Aging test method and aging test system

Abstract

This invention discloses an aging test method and an aging test system. The aging test method provided in this embodiment is applied to an aging test system; the method includes: connecting at least two power modules to the aging test system and controlling the operation of the power modules; performing aging tests on at least two components of the power modules based on the constructed aging test system, generating test results; and disconnecting the power modules after the test is completed. The technical solution of this invention, by constructing an aging test system and connecting at least two power modules, enables aging tests on at least two components of the power modules. This technical solution achieves simultaneous aging tests on multiple components of multiple power modules, saving operation time and testing costs.

Description

Technical Field

[0001] This invention relates to the field of aging testing technology, and in particular to an aging testing method and aging testing system. Background Technology

[0002] Power electronic converters consist of multiple power modules. Before leaving the factory, these modules need to undergo rated power aging tests to ensure reliability by inspecting each component. However, existing aging test methods typically only test one power module at a time, resulting in high power consumption and low efficiency. If multiple power modules are tested, only one component within each module can be tested simultaneously. Therefore, there is an urgent need for a simple, low-power-consumption, and highly comprehensive aging test method. Summary of the Invention

[0003] This invention provides an aging test method and aging test system to solve the problems of high power consumption, low efficiency and low test integrity of existing aging test methods.

[0004] According to one aspect of the present invention, an aging test method is provided, applied to an aging test system; the method includes:

[0005] Based on the aging test system, at least two power modules are connected to the aging test system and the operation of the power modules is controlled;

[0006] Based on the established aging test system, aging tests are performed on at least two components of the power module to generate test results;

[0007] After the test is completed, the power module is cut out.

[0008] Optionally, the aging test system includes a reactor, a circuit breaker, and a constant voltage DC power supply, wherein the constant voltage DC power supply is connected to the input terminal of the power module; and the output terminal of the power module is connected to the reactor and the circuit breaker.

[0009] The aging test system includes connecting at least two power modules to the aging test system and controlling the operation of the power modules, including:

[0010] Connect the input terminals of at least two of the power modules in parallel and then connect them to the output terminal of the constant voltage DC power supply.

[0011] The output terminals of at least two of the power modules are connected in series, and then connected in series with the reactor and the circuit breaker.

[0012] The power module is driven to operate by outputting a rated voltage signal from the constant voltage DC power supply.

[0013] Optionally, the power module includes a dual active bridge and a cascaded H-bridge, the dual active bridge being connected to the cascaded H-bridge, and the dual active bridge being connected to the constant voltage DC power supply;

[0014] The step of driving the power module to operate by outputting a rated voltage signal through the constant voltage DC power supply includes:

[0015] Unlock the dual active bridge and adjust the phase shift angle of the dual active bridge until the power module outputs the rated voltage;

[0016] Close the circuit breaker;

[0017] Unlock the cascaded H-bridge and adjust the phase difference of the cascaded H-bridge until the power module outputs the rated current.

[0018] Optionally, the aging test system further includes: at least two bypass switches, the bypass switches being connected to the output terminal of the power module;

[0019] Before the constant voltage DC power supply outputs a rated voltage signal to drive the power module to operate, the following is also included:

[0020] The conduction state of the bypass switch is controlled to adjust the number of power modules that can be switched on; wherein the number of power modules is an even number.

[0021] Optionally, based on the established aging test system, aging tests are performed on at least two components of the power module to generate test results, including:

[0022] Control the power module to run for a preset time;

[0023] Obtain the first temperature information of the dual active bridge of the power module, and determine the aging test result of the dual active bridge of the power module based on the first temperature information and a first preset threshold.

[0024] The second temperature information of the cascaded H-bridge of the power module is obtained, and the aging test result of the cascaded H-bridge of the power module is determined based on the second temperature information and a second preset threshold.

[0025] Optionally, the aging test system, based on which the power module is constructed, performs aging tests on at least two components and generates test results, further includes:

[0026] Obtain the conduction status information of the bypass switch of the power module, and determine the test result of the bypass switch based on the conduction status information of the bypass switch.

