments, step S402 specifically includes: step S601: controlling the switch circuits connected to each port to close the switch connected to the accessory under test, and disconnecting the switch connected to the non-accessory under test.

[0101] The multi-port repeater can be replaced with a switching circuit, that is, the port of the device under test is electrically connected to the switching circuit, the switching circuit is electrically connected to the accessory, and the switching circuit can open or close the corresponding switch of the accessory.

[0102] The switching circuit may include a relay. For example, if a remote control is the accessory under test (DUT), the DUT sends a first control command to the switching circuit. The relay in the switching circuit closes the remote control's switch on the first port according to the first control command, putting the remote control in an "on" state and generating a presence signal. The remote control then sends the presence signal to the DUT. Alternatively, if a wireless access point is not the accessory under test (DUT), the DUT sends a second control command to the switching circuit. The relay in the switching circuit then disconnects the wireless access point's switch on the first port according to the second control command, putting the wireless access point in a "disabled" state and preventing it from sending a presence signal to the DUT.

[0103] Understandably, the device under test can also close the switch of the component under test via a switching circuit, and open the switch of the non-component under test via a switching circuit, thus turning the component under test on or off. This simulates the on / off state of different components connected to the device under test in different arrangements and combinations.

[0104] This application also provides an electronic device, please refer to... Figure 10The diagram shown is a structural schematic of an electronic device 101 provided in an embodiment of this application. The electronic device 101 can be a personal computer (PC), cloud server, desktop computer, network server, service cluster, handheld digital assistant (PDA), mobile phone, wireless terminal device, embedded device, or other device with data processing capabilities. In one embodiment, the electronic device 101 includes a memory 21, at least one port 23, and at least one processor 22. Those skilled in the art should understand that... Figure 10 The structure of the electronic device 101 shown does not constitute a limitation of the embodiments of this application. The electronic device 101 may also include more or fewer other hardware or software than shown, or different component arrangements.

[0105] As one embodiment, the electronic device 101 includes a terminal capable of automatically performing numerical calculations and / or information processing according to pre-set or stored instructions. Its hardware includes, but is not limited to, microprocessors, application-specific integrated circuits (ASICs), programmable gate arrays (FPGAs), digital processors, and embedded devices. As one embodiment, port 23 is used to connect different types of accessories. Memory 21 is used to store program code and various data. The memory 21 may include read-only memory (ROM), random access memory (RAM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), one-time programmable read-only memory (OTPROM), electrically erasable programmable read-only memory (EEPROM), compact disc read-only memory (CD-ROM) or other optical disc storage, disk storage, magnetic tape storage, or any other computer-readable medium capable of carrying or storing data.

[0106] As one embodiment, at least one processor 22 is the control unit of the control terminal. It executes programs or modules stored in the memory 21 and calls data stored in the memory 21 to perform various functions of the electronic device 20 and process data. The integrated unit, implemented as a software functional module, can be stored in a computer-readable storage medium. The memory 21 stores program code, and at least one processor 22 can call the program code stored in the memory 21 to execute related functions. In one embodiment of this application, the memory 21 stores multiple instructions, which are executed by at least one processor 22 to implement steps S101 to S104, steps S201 to S202, and steps S301 to S302. Specifically, the specific implementation method of the above instructions by at least one processor 22 corresponds to the description of the relevant steps in the embodiment, and will not be repeated here.

[0107] This application also provides an electronic device, please refer to... Figure 11 The diagram shown is a structural schematic of an electronic device 201 provided in an embodiment of this application. The electronic device 201 can be an energy storage device, a remote control, or a cooling device, etc. In one embodiment, the electronic device 201 includes a memory 31 and at least one processor 32. Those skilled in the art should understand that... Figure 11 The structure of the electronic device 201 shown does not constitute a limitation of the embodiments of this application. The electronic device 201 may also include more or fewer other hardware or software than shown, or different component arrangements.

[0108] As one embodiment, electronic device 201 includes a terminal capable of automatically performing numerical calculations and / or information processing according to pre-set or stored instructions. Its hardware includes, but is not limited to, microprocessors, application-specific integrated circuits (ASICs), programmable gate arrays (PGAs), digital processors, and embedded devices. As one embodiment, memory 31 is used to store program code and various data. Memory 31 may include read-only memory (ROM), random access memory (RAM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), one-time programmable read-only memory (OTPROM), electrically erasable programmable read-only memory (EEPROM), compact disc read-only memory (CD-ROM) or other optical disc storage, disk storage, magnetic tape storage, or any other computer-readable medium capable of carrying or storing data.

[0109] In one embodiment, at least one processor 32 is the control unit of the control terminal. It executes programs or modules stored in the memory 31 and calls data stored in the memory 31 to perform various functions and process data of the electronic device 201. The memory 31 stores program code, and at least one processor 32 can call the program code stored in the memory 31 to execute related functions. In one embodiment of this application, the memory 31 stores multiple instructions, which are executed by at least one processor 32 to implement steps S401 to S404, step S501, and step S601. Specifically, the specific implementation method of the above instructions by at least one processor 32 corresponds to the description of the relevant steps in the embodiment, and will not be repeated here.

