A multi-site mode integrated circuit testing method and testing system

Abstract

The application discloses a kind of integrated circuit test method and test system of multiple Site mode, belong to integrated circuit test field, method includes: based on the test station provided by tester and the test station and communication port provided by handler to the test piece and carry out test operation, after test operation test piece is sorted as good product or defective product, wherein defective product is sent into defective product tube;In response to retest instruction, based on the test station provided by tester and the test station and communication port provided by handler to the test piece in defective product tube and carry out test operation, and based on the retest control module provided by tester according to test operation result judges the signal line connection relationship of handler and tester.The application adopts simple retest mode to realize the foolproof test of integrated circuit test system, to avoid the situation of test piece error identification.

Description

TECHNICAL FIELD

[0001] The present application belongs to the field of integrated circuit testing, and particularly relates to a multi-Site mode integrated circuit testing method and testing system. BACKGROUND

[0002] The rapid development of integrated circuit testing technology has made a great contribution to the wide application of integrated circuits. Repeated inspection and testing are needed at various stages of integrated circuit development, production and application to ensure product quality and guarantee the production of products meeting system requirements. Integrated circuit testing is the process of detecting integrated circuits or modules by comparing the output response of the integrated circuits or modules with the expected output to evaluate the function and performance of integrated circuit components. It is an important means of verifying design, monitoring production, ensuring quality, analyzing effectiveness and guiding application.

[0003] The existing integrated circuit testing system mainly includes a tester and a handler, and the structure is as shown in Figure 1 The tester is used to send test signals, receive test data, analyze the performance of the tested chip according to the test data, generate and send sorting signals, etc. The handler is used to receive test signals and test the tested chip according to the test signals, send test data, receive sorting signals and perform corresponding sorting operations on the tested chip according to the sorting signals, etc. The tester and the handler transmit test signals and test data through test cables and transmit sorting signals through sorting signal lines.

[0004] During the testing process, after the tested chip is placed at a specified position of the handler, the handler sends a Ready signal to the tester through the sorting signal line, prompting the tester to start testing. After receiving the Ready signal, the tester sends test signals to the handler through the test cable, so that the handler tests the tested chip according to the test signals. After the testing is completed, the handler returns the test data to the tester through the test cable. The tester analyzes the performance of the chip according to the test data, generates sorting signals according to the performance of the chip, and sends the sorting signals to the handler through the sorting signal line. After receiving the sorting signals, the handler performs corresponding sorting operations on the tested chip. During normal testing, good products and defective products are placed separately by the mechanical hand of the handler, for example, good products are printed on a tape, and defective products are placed in a defective product tube. During the entire testing process, the test operator needs to perform loading and unloading operations, including replacing a new empty tube when the defective product tube is full, and storing the replaced defective product tube in the defective product area.

[0005] With the increasing requirement of chip testing speed, the above-mentioned testing method of testing chips one by one cannot meet the production requirement, so more and more testing systems in the prior art adopt the multi-Site mode to improve the testing speed. Taking a 2-Site mode as an example, the testing system structure is shown in Figure 2 .

[0006] In the 2-Site mode integrated circuit testing system shown in Figure 2 , the testing machine is provided with two Sites, i.e. Site A and Site B, and the handler includes two groups of testing stations and communication interfaces arranged correspondingly, i.e. testing station 1, testing station 2 and communication interface 1, communication interface 2. Site A and Site B are connected with testing station 1 and testing station 2 through testing lines respectively, and are connected with communication interface 1 and communication interface 2 through sorting signal lines respectively, so that the testing system as shown in Figure 2 generates sorting signals according to the testing data and transmits the sorting signals to communication interface 1 through the sorting signal lines, so that the handler performs corresponding operation and processing on the chip. Similarly, Site B transmits testing signals to testing station 2 through the testing lines, receives testing data returned by testing station 2, generates sorting signals according to the testing data and transmits the sorting signals to communication interface 2 through the sorting signal lines, so that the handler performs corresponding operation and processing on the chip.

[0007] The higher the testing speed requirement is, the more the number of testing machine Sites and the number of testing stations and communication interfaces of the corresponding handler will be, and at the same time, the connection error of the testing lines and the sorting signal lines is likely to occur, which will bring serious adverse effects.

[0008] Taking the testing line cross error connection shown in Figure 3 as an example, in the testing process, since Site A is connected with testing station 2 and communication interface 1 of the handler, after receiving the Ready signal transmitted by communication interface 1 through the sorting signal lines, Site A transmits testing signals to the tested chip in testing station 2 through the testing lines, and then testing station 2 tests the tested chip according to the testing signals to obtain testing data, and returns the testing data to Site A through the testing lines, so that Site A generates sorting signals according to the testing data and transmits the sorting signals to communication interface 1 connected with it through the sorting signal lines, and thus the handler performs corresponding sorting operation on the tested chip in testing station 1 corresponding to communication interface 1 according to the sorting signals received by communication interface 1.

