Method and apparatus for detecting lid annealing coil adhesion defects

Abstract

The application discloses a method and device for detecting the bonding defect of a cover annealing coil, and the method comprises the following steps: obtaining an annealing coil, an elongation reference value and an elongation fluctuation value; detecting the elongation of the annealing coil to obtain an elongation detection value; determining an elongation fluctuation range according to the elongation reference value and the elongation fluctuation value; comparing the elongation detection value with the elongation fluctuation range to determine whether the annealing coil has a bonding defect. The application can improve the detection rate of the bonding defect.

Description

Technical Field

[0001] This invention relates to the field of annealed coil quality control technology, and in particular, to a method and apparatus for detecting bonding defects in hood-type annealed coils. Background Technology

[0002] Steel coils can be produced by sequentially performing annealing, leveling, and tin plating processes. The annealing process is completed using a bell-type annealing unit, which can adjust the mechanical properties of the steel coil. The leveling process is completed using a leveling unit to form a tin-plated substrate, which can improve the shape of the steel coil. The tin plating process is completed using a tin plating unit to process the tin-plated substrate.

[0003] Currently, when annealing steel coils in a bell-type annealing unit, the coils need to be stacked, i.e., pressing one coil against the end face of another coil and stacking them to a height of about 4 meters. Due to the large temperature difference between coils of different heights, and the temperature difference between different positions of the same coil, the temperature difference causes the steel strips of adjacent layers in adjacent coils to be squeezed and adhered to each other, forming adhesion defects, and even serious adhesion defects such as adhesion points and adhesion lines. The leveling unit is difficult to eliminate the above adhesion defects, resulting in adhesion defects on the tin-plated substrate. For tin-plated substrates with lower hardness and thinner thickness, such as tin-plated substrates with hardness ≤ T3 and thickness ≤ 0.25mm, the incidence of serious adhesion defects is even higher.

[0004] When tin plating units use tin-plated substrates with bonding defects, especially severe bonding defects, production stability is difficult to guarantee, and in severe cases, strip breakage may even occur. Therefore, in order to ensure the production stability of tin plating units, it is necessary to detect bonding defects, especially severe bonding defects, in a timely manner. Currently, the main methods of detection are visual inspection or photographic inspection using a surface inspection instrument. However, since bonding defects are short in length and occur in unpredictable locations, the above detection methods are prone to missing defects. Therefore, there is an urgent need for a bonding defect detection method that can improve the detection rate of bonding defects. Summary of the Invention

[0005] The embodiments of this application provide a method and apparatus for detecting bonding defects in annealed coils, which can improve the detection rate of bonding defects and ensure the production stability of tin plating units.

[0006] Other features and advantages of this application will become apparent from the following detailed description, or may be learned in part from practice of this application.

[0007] According to a first aspect of the embodiments of this application, a method for detecting bonding defects in annealed rolls is provided, comprising:

[0008] Obtain the annealed coil, the baseline elongation value, and the elongation fluctuation value;

[0009] The elongation of the annealed coil is measured to obtain the elongation measurement value;

[0010] The range of elongation fluctuation is determined based on the baseline value and the fluctuation value of elongation.

[0011] By comparing the elongation test value and the elongation fluctuation range, it can be determined whether there are bonding defects in the annealed coil.

[0012] In some embodiments of this application, based on the foregoing scheme, determining the elongation fluctuation range according to the elongation benchmark value and the elongation fluctuation value includes:

[0013] The sum of the baseline elongation value and the elongation fluctuation value is used as the upper limit of the elongation rate.

[0014] The difference between the baseline elongation value and the elongation fluctuation value is calculated as the lower limit of the elongation rate.

[0015] The range of elongation fluctuation is determined based on the upper and lower limits of the elongation rate.

[0016] In some embodiments of this application, based on the foregoing scheme, the step of comparing the elongation detection value and the elongation fluctuation range to determine whether the annealed coil has bonding defects includes:

[0017] When the detected elongation is less than the lower limit of the elongation fluctuation range or greater than the upper limit of the elongation fluctuation range, the annealed coil has an adhesion defect.

[0018] When the elongation rate is within the elongation rate fluctuation range, there are no adhesion defects in the annealed coil.

[0019] In some embodiments of this application, based on the foregoing scheme, after determining whether the annealed coil has bonding defects by comparing the elongation detection value and the elongation fluctuation range, when the annealed coil has bonding defects, the method further includes:

[0020] The tension of the annealed coil is measured to obtain the tension measurement value;

[0021] Based on the tension test values, determine the type of bonding defect.

