Automated test system and method for electrical characteristics of a pulse generator

Abstract

The application provides an automatic test system and method for pulse generator electrical characteristics, which is used for detecting a measured device by cooperating with a signal generator, an oscilloscope and a program control device. The automatic test system comprises a test unit and a test tool. The test unit is used for sending a test instruction to the test tool and the program control device. The test instruction comprises a test tool configuration instruction and a program control adjustment instruction. The test tool is used for configuring a corresponding test mode according to the test tool configuration instruction. The program control device is used for configuring a corresponding working mode of the measured device according to the program control adjustment instruction. The signal generator is used for sending a test signal to the measured device through the test tool. The oscilloscope is used for testing a signal transmitted by the measured device and a signal emitted by the signal generator through the test tool, so as to complete the automatic test of the electrical characteristics of the measured device. The automatic test system and method provided by the application have low manual participation, save time and labor, have high test speed and high accuracy, and have high repeatability.

Description

Technical Field

[0001] This invention relates to the field of implantable medical device technology, and in particular to an automated testing system and method for the electrical characteristics of a pulse generator. Background Technology

[0002] A pacemaker is an effective way to treat bradycardia. It delivers electrical pulses powered by a battery through an implanted pulse generator. These pulses are conducted through electrode wires to stimulate the myocardium in contact with the electrodes, causing the heart to beat and contract, thereby achieving the purpose of treating diseases such as bradycardia.

[0003] Cardiac pacemakers are classified as high-risk Class III medical devices. To ensure the safety and reliability of product implantation, in accordance with the requirements of the national mandatory standard GB16174.2—2015, the electrical characteristics of the pulse generator need to be tested during the type testing and production processes. This regulation also specifies the required test items and test methods for the pulse generator.

[0004] Traditional pulse generator electrical characteristic testing involves manual connection and testing. The tester must connect test leads, set up the signal generator, observe and read the oscilloscope readings according to different test items, and then manually interpret the test results. This testing method has high human involvement and suffers from drawbacks such as slow measurement speed, low accuracy, and poor repeatability. Summary of the Invention

[0005] The purpose of this invention is to provide an automated testing system and method for the electrical characteristics of a pulse generator, which has the advantages of low human intervention, time and labor saving, high accuracy and high repeatability.

[0006] To address the aforementioned technical problems, this invention provides an automated testing system for the electrical characteristics of a pulse generator. This system, used in conjunction with a signal generator, an oscilloscope, and a programmable control device compatible with the device under test (DUT), is used to test the DUT. The system includes a testing unit and testing fixtures; wherein...

[0007] The test unit is communicatively connected to the test fixture, the signal generator, the oscilloscope, and the programmable control device, respectively.

[0008] The testing unit is used to send test instructions to the testing fixture and the programmable control device. The test instructions include testing fixture configuration instructions and programmable control adjustment instructions. The testing fixture is used to configure the corresponding test mode according to the testing fixture configuration instructions. The programmable control device is used to configure the corresponding working mode of the device under test according to the programmable control adjustment instructions.

[0009] The signal generator is used to send test signals to the device under test through the test fixture, and the oscilloscope is used to test the signals transmitted by the device under test and the signals emitted by the signal generator through the test fixture.

[0010] Optionally, the test fixture includes a communication circuit, a microprocessor and a switch control resistor network connected in sequence, and a power supply that supplies power to the communication circuit, the microprocessor and the switch control resistor network respectively.

[0011] The communication circuit is connected to the test unit and is used to receive test fixture configuration instructions sent by the test unit;

[0012] The microprocessor is used to receive the test fixture configuration instruction received by the communication circuit and parse it into a specific status instruction corresponding to the switch control resistor network.

[0013] The switch control resistor network is used to adjust to the corresponding test mode according to the specific state instruction corresponding to the switch control resistor network obtained by the microprocessor, receive the test signal sent by the signal generator and transmit it to the device under test, and receive the output signal of the device under test and transmit it to the oscilloscope.

[0014] Optionally, the test fixture is also used to receive the output signal of the device under test as a trigger signal and send it to the signal generator.

[0015] Optionally, the switch control resistor network includes at least one test network, the number of which is consistent with the number of chambers in the device under test.

[0016] Optionally, the test network includes five resistors and seven switches connected to each other, and the test network is connected to the output channel of the signal generator, the input channel of the signal generator, the input channel of the oscilloscope, and the device under test;

[0017] The system includes a first switch to control whether the signal generator is connected to the test network; a second, third, and fourth switch to control whether the second, third, and fourth resistors are connected; a fifth switch to control whether the fifth resistor is short-circuited; a sixth switch to control whether the test network transmits an external trigger signal to the signal generator; and a seventh switch to control whether the first resistor is short-circuited. The second, third, and fourth resistors are load resistors. The first resistor is connected to the output channel of the signal generator through the first switch. The fifth resistor is connected to the device under test. The first and fifth resistors are connected in series and in parallel with the second, third, and fourth resistors.

[0018] Optionally, the first terminal of the first switch is connected to the output channel of the signal generator, the second terminal is connected to the first terminal of the first resistor and the input channel of the oscilloscope, and the second terminal of the first resistor is connected to the first terminals of the second switch, the third switch and the fourth switch, and the first terminal of the fifth resistor;

[0019] The second terminal of the second switch is connected to the first terminal of the second resistor, the second terminal of the third switch is connected to the first terminal of the third resistor, the second terminal of the fourth switch is connected to the first terminal of the fourth resistor, and the second terminals of the second resistor, the third resistor, and the fourth resistor are connected to the negative terminal of the power supply.

[0020] The seventh switch is connected in parallel with the first resistor, and the fifth switch is connected in parallel with the fifth resistor;

[0021] The second end of the first resistor, the first end of the second switch, the first end of the third switch, the first end of the fourth switch, and the first end of the fifth resistor are all connected to the second end of the sixth switch. The first end of the sixth switch is connected to the input channel of the signal generator as an external trigger signal.

[0022] One end of the device under test is connected to the second end of the fifth resistor and the input channel of the oscilloscope, and the other end of the device under test is connected to the negative terminal of the power supply.

[0023] Optionally, the switch control resistor network includes two test networks, namely an atrial test network and a ventricular test network. The atrial test network is used to test the output of the atrial cavity of the device under test, and the ventricular test network is used to test the output of the ventricular cavity of the device under test.

[0024] Optionally, the output channels of the signal generator include a first output channel and a second output channel of the signal generator, and the input channels of the oscilloscope include a first input channel, a second input channel, a third input channel, and a fourth input channel of the oscilloscope. The atrial test network is connected to the first output channel of the signal generator, the input channel of the signal generator, the first input channel of the oscilloscope, the second input channel of the oscilloscope, and the atrial cavity of the device under test.