[0009] It can be seen that due to the cross error connection of the test cable, the handler performs the sorting operation on the chip at the test site 1 according to the test data of the chip at the test site 2, and similarly, the Site B connects the handler test site 1 and the communication port 2, so that the handler performs the sorting operation on the chip at the test site 2 according to the test data of the chip at the test site 1. Once the test data of the chips at the test site 1 and the test site 2 is different, the Site A and the Site B may generate opposite sorting signals, so that the handler will perform an error sorting operation on the chip after receiving the error sorting signal generated by the tester according to the error test data, and finally cause serious influence. Therefore, it is necessary to add a foolproof scheme to the existing test system to avoid chip identification errors. SUMMARY

[0010] One of the purposes of the present application is to provide a multi-Site mode integrated circuit test method, which adopts a simple retest method to realize the foolproof test of the integrated circuit test system, so as to avoid the situation of error identification of the tested piece.

[0011] To achieve the above purpose, the technical scheme adopted by the present application is as follows:

[0012] A multi-Site mode integrated circuit test method, the multi-Site mode integrated circuit test method comprises:

[0013] Based on the test station provided by the tester and the test site and the communication port provided by the handler, the tested piece is tested, and the tested piece is sorted as a good product or a defective product after the test operation, wherein the defective product is sent into the defective product pipe;

[0014] In response to the retest instruction, based on the test station provided by the tester and the test site and the communication port provided by the handler, the tested piece in the defective product pipe is tested, and the signal line connection relationship between the handler and the tester is judged according to the test operation result based on the retest control module provided by the tester.

[0015] The following also provides several optional modes, but not as an additional limitation to the above overall scheme, but only as a further supplement or optimization, without technical or logical contradiction, each optional mode can be combined with the above overall scheme, and the combination between multiple optional modes can also be combined.

[0016] As a preferred, the test operation, the execution process comprises:

[0017] After loading on the test site, the communication port corresponding to the test site sends a Ready signal to the test station;

[0018] After the test station receives the Ready signal, the test signal is sent to the corresponding test site.

[0019] The test station receives the test signal, tests the DUT, and returns test data to the test station;

[0020] The test station receives the test data, generates analysis results, and generates a sorting signal according to the analysis results, and sends the sorting signal to the communication port;

[0021] The handler sorts the DUTs in the corresponding test station according to the sorting signal received by the communication port, and the DUTs are sorted as good or bad.

[0022] As a preferred embodiment, the test machine further comprises an interactive module for issuing a retest instruction to the retest control module according to human-computer interaction input to start the retest process.

[0023] As a preferred embodiment, the test operation result includes the analysis result fed back by the test station, which is a good or bad product, and the retest control module provided by the test machine judges the signal line connection relationship between the handler and the test machine according to the test operation result, including:

[0024] The analysis result fed back by the test station is counted to obtain the number of good products and the number of bad products in the entire retest process, and the number of good products and the number of bad products are fed back to the interactive module for display after the retest process is completed.

[0025] As a preferred embodiment, the test operation result includes the analysis result fed back by the test station, which is a good or bad product, and the retest control module provided by the test machine judges the signal line connection relationship between the handler and the test machine according to the test operation result, including:

[0026] If the analysis result is a bad product, it is determined that the signal line connection relationship between the handler and the test machine is normal, and the retest process is continued until all DUTs in the bad product tube are retested.

[0027] If the analysis result is a good product, it is determined that the signal line connection relationship between the handler and the test machine is abnormal, and the retest process is ended, and the analysis result and the signal line connection relationship between the handler and the test machine are fed back to the interactive module for display.

[0028] As a preferred embodiment, the test operation result includes the test data and the analysis result fed back by the test station, and the analysis result is a good or bad product, and the retest control module provided by the test machine judges the signal line connection relationship between the handler and the test machine according to the test operation result, including:

[0029] If the analysis result is a bad product, it is determined that the signal line connection relationship between the handler and the test machine is normal, and the retest process is continued until all DUTs in the bad product tube are retested.

[0030] If the analysis result is a good product, it is judged that the signal line connection relationship of the handler and the tester is abnormal, and it is judged whether the test data is in the critical range of good products and defective products, if yes, the critical mark, test data, analysis result and signal line connection relationship of the handler and the tester are sent to the interactive module for display, if no, the analysis result and the signal line connection relationship of the handler and the tester are fed back to the interactive module for display.

[0031] The application provides a multi-Site mode integrated circuit test method, a retest control module is added based on an existing integrated circuit test system to ensure the universality of the test method, and on the basis of the retest control module, foolproof testing is realized through simple retest logic, so that the condition of incorrect identification of a measured piece can be avoided, and the efficiency of foolproof testing is ensured.

[0032] The second object of the application is to provide a multi-Site mode integrated circuit test system, a foolproof module is added based on an existing integrated circuit test system to avoid the condition of incorrect identification of a measured piece.

[0033] To achieve the above object, the technical scheme adopted by the application is as follows:

[0034] A multi-Site mode integrated circuit test system, the multi-Site mode integrated circuit test system comprises a tester and a handler, the tester is provided with an interactive module, a retest control module and a plurality of test stations, and the handler is provided with a plurality of test stations and a plurality of communication ports;

[0035] The test stations and the communication ports are in one-to-one correspondence, and each test station is connected with a test station and a communication port, the retest control module is in communication connection with each test station, and the interactive module is in communication connection with the retest control module and each test station;

[0036] The retest control module responds to a retest instruction issued by the interactive module, judges the signal line connection relationship of the handler and the tester according to a test operation result sent by the test station.

