A metrology device remote calibration system and method

Abstract

The application provides a kind of metering device remote calibration system and method, wherein the system is composed of Beidou satellite, ground satellite station, Beidou master station board card and at least one Beidou measurement board card, Beidou master station board card sends encrypted information to Beidou measurement board card through Beidou satellite and ground satellite station, then Beidou measurement board card decrypts the encrypted information to form decrypted data, and then outputs corresponding analog signal, wherein the output signal includes voltage, current and frequency. The Beidou master station board card and Beidou measurement in the system and method use two-way timing principle, obtain timing by receiving satellite signal, then communicate with ground satellite station to obtain timing calibration, so that the clock is more accurate, thereby realizing accurate synchronization of remote multi-channel data acquisition and control, and having broad engineering application and achievement popularization space.

Description

A remote calibration system and method for measuring devices Technical Field

[0001] This invention relates to the field of metrology and calibration, and more specifically, to a remote calibration system and method for metrology devices. Background Technology

[0002] With societal progress and technological advancements, people's demands for product quality are increasing. The complexity and manufacturing difficulty of high-tech products are rising, thus raising the requirements for metrological calibration of production equipment. However, some traditional metrological standards are bulky and difficult to move, or require online calibration and cannot be moved, while others are high-precision equipment that cannot be moved. This increases the difficulty of value transfer and metrological calibration, as well as synchronous metrological errors between multiple devices. Therefore, remote calibration and testing of metrological devices based on networks is essential for reducing costs and improving calibration accuracy. Summary of the Invention

[0003] To address the challenges of transporting and calibrating metrological standards in existing technologies, which are often difficult or prohibited from being moved, this invention provides a remote calibration system and method for metrological devices.

[0004] According to one aspect of the present invention, a remote calibration system for a metrology device is provided. The system includes a BeiDou satellite, a ground satellite station, and a BeiDou master station board, as well as at least one BeiDou measurement board. The BeiDou master station board is connected to a metrology standard device, and the BeiDou measurement board is connected to the metrology device to be calibrated. In this system:

[0005] The Beidou master station board is used to receive Beidou satellite signals to obtain timing, communicate with the ground satellite station to obtain timing calibration, generate the first PPS signal and the first time information, collect external signals transmitted by the metrology standard device, and generate encrypted information based on the PPS signal, time information and external signals, and send the encrypted information to the Beidou measurement board through the ground satellite station and Beidou satellite.

[0006] The Beidou measurement board is used to receive Beidou satellite signals to obtain timing and communicate with ground satellite stations to obtain timing calibration. It receives the encrypted information through Beidou satellites, decrypts the encrypted information, and outputs corresponding analog signals to the computing device to be calibrated based on the decrypted data.

[0007] Optionally, the BeiDou master station board includes a first processing unit, a first ADC chip, a first BeiDou chip, a data monitoring module, and a data input interface connected to a metrology standard device, wherein:

[0008] The first processing unit is used to communicate with the first Beidou chip to obtain the first PPS signal and the first time information; receive the first frequency signal transmitted by the frequency monitoring module; and run an algorithm to parse and encode the first frequency signal, the first digital voltage signal and the first digital current signal to generate first encoded information and transmit it to the first Beidou chip.

[0009] The first Beidou chip is used to receive satellite signals to obtain authorization, and to communicate with the ground satellite station to obtain time synchronization and calibration, as well as to communicate with the first processing unit to encrypt the first encoding information, the first PPS signal and the first time information, generate encrypted information, and transmit it to the Beidou measurement board through the ground satellite station and Beidou satellite.

[0010] The data monitoring module is used to collect external signals transmitted by the metrological standard device. The data monitoring module includes a frequency monitoring module, a voltage monitoring module, and a current monitoring module. The data input interface connected to the metrological standard device includes a frequency input interface, a voltage input interface, and a current input interface. The voltage monitoring module and the current monitoring module collect a first analog voltage signal and a first analog current signal through the voltage input interface and the current input interface, respectively. The frequency monitoring module collects a first frequency signal through the frequency input interface.

