Method and system for developing and testing a multi-functional module

Abstract

The embodiment of the application discloses a kind of compatible multifunction module development test method and system, for the test system of communication module, test system includes host board and function board, multiple test modules are provided on function board, the communication module to be tested is installed on host board when testing, host board and function board are connected by golden finger connector, function board is connected with host computer, IO port of communication module is connected with the pad of golden finger connector on host board one by one, the interface of test module is connected with the pad of golden finger connector on function board, the function board of this embodiment can be reused for the test of different communication module since multiple test modules are integrated, the function of function board is expanded, and after test application program is downloaded to communication module once, the multiple function test of communication module is realized, the cost of communication module development test is reduced, the test process is simplified, and the development cycle of communication module is shortened.

Description

Technical Field

[0001] This invention belongs to the field of electronic product testing technology, and in particular relates to a method and system for developing and testing compatible multifunctional modules. Background Technology

[0002] With the development of electronic technology, communication modules have integrated functions beyond simple communication, such as image acquisition, sound pickup, sound playback, wired connection to the Internet, connection to various sensors, and connection to various interfaces.

[0003] Currently, during the development and testing of communication modules, each function requires the creation of a corresponding test board, resulting in non-universal test boards with limited functionality. Furthermore, the testing process necessitates downloading the test programs for different functional modules to the communication module and triggering test commands multiple times, leading to high development and testing costs and long development cycles. Summary of the Invention

[0004] The purpose of this invention is to provide a method and system for the development and testing of multifunctional modules, aiming to solve the problems mentioned in the background art, such as the need to manufacture multiple test boards for the multifunctional testing of communication modules, download the test programs of different functional modules to the communication module, and trigger test commands multiple times, resulting in high development and testing costs and long development cycles.

[0005] To achieve the above objectives, the embodiments of the present invention provide the following technical solutions:

[0006] A method for developing and testing compatible multi-functional modules is applied to a communication module testing system including a motherboard and a function board. The communication module to be tested is installed on the motherboard, and the function board is equipped with multiple test modules. The motherboard and the function board are connected via gold finger connectors. The function board is connected to a host computer. The I / O ports of the communication module to be tested are connected one by one to the pads of the gold finger connectors on the motherboard, and the interfaces of the test modules are connected to the pads of the gold finger connectors on the function board. The method specifically includes the following steps:

[0007] After the communication module to be tested is installed and connected to the function board via the gold finger connector, power on the main board and the function board.

[0008] The host computer downloads the test application to the communication module under test;

[0009] After the communication module to be tested is powered on, the host computer sends a test instruction to the communication module to be tested, the test instruction including test items;

[0010] The communication module to be tested determines the target I / O port and test data according to the test items, and outputs the test data from the target I / O port to the function board;

[0011] The function board sends the test data to the target test module to test the communication module to be tested;

[0012] The function board receives feedback data from each of the test modules and sends it to the host computer.

[0013] As a further limitation of the technical solution of this embodiment of the invention, the function board is provided with a USB interface, and the host computer downloads the test application to the communication module to be tested, specifically including the following steps:

[0014] After the USB interface of the function board is connected to the host computer, the host computer downloads the test application to the communication module under test via the USB interface through the function board and the host board.

[0015] As a further limitation of the technical solution of this embodiment of the invention, after the communication module to be tested is powered on, the host computer sends a test command to the communication module to be tested, specifically including the following steps:

[0016] After the communication module under test is powered on, the host computer sends multiple test commands to the communication module under test through the function board.

[0017] As a further limitation of the technical solution of this embodiment of the invention, the communication module to be tested determines the target I / O port and test data according to the test items, and outputs the test data from the target I / O port to the function board, specifically including the following steps:

[0018] When the communication module under test receives a test instruction, the priority level of the test instruction is determined according to the type of test item, the amount of resources required, and the duration of resource occupation of each received test instruction.

[0019] A test instruction list is generated based on the priority level, with the test instruction at the top of the list having the highest priority.