[0037] The interactive module is used for issuing a retest instruction to the retest control module according to human-computer interaction input, and displaying the signal line connection relationship of the handler and the tester after the end of the retest process, and the test station loads the measured piece in a defective product pipe during the retest process.

[0038] The following also provides several optional modes, but not as an additional limitation to the above general scheme, just a further supplement or preferred, without technical or logical contradiction, each optional mode can be combined with the above general scheme, and the combination between multiple optional modes can also be combined.

[0039] As preferred, the retest control module comprises a plurality of retest control units, all of which are in communication connection with the interactive module, and each of which is in one-to-one communication connection with the test station.

[0040] As preferred, the test operation result comprises an analysis result fed back by the test station, which is a good product or a defective product, and the retest control module judges the signal line connection relationship between the sorting machine and the testing machine and performs the following operations:

[0041] The analysis result fed back by the test station is counted to obtain the number of good products and the number of defective products in the entire retest process, and the number of good products and the number of defective products are fed back to the interactive module for display after the retest process is completed.

[0042] As preferred, the test operation result comprises an analysis result fed back by the test station, which is a good product or a defective product, and the retest control module judges the signal line connection relationship between the sorting machine and the testing machine and performs the following operations:

[0043] If the analysis result is a defective product, it is judged that the signal line connection relationship between the sorting machine and the testing machine is normal, and the retest process is continued until all the tested pieces in the defective product tube are retested.

[0044] If the analysis result is a good product, it is judged that the signal line connection relationship between the sorting machine and the testing machine is abnormal, and the retest process is ended, and the analysis result and the signal line connection relationship between the sorting machine and the testing machine are fed back to the interactive module for display.

[0045] As preferred, the test operation result comprises test data and an analysis result fed back by the test station, which is a good product or a defective product, and the retest control module judges the signal line connection relationship between the sorting machine and the testing machine and performs the following operations:

[0046] If the analysis result is a defective product, it is judged that the signal line connection relationship between the sorting machine and the testing machine is normal, and the retest process is continued until all the tested pieces in the defective product tube are retested.

[0047] If the analysis result is a good product, it is judged that the signal line connection relationship between the sorting machine and the testing machine is abnormal, and it is judged whether the test data is within the critical range of good products and defective products, if yes, a critical mark, test data, analysis result and signal line connection relationship between the sorting machine and the testing machine are sent to the interactive module for display, and if no, the analysis result and the signal line connection relationship between the sorting machine and the testing machine are fed back to the interactive module for display.

[0048] The application provides a multi-Site mode integrated circuit test system, which is based on an existing integrated circuit test system and increases a foolproof module (including an interactive module and a retest control module), so as to ensure universality and quickly determine the signal line connection condition of the integrated circuit test system, thereby avoiding the condition of wrong identification of a measured piece. BRIEF DESCRIPTION OF DRAWINGS

[0049] Figure 1 It is a structural schematic diagram of an existing integrated circuit test system;

[0050] Figure 2 It is a structural schematic diagram of an existing 2Site mode integrated circuit test system;

[0051] Figure 3 It is a structural schematic diagram of an existing 2Site mode integrated circuit test system in a test cable cross error connection condition;

[0052] Figure 4 It is a flowchart of a multi-Site mode integrated circuit test method of the application;

[0053] Figure 5 It is a structural schematic diagram of a multi-Site mode integrated circuit test system of the application;

[0054] Figure 6 It is a structural schematic diagram of a 2Site mode integrated circuit test system of the application;

[0055] Figure 7 It is a structural schematic diagram of a 4Site mode integrated circuit test system of the application. DETAILED DESCRIPTION

[0056] The technical solutions in the embodiments of the application will be clearly and completely described below with reference to the drawings in the embodiments of the application. Obviously, the described embodiments are only part of the embodiments of the application, rather than all the embodiments of the application. Based on the embodiments in the application, all other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the application.

[0057] It should be noted that when an assembly is referred to as being "connected" to another assembly, it can be directly connected to the other assembly or there can be an intermediate assembly; when an assembly is referred to as being "fixed" to another assembly, it can be directly fixed to the other assembly or there can be an intermediate assembly.

[0058] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used in the specification of the present invention herein are only for the purpose of describing specific embodiments and are not intended to limit the present invention.

[0059] Example 1

[0060] In response to the situation where signal lines are incorrectly connected when they are crossed in existing integrated circuit testing systems, this embodiment proposes a fool-proof solution. Since the test operator needs to perform loading and unloading operations during the test process, the fool-proof solution proposed in this embodiment is to perform a retest process (for example, after a defective material tube is fully loaded, the test operator performs a retest process when replacing the defective material tube. In other embodiments, the retest process can also be performed at other stages).

[0061] During the retest process, the defective material tubes are reloaded and tested again, and the test machine is informed of the current retest process through the human-computer interaction interface. If the test environment has not changed and the signal lines are connected normally, theoretically all defective products will still be defective in the retest results. If good products appear in the defective material tubes in the retest results, it means that there is an error in the signal line connection, and the test operator will be prompted to check through the human-computer interaction interface.

