Oscillating mirror, shape determination method, device and three-dimensional measurement device

Abstract

The present invention discloses a oscillating mirror and a method, device, and three-dimensional measurement device for determining its shape. The method for determining the shape of the oscillating mirror includes: S10, obtaining initial parameters of the three-dimensional measurement device and initial parameters of the object to be measured; S20, adjusting one of the initial parameters, including the initial position of the object to be measured, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror, according to preset rules, and determining the coordinates of the reflection points of the oscillating mirror's reflection surface based on the adjusted initial parameters until the number of determined reflection point coordinates is greater than or equal to a preset number; S30, determining the shape of the oscillating mirror's reflection surface based on the coordinates of each reflection point. The technical solution of the present invention adjusts the shape of the oscillating mirror according to the morphology of the surface of the object to be measured, and then adjusts the scanning trajectory of the three-dimensional measurement device so that the scanning trajectory of the three-dimensional measurement device is consistent with the morphology of the surface of the object to be measured, thereby improving the accuracy of measuring convex objects to be measured.

Description

Technical Field

[0001] The present invention relates to the field of three-dimensional measurement technology, and in particular to a swing mirror, a method for determining its shape, a device, and a three-dimensional measurement device. Background Art

[0002] Optical 3D imaging technology has a wide range of applications due to its advantages, such as fast data acquisition and high measurement accuracy. For 3D measurement of convex parts such as hatches and wall panels, the main methods used are 3D photography based on mobile robotic platforms or a combination of handheld 3D cameras and transfer stations. However, the former requires high-precision multi-axis robots, which is very expensive, while the latter requires image stitching, which can lead to cumulative errors.

[0003] Currently, there is a synchronous scanning three-dimensional imaging device based on structured light projection. Its scanning trajectory is "concave cylindrical". Therefore, it can only measure concave parts within its optimal effective field of view, and cannot adjust its scanning trajectory according to the shape of the object to be measured so that its scanning trajectory is consistent with the morphology of the surface of the object to be measured. Summary of the Invention

[0004] The present invention provides a oscillating mirror and a method and device for determining its shape, as well as a three-dimensional measuring device, to address the defects in the prior art, so that the scanning trajectory of the three-dimensional measuring device is consistent with the morphology of the surface of the object to be measured, thereby improving the accuracy of measuring convex objects to be measured.

[0005] In a first aspect, the present invention provides a method for determining the shape of a oscillating mirror, wherein the oscillating mirror is used in a three-dimensional measuring device, wherein the three-dimensional measuring device is used to measure the surface shape of an object to be measured, wherein the three-dimensional measuring device includes at least one projection device, at least one imaging device, a rotation mechanism, at least one plane mirror, and the oscillating mirror, wherein the rotation mechanism drives the plane mirror and the oscillating mirror to rotate along a rotation axis, wherein the center of the rotation axis and the reflective surface of the oscillating mirror are both located on the plane where the reflective surface of the plane mirror is located. The method for determining the shape of the oscillating mirror includes:

[0006] S10, acquiring initial parameters of the three-dimensional measuring device and initial parameters of the object to be measured; the initial parameters of the three-dimensional measuring device include the initial shape of the oscillating mirror, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror; the initial parameters of the object to be measured include the initial position of the object to be measured and the surface shape of the object to be measured;

[0007] S20, adjusting one of the initial parameters, namely, the initial position of the object to be measured, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror, according to a preset rule, and determining the coordinates of the reflection points of the reflecting surface of the oscillating mirror according to the adjusted initial parameters until the number of the determined reflection point coordinates is greater than or equal to a preset number;

[0008] S30. Determine the shape of the reflective surface of the oscillating mirror according to the coordinates of each of the reflection points.

[0009] Optionally, when the oscillating mirror is in its initial shape, and the object to be measured, the imaging device, the projection device, and the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the projection device is reflected by the reflective surface of the oscillating mirror and propagates to the initial reflection point on the surface of the object to be measured, and is reflected by the initial reflection point on the surface of the object to be measured and propagates to the reflective surface of the plane mirror, and is reflected by the reflective surface of the plane mirror and received by the imaging device.

[0010] Optionally, the S20 includes:

[0011] S211, when the object to be measured, the imaging device, and the projection device are at their initial positions, controlling the plane mirror and the oscillating mirror to rotate along the rotation axis by a preset angle according to the preset rule;

[0012] S212: When there is a reflection point to be measured on the surface of the object to be measured, and the intersection of the reflected light from the reflection point to be measured and the received light from the imaging device is located on the reflective surface of the plane mirror, determine the intersection of the projection light emitted by the projection device and the incident light on the reflection point to be measured on the surface of the object to be measured as the coordinates of the reflection point on the reflective surface of the oscillating mirror;

[0013] S213 , returning to execute steps S211 to S212 until the number of the determined reflection point coordinates is greater than or equal to a preset number.

[0014] Optionally, the projection device includes a first projection device and a second projection device;

[0015] When the oscillating mirror is in its initial shape and the object to be measured, the first projection device, the second projection device, the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the first projection device is reflected by the reflective surface of the oscillating mirror and is incident on the initial reflection point on the surface of the object to be measured, and the projection light emitted by the second projection device is reflected by the reflective surface of the plane mirror and is incident on the initial reflection point on the surface of the object to be measured.

[0016] Optionally, the S20 includes:

[0017] S221, when the object to be measured, the imaging device, and the projection device are at their initial positions, controlling the plane mirror and the oscillating mirror to rotate along the rotation axis by a preset angle according to the preset rule;

[0018] S222: When there is a reflection point to be measured on the surface of the object to be measured, and an intersection of a reflected light ray emitted by the first projection device after being reflected by the reflective surface of the oscillating mirror and a reflected light ray emitted by the second projection device after being reflected by the reflective surface of the plane mirror is the reflection point to be measured, determining the reflection point of the projection light emitted by the first projection device on the reflective surface of the oscillating mirror as the coordinates of the reflection point on the reflective surface of the oscillating mirror;

[0019] S223 , returning to execute steps S221 to S222 , until the number of the determined reflection point coordinates is greater than or equal to a preset number.

[0020] Optionally, when the oscillating mirror is in its initial shape and the object to be measured, the imaging device, the projection device, and the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the projection device is reflected by the reflective surface of the plane mirror and then propagates to the initial reflection point on the surface of the object to be measured, and is reflected by the initial reflection point on the surface of the object to be measured and then propagates to the reflective surface of the oscillating mirror, and is reflected by the reflective surface of the oscillating mirror and then received by the imaging device.