[0020] Extract the target test instruction according to the order of the test instructions in the test instruction list, and determine the test data required for the test items of the target test instruction;

[0021] Find the target I / O port that matches the test item of the target test instruction in the pre-set table of test items and I / O ports;

[0022] Output the corresponding test data from the target I / O port.

[0023] As a further limitation of the technical solution of this embodiment of the invention, when the communication module under test receives a test instruction, the priority level of the test instruction is determined according to the type of test item, the amount of resources required, and the duration of resource occupation of each received test instruction. Specifically, this includes the following steps:

[0024] When the communication module under test receives a test instruction, it determines the type of test item, the required resource size, and the resource occupation duration of the test instruction.

[0025] The score of the test instruction is calculated according to the following formula: Score=W type ×S type +W resource ×S resource + W time ×S time

[0026] In the above formula, W type For the type of test project, S type The priority score for the test items, S type The larger the value, the higher the priority of the test project. W resource As the weight of the demanded resources, S resource For the size of the required resources, W time Weighted by the duration of resource usage. S time The score represents the duration of resource usage, where, W type and S type Positive correlation W resource and S resource negative correlation and S resource When the value is greater than the preset threshold, the value equals 0. W time and S time Positive correlation;

[0027] The priority of the test instructions is determined by sorting them in ascending order of their scores, with higher scores indicating higher priority.

[0028] As a further limitation of the technical solution of this embodiment of the invention, the target test instruction is extracted according to the order of the test instructions in the test instruction list, specifically including the following steps:

[0029] Determine the available resource size of the communication module to be tested;

[0030] When the available resource size is greater than a preset resource threshold, the first N test instructions are determined from the test instruction list as target test instructions, wherein the sum of the resource requirements of the test items of the first N test instructions is less than the available resource size.

[0031] As a further limitation of the technical solution of the embodiments of the present invention, it also includes:

[0032] After receiving the feedback data, the host computer generates the test results of the communication module to be tested based on the feedback data.

[0033] As a further limitation of the technical solution of this embodiment of the invention, the test module includes at least one of the following models:

[0034] Display screen, camera, three-axis sensor, six-axis sensor, proximity sensor, buttons, vibration motor, dual SIM card slot, RF socket, speaker, microphone, TF card slot, network port, headphone jack, IIC interface, digital audio IIS interface, UART interface, SPI interface.

[0035] A system for developing and testing multifunctional modules includes a motherboard and a function board. The communication module to be tested is mounted on the motherboard. The function board has multiple test modules. The motherboard and the function board are connected via gold finger connectors. The function board is connected to a host computer. The I / O ports of the communication module to be tested are connected one-to-one to the pads of the gold finger connectors on the motherboard. The interfaces of the test modules are connected to the pads of the gold finger connectors on the function board. The system also includes the following units:

[0036] The power-on unit is used to power on the main board and the function board after the communication module to be tested is connected to the function board via the gold finger connector.

[0037] A test application download unit is used by the host computer to download the test application to the communication module under test;

[0038] A test instruction sending unit is used to send a test instruction from the host computer to the communication module under test after the communication module under test is powered on. The test instruction includes test items.

[0039] A test data output unit is used for the communication module under test to determine the target I / O port and test data according to the test items, and to output the test data from the target I / O port to the function board;

[0040] A test data forwarding unit is used by the function board to send the test data to the target test module to test the communication module to be tested;

[0041] The feedback data sending unit is used by the function board to receive feedback data from each of the test modules and send it to the host computer.

[0042] As a further limitation of the technical solution of this embodiment of the invention, the test data output unit includes:

[0043] The priority level determination module is used to determine the priority level of each test instruction received by the communication module under test based on the type of test item, the amount of resources required, and the duration of resource occupation of each received test instruction.

[0044] A test instruction list generation module is used to generate a test instruction list according to the priority level, wherein the test instruction at the top of the test instruction list has the highest priority.