[0062] Based on this, this embodiment proposes a multi-site mode integrated circuit testing method for integrated circuit testing and foolproof testing of sorting machines and testers. Figure 4 As shown, the integrated circuit testing method in the multi-site mode of this embodiment includes an initial testing process and a retesting process.

[0063] (1) Initial test process: The test operation is performed on the test piece based on the test station provided by the test machine and the test station and communication port provided by the sorting machine. After the test operation, the test piece is sorted into good or defective products, and the defective products are sent to the defective product material tube.

[0064] The device under test is an integrated circuit or module to evaluate the function and performance of the integrated circuit components. The initial test process of this embodiment is a conventional integrated circuit test process, including the following steps:

[0065] After the test station is loaded with materials, the communication port corresponding to the test station sends a Ready signal to the test station.

[0066] After receiving the Ready signal, the test station sends a test signal to the corresponding test station.

[0067] After receiving the test signal, the test station tests the device under test and returns the test data (the test data is usually various test index data of the device under test) to the test station.

[0068] The test station generates an analysis result (the analysis result is a good product or a defective product) after receiving the test data, and generates a sorting signal according to the analysis result, and sends the sorting signal to the communication port.

[0069] The handler performs a sorting operation on the DUT located in the corresponding test station according to the sorting signal received by the communication port. The DUT is sorted as a good product or a defective product.

[0070] (2) The retest process needs to be entered according to human-computer interaction input. The present embodiment realizes the addition of a foolproof scheme to the existing test system through the retest process.

[0071] In the retest process, in response to the retest instruction, the DUT in the defective product tube is tested based on the test station provided by the test machine and the test station and the communication port provided by the handler, and the signal line connection relationship between the handler and the test machine is judged based on the test operation result according to the retest control module provided by the test machine.

[0072] The test operation in the retest process is the same as the test operation in the initial test process, which will not be described here. In addition, the human-computer interaction input can be that the retest control module is connected to the upper computer, and the test operator issues a retest instruction to the retest control module based on the upper computer. In another embodiment, in order to facilitate interaction, the test machine also provides an interaction module, which is used to issue a retest instruction to the retest control module according to human-computer interaction input (for example, input of a test operator), and start the retest process.

[0073] The test data and analysis results generated in the test operation process are taken as the test operation results, and the following three kinds of signal line connection relationship judgment logics of the handler and the test machine are proposed according to the test operation results.

[0074] The first kind: only statistical analysis results.

[0075] The analysis results fed back by the test station are counted to obtain the number of good products and the number of defective products in the entire retest process, and the number of good products and the number of defective products are fed back to the interaction module for display after the retest process is completed.

[0076] Under this execution logic, the retest control module can not output the signal line connection relationship of the handler and the test machine to the interaction module, or the signal line connection relationship of the handler and the test machine to the interaction module is unknown. Under this execution logic, the main purpose is to count the number of good products and the number of defective products to prompt the test operator about the current retest situation, so that the test operator can analyze the signal line connection relationship of the handler and the test machine according to the current retest situation.

[0077] The second kind: only judge the analysis result.

[0078] If the analysis result is a defective product, it is determined that the signal line connection relationship of the sorting machine and the testing machine is normal, and the retest process is continued until all the tested pieces in the defective product tube are retested.

[0079] If the analysis result is a good product, it is determined that the signal line connection relationship of the sorting machine and the testing machine is abnormal, and the retest process is ended. The analysis result and the signal line connection relationship of the sorting machine and the testing machine are fed back to the interactive module for display, so as to prompt the test operator that there may be a line cross connection at present, and the current line connection condition should be checked immediately.

[0080] The third: determine the test data and the analysis result.

[0081] If the analysis result is a defective product, it is determined that the signal line connection relationship of the sorting machine and the testing machine is normal, and the retest process is continued until all the tested pieces in the defective product tube are retested.

[0082] If the analysis result is a good product, it is determined that the signal line connection relationship of the sorting machine and the testing machine is abnormal, and it is determined whether the test data is within the critical range of good products and defective products. If yes, a critical flag, test data, analysis result and signal line connection relationship of the sorting machine and the testing machine are sent to the interactive module for display, so as to prompt that the good product analysis result of the product may be caused by critical test data, and provide a reference for the judgment of the test operator. If no, the analysis result and the signal line connection relationship of the sorting machine and the testing machine are fed back to the interactive module for display.

[0083] In addition to the first kind of judgment logic, when the retest results of all defective products in the retest process are defective products, it is indicated that the signal line connection relationship of the sorting machine and the testing machine is normal. At this time, the interactive module can only output the final judgment result, that is, the result that the signal line connection relationship of the sorting machine and the testing machine is normal, or can not make any prompt. If there is a retest result of a defective product as a good product, it is indicated that there may be a line cross connection error. The signal line connection relationship of the sorting machine and the testing machine is determined to be abnormal, and the abnormal condition is displayed through the interactive module to prompt the test operator to check.