[0021] Optionally, the S20 includes:

[0022] S231, when the object to be measured, the imaging device, and the projection device are at their initial positions, controlling the plane mirror and the oscillating mirror to rotate along the rotation axis by a preset angle according to the preset rule;

[0023] S232. When there is a reflection point to be measured on the surface of the object to be measured, and the intersection of the projection light emitted by the projection device and the incident light on the reflection point to be measured on the surface of the object to be measured is located on the reflection surface of the plane mirror, the intersection of the reflected light of the reflection point to be measured and the received light of the imaging device is determined as the reflection point coordinates of the reflection surface of the oscillating mirror.

[0024] S233 , returning to execute steps S231 to S232 until the number of the determined reflection point coordinates is greater than or equal to a preset number.

[0025] Optionally, the oscillating mirror includes a first reflecting surface and a second reflecting surface that are not coplanar, the first reflecting surface being located on a side of the second reflecting surface away from the projection device; the first reflecting surface is deflected toward a side away from the reflecting surface, and the second reflecting surface is deflected toward a side of the reflecting surface;

[0026] When the oscillating mirror is in its initial shape, and the object to be measured, the imaging device, the projection device, and the plane mirror and the oscillating mirror are all located at their respective initial positions, and the projection light emitted by the projection device is reflected by the reflective surface of the oscillating mirror and propagates to the initial reflection point on the surface of the object to be measured, the reflection point of the projection light emitted by the projection device on the reflective surface of the oscillating mirror is located at the junction of the first reflective surface and the second reflective surface.

[0027] Optionally, the preset rules include:

[0028] The plane mirror and the oscillating mirror are rotated in a counterclockwise direction along the rotation axis in sequence by a preset angle to determine the coordinates of the reflection point on the first reflection surface; and

[0029] The plane mirror and the oscillating mirror are rotated in sequence along the rotation axis in a clockwise direction by a preset angle to determine the coordinates of the reflection point on the second reflection surface.

[0030] In a second aspect, the present invention provides a device for determining the shape of a oscillating mirror, wherein the oscillating mirror is used in a three-dimensional measuring device, wherein the three-dimensional measuring device is used to measure the surface shape of an object to be measured, wherein the three-dimensional measuring device includes at least one projection device, at least one imaging device, a rotation mechanism, at least one plane mirror, and the oscillating mirror, wherein the rotation mechanism drives the plane mirror and the oscillating mirror to rotate along a rotation axis, wherein the center of the rotation axis and the reflective surface of the oscillating mirror are both located on the plane where the reflective surface of the plane mirror is located, and the device for determining the shape of the oscillating mirror includes:

[0031] an initial parameter acquisition module, configured to acquire initial parameters of the three-dimensional measuring device and initial parameters of the object to be measured; the initial parameters of the three-dimensional measuring device include the initial shape of the oscillating mirror, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror; the initial parameters of the object to be measured include the initial position of the object to be measured and the surface shape of the object to be measured;

[0032] a reflection point coordinate determination module, configured to adjust one of the initial parameters, namely, the initial position of the object to be measured, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror, according to a preset rule, and determine the reflection point coordinates of the reflecting surface of the oscillating mirror according to the adjusted initial parameters until the number of the determined reflection point coordinates is greater than or equal to a preset number;

[0033] The swing mirror shape determination module is used to determine the shape of the swing mirror reflective surface according to the coordinates of each reflection point.

[0034] In a third aspect, the present invention provides a oscillating mirror for use in a three-dimensional measuring device, the three-dimensional measuring device being used to measure the surface shape of an object to be measured, the three-dimensional measuring device comprising at least one projection device, at least one imaging device, a rotation mechanism, at least one plane mirror, and the oscillating mirror, wherein the rotation mechanism drives the plane mirror and the oscillating mirror to rotate along a rotation axis, wherein the centers of the rotation axis and the reflective surface of the oscillating mirror are both located on the plane where the reflective surface of the plane mirror is located;

[0035] The shape of the oscillating mirror is determined by any of the above methods for determining the shape of the oscillating mirror.

[0036] In a fourth aspect, the present invention provides a three-dimensional measuring device comprising at least one projection device, at least one imaging device, a rotation mechanism, at least one plane mirror, and the oscillating mirror according to claim 8;

[0037] The rotating mechanism drives the plane mirror and the oscillating mirror to rotate along a rotation axis, and the centers of the rotation axis and the reflecting surface of the oscillating mirror are both located on the plane where the reflecting surface of the plane mirror is located.

[0038] The technical solution of the present invention obtains initial parameters of a three-dimensional measuring device and initial parameters of an object to be measured, and then adjusts one of the initial parameters, including the initial position of the object to be measured, the initial position of an imaging device, the initial position of a projection device, and the initial positions of a plane mirror and a swing mirror, according to preset rules. The coordinates of reflection points of a swing mirror reflection surface are determined according to the adjusted initial parameters until the number of determined reflection point coordinates is greater than or equal to a preset number, thereby determining the shape of the swing mirror reflection surface according to the coordinates of each reflection point. The shape of the swing mirror can be adjusted according to the morphology of the surface of the object to be measured, and the scanning trajectory of the three-dimensional measuring device is adjusted to make the scanning trajectory of the three-dimensional measuring device consistent with the morphology of the surface of the object to be measured, thereby improving the measurement accuracy when measuring the object to be measured.

[0039] It should be understood that the content described in this section is not intended to identify the key or important features of the embodiments of the present invention, nor is it intended to limit the scope of the present invention. Other features of the present invention will become readily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0041] Figure 1 A schematic structural diagram of a three-dimensional measurement device provided in Example 1 of the present invention;

[0042] Figure 2 and Figure 3 Schematic diagrams of the structures of two other three-dimensional measurement devices provided in Example 1 of the present invention;

[0043] Figure 4 A flowchart of a method for determining the shape of a oscillating mirror provided in the second embodiment of the present invention;

[0044] Figure 5 A flowchart of a method for determining the shape of a oscillating mirror provided in Example 3 of the present invention;

[0045] Figure 6 A flowchart of a method for determining the shape of a oscillating mirror provided in a fourth embodiment of the present invention;

[0046] Figure 7 A flowchart of a method for determining the shape of a oscillating mirror provided in a fifth embodiment of the present invention;

[0047] Figure 8 This is a structural diagram of a device for determining the shape of a oscillating mirror provided in Example 6 of the present invention. DETAILED DESCRIPTION

[0048] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of the present invention.

