Sensor testing method and device, electronic device and computer-readable storage medium

Abstract

The present invention provides a sensor testing method and device, an electronic device, and a computer-readable storage medium, which relate to the field of sensors. The sensor testing method includes: obtaining a linear fitting function based on the sensor type of the sensor to be tested, the linear fitting function being used to convert the electrical signal generated by the sensor to be tested into sensing data, the linear fitting function being an error fitting function common to sensors of the same type as the sensor to be tested; obtaining a plurality of target sampling data, the target sampling data being the data sensed by the sensor to be tested; and performing function fitting on the linear fitting function based on the plurality of target sampling data to obtain a quadratic fitting function. Compared with the prior art, the sensor testing method and device, the electronic device, and the computer-readable storage medium provided by the embodiments of the present invention have the advantage of reducing the amount of test data required during the sensor testing process.

Description

Technical Field

[0001] The present invention relates to the field of sensors, and in particular to a sensor testing method and device, an electronic device, and a computer-readable storage medium. Background Art

[0002] With the advancement of integrated circuits, the scale of SoCs (System on Chip) is increasing. During sensor physical manufacturing and operation, device performance varies across different regions within the same sensor, such as temperature at different locations and transistor voltage and current characteristics. This requires the placement of multiple monitoring circuits in different areas to monitor these physical characteristics, forming an on-chip monitoring system within the sensor. During operation, targeted processing is performed based on the monitoring system's results, improving SoC performance.

[0003] The electrical measurement circuits within sensors require a variety of different sensor types. Sensors typically rely on their unique physical properties to convert physical stresses such as temperature, pressure, and humidity into electrical signals. After processing by signal processing circuits, these signals are converted into digital signals that can be transmitted and stored. Finally, mathematical fitting calculations are performed to output data that is linearly proportional to the physical quantities, such as temperature, pressure, and humidity. Within circuits, sensors can typically be equivalent to resistors, capacitors, voltage-controlled current sources, or current-controlled voltage sources.

[0004] However, the relationship between the sensor's output signal and the actual physical parameter being sensed is usually not completely linear. Therefore, after converting the sensor signal into a digital signal, a polynomial function must be fitted to output a perfect polynomial function that corresponds to the physical parameter and the output signal, which can ultimately be used. During the polynomial fitting process, the larger the higher-order terms of the polynomial, the higher the accuracy. However, the higher the polynomial fitting accuracy, the more test data required, and the higher the testing cost. Summary of the Invention

[0005] An object of the present invention is to provide a sensor testing method and apparatus, an electronic device, and a computer-readable storage medium, which can reduce the amount of test data required during the sensor testing process.

[0006] In a first aspect, the present invention provides a sensor testing method, comprising: obtaining a linear fitting function according to the sensor type of a sensor to be tested, the linear fitting function being used to convert an electrical signal generated by the sensor to be tested into sensing data, the linear fitting function being an error fitting function common to sensors of the same type as the sensor to be tested; obtaining a plurality of target sampling data, the target sampling data being data sensed by the sensor to be tested; and performing function fitting on the linear fitting function according to the plurality of target sampling data to obtain a quadratic fitting function.

[0007] Compared with the prior art, in the sensor testing method provided in the embodiment of the present invention, a linear fitting function is first obtained according to the sensor type of the sensor to be tested. Since the linear fitting function is an error fitting function common to sensors of the same type as the sensor to be tested, that is, the linear fitting function has already fitted the error caused by the sensor type of the sensor to be tested, then for the specific sensor to be tested, multiple target sampling data are obtained, the target sampling data being the data sensed by the sensor to be tested, and the linear fitting function is fitted using the multiple target sampling data obtained by data sampling to obtain a quadratic fitting function, thereby fitting the error caused by the individual specific sensor to be tested. Since the function fitting of the linear fitting function only needs to fit the error caused by the individual sensor to be tested, the data volume requirement for the target sampling data in the fitting process can be reduced, thereby reducing the amount of test data required in the sensor testing process.