[0027] Optionally, determining the aging test result of the dual active bridge of the power module based on the first temperature information and a first preset threshold includes:

[0028] The first temperature information is compared with a first preset threshold to generate a comparison result;

[0029] If the first temperature information is less than or equal to the first preset threshold, then the aging test result of the dual active bridge is qualified.

[0030] Optionally, determining the aging test result of the cascaded H-bridge of the power module based on the second temperature information and a second preset threshold includes:

[0031] The second temperature information is compared with a second preset threshold to generate a comparison result;

[0032] If the second temperature information is less than or equal to the second preset threshold, then the aging test result of the cascaded H-bridge is qualified.

[0033] Optionally, after the test is completed, the power module is cut off, including:

[0034] Reduce the phase difference of the cascaded H-bridge of the power module until it is zero, and then lock the cascaded H-bridge;

[0035] Open the circuit breaker of the aging test system;

[0036] Reduce the phase shift angle of the dual active bridge of the power module until it is zero, and lock the dual active bridge;

[0037] Turn off the constant voltage DC power supply.

[0038] In a second aspect, embodiments of the present invention provide an aging test system, the aging test system being used to execute the aging test method according to any one of claims 1 to 9; the aging test system includes: an access module, used to connect at least two power modules to the aging test system and control the operation of the power modules based on the aging test system;

[0039] The test module is used to perform aging tests on at least two components of the power module based on the constructed aging test system, and generate test results;

[0040] The cut-out module is used to cut out the power module after testing is completed.

[0041] The technical solution of this invention is based on an aging test system. At least two power modules are connected to the aging test system, and the operation of the power modules is controlled. Based on the constructed aging test system, aging tests are performed on at least two components of the power modules, generating test results. After the test is completed, the power modules are disconnected. This technical solution of the present invention, by connecting multiple power modules to a constructed aging test system and performing aging tests on multiple components of the power modules to generate test results, achieves simultaneous aging tests on multiple components of multiple power modules, resulting in high test completeness and saving operation time and testing costs.

[0042] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of the present invention, nor is it intended to limit the scope of the invention. Other features of the invention will become readily apparent from the following description. Attached Figure Description

[0043] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0044] Figure 1 This is a flowchart of an aging test method provided in an embodiment of the present invention;

[0045] Figure 2 This is a flowchart of another aging test method provided in an embodiment of the present invention;

[0046] Figure 3 This is a wiring diagram for aging test of a power module provided in an embodiment of the present invention;

[0047] Figure 4 This is a flowchart of another aging test method provided in an embodiment of the present invention;

[0048] Figure 5 This is a schematic diagram of a dual active bridge structure provided in an embodiment of the present invention;

[0049] Figure 6 This is a schematic diagram of a cascaded H-bridge provided in an embodiment of the present invention;

[0050] Figure 7 This is a flowchart of another aging test method provided in an embodiment of the present invention;

[0051] Figure 8 This is a flowchart of another aging test method provided in an embodiment of the present invention;

[0052] Figure 9This is a flowchart of another aging test method provided in an embodiment of the present invention;

[0053] Figure 10 This is a flowchart of another aging test method provided in an embodiment of the present invention;

[0054] Figure 11 This is a flowchart of another aging test method provided in an embodiment of the present invention;

[0055] Figure 12 This is a flowchart of another aging test method provided in an embodiment of the present invention;

[0056] Figure 13 This is a schematic diagram of the structure of an aging test system provided in an embodiment of the present invention. Detailed Implementation

[0057] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.

[0058] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0059] Figure 1 This is a flowchart of an aging test method provided in an embodiment of the present invention. See also... Figure 1 The aging test method provided in this embodiment of the invention is applied to an aging test system. The aging test method includes:

[0060] S101. Based on the aging test system, at least two power modules are connected to the aging test system and the operation of the power modules is controlled.

[0061] Specifically, the power modules of a power electronic converter need to undergo aging tests before being put into operation to ensure reliability. To improve efficiency, at least two power modules can be connected to the aging test system, and the aging test can begin once the power modules are started.