[0025] The ventricular test network is connected to the second output channel of the signal generator, the input channel of the signal generator, the third input channel of the oscilloscope, the fourth input channel of the oscilloscope, and the ventricular cavity of the device under test.

[0026] Optionally, the first resistor has a resistance of 100kΩ, the second resistor has a resistance of 500Ω, the third resistor has a resistance of 240Ω, the fourth resistor has a resistance of 1000Ω, and the fifth resistor has a resistance of 100kΩ.

[0027] Optionally, the test unit is communicatively connected to the oscilloscope and the signal generator via a network switch, and the network switch is used to transmit the test results of the oscilloscope to the test unit.

[0028] Optionally, the test unit is connected to the test fixture and the programmable device via an RS232 serial cable; the test unit is connected to the network switch via a Cat5 network cable; the network switch is connected to the signal generator and the oscilloscope via a Cat5 network cable; the signal generator and the oscilloscope are connected to the test fixture via test leads; the test fixture is connected to the device under test via test leads; and the programmable device is wirelessly connected to the device under test.

[0029] Optionally, the test unit is equipped with host computer software, and the operation flow of the host computer software includes:

[0030] Configure the working mode of the device under test according to the test item;

[0031] Send test fixture configuration instructions according to the test project;

[0032] Reread the test mode of the test fixture;

[0033] Determine if the readback status matches the test fixture configuration command; if they match, start automated testing; if they do not match, determine if the number of inconsistencies is greater than N consecutive times; if it is greater than N, prompt an error; if it is less than or equal to N, resend the test fixture configuration command according to the test items.

[0034] N is a positive integer greater than or equal to 2.

[0035] Accordingly, the present invention also provides an automated testing method for the electrical characteristics of a pulse generator, which employs the automated testing system for the electrical characteristics of a pulse generator as described above. The automated testing method includes:

[0036] The testing unit sends the test command to the test fixture and the programmable control device. The test fixture configures the corresponding test mode according to the test fixture configuration command of the test command, and the programmable control device configures the working mode of the device under test according to the programmable control adjustment command of the test command.

[0037] The signal generator sends a test signal to the device under test through the test fixture, and the oscilloscope tests the signal transmitted from the device under test and the signal transmitted from the signal generator through the test fixture.

[0038] Optionally, it also includes: a network switch transmitting the test results of the oscilloscope to the test unit.

[0039] Optionally, when measuring atrial pulse amplitude, pulse width, pulse frequency, and pulse interval, the first and sixth switches are disconnected, and the signal generator is completely disconnected from the test network; the fifth switch is closed, and the output of the atrial cavity of the device under test is loaded onto the load resistor; the seventh switch is closed, and the second input channel of the oscilloscope tests the output signal of the atrial cavity of the device under test; the second, third, and fourth switches are closed in sequence, and different load resistors are selected for testing.

[0040] Optionally, during atrial sensitivity testing, the third and fourth switches are disconnected, the second switch is closed, and the second resistor is selected as the load resistor; the sixth switch is disconnected to disable the external trigger function of the signal generator; the first switch is closed, the seventh switch is disconnected, and the output signal of the first output channel of the signal generator is loaded onto the load resistor through the first resistor, and the first input channel of the oscilloscope tests the output signal of the signal generator; the fifth switch is closed, and the second input channel of the oscilloscope tests the output signal of the atrial cavity of the device under test on the load resistor.

[0041] Optionally, when performing atrial input impedance testing, the third and fourth switches are disconnected, the second switch is closed, and the second resistor is selected as the load resistor; the sixth switch is disconnected to disable the external trigger function of the signal generator; the first switch is closed, the seventh switch is disconnected, and the signal output from the first output channel of the signal generator is loaded onto the load resistor through the first resistor; the first input channel of the oscilloscope tests the output signal of the signal generator; the second input channel of the oscilloscope tests the output signal of the atrial cavity of the device under test; by closing and opening the fifth switch, the amplitudes V1 and V2 of the oscilloscope are read respectively, and the input impedance of the atrial cavity of the device under test is calculated.

[0042] Optionally, the formula for calculating the input impedance is:

[0043]

[0044]

[0045] Where Z is an intermediate quantity, R5 is the resistance value of the fifth resistor, and R S It is the input resistance of the oscilloscope input channel.

[0046] Optionally, when measuring the refractory period of the postventricular atrium, in the atrial test network, the third and fourth switches are disconnected, the second switch is closed, and the second resistor is selected as the load resistor; the sixth and seventh switches are closed, the external trigger of the signal generator is turned off, and the first input channel of the oscilloscope tests the output signal of the atrial cavity of the device under test; the first switch is closed, and the output signal of the first output channel of the signal generator is loaded onto the load resistor through the first resistor; the fifth switch is closed, and the atrial cavity output of the device under test is loaded onto the load resistor; in the ventricular test network, the first switch is disconnected, the sixth switch is closed, and the signal generator uses the output signal of the ventricular cavity of the device under test as the external trigger signal; the second switch is closed, the third and fourth switches are disconnected, and the second resistor is selected as the load resistor; the fifth switch is closed, and the ventricular cavity output of the device under test is directly loaded onto the load resistor; the seventh switch is closed, and the third input channel of the oscilloscope tests the output signal of the ventricular cavity of the device under test.

[0047] In summary, the automated testing system and method for the electrical characteristics of a pulse generator provided by this invention involves a testing unit sending test commands to a test fixture and a programmable control device. These test commands include test fixture configuration commands and programmable control adjustment commands. The test fixture configures a corresponding test mode according to the test fixture configuration commands, and the programmable control device configures the corresponding operating mode of the device under test according to the programmable control adjustment commands. A signal generator sends test signals to the device under test through the test fixture, and an oscilloscope tests the signals transmitted by the device under test and the signals emitted by the signal generator through the test fixture, thus completing the automated testing of the electrical characteristics of the device under test. The automated testing system and method provided by this invention have low manual intervention, save time and effort, have high testing speed, high accuracy, and high repeatability. Attached Figure Description

[0048] Those skilled in the art will understand that the accompanying drawings are provided to better understand the invention and do not constitute any limitation on the scope of the invention. Wherein:

[0049] Figure 1 This is a structural block diagram of an automated testing system for the electrical characteristics of a pulse generator provided in an embodiment of the present invention.

[0050] Figure 2 This is a structural block diagram of a test fixture provided in an embodiment of the present invention.

[0051] Figure 3 This is a schematic diagram of a switch control resistor network provided in an embodiment of the present invention.