[0011] The first ADC chip is used to convert the first analog voltage signal and the first analog current signal into a first digital voltage signal and a first digital current signal, and then transmit them to the first processing unit.

[0012] Optionally, the first processing unit and the first Beidou chip communicate using the UART protocol, and the first ADC chip and the first processing unit communicate using the SPI protocol.

[0013] Optionally, the Beidou measurement board includes a second processing unit, a DAC chip, a second ADC chip, a third ADC chip, a second Beidou chip, a first VFC voltage-to-frequency converter and a frequency-to-voltage converter, a second VFC voltage-to-frequency converter and a frequency-to-voltage converter, a current source module, a frequency / voltage monitoring module, a frequency / voltage output interface, and a current output interface, wherein:

[0014] The second processing unit is used to communicate with the second Beidou chip, obtain the encrypted information and decrypt it, obtain the decrypted data, and obtain the second PPS signal and the second time information; send the decrypted data and the second PPS signal to the first VFC voltage-to-frequency converter and frequency-to-voltage converter; run an algorithm to parse and encode the second data voltage signal, generate second encoded information and transmit it to the DAC chip; and calibrate the second data current signal and the second frequency signal.

[0015] The second Beidou chip is used to receive satellite signals to obtain authorization, and to communicate with the ground satellite station to obtain timing calibration, as well as to communicate with the second processing unit.

[0016] The first VFC voltage-to-frequency and frequency-to-voltage converter is used to generate a second analog voltage signal based on the decrypted data and the second PPS signal;

[0017] The second ADC chip is used to convert the second analog voltage signal into a second digital voltage signal and transmit it to the second processing unit;

[0018] The DAC chip is used to transmit the analog signal generated after the second encoded information is converted from digital to analog to the current source module.

[0019] The current source module is used to output a third analog voltage signal and a second analog current signal according to the analog signal. The second analog current signal is proportionally amplified by non-contact induction of the coil assembly and then output to the current output interface, and transmitted to the calibration device through the current output interface. The module also transmits the second analog current signal to the third ADC chip and the third analog voltage signal to the second VFC voltage-to-frequency and frequency-to-voltage converter.

[0020] The third ADC chip is used to acquire the second analog current signal, convert the second analog current signal into a second digital current signal, and then transmit it to the second processing unit.

[0021] The second VFC voltage-to-frequency and frequency-to-voltage converter is used to convert the third analog voltage signal into a second frequency signal;

[0022] The frequency / voltage monitoring module is used to acquire the second frequency signal and transmit it to the metering device to be calibrated through the frequency / voltage output interface, and to transmit the second frequency signal to the second processing unit.

[0023] Optionally, the second processing unit and the second Beidou chip communicate using the UART protocol, and the second processing unit and the DAC chip, as well as the third ADC chip and the second processing unit, communicate using the SPI protocol.

[0024] According to another aspect of the present invention, a remote calibration method for a measuring device is provided, the method comprising:

[0025] The Beidou main station board connected to the metrology standard device receives Beidou satellite signals to obtain timing, communicates with the ground satellite station to obtain timing calibration, generates a first PPS signal and first time information, collects external signals transmitted by the metrology standard device, and generates encrypted information based on the PPS signal, time information and external signals. The encrypted information is then sent to the Beidou measurement board via the ground satellite station and the Beidou satellite.

[0026] At least one Beidou measurement board connected to the metering device to be calibrated receives Beidou satellite signals to obtain timing and communicates with the ground satellite station to obtain timing calibration. It receives the encrypted information through the Beidou satellite, decrypts the encrypted information, and outputs the corresponding analog signal to the computing device to be calibrated based on the decrypted data.

[0027] Optionally, the BeiDou master station board connected to the metrology standard device receives BeiDou satellite signals to obtain timing, communicates with the ground satellite station to obtain timing calibration, generates a first PPS signal and first time information, collects external signals transmitted by the metrology standard device, and generates encrypted information based on the PPS signal, time information, and external signals. The encrypted information is then sent to the BeiDou measurement board via the ground satellite station and BeiDou satellites. This includes:

[0028] It receives satellite signals to obtain authorization and coordinates with ground satellite stations by acquiring timing synchronization.