[0008] In an optional embodiment, obtaining a linear fit function based on the sensor type of the sensor to be tested includes: obtaining a sample mapping set, the sample mapping set including a one-to-one correspondence between a plurality of sensor types and a plurality of sample fit functions; and obtaining a sample fit function corresponding to the sensor type of the sensor to be tested from the sample mapping set as the linear fit function. Directly obtaining the linear fit function corresponding to the sensor to be tested using the pre-stored correspondence in the sample mapping set can more conveniently and quickly obtain the linear fit function, further improving sensor testing efficiency.

[0009] In an optional embodiment, obtaining a sample mapping set includes: obtaining a plurality of sample sensors of the same type; sampling data using each of the sample sensors to obtain sample sampling data; performing function fitting on the sample sampling data to obtain a sample fitting function; and establishing a correspondence between the sample sensor type and the sample fitting function. Sampling data using the plurality of sample sensors to obtain a plurality of sample sampling data, and then fitting the sample sampling data to obtain a sample fitting function, can further reduce the amount of test data required during sensor testing compared to the prior art method of sampling data individually for each sensor and then performing function fitting.

[0010] In an optional embodiment, performing function fitting on the sample sampling data to obtain a sample fitting function includes: performing polynomial fitting on the sample sampling data to obtain a number of sample polynomial coefficients; and constructing a polynomial function as the sample fitting function based on the sample polynomial coefficients.

[0011] In an optional implementation, the acquiring the sample mapping set includes: reading a pre-stored sample mapping set.

[0012] In an optional embodiment, obtaining a linear fitting function based on the sensor type of the sensor to be tested includes: obtaining similar sampled data from multiple sensors of the same type as the sensor to be tested based on the sensor type of the sensor to be tested; and performing function fitting on the similar sampled data to obtain the linear fitting function. By sampling data from multiple sensors of the same type as the sensor to be tested to obtain the similar sampled data, and then fitting the linear fitting function using the similar sampled data, the amount of test data required during sensor testing can be further reduced compared to the prior art method of sampling data from each sensor individually and then performing function fitting.

[0013] In an optional embodiment, performing function fitting on the linear fitting function according to the multiple target sampling data to obtain a quadratic fitting function includes: taking the linear fitting function as a variable, performing polynomial fitting on the linear fitting function using the multiple target sampling data to obtain several target polynomial coefficients; and constructing a polynomial function as the quadratic fitting function according to the target polynomial coefficients.

[0014] In a second aspect, the present invention provides a sensor testing device, comprising: a linear fitting module, the linear fitting module being used to obtain a linear fitting function according to the sensor type of the sensor to be tested, the linear fitting function being used to convert the electrical signal generated by the sensor to be tested into sensing data; a data sampling module, the data sampling module being used to obtain a plurality of target sampling data, the target sampling data being the data sensed by the sensor to be tested; and a quadratic fitting module, the quadratic fitting module being used to perform function fitting on the linear fitting function according to the plurality of target sampling data to obtain a quadratic fitting function.

[0015] In a third aspect, the present invention provides an electronic device comprising: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the sensor testing method as described in any one of the aforementioned embodiments.

[0016] In a fourth aspect, the present invention provides a computer-readable storage medium storing a computer program, wherein the computer program is executed by a processor to implement the sensor testing method described in any one of the aforementioned embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying any creative work.

[0018] Figure 1 A schematic flow chart of a sensor testing method provided in the first embodiment of the present invention;

[0019] Figure 2 A schematic diagram of a flow chart for obtaining a first-order fitting function in the sensor testing method provided in the first embodiment of the present invention;

[0020] Figure 3 This is a schematic structural diagram of a sensor testing device provided in the second embodiment of the present invention;

[0021] Figure 4 This is a schematic diagram of the structure of the sensor test device and temperature sensor used in this example;

[0022] Figure 5 This is a structural diagram of an electronic device provided in Example 3 of the present invention. DETAILED DESCRIPTION

[0023] To make the objectives, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions of the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Generally, the components of the embodiments of the present invention described and shown in the drawings herein can be arranged and designed in various different configurations.

[0024] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention as claimed, but rather merely represents selected embodiments of the present invention. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of the present invention without creative effort shall fall within the scope of protection of the present invention.

[0025] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, it does not need to be further defined or explained in subsequent drawings.

[0026] In addition, the terms "first", "second", etc., if used, are merely used to distinguish and describe, and should not be understood as indicating or implying relative importance.

