A test device for simulating armature-rail force electrical transient impact scuffing

Abstract

The application provides a test device for simulating armature-rail force electric transient impact scratch, wherein the test device comprises an optical flat, a rotating disc mechanism, a driving mechanism and a scratch rod mechanism arranged on the optical flat, the driving mechanism is used for driving the scratch rod mechanism to scratch on the rotating disc mechanism, the scratch rod mechanism comprises a rod, an elastic component, a three-dimensional force sensor, an insulated double-end flange, a connecting flange, a lock nut, a first copper nose, a ball clamp and a ball sample which are sequentially connected, one end of the rod is connected with the driving mechanism, and the rotating disc mechanism comprises a rotating disc sample, a rotating shaft, an insulating disc, an insulating cylindrical pin and an insulating rhombic pin. The application can simulate single and continuous multiple scratches of the armature-rail, and can in-situ observe the state of the friction pair and measure the friction force, the friction coefficient, the current, the voltage and the contact resistance signal.

Description

Technical Field

[0001] This invention belongs to the field of equivalent simulation test technology for electromagnetic launch equipment, and specifically relates to a test device for simulating armature-track force transient impact and friction. Background Technology

[0002] Electromagnetic launch is a new linear propulsion technology based on electromagnetic energy, possessing significant advantages such as ultra-high speed, long range, and strong controllability, and has broad application prospects in fields such as electromagnetic railguns and electromagnetic catapults. The armature-rail current-carrying friction pair is a core component of the launcher, operating in a transient electro-mechanical impact environment (short time, large pulse current, high speed). Rail wear failure under continuous launch requirements is a major bottleneck restricting the performance improvement of electromagnetic energy equipment. To develop protective designs such as new rail materials and surface coatings, extensive basic experimental research on armature-rail friction and wear is required. However, conducting experiments on actual electromagnetic energy equipment faces practical problems such as high costs and difficulties in obtaining permits. Therefore, there is an urgent need to invent a test device that can simulate armature-rail friction behavior.

[0003] The armature-track friction process is characterized by transient electromechanical impact, current carrying capacity, high speed, and time-varying normal load (the normal load curve exhibits a "rise-hold-fall" time-varying characteristic). This friction mode under special working conditions is called "scratching," but traditional current-carrying friction test devices cannot meet this requirement. For example, patents with application numbers 202210049940.4 and 201710172189.6 respectively provide a sliding and a rolling current-carrying friction test device, but their friction pair processes are all long-term contact processes and do not possess transient contact or electromechanical impact. Patent application number 202110060652.4 provides a friction and wear test platform for an electromagnetic track launcher, but the pin-disc friction pair it provides also does not possess transient electromechanical impact or time-varying normal load. At the same time, existing traditional current-carrying friction test devices also suffer from drawbacks such as unstable current carrying capacity, difficulty in replacing current-carrying components, and waste of friction pair samples.

[0004] Armature-track friction in electromagnetic launch equipment is a fundamental research problem that has only recently gained attention. While there are existing literature reports on this topic, a dedicated experimental device that highly simulates the armature-track friction process has yet to be seen. Summary of the Invention

[0005] To address the aforementioned technical problems, this invention provides a test apparatus for simulating transient impact and friction between armature and track forces. The test apparatus includes an optical plate and a turntable mechanism, a drive mechanism, and a friction rod mechanism mounted on the optical plate.

[0006] The driving mechanism is used to drive the rubbing rod mechanism to rub on the turntable mechanism. The rubbing rod mechanism includes a rod, an elastic component, a three-dimensional force sensor, an insulating double-ended flange, a connecting flange, an anti-loosening nut, a first copper lug, a ball clamp, and a ball sample connected in sequence. One end of the rod is connected to the driving mechanism.

[0007] The turntable mechanism includes a turntable sample, a rotating shaft, an insulating disk, an insulating cylindrical pin, and an insulating diamond pin. The rotating shaft passes through the optical plate and is connected by a rotating mechanism at the bottom of the optical plate. The insulating disk is detachably connected to the rotating shaft. The insulating cylindrical pin and the insulating diamond pin are installed on the end face of the rotating shaft, and the insulating disk is installed on the insulating cylindrical pin and the insulating diamond pin.

[0008] Furthermore, the elastic component includes a first spring, a hollow shaft, and a sliding block, wherein,

[0009] One end of the hollow shaft is provided with four through keyways arranged in a ring, and a limit screw is installed in the keyway. One end of the sliding block is provided with four keys arranged in a ring. One end of the sliding block is inserted into the hollow shaft and fixed to the hollow shaft by the keyways, keys and limit screws.