[0029] Acquire the first PPS signal and the first time information;

[0030] The external signals transmitted by the measurement standard device are collected, including a first analog voltage signal, a first analog current signal, and a first frequency signal;

[0031] The algorithm is used to analyze and encode the first frequency signal, the first digital voltage signal, and the first digital current signal to generate first encoded information.

[0032] The first encoded information, the first PPS signal, and the first time information are encrypted to generate encrypted information, which is then transmitted to the BeiDou measurement board via ground satellite stations and BeiDou satellites.

[0033] Optionally, at least one BeiDou measurement board connected to the calibration device receives BeiDou satellite signals to obtain timing and communicates with a ground satellite station to obtain timing calibration. It receives the encrypted information via BeiDou satellite, decrypts the encrypted information, and outputs a corresponding analog signal to the calibration device based on the decrypted data, including:

[0034] It receives satellite signals to obtain authorization and coordinates with ground satellite stations by acquiring timing synchronization.

[0035] The encrypted information is obtained and decrypted to obtain the decrypted data, as well as the second PPS signal and the second time information.

[0036] A second analog voltage signal is generated based on the decrypted data and the second PPS signal;

[0037] The second analog voltage signal is converted into a second digital voltage signal, and the algorithm is run to parse and encode the second digital voltage signal to generate second encoded information;

[0038] The analog signal generated by the digital-to-analog conversion of the second encoded information is used to output a third analog voltage signal and a second analog current signal. The second analog current signal is amplified proportionally by the non-contact induction of the coil assembly and then output to the calibration device.

[0039] The second analog current signal is converted into a second digital current signal, and the third analog voltage signal is converted into a second frequency signal;

[0040] The second frequency signal is transmitted to the measuring device to be calibrated, and the second data current signal and the second frequency signal are calibrated.

[0041] The remote calibration system and method for metrology devices provided by this invention comprises a BeiDou satellite, a ground satellite station, a BeiDou master station board, and at least one BeiDou measurement board. The BeiDou master station board sends encrypted information (time synchronization and short messages) to the BeiDou measurement board via the BeiDou satellite and the ground satellite station. The BeiDou measurement board then decrypts the encrypted information (time synchronization and short messages), generating decrypted data, and outputs corresponding analog signals, including voltage, current, and frequency. The BeiDou master station board and BeiDou measurement system in this system and method utilize a two-way time synchronization principle. Time synchronization is obtained by receiving satellite signals and then communicating with the ground satellite station to obtain time synchronization calibration, ensuring more accurate clock synchronization and achieving precise synchronization of remote multi-channel data acquisition and control. Using this system and method not only expands the testing / calibration capabilities of higher-level metrology institutions but also improves the testing accuracy and capabilities of grassroots metrology institutions. Remote metrological calibration not only enables accurate data to be obtained by calibrating metrological instruments for subordinate units, but also allows for monitoring of every action and step in the calibration process. Problems discovered during the calibration process can be corrected and guided in a timely manner, which is an effective way to promote the improvement of the capabilities of metrological technical institutions. The remote calibration system and method described in this invention have broad prospects for engineering applications and the promotion of their results. Attached Figure Description

[0042] Exemplary embodiments of the present invention can be more fully understood by referring to the following figures:

[0043] Figure 1 is a schematic diagram of the structure of a remote calibration system for a measuring device according to a preferred embodiment of the present invention;

[0044] Figure 2 is a structural schematic diagram of the Beidou master station board according to a preferred embodiment of the present invention;

[0045] Figure 3 is a structural schematic diagram of the Beidou measurement board according to a preferred embodiment of the present invention;

[0046] Figure 4 is a flowchart of a remote calibration method for a measuring device according to a preferred embodiment of the present invention. Detailed Implementation

[0047] Exemplary embodiments of the invention will now be described with reference to the accompanying drawings. However, the invention may be embodied in many different forms and is not limited to the embodiments described herein. These embodiments are provided to fully and completely disclose the invention and to fully convey its scope to those skilled in the art. The terminology used in the exemplary embodiments illustrated in the drawings is not intended to limit the invention. In the drawings, the same units / elements are referred to by the same reference numerals.