[0052] Figure 4 This is a schematic diagram of a switch control resistor network provided in another embodiment of the present invention.

[0053] Figure 5 This is a flowchart of the operation of the host computer software provided in an embodiment of the present invention.

[0054] In the attached image:

[0055] 10-Test unit; 20-Test fixture; 21-Communication circuit; 22-Microprocessor; 23-Switch control resistor network; 231-Atrial test network; 232-Ventricular test network; 24-Power supply; 30-Network switch; 40-Signal generator; 50-Oscilloscope; 60-Programmable device; 70-Device under test. Detailed Implementation

[0056] To make the objectives, advantages, and features of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that the drawings are all in a very simplified form and are not drawn to scale, and are only used to facilitate and clarify the explanation of the embodiments of this invention. Furthermore, the structures shown in the drawings are often part of the actual structures. In particular, different figures may emphasize different aspects and may sometimes use different scales.

[0057] As used in this invention, the singular forms “a,” “an,” and “the” include plural objects; the term “or” is generally used to mean “and / or”; the term “a number” is generally used to mean “at least one”; the term “at least two” is generally used to mean “two or more”; furthermore, the terms “first,” “second,” and “third” are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, features defined as "first," "second," and "third" may explicitly or implicitly include one or at least two of those features. The term "proximal" usually refers to the end closer to the operator, and the term "distal" usually refers to the end closer to the patient. "One end" and "the other end," as well as "proximal" and "distal," usually refer to two corresponding parts, which include not only the endpoints. The terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can be fixed connections, detachable connections, or integral connections; they can be mechanical connections or electrical connections; they can be direct connections or indirect connections through an intermediate medium; they can be internal connections between two components or the interaction between two components.

[0058] Furthermore, as used in this invention, the phrase "one element is disposed on another element" generally only indicates that there is a connection, coupling, cooperation, or transmission relationship between the two elements, and the connection, coupling, cooperation, or transmission between the two elements can be direct or indirect through an intermediate element. It should not be construed as indicating or implying a spatial positional relationship between the two elements, i.e., one element can be located arbitrarily inside, outside, above, below, or to one side of the other element, unless otherwise explicitly stated. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0059] Figure 1 This is a structural block diagram of an automated testing system for the electrical characteristics of a pulse generator according to an embodiment of the present invention. Please refer to... Figure 1 As shown, this invention provides an automated testing system for the electrical characteristics of a pulse generator. This system, in conjunction with a signal generator 40, an oscilloscope 50, and a programmable control device 60 used with the device under test (DUT) 70, is used to test the DUT 70. The system includes a test unit 10 and a test fixture 20. In this embodiment, the DUT 70 is an implantable cardiac pacemaker (IPG).

[0060] The test unit 10 is communicatively connected to the test fixture 20, the signal generator 40, the oscilloscope 50, and the programmable device 60, respectively. The test fixture 20 is also communicatively connected to the device under test 70, the oscilloscope 50, and the signal generator 40, respectively.

[0061] The test unit 10 is used to send test instructions to the test fixture 20 and the programmable control device 60. The test instructions include test fixture configuration instructions and programmable control adjustment instructions. The test fixture 20 is used to configure the corresponding test mode according to the test fixture configuration instructions. The programmable control device 60 is used to configure the corresponding working mode of the device under test 70 according to the programmable control adjustment instructions.

[0062] The signal generator 40 is used to send test signals to the device under test 70 through the test fixture 20, and the oscilloscope 50 is used to test the signals transmitted by the device under test 70 and the signals emitted by the signal generator 40 through the test fixture 20.

[0063] In this embodiment, the test unit 10 is communicatively connected to the oscilloscope 50 and the signal generator 40 via a network switch 30. The network switch 30 is used to transmit the test results of the oscilloscope 50 to the test unit 10.

[0064] In this embodiment, the signal generator 40 is preferably a function generator, and the test unit 10 can be a test computer or test software located in a device with communication capabilities, such as a mobile phone. For example, the test unit 10 is connected to the test fixture 20 and the programmable device 60 via an RS232 serial cable; the test unit 10 is connected to the network switch 30 via a Cat5 network cable; the network switch 30 is connected to the signal generator 40 and the oscilloscope 50 via a Cat5 network cable; the signal generator 40 and the oscilloscope 50 are connected to the test fixture 20 via test leads; the test fixture 20 is connected to the device under test 70 via test leads; and the programmable device 60 is connected to the device under test 70 via a wireless connection.

[0065] Furthermore, this embodiment can also be used for measuring the electrical characteristics of non-implantable pulse generators, which will not be elaborated here.

[0066] The test unit 10, network switch 30, signal generator 40, and oscilloscope 50 are standard devices. The signal generator 40 and oscilloscope 50 need to support the Virtual Instrument Software Architecture Protocol (VISA) and Standard Programmable Instrument Command (SCPI). The test unit 10 can be used to configure the signal generator 40 and oscilloscope 50 and read test values. In this embodiment, the oscilloscope 50 has four channels, the signal generator 40 has two output channels, and it has an external trigger function, meeting the basic electrical performance testing requirements of the dual-cavity device under test 70.

[0067] The programmable controller 60 and the device under test 70 need to be used together. In this embodiment, the MicroPortCRM CPR3 universal magnetic induction programmable controller and the device under test are used.

[0068] Figure 2 This is a structural block diagram of a test fixture provided in an embodiment of the present invention. Please refer to it. Figure 2 As shown, the test fixture 20 includes: a communication circuit 21, a microprocessor (MCU) 22 and a switch control resistor network 23 connected in sequence, and a power supply 24 that supplies power to the communication circuit 21, the microprocessor 22 and the switch control resistor network 23 respectively.

[0069] The communication circuit 21 is connected to the test unit 10 and is used to receive the test fixture configuration command sent by the test unit 10; the microprocessor 22 is used to receive the test fixture configuration command received by the communication circuit 21 and parse it into a specific state command corresponding to the switch control resistor network 23; the switch control resistor network 23 is used to adjust to the corresponding test mode according to the specific state command corresponding to the switch control resistor network 23 parsed by the microprocessor 22, receive the test signal sent by the signal generator 40 and transmit it to the device under test 70, and receive the output signal of the device under test 70 and transmit it to the oscilloscope 50.

[0070] In this embodiment, the communication circuit 21 is connected to the microprocessor 22 via a UART serial port, and the microprocessor 22 is connected to the switch control resistor network 23 via an RS232 serial port.

[0071] The test fixture 20 is also used to receive the output signal of the device under test 70 as a trigger signal and send it to the signal generator 40.