[0084] Since the test data has corresponding good product value range and defective product value range, in order to improve the early warning accuracy of the method of the embodiment, in the third kind of result, the test data is compared with the critical range of good products and defective products. If at least one kind of index data is located in the critical range of good products and defective products, it is indicated that the index data is located near the critical value, so as to prompt that the good product analysis result of the product may be caused by critical test data, and provide a reference for the judgment of the test operator.

[0085] Embodiment 2

[0086] In view of the existing integrated circuit test system, the signal line cross connection error exists, the embodiment provides a foolproof scheme, because the test operator needs to perform the feeding and discharging operation during the test process, therefore, the foolproof scheme provided by the embodiment is used for executing the retest process (for example, the retest process is executed when the test operator replaces the defective product tube, in other embodiments, the retest process can also be executed at other stages).

[0087] During the retest process, the defective product tube is re-fed and tested again, and the test machine is informed of the current start of the retest process through the man-machine interface; if the signal line is normally connected, theoretically, the retest result of all defective products is still defective under the condition that the test environment is not changed; if the retest result of the product in the defective product tube appears to be good, it indicates that there is an error in the signal line connection, and the test operator is prompted to check through the man-machine interface.

[0088] Based on this, the embodiment provides a multi-Site mode integrated circuit test system, as shown in Figure 5 The multi-Site mode integrated circuit test system of the embodiment includes a test machine and a handler, the test machine is provided with an interaction module, a retest control module and a plurality of test stations, and the handler is provided with a plurality of test sites and a plurality of communication ports.

[0089] In the connection of each part, the test site and the communication port are one-to-one corresponding, and each test station is connected with a test site and a communication port, the retest control module is in communication connection with each test station, and the interaction module is in communication connection with the retest control module and each test station.

[0090] The retest control module in the embodiment can be an integrated module, that is, one retest control module is connected with all test stations to receive and process the information of all test stations, at this time, the number of test stations, test sites and communication ports is preferably the same. Of course, the retest control module can be a split module, that is, one retest control module includes a plurality of retest control units, one retest control unit is connected with one test station to receive and process only the information of the connected test station, the interaction module is connected with each retest control unit, each retest control unit independently judges and feeds back the corresponding information to the interaction module, at this time, the number of test stations, retest control units, test sites and communication ports is preferably the same.

[0091] One test station, one test site and one communication port corresponding to the connection are taken as a group, the test station and the test site in the same group are connected through the test line, and the test station and the communication port are connected through the handler signal line.

[0092] The interactive module in the embodiment is configured to realize human-computer interaction, and the retest control module is configured to run a retest algorithm. The interactive module and the retest control module can be independently arranged on different hardware, for example, the interactive module is a display control device, and the retest control module is a processor configured with the retest algorithm. Alternatively, the interactive module and the retest control module can be arranged on the same hardware, for example, on a computer device. The embodiment is not limited in this regard.

[0093] The integrated circuit test system in the multi-site mode of the embodiment has a preliminary test process and a retest process. The preliminary test process is a conventional integrated circuit test process. For example, the embodiment provides a test process as follows:

[0094] After the test station is loaded, the communication port corresponding to the test station sends a Ready signal to the test station.

[0095] After receiving the Ready signal, the test station sends a test signal to the corresponding test station.

[0096] After receiving the test signal, the test station tests the DUT and returns test data (usually various test index data of the DUT) to the test station.

[0097] After receiving the test data, the test station generates an analysis result (good or bad) and generates a sorting signal according to the analysis result. The sorting signal is sent to the communication port.

[0098] According to the sorting signal received by the communication port, the handler performs a sorting operation on the DUT located in the corresponding test station. The DUT is sorted as a good product or a bad product.

[0099] For the retest process, the interactive module issues a retest instruction to the retest control module according to human-computer interaction input. In the embodiment, the interactive module simultaneously issues a retest instruction to the corresponding test station when issuing the retest instruction, so as to inform the test station to transfer the test data and the analysis result to the retest control module after obtaining the test data and the analysis result.

[0100] Correspondingly, in the preliminary test process, the interactive module can issue a preliminary test instruction to the test station, so as to inform the test station to not transfer the test data and the analysis result to the retest control module after obtaining the test data and the analysis result. Of course, the test station can be defaulted to transfer the test data and the analysis result to the retest control module after obtaining the test data and the analysis result each time. In this case, the retest control module can not receive or process the test data and the analysis result. In this case, the interactive module does not need to issue a preliminary test instruction and a retest instruction to the test station.

[0101] The test station, the test station and the communication port test and sort the defective products according to the conventional integrated circuit test process, the test station obtains the test data and the analysis result and sends them to the retest control module, the retest control module judges the signal line connection relationship of the handler and the tester according to the test data and the analysis result sent by the test station, and sends the signal line connection relationship of the handler and the tester to the interaction module for display.

[0102] The retest control module executes the retest algorithm according to the test data and the analysis result sent by the test station in response to the retest instruction issued by the interaction module, judges the signal line connection relationship of the handler and the tester, and this embodiment proposes three kinds of execution logic according to the demand as follows.

[0103] The first kind is only statistical analysis result.

[0104] The analysis result fed back by the test station is counted to obtain the number of good products and the number of defective products in the whole retest process, and the number of good products and the number of defective products are fed back to the interaction module for display after the retest process is completed.