[0045] The target test instruction determination module is used to extract the target test instruction according to the order of the test instructions in the test instruction list, and determine the test data required for the test items of the target test instruction;

[0046] The target I / O port determination module is used to find the target I / O port that matches the test item of the target test instruction in a pre-set lookup table of test items and I / O ports;

[0047] The test data output module is used to output corresponding test data from the target I / O port.

[0048] Compared with the prior art, the beneficial effects of the present invention are:

[0049] This invention provides a testing system for communication modules, comprising a motherboard and a function board. Multiple test modules are mounted on the function board. The communication module to be tested is installed on the motherboard. The motherboard and function board are connected via gold finger connectors. The function board is connected to a host computer. The I / O ports of the communication module are connected to the pads of the gold finger connectors on the motherboard, and the interfaces of the test modules are connected to the pads of the gold finger connectors on the function board. After the communication module to be tested is installed and connected to the function board via the gold finger connectors, the motherboard and function board are powered on. The host computer downloads the test application to the communication module to be tested. After the communication module to be tested is powered on, the host computer sends test instructions to the communication module to be tested. The test instructions include test items. The communication module to be tested performs tests according to the test items. The system identifies the target I / O port and test data, outputs the test data from the target I / O port to the function board, and sends the test data to the target test module for testing the communication module under test. The function board receives feedback data from each test module and sends it to the host computer, thus integrating multiple test modules into a single function board. After the function board with the communication module under test is connected to the host board, the host computer can be used to test various functions of the communication module. Because the function board integrates multiple test modules, it can be reused for testing different communication modules, expanding the functionality of the function board. Furthermore, by downloading the test application to the communication module at once, multiple functions can be tested, reducing the cost of communication module development and testing, simplifying the testing process, and shortening the development cycle of the communication module. Attached Figure Description

[0050] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention.

[0051] Figure 1 A flowchart is shown of a method for developing and testing compatible multi-functional modules provided by an embodiment of the present invention.

[0052] Figure 2 A schematic diagram of the test system in an embodiment of the present invention is shown.

[0053] Figure 3 A circuit diagram of the gold finger in an embodiment of the present invention is shown.

[0054] Figure 4 The following is an application architecture diagram of a system for developing and testing compatible multi-functional modules provided by an embodiment of the present invention. Detailed Implementation

[0055] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0056] Figure 1 The flowchart illustrates a method for developing and testing compatible multi-functional modules according to an embodiment of the present invention. Specifically, the method for developing and testing compatible multi-functional modules in this embodiment includes the following steps:

[0057] Step S101: After the communication module to be tested is installed and connected to the function board via the gold finger connector, power on the motherboard and the function board.

[0058] The method for developing and testing compatible multi-functional modules in this embodiment is used to test various communication modules. The communication modules can be wireless communication modules such as WiFi and Bluetooth, or various wired communication modules, and the communication modules have multiple functions.

[0059] like Figure 2 As shown, the testing system for the communication module in this embodiment may include a motherboard and a function board. The communication module to be tested is installed on the motherboard, and the function board is equipped with multiple test modules. The motherboard and the function board are connected through a gold finger connector. The function board is connected to a host computer. The I / O ports of the communication module are connected to the pads of the gold finger connector on the motherboard one by one, and the interfaces of the test modules are connected to the pads of the gold finger connector on the function board.

[0060] like Figure 2 As shown, the test module can be a device that performs various functions of the communication module and its connected peripheral circuits. For example, the test module may include at least one of the following: display screen, camera, three-axis sensor, six-axis sensor, proximity sensor, button, vibration motor, dual SIM card slot, RF slot, speaker, microphone, TF card slot, network port, headphone jack, IIC interface, digital audio IIS interface, UART interface, and SPI interface, so that the function board can be used for multiple function tests of different communication modules.