[0072] The switch control resistor network 23 includes at least one test network. The number of test networks is greater than the number of chambers in the device under test 70, or the number of test networks is equal to the number of chambers in the device under test 70. That is, the test networks correspond one-to-one with the chambers of the device under test 70, so that each chamber of the device under test 70 can be automatically tested. For example, when the pacemaker is single-chambered, the switch control resistor network 23 may include one test network; when the pacemaker is dual-chambered, the switch control resistor network 23 may include two test networks.

[0073] Figure 3 This is a schematic diagram of a switch control resistor network provided in an embodiment of the present invention. Please refer to it. Figure 3As shown, the switch control resistor network includes a test network comprising five resistors and seven switches connected to each other. The test network is connected to the output channel of the signal generator 40, the input channel of the signal generator 40, the input channel of the oscilloscope 50, such as the first input channel CH1 and the second input channel CH2, and the device under test 70. The first switch S1 controls whether the signal generator 40 is connected to the test network; the second switch S2, the third switch S3, and the fourth switch S4 control whether the second resistor R2, the third resistor R3, and the fourth resistor R4 are connected; the fifth switch S5 controls whether the fifth resistor R5 is short-circuited; the sixth switch S6 controls whether the test network transmits an external trigger signal to the signal generator 40; and the seventh switch S7 controls whether the first resistor R1 is short-circuited. The second resistor R2, the third resistor R3, and the fourth resistor R4 are load resistors. The first resistor R1 is connected to the output channel of the signal generator 40 through the first switch S1, and the fifth resistor R5 is connected to the device under test 70. The first resistor R1 and the fifth resistor R5 are connected in series and in parallel with the second resistor R2, the third resistor R3, and the fourth resistor R4.

[0074] Specifically, the first terminal of the first switch S1 is connected to the output channel of the signal generator 40, and the second terminal is connected to the first terminal of the first resistor R1 and the first input channel of the oscilloscope 50. The second terminal of the first resistor R1 is connected to the first terminals of the second switch S2, the third switch S3, and the fourth switch S4, as well as the first terminal of the fifth resistor R5. The second terminal of the second switch S2 is connected to the first terminal of the second resistor R2, the second terminal of the third switch S3 is connected to the first terminal of the third resistor R3, and the second terminal of the fourth switch S4 is connected to the first terminal of the fourth resistor R4. The second terminals of the second resistor R2, the third resistor R3, and the fourth resistor R4 are connected to the negative terminal of the power supply (i.e., ground). The seventh switch S7 is connected in parallel with the first resistor R1, and the fifth switch S5 is connected in parallel with the fifth resistor R5. The second terminal of the first resistor R1, the first terminal of the second switch S2, the first terminal of the third switch S3, the first terminal of the fourth switch S4, and the first terminal of the fifth resistor R5 are all connected to the second terminal of the sixth switch S6. The first terminal of the sixth switch S6 is connected to the input channel of the signal generator 40 as an external trigger signal. One end of the device under test 70 is connected to the second terminal of the fifth resistor R5 and the second input channel of the oscilloscope 50, and the other end of the device under test 70 is connected to the negative terminal of the power supply.

[0075] Figure 4This is a schematic diagram of a switch-controlled resistor network provided in another embodiment of the present invention. In this embodiment, the switch-controlled resistor network includes two test networks: an atrial test network and a ventricular test network. Please refer to... Figure 4 As shown, referring to standard GB16174.2—2015, the switch control resistor network 23 includes an atrial test network 231 and a ventricular test network 232 with the same configuration. The upper part of the atrial test network 231 is used to test the output of the atrial cavity of the device under test, and the lower part of the ventricular test network 232 is used to test the output of the ventricular cavity of the device under test.

[0076] The output channels of the signal generator 40 include the first output channel CH1 and the second output channel CH2 of the signal generator 40, and the input channels of the oscilloscope 50 include the first input channel CH1, the second input channel CH2, the third input channel CH3, and the fourth input channel CH3 of the oscilloscope 50.

[0077] Please refer to Figure 4 As shown, the atrial test network 231 includes five resistors and seven switches connected to each other. The atrial test network 231 is connected to the first output channel CH1 of the signal generator 40, the input channel of the signal generator 40, the first input channel CH1 of the oscilloscope 50, the second input channel CH2 of the oscilloscope 50, and the atrial cavity of the device under test. The system includes a first switch (S11) for controlling whether the signal generator 40 is connected to the atrial test network; a second switch (S12), a third switch (S13), and a fourth switch (S14) for controlling whether the second resistor R12, the third resistor R13, and the fourth resistor R14 are connected; a fifth switch (S15) for controlling whether the fifth resistor R15 is short-circuited; a sixth switch (S16) for controlling whether the atrial test network transmits an external trigger signal to the signal generator 40; and a seventh switch (S17) for controlling whether the first resistor R11 is short-circuited. The second resistor R12, the third resistor R13, and the fourth resistor R14 are load resistors. The first resistor R11 is connected to the first output channel of the signal generator 40 via the first switch (S11). The fifth resistor R15 is connected to the atrial cavity of the device under test. The first resistor R11 and the fifth resistor R15 are connected in series and in parallel with the second resistor R12, the third resistor R13, and the fourth resistor R14.

[0078] Specifically, the first terminal of the first switch S11 is connected to the first output channel CH1 of the signal generator 40, and the second terminal is connected to the first terminal of the first resistor R11 and the first input channel CH1 of the oscilloscope 50. The second terminal of the first resistor R11 is connected to the first terminals of the second switch S12, the third switch S13, and the fourth switch S14, as well as the first terminal of the fifth resistor R15. The second terminal of the second switch S12 is connected to the first terminal of the second resistor R12, the second terminal of the third switch S13 is connected to the first terminal of the third resistor R13, and the second terminal of the fourth switch S14 is connected to the first terminal of the fourth resistor R14. The second terminals of the second resistor R12, the third resistor R13, and the fourth resistor R14 are grounded (i.e., connected to the negative terminal of the power supply). The seventh switch S17 is connected in parallel with the first resistor R11, and the fifth switch S15 is connected in parallel with the fifth resistor R15. The second terminal of the fifth resistor R15 is connected to the second input channel CH2 of the oscilloscope 50. The first and second ends of the first resistor R11 are respectively connected to the first and second ends of the seventh switch S17, and the first and second ends of the fifth resistor R15 are respectively connected to the first and second ends of the fifth switch S15. The second end of the first resistor R11, the second switch S12, the third switch S13, the fourth switch S14, and the first end of the fifth resistor R15 are all connected to the second end of the sixth switch S16. The first end of the sixth switch S16 is connected to the signal generator 40 as an external trigger signal. One end of the atrial cavity of the device under test is connected to the second end of the fifth resistor R15 and the second channel CH2 of the oscilloscope 50, and the other end of the atrial cavity of the device under test is connected to the negative terminal of the power supply.

