A calibration-free cavity-enhanced absorption spectroscopy method for measuring reflectivity of an optical cavity
By extracting the phase information of reflected light through the detection system, the reflectivity of the optical cavity is directly measured and the gas concentration is inverted, which solves the problem of large reflectivity measurement error in the existing technology and realizes high sensitivity and high efficiency cavity-enhanced absorption spectroscopy measurement.
Patent Information
- Application Number
- CN202310960674.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-08-01
- Publication Date
- 2025-12-16
- Estimated Expiration
- 2043-08-01
AI Technical Summary
Existing technologies struggle to accurately measure the reflectivity of optical cavity mirrors, especially when the reflectivity is low. Furthermore, the standard gas method is susceptible to inaccurate gas concentration and laser intensity shifts, resulting in significant errors.
The phase information of the reflected light is extracted by the detection system to obtain the error signal. The reflectivity of the optical cavity is directly measured using the error signal. The concentration of the gas to be measured is obtained by cavity-enhanced absorption spectroscopy inversion, avoiding the standard gas calibration process. The detection system consists of a laser, an electro-optic modulator, a three-terminal circulator, a collimator, a mode-matching lens group, and a photodetector.
It enables accurate measurement of optical cavity reflectivity even at low reflectivity, avoiding errors introduced by inaccurate standard gas concentration and laser intensity shift, and features high sensitivity, high efficiency and convenience.