[0048] Unless otherwise stated, the terms used herein (including technical terms) have their common meaning as understood by one of ordinary skill in the art. Furthermore, it is understood that terms defined in commonly used dictionaries should be understood to have a meaning consistent with the context of their relevant field, and not to be interpreted as having an idealized or overly formal meaning.

[0049] Exemplary System

[0050] Figure 1 is a schematic diagram of the structure of a remote calibration system for a metrology device according to a preferred embodiment of the present invention. As shown in Figure 1, the remote calibration system for a metrology device according to this preferred embodiment includes a BeiDou satellite 101, a ground satellite station 102, a BeiDou master station board 103, and at least one BeiDou measurement board 104. The BeiDou master station board 103 is connected to a metrology standard device, and the BeiDou measurement board 104 is connected to the metrology device to be calibrated, wherein:

[0051] The Beidou main station board 103 is used to receive signals from Beidou satellite 101 to obtain timing, communicate with ground satellite station 102 to obtain timing calibration, generate a first PPS signal and first time information, collect external signals transmitted by the metrology standard device, and generate encrypted information based on the PPS signal, time information and external signals, and send the encrypted information to the Beidou measurement board through the ground satellite station and Beidou satellite.

[0052] The Beidou measurement board 104 is used to receive signals from the Beidou satellite 101 to obtain timing, and communicate with the ground satellite station 102 to obtain timing calibration. It receives the encrypted information through the Beidou satellite, decrypts the encrypted information, and outputs corresponding analog signals to the computing device to be calibrated based on the decrypted data.

[0053] Figure 2 is a structural schematic diagram of the BeiDou master station board according to a preferred embodiment of the present invention. As shown in Figure 2, the BeiDou master station board 103 of this preferred embodiment includes a first processing unit 131, a first BeiDou chip 132, a data monitoring module 133, a first ADC chip 134, and a data input interface 135 connected to a metrology standard device, wherein:

[0054] The first processing unit 131 is used to communicate with the first Beidou chip 132 to obtain the first PPS signal and the first time information; and to receive the first frequency signal, run an algorithm to parse and encode the first frequency signal, the first digital voltage signal and the first digital current signal, generate the first encoded information and transmit it to the first Beidou chip 133.

[0055] The first Beidou chip 132 is used to receive signals from Beidou satellite 101 to obtain authorization, and to obtain time synchronization calibration with ground satellite station 102, and to communicate with the first processing unit 131 to encrypt the first encoding information, the first PPS signal and the first time information to generate encrypted information, and transmit it to the Beidou measurement board through ground satellite station 102 and Beidou satellite 101.

[0056] The data monitoring module 133 is used to collect external signals transmitted by the metrological standard device. The data monitoring module includes a frequency monitoring module 1331, a voltage monitoring module 1332, and a current monitoring module 1333. The data input interface 135 connected to the metrological standard device includes a frequency input interface 1351, a voltage input interface 1352, and a current input interface 1353. The voltage monitoring module 1332 and the current monitoring module 1333 collect a first analog voltage signal and a first analog current signal through the voltage input interface 1352 and the current input interface 1353, respectively. The frequency monitoring module 1331 collects a first frequency signal through the frequency input interface 1353.

[0057] The first ADC chip 134 is used to convert the first analog voltage signal and the first analog current signal into a first digital voltage signal and a first digital current signal and then transmit them to the first processing unit 131.

[0058] Preferably, the first processing unit 131 and the first Beidou chip 132 communicate with each other using the UART protocol, and the first ADC chip 134 and the first processing unit 131 communicate with each other using the SPI protocol.