[0027] It should be noted that, in the absence of conflict, the features in the embodiments of the present invention may be combined with each other.

[0028] The first embodiment of the present invention provides a sensor testing method, the specific steps are as follows: Figure 1 As shown, including:

[0029] Step S101: obtaining a first-order fitting function according to the sensor type of the sensor to be tested.

[0030] Specifically, sensors typically rely on their unique physical properties to convert physical stresses like temperature, pressure, and humidity into electrical signals. After processing by signal processing circuits, these signals are converted into digital signals that can be transmitted and stored. Finally, through mathematical fitting calculations, the output is a data result that is linear with the physical quantities like temperature, pressure, and humidity. During this mathematical fitting process, sensor errors come from two sources: one is errors arising from the sensor's structure and principles, which are common to sensors of the same type; the other is errors introduced during the manufacturing process of individual sensors, such as errors caused by differences in temperature, humidity, size, and other factors during the manufacturing process. These errors are unique to each sensor.

[0031] In this step, the primary fitting function is the error fitting function common to all sensors of the same type as the sensor being tested. In other words, the primary fitting function is the function generated by fitting the common errors of sensors of the same type as the sensor being tested. This primary fitting function can eliminate errors caused by factors such as sensor structure and principle.

[0032] In some embodiments of the present invention, a first-order fitting function can be obtained using several sensors of the same type as the sensor to be measured. The specific steps are as follows: Figure 2 As shown, the following steps are included:

[0033] Step S201: obtaining similar sampling data of several sensors of the same type as the sensor to be tested.

[0034] Specifically, in this step, similar sensors are sensors of the same type as the sensor to be tested. The same type may mean that the sensors are of the same model, size, and function as the sensor to be tested. For example, similar sensors may be sensors produced in the same batch as the sensor to be tested.

[0035] In this step, the same type of sampling data can be the electrical data sensed by each similar sensor. The same type of sampling data can be data uploaded by the user, or data obtained by the sensor test device through experimental measurement, and can be used according to actual needs. In different embodiments of the present invention, for example, the sensor test device includes a test component, and the test component can be used to control the sensor to sense environmental data. In this case, the same type of sampling data can be data obtained by the test component using several similar sensors to sense environmental data; in other embodiments of the present invention. For example, the sensor test device does not include a test component. In this case, the same type of sampling data can be, for example, data uploaded by the user, or data downloaded from the server, and can be flexibly set according to the different structures of the sensor test device.

[0036] Step S202: performing function fitting on the same type of sampled data to obtain a first-order fitting function.

[0037] In this step, function fitting is performed on similar sampling data sensed by several similar sensors, for example, polynomial fitting is performed to obtain several polynomial coefficients, and then a polynomial function is constructed as a linear fitting function based on the obtained polynomial coefficients.

[0038] It will be understood that the foregoing is merely an example of obtaining a linear fit function in some embodiments of the present invention and does not constitute a limitation. In other embodiments of the present invention, the linear fit function may be obtained, for example, from a pre-stored sample mapping set, which may include a one-to-one correspondence between several sensor types and several sample fit functions. In some embodiments of the present invention, the sample mapping set may be pre-stored in a storage unit, and then, when testing a sensor to be tested, the sample mapping set is first read from the storage unit, and then the sample fit function corresponding to the sensor type to which the sensor to be tested belongs in the sample mapping set is obtained as the linear fit function.

[0039] Specifically, the sample mapping set includes multiple sensor types and sample fitting functions that correspond to each tactile type. For example, the sample mapping set may include five different sensor types: A1, A2, A3, A4, and A5. Each sensor type corresponds to a unique sample fitting function, such as A1→B1, A2→B2, A3→B3, A4→B4, and A5→B5. In this step, the sensor type of the sensor to be tested can be found from the sample mapping set. For example, if the sensor type of the sensor to be tested is A2, its corresponding sample fitting function is B2, and the primary fitting function is B2.