[0105] Under this execution logic, the retest control module can not output the signal line connection relationship of the handler and the tester to the interaction module, or the signal line connection relationship of the handler and the tester output to the interaction module is unknown. Under this execution logic, the main purpose is to count the number of good products and the number of defective products to prompt the test operator about the current retest situation, so that the test operator can analyze the signal line connection relationship of the handler and the tester according to the current retest situation.

[0106] The second kind is only to judge the analysis result.

[0107] If the analysis result is a defective product, it is judged that the signal line connection relationship of the handler and the tester is normal, and the retest process is continued until all the measured pieces in the defective product tube are retested.

[0108] If the analysis result is a good product, it is judged that the signal line connection relationship of the handler and the tester is abnormal, and the retest process is ended, and the analysis result and the signal line connection relationship of the handler and the tester are fed back to the interaction module for display to prompt the test operator that there may be a line cross connection at present, which should be checked immediately.

[0109] The third kind is to judge the test data and the analysis result.

[0110] If the analysis result is a defective product, it is judged that the signal line connection relationship of the handler and the tester is normal, and the retest process is continued until all the measured pieces in the defective product tube are retested.

[0111] If the analysis result is a good product, the signal line connection relationship between the sorting machine and the tester is judged to be abnormal, and the test data is judged whether it is within the critical range between good and defective products. If so, the critical mark, test data, analysis result and the signal line connection relationship between the sorting machine and the tester are sent to the interactive module display to prompt that the good product analysis result of the product may be due to the critical test data, providing a reference for the test operator to make a judgment. If not, the analysis result and the signal line connection relationship between the sorting machine and the tester are fed back to the interactive module display.

[0112] In addition to the first judgment logic, if all defective products are retested as defective during the retest process, it indicates that the signal line connection relationship between the sorting machine and the tester is normal. In this case, the interactive module can only output the final judgment result, that is, the signal line connection relationship between the sorting machine and the tester is normal, or no prompt is given. If the retest result of a defective product is good, it indicates that there may be a cross-connection error. The signal line connection relationship between the sorting machine and the tester is judged to be abnormal. The abnormality is displayed through the interactive module to prompt the test operator to check.

[0113] Since the test data is provided with a corresponding numerical range of good products and a numerical range of defective products, in order to improve the early warning accuracy of the test system of this embodiment, in the third result, the test data is compared with the critical range of good products and defective products. If at least one type of indicator data is within the critical range of good products and defective products, it means that the indicator data is near the critical value, so as to indicate that the good product analysis result of the product may be caused by the criticality of the test data, and provide a judgment reference for the test operator.

[0114] Example 3

[0115] To facilitate understanding of the present application, this embodiment is further explained using the 2Site mode as an example.

[0116] A 2-site integrated circuit test system Figure 6 As shown, the test system includes an interactive module, a retest control module, two test stations (Site A and Site B), two test stations (Test Station 1 and Test Station 2), and two communication ports (Communication Port 1 and Communication Port 2).

[0117] Based on the existing test system, this test system adds a retest control module in the test machine, including a first retest control unit and a second retest control unit respectively connected to Site A and Site B for controlling the retest process; at the same time, the test machine is provided with an interactive module, which is connected to each retest control unit and Site A and Site B for issuing retest instructions to each retest control module and prompting retest results.

[0118] In actual operation, the integrated circuit test system in the 2Site mode, on the basis of the initial test process operation of the original test system, when the bad product feed pipe is full, the test operator issues a retest instruction through the interactive module, prompting the retest control module and the test station to start the retest program; at the same time, the test operator reloads the bad products in the bad product feed pipe at the test station 1 and the test station 2 of the sorting machine, and the communication port 1 and the communication port 2 respectively send a Ready signal to the Site A and the Site B of the tester through the sorting signal line; after receiving the Ready signal, the Site A and the Site B respectively send a test signal to the test station 1 and the test station 2, so that each test station retests the bad products according to the test signal, and returns the test data to the Site A and the Site B through the test line; the Site A and the Site B analyze the received test data, judge the performance of the measured piece, transmit the test data and the analysis result to the first retest control unit and the second retest control unit respectively, and generate a sorting signal according to the analysis result and transmit it to the sorting machine through the sorting signal line, so that the sorting machine performs a sorting operation on the measured piece according to the corresponding sorting signal.

[0119] After receiving the test data and the analysis result transmitted by the Site A and the Site B, the first retest control unit and the second retest control unit identify the current analysis result, count the number of good products and bad products in the current retest process, and send the analysis result and the statistical result to the interactive module to prompt the test operator about the current retest situation, and then analyze the current line connection situation according to the retest situation.

[0120] In addition, in order to output the foolproof judgment result more intuitively, the first retest control unit and the second retest control unit can also perform the following operations: after receiving the test data and the analysis result transmitted by the Site A and the Site B, the first retest control unit and the second retest control unit judge, if the analysis result is still a bad product, automatically continue the current retest process; once the analysis result is a good product, immediately stop the current retest process, and send the analysis result to the interactive module to prompt the test operator that there may be a line cross connection situation in the current line connection situation, which should be checked immediately.