[0059] Figure 3 is a structural schematic diagram of a Beidou measurement board according to a preferred embodiment of the present invention. As shown in Figure 3, the Beidou measurement board 104 of this preferred embodiment includes a second processing unit 141, a second Beidou chip 142, a first VFC voltage-to-frequency converter and frequency-to-voltage converter 143, a second ADC chip 144, a DAC chip 145, a current source module 146, a third ADC chip 147, a second VFC voltage-to-frequency converter and frequency-to-voltage converter 148, a frequency / voltage monitoring module 149, a frequency / voltage output interface 150, and a current output interface 151, wherein:

[0060] The second processing unit 141 is used to communicate with the second Beidou chip 142 to obtain the encrypted information and decrypt it, obtain the decrypted data, and obtain the second PPS signal and the second time information; send the decrypted data and the second PPS signal to the first VFC voltage-to-frequency converter and frequency-to-voltage converter 143; run an algorithm to parse and encode the second data voltage signal, generate second encoded information and transmit it to the DAC chip; and calibrate the second data current signal and the second frequency signal.

[0061] The second Beidou chip 142 is used to receive signals from Beidou satellite 101 to obtain authorization, and to communicate with ground satellite station 102 to obtain timing calibration, as well as to communicate with the second processing unit 141.

[0062] The first VFC voltage-to-frequency and frequency-to-voltage converter 143 is used to generate a second analog voltage signal based on the decrypted data and the second PPS signal;

[0063] The second ADC chip 144 is used to convert the second analog voltage signal into a second digital voltage signal and transmit it to the second processing unit 141;

[0064] DAC chip 145 is used to transmit the analog signal generated after the second encoded information is converted from digital to analog to the current source module 146.

[0065] The current source module 146 is used to output a third analog voltage signal and a second analog current signal according to the analog signal. The second analog current signal is proportionally amplified by non-contact induction of the coil assembly and then output to the current output interface 151, and transmitted to the calibration device through the current output interface 151. The module also transmits the second analog current signal to the third ADC chip 147 and the third analog voltage signal to the second VFC voltage-to-frequency and frequency-to-voltage converter 148.

[0066] The third ADC chip 147 is used to acquire the second analog current signal, convert the second analog current signal into a second digital current signal, and then transmit it to the second processing unit 141.

[0067] The second VFC voltage-to-frequency and frequency-to-voltage converter 148 is used to convert the third analog voltage signal into a second frequency signal;

[0068] The frequency / voltage monitoring module 149 is used to acquire the second frequency signal and transmit it to the metering device to be calibrated through the frequency / voltage output interface 150, and to transmit the second frequency signal to the second processing unit 141.

[0069] Preferably, the second processing unit 141 and the second Beidou chip 142 communicate using the UART protocol, the second processing unit 141 and the DAC chip 145 communicate using the SPI protocol, and the third ADC chip 147 communicates with the second processing unit 141 using the SPI protocol.

[0070] The remote calibration system for the metering device described in this preferred embodiment includes a BeiDou master station board, a BeiDou measurement board, BeiDou satellites, and a ground satellite station. The BeiDou master station board sends encrypted information (time synchronization and short messages) to the BeiDou measurement board via the BeiDou satellites and the ground satellite station. The BeiDou measurement board then decrypts the encrypted information (time synchronization and short messages), generating decrypted data, and outputs corresponding analog signals. These output signals include voltage, current, and frequency. The BeiDou master station board and BeiDou measurement system in this system and method utilize a two-way time synchronization principle. Time synchronization is obtained by receiving satellite signals and then communicating with the ground satellite station for time synchronization calibration, ensuring more accurate clock synchronization and achieving precise synchronization of remote multi-channel data acquisition and control. Furthermore, the BeiDou measurement board improves the accuracy of the output signals by acquiring and correcting the output analog current and frequency signals.

[0071] Exemplary methods

[0072] Figure 4 is a flowchart of a remote calibration method for a measuring device according to a preferred embodiment of the present invention. As shown in Figure 4, the remote calibration method for a measuring device according to this preferred embodiment begins with step 401.