[0062] S102. Based on the established aging test system, perform aging tests on at least two components of the power module and generate test results.

[0063] Specifically, the power module of a power electronic converter includes various components. After the power module starts up and runs, aging tests can be performed on multiple components, generating test results. Based on these results, each component can be evaluated. By setting up an aging test system, multiple components of the power module can be aged simultaneously in a single test, generating test results and ensuring the efficiency and completeness of the aging test.

[0064] S103. After the test is completed, the power module is cut out.

[0065] Specifically, after the test is completed, each component tested is disconnected in turn until the power module is completely shut down. This operation can protect the safety of the equipment and the operators.

[0066] The aging test method provided in this embodiment involves connecting at least two power modules to an aging test system and controlling their operation. Based on the established aging test system, aging tests are performed on at least two components of the power modules, generating test results. After the test is completed, the power modules are disconnected. This aging test method, by connecting multiple power modules to a built aging test system and performing aging tests on various components of the power modules to generate test results, achieves simultaneous aging tests on multiple components of multiple power modules. This results in high test completeness, saves operation time and testing costs, and improves safety.

[0067] Optional, Figure 2 This is a flowchart of another aging test method provided in an embodiment of the present invention. Figure 3 This is a wiring diagram for aging test of a power module provided in an embodiment of the present invention. Based on the above embodiment, see... Figure 2 and Figure 3 The aging test system includes a reactor L, a circuit breaker CB, and a constant voltage DC power supply S. The constant voltage DC power supply S is connected to the input terminal of power module 1, and the output terminal of power module 1 is connected to the reactor L and the circuit breaker CB. The aging test method includes:

[0068] S201. Connect the input terminals of at least two of the power modules in parallel and connect them to the output terminal of the constant voltage DC power supply.

[0069] Specifically, the input terminals of at least two power modules are connected in parallel with a constant voltage DC power supply. The input terminals of the power modules are used to receive the voltage signal output by the constant voltage DC power supply. This setup ensures that the voltage signal output by the constant voltage DC power supply to each power module is the rated voltage, thus improving the stability of the test.

[0070] S202. Connect the output terminals of at least two of the power modules in series, and connect them in series with the reactor and the circuit breaker.

[0071] Specifically, the output terminals of at least two power modules are connected in series, and then connected in series with a reactor and a circuit breaker. The output current is relatively large after the output terminals of the power modules are connected in series, and the reactor and circuit breaker can limit the current to protect the circuit.

[0072] S203. The rated voltage signal is output through the constant voltage DC power supply to drive the power module to operate.

[0073] Specifically, the input terminals of the power module are connected in parallel and the output terminals are connected in series. The constant voltage DC power supply then starts to output the rated voltage signal. The power module continues to operate according to the voltage signal input by the constant voltage DC power supply to perform aging tests.

[0074] S102. Based on the established aging test system, perform aging tests on at least two components of the power module and generate test results.

[0075] S103. After the test is completed, the power module is cut out.

[0076] Optional, Figure 4 This is a flowchart of another aging test method provided in an embodiment of the present invention. Based on the above embodiments, see [link to other embodiments]. Figure 3 and Figure 4 Power module 1 includes a dual active bridge DAB and a cascaded H-bridge CHB. The dual active bridge DAB is connected to the cascaded H-bridge CHB, and the dual active bridge DAB is connected to a constant voltage DC power supply S. Aging test methods include:

[0077] S201. Connect the input terminals of at least two of the power modules in parallel and connect them to the output terminal of the constant voltage DC power supply.

[0078] S202. Connect the output terminals of at least two of the power modules in series, and connect them in series with the reactor and the circuit breaker.

[0079] S301. Unlock the dual active bridge and adjust the phase shift angle of the dual active bridge until the power module outputs the rated voltage.