[0079] The second resistor R12, the third resistor R13, and the fourth resistor R14 are load resistors. For example, the resistance of the second resistor R12 is 500Ω, the resistance of the third resistor R13 is 240Ω, and the resistance of the fourth resistor R14 is 1000Ω. The resistance of the first resistor is 100kΩ, and the resistance of the fifth resistor is 100kΩ. However, this is not a limitation.

[0080] In the switch-controlled resistor network 23, the lower half of the ventricular test network 232 has the same structure as the upper half of the atrial test network 231. The ventricular test network 232 includes five resistors and seven switches connected to each other. The ventricular test network 232 is connected to the second output channel CH2 of the signal generator 40, the input channel of the signal generator 40, the third input channel CH3 and the fourth input channel CH4 of the oscilloscope 50, and the ventricular cavity of the device under test. The circuit consists of several switches: a first switch (S21) for controlling whether the signal generator 40 is connected to the ventricular testing network; a second switch (S22), a third switch (S23), and a fourth switch (S24) for controlling whether the second resistor R22, the third resistor R23, and the fourth resistor R24 ​​are connected; a fifth switch (S25) for controlling whether the fifth resistor R25 is short-circuited; a sixth switch (S26) for controlling whether the ventricular testing network transmits an external trigger signal to the signal generator 40; and a seventh switch (S27) for controlling whether the first resistor R21 is short-circuited. The second resistor R22, the third resistor R23, and the fourth resistor R24 ​​are load resistors. The first resistor R21 is connected to the second output channel of the signal generator 40 via the first switch (S21). The fifth resistor R25 is connected to the ventricular cavity of the device under test. The first resistor R21 and the fifth resistor R25 are connected in series and in parallel with the second resistor R22, the third resistor R23, and the fourth resistor R24.

[0081] Specifically, the first terminal of the first switch S21 is connected to the second output channel CH2 of the signal generator 40, and the second terminal is connected to the first terminal of the first resistor R21 and the third input channel CH3 of the oscilloscope 50. The second terminal of the first resistor R21 is connected to the first terminals of the second switch S22, the third switch S23, and the fourth switch S24, as well as the first terminal of the fifth resistor R25. The second terminal of the second switch S22 is connected to the first terminal of the second resistor R22, the second terminal of the third switch S23 is connected to the first terminal of the third resistor R23, and the second terminal of the fourth switch S24 is connected to the first terminal of the fourth resistor R24. The second terminals of the second resistor R22, the third resistor R23, and the fourth resistor R24 ​​are grounded. The seventh switch S27 is connected in parallel with the first resistor R21, and the fifth switch S25 is connected in parallel with the fifth resistor R25. The second terminal of the fifth resistor R25 is connected to the fourth input channel CH4 of the oscilloscope 50. The first and second ends of the first resistor R21 are respectively connected to the first and second ends of the seventh switch S27, and the first and second ends of the fifth resistor R25 are respectively connected to the first and second ends of the fifth switch S25. The second end of the first resistor R21, the second switch S22, the third switch S23, the fourth switch S24, and the first end of the fifth resistor R25 are all connected to the second end of the sixth switch S26. The first end of the sixth switch S26 is connected to the signal generator 40 as an external trigger signal. One end of the ventricular cavity of the device under test is connected to the second end of the fifth resistor R25 and the fourth input channel CH4 of the oscilloscope 50, and the other end of the ventricular cavity of the device under test is connected to the negative terminal of the power supply 24.

[0082] The second resistor R22, the third resistor R23, and the fourth resistor R24 ​​are load resistors. For example, the resistance of the second resistor R22 is 500Ω, the resistance of the third resistor R23 is 240Ω, and the resistance of the fourth resistor R24 ​​is 1000Ω. The resistance of the first resistor is 100kΩ, and the resistance of the fifth resistor is 100kΩ. However, this is not a limitation.

[0083] Please refer to Figure 4As shown, when measuring atrial pulse amplitude, pulse width, pulse frequency, and pulse interval, the first switch S11 and the sixth switch S16 are disconnected, and the signal generator 40 is completely disconnected, so this test is not required; the fifth switch S15 is closed, and the atrial cavity output of the device under test is directly applied to the load resistor; the seventh switch S17 is closed, and the second input channel CH2 of the oscilloscope 50 tests the atrial cavity output signal of the device under test; the second switch S12, the third switch S13, and the fourth switch S14 are closed in sequence, and different load resistors are selected for testing.

[0084] During atrial sensitivity testing, the third switch S13 and the fourth switch S14 are open, the second switch S12 is closed, and the second resistor R12 is selected as the load resistor; the sixth switch S16 is open, turning off the external triggering of the signal generator 40; the first switch S11 is closed, the seventh switch S17 is open, and the output signal of the first output channel CH1 of the signal generator 40 is applied to the load resistor (i.e., the second resistor R12) through the first resistor R11; the first input channel CH1 of the oscilloscope 50 tests the output signal of the signal generator 40; the fifth switch S15 is closed, and the second input channel CH2 of the oscilloscope 50 tests the output signal of the atrial cavity of the device under test on the load resistor (i.e., the second resistor R12).

[0085] During atrial input impedance testing, the third switch S13 and the fourth switch S14 are open, the second switch S12 is closed, and the second resistor R12 is selected as the load resistor; the sixth switch S16 is open, turning off the external triggering of the signal generator 40; the first switch S11 is closed, the seventh switch S17 is open, and the signal output from the first output channel CH1 of the signal generator 40 is loaded onto the load resistor (i.e., the second resistor R12) through the first resistor R11; the first input channel CH1 of the oscilloscope 50 tests the output signal of the signal generator 40; the second input channel CH2 of the oscilloscope 50 tests the output signal of the atrial cavity of the device under test; by closing and opening the fifth switch S15, the amplitudes V1 and V2 of the oscilloscope 50 are read respectively, and the input impedance of the atrial cavity of the device under test is calculated.

[0086] The formula for calculating the input impedance is:

[0087]

[0088]

[0089] Where Z is an intermediate quantity, R5 is the resistance value of the fifth resistor, and RS It is the input resistance of the input channel of the oscilloscope 50.