[0040] In some embodiments of the present invention, a sample mapping set can be constructed based on several sample sensors. Specifically, sensing data from several different types of sample sensors is obtained. For example, if there are N sample sensors of each of five different types, A1, A2, A3, A4, and A5, sensing data from N sample sensors of type A1, sensing data from N sample sensors of type A2, and so on are obtained. Function fitting is then performed on the sensing data from the N sample sensors of type A1 to obtain a sample fitting function B1 corresponding to the sample sensors of type A1. Function fitting is then performed on the sensing data from the N sample sensors of type A2 to obtain a sample fitting function B2 corresponding to the sample sensors of type A2, and so on. Finally, correspondences are established between the sample sensor types A1, A2, A3, A4, and A5 and the sample fitting functions B1, B2, B3, B4, and B5 to form a sample mapping set.

[0041] In some embodiments of the present invention, when performing function fitting on the sensing data of the sample sensor, a polynomial fit can be performed on the sample data to obtain a number of sample polynomial coefficients; a polynomial function is then constructed based on the sample polynomial coefficients to serve as the sample fitting function. The specific fitting process can be referred to the detailed description of function fitting for the target sensor described above and will not be repeated here.

[0042] Step S102: Acquire multiple target sampling data.

[0043] In this step, the target sampling data is the data sensed by the sensor to be tested. Similar to the aforementioned step S201, in different embodiments of the present invention, the target sampling data can also be data uploaded by the user, or data obtained by the sensor testing device through experimental measurement, and can be used according to actual needs. In different embodiments of the present invention, for example, the sensor testing device includes a test component, and the test component can be used to control the sensor to be tested to sense environmental data. In this case, the target sampling data can be data obtained by the test component using the sensor to be tested to sense environmental data; in other embodiments of the present invention. For example, if the sensor testing device does not include a test component, then in this case, the target sampling data can be, for example, data uploaded by the user, and can be flexibly set according to the different structures of the sensor testing device.

[0044] Step S103: performing function fitting on the linear fitting function according to the plurality of target sampling data to obtain a quadratic fitting function.

[0045] In this step, the linear fitting function can be used as a variable, and a plurality of target sampling data can be used to perform polynomial fitting on the linear fitting function to obtain several target polynomial coefficients, and then a polynomial function is constructed as a quadratic fitting function based on the target polynomial coefficients.

[0046] In the embodiments provided by the present invention, during the sensing process of the sensor to be measured, the quadratic fitting process only needs to fit the individual differences of the sensor to be measured. Compared with the prior art that simultaneously fits the sensor type differences and individual differences of the sensor to be measured, the amount of data required is smaller. For example, in the prior art, the function:

[0047] Y=f(Dout)=a0+a1*f(Dout)^1+a2*f(Dout)^2+…+an*f(Dout)^n for data fitting, and this process requires at least n+1 sampling data; and in some embodiments of the present invention, the linear fitting function may be, for example: Y=f(X)=a0+a1*X^1+a2*X^2+…+an*X^n, wherein a0…an are polynomial coefficients, wherein X=b0+b1*f(Dout)+b2*f(Dout)^2+…+bm*f(Dout)^m is a quadratic fitting function, Dout is similar sampling data obtained by measurement, f(Dout) is a mathematical function operation, which can be determined according to the sensor type of the sensor to be measured and the sensor type of the same type, for example, f(Dout) can be a logarithmic operation, a derivative operation, an integral operation, a power function operation, etc., and b0…bm are fitting polynomial coefficients. Only m+1 sampling data are needed in the quadratic fitting process. Since only the errors generated by the individual sensors to be measured need to be fitted in the quadratic fitting process, m<n.

[0048] For R sensors of the same type, the prior art requires R*(n+1) samples of data. However, the sensor testing method provided in the embodiments of the present invention only requires R*(m+1)+r*(n+1) samples of data, where r represents the portion of sensors used to obtain the linear fitting function. Since m<n, R*(m+1)+r*(n+1)<R*(n+1). For sensing processes involving a large number of sensors, the sensor testing method provided in the embodiments of the present invention can also reduce the amount of test data required.