[0061] The display screen is used to test whether the screen driver function of the communication module is normal; the network port is used to test whether the communication module can exchange data with the server normally; the camera is used to test whether the camera driver function of the communication module is normal; the three-axis sensor, six-axis sensor, and proximity sensor are used to test whether each IIC line is working properly; the buttons and vibration motor are used to test whether the I / O ports of the communication module are working properly; the TF card slot is used to test whether the data read and write of the communication module is working properly; the speaker and microphone are used to test whether the sound playback and reception of the communication module are normal; and the headphone jack, IIC interface, IIS interface, UART interface, and SPI interface are used to test other functions of the communication module, and then the corresponding test modules are connected to the interface for testing.

[0062] like Figure 3 The diagram shown is of a gold finger connector. Figure 3 As can be seen, the gold finger connector has multiple pins for data transmission. When the function board and the motherboard are connected through the gold finger connector, each test module on the function board can be connected to each I / O port of the communication module to be tested on the motherboard through different pins of different gold finger connectors, so that the function board is compatible with different test modules to test the communication module.

[0063] After the tester connects each I / O port of the communication module to be tested to the corresponding pads of each pin of the gold finger connector, the tester plugs in the gold finger connector of the motherboard and the gold finger connector of the function board, and connects the test power supply (such as a battery, AC to DC power supply, etc.) to the battery interface of at least one of the motherboard and the function board to provide power and power on the function board and the motherboard.

[0064] In step S102, the host computer downloads the test application to the communication module to be tested.

[0065] like Figure 2 As shown, the function board is equipped with a USB interface. After the function board's USB interface is connected to the host computer, the host computer downloads the test application to the communication module under test via the USB interface (such as TYPE-C or Micro USB) through the function board and the motherboard. The test application is a program used to perform various functional tests on the communication module under test. The host computer can transfer the test application to the gold finger connector of the function board via the USB interface, and then transfer it to the communication module via the gold finger connector. The communication module can install the test application.

[0066] Step S103: After the communication module to be tested is powered on, the host computer sends a test command to the communication module to be tested. The test command includes test items.

[0067] During testing, the tester can trigger the communication module to power on by pressing a button on the motherboard. After the communication module under test is powered on, the host computer sends multiple test commands to the communication module under test through the function board. In one example, the host computer can send test commands to the communication module under test one by one, or it can send all test commands to the communication module at the same time.

[0068] Of course, the host computer can also send a start test command to the communication module, and the test application on the communication module will generate multiple test commands to test the communication module.

[0069] In step S104, the communication module to be tested determines the target I / O port and test data according to the test items, and outputs the test data from the target I / O port to the function board.

[0070] In this embodiment, after receiving a test command, the communication module can determine the test item corresponding to the test command and generate corresponding test data, which is then output to the gold finger connector through the corresponding I / O port. The test data is then transmitted to the corresponding test module on the function board via the gold finger connector. The test module then tests the relevant functions of the communication module. In one embodiment, step S104 may specifically include the following steps:

[0071] S1041, when the communication module under test receives a test instruction, the priority level of the test instruction is determined according to the type of test item, the amount of resources required, and the duration of resource occupation of each received test instruction.

[0072] Specifically, when the communication module under test receives a test instruction, it determines the type of test item, the required resource size, and the resource usage duration of the test instruction, and calculates the score of the test instruction according to the following formula: Score= W type ×S type +W resource ×S resource + W time ×S time

[0073] In the above formula, W type For the type of test project, S type The priority score for the test items, S type The larger the value, the higher the priority of the test project. W resource As the weight of the demanded resources, Sresource For the size of the required resources, W time Weighted by the duration of resource usage. S time The score represents the duration of resource usage, where, W type and S type Positive correlation W resource and S resource negative correlation and S resource When the value is greater than the preset threshold, the value equals 0. W time and S time The scores of all test instructions are positively correlated, and the priority of the test instructions is determined by sorting them in ascending order, with higher scores indicating higher priority.