[0080] Specifically, Figure 5This is a schematic diagram of a dual-active bridge structure provided in an embodiment of the present invention. See also... Figure 5 First, the dual-active bridge is unlocked and connected to the circuit. Since the first bridge arm (comprising the first and fourth switches S1 and S4 at the input) and the fourth bridge arm (comprising the fifth and eighth switches S8 at the output) are simultaneously turned on, and the second bridge arm (comprising the second and third switches S2 and S3 at the input) and the third bridge arm (comprising the sixth and seventh switches S7 at the output) are simultaneously turned on, the phase shift angle between the input and output terminals of the dual-active bridge is 0, and the dual-active bridge has no output voltage. Changing the on-time of the switches, so that the first and fourth bridge arms are no longer simultaneously turned on, and the second and third bridge arms are no longer simultaneously turned on, increases the phase shift angle of the dual-active bridge, causing the output voltage to gradually increase until it reaches the rated DC output voltage.

[0081] S302. Close the circuit breaker.

[0082] Specifically, the circuit breaker remains open until the dual active bridge outputs its rated DC voltage, ensuring that the cascaded H-bridge is not connected to the circuit. The circuit breaker is then closed after the dual active bridge outputs its rated DC voltage. This configuration prevents transient overcurrent from damaging the equipment.

[0083] S303. Unlock the cascaded H-bridge and adjust the phase difference of the cascaded H-bridge until the power module outputs the rated current.

[0084] Specifically, Figure 6 This is a schematic diagram of a cascaded H-bridge provided in an embodiment of the present invention. See also... Figure 6 First, the cascaded H-bridge is unlocked and connected to the circuit, with an initial phase difference of 0. When the ninth switch S9 and the eleventh switch S11 are on, and the tenth switch S10 and the twelfth switch S12 are off, the output voltage Uab of the cascaded H-bridge is 0. When the ninth switch S9 and the eleventh switch S11 are off, and the tenth switch S10 and the twelfth switch S12 are on, the output voltage Uab of the cascaded H-bridge is 0. When the ninth switch S9 and the twelfth switch S12 are on, and the tenth switch S10 and the eleventh switch S11 are off, the output voltage Uab of the cascaded H-bridge is equal to the input voltage UAB. When the ninth switch S9 and the twelfth switch S12 are off, and the tenth switch S10 and the eleventh switch S11 are on, the output voltage Uab of the cascaded H-bridge is equal in magnitude but opposite in phase to the input voltage UAB. Because the cascaded H-bridge uses fixed sine wave modulation, the phase difference of the cascaded H-bridge can be adjusted by changing the phase difference of the sine wave. As the phase difference of the cascaded H-bridge increases, the output current of the power module gradually increases until it outputs the rated current.

[0085] S102. Based on the established aging test system, perform aging tests on at least two components of the power module and generate test results.

[0086] S103. After the test is completed, the power module is cut out.

[0087] Optional, Figure 7 This is a flowchart of another aging test method provided in an embodiment of the present invention. Based on the above embodiments, see [link to other embodiments]. Figure 3 and Figure 7 The aging test system also includes at least two bypass switches 10, which are connected to the output terminals of the power module 1. The aging test method includes:

[0088] S201. Connect the input terminals of at least two of the power modules in parallel and connect them to the output terminal of the constant voltage DC power supply.

[0089] S202. Connect the output terminals of at least two of the power modules in series, and connect them in series with the reactor and the circuit breaker.

[0090] S401. Control the conduction state of the bypass switch to adjust the number of power modules switched in; wherein the number of power modules is an even number.

[0091] Specifically, before starting the aging test, the number of power modules to be tested needs to be determined based on the output power of the constant voltage DC power supply. Power modules not to be tested are then switched off by closing a bypass switch, and the number of power modules undergoing aging testing must be even. This setup ensures full utilization of the constant voltage DC power supply's power and avoids energy waste.

[0092] S203. The rated voltage signal is output through the constant voltage DC power supply to drive the power module to operate.

[0093] S102. Based on the established aging test system, perform aging tests on at least two components of the power module and generate test results.

[0094] S103. After the test is completed, the power module is cut out.

[0095] Optional, Figure 8 This is a flowchart of another aging test method provided in an embodiment of the present invention. Based on the above embodiments, see [link to other embodiments]. Figure 8 Aging test methods include:

[0096] S201. Connect the input terminals of at least two of the power modules in parallel and connect them to the output terminal of the constant voltage DC power supply.