[0010] The other end of the sliding block is flange-shaped and connected to one end of the insulating double-headed flange. The other end of the hollow shaft is flange-shaped and connected to the other end of the rod by bolts.

[0011] Furthermore, the test apparatus also includes two flow guiding mechanisms, which are symmetrically arranged on both sides of the turntable mechanism.

[0012] The flow guiding mechanism includes a yz-axis slide, an insulating plate, and a flow guiding assembly. The yz-axis slide includes a y-axis slide and a first z-axis slide, which are mounted on the optical plate via a lead screw structure. The first z-axis slide is mounted on the y-axis slide. The insulating plate is connected to the upper end face of the first z-axis slide by screws. The flow guiding assembly is mounted on the upper end face of the insulating plate.

[0013] Furthermore, the flow guiding assembly includes a follower bearing, a follower bearing housing, a ball-and-bar joint bearing, a second fixing collar, a second copper lug, an end face bearing, a smooth rod screw, a second spring, two temporary limiting rings, and two rotating rods, wherein,

[0014] A threaded hole is provided on the upper end face of one side of the insulating plate. An end face bearing, one end of a rotating rod, and a second copper lug are placed concentrically above the threaded hole and fixed by a smooth rod screw.

[0015] The second fixing collar is fitted and fixed in the middle of the two rotating rods. One end of the ball-rod joint bearing is threaded to the other end of the rotating rod, and the other end of the ball-rod joint bearing is threaded to one end of the follower bearing seat. The follower bearing is fixed on the follower bearing seat. The second spring is hung on the second fixing collar.

[0016] The temporary limiting ring is installed at one end of the follower bearing housing and at the other end of the rotating rod.

[0017] Furthermore, the test apparatus also includes a recovery mechanism and a release mechanism. The recovery mechanism includes a first support body, a forward slide, a reverse slide, a slide base, a right slide, a left slide, a third spring, a left baffle, a slide groove, a right baffle, a left cover plate, and a connector.

[0018] The two connectors are bolted to the vertical plate of the first support; the slide base is mounted on the two first supports and is inclined.

[0019] The slide base is provided with a mounting rod, and the positive slide and the negative slide are slidably connected to the mounting rod. The left slide is installed in the slide groove on the positive slide, and the right slide is installed in the slide groove on the negative slide.

[0020] The left baffle is fixed to one side wall of the left slide, and the left cover plate is fixed to the other side wall of the left slide; the right baffle is fixed to one side wall of the right slide, and the right cover plate is fixed to the other side wall of the right slide.

[0021] Linear bearings are provided on both the left and right baffles. Optical shafts are provided on the left end face of the left slide and the right end face of the right slide. The two optical shafts are respectively passed through the two linear bearings, and the third spring is sleeved on each of the linear bearings.

[0022] The left and right slides are both provided with concave surfaces on their opposite surfaces;

[0023] The release mechanism and the recovery mechanism have the same structure, wherein the slide base in the release mechanism is horizontally inverted.

[0024] Furthermore, the recycling mechanism also includes a locking screw, wherein,

[0025] The locking screw is installed on the positive slide or the negative slide.

[0026] Furthermore, the drive mechanism includes a drive base, a rotating shaft, a bearing housing, a torque motor, a first transmission belt, and an electromagnetic clutch, wherein,

[0027] The drive base is mounted on a frame provided on the upper surface of the optical flat plate. The torque motor and the bearing seat are both mounted on the drive base. The rotating shaft is connected to the electromagnetic clutch key via the bearing seat.

[0028] The limiting ring on the electromagnetic clutch is connected to the bearing seat by fixing screws, which is used to limit the rotation of the electromagnetic clutch support part.

[0029] The torque motor transmits torque to the electromagnetic clutch via a first transmission belt.

[0030] Furthermore, the rubbing rod mechanism also includes an open weight and a bolt assembly, wherein,

[0031] The other end of the rod is provided with two first fixed collars, and the opening of the open weight surrounds the other end of the rod and the open weight is located between the two first fixed collars.

[0032] The bolt assembly includes a bolt and a nut. The bolt is inserted into an opening, with the head of the bolt contacting the bottom of the open weight. The nut is installed at the tail of the bolt and contacts the top of the open weight. Both the bolt and the nut are equipped with a third copper lug. The third copper lug on the nut is connected to a second copper lug via a wire.