[0073] In step 401, the Beidou main station board connected to the metrology standard device receives Beidou satellite signals to obtain timing, communicates with the ground satellite station to obtain timing calibration, generates a first PPS signal and first time information, collects external signals transmitted by the metrology standard device, and generates encrypted information based on the PPS signal, time information and external signals. The encrypted information is then sent to the Beidou measurement board via the ground satellite station and the Beidou satellite.

[0074] In step 402, at least one Beidou measurement board connected to the calibration device receives Beidou satellite signals to obtain timing and communicates with the ground satellite station to obtain timing calibration. It receives the encrypted information through the Beidou satellite, decrypts the encrypted information, and outputs the corresponding analog signal to the calibration device based on the decrypted data.

[0075] Preferably, the BeiDou master station board connected to the metrology standard device receives BeiDou satellite signals to obtain timing, communicates with the ground satellite station to obtain timing calibration, generates a first PPS signal and first time information, collects external signals transmitted by the metrology standard device, and generates encrypted information based on the PPS signal, time information, and external signals. The encrypted information is then sent to the BeiDou measurement board via the ground satellite station and BeiDou satellites. This includes:

[0076] It receives satellite signals to obtain authorization and coordinates with ground satellite stations by acquiring timing synchronization.

[0077] Acquire the first PPS signal and the first time information;

[0078] The external signals transmitted by the measurement standard device are collected, including a first analog voltage signal, a first analog current signal, and a first frequency signal;

[0079] The algorithm is used to analyze and encode the first frequency signal, the first digital voltage signal, and the first digital current signal to generate first encoded information.

[0080] The first encoded information, the first PPS signal, and the first time information are encrypted to generate encrypted information, which is then transmitted to the BeiDou measurement board via ground satellite stations and BeiDou satellites.

[0081] Preferably, at least one BeiDou measurement board connected to the calibration device receives BeiDou satellite signals to obtain timing and communicates with a ground satellite station to obtain timing calibration. It receives the encrypted information via BeiDou satellite, decrypts the encrypted information, and outputs a corresponding analog signal to the calibration device based on the decrypted data, including:

[0082] It receives satellite signals to obtain authorization and coordinates with ground satellite stations by acquiring timing synchronization.

[0083] The encrypted information is obtained and decrypted to obtain the decrypted data, as well as the second PPS signal and the second time information.

[0084] A second analog voltage signal is generated based on the decrypted data and the second PPS signal;

[0085] The second analog voltage signal is converted into a second digital voltage signal, and the algorithm is run to parse and encode the second digital voltage signal to generate second encoded information;

[0086] The analog signal generated by the digital-to-analog conversion of the second encoded information is used to output a third analog voltage signal and a second analog current signal. The second analog current signal is amplified proportionally by the non-contact induction of the coil assembly and then output to the calibration device.

[0087] The second analog current signal is converted into a second digital current signal, and the third analog voltage signal is converted into a second frequency signal;

[0088] The second frequency signal is transmitted to the measuring device to be calibrated, and the second data current signal and the second frequency signal are calibrated.

[0089] The remote calibration method for the measuring device described in this preferred embodiment is implemented using the remote calibration method for the measuring device described in this invention. Therefore, it also adopts the two-way time synchronization principle, which enables more accurate clock synchronization and achieves precise synchronization of remote multi-channel data acquisition and control.

[0090] The invention has been described with reference to a few embodiments. However, as will be known to those skilled in the art, and as defined in the appended claims, other embodiments besides those disclosed above fall equivalently within the scope of the invention.

[0091] Generally, all terms used in the claims are to be interpreted according to their ordinary meaning in the art, unless otherwise expressly defined herein. All references to “a / the / the [device, component, etc.]” ​​are openly interpreted as at least one instance of said device, component, etc., unless otherwise expressly stated. The steps of any method disclosed herein need not be performed in the exact order disclosed unless explicitly stated otherwise.

[0092] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0093] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in one or more flowchart illustrations and / or one or more block diagrams.

[0094] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means that implement the functions specified in one or more flowcharts and / or one or more block diagrams.

[0095] These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer-implemented process, such that the instructions, which execute on the computer or other programmable apparatus, provide steps for implementing the functions specified in one or more flowcharts and / or one or more block diagrams.