[0097] S202. Connect the output terminals of at least two of the power modules in series, and connect them in series with the reactor and the circuit breaker.

[0098] S401. Control the conduction state of the bypass switch to adjust the number of power modules switched in; wherein the number of power modules is an even number.

[0099] S203. The rated voltage signal is output through the constant voltage DC power supply to drive the power module to operate.

[0100] S501. Control the power module to run for a preset time.

[0101] Specifically, aging tests involve controlling the power module to operate continuously for a period of time under a specific ambient temperature, causing various potential defects within it to be exposed, thus eliminating problematic power modules. After the power module has run for a preset time, its aging status can be confirmed.

[0102] S502. Obtain the first temperature information of the dual active bridge of the power module, and determine the aging test result of the dual active bridge of the power module based on the first temperature information and a first preset threshold.

[0103] Specifically, after the power module has been running for a preset time, the first temperature information of the dual active bridge is acquired. The first temperature information is the actual temperature after the dual active bridge has been running, and the first preset threshold is the highest temperature at which the dual active bridge operates normally. The aging test results of the dual active bridge can be determined based on the first temperature information and the first preset threshold.

[0104] S503. Obtain the second temperature information of the cascaded H-bridge of the power module, and determine the aging test result of the cascaded H-bridge of the power module based on the second temperature information and a second preset threshold.

[0105] Specifically, after the power module has been running for a preset time, the second temperature information of the cascaded H-bridge is acquired. This second temperature information represents the actual operating temperature of the cascaded H-bridge, and the second preset threshold is the highest temperature at which the cascaded H-bridge operates normally. The aging test results of the cascaded H-bridge can be determined based on the second temperature information and the second preset threshold.

[0106] S103. After the test is completed, the power module is cut out.

[0107] Optional, Figure 9 This is a flowchart of another aging test method provided in an embodiment of the present invention. Based on the above embodiments, see [link to other embodiments]. Figure 9 Aging test methods include:

[0108] S201. Connect the input terminals of at least two of the power modules in parallel and connect them to the output terminal of the constant voltage DC power supply.

[0109] S202. Connect the output terminals of at least two of the power modules in series, and connect them in series with the reactor and the circuit breaker.

[0110] S401. Control the conduction state of the bypass switch to adjust the number of power modules switched in; wherein the number of power modules is an even number.

[0111] S203. The rated voltage signal is output through the constant voltage DC power supply to drive the power module to operate.

[0112] S501. Control the power module to run for a preset time.

[0113] S502. Obtain the first temperature information of the dual active bridge of the power module, and determine the aging test result of the dual active bridge of the power module based on the first temperature information and a first preset threshold.

[0114] S503. Obtain the second temperature information of the cascaded H-bridge of the power module, and determine the aging test result of the cascaded H-bridge of the power module based on the second temperature information and a second preset threshold.

[0115] S601. Obtain the conduction status information of the bypass switch of the power module, and determine the test result of the bypass switch based on the conduction status information of the bypass switch.

[0116] Specifically, after the power module has been running for a preset time, the conduction status of the power module's bypass switch is checked. If the bypass switch is normally turned on and off, the test is passed; otherwise, it fails.

[0117] S103. After the test is completed, the power module is cut out.

[0118] Optional, Figure 10 This is a flowchart of another aging test method provided in an embodiment of the present invention. Based on the above embodiments, see [link to other embodiments]. Figure 10 Aging test methods include:

[0119] S201. Connect the input terminals of at least two of the power modules in parallel and connect them to the output terminal of the constant voltage DC power supply.

[0120] S202. Connect the output terminals of at least two of the power modules in series, and connect them in series with the reactor and the circuit breaker.

[0121] S401. Control the conduction state of the bypass switch to adjust the number of power modules switched in; wherein the number of power modules is an even number.

[0122] S203. The rated voltage signal is output through the constant voltage DC power supply to drive the power module to operate.

[0123] S501. Control the power module to run for a preset time.