[0033] Furthermore, the testing apparatus also includes a detection mechanism, which comprises a busbar and a current generator. The busbar includes a current inlet, a current outlet, a set screw, a wire clamping screw, an insulating support, and a slot.

[0034] The insulating support is connected to the optical plate by a wire screw. There are four current inlets, and the four current inlets are connected to four second copper lugs by a bus wire.

[0035] The current outlet is connected to the negative terminal of the current generator via a negative wire, and the positive terminal of the current generator is connected to the third copper lug on the bolt via a positive wire.

[0036] Furthermore, the rotating mechanism includes a high-speed motor, a large pulley, a second transmission belt, and a small pulley, wherein,

[0037] The output end of the high-speed motor is connected to a large pulley, the large pulley is connected to a small pulley via a second transmission belt, and the small pulley is connected to a rotating shaft.

[0038] Compared with the prior art, the present invention provides a test device for simulating the transient impact and friction of armature-track force, which can simulate single and multiple consecutive frictions between the armature and track, and can observe the state of the friction pair in situ and measure the friction force, friction coefficient, current, voltage and contact resistance signals (the contact resistance signal is calculated from the measured voltage and current signals).

[0039] Other features and advantages of the invention will be set forth in the following description, and will be apparent in part from the description, or may be learned by practicing the invention. The objects and other advantages of the invention may be realized and obtained by means of the structures pointed out in the description and the drawings. Attached Figure Description

[0040] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0041] Figure 1 A schematic diagram of the front of a test device for simulating armature-track force-electric transient impact and friction according to an embodiment of the present invention is shown;

[0042] Figure 2 A schematic diagram of the wiping lever mechanism according to an embodiment of the present invention is shown;

[0043] Figure 3 A cross-sectional view of an elastic member according to an embodiment of the present invention is shown;

[0044] Figure 4 A schematic diagram of the drive mechanism according to an embodiment of the present invention is shown;

[0045] Figure 5 A schematic diagram of the structure of a turntable sample according to an embodiment of the present invention is shown;

[0046] Figure 6 An embodiment of the present invention is shown. Figure 1 A structural diagram of the back side;

[0047] Figure 7 A schematic diagram of the flow guiding mechanism according to an embodiment of the present invention is shown;

[0048] Figure 8 A schematic diagram of the rotating rod of the flow guiding mechanism according to an embodiment of the present invention is shown during its movement.

[0049] Figure 9 A schematic diagram of the bus structure according to an embodiment of the present invention is shown;

[0050] Figure 10 A schematic diagram of the structure of the recycling mechanism according to an embodiment of the present invention is shown;

[0051] Figure 11 A schematic diagram of forming a current-carrying loop according to an embodiment of the present invention is shown;

[0052] Figure 12 A schematic diagram of the motion structure of the wiping lever mechanism according to an embodiment of the present invention is shown. Detailed Implementation

[0053] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0054] like Figure 1 As shown, the present invention provides a test device for simulating transient impact and scratching of armature-track force, wherein the test device includes an optical plate 1 and a turntable mechanism, a drive mechanism, a scratching rod mechanism 7, a release mechanism 11, a recovery mechanism 18, a detection mechanism, and two flow guiding mechanisms 3 disposed on the optical plate 1. The various parts of the test device are described in detail below.

[0055] 1. Scraping rod mechanism

[0056] like Figure 2 As shown, the scrubbing rod mechanism 7 includes, in sequence, a rod 7-2, an elastic component, a double-ended flange 7-7, a three-dimensional force sensor 7-8, an insulating double-ended flange 7-9, a connecting flange 7-10, a lock nut 7-11, a first copper lug 7-12, a ball clamp 7-13, and a ball sample 7-14, wherein:

[0057] The elastic component includes a first spring 7-6-1, a hollow shaft 7-6-2, and a sliding block 7-6-4. One end of the hollow shaft 7-6-2 has four through keyways arranged in a 90° annular array, and a limiting screw 7-6-3 is installed within each keyway. One end of the sliding block 7-6-4 has four keys arranged in a 90° annular array. One end of the sliding block 7-6-4 is inserted into the hollow shaft 7-6-2 and fixed to it via the keyways, keys, and limiting screws 7-6-3. The other end of the sliding block 7-6-4 is flange-shaped and connected to one end of a double-ended flange 7-7. The other end of the hollow shaft 7-6-2 is flange-shaped and connected to the other end of the rod 7-2 via bolts.