[0090] When measuring the refractory period of the postventricular atrium, in the atrial test network 231, the third switch S13 and the fourth switch S14 are open, the second switch S12 is closed, and the second resistor R12 is selected as the load resistor; the sixth switch S16 and the seventh switch S17 are closed, turning off the external trigger of the signal generator 40, and the first channel CH1 of the oscilloscope 50 tests the output signal of the atrial cavity of the device under test; the first switch S11 is closed, and the output signal of the first output channel CH1 of the signal generator 40 is loaded onto the load resistor (i.e., the second resistor S12) through the first resistor R11; the fifth switch S15 is closed, and the atrial cavity output of the device under test... The output signal is loaded onto the load resistor (i.e., the second resistor S12); in the ventricular test network 232, the first switch S21 is open, the sixth switch S26 is closed, and the signal generator 40 uses the output signal of the ventricular cavity of the device under test as an external trigger signal; the second switch S22 is closed, the third switch S23 and the fourth switch S24 are open, and the second resistor R22 is selected as the load resistor; the fifth switch S25 is closed, and the output signal of the ventricular cavity of the device under test is directly loaded onto the load resistor (i.e., the second resistor S22); the seventh switch S27 is closed, and the third channel CH3 of the oscilloscope 50 tests the output signal of the ventricular cavity of the device under test.

[0091] The automated testing system for the electrical characteristics of the pulse generator also includes a host computer system located within the testing unit 10. The host computer system sends test commands to the testing fixture 20 and the programmable control device 60 to complete the aforementioned operations. The host computer system is developed based on LabVIEW, and the basic logic of the test algorithm is consistent with that specified in GB16174.2—2015. Figure 5 This is a flowchart of the operation of the host computer software provided in an embodiment of the present invention. Please refer to it. Figure 5 As shown, the operation flow of the host computer software includes:

[0092] Configure the working mode of the device under test according to the test item;

[0093] Send test fixture configuration instructions according to the test project;

[0094] Reread the test mode of the test fixture;

[0095] The system checks if the readback status matches the test fixture configuration command. If they match, automated testing begins. If they don't match, it checks if the number of consecutive inconsistencies exceeds N. If it exceeds N, an error is displayed. If it is less than or equal to N, the test fixture configuration command is resent according to the test items. N is a positive integer greater than or equal to 2.

[0096] To ensure the accuracy of communication between the host computer system and the test fixture 20, a mature communication protocol, such as the Modbus protocol, can be used. After configuring the test fixture 20, the accuracy of the configuration is confirmed a second time through a readback function, thereby improving the accuracy of the test.

[0097] In the automated testing system for the electrical characteristics of a pulse generator provided by this invention, the testing unit 10 is used to send test commands to the testing fixture 20 and the programmable control device 60. The test commands include testing fixture configuration commands and programmable control adjustment commands. The testing fixture 20 is used to configure a corresponding test mode according to the testing fixture configuration commands. The programmable control device 60 is used to configure a corresponding operating mode for the device under test (DUT) 70 according to the programmable control adjustment commands. The signal generator 40 is used to send test signals to the DUT 70 through the testing fixture 20. The oscilloscope 50 is used to test the signals transmitted by the DUT 70 and the signals emitted by the signal generator 40 through the testing fixture 20, thereby completing the automated testing of the electrical characteristics of the DUT 70. The automated testing system provided by this invention has low manual intervention, saves time and labor, has fast testing speed, high accuracy, and high repeatability.

[0098] Accordingly, the present invention also provides an automated testing method for the electrical characteristics of a pulse generator, using the automated testing system for the electrical characteristics of a pulse generator as described above. Please refer to... Figure 1 As shown, the automated testing method for the electrical characteristics of the pulse generator includes:

[0099] The test unit 10 sends test instructions to the test fixture 20 and the programmable control device 60. The test fixture 20 configures the corresponding test mode according to the test fixture configuration instructions of the test instructions, and the programmable control device 60 configures the working mode of the device under test 70 according to the programmable control adjustment instructions of the test instructions.

[0100] The signal generator 40 sends a test signal to the device under test 70 through the test fixture 20, and the oscilloscope 50 tests the signal transmitted from the device under test 70 and the signal transmitted from the signal generator 40 through the test fixture 20.

[0101] In this embodiment, the network switch 30 also transmits the test results of the oscilloscope 50 to the test unit 10.

[0102] Please refer to Figure 2 As shown, in the test fixture 20, the communication circuit 21 receives the test fixture configuration command sent by the test unit 10; the microprocessor 22 receives the test fixture configuration command received by the communication circuit 21 and parses it into a specific state command corresponding to the switch control resistor network 23; the switch control resistor network 23 adjusts to the corresponding test mode according to the specific state command corresponding to the switch control resistor network 23 parsed by the microprocessor 22, receives the test signal sent by the signal generator 40 and transmits it to the device under test 70, and receives the output signal of the device under test 70 and transmits it to the oscilloscope 50.

[0103] The test fixture 20 also receives the output signal of the device under test 70 as a trigger signal and sends it to the signal generator 40.

[0104] Please refer to Figure 4 As shown, when measuring atrial pulse amplitude, pulse width, pulse frequency, and pulse interval, the first switch S11 and the sixth switch S16 are disconnected, and the signal generator 40 is completely disconnected, as it is not needed for this test; the fifth switch S15 is closed, and the atrial cavity output of the device under test is directly applied to the load resistor; the seventh switch S17 is closed, and the second output channel CH2 of the oscilloscope 50 tests the atrial cavity output signal of the device under test; the second switch S12, the third switch S13, and the fourth switch S14 are closed in sequence, and different load resistors are selected for testing.

[0105] During atrial sensitivity testing, the third switch S13 and the fourth switch S14 are disconnected, the second switch S12 is closed, and the second resistor R12 is selected as the load resistor; the sixth switch S16 is disconnected to disable the external triggering of the signal generator 40; the first switch S11 is closed, the seventh switch S17 is disconnected, and the output signal of the first output channel CH1 of the signal generator 40 is applied to the load resistor (i.e., the second resistor R12) through the first resistor R11, and the first channel CH1 of the oscilloscope 50 tests the output signal of the signal generator 40; the fifth switch S15 is closed, and the second input channel CH2 of the oscilloscope 50 tests the output signal of the atrial cavity of the device under test on the load resistor (i.e., the second resistor R12).

[0106] When performing atrial input impedance testing, disconnect the third switch S13 and the fourth switch S14, close the second switch S12, and select the second resistor R12 as the load resistor; disconnect the sixth switch S16 to turn off the external trigger of the signal generator 40; close the first switch S11 and disconnect the seventh switch S17. The signal output from the first channel CH1 of the signal generator 40 is loaded onto the load resistor (i.e., the second resistor R12) through the first resistor R11. The first input channel CH1 of the oscilloscope 50 tests the output signal of the signal generator 40; the second input channel CH2 of the oscilloscope 50 tests the output signal of the atrial cavity of the device under test; by closing and opening the fifth switch S15, the amplitudes V1 and V2 of the oscilloscope 50 are read respectively, and the input impedance of the atrial cavity of the device under test is calculated.