[0049] It should be noted that the terms "first", "second", etc. in the description and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0050] Example 1

[0051] An embodiment of the present invention provides a three-dimensional measurement device. Figure 1 This is a schematic diagram of the structure of a three-dimensional measurement device provided in Example 1 of the present invention, with reference to Figure 1 As shown, the three-dimensional measuring device includes at least one projection device 1, at least one imaging device 2, a rotating mechanism 3, at least one plane mirror 4 and an oscillating mirror 5. The rotating mechanism 3 drives the plane mirror 4 and the oscillating mirror 5 to rotate along the rotation axis 6. The centers of the rotation axis 6 and the reflection surface of the oscillating mirror 5 are both located on the plane where the reflection surface of the plane mirror 4 is located.

[0052] Among them, the projection device 1 may include but is not limited to a laser array or a projector. For example, when the projection device 1 includes a laser array, a 1mw point laser light source can be used, and the average width of the line laser is 2mm. Its projection method can adopt any existing two-dimensional projection structured light technology with encoded information, such as grating projection, Fourier projection, color structured light projection, etc. When the Fourier projection method is adopted, the phase method and the triangulation method can be integrated simultaneously to calculate the three-dimensional spatial data. The structured light stripes can be longitudinal structured light stripes. In this embodiment, one projection device 1 can be included, or multiple projection devices 1 can be included. As long as the core invention point of this embodiment can be achieved, the embodiment of the present invention does not specifically limit the number of projection devices 1.

[0053] The imaging device 2 can adopt any existing two-dimensional array imaging technology, such as a general imaging device such as a two-dimensional CCD camera. In this embodiment, one imaging device 2 can be included, or multiple imaging devices 2 can be set. The positions of the multiple imaging devices 2 can be set as needed. As long as the core invention of this embodiment can be achieved, the embodiment of the present invention does not make specific limitations on this.

[0054] It should be noted that the three-dimensional measurement device provided in this embodiment may include at least one projection device and at least one imaging device. Figure 1 This example illustrates a 3D measurement device comprising a projection device and an imaging device, with the projection light emitted by the projection device reflected by an oscillating mirror. This does not limit the structure of the 3D measurement device. This embodiment does not specifically limit the number of projection devices and imaging devices, nor their relative positions to the plane mirror and oscillating mirror. It suffices to ensure that the core inventive concept of the present invention is achieved.

[0055] In other embodiments, Figure 2 and Figure 3 This is a schematic diagram of the structure of two other three-dimensional measurement devices provided in Example 1 of the present invention, referring to Figure 2 As shown, the three-dimensional measuring device may further include a projection device and an imaging device, and the projection light emitted by the projection device is reflected by a plane mirror; Figure 3As shown, the three-dimensional measuring device may further include a projection device and two imaging devices, and the projection light emitted by the projection device is reflected by a plane.

[0056] In this embodiment, the projection light emitted by the projection device is reflected by the oscillating mirror and then projected onto a reflection point on the surface of the object to be measured. After reflecting from the reflection point on the surface of the object to be measured, the projection light propagates to the plane mirror and is reflected by the plane mirror to the imaging device. This allows the imaging device to measure the surface of the object to be measured based on the projection light emitted by the projection device and the received reflected light. It will be understood that when the reflective surface of the oscillating mirror has different shapes, the scanning trajectory of the three-dimensional measurement device will also be different. Therefore, the shape of the reflective surface of the oscillating mirror can be determined based on the topography of the surface to be measured, so that the scanning trajectory of the three-dimensional measurement device is consistent with the topography of the surface to be measured, thereby further improving the measurement accuracy of the three-dimensional measurement device.

[0057] Example 2

[0058] An embodiment of the present invention provides a method for determining the shape of a swing mirror, which can be used to determine the shape of the reflective surface of the swing mirror in the three-dimensional measurement device provided by an embodiment of the present invention. The determination method can be executed by the swing mirror shape determination device provided by an embodiment of the present invention. The determination device can be implemented in the form of hardware and / or software, and the determination device can be integrated into an electronic device. Figure 4 This is a flow chart of a method for determining the shape of a oscillating mirror provided in the second embodiment of the present invention, such as Figure 4 As shown, the determination method includes:

[0059] S10: Acquire initial parameters of the three-dimensional measurement device and initial parameters of the object to be measured.

[0060] Among them, the initial parameters of the three-dimensional measurement device include the initial shape of the oscillating mirror, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror; the initial parameters of the object to be measured include the initial position of the object to be measured and the surface shape of the object to be measured.

[0061] Exemplarily, the initial shape of the oscillating mirror can be a plane, a curved surface, two planes with a folding angle, etc. This embodiment does not limit the initial shape of the oscillating mirror; in addition, this embodiment does not limit the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror, nor does it limit the initial position of the object to be measured and the surface shape of the object to be measured.

[0062] In an optional embodiment, the initial parameters of the three-dimensional measuring device and the initial parameters of the object to be measured need to satisfy the following conditions: when the oscillating mirror is in its initial shape and the object to be measured, the imaging device, the projection device, the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the projection device is reflected by the reflective surface of the oscillating mirror and then propagates to the initial reflection point on the surface of the object to be measured, and then propagates to the reflective surface of the plane mirror after being reflected by the initial reflection point on the surface of the object to be measured, and then is reflected by the reflective surface of the plane mirror and then received by the imaging device.

[0063] In another optional embodiment, when the projection device includes a first projection device and a second projection device, it is satisfied that when the oscillating mirror is in an initial shape and the object to be measured, the first projection device, the second projection device, the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the first projection device is reflected by the reflective surface of the oscillating mirror and is incident on the initial reflection point on the surface of the object to be measured, and the projection light emitted by the second projection device is reflected by the reflective surface of the plane mirror and is incident on the initial reflection point on the surface of the object to be measured.

[0064] S20. Adjust one of the initial parameters, including the initial position of the object to be measured, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the swing mirror, according to preset rules, and determine the coordinates of the reflection points of the swing mirror reflection surface according to the adjusted initial parameters until the number of determined reflection point coordinates is greater than or equal to a preset number.

[0065] The preset rule may include, but is not limited to, sequentially adjusting the initial position of the object to be measured, the initial position of the imaging device, the initial position of the projection device, or the initial positions of the plane mirror and the oscillating mirror in a certain step size. The preset number may be determined based on the measurement accuracy requirements of the three-dimensional measurement device. If the measurement accuracy requirements of the three-dimensional measurement device are not high, the preset number may be set to a small value, for example, 3. If the measurement accuracy requirements of the three-dimensional measurement device are high, the preset number may be set to a large value. In this embodiment, the preset number is limited to a positive integer greater than or equal to 3.