[0049] In the sensor sensing method provided in the first embodiment of the present invention, a linear fitting function is first obtained according to the sensor type of the sensor to be tested. Since the linear fitting function is an error fitting function common to sensors of the same type as the sensor to be tested, that is, the linear fitting function has already fitted the error caused by the sensor type of the sensor to be tested, then for the specific sensor to be tested, multiple target sampling data are obtained, the target sampling data is the data sensed by the sensor to be tested, and the linear fitting function is fitted using the multiple target sampling data obtained by data sampling to obtain a quadratic fitting function, thereby fitting the error generated by the individual specific sensor to be tested. Since the function fitting of the linear fitting function only needs to fit the error generated by the individual sensor to be tested, the data volume requirement for the target sampling data in the fitting process can be reduced, thereby reducing the amount of test data required in the sensor testing process.

[0050] The second embodiment of the present invention relates to a sensor testing device, specifically Figure 3 As shown, it includes: a first-order fitting module 301, which is used to obtain a first-order fitting function according to the sensor type of the sensor to be tested, and the first-order fitting function is used to convert the electrical signal generated by the sensor to be tested into sensing data; a data sampling module 302, which is used to use the sensor to be tested to perform data sampling to obtain multiple target sampling data; a quadratic fitting module 303, which is used to perform function fitting on the first-order fitting function according to the multiple target sampling data to obtain a quadratic fitting function.

[0051] Compared with the prior art, in the sensor testing device provided by the embodiment of the present invention, the first-order fitting module 301 obtains a first-order fitting function according to the sensor type of the sensor to be tested. Since the first-order fitting function is an error fitting function common to sensors of the same type as the sensor to be tested, that is, the first-order fitting function has already fitted the error caused by the sensor type of the sensor to be tested, then for the specific sensor to be tested, the data sampling module 302 obtains multiple target sampling data, where the target sampling data is the data sensed by the sensor to be tested. The second-order fitting module 303 uses the multiple target sampling data obtained by data sampling to perform function fitting on the first-order fitting function to obtain a second-order fitting function, thereby fitting the error generated by the individual sensor to be tested. Since function fitting of the first-order fitting function only needs to fit the error generated by the individual sensor to be tested, the data volume requirement for the target sampling data in the fitting process can be reduced, thereby reducing the amount of test data required in the sensor testing process.

[0052] Specifically, taking the sensor as a temperature sensor as an example, Figure 4As shown, the temperature sensor 100 includes a temperature sensing element 401, a current mirror circuit 402, and a current controlled oscillator 403. The temperature sensing element 401 can change its physical parameters such as resistance and inductance according to different temperatures, and the current mirror circuit 402 and the current controlled oscillator 403 are used to stabilize and output electrical signals. The sensor testing device 200 provided in an embodiment of the present invention includes a signal processing circuit 404, a digital calibration circuit 405, and a storage unit 406. The signal processing circuit 404 is used to obtain the electrical signal output by the temperature sensor 100, and the signal processing circuit 404 is the aforementioned data sampling module 302. The digital calibration circuit 405 is used to perform function fitting, which is the aforementioned quadratic fitting module 303. The storage unit 406 can store a linear fitting function, and the storage unit 406 is the aforementioned linear fitting module 301. Specifically, as Figure 4 As shown, the electrical signal generated by the temperature sensor 100 is counted and sampled by the signal processing circuit 404 and then transmitted to the digital calibration circuit for function fitting with the linear fitting function stored in the storage unit 406 to obtain a quadratic fitting function.

[0053] A third embodiment of the present invention relates to an electronic device, such as Figure 5 As shown, it includes: at least one processor 501; and a memory 502 communicatively connected to the at least one processor 501; wherein the memory 502 stores instructions that can be executed by the at least one processor 501, and the instructions are executed by the at least one processor 501 so that the at least one processor 501 can execute the sensor testing method in the above-mentioned embodiments.

[0054] The memory and processor are connected using a bus, which can include any number of interconnected buses and bridges. The bus connects various circuits of one or more processors and memories. The bus can also connect various other circuits such as peripheral devices, voltage regulators, and power management circuits. These are all well known in the art and are therefore not described further herein. The bus interface provides an interface between the bus and the transceiver. The transceiver can be a single component or multiple components, such as multiple receivers and transmitters, providing a unit for communicating with various other devices over a transmission medium. Data processed by the processor is transmitted over a wireless medium via an antenna. Furthermore, the antenna receives data and transmits it to the processor.