[0107] The formula for calculating the input impedance is:

[0108]

[0109]

[0110] Where Z is an intermediate quantity, R5 is the resistance value of the fifth resistor, and R S It is the input resistance of the oscilloscope input channel.

[0111] When measuring the refractory period of the postventricular atrium, in the atrial test network 231, the third switch S13 and the fourth switch S14 are disconnected, the second switch S12 is closed, and the second resistor R12 is selected as the load resistor; the sixth switch S16 and the seventh switch S17 are closed, the external trigger of the signal generator 40 is turned off, and the first channel CH1 of the oscilloscope 50 tests the output signal of the atrial cavity of the device under test; the first switch S11 is closed, and the output signal of the first output channel CH1 of the signal generator 40 is loaded onto the load resistor (i.e., the second resistor S12) through the first resistor R11; the fifth switch S15 is closed, and the atrial cavity output of the device under test... The load is applied to the load resistor (i.e., the second resistor S12); in the ventricular test network 232, the first switch S21 is opened, the sixth switch S26 is closed, and the signal generator 40 uses the output signal of the ventricular cavity of the device under test as an external trigger signal; the second switch S22 is closed, the third switch S23 and the fourth switch S24 are opened, and the second resistor R22 is selected as the load resistor; the fifth switch S25 is closed, and the output of the ventricular cavity of the device under test is directly applied to the load resistor (i.e., the second resistor S22); the seventh switch S27 is closed, and the third input channel CH3 of the oscilloscope 50 tests the output signal of the ventricular cavity of the device under test.

[0112] In the automated testing method for the electrical characteristics of a pulse generator provided by this invention, the testing unit 10 sends test commands to the testing fixture 20 and the programmable control device 60. The test commands include testing fixture configuration commands and programmable control adjustment commands. The testing fixture 20 configures a corresponding test mode according to the testing fixture configuration commands, and the programmable control device 60 configures the corresponding operating mode of the device under test 70 according to the programmable control adjustment commands. The signal generator 40 sends test signals to the device under test 70 through the testing fixture 20. The oscilloscope 50 tests the signals transmitted by the device under test 70 and the signals emitted by the signal generator 40 through the testing fixture 20, thus completing the automated testing of the electrical characteristics of the device under test 70. The automated testing system provided by this invention has low manual intervention, saves time and effort, has fast testing speed, high accuracy, and high repeatability.

[0113] The above description is merely a description of preferred embodiments of the present invention and is not intended to limit the scope of the present invention. Any person skilled in the art can make possible changes and modifications to the technical solutions of the present invention by utilizing the methods and techniques disclosed above without departing from the spirit and scope of the present invention. Therefore, any simple modifications, equivalent changes and alterations made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solutions of the present invention shall fall within the protection scope of the technical solutions of the present invention.

Claims

1. An automated testing system for the electrical characteristics of a pulse generator, used in conjunction with a signal generator, an oscilloscope, and a programmable control device compatible with the device under test (DUT) for testing the DUT, characterized in that, include: Test units and test fixtures; among which, The test unit is communicatively connected to the test fixture, the signal generator, the oscilloscope, and the programmable control device, respectively. The testing unit is used to send test instructions to the testing fixture and the programmable control device. The test instructions include testing fixture configuration instructions and programmable control adjustment instructions. The testing fixture is used to configure the corresponding test mode according to the testing fixture configuration instructions. The programmable control device is used to configure the corresponding working mode of the device under test according to the programmable control adjustment instructions. The signal generator is used to send a test signal to the device under test through the test fixture, and the oscilloscope is used to test the signal transmitted by the device under test and the signal generated by the signal generator through the test fixture. The test fixture includes a communication circuit, a microprocessor and a switch control resistor network connected in sequence, and a power supply that supplies power to the communication circuit, the microprocessor and the switch control resistor network respectively. The communication circuit is connected to the test unit and is used to receive test fixture configuration instructions sent by the test unit; The microprocessor is used to receive the test fixture configuration instruction received by the communication circuit and parse it into a specific status instruction corresponding to the switch control resistor network. The switch control resistor network is used to adjust to the corresponding test mode according to the specific state instruction corresponding to the switch control resistor network obtained by the microprocessor, receive the test signal sent by the signal generator and transmit it to the device under test, and receive the output signal of the device under test and transmit it to the oscilloscope. The switch-controlled resistor network includes at least one test network; The test network includes five resistors and seven switches connected to each other, and the test network is connected to the output channel of the signal generator, the input channel of the signal generator, the input channel of the oscilloscope, and the device under test; The system includes a first switch to control whether the signal generator is connected to the test network; a second, third, and fourth switch to control whether the second, third, and fourth resistors are connected; a fifth switch to control whether the fifth resistor is short-circuited; a sixth switch to control whether the test network transmits an external trigger signal to the signal generator; and a seventh switch to control whether the first resistor is short-circuited. The second, third, and fourth resistors are load resistors. The first resistor is connected to the output channel of the signal generator through the first switch. The fifth resistor is connected to the device under test. The first and fifth resistors are connected in series and in parallel with the second, third, and fourth resistors.

2. The automated testing system for the electrical characteristics of a pulse generator according to claim 1, characterized in that, The test fixture is also used to receive the output signal of the device under test as a trigger signal and send it to the signal generator.

3. The automated testing system for the electrical characteristics of a pulse generator according to claim 1, characterized in that, The number of test networks is greater than or equal to the number of chambers in the device under test.

4. The automated testing system for the electrical characteristics of a pulse generator according to claim 1, characterized in that, The first terminal of the first switch is connected to the output channel of the signal generator, and the second terminal is connected to the first terminal of the first resistor and the input channel of the oscilloscope. The second terminal of the first resistor is connected to the first terminals of the second switch, the third switch, and the fourth switch, as well as the first terminal of the fifth resistor. The second terminal of the second switch is connected to the first terminal of the second resistor, the second terminal of the third switch is connected to the first terminal of the third resistor, the second terminal of the fourth switch is connected to the first terminal of the fourth resistor, and the second terminals of the second resistor, the third resistor, and the fourth resistor are connected to the negative terminal of the power supply. The seventh switch is connected in parallel with the first resistor, and the fifth switch is connected in parallel with the fifth resistor; The second end of the first resistor, the first end of the second switch, the first end of the third switch, the first end of the fourth switch, and the first end of the fifth resistor are all connected to the second end of the sixth switch. The first end of the sixth switch is connected to the input channel of the signal generator as an external trigger signal. One end of the device under test is connected to the second end of the fifth resistor and the input channel of the oscilloscope, and the other end of the device under test is connected to the negative terminal of the power supply.