[0058] The assembly method of the entire wiping lever mechanism 7 is as follows:

[0059] like Figure 3 As shown, the first spring 7-6-1 in the elastic component rests against the right end face of the rod 7-2 on its left side. The hollow shaft 7-6-2 is fitted onto the first spring 7-6-1, and the hollow shaft 7-6-2 is connected to the end face of the rod 7-2 by bolts. After loosening the limiting screw 7-6-3 on the hollow shaft 7-6-2 upwards, the sliding block 7-6-4 is fitted onto the hollow shaft 7-6-2, with the keyway and key aligned accordingly. Then, the limiting screw 7-6-3 is tightened downwards to prevent the sliding block 7-6-4 from falling off the hollow shaft 7-6-2. The purpose of the four pairs of keyways and keys is to restrict the rotation of the sliding block 7-6-4.

[0060] Starting from the elastic component and moving to the right, connect the double-ended flange 7-7, the three-dimensional force sensor 7-8, the insulating double-ended flange 7-9, and the connecting flange 7-10 in sequence. First, screw the anti-loosening nut 7-11 onto the bolt at the other end of the connecting flange 7-10 and then put the first copper lug 7-12 on it. Then, place the ball sample 7-14 into the ball clamp 7-13, which is made of copper and has internal threads. Finally, install the ball clamp 7-13 onto the bolt of the connecting flange 7-10 until the ball sample 7-14 is clamped against it.

[0061] In addition, in some embodiments of the present invention, the rubbing rod mechanism 7 further includes an open weight 7-4 and a bolt group 7-5, which will be described in detail below.

[0062] like Figure 2As shown, two first fixing collars 7-3 are provided at the other end of the rod 7-2 (i.e., 30mm from the end face of the other end of the rod 7-2). The opening of the open weight 7-4 surrounds the other end of the rod 7-2 and is located between the two first fixing collars 7-3. The bolt assembly 7-5 includes a bolt and a nut. The bolt is engaged in the opening, the head of the bolt contacts the bottom of the open weight 7-4, and the nut is installed at the tail of the bolt and contacts the top of the open weight 7-4.

[0063] The installation method of the open weight 7-4 and the bolt assembly 7-5 is as follows: Insert the open weight 7-4 onto the rod 7-2 and abut it against the right end face of one of the first fixing collars 7-3 and the left end face of the other first fixing collar 7-3. Use the bolt assembly to axially clamp the open weight 7-4, which is already inserted into the rod 7-2, to stably fix the open weight 7-4 onto the rod 7-2.

[0064] 2. Drive mechanism

[0065] The drive mechanism is used to drive the rubbing rod mechanism 7 to rub on the turntable mechanism. That is, one end of the rod 7-2 in the rubbing rod mechanism 7 is connected to the drive mechanism, which will be described in detail below.

[0066] like Figure 4 As shown, the drive mechanism includes a drive base 10, a rotating shaft 16, a bearing seat 15, a torque motor 12, a first transmission belt 13, and an electromagnetic clutch. The drive base 10 is mounted on an x-axis slide 6 (which provides the function of sliding the drive base in the x-direction, i.e., controlled by a control mechanism, such as a hydraulic cylinder, to slide the drive base on the x-axis slide 6 in the x-direction). The x-axis slide 6 is mounted on a second z-axis slide, which provides the function of raising and lowering the x-axis slide 6 (i.e., controlled by a control mechanism, such as a hydraulic cylinder, to slide the x-axis slide 6 on the second z-axis slide in the z-direction; some slides mentioned below can be controlled by corresponding control mechanisms to control the sliding of components on the slide). The second z-axis slide is mounted on the upper surface of the optical flat plate 1. The torque motor 12 and the bearing seat 15 are both mounted on the drive base 10. The rotating shaft 16 is keyed to the electromagnetic clutch 14 via the bearing seat 15, and the keyed end of the rod 7-2 in the rubbing rod mechanism 7 is keyed to the rotating shaft 16.