[0066] Among them, determining the coordinates of the reflection point of the reflection surface of the oscillating mirror according to the adjusted initial parameters includes but is not limited to: when the shape of the oscillating mirror is adjusted, and the object to be measured, the imaging device, the projection device, the plane mirror and the oscillating mirror are all located at their respective adjusted initial positions, the projection light emitted by the projection device is reflected by the reflection surface of the oscillating mirror and then propagates to the reflection point on the surface of the object to be measured, and is reflected by the reflection point on the surface of the object to be measured and then propagates to the reflection surface of the plane mirror, and is reflected by the reflection surface of the plane mirror and then received by the imaging device, the reflection point of the projection light emitted by the projection device at the oscillating mirror is determined as the reflection point of the reflection surface of the oscillating mirror.

[0067] S30, determining the shape of the reflective surface of the oscillating mirror according to the coordinates of each reflection point.

[0068] The coordinates of each reflection point can be fitted to form a smooth curved surface, which is then determined as the shape of the reflective surface of the oscillating mirror.

[0069] Specifically, the initial parameters of the three-dimensional measuring device and the initial parameters of the object to be measured are first obtained, so that when the oscillating mirror is in an initial shape and the object to be measured, the imaging device, the projection device, the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the projection device is reflected by the reflection surface of the oscillating mirror and then propagates to the initial reflection point on the surface of the object to be measured, and then is reflected by the initial reflection point on the surface of the object to be measured and then propagates to the reflection surface of the plane mirror, and is reflected by the reflection surface of the plane mirror and then received by the imaging device, and then one of the initial positions of the object to be measured, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror in the initial parameters is adjusted according to a preset rule, so that the shape of the oscillating mirror after adjustment is When the object to be measured, the imaging device, the projection device, the plane mirror and the oscillating mirror are all located in their respective adjusted initial positions, the projection light emitted by the projection device is reflected by the reflection surface of the oscillating mirror and propagates to the reflection point on the surface of the object to be measured, and is reflected by the reflection point on the surface of the object to be measured and propagates to the reflection surface of the plane mirror, and is reflected by the reflection surface of the plane mirror and received by the imaging device, thereby determining the reflection point coordinates of the oscillating mirror reflection surface according to the adjusted initial parameters, until the number of determined reflection point coordinates is greater than or equal to a preset number, so that the shape of the oscillating mirror reflection surface can be determined according to the coordinates of each reflection point. In this way, the shape of the oscillating mirror can be adjusted according to the shape of the surface of the object to be measured, so as to improve the measurement accuracy of the three-dimensional measurement device.

[0070] In this embodiment, initial parameters of the three-dimensional measuring device and initial parameters of the object to be measured are obtained, and then one of the initial parameters, namely, the initial position of the object to be measured, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror, is adjusted according to a preset rule. The coordinates of the reflection points of the oscillating mirror reflection surface are determined based on the adjusted initial parameters until the number of determined reflection point coordinates is greater than or equal to a preset number. The shape of the oscillating mirror reflection surface is determined based on the coordinates of each reflection point, and the shape of the oscillating mirror can be adjusted according to the morphology of the surface of the object to be measured. The scanning trajectory of the three-dimensional measuring device is then adjusted to make the scanning trajectory of the three-dimensional measuring device consistent with the morphology of the surface of the object to be measured, thereby improving the measurement accuracy when measuring the object to be measured.

[0071] Example 3

[0072] Figure 5 This is a flow chart of a method for determining the shape of a oscillating mirror provided in the third embodiment of the present invention. Based on the above embodiment, this embodiment further defines that when the three-dimensional projection device includes an imaging device and a projection device, the specific steps of S20 are as follows: Figure 5 As shown, the method specifically includes:

[0073] S10: Acquire initial parameters of the three-dimensional measurement device and initial parameters of the object to be measured.

[0074] Among them, the initial parameters of the three-dimensional measurement device include the initial shape of the oscillating mirror, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror; the initial parameters of the object to be measured include the initial position of the object to be measured and the surface shape of the object to be measured.

[0075] At this time, the initial parameters of the three-dimensional measuring device and the initial parameters of the object to be measured should satisfy the following conditions: when the oscillating mirror is in its initial shape and the object to be measured, the imaging device, the projection device, the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the projection device is reflected by the reflective surface of the oscillating mirror and then propagates to the initial reflection point on the surface of the object to be measured, and then propagates to the reflective surface of the plane mirror after being reflected by the initial reflection point on the surface of the object to be measured, and then is reflected by the reflective surface of the plane mirror and then received by the imaging device.

[0076] S211 , when the object to be measured, the imaging device, and the projection device are at their initial positions, controlling the plane mirror and the oscillating mirror to rotate along the rotation axis by a preset angle according to a preset rule.

[0077] Among them, the preset angle can be related to the shape and preset number of the object to be measured. When the plane mirror and the swing mirror are controlled to rotate along the rotation axis by the preset angle according to the preset rules until the number of determined reflection point coordinates is greater than or equal to the preset number, the measurement of the object to be measured can be completed. For example, when the object to be measured is large and the preset number is small, the preset angle can be set to a larger angle; when the object to be measured is small and the preset number is large, the preset angle can be set to a smaller angle.

[0078] In an optional embodiment, the oscillating mirror includes a first reflecting surface and a second reflecting surface that are not coplanar, the first reflecting surface being located on a side of the second reflecting surface away from the projection device; the first reflecting surface is deflected toward a side away from the reflecting surface, and the second reflecting surface is deflected toward a side of the reflecting surface; when the oscillating mirror is in an initial shape, and the object to be measured, the imaging device, the projection device, the plane mirror, and the oscillating mirror are all located at their respective initial positions, and the projection light emitted by the projection device is reflected by the reflecting surface of the oscillating mirror and propagates to the initial reflection point on the surface of the object to be measured, the reflection point of the projection light emitted by the projection device on the reflecting surface of the oscillating mirror is located at the intersection of the first reflecting surface and the second reflecting surface. In this case, the preset rule includes the plane mirror and the oscillating mirror being rotated in sequence by a preset angle along the rotation axis in a counterclockwise direction to determine the coordinates of the reflection point on the first reflecting surface; and the plane mirror and the oscillating mirror being rotated in sequence by a preset angle along the rotation axis in a clockwise direction to determine the coordinates of the reflection point on the second reflecting surface.