[0110] This application also provides a testing system; please refer to [link / reference]. Figure 12The test system 1000 includes an electronic device 101 that can be used as a test device and an electronic device 201 that can be used as a device under test. The electronic device 101, as a test device, can execute steps S101 to S104, steps S201 to S202, steps S301 to S302, and other steps. The electronic device 201, as a device under test, can execute steps S401 to S404 and other steps.

[0111] Please see Figure 13 In one application scenario of the testing system in this embodiment, after electronic device 101 and electronic device 201 establish a communication connection, electronic device 101 obtains accessory testing information. The accessory testing information indicates that the accessories to be tested are the remote control of the first port and the power distribution box of the second port. Electronic device 101 generates a control command based on the test information and then sends the control command to electronic device 201. After receiving the control command, electronic device 201 enables the remote control of the first port and the power distribution box of the second port according to the control command and disables accessories of other ports. Then, electronic device 201 detects the corresponding presence signal of each port and generates presence information indicating that the wireless access point device of the first port and the power distribution box of the second port are being used based on the detected presence signals of the first port and the second port. Finally, electronic device 201 sends the presence information to electronic device 101. Electronic device 101 compares the in-situ information and accessory test information to determine that the in-situ information of the wireless access point device on the first port and the power distribution box on the second port being in use is inconsistent with the accessory test information of the remote control on the first port and the power distribution box on the second port. Therefore, it can be determined that the test result of the electronic device 201 being electrically connected to the remote control on the first port and electrically connected to the power distribution box on the second port is a test failure.

[0112] This application also provides a storage medium. The storage medium stores computer instructions that, when executed on a processor (which may include processor 22 or processor 32), enable the processor to perform the accessory in-situ testing method provided in the foregoing embodiments.

[0113] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application and are not intended to limit it. Although this application has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this application without departing from the spirit and scope of the technical solutions of this application.

Claims

1. A method of in-situ testing of a fitting, characterized by, The method is applied to a test device, and the method comprises: obtaining accessory test information, and generating a control instruction according to the accessory test information, the accessory test information being used to indicate accessories to be tested corresponding to each port of a device to be tested; sending the control instruction to the device to be tested, the control instruction being used to instruct the device to be tested to enable the accessories to be tested corresponding to each port and disable non-accessories to be tested corresponding to each port; obtaining in-position information detected by the device to be tested, the in-position information being used to indicate the enabled accessories detected by the device to be tested; determining a test result corresponding to the accessory test information according to the in-position information and the accessory test information, wherein when the in-position information matches the accessory test information, it is determined that an arrangement and combination of the accessories to be tested corresponding to the accessory test information does not cause the device to be tested to have a communication failure; when the in-position information does not match the accessory test information, it is determined that the arrangement and combination of the accessories to be tested corresponding to the accessory test information causes the device to be tested to have a communication failure.

2. The method of claim 1, wherein, The method comprises: sending an information acquisition request to a server, the information acquisition request being used to request the server to return in-position information uploaded to the server by the device to be tested; and receiving the in-position information sent by the server.

3. A method of in-place testing of a fitting, the method comprising: The method is applied to a device to be tested, and the method comprises: receiving a control instruction sent by a test device, the control instruction carrying accessory test information, the accessory test information being used to indicate accessories to be tested corresponding to each port of the device to be tested; enabling the accessories to be tested corresponding to each port and disabling non-accessories to be tested corresponding to each port; detecting in-position signals corresponding to each port and generating in-position information according to the in-position signals corresponding to each port; sending the in-position information to the test device, so that the test device determines a test result corresponding to the accessory test information according to the in-position information and the accessory test information, wherein when the in-position information matches the accessory test information, it is determined that an arrangement and combination of the accessories to be tested corresponding to the accessory test information does not cause the device to be tested to have a communication failure; when the in-position information does not match the accessory test information, it is determined that the arrangement and combination of the accessories to be tested corresponding to the accessory test information causes the device to be tested to have a communication failure.

4. The method of claim 3, wherein, The method comprises: sending an enable instruction to each accessory to be tested corresponding to each port and sending a mute instruction to each non-accessory to be tested corresponding to each port; wherein the enable instruction is used to instruct the accessory to be tested to send an in-position signal to the device to be tested, and the mute instruction is used to instruct the non-accessory to be tested to stop sending an in-position signal to the device to be tested. The method comprises:

5. The method of claim 3, wherein, ​ controlling a switch circuit connected to each of the ports to close a switch connected to the accessory to be tested and to open a switch connected to the accessory not to be tested.

6. An electronic device comprising a processor and a memory, characterized in that The memory is configured to store instructions, and the processor is configured to invoke the instructions in the memory to cause the electronic device to perform the method of any one of claims 1-2.

7. An electronic device comprising a processor and a memory, characterized in that The electronic device includes a plurality of ports, each of which is configured to connect to a different type of accessory, the memory is configured to store instructions, and the processor is configured to invoke the instructions in the memory to cause the electronic device to perform the method of any one of claims 3-5.

8. A test system, characterized by The electronic device includes a plurality of ports, each of which is configured to connect to a different type of accessory, the memory is configured to store instructions, and the processor is configured to invoke the instructions in the memory to cause the electronic device to perform the method of any one of claims 3-5.

9. A computer readable storage medium having stored thereon at least one computer instruction, characterized in that, The computer instructions are loaded by a processor and used to perform the method of any one of claims 1-5.

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