[0022] In some embodiments of this application, based on the foregoing scheme, determining the defect type of the bonding defect according to the tension detection value includes:

[0023] Obtain the tension baseline value and tension fluctuation value;

[0024] The tension fluctuation range is determined based on the tension reference value and the tension fluctuation value;

[0025] By comparing the tension test values ​​and the tension fluctuation range, the type of bonding defect can be determined.

[0026] In some embodiments of this application, based on the foregoing scheme, determining the tension fluctuation range according to the tension reference value and the tension fluctuation value includes:

[0027] Calculate the sum of the tension baseline value and the tension fluctuation value as the upper limit of tension;

[0028] The difference between the tension baseline value and the tension fluctuation value is calculated as the lower limit of the tension.

[0029] The tension fluctuation range is determined based on the upper and lower tension limits.

[0030] In some embodiments of this application, based on the foregoing scheme, determining the defect type of the bonding defect by comparing the tension detection value and the tension fluctuation range includes:

[0031] When the tension detection value is greater than the upper limit of the tension fluctuation range or less than the lower limit of the tension fluctuation range, the bonding defect is a protruding defect.

[0032] When the tension test value is within the tension fluctuation range, the bonding defect is a concave defect.

[0033] In some embodiments of this application, based on the aforementioned scheme, a leveling unit is used to detect the elongation, tension, and mileage of the annealed coil. Based on the correspondence between mileage and elongation, and the correspondence between mileage and tension, the location of the bonding defect is determined.

[0034] In some embodiments of this application, based on the aforementioned scheme, the elongation of the annealed coil is detected by the elongation detection mechanism of the leveling unit.

[0035] In some embodiments of this application, the elongation of the steel coil is detected. When the elongation of the steel coil is outside the elongation fluctuation range, i.e., when abnormal fluctuation occurs, it can be determined that there is an adhesion defect at that location, which needs to be handled. This eliminates the need for manual inspection, thus improving the detection rate and inspection efficiency.

[0036] According to a second aspect of the embodiments of this application, an apparatus for detecting bonding defects in annealed rolls is provided, comprising:

[0037] The acquisition unit acquires the annealed coil, the baseline elongation value, and the elongation fluctuation value.

[0038] The detection unit detects the elongation of the annealed coil and obtains the elongation detection value;

[0039] Determine the unit and, based on the elongation benchmark value and elongation fluctuation value, determine the elongation fluctuation range;

[0040] The judgment unit compares the elongation detection value and the elongation fluctuation range to determine whether the annealed coil has bonding defects.

[0041] The beneficial effects of the various embodiments of the second aspect described above can be referred to the beneficial effects of the first aspect and the various embodiments of the first aspect described above, and will not be repeated here.

[0042] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and do not limit this application. Attached Figure Description

[0043] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application. It is obvious that the drawings described below are merely some embodiments of this application, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort. In the drawings:

[0044] Figure 1 A flowchart of a method for detecting bonding defects in a shrouded annealed coil according to an embodiment of this application is shown;

[0045] Figure 2 A schematic diagram of a leveling unit for detecting the elongation, tension, and mileage of annealed coils is shown in an embodiment of this application.

[0046] Figure 3 A schematic diagram of a severe adhesion defect in an embodiment of this application is shown;

[0047] Figure 4 The waveform diagram for detecting dented defects using a leveling unit is shown.

[0048] Figure 5 A schematic diagram of another severe bonding defect in this embodiment is shown;

[0049] Figure 6 The waveform diagram for detecting protruding defects using a leveling unit is shown.

[0050] Figure 7 A block diagram of an apparatus for detecting bonding defects in shrouded annealed rolls according to an embodiment of this application is shown. Detailed Implementation

[0051] Exemplary embodiments will now be described more fully with reference to the accompanying drawings. However, these exemplary embodiments can be implemented in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided to make this application more comprehensive and complete, and to fully convey the concept of the exemplary embodiments to those skilled in the art.

[0052] Furthermore, the described features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. Numerous specific details are provided in the following description to give a thorough understanding of embodiments of this application. However, those skilled in the art will recognize that the technical solutions of this application can be practiced without one or more of the specific details, or other methods, components, apparatuses, steps, etc., can be employed. In other instances, well-known methods, apparatuses, implementations, or operations are not shown or described in detail to avoid obscuring various aspects of this application.