[0055] The processor is responsible for managing the bus and general processing, and can also provide various functions, including timing, peripheral interfaces, voltage regulation, power management, and other control functions. Memory can be used to store data used by the processor when performing operations.

[0056] A fourth embodiment of the present invention relates to a computer-readable storage medium storing a computer program, which implements the above method embodiment when executed by a processor.

[0057] That is, those skilled in the art will understand that all or part of the steps in the above-mentioned embodiment methods can be implemented by instructing the relevant hardware through a program, which is stored in a storage medium and includes a number of instructions for causing a device (which may be a single-chip microcomputer, sensor, etc.) or a processor to execute all or part of the steps in the various embodiments of the present application. The aforementioned storage medium includes: a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, etc., various media that can store program code.

[0058] The above are merely specific embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in the present invention should be included in the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be based on the scope of protection of the claims.

Claims

1. A sensor testing method, characterized in that: include: Obtaining a linear fitting function according to the sensor type of the sensor to be tested, wherein the linear fitting function is used to convert the electrical signal generated by the sensor to be tested into sensing data, and the linear fitting function is an error fitting function common to sensors of the same type as the sensor to be tested; Acquire a plurality of target sampling data, where the target sampling data is data sensed by the sensor to be tested; Taking the linear fitting function as a variable, performing polynomial fitting on the linear fitting function using the plurality of target sampling data to obtain a plurality of target polynomial coefficients; A polynomial function is constructed according to the target polynomial coefficients as a quadratic fitting function; the quadratic fitting function is used to fit the individual errors generated by the specific sensor to be measured.

2. The sensor testing method according to claim 1, characterized in that: The step of obtaining a first-order fitting function according to the sensor type of the sensor to be tested includes: Acquire a sample mapping set, the sample mapping set including a one-to-one correspondence between a plurality of sensor types and a plurality of sample fitting functions; A sample fitting function corresponding to the sensor type to which the sensor to be tested belongs in the sample mapping set is obtained as the first-order fitting function.

3. The sensor testing method according to claim 2, characterized in that: The obtaining of the sample mapping set includes: Obtain several sample sensors of the same type; Using each of the sample sensors to perform data sampling respectively to obtain sample sampling data; Performing function fitting on the sample sampling data to obtain a sample fitting function; A correspondence between the sample sensor type and the sample fitting function is established.

4. The sensor testing method according to claim 3, characterized in that: The performing function fitting on the sample sampling data to obtain a sample fitting function includes: Performing polynomial fitting on the sample sampling data to obtain a number of sample polynomial coefficients; A polynomial function is constructed according to the sample polynomial coefficients as the sample fitting function.

5. The sensor testing method according to claim 2, characterized in that: The obtaining of the sample mapping set includes: Read a pre-stored sample mapping set.

6. The sensor testing method according to claim 1, characterized in that: The step of obtaining a first-order fitting function according to the sensor type of the sensor to be tested includes: Acquire similar sampling data of several sensors of the same type as the sensor to be tested according to the sensor type of the sensor to be tested; Function fitting is performed on the similar sampling data to obtain the first-order fitting function.

7. A sensor testing device, characterized in that: include: a first-order fitting module, the first-order fitting module being configured to obtain a first-order fitting function according to the sensor type of the sensor to be tested, the first-order fitting function being configured to convert the electrical signal generated by the sensor to be tested into sensing data, the first-order fitting function being an error fitting function common to sensors of the same type as the sensor to be tested; A data sampling module, wherein the data sampling module is used to obtain a plurality of target sampling data, wherein the target sampling data is the data sensed by the sensor to be tested; A quadratic fitting module is configured to perform polynomial fitting on the linear fitting function using the plurality of target sampling data, taking the linear fitting function as a variable, to obtain a plurality of target polynomial coefficients; construct a polynomial function as a quadratic fitting function based on the target polynomial coefficients; and use the quadratic fitting function to fit the individual errors of the specific sensor to be measured.

8. An electronic device, characterized in that: include: at least one processor; and, a memory communicatively coupled to the at least one processor; The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the sensor testing method according to any one of claims 1 to 6.

9. A computer-readable storage medium storing a computer program, characterized in that: The computer program is executed by a processor to implement the sensor testing method according to any one of claims 1 to 6.

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