[0121] In addition, in order to improve the accuracy of retest judgment, after receiving the good product analysis result transmitted by the Site A and the Site B, the first retest control module and the second retest control module also need to analyze the test data, if the current product test data is near the critical value, the product is marked as critical, and the test data and the analysis result are sent to the interactive module at the same time, to prompt the test operator that the good product analysis result of the product may be caused by the critical test data, providing a reference for the test operator to make a judgment.

[0122] Embodiment 4

[0123] For the convenience of understanding the present application, the embodiment is further illustrated by taking the 4Site mode as an example.

[0124] A 4Site mode integrated circuit test system is shown in Fig. 1, which comprises an interactive module, a retest control module, four Site test points (Site A, Site B, Site C and Site D), four test stations (test station 1, test station 2, test station 3 and test station 4), and four communication ports (communication port 1, communication port 2, communication port 3 and communication port 4). Figure 7

[0125] The test system adds the retest control module in the tester on the basis of the existing test system, which comprises a first retest control unit, a second retest control unit, a third retest control unit and a fourth retest control unit respectively connected with Site A, Site B, Site C and Site D for controlling the retest process. Meanwhile, the tester is provided with the interactive module, which is connected with each retest control module and each test station for issuing the retest instruction to each retest control module and prompting the retest result.

[0126] In actual operation, the 4Site mode integrated circuit test system operates on the basis of the initial test process of the original test system. When the bad product tube is full, the test operator issues the retest instruction through the interactive module to prompt the retest control module and the test station to start the retest program. Meanwhile, the test operator reloads the bad products in the test station 1, test station 2, test station 3 and test station 4 of the handler after the bad products in the bad product tube are reloaded, and the communication port 1, communication port 2, communication port 3 and communication port 4 respectively send the Ready signal to the tester Site A, Site B, Site C and Site D through the sorting signal line. Site A, Site B, Site C and Site D respectively send the test signal to the test station 1, test station 2, test station 3 and test station 4 after receiving the Ready signal, so that each test station retests the bad products according to the test signal and returns the test data to Site A, Site B, Site C and Site D through the test cable. Site A, Site B, Site C and Site D analyze the received test data to judge the performance of the tested piece, transmit the test data and analysis result to the first retest control unit, second retest control unit, third retest control unit and fourth retest control unit respectively, and generate the sorting signal according to the analysis result and transmit it to the handler through the sorting signal line to make the handler sort the tested piece according to the corresponding sorting signal.

[0127] ​The first retest control unit, the second retest control unit, the third retest control unit and the fourth retest control unit identify the current analysis result, count the number of good products and bad products in the current retest process after receiving the test data and analysis result transmitted by Site A, Site B, Site C and Site D, and send the analysis result and the counting result to the interactive module to prompt the test operator of the current retest situation, and then analyze the current line connection situation according to the retest situation.

[0128] In addition, in order to output the foolproof judgment result more intuitively, the first retest control unit, the second retest control unit, the third retest control unit and the fourth retest control unit can also perform the following operations:

[0129] The first retest control unit, the second retest control unit, the third retest control unit and the fourth retest control unit judge after receiving the test data and analysis result transmitted by Site A, Site B, Site C and Site D, and if the analysis result is still a bad product, the current retest process is automatically continued; once the analysis result is a good product, the current retest process is immediately stopped, and the analysis result is sent to the interactive module to prompt the test operator that there may be a line cross connection situation, and the current line connection situation should be checked immediately.

[0130] In addition, in order to improve the accuracy of retest judgment, the first retest control unit, the second retest control unit, the third retest control unit and the fourth retest control unit also need to analyze the test data after receiving the good product analysis result transmitted by Site A, Site B, Site C and Site D, and if the current product test data is near the critical value, the product is marked as critical, and the test data and the analysis result are sent to the interactive module to prompt that the good product analysis result of the product may be caused by the critical test data, and provide a reference for the test operator to make a judgment.

[0131] The technical features of the above-mentioned embodiments can be combined in any way. In order to make the description simple, all possible combinations of the technical features in the above-mentioned embodiments are not described, but as long as the combination of the technical features does not exist contradictory, it should be considered as the scope of the present application.

[0132] The above-mentioned embodiments only express several embodiments of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the scope of the application. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are within the scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A multi-site integrated circuit testing method, characterized in that: The multi-site mode integrated circuit testing method includes: The DUT is tested based on the test station provided by the test machine and the test station and communication port provided by the sorting machine. After the test, the DUT is sorted into good or defective products, and the defective products are sent to the defective product feed pipe; In response to the retest instruction, the test operation is performed on the test pieces in the defective material tube based on the test station provided by the test machine and the test station and communication port provided by the sorting machine, and the signal line connection relationship between the sorting machine and the test machine is determined based on the test operation results by the retest control module provided by the test machine; The test operation result includes the test data and analysis result fed back by the test station, and the analysis result is a good product or a defective product. The retest control module provided by the tester determines the signal line connection relationship between the sorter and the tester based on the test operation result, including: If the analysis result is defective, the signal line connection relationship between the sorting machine and the tester is judged to be normal, and the retest process is continued until all the tested parts in the defective material tube are retested; If the analysis result is a good product, the signal line connection relationship between the sorting machine and the tester is judged to be abnormal, and the test data is judged whether it is within the critical range between good and defective products. If so, the critical mark, test data, analysis result and the signal line connection relationship between the sorting machine and the tester are sent to the interactive module display provided by the tester. If not, the analysis result and the signal line connection relationship between the sorting machine and the tester are fed back to the interactive module display provided by the tester.