[0079] S212. When there is a reflection point to be measured on the surface of the object to be measured, and the intersection of the reflected light from the reflection point to be measured and the received light of the imaging device is located on the reflection surface of the plane mirror, the intersection of the projection light emitted by the projection device and the incident light incident on the reflection point to be measured on the surface of the object to be measured is determined as the coordinates of the reflection point on the reflection surface of the oscillating mirror.

[0080] Specifically, when the object to be measured is in the initial position, the imaging device is in the initial position, and the projection device is in the initial position, after the plane mirror and the swing mirror are controlled to rotate along the rotation axis by a preset angle according to preset rules, there is a reflection point to be measured on the surface of the object to be measured. The reflected light from the reflection point to be measured can be reflected by the plane mirror and received by the imaging device. At this time, the intersection of the projection light emitted by the projection device and the incident light on the reflection point to be measured can be determined as the coordinates of the reflection point on the reflection surface of the swing mirror.

[0081] S213 , returning to execute steps S211 to S212 until the number of determined reflection point coordinates is greater than or equal to a preset number.

[0082] Specifically, after determining the intersection of the projection light emitted by the projection device and the incident light on the reflection point to be measured on the surface of the object to be measured as the reflection point coordinate of the swing mirror reflection surface, continue to control the plane mirror and the swing mirror to rotate along the rotation axis by a preset angle according to the preset rules, so as to determine another reflection point coordinate of the swing mirror reflection surface according to the intersection of the projection light emitted by the projection device and the incident light on the reflection point to be measured, until the number of determined reflection point coordinates is greater than or equal to the preset number.

[0083] S30, determining the shape of the reflective surface of the oscillating mirror according to the coordinates of each reflection point.

[0084] In this embodiment, when the object to be measured, the imaging device, and the projection device are at their initial positions, the plane mirror and the oscillating mirror are controlled to rotate along the rotation axis at a preset angle according to a preset rule, so that the projection light emitted by the projection device is incident on different positions of the reflection surface of the oscillating mirror, and the coordinates of the reflection points at different positions of the reflection surface of the oscillating mirror can be determined; when there is a reflection point to be measured on the surface of the object to be measured, and the intersection of the reflected light from the reflection point to be measured and the received light of the imaging device is located on the reflection surface of the plane mirror, the projection light emitted by the projection device is incident on the reflection point to be measured on the surface of the object to be measured. The intersection of the incident rays is determined as the coordinate of the reflection point of the swing mirror reflection surface, and the process returns to the step of controlling the plane mirror and the swing mirror to rotate along the rotation axis by a preset angle according to a preset rule until the number of determined reflection point coordinates is greater than or equal to the preset number, thereby determining the shape of the swing mirror reflection surface according to each reflection point coordinate. When the shape of the swing mirror reflection surface is determined, the position of the object to be measured, the position of the imaging device, and the position of the projection device are determined. This allows accurate measurement to be performed without re-determining the position of the object to be measured, the position of the imaging device, and the position of the projection device during actual measurement by the three-dimensional measuring device, thereby improving measurement efficiency.

[0085] Example 4

[0086] Figure 6 This is a flowchart of a method for determining the shape of a oscillating mirror provided in the fourth embodiment of the present invention. Based on the above embodiment, this embodiment further defines the specific steps of S20 when the three-dimensional projection device includes a first projection device and a second projection device. Figure 6 As shown, the method specifically includes:

[0087] S10: Acquire initial parameters of the three-dimensional measurement device and initial parameters of the object to be measured.

[0088] Among them, the initial parameters of the three-dimensional measurement device include the initial shape of the oscillating mirror, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror; the initial parameters of the object to be measured include the initial position of the object to be measured and the surface shape of the object to be measured.

[0089] At this time, the initial parameters of the three-dimensional measuring device and the initial parameters of the object to be measured should satisfy the following conditions: when the oscillating mirror is in its initial shape and the object to be measured, the first projection device, the second projection device, the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the first projection device is reflected by the reflective surface of the oscillating mirror and is incident on the initial reflection point on the surface of the object to be measured, and the projection light emitted by the second projection device is reflected by the reflective surface of the plane mirror and is incident on the initial reflection point on the surface of the object to be measured.

[0090] S221 , when the object to be measured, the imaging device, and the projection device are at their initial positions, controlling the plane mirror and the oscillating mirror to rotate along the rotation axis by a preset angle according to a preset rule.

[0091] Among them, the preset angle can be related to the shape and preset number of the object to be measured. When the plane mirror and the swing mirror are controlled to rotate along the rotation axis by the preset angle according to the preset rules until the number of determined reflection point coordinates is greater than or equal to the preset number, the measurement of the object to be measured can be completed.

[0092] In an optional embodiment, the oscillating mirror includes a first reflecting surface and a second reflecting surface that are not coplanar, the first reflecting surface being located on a side of the second reflecting surface away from the projection device; the first reflecting surface is deflected toward a side away from the reflecting surface, and the second reflecting surface is deflected toward a side of the reflecting surface; when the oscillating mirror is in an initial shape, and the object to be measured, the imaging device, the projection device, the plane mirror, and the oscillating mirror are all located at their respective initial positions, and the projection light emitted by the projection device is reflected by the reflecting surface of the oscillating mirror and propagates to the initial reflection point on the surface of the object to be measured, the reflection point of the projection light emitted by the projection device on the reflecting surface of the oscillating mirror is located at the intersection of the first reflecting surface and the second reflecting surface. In this case, the preset rule includes the plane mirror and the oscillating mirror being rotated in sequence by a preset angle along the rotation axis in a counterclockwise direction to determine the coordinates of the reflection point on the first reflecting surface; and the plane mirror and the oscillating mirror being rotated in sequence by a preset angle along the rotation axis in a clockwise direction to determine the coordinates of the reflection point on the second reflecting surface.

[0093] S222. When there is a reflection point to be measured on the surface of the object to be measured, and the intersection of the reflected light of the projection light emitted by the first projection device after being reflected by the reflective surface of the oscillating mirror and the reflected light of the projection light emitted by the second projection device after being reflected by the reflective surface of the plane mirror is the reflection point to be measured, the reflection point of the projection light emitted by the first projection device on the reflective surface of the oscillating mirror is determined as the coordinates of the reflection point of the reflective surface of the oscillating mirror.