[0053] The block diagrams shown in the accompanying drawings are merely functional entities and do not necessarily correspond to physically independent entities. That is, these functional entities can be implemented in software, in one or more hardware modules or integrated circuits, or in different network and / or processor devices and / or microcontroller devices.

[0054] The flowcharts shown in the accompanying drawings are merely illustrative and do not necessarily include all content and operations / steps, nor do they necessarily have to be performed in the described order. For example, some operations / steps can be broken down, while others can be combined or partially combined; therefore, the actual execution order may change depending on the specific circumstances.

[0055] It should be noted that "multiple" in this article refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone. The character " / " generally indicates that the preceding and following related objects have an "or" relationship.

[0056] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such uses of these terms can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described.

[0057] Figure 1 A flowchart of a method for detecting bonding defects in annealed coils according to an embodiment of this application is shown. This method for detecting bonding defects in annealed coils can be performed by a device with computational processing capabilities.

[0058] Reference Figure 1 As shown, the method for detecting bonding defects in annealed rolls includes at least steps S1 to S4, which are described in detail below:

[0059] In step S1, the annealed coil, the elongation baseline value, and the elongation fluctuation value are obtained.

[0060] In this application, the annealed coil can be a bell-type annealed coil, an annealed coil for tin plating units, or an annealed coil for galvanizing units. The elongation reference value can be set according to the type of annealed coil, such as according to thickness, hardness, or steel grade. The elongation reference value can be the elongation value of the normal part of the annealed coil, i.e., the part without bonding defects. The elongation fluctuation value can be a fixed value or can be set according to the elongation reference value, such as according to the percentage of the elongation reference value.

[0061] In step S2, the elongation of the annealed coil is detected to obtain the elongation detection value.

[0062] In step S3, the elongation fluctuation range is determined based on the elongation baseline value and the elongation fluctuation value.

[0063] In step S4, the elongation detection value and the elongation fluctuation range are compared to determine whether there are adhesion defects in the annealed coil.

[0064] Specifically, determining the elongation fluctuation range based on the elongation benchmark value and the elongation fluctuation value can be done in the following way:

[0065] The sum of the baseline elongation value and the elongation fluctuation value is used as the upper limit of the elongation rate.

[0066] The difference between the baseline elongation value and the elongation fluctuation value is calculated as the lower limit of the elongation rate.

[0067] The range of elongation fluctuation is determined based on the upper and lower limits of the elongation rate.

[0068] To determine whether the annealed coil has bonding defects by comparing the measured elongation value and the elongation fluctuation range, the following method can be used:

[0069] When the detected elongation is less than the lower limit of the elongation fluctuation range or greater than the upper limit of the elongation fluctuation range, the annealed coil has an adhesion defect.

[0070] When the elongation is within the elongation fluctuation range, the annealed coil does not exhibit bonding defects.

[0071] In this application, when the detected elongation is within the elongation fluctuation range, it can also indicate that the annealed coil does not have serious bonding defects, that is, there are no bonding defects that affect production stability.

[0072] In this embodiment of the application, the comparison of the elongation detection value and the elongation fluctuation range is used to determine whether the annealed coil has bonding defects. If bonding defects are found, the tension of the annealed coil is detected. Based on the tension of the annealed coil, the defect type of the bonding defect can be determined in the following manner:

[0073] The tension of the annealed coil is measured to obtain the tension measurement value;

[0074] Based on the tension test values, determine the type of bonding defect.

[0075] Specifically, determining the type of bonding defect based on the tension detection value can be done in the following manner:

[0076] Obtain the tension baseline value and tension fluctuation value;

[0077] The tension fluctuation range is determined based on the tension reference value and the tension fluctuation value;

[0078] By comparing the tension test values ​​and the tension fluctuation range, the type of bonding defect can be determined.

[0079] The determination of the tension fluctuation range based on the tension reference value and the tension fluctuation value can be carried out in the following manner:

[0080] Calculate the sum of the tension baseline value and the tension fluctuation value as the upper limit of tension;

[0081] The difference between the tension baseline value and the tension fluctuation value is calculated as the lower limit of the tension.

[0082] The tension fluctuation range is determined based on the upper and lower tension limits.

[0083] Specifically, the method of comparing the measured tension value and the tension fluctuation range to determine the type of bonding defect can be performed in the following way:

[0084] When the tension detection value is greater than the upper limit of the tension fluctuation range or less than the lower limit of the tension fluctuation range, the bonding defect is a protruding defect.

[0085] When the tension test value is within the tension fluctuation range, the bonding defect is a concave defect.