[0074] The test items can include network, voice, interface, image and video, and sensor types. Different types of test items have different priority scores and weights. For example, for the communication module, the network is more important, so network-type test items can be set to have higher priority scores and weights. The required resource size refers to the amount of computing resources of the communication module that the test item needs to occupy. The required resource size can be set in the test command or estimated by the test application. The resource occupation duration refers to the duration of the communication module's computing resources occupied by the test item from the generation of the required test data to the end of the test item. This duration can be set in the test command or estimated by the test application.

[0075] This embodiment calculates the score of a test instruction based on the type of the test item, the size of the required resources, and the duration of resource occupation to determine the priority of the test instruction. It fully considers the type of the test item, the size of the required resources, and the duration of resource occupation of the test instruction, and can optimize the test order when multiple functions are tested in parallel. It allows test items with priority type and longer resource occupation to be tested first, so that important types and long-lasting test items are tested first. This not only focuses on key test items, but also shortens the total test time and improves test efficiency.

[0076] S1042, Generate a test instruction list based on priority level, with the test instruction at the top of the list having the highest priority.

[0077] Specifically, the priority levels are arranged from top to bottom in the test instruction list, so that the test instructions closer to the top of the test instruction list have a higher priority than those at the bottom. The execution order of the test instructions in the test instruction list is from top to bottom.

[0078] S1043, extract the target test instruction according to the order of the test instructions in the test instruction list, and determine the test data required for the test items of the target test instruction.

[0079] In one embodiment, the available resource size of the communication module under test can be determined in real time. When the available resource size is greater than a preset resource threshold, the first N test instructions are selected from the test instruction list as target test instructions. The sum of the resource requirements of the test items of the first N test instructions is less than the available resource size. The preset resource threshold can be 80%, 85%, 90%, etc., and can be determined according to the total resource size of the communication module. When the available resource size is greater than the threshold, it is determined that the communication module has more idle resources. The first N test instructions can be extracted for multiple functions to be tested in parallel to improve the testing efficiency of the communication module.

[0080] S1044: Search for the target I / O port that matches the test item of the target test instruction in the pre-set table of test items and I / O ports.

[0081] In this embodiment, after the communication module is installed on the motherboard, a reference table of each test item and I / O port of the communication module can be written into the test program. The I / O port corresponding to the test item can be determined through the reference table, so that the test data can be output to the corresponding test module through the I / O port. For example, if the test item is a camera test, and the camera is connected to pins 110-114 of the gold finger connector on the function board, then the target I / O port for the camera test on the communication module is the I / O port connected to pins 110-114 of the gold finger connector on the motherboard. It should be noted that a test item may have only one target I / O port or multiple target I / O ports.

[0082] S1045 outputs the corresponding test data from the target I / O port.

[0083] After determining the target I / O port, the test data of the test item can be sent to the corresponding pin of the gold finger connector through the target I / O port, so as to be sent to the test module. If multiple test items are tested in parallel, the test data can be sent to the corresponding test modules in parallel through the gold finger connector to improve the testing efficiency of the communication module.

[0084] In step S105, the function board sends the test data to the target test module to test the communication module to be tested.

[0085] That is, the test data is sent from the I / O port of the communication module to the gold finger connector of the motherboard. After receiving the test data from the gold finger connector of the motherboard, the gold finger connector of the function board sends it to each test module for testing.

[0086] In step S106, the function board receives feedback data from each test module and sends it to the host computer.

[0087] Each test module can be a device, sensor, etc., required for the communication module to perform its related functions. For example, taking the function of connecting a camera to capture images as an example, after the camera on the function board receives the test data, it can capture images based on the test data and upload them to the host computer as feedback data. For example, the test data can include parameters such as the frame rate and resolution of the captured images. After the camera captures the images and uploads them to the host computer, the host computer can determine whether the test data generated by the communication module can correctly drive the camera to capture qualified images. If so, it is determined that the communication module is performing the command to capture images from the camera and that the function of driving the camera to capture images is normal; otherwise, it is abnormal. The testing of other functional modules can refer to the testing methods of existing technologies. This embodiment does not limit the testing methods of each test module.