[0124] S502. Obtain the first temperature information of the dual active bridge of the power module, and determine the aging test result of the dual active bridge of the power module based on the first temperature information and a first preset threshold.

[0125] S701. The first temperature information is compared with a first preset threshold to generate a comparison result.

[0126] If the first temperature information is less than or equal to the first preset threshold, the aging test result of the dual active bridge is qualified.

[0127] Specifically, since the first preset threshold is the highest temperature at which the dual active bridge can operate normally, if the first temperature information is less than or equal to the first preset threshold, it can be said that the aging test result of the dual active bridge is qualified; otherwise, it can be said that the dual active bridge has failed.

[0128] S503. Obtain the second temperature information of the cascaded H-bridge of the power module, and determine the aging test result of the cascaded H-bridge of the power module based on the second temperature information and a second preset threshold.

[0129] S103. After the test is completed, the power module is cut out.

[0130] Optional, Figure 11 This is a flowchart of another aging test method provided in an embodiment of the present invention. Based on the above embodiments, see [link to other embodiments]. Figure 11 Aging test methods include:

[0131] S201. Connect the input terminals of at least two of the power modules in parallel and connect them to the output terminal of the constant voltage DC power supply.

[0132] S202. Connect the output terminals of at least two of the power modules in series, and connect them in series with the reactor and the circuit breaker.

[0133] S401. Control the conduction state of the bypass switch to adjust the number of power modules switched in; wherein the number of power modules is an even number.

[0134] S203. The rated voltage signal is output through the constant voltage DC power supply to drive the power module to operate.

[0135] S501. Control the power module to run for a preset time.

[0136] S502. Obtain the first temperature information of the dual active bridge of the power module, and determine the aging test result of the dual active bridge of the power module based on the first temperature information and a first preset threshold.

[0137] S503. Obtain the second temperature information of the cascaded H-bridge of the power module, and determine the aging test result of the cascaded H-bridge of the power module based on the second temperature information and a second preset threshold.

[0138] S801. The second temperature information is compared with a second preset threshold to generate a comparison result.

[0139] If the second temperature information is less than or equal to the second preset threshold, the aging test result of the cascaded H-bridge is qualified.

[0140] Specifically, since the second preset threshold is the highest temperature at which the cascaded H-bridge operates normally, if the second temperature information is less than or equal to the second preset threshold, it can be said that the aging test result of the cascaded H-bridge is qualified; otherwise, it can be said that the cascaded H-bridge has failed.

[0141] S103. After the test is completed, the power module is cut out.

[0142] Optional, Figure 12 This is a flowchart of another aging test method provided in an embodiment of the present invention. Based on the above embodiments, see [link to other embodiments]. Figure 12 Aging test methods include:

[0143] S201. Connect the input terminals of at least two of the power modules in parallel and connect them to the output terminal of the constant voltage DC power supply.

[0144] S202. Connect the output terminals of at least two of the power modules in series, and connect them in series with the reactor and the circuit breaker.

[0145] S301. Unlock the dual active bridge and adjust the phase shift angle of the dual active bridge until the power module outputs the rated voltage.

[0146] S302. Close the circuit breaker.

[0147] S303. Unlock the cascaded H-bridge and adjust the phase difference of the cascaded H-bridge until the power module outputs the rated current.

[0148] S102. Based on the established aging test system, perform aging tests on at least two components of the power module and generate test results.

[0149] S901. Reduce the phase difference of the cascaded H-bridge of the power module until it is zero, and lock the cascaded H-bridge.

[0150] Specifically, the phase difference of the sine wave is adjusted until the phase difference of the cascaded H-bridge is zero, and then the cascaded H-bridge is locked, so that the current no longer passes through the cascaded H-bridge.

[0151] S902, Open the circuit breaker of the aging test system.

[0152] Specifically, since there is no current output, the circuit breaker can be controlled to trip at this time.

[0153] S903. Reduce the phase shift angle of the dual active bridge of the power module until it is zero, and lock the dual active bridge.