[0067] The limiting ring 14-1 on the electromagnetic clutch 14 is connected to the bearing seat 15 by a fixing screw 14-2, which is used to limit the rotation of the support part of the electromagnetic clutch 14; the torque motor 12 transmits torque to the electromagnetic clutch 14 through the first transmission belt 13. Whether the electromagnetic clutch 14 continues to transmit torque to the rotating shaft 16 and the subsequent rod 7-2 is explained as follows:

[0068] By controlling the on / off state of the electromagnetic clutch 14, the output torque of the torque motor 12 is controlled to transmit to the rotating shaft 16 and subsequent rods 7-2. The de-energized state applies to the period when the entire rubbing rod mechanism 7 freely descends from the release mechanism 11 to the recovery mechanism 18, while the energized state applies to the period when the entire rubbing rod mechanism 7 rotates from the recovery mechanism 18 to the release mechanism 11 driven by torque. The electromagnetic clutch 14 and torque motor 12 can automatically rotate the entire rubbing rod mechanism 7 to the release mechanism 11 after the rubbing test, ready for the next rubbing test, saving manpower and improving safety and testing efficiency.

[0069] 3. Turntable mechanism

[0070] like Figure 5 As shown, the turntable mechanism includes a turntable sample 2, a rotating shaft 36, an insulating disk 37, an insulating cylindrical pin 38, and an insulating rhomboid pin 39. The rotating shaft 36 passes through the optical plate 1 and is connected by a rotating mechanism at the bottom of the optical plate 1. The insulating disk 37 is detachably connected to the rotating shaft 36. The insulating cylindrical pin 38 and the insulating rhomboid pin 39 are mounted on the end face of the rotating shaft 36, and the insulating disk 37 is mounted on the insulating cylindrical pin 38 and the insulating rhomboid pin 39.

[0071] The connection method between the insulating disk 37, the rotating shaft 36, and the turntable sample 2 is further explained below: The edge and center of the turntable sample 2 and the insulating disk 37 are respectively provided with mounting holes and two positioning holes. The center of the end face of the rotating shaft 36 is provided with a threaded hole. The positioning between the turntable sample 2, the insulating disk 37, and the drive shaft is achieved by insulating cylindrical pins 38 and insulating diamond pins 39. The connection and clamping are achieved by insulating screws. That is, after the insulating cylindrical pins 38 and insulating diamond pins 39 are passed through the two positioning holes of the insulating disk 37 and the two positioning holes of the turntable sample 2 in sequence, the turntable sample 2 is installed in the threaded hole by insulating screws 40, thereby fixing the turntable sample 2 and the drive shaft 36.

[0072] The purpose of providing insulating cylindrical pins 38, insulating diamond pins 39, and insulating screws 40 is to insulate the turntable sample 2 from the drive shaft 36. The insulating cylindrical pins 38 and 39 are used together to improve the ease of disassembly of the turntable sample 2 and the insulating disk 37 sample. The diameter of the insulating disk 37 is equal to the diameter of the end face of the rotating shaft 36, while the diameter of the turntable sample 2 is 40 mm larger than that of the insulating disk 37. This is to ensure that the normal rotation of the insulating disk 37 and the rotating shaft 36 is not affected when current is discharged from the annular surface of the turntable sample 2 through the follower bearing 3-1 on the current guiding mechanism 3.

[0073] 4. Rotating mechanism

[0074] like Figure 6As shown, the rotating mechanism includes a high-speed motor 29, a large pulley 33, a second transmission belt 34, and a small pulley 35. The output end of the high-speed motor 29 is connected to the large pulley 33, the large pulley 33 is connected to the small pulley 35 through the second transmission belt 34, and the small pulley 35 is connected to the rotating shaft 36.

[0075] The rotational torque of the turntable sample 2 is provided by the high-speed motor 29. The high-speed motor 29 passes through the large pulley 33, the transmission belt 34, the small pulley 35, and the transmission shaft 36 in sequence. Then, the transmission shaft 36 transmits the output torque to the turntable sample 2 through the insulated cylindrical pin 38, the insulated diamond pin 39, and the insulated disc 37. The high-speed motor 29 is vertically mounted on the high-speed motor support plate 26 at the bottom of the optical flat plate by bolts.

[0076] 5. Flow guiding mechanism

[0077] like Figure 1 As shown, the two flow guiding mechanisms 3 are symmetrically arranged on both sides of the turntable mechanism, that is, in the positive and negative y directions of the turntable sample 2. The flow guiding mechanism 3 will be described in detail below:

[0078] like Figure 7 As shown, the flow guiding mechanism 3 includes a yz-axis slide 4, an insulating plate 3-8, and a flow guiding assembly. The yz-axis slide 4-3 includes a y-axis slide 4-3 and a first z-axis slide 4-2. The y-axis slide 4-3 is mounted on the optical plate 1 via a lead screw structure. The first z-axis slide 4-2 is mounted on the y-axis slide 4-3. The insulating plate 3-8 is connected to the upper end face of the first z-axis slide 4-2 by screws.