[0088] After the host computer sends all test commands and receives the corresponding feedback data, it determines that the communication module test is over. It can generate the test results of the communication module based on the feedback data of each test module, such as whether the test passed or failed. If a test fails, it lists the test items that failed and the reasons for the failure.

[0089] This invention provides a testing system for communication modules, comprising a motherboard and a function board. The function board houses multiple test modules. The communication module under test is installed on the motherboard during testing. The motherboard and function board are connected via gold finger connectors. The function board is connected to a host computer. The I / O ports of the communication module are connected to the pads of the gold finger connectors on the motherboard, and the interfaces of the test modules are connected to the pads of the gold finger connectors on the function board. This integrates multiple test modules onto a single function board. After the function board containing the communication module under test is connected to the motherboard, the host computer can perform tests on various functions of the communication module. Because the function board integrates multiple test modules, it can be reused for testing different communication modules, expanding its functionality. Furthermore, by downloading the test application to the communication module once, multiple functions can be tested simultaneously, reducing the cost of communication module development and testing, simplifying the testing process, and shortening the development cycle of the communication module.

[0090] Figure 4This diagram illustrates the application architecture of a system for developing and testing compatible multi-functional modules according to an embodiment of the present invention. The system includes a motherboard and a function board. The communication module to be tested is mounted on the motherboard. The function board has multiple test modules. The motherboard and the function board are connected via a gold finger connector. The function board is connected to a host computer. The I / O ports of the communication module to be tested are connected to the pads of the gold finger connector on the motherboard. The interface of the test module is connected to the pads of the gold finger connector on the function board. Specifically, the system also includes the following units:

[0091] The power-on unit 401 is used to power on the main board and the function board after the communication module to be tested is connected to the function board via the gold finger connector.

[0092] The test application download unit 402 is used by the host computer to download the test application to the communication module to be tested;

[0093] The test instruction sending unit 403 is used to send a test instruction from the host computer to the communication module under test after the communication module under test is powered on. The test instruction includes test items.

[0094] The test data output unit 404 is used for the communication module under test to determine the target I / O port and test data according to the test items, and to output the test data from the target I / O port to the function board;

[0095] The test data forwarding unit 405 is used by the function board to send the test data to the target test module to test the communication module to be tested.

[0096] The feedback data sending unit 406 is used for the function board to receive feedback data from each of the test modules and send it to the host computer.

[0097] Optionally, the function board is provided with a USB interface, and the test application download unit 402 includes:

[0098] The test application download module is used to download the test application to the communication module under test via the USB interface after the function board's USB interface is connected to the host computer.

[0099] Optionally, the test command sending unit 403 includes:

[0100] The test command sending module is used to send multiple test commands from the host computer to the communication module under test through the function board after the communication module under test is powered on.

[0101] Optionally, the test data output unit 404 includes:

[0102] The priority level determination module is used to determine the priority level of each test instruction received by the communication module under test based on the type of test item, the amount of resources required, and the duration of resource occupation of each received test instruction.

[0103] A test instruction list generation module is used to generate a test instruction list according to the priority level, wherein the test instruction at the top of the test instruction list has the highest priority.

[0104] The target test instruction determination module is used to extract the target test instruction according to the order of the test instructions in the test instruction list, and determine the test data required for the test items of the target test instruction;

[0105] The target I / O port determination module is used to find the target I / O port that matches the test item of the target test instruction in a pre-set lookup table of test items and I / O ports;

[0106] The test data output module is used to output corresponding test data from the target I / O port.

[0107] Optionally, the priority level determination module includes:

[0108] The test item information determination submodule is used to determine the type, required resource size, and resource occupation duration of the test item for each test instruction received by the communication module under test.