[0154] Specifically, the on-time of the switching transistors is changed until the phase shift angle of the dual-active bridge is zero. Then, the dual-active bridge is locked, and it no longer receives voltage signals from the constant-voltage DC power supply. Both the dual-active bridge and the cascaded H-bridge are locked, at which point the power module has been switched off.

[0155] S904. Turn off the constant voltage DC power supply.

[0156] Specifically, after the power module is switched off, the constant voltage DC power supply can be turned off to end the test.

[0157] Optional, Figure 13 This is a schematic diagram of an aging test system provided in an embodiment of the present invention. Based on the above embodiment, see... Figure 13 The aging test system 100 provided in this embodiment of the invention is used to execute the aging test method described in any of the above embodiments. The aging test system includes:

[0158] The access module 11 is used to connect at least two of the power modules to the aging test system and control the operation of the power modules based on the aging test system.

[0159] Test module 12 is used to perform aging tests on at least two components of the power module based on the constructed aging test system, and generate test results;

[0160] The cut-out module 13 is used to cut out the power module after the test is completed.

[0161] Optionally, the access module 11 is specifically used to connect the input terminals of at least two power modules in parallel and connect them to the output terminal of the constant voltage DC power supply; connect the output terminals of at least two power modules in series and connect them in series with the reactor and the circuit breaker; and drive the power modules to operate by outputting a rated voltage signal through the constant voltage DC power supply.

[0162] Optionally, the access module 11 is also used to unlock the dual active bridge and adjust the phase shift angle of the dual active bridge until the power module outputs the rated voltage; close the circuit breaker; unlock the cascaded H bridge and adjust the phase difference of the cascaded H bridge until the power module outputs the rated current.

[0163] Optionally, the access module 11 is also used to control the conduction state of the bypass switch to adjust the number of power modules switched in.

[0164] Optionally, the test module 12 is specifically used to control the power module to run for a preset time; acquire the first temperature information of the dual active bridge of the power module, and determine the aging test result of the dual active bridge of the power module based on the first temperature information and a first preset threshold; acquire the second temperature information of the cascaded H-bridge of the power module, and determine the aging test result of the cascaded H-bridge of the power module based on the second temperature information and a second preset threshold.

[0165] Optionally, the test module 12 is further configured to acquire the conduction status information of the bypass switch of the power module, and determine the test result of the bypass switch based on the conduction status information of the bypass switch.

[0166] Optionally, the cut-out module 13 is specifically used to reduce the phase difference of the cascaded H-bridge of the power module until it is zero, and lock the cascaded H-bridge; open the circuit breaker of the aging test system; reduce the phase shift angle of the dual active bridge of the power module until it is zero, and lock the dual active bridge; and turn off the constant voltage DC power supply.

[0167] The aging test system provided in this embodiment of the invention includes an access module, a test module, and a cut-off module. The access module, based on the aging test system, controls the conduction state of the bypass switch to adjust the number of power modules that can be switched on. The access module unlocks the dual active bridge and adjusts its phase shift angle until the power module outputs its rated voltage. It then closes the circuit breaker and unlocks the cascaded H-bridge, adjusting the phase difference of the cascaded H-bridge until the power module outputs its rated current.

[0168] After the test module controls the power module to operate for a preset time, it obtains the first temperature information of the dual active bridge of the power module, compares the first temperature information with the first preset threshold. If the first temperature information is less than or equal to the first preset threshold, it can indicate that the aging test result of the dual active bridge is qualified; otherwise, it indicates that the dual active bridge fails. The test module obtains the second temperature information of the cascaded H-bridge of the power module, compares the second temperature information with the second preset threshold. If the second temperature information is less than or equal to the second preset threshold, it can indicate that the aging test result of the cascaded H-bridge is qualified; otherwise, it indicates that the cascaded H-bridge fails. The test module also obtains the conduction state information of the bypass switch of the power module, confirms the conduction state of the bypass switch of the power module. If the bypass switch conducts and shuts off normally, it passes the test; otherwise, it fails.