[0096] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the specific implementation of the present invention. Any modifications or equivalent substitutions that do not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A remote calibration system for a measuring device, characterized in that, The system includes a BeiDou satellite, a ground satellite station, and a BeiDou master station board, as well as at least one BeiDou measurement board. The BeiDou master station board is connected to a metrology standard device, and the BeiDou measurement board is connected to a metrology device to be calibrated. Specifically: the BeiDou master station board receives BeiDou satellite signals to acquire time synchronization and communicates with the ground satellite station to acquire time synchronization calibration; it generates a first PPS signal and first time information; it collects external signals transmitted by the metrology standard device; and it generates encrypted information based on the PPS signal, time information, and external signals, sending the encrypted information to the BeiDou measurement board via the ground satellite station and BeiDou satellite. The BeiDou measurement board receives BeiDou satellite signals to acquire time synchronization and communicates with the ground satellite station to acquire time synchronization calibration. The Beidou satellite receives the encrypted information, decrypts it, and outputs a corresponding analog signal to the calibration device based on the decrypted data. The Beidou measurement board includes a second processing unit, a DAC chip, a second ADC chip, a third ADC chip, a second Beidou chip, a first VFC voltage-to-frequency converter and a frequency-to-voltage converter, a second VFC voltage-to-frequency converter and a current source module, a frequency / voltage monitoring module, a frequency / voltage output interface, and a current output interface. The second processing unit communicates with the second Beidou chip to acquire and decrypt the encrypted information, obtain the decrypted data, and acquire the second PPS signal and second time information. It then processes the decrypted data and the second PPS signal... The signal is fed into the first VFC voltage-to-frequency converter and frequency-to-voltage converter; the algorithm is run to parse and encode the second data voltage signal, generating second encoded information which is transmitted to the DAC chip; the second data current signal and the second frequency signal are calibrated; the second Beidou chip is used to receive satellite signals to obtain authorization, and to communicate with the ground satellite station for timing calibration, as well as to communicate with the second processing unit; the first VFC voltage-to-frequency converter and frequency-to-voltage converter are used to generate a second analog voltage signal based on the decrypted data and the second PPS signal; the second ADC chip is used to convert the second analog voltage signal into a second digital voltage signal and transmit it to the second processing unit; the DAC chip is used to convert the second encoded information into an analog signal after digital-to-analog conversion and transmit it to the second processing unit. The signal is input to a current source module; the current source module is used to output a third analog voltage signal and a second analog current signal according to the analog signal, wherein the second analog current signal is proportionally amplified by non-contact induction of the coil assembly and output to the current output interface, and transmitted to the calibration device through the current output interface; and to transmit the second analog current signal to a third ADC chip, and the third analog voltage signal to a second VFC voltage-to-frequency and frequency-to-voltage converter; the third ADC chip is used to acquire the second analog current signal, convert the second analog current signal into a second digital current signal and transmit it to the second processing unit; the second VFC voltage-to-frequency and frequency-to-voltage converter is used to convert the third analog voltage signal into a second frequency signal;The frequency / voltage monitoring module is used to acquire a second frequency signal and transmit it to the metering device to be calibrated via the frequency / voltage output interface, as well as to transmit the second frequency signal to the second processing unit.

2. The system according to claim 1, characterized in that, The Beidou master station board includes a first processing unit, a first ADC chip, a first Beidou chip, a data monitoring module, and a data input interface connected to a metrology standard device. The first processing unit communicates with the first Beidou chip to acquire a first PPS signal and first time information; receives a first frequency signal transmitted by the frequency monitoring module; and runs an algorithm to parse and encode the first frequency signal, first digital voltage signal, and first digital current signal, generating first encoded information which is then transmitted to the first Beidou chip. The first Beidou chip receives satellite signals to obtain authorization, obtains time synchronization calibration with the ground satellite station, and communicates with the first processing unit to encrypt the first encoded information, the first PPS signal, and the first time information, generating... Encrypted information is transmitted to the BeiDou measurement board via ground satellite stations and BeiDou satellites; a data monitoring module is used to collect external signals transmitted by the metrological standard device. The data monitoring module includes a frequency monitoring module, a voltage monitoring module, and a current monitoring module. The data input interface connected to the metrological standard device includes a frequency input interface, a voltage input interface, and a current input interface. The voltage monitoring module and the current monitoring module collect a first analog voltage signal and a first analog current signal through the voltage input interface and the current input interface, respectively. The frequency monitoring module collects a first frequency signal through the frequency input interface; a first ADC chip is used to convert the first analog voltage signal and the first analog current signal into a first digital voltage signal and a first digital current signal, and then transmit them to the first processing unit.