2. The multi-site integrated circuit testing method according to claim 1, wherein: The test operation execution process includes: After the test station is loaded, the communication port corresponding to the test station sends a Ready signal to the test station; After receiving the Ready signal, the test station sends a test signal to the corresponding test station; After receiving the test signal, the test station tests the device under test and returns the test data to the test station; The test station generates an analysis result after receiving the test data, generates a sorting signal according to the analysis result, and sends the sorting signal to the communication port; The sorting machine performs a sorting operation on the test pieces located at the corresponding test stations according to the sorting signals received by the communication port, and the test pieces are sorted into good products or defective products.

3. The multi-site integrated circuit testing method according to claim 1, wherein: The test machine further provides an interaction module, which is used to send a retest instruction to the retest control module according to human-computer interaction input to start the retest process.

4. The multi-site integrated circuit testing method according to claim 3, wherein: The test operation result includes an analysis result fed back by the test station, the analysis result being a good product or a defective product. The retest control module provided by the tester determines the signal line connection relationship between the sorter and the tester based on the test operation result, including: The analysis results fed back by the test stations are statistically analyzed to obtain the number of good products and the number of defective products in the entire retest process. After the retest process is completed, the number of good products and the number of defective products are fed back to the interactive module for display.

5. The multi-site integrated circuit testing method according to claim 3, wherein: The test operation result includes an analysis result fed back by the test station, the analysis result being a good product or a defective product. The retest control module provided by the tester determines the signal line connection relationship between the sorter and the tester based on the test operation result, including: If the analysis result is defective, the signal line connection relationship between the sorting machine and the tester is judged to be normal, and the retest process is continued until all the tested parts in the defective material tube are retested; If the analysis result is a good product, the signal line connection relationship between the sorting machine and the tester is judged to be abnormal, and the retest process is ended. The analysis result and the signal line connection relationship between the sorting machine and the tester are fed back to the interactive module for display.

6. A multi-site integrated circuit test system, characterized in that: The multi-site integrated circuit test system includes a tester and a sorter. The tester is provided with an interaction module, a retest control module and multiple test stations. The sorter is provided with multiple test stations and multiple communication ports. The test stations correspond to the communication ports one by one, and each test station is connected to a test station and a communication port, the retest control module is in communication with each test station, and the interaction module is in communication with the retest control module and each test station; The retest control module, in response to the retest instruction issued by the interaction module, determines the connection relationship of the signal lines between the sorting machine and the tester according to the test operation result sent by the test station; The interactive module is used to issue a retest instruction to the retest control module according to the human-computer interaction input, and to display the signal line connection relationship between the sorting machine and the tester after the retest process is completed. The test station is loaded with the test pieces in the defective material tube during the retest process; The test operation results include the test data and analysis results fed back by the test station. The analysis results are good or bad products. The retest control module determines the connection relationship between the signal lines of the sorting machine and the tester and performs the following operations: If the analysis result is defective, the signal line connection relationship between the sorting machine and the tester is judged to be normal, and the retest process is continued until all the tested parts in the defective material tube are retested; If the analysis result is a good product, the signal line connection relationship between the sorting machine and the tester is judged to be abnormal, and it is judged whether the test data is within the critical range between good and defective products. If so, the critical mark, test data, analysis result and the signal line connection relationship between the sorting machine and the tester are sent to the interactive module for display. If not, the analysis result and the signal line connection relationship between the sorting machine and the tester are fed back to the interactive module for display.

7. The multi-site integrated circuit test system according to claim 6, wherein: The retest control module includes a plurality of retest control units, all of which are communicatively connected to the interaction module, and the retest control units are communicatively connected to the test stations in a one-to-one correspondence.

8. The multi-site integrated circuit test system according to claim 6, wherein: The test operation result includes the analysis result fed back by the test station, which is a good product or a defective product. The retest control module determines the connection relationship between the signal lines of the sorting machine and the tester and performs the following operations: The analysis results fed back by the test stations are statistically analyzed to obtain the number of good products and the number of defective products in the entire retest process. After the retest process is completed, the number of good products and the number of defective products are fed back to the interactive module for display.

9. The multi-site integrated circuit test system according to claim 6, wherein: The test operation result includes the analysis result fed back by the test station, which is a good product or a defective product. The retest control module determines the connection relationship between the signal lines of the sorting machine and the tester and performs the following operations: If the analysis result is defective, the signal line connection relationship between the sorting machine and the tester is judged to be normal, and the retest process is continued until all the tested parts in the defective material tube are retested; If the analysis result is a good product, the signal line connection relationship between the sorting machine and the tester is judged to be abnormal, and the retest process is ended. The analysis result and the signal line connection relationship between the sorting machine and the tester are fed back to the interactive module for display.

Images