[0169] After the aging test is completed, the cut-out module reduces the phase difference of the cascaded H-bridge of the power module until it is zero, then locks the cascaded H-bridge, opens the circuit breaker of the aging test system, reduces the phase shift angle of the dual active bridge of the power module until it is zero, then locks the dual active bridge, and turns off the constant voltage DC power supply to end the test. The aging test system of the embodiment of the present invention realizes aging tests on multiple components of multiple power modules at one time, has a high test integrity, saves operation time and test costs, and improves safety.

[0170] It should be understood that various forms of the processes shown above can be used, steps can be reordered, added or deleted. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and no limitation is made herein.

[0171] The above specific embodiments do not constitute a limitation on the protection scope of the present invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

Claims

1. An aging test method characterized by, The aging test method is applied to an aging test system, the aging test system comprising a reactor, a circuit breaker and a constant-voltage direct-current power supply, the constant-voltage direct-current power supply being connected to an input end of a power module; an output end of the power module being connected to the reactor and the circuit breaker; the method comprising: based on the aging test system, connecting at least two power modules to the aging test system and controlling the power modules to operate; wherein the input ends of the at least two power modules are connected in parallel to an output end of the constant-voltage direct-current power supply; the output ends of the at least two power modules are connected in series to the reactor and the circuit breaker; a rated voltage signal is output by the constant-voltage direct-current power supply to drive the power modules to operate; wherein the power module comprises a double active bridge and a cascaded H-bridge, the double active bridge being connected to the cascaded H-bridge, and the double active bridge being connected to the constant-voltage direct-current power supply; the double active bridge is unlocked, and a phase shift angle of the double active bridge is adjusted until the power module outputs a rated voltage; the circuit breaker is closed; the cascaded H-bridge is unlocked, and a phase difference of the cascaded H-bridge is adjusted until the power module outputs a rated current; based on the built aging test system, performing aging tests on at least two components of the power module to generate test results; comprising: controlling the power modules to operate for a preset time; obtaining first temperature information of a double active bridge of the power module, and determining an aging test result of the double active bridge of the power module based on the first temperature information and a first preset threshold; obtaining second temperature information of a cascaded H-bridge of the power module, and determining an aging test result of the cascaded H-bridge of the power module based on the second temperature information and a second preset threshold; after the test is completed, the power module is cut out.

2. The method of claim 1, wherein, The aging test system further comprises at least two bypass switches, the bypass switches being connected to the output end of the power module; before the constant-voltage direct-current power supply outputs a rated voltage signal to drive the power modules to operate, the method further comprises: controlling a conduction state of the bypass switches to adjust the number of power modules that are cut in; wherein the number of power modules is even.

3. The method of claim 2, wherein, The method of performing aging tests on at least two components of the power module based on the built aging test system to generate test results further comprises: obtaining conduction state information of a bypass switch of the power module, and determining a test result of the bypass switch based on the conduction state information of the bypass switch.

4. The method of claim 1, wherein, The method of determining an aging test result of the double active bridge of the power module based on the first temperature information and a first preset threshold comprises: comparing the first temperature information with the first preset threshold to generate a comparison result; if the first temperature information is less than or equal to the first preset threshold, the aging test result of the double active bridge is qualified.

5. The method of claim 1, wherein, The method of determining an aging test result of the cascaded H-bridge of the power module based on the second temperature information and a second preset threshold comprises: comparing the second temperature information with a second preset threshold to generate a comparison result; if the second temperature information is less than or equal to the second preset threshold, the aging test result of the cascade H-bridge is qualified.

6. The method of claim 1, wherein, after the test is completed, the power module is cut out, including: reducing the phase difference of the cascade H-bridge of the power module until zero, and locking the cascade H-bridge; opening the circuit breaker of the aging test system; reducing the phase-shifting angle of the dual-active bridge of the power module until zero, and locking the dual-active bridge; turning off the constant voltage DC power supply.

7. An aging test system characterized by, The aging test system is used to execute the aging test method in any one of claims 1 to 6; the aging test system comprises: an access module, configured to access at least two power modules to the aging test system based on the aging test system and control the power modules to run; a test module, configured to perform aging test on at least two components of the power module based on the built aging test system, and generate a test result; a cut-out module, configured to cut out the power module after the test is completed.

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