5. The automated testing system for the electrical characteristics of a pulse generator according to claim 4, characterized in that, The switch control resistor network includes two test networks: an atrial test network and a ventricular test network. The atrial test network is used to test the output of the atrial cavity of the device under test, and the ventricular test network is used to test the output of the ventricular cavity of the device under test.

6. The automated testing system for the electrical characteristics of a pulse generator according to claim 5, characterized in that, The output channels of the signal generator include a first output channel and a second output channel of the signal generator. The input channels of the oscilloscope include a first input channel, a second input channel, a third input channel, and a fourth input channel of the oscilloscope. The atrial test network is connected to the first output channel of the signal generator, the input channel of the signal generator, the first input channel of the oscilloscope, the second input channel of the oscilloscope, and the atrial cavity of the device under test. The ventricular test network is connected to the second output channel of the signal generator, the input channel of the signal generator, the third input channel of the oscilloscope, the fourth input channel of the oscilloscope, and the ventricular cavity of the device under test.

7. The automated testing system for the electrical characteristics of a pulse generator according to claim 4, characterized in that, The first resistor has a resistance of 100kΩ, the second resistor has a resistance of 500Ω, the third resistor has a resistance of 240Ω, the fourth resistor has a resistance of 1000Ω, and the fifth resistor has a resistance of 100kΩ.

8. The automated testing system for the electrical characteristics of a pulse generator according to claim 1, characterized in that, The test unit is connected to the oscilloscope and the signal generator via a network switch, and the network switch is used to transmit the test results of the oscilloscope to the test unit.

9. The automated testing system for the electrical characteristics of a pulse generator according to claim 8, characterized in that, The test unit is connected to the test fixture and the programmable device via an RS232 serial cable; the test unit is connected to the network switch via a Cat5 network cable; the network switch is connected to the signal generator and the oscilloscope via a Cat5 network cable; the signal generator and the oscilloscope are connected to the test fixture via test leads; the test fixture is connected to the device under test via test leads; and the programmable device is wirelessly connected to the device under test.

10. The automated testing system for the electrical characteristics of a pulse generator according to claim 1, characterized in that, The test unit is equipped with host computer software, and the operation flow of the host computer software includes: Configure the working mode of the device under test according to the test item; Send test fixture configuration instructions according to the test project; Reread the test mode of the test fixture; Determine if the readback status matches the test fixture configuration command; if they match, start automated testing; if they do not match, determine if the number of inconsistencies is greater than N consecutive times; if it is greater than N, prompt an error; if it is less than or equal to N, resend the test fixture configuration command according to the test items. N is a positive integer greater than or equal to 2.

11. An automated testing method for the electrical characteristics of a pulse generator, characterized in that, The pulse generator electrical characteristics are tested using the automated testing system as described in claim 6, wherein the automated testing method includes: The testing unit sends the test command to the test fixture and the programmable control device. The test fixture configures the corresponding test mode according to the test fixture configuration command of the test command, and the programmable control device configures the working mode of the device under test according to the programmable control adjustment command of the test command. The signal generator sends a test signal to the device under test through the test fixture, and the oscilloscope tests the signal transmitted from the device under test and the signal transmitted from the signal generator through the test fixture.

12. The automated testing method for the electrical characteristics of a pulse generator according to claim 11, characterized in that, Also includes: The network switch transmits the test results from the oscilloscope to the test unit.

13. The automated testing method for the electrical characteristics of a pulse generator according to claim 11, characterized in that, When measuring atrial pulse amplitude, pulse width, pulse frequency, and pulse interval, disconnect the first switch and the sixth switch, and disconnect the signal generator from the test network. Close the fifth switch, and the output of the atrial cavity of the device under test is applied to the load resistor. Close the seventh switch, and the second input channel of the oscilloscope tests the output signal of the atrial cavity of the device under test. Close the second, third and fourth switches in sequence to select different load resistors for testing.

14. The automated testing method for the electrical characteristics of a pulse generator according to claim 11, characterized in that, When performing atrial sensitivity testing, disconnect the third and fourth switches, close the second switch, and select the second resistor as the load resistor. Disconnect the sixth switch to disable the external trigger function of the signal generator; close the first switch and disconnect the seventh switch. The output signal of the first output channel of the signal generator is applied to the load resistor through the first resistor, and the first input channel of the oscilloscope tests the output signal of the signal generator. When the fifth switch is closed, the second input channel of the oscilloscope tests the output signal of the atrial cavity of the device under test on the load resistor.

15. The automated testing method for the electrical characteristics of a pulse generator according to claim 11, characterized in that, When performing atrial input impedance testing, disconnect the third and fourth switches, close the second switch, and select the second resistor as the load resistor. Disconnect the sixth switch to disable the external trigger function of the signal generator; close the first switch and disconnect the seventh switch. The signal output from the first output channel of the signal generator is loaded onto the load resistor through the first resistor. The first input channel of the oscilloscope tests the output signal of the signal generator. The second input channel of the oscilloscope tests the output signal of the atrial cavity of the device under test. By closing and opening the fifth switch, the amplitudes V1 and V2 of the oscilloscope are read respectively, and the input impedance of the atrial cavity of the device under test is calculated.

16. The automated testing method for the electrical characteristics of a pulse generator according to claim 15, characterized in that, The formula for calculating the input impedance is: ； ； Where Z is an intermediate quantity. This is the resistance value of the fifth resistor, R. S It is the input resistance of the second input channel of the oscilloscope.

17. The automated testing method for the electrical characteristics of a pulse generator according to claim 11, characterized in that, When measuring the refractory period of the postventricular atrial cavity, in the atrial test network, the third and fourth switches are disconnected, the second switch is closed, and the second resistor is selected as the load resistor; the sixth and seventh switches are closed, the external trigger of the signal generator is turned off, and the first input channel of the oscilloscope tests the output signal of the atrial cavity of the device under test; the first switch is closed, and the output signal of the first output channel of the signal generator is loaded onto the load resistor through the first resistor; When the fifth switch is closed, the atrial cavity output of the device under test is applied to the load resistor; in the ventricular test network, when the first switch is opened and the sixth switch is closed, the signal generator uses the ventricular cavity output signal of the device under test as an external trigger signal; when the second switch is closed and the third and fourth switches are opened, the second resistor is selected as the load resistor; When the fifth switch is closed, the ventricular output of the device under test is directly applied to the load resistor. Close the seventh switch, and the third input channel of the oscilloscope will test the output signal of the ventricular cavity of the device under test.

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