[0086] In the embodiments of this application, the elongation fluctuation range indicates the fluctuation situation in areas without serious bonding defects. If it exceeds the elongation fluctuation range, it indicates abnormal fluctuation and serious bonding defects. Since areas with bonding defects, especially those with serious bonding defects, have a large degree of deformation, the internal stress in areas with serious bonding defects is different from that in normal areas. Therefore, bonding defects can be detected by detecting elongation and tension, especially by detecting whether there are abnormal fluctuations in elongation and tension, with a high detection rate.

[0087] In this embodiment of the application, a leveling unit is used to detect the elongation, tension, and mileage of the annealed coil. Based on the correspondence between mileage and elongation, and the correspondence between mileage and tension, the location of the bonding defect is determined.

[0088] In this embodiment of the application, the elongation of the annealed coil is detected by the elongation detection mechanism of the leveling unit.

[0089] See Figure 2 , Figure 2 A schematic diagram of a leveling unit used to detect the elongation, tension, and mileage of annealed coils is shown. Figure 2 The structure, from left to right, includes an uncoiler, inlet tension roller, tension detection device, left frame, elongation detection device, right frame, outlet tension roller, and coiler. The annealed coil is transported to the leveling unit. The uncoiler opens the annealed coil, which then passes sequentially through the inlet tension roller, tension detection device, left frame, elongation detection device, right frame, and outlet tension roller before being threaded onto the coiler. The leveling unit then establishes tension and engages elongation control. The tension detection device and elongation detection device can then be used for normal detection. The elongation, tension, and mileage obtained from the leveling unit's detection of the annealed coil can be collected via a PDA system; the mileage represents the length of strip steel in meters.

[0090] Figure 3 A schematic diagram of a severe bonding defect in an embodiment of this application is shown. This severe bonding defect can be named as a concave defect. Figure 4 The diagram shows waveforms of dented defects detected using a leveling unit. From top to bottom, the waveforms represent elongation, mileage, and tension. Figure 4 It can be seen that there is an abnormal bulge in the elongation waveform, and its fluctuation exceeds the normal fluctuation, which is an abnormal fluctuation. Therefore, it can be judged that there is a serious bonding defect at this location. However, the tension fluctuation is within the normal fluctuation. Based on this, the serious bonding defect is judged to be a concave defect. Figure 5 This diagram illustrates another severe bonding defect in this embodiment, which can be termed a convex defect and is mainly caused by the stacking of wavy annealed rolls. Figure 6 The diagram shows waveforms of convex defects detected using a leveling unit. From top to bottom, the waveforms represent mileage, elongation, and tension. Figure 6 It can be seen that there is an abnormal fluctuation in the waveform of elongation, which exceeds the normal fluctuation and is an abnormal fluctuation. Therefore, it can be determined that there is a serious bonding defect at this position. However, the corresponding tension fluctuation is also an abnormal fluctuation. Based on this, it can be determined that the serious bonding defect is a protrusion type defect.

[0091] In actual testing, the location of serious bonding defects can be determined by the correspondence between abnormal fluctuations in mileage and elongation. The abnormal fluctuation range of elongation is within ± (0.3% to 2%) of the elongation reference value, and the abnormal fluctuation range of tension is within ± (20% to 70%) of the tension reference value.

[0092] Figure 7A block diagram of an apparatus for detecting bonding defects in shrouded annealed rolls according to an embodiment of this application is shown.

[0093] like Figure 7 As shown, based on the same inventive concept, the second aspect of this application also provides an apparatus 100 for detecting bonding defects in annealed rolls, comprising:

[0094] Acquisition unit 101 acquires the annealed coil, elongation baseline value, and elongation fluctuation value;

[0095] The detection unit 102 detects the elongation of the annealed coil and obtains the elongation detection value;

[0096] Unit 103 is defined to determine the elongation fluctuation range based on the elongation benchmark value and the elongation fluctuation value.

[0097] Judgment unit 104 compares the elongation detection value and the elongation fluctuation range to determine whether there is an adhesion defect in the annealed coil.

[0098] It should be noted that the above embodiments are illustrative of the invention and not restrictive, and that those skilled in the art can devise alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses should not be construed as limiting the claims. The word "comprising" does not exclude the presence of components or steps not listed in the claims. The word "a" or "an" preceding a component does not exclude the presence of a plurality of such components. The invention can be implemented by means of hardware comprising several different components and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by the same item of hardware. The use of the words first, second, and third, etc., does not indicate any order. These words can be interpreted as names.