[0109] The score calculation submodule is used to calculate the score of the test instruction according to the following formula: Score=W type ×S type +W resource ×S resource + W time ×S time

[0110] In the above formula, W type For the type of test project, S type The priority score for the test items, S type The larger the value, the higher the priority of the test project. W resource As the weight of the demanded resources, S resourceFor the size of the required resources, W time Weighted by the duration of resource usage. S time The score represents the duration of resource usage, where, W type and S type Positive correlation W resource and S resource negative correlation and S resource When the value is greater than the preset threshold, the value equals 0. W time and S time Positive correlation;

[0111] The priority level determination submodule is used to determine the priority level of the test instructions by sorting them in ascending order of their scores, where the higher the score, the higher the priority level.

[0112] Optionally, the target test instruction determination module includes:

[0113] The available resource size determination submodule is used to determine the available resource size of the communication module to be tested;

[0114] The target test instruction determination submodule is used to determine the first N test instructions as target test instructions from the test instruction list when the available resource size is greater than a preset resource threshold, wherein the sum of the resource requirements of the test items of the first N test instructions is less than the available resource size.

[0115] Optional, also includes:

[0116] The test result generation unit is used by the host computer to generate test results for the communication module to be tested based on the feedback data after receiving the feedback data.

[0117] Optionally, the test module includes at least one of the following models:

[0118] Display screen, camera, three-axis sensor, six-axis sensor, proximity sensor, buttons, vibration motor, dual SIM card slot, RF socket, speaker, microphone, TF card slot, network port, headphone jack, IIC interface, digital audio IIS interface, UART interface, SPI interface.

[0119] It should be understood that although the steps in the flowcharts of the various embodiments of the present invention are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the various embodiments may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least a portion of the sub-steps or stages of other steps.

[0120] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), Rambus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0121] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0122] The embodiments described above are merely illustrative of several implementations of the present invention, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of the present invention, and these modifications and improvements all fall within the scope of protection of the present invention. Therefore, the scope of protection of this patent should be determined by the appended claims.

[0123] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A method for developing and testing compatible multi-functional modules, characterized in that, A communication module testing system is used to configure a motherboard and a function board. The communication module to be tested is installed on the motherboard, and the function board is equipped with multiple test modules. The motherboard and the function board are connected via gold finger connectors. The function board is connected to a host computer. The I / O ports of the communication module to be tested are connected to the pads of the gold finger connectors on the motherboard, and the interfaces of the test modules are connected to the pads of the gold finger connectors on the function board. The system specifically includes the following steps: After the communication module to be tested is installed and connected to the function board via the gold finger connector, power on the main board and the function board. The host computer downloads the test application to the communication module under test; After the communication module to be tested is powered on, the host computer sends a test instruction to the communication module to be tested, the test instruction including test items; The communication module to be tested determines the target I / O port and test data according to the test items, and outputs the test data from the target I / O port to the function board; The function board sends the test data to the target test module to test the communication module to be tested; The function board receives feedback data from each of the test modules and sends it to the host computer. The communication module to be tested determines the target I / O port and test data according to the test items, and outputs the test data from the target I / O port to the function board, specifically including the following steps: When the communication module under test receives a test instruction, the priority level of the test instruction is determined according to the type of test item, the amount of resources required, and the duration of resource occupation of each received test instruction. A test instruction list is generated based on the priority level, with the test instruction at the top of the list having the highest priority. Extract the target test instruction according to the order of the test instructions in the test instruction list, and determine the test data required for the test items of the target test instruction; Find the target I / O port that matches the test item of the target test instruction in the pre-set table of test items and I / O ports; Output the corresponding test data from the target I / O port.

2. The method for developing and testing compatible multi-functional modules according to claim 1, characterized in that, The function board is equipped with a USB interface. The host computer downloads the test application to the communication module under test, specifically including the following steps: After the USB interface of the function board is connected to the host computer, the host computer downloads the test application to the communication module under test via the USB interface through the function board and the host board.