[0094] Specifically, when the object to be measured is in the initial position, the imaging device is in the initial position, and the projection device is in the initial position, after the plane mirror and the swing mirror are controlled to rotate along the rotation axis by a preset angle according to preset rules, there is a reflection point to be measured on the surface of the object to be measured, and the projection light emitted by the first projection device is reflected by the reflection surface of the swing mirror and is incident on the reflection point to be measured. At the same time, the projection light emitted by the second projection device is also reflected by the reflection surface of the plane mirror and is incident on the reflection point to be measured. At this time, the reflection point of the projection light emitted by the first projection device on the reflection surface of the swing mirror is determined as the reflection point coordinate of the reflection surface of the swing mirror.

[0095] S223 , returning to execute steps S221 to S222 until the number of determined reflection point coordinates is greater than or equal to a preset number.

[0096] Specifically, after the reflection point of the projection light emitted by the first projection device on the reflection surface of the oscillating mirror is determined as the reflection point coordinate of the reflection surface of the oscillating mirror, the plane mirror and the oscillating mirror are continued to be controlled to rotate along the rotation axis by a preset angle according to the preset rules, so as to determine the coordinates of other reflection points on the reflection surface of the oscillating mirror according to the reflection point of the projection light emitted by the first projection device on the reflection surface of the oscillating mirror, until the number of determined reflection point coordinates is greater than or equal to the preset number.

[0097] S30, determining the shape of the reflective surface of the oscillating mirror according to the coordinates of each reflection point.

[0098] In this embodiment, when the object to be measured, the imaging device, and the projection device are at their initial positions, the plane mirror and the oscillating mirror are controlled to rotate by a preset angle along the rotation axis according to a preset rule, so that the projection light emitted by the first projection device is incident on different positions of the reflective surface of the oscillating mirror, thereby determining the coordinates of the reflection points at different positions of the reflective surface of the oscillating mirror. When there is a reflection point to be measured on the surface of the object to be measured, and the intersection of the reflection light of the projection light emitted by the first projection device after being reflected by the reflective surface of the oscillating mirror and the reflection light of the projection light emitted by the second projection device after being reflected by the reflective surface of the plane mirror is the reflection point to be measured, the reflection point of the projection light emitted by the first projection device on the reflective surface of the oscillating mirror is determined as the reflection point coordinate of the reflective surface of the oscillating mirror, and the step of controlling the plane mirror and the oscillating mirror to rotate by the preset angle along the rotation axis according to the preset rule is returned to be executed until the number of determined reflection point coordinates is greater than or equal to the preset number, thereby determining the shape of the reflective surface of the oscillating mirror according to the coordinates of each reflection point, which is conducive to more rapid determination of the reflection point coordinates of the reflective surface of the oscillating mirror, thereby improving the efficiency of determining the shape of the reflective surface of the oscillating mirror.

[0099] Example 5

[0100] Figure 7 This is a flowchart of a method for determining the shape of a oscillating mirror provided in the fifth embodiment of the present invention. Based on the above embodiment, this embodiment further defines that when the three-dimensional projection device includes an imaging device and a projection device, the specific steps of S20 are as follows: Figure 7 As shown, the method specifically includes:

[0101] S10: Acquire initial parameters of the three-dimensional measurement device and initial parameters of the object to be measured.

[0102] Among them, the initial parameters of the three-dimensional measurement device include the initial shape of the oscillating mirror, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror; the initial parameters of the object to be measured include the initial position of the object to be measured and the surface shape of the object to be measured.

[0103] At this time, the initial parameters of the three-dimensional measuring device and the initial parameters of the object to be measured should satisfy the following conditions: when the oscillating mirror is in its initial shape and the object to be measured, the imaging device, the projection device, the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the projection device is reflected by the reflection surface of the plane mirror and then propagates to the initial reflection point on the surface of the object to be measured, and then propagates to the reflection surface of the oscillating mirror after being reflected by the initial reflection point on the surface of the object to be measured, and then is reflected by the reflection surface of the oscillating mirror and then is received by the imaging device.

[0104] S231 , when the object to be measured, the imaging device, and the projection device are at their initial positions, controlling the plane mirror and the oscillating mirror to rotate along the rotation axis by a preset angle according to a preset rule.

[0105] The preset angle can be related to the shape and preset number of the object to be measured. When the plane mirror and the swing mirror are controlled to rotate along the rotation axis by the preset angle according to the preset rules until the number of determined reflection point coordinates is greater than or equal to the preset number, the measurement of the object to be measured can be completed.

[0106] In an optional embodiment, the oscillating mirror may include a first reflecting surface and a second reflecting surface that are not coplanar, the first reflecting surface being located on a side of the second reflecting surface away from the projection device; the first reflecting surface being deflected toward a side away from the reflecting surface, and the second reflecting surface being deflected toward a side of the reflecting surface; when the oscillating mirror is in an initial shape, and the object to be measured, the imaging device, the projection device, the plane mirror, and the oscillating mirror are all located at their respective initial positions, and when light reflected from an initial reflection point on the surface of the object to be measured is reflected by the reflecting surface of the oscillating mirror and received by the imaging device, the light reflected from the initial reflection point on the surface of the object to be measured on the reflecting surface of the oscillating mirror is reflected at a point at the intersection of the first reflecting surface and the second reflecting surface. In this case, the preset rule includes the plane mirror and the oscillating mirror being rotated in sequence by a preset angle along the rotation axis in a counterclockwise direction to determine the coordinates of the reflection point on the first reflecting surface; and the plane mirror and the oscillating mirror being rotated in sequence by a preset angle along the rotation axis in a clockwise direction to determine the coordinates of the reflection point on the second reflecting surface.

[0107] S232. When there is a reflection point to be measured on the surface of the object to be measured, and the intersection of the projection light emitted by the projection device and the incident light incident on the reflection point to be measured on the surface of the object to be measured is located on the reflection surface of the plane mirror, the intersection of the reflected light of the reflection point to be measured and the received light of the imaging device is determined as the coordinates of the reflection point on the reflection surface of the oscillating mirror.

[0108] Specifically, when the object to be measured is in the initial position, the imaging device is in the initial position, and the projection device is in the initial position, after the plane mirror and the swing mirror are controlled to rotate along the rotation axis by a preset angle according to preset rules, there is a reflection point to be measured on the surface of the object to be measured, and the projection light emitted by the projection device is reflected by the reflection surface of the plane mirror and then incident on the reflection point to be measured. The light reflected by the reflection point to be measured can be received by the imaging device after being reflected by the swing mirror. At this time, the reflection point of the light reflected by the reflection point to be measured on the reflection surface of the swing mirror is determined as the reflection point coordinate of the reflection surface.