3. The system according to claim 2, characterized in that, The first processing unit and the first Beidou chip communicate using the UART protocol, and the first ADC chip and the first processing unit communicate using the SPI protocol.

4. The system according to claim 1, characterized in that, The second processing unit communicates with the second Beidou chip using the UART protocol, and the second processing unit communicates with the DAC chip, as well as the third ADC chip and the second processing unit, using the SPI protocol.

5. A remote calibration method for a measuring device employing any one of the systems described in claims 1 to 4, characterized in that, The method includes: a BeiDou master station board connected to a metrology standard device receiving BeiDou satellite signals to obtain timing, communicating with a ground satellite station to obtain timing calibration, generating a first PPS signal and first time information, collecting external signals transmitted by the metrology standard device, and generating encrypted information based on the PPS signal, time information, and external signals, and sending the encrypted information to the BeiDou measurement board via the ground satellite station and BeiDou satellite; at least one BeiDou measurement board connected to the metrology device to be calibrated receiving BeiDou satellite signals to obtain timing, communicating with a ground satellite station to obtain timing calibration, receiving the encrypted information via BeiDou satellite, decrypting the encrypted information, and outputting a corresponding analog signal to the computing device to be calibrated based on the decrypted data.

6. The method according to claim 5, characterized in that, The Beidou master station board connected to the metrology standard device receives Beidou satellite signals to obtain timing, communicates with the ground satellite station to obtain timing calibration, generates a first PPS signal and first time information, collects external signals transmitted by the metrology standard device, and generates encrypted information based on the PPS signal, time information, and external signals. The encrypted information is then sent to the Beidou measurement board via the ground satellite station and Beidou satellite. This process includes: receiving satellite signals to obtain authorization and obtaining timing calibration with the ground satellite station; acquiring the first PPS signal and first time information; collecting external signals transmitted by the metrology standard device, including a first analog voltage signal, a first analog current signal, and a first frequency signal; running an algorithm to parse and encode the first frequency signal, the first digital voltage signal, and the first digital current signal to generate first encoded information; encrypting the first encoded information, the first PPS signal, and the first time information to generate encrypted information, and transmitting it to the Beidou measurement board via the ground satellite station and Beidou satellite.

7. The method according to claim 6, characterized in that, At least one BeiDou measurement board connected to the calibration device receives BeiDou satellite signals to obtain time synchronization and communicates with a ground satellite station to obtain time synchronization calibration. It receives encrypted information via BeiDou satellite, decrypts the encrypted information, and outputs corresponding analog signals to the calibration device based on the decrypted data. This includes: receiving satellite signals to obtain authorization and obtaining time synchronization calibration with a ground satellite station; obtaining and decrypting the encrypted information to obtain decrypted data, and obtaining a second PPS signal and second time information; generating a second analog voltage signal based on the decrypted data and the second PPS signal; converting the second analog voltage signal into a second digital voltage signal, and running an algorithm to parse and encode the second data voltage signal to generate second encoded information; outputting a third analog voltage signal and a second analog current signal based on the analog signal generated after digital-to-analog conversion of the second encoded information, wherein the second analog current signal is proportionally amplified through non-contact induction of a coil assembly and then output to the calibration device; converting the second analog current signal into a second digital current signal and the third analog voltage signal into a second frequency signal; transmitting the second frequency signal to the calibration device; and calibrating the second data current signal and the second frequency signal.

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