3. The method for developing and testing compatible multi-functional modules according to claim 2, characterized in that, After the communication module under test is powered on, the host computer sends a test command to the communication module under test, which specifically includes the following steps: After the communication module under test is powered on, the host computer sends multiple test commands to the communication module under test through the function board.

4. The method for developing and testing compatible multi-functional modules according to claim 1, characterized in that, When the communication module under test receives a test instruction, its priority is determined based on the type of test item, the amount of resources required, and the duration of resource occupation for each received test instruction. This process includes the following steps: When the communication module under test receives a test instruction, it determines the type of test item, the required resource size, and the resource occupation duration of the test instruction. The score of the test instruction is calculated according to the following formula: Score=W type ×S type +W resource ×S resource + W time ×S time In the above formula, W type For the type of test project, S type The priority score for the test items, S type The larger the value, the higher the priority of the test project. W resource As the weight of the demanded resources, S resource For the size of the required resources, W time Weighted by the duration of resource usage. S time The score represents the duration of resource usage, where... W type and S type Positive correlation W resource and S resource negative correlation and S resource When the value is greater than the preset threshold, the value equals 0. W time and S time Positive correlation; The priority of the test instructions is determined by sorting them in ascending order of their scores, with higher scores indicating higher priority.

5. The method for developing and testing compatible multi-functional modules according to claim 1, characterized in that, Extracting the target test instruction according to the order of the test instructions in the test instruction list specifically includes the following steps: Determine the available resource size of the communication module to be tested; When the available resource size is greater than a preset resource threshold, the first N test instructions are determined from the test instruction list as target test instructions, wherein the sum of the resource requirements of the test items of the first N test instructions is less than the available resource size.

6. The method for developing and testing compatible multi-functional modules according to any one of claims 1-3 further includes: After receiving the feedback data, the host computer generates the test results of the communication module to be tested based on the feedback data.

7. The method for developing and testing compatible multi-functional modules according to any one of claims 1-3, characterized in that, The test module includes at least one of the following models: Display screen, camera, three-axis sensor, six-axis sensor, proximity sensor, buttons, vibration motor, dual SIM card slot, RF socket, speaker, microphone, TF card slot, network port, headphone jack, IIC interface, digital audio IIS interface, UART interface, SPI interface.

8. A system for developing and testing multifunctional modules, characterized in that, The system includes a motherboard and a function board. The communication module to be tested is mounted on the motherboard. The function board has multiple test modules. The motherboard and the function board are connected via gold finger connectors. The function board is connected to a host computer. The I / O ports of the communication module to be tested are connected to the pads of the gold finger connectors on the motherboard. The interface of the test module is connected to the pads of the gold finger connectors on the function board. Specifically, it also includes the following units: The power-on unit is used to power on the main board and the function board after the communication module to be tested is connected to the function board via the gold finger connector. A test application download unit is used by the host computer to download the test application to the communication module under test; A test instruction sending unit is used to send a test instruction from the host computer to the communication module under test after the communication module under test is powered on. The test instruction includes test items. A test data output unit is used for the communication module under test to determine the target I / O port and test data according to the test items, and to output the test data from the target I / O port to the function board; A test data forwarding unit is used by the function board to send the test data to the target test module to test the communication module to be tested; The feedback data sending unit is used for the function board to receive feedback data from each of the test modules and send it to the host computer; The test data output unit includes: The priority level determination module is used to determine the priority level of each test instruction received by the communication module under test based on the type of test item, the amount of resources required, and the duration of resource occupation of each received test instruction. A test instruction list generation module is used to generate a test instruction list according to the priority level, wherein the test instruction at the top of the test instruction list has the highest priority level; The target test instruction determination module is used to extract the target test instruction according to the order of the test instructions in the test instruction list, and determine the test data required for the test items of the target test instruction; The target I / O port determination module is used to find the target I / O port that matches the test item of the target test instruction in a pre-set lookup table of test items and I / O ports; The test data output module is used to output corresponding test data from the target I / O port.

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