[0109] S233 , returning to execute steps S231 to S232 until the number of determined reflection point coordinates is greater than or equal to a preset number.

[0110] Specifically, after the reflection point of the light reflected by the reflection point to be measured on the reflection surface of the oscillating mirror is determined as the reflection point coordinate of the reflection surface, the plane mirror and the oscillating mirror are continued to be controlled to rotate along the rotation axis by a preset angle according to the preset rules, so as to determine the reflection point of the projection light emitted by the first projection device on the reflection surface of the oscillating mirror as the reflection point of the reflection surface of the oscillating mirror and determine the coordinates of other reflection points on the reflection surface of the oscillating mirror, until the number of determined reflection point coordinates is greater than or equal to the preset number.

[0111] S30, determining the shape of the reflective surface of the oscillating mirror according to the coordinates of each reflection point.

[0112] In this embodiment, when the object to be measured, the imaging device, and the projection device are at their initial positions, the plane mirror and the oscillating mirror are controlled to rotate along the rotation axis by a preset angle according to a preset rule, so that light reflected from the reflection point to be measured can be received by the imaging device after being reflected by different positions of the oscillating mirror's reflection surface, thereby determining the coordinates of the reflection points at different positions of the oscillating mirror's reflection surface. When there is a reflection point to be measured on the surface of the object to be measured, and the intersection of the projection light emitted by the projection device and the incident light on the reflection point to be measured on the surface of the object to be measured is located on the reflection surface of the plane mirror, the intersection of the reflected light from the reflection point to be measured and the received light by the imaging device is determined as the reflection point coordinate of the reflection surface of the oscillating mirror, and the step of controlling the plane mirror and the oscillating mirror to rotate along the rotation axis by a preset angle according to the preset rule is returned to be executed until the number of determined reflection point coordinates is greater than or equal to the preset number, thereby determining the shape of the oscillating mirror's reflection surface according to each reflection point coordinate, which is conducive to more rapid determination of the reflection point coordinates of the oscillating mirror's reflection surface, thereby improving the efficiency of determining the shape of the oscillating mirror's reflection surface.

[0113] Example 6

[0114] This embodiment provides a device for determining the shape of a oscillating mirror. The device can be implemented in the form of hardware and / or software and can be integrated into an electronic device. Figure 8 This is a structural diagram of a device for determining the shape of a oscillating mirror provided in Example 6 of the present invention, as shown in FIG. Figure 8 As shown, the determining device includes:

[0115] The initial parameter acquisition module 210 is used to acquire the initial parameters of the three-dimensional measurement device and the initial parameters of the object to be measured.

[0116] Among them, the initial parameters of the three-dimensional measurement device include the initial shape of the oscillating mirror, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror; the initial parameters of the object to be measured include the initial position of the object to be measured and the surface shape of the object to be measured.

[0117] The reflection point coordinate determination module 220 is used to adjust one of the initial parameters, including the initial position of the object to be measured, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror, according to preset rules, and determine the reflection point coordinates of the oscillating mirror reflection surface based on the adjusted initial parameters until the number of determined reflection point coordinates is greater than or equal to the preset number.

[0118] The oscillating mirror shape determining module 230 is used to determine the shape of the oscillating mirror reflective surface according to the coordinates of each reflection point.

[0119] The device for determining the shape of a oscillating mirror provided in an embodiment of the present invention can execute the method for determining the shape of a oscillating mirror provided in any embodiment of the present invention, and has corresponding functional modules and beneficial effects. The similarities can be referred to the above description.

[0120] Example 7

[0121] An embodiment of the present invention provides a oscillating mirror, which is used in a three-dimensional measuring device provided in an embodiment of the present invention, and the three-dimensional measuring device is used to measure the surface shape of an object to be measured; the shape of the oscillating mirror is determined by the oscillating mirror shape determination method provided in any embodiment of the present invention. Therefore, the oscillating mirror can achieve the beneficial effects of the oscillating mirror shape determination method provided in an embodiment of the present invention. The similarities can be referred to the above description.

[0122] The above specific embodiments do not limit the scope of protection of the present invention. Those skilled in the art will appreciate that various modifications, combinations, sub-combinations, and substitutions may be made based on design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention are intended to be included within the scope of protection of the present invention.

Claims

1. A method for determining the shape of a oscillating mirror, wherein the oscillating mirror is used in a three-dimensional measuring device for measuring the surface shape of an object to be measured, characterized in that: The three-dimensional measurement device includes at least one projection device, at least one imaging device, a rotation mechanism, at least one plane mirror, and the oscillating mirror. The rotation mechanism drives the plane mirror and the oscillating mirror to rotate along a rotation axis. The centers of the rotation axis and the reflective surface of the oscillating mirror are both located on the plane where the reflective surface of the plane mirror is located. The method for determining the shape of the oscillating mirror includes: S10, acquiring initial parameters of the three-dimensional measuring device and initial parameters of the object to be measured; the initial parameters of the three-dimensional measuring device include the initial shape of the oscillating mirror, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror; the initial parameters of the object to be measured include the initial position of the object to be measured and the surface shape of the object to be measured; S20, adjusting one of the initial parameters, namely, the initial position of the object to be measured, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror, according to a preset rule, and determining the coordinates of the reflection points of the reflecting surface of the oscillating mirror according to the adjusted initial parameters until the number of the determined reflection point coordinates is greater than or equal to a preset number; S30. Determine the shape of the reflective surface of the oscillating mirror according to the coordinates of each of the reflection points.

2. The method for determining the shape of a oscillating mirror according to claim 1, wherein: When the oscillating mirror is in its initial shape, and the object to be measured, the imaging device, the projection device, and the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the projection device is reflected by the reflective surface of the oscillating mirror and then propagates to the initial reflection point on the surface of the object to be measured, and then propagates to the reflective surface of the plane mirror after being reflected by the initial reflection point on the surface of the object to be measured, and then is reflected by the reflective surface of the plane mirror and then received by the imaging device.

3. The method for determining the shape of a oscillating mirror according to claim 2, wherein: The S20 includes: S211, when the object to be measured, the imaging device, and the projection device are at their initial positions, controlling the plane mirror and the oscillating mirror to rotate along the rotation axis by a preset angle according to the preset rule; S212: When there is a reflection point to be measured on the surface of the object to be measured, and the intersection of the reflected light from the reflection point to be measured and the received light from the imaging device is located on the reflective surface of the plane mirror, determine the intersection of the projection light emitted by the projection device and the incident light on the reflection point to be measured on the surface of the object to be measured as the coordinates of the reflection point on the reflective surface of the oscillating mirror; S213 , returning to execute steps S211 to S212 until the number of the determined reflection point coordinates is greater than or equal to a preset number.