[0099] The above description is merely an embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.

Claims

1. A method of detecting a banding defect in a batch anneal, characterized by, The method comprises the following steps: obtaining an annealed coil, an elongation reference value and an elongation fluctuation value, the elongation reference value being an elongation value of a position without a bonding defect of the annealed coil or being set according to a type of the annealed coil, including being set according to thickness, hardness or steel grade, the elongation fluctuation value being a fixed value or being set according to the elongation reference value, including being set according to a percentage of the elongation reference value; detecting the elongation of the annealed coil to obtain an elongation detection value; determining an elongation fluctuation range according to the elongation reference value and the elongation fluctuation value, including calculating a sum of the elongation reference value and the elongation fluctuation value as an upper limit value of the elongation, calculating a difference between the elongation reference value and the elongation fluctuation value as a lower limit value of the elongation, and determining the elongation fluctuation range according to the upper limit value and the lower limit value of the elongation; comparing the elongation detection value and the elongation fluctuation range to determine whether the annealed coil has a bonding defect, including: when the detected elongation is less than the lower limit value of the elongation fluctuation range or greater than the upper limit value of the elongation fluctuation range, the annealed coil has a bonding defect; and when the detected elongation is within the elongation fluctuation range, the annealed coil does not have a bonding defect.

2. The method of claim 1, wherein, After the comparison of the elongation detection value and the elongation fluctuation range to determine whether the annealed coil has a bonding defect, when the annealed coil has a bonding defect, the method further comprises the following steps: detecting a tension of the annealed coil to obtain a tension detection value; determining a defect type of the bonding defect according to the tension detection value.

3. The method of claim 2, wherein, The determination of the defect type of the bonding defect according to the tension detection value comprises the following steps: obtaining a tension reference value and a tension fluctuation value; determining a tension fluctuation range according to the tension reference value and the tension fluctuation value; comparing the tension detection value and the tension fluctuation range to determine the defect type of the bonding defect.

4. The method of claim 2, wherein, The determination of the tension fluctuation range according to the tension reference value and the tension fluctuation value comprises the following steps: calculating a sum of the tension reference value and the tension fluctuation value as an upper limit value of the tension; calculating a difference between the tension reference value and the tension fluctuation value as a lower limit value of the tension; determining the tension fluctuation range according to the upper limit value and the lower limit value of the tension.

5. The method of claim 3, wherein, The comparison of the tension detection value and the tension fluctuation range to determine the defect type of the bonding defect comprises the following steps: when the tension detection value is greater than the upper limit value of the tension fluctuation range or less than the lower limit value of the tension fluctuation range, the bonding defect is a convex defect; when the tension detection value is within the tension fluctuation range, the bonding defect is a concave defect.

6. The method of claim 1, wherein, The elongation, the tension and the mileage of the annealed coil are detected by a temper mill, and the position of the bonding defect is determined according to the corresponding relationship between the mileage and the elongation and the corresponding relationship between the mileage and the tension.

7. The method of claim 6, wherein, The detection of the elongation of the annealed coil is completed by an elongation detection mechanism of the temper mill.

8. Apparatus for detecting defects in a batch of annealed coils, characterized in that, The method comprises the following steps: an obtaining unit is configured to obtain an annealed coil, an elongation reference value and an elongation fluctuation value, the elongation reference value being an elongation value of a position without a bonding defect of the annealed coil or being set according to a type of the annealed coil, including being set according to thickness, hardness or steel grade, the elongation fluctuation value being a fixed value or being set according to the elongation reference value, including being set according to a percentage of the elongation reference value; a detection unit is configured to detect the elongation of the annealed coil to obtain an elongation detection value; The determining unit determines the extension rate fluctuation range according to the extension rate reference value and the extension rate fluctuation value, including: calculating the sum of the extension rate reference value and the extension rate fluctuation value as an upper limit value of the extension rate, calculating the difference between the extension rate reference value and the extension rate fluctuation value as a lower limit value of the extension rate, and determining the extension rate fluctuation range according to the upper limit value and the lower limit value of the extension rate; The judging unit compares the detected extension rate with the extension rate fluctuation range to judge whether the annealed coil has the bonding defect, including: when the detected extension rate is less than the lower limit value of the extension rate fluctuation range or greater than the upper limit value of the extension rate fluctuation range, the annealed coil has the bonding defect; and when the detected extension rate is within the extension rate fluctuation range, the annealed coil does not have the bonding defect.

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