4. The method for determining the shape of a oscillating mirror according to claim 1, wherein: The projection device includes a first projection device and a second projection device; When the oscillating mirror is in its initial shape and the object to be measured, the first projection device, the second projection device, the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the first projection device is reflected by the reflective surface of the oscillating mirror and is incident on the initial reflection point on the surface of the object to be measured, and the projection light emitted by the second projection device is reflected by the reflective surface of the plane mirror and is incident on the initial reflection point on the surface of the object to be measured.

5. The method for determining the shape of a oscillating mirror according to claim 4, wherein: The S20 includes: S221, when the object to be measured, the imaging device, and the projection device are at their initial positions, controlling the plane mirror and the oscillating mirror to rotate along the rotation axis by a preset angle according to the preset rule; S222: When there is a reflection point to be measured on the surface of the object to be measured, and an intersection of a reflected light ray emitted by the first projection device after being reflected by the reflective surface of the oscillating mirror and a reflected light ray emitted by the second projection device after being reflected by the reflective surface of the plane mirror is the reflection point to be measured, determining the reflection point of the projection light emitted by the first projection device on the reflective surface of the oscillating mirror as the coordinates of the reflection point on the reflective surface of the oscillating mirror; S223 , returning to execute steps S221 to S222 , until the number of the determined reflection point coordinates is greater than or equal to a preset number.

6. The method for determining the shape of a oscillating mirror according to claim 1, wherein: When the oscillating mirror is in its initial shape and the object to be measured, the imaging device, the projection device, and the plane mirror and the oscillating mirror are all in their respective initial positions, the projection light emitted by the projection device is reflected by the reflection surface of the plane mirror and then propagates to the initial reflection point on the surface of the object to be measured, and then propagates to the reflection surface of the oscillating mirror after being reflected by the initial reflection point on the surface of the object to be measured, and then is reflected by the reflection surface of the oscillating mirror and then received by the imaging device.

7. The method for determining the shape of a oscillating mirror according to claim 6, wherein: The S20 includes: S231, when the object to be measured, the imaging device, and the projection device are at their initial positions, controlling the plane mirror and the oscillating mirror to rotate along the rotation axis by a preset angle according to the preset rule; S232: When there is a reflection point to be measured on the surface of the object to be measured, and the intersection of the projection light emitted by the projection device and the incident light on the reflection point to be measured on the surface of the object to be measured is located on the reflection surface of the plane mirror, determine the intersection of the reflected light from the reflection point to be measured and the received light of the imaging device as the coordinates of the reflection point on the reflection surface of the oscillating mirror; S233 , returning to execute steps S231 to S232 until the number of the determined reflection point coordinates is greater than or equal to a preset number.

8. The method for determining the shape of a oscillating mirror according to claim 3 or 5, characterized in that: The oscillating mirror includes a first reflecting surface and a second reflecting surface that are not coplanar, wherein the first reflecting surface is located on a side of the second reflecting surface away from the projection device; the first reflecting surface deflects toward a side away from the reflecting surface, and the second reflecting surface deflects toward a side of the reflecting surface; When the oscillating mirror is in its initial shape, and the object to be measured, the imaging device, the projection device, and the plane mirror and the oscillating mirror are all located at their respective initial positions, and the projection light emitted by the projection device is reflected by the reflective surface of the oscillating mirror and propagates to the initial reflection point on the surface of the object to be measured, the reflection point of the projection light emitted by the projection device on the reflective surface of the oscillating mirror is located at the junction of the first reflective surface and the second reflective surface.

9. The method for determining the shape of a oscillating mirror according to claim 8, wherein: The preset rules include: The plane mirror and the oscillating mirror are rotated in a counterclockwise direction along the rotation axis in sequence by a preset angle to determine the coordinates of the reflection point on the first reflection surface; and The plane mirror and the oscillating mirror are rotated in sequence along the rotation axis in a clockwise direction by a preset angle to determine the coordinates of the reflection point on the second reflection surface.

10. A device for determining the shape of a oscillating mirror, wherein the oscillating mirror is used in a three-dimensional measuring device for measuring the surface shape of an object to be measured, characterized in that: The three-dimensional measuring device includes at least one projection device, at least one imaging device, a rotation mechanism, at least one plane mirror, and the oscillating mirror. The rotation mechanism drives the plane mirror and the oscillating mirror to rotate along a rotation axis. The centers of the rotation axis and the reflective surface of the oscillating mirror are both located on the plane where the reflective surface of the plane mirror is located. The device for determining the shape of the oscillating mirror includes: an initial parameter acquisition module, configured to acquire initial parameters of the three-dimensional measuring device and initial parameters of the object to be measured; the initial parameters of the three-dimensional measuring device include the initial shape of the oscillating mirror, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror; the initial parameters of the object to be measured include the initial position of the object to be measured and the surface shape of the object to be measured; a reflection point coordinate determination module, configured to adjust one of the initial parameters, namely, the initial position of the object to be measured, the initial position of the imaging device, the initial position of the projection device, and the initial positions of the plane mirror and the oscillating mirror, according to a preset rule, and determine the reflection point coordinates of the reflecting surface of the oscillating mirror according to the adjusted initial parameters until the number of the determined reflection point coordinates is greater than or equal to a preset number; The swing mirror shape determination module is used to determine the shape of the swing mirror reflective surface according to the coordinates of each reflection point.

11. A oscillating mirror used in a three-dimensional measuring device for measuring the surface shape of an object to be measured, characterized in that: The three-dimensional measuring device includes at least one projection device, at least one imaging device, a rotation mechanism, at least one plane mirror, and the oscillating mirror. The rotation mechanism drives the plane mirror and the oscillating mirror to rotate along a rotation axis. The centers of the rotation axis and the reflective surface of the oscillating mirror are both located on the plane where the reflective surface of the plane mirror is located. The shape of the oscillating mirror is determined by the method for determining the shape of the oscillating mirror according to any one of claims 1 to 9.

12. A three-dimensional measuring device, characterized in that: comprising at least one projection device, at least one imaging device, a rotating mechanism, at least one plane mirror and the oscillating mirror according to claim 11; The rotating mechanism drives the plane mirror and the oscillating mirror to rotate along a rotation axis, and the centers of the rotation axis and the reflecting surface of the oscillating mirror are both located on the plane where the reflecting surface of the plane mirror is located.

Images