[0079] The flow guiding assembly is installed on the upper surface of the insulating plate 3-8. Specifically, the flow guiding assembly includes a follower bearing 3-1, a follower bearing seat 3-2, a ball-and-rod joint bearing 3-3, a second fixing collar 3-5, a second copper lug 3-6, an end face bearing 3-7, a smooth rod screw 3-9, a second spring 3-11, two temporary limiting rings 3-10, and two rotating rods 3-4.

[0080] The insulating plate 3-8 has a threaded hole on one side of its upper surface. Above the threaded hole, an end face bearing 3-7, one end of a rotating rod 3-4, and a second copper lug 3-6 are placed concentrically and fixed with a smooth rod screw 3-9. The second fixing collar 3-5 is fitted and fixed in the middle of the two rotating rods 3-4. One end of the ball-rod joint bearing 3-3 is threaded to the other end of the rotating rod 3-4, and the other end of the ball-rod joint bearing 3-3 is threaded to one end of the follower bearing seat 3-2. The follower bearing 3-1 is fixed on the follower bearing seat 3-2. The second spring 3-11 is hung on the second fixing collar 3-5, so that the two rotating rods 3-4 and the second spring 3-11 can form a "V" shape.

[0081] In addition, temporary limiting rings 3-10 are installed at one end of the follower bearing housing 3-2 and the other end of the rotating rod 3-4 to prevent the follower bearing from temporarily falling due to gravity. That is, before energizing, a pin is inserted into the temporary limiting ring 3-10 to prevent the follower bearing 3-1 from falling due to gravity, which would cause the generatrix of the follower bearing 3-1 to be non-parallel to the generatrix of the turntable sample 2, thus affecting the current conduction effect. Here, the generatrix refers to the outer contact surface of the columnar conductor.

[0082] In this process, the first z-axis slide 4-2 is adjusted so that the generatrix of the follower bearing 3-1 falls within the thickness range of the turntable sample 2. Then, the y-axis slide 4-3 is adjusted to move the herringbone-shaped flow guiding mechanism 3 toward the turntable sample 2. When the follower bearing 3-1 contacts the annular surface of the turntable sample 2, the pin is removed and the movement continues. As the follower bearing 3-1 continues to make tangential contact with the turntable sample 2, the angle between the two rotating rods 3-4 becomes larger and larger, and the second spring 3-11 is stretched and lengthened. At this time, the two follower bearings 3-1 make close tangential contact with the annular surface of the turntable sample 2 due to the inward pulling spring force, thus realizing the flow guiding mechanism 3 and the turntable sample 2.

[0083] Among them, due to the unavoidable machining and assembly errors on the annular surface of the turntable sample 2, especially when it is in a high-speed rotation state, these errors usually manifest as follows: Figure 8 The macroscopic runout state shown leads to point contact between the follower bearing 3-1 and the annular surface of the turntable sample 2. An electric arc occurs when current flows through this contact point, ultimately reducing the current conduction stability. To solve this problem, this invention incorporates a ball-and-rod joint bearing 3-3 between the follower bearing 3-1 and the rotating rod 3-4. When the turntable sample 2 exhibits runout error, the follower bearing and the annular surface of the turntable sample 2 can still achieve adaptive, tight tangential contact. A schematic diagram of its adaptive principle is shown below. Figure 8 As shown.

[0084] In addition, the current guiding mechanism 3 is placed symmetrically on the left and right sides of the turntable sample 2. The purpose of designing two current guiding mechanisms 3 to work at the same time is to prevent the failure of the current carrying device (i.e., the current guiding mechanism 3) on one side when guiding the current, thereby ensuring the stable conduction of current during the scratch test.

[0085] 6. Testing institutions

[0086] like Figure 9 As shown, the detection mechanism includes a busbar 24 and a current generator 21. The busbar 24 includes a current inlet 24-1, a current outlet 24-2, a set screw 24-3, a wire clamping screw 24-4, an insulating support 24-5, and a slot 24-6. The insulating support 24-5 is connected to the optical plate 1 via the wire clamping screw 24-4, serving to insulate the busbar 24 from the optical plate 1. There are four current inlets 24-1, which are connected to four second copper lugs 3-6 via busbar wires 28.

[0087] The current outlet 24-2 is connected to the negative terminal 22 of the power supply of the current generator 21 via the negative wire 23. The positive terminal 20 of the power supply of the current generator 21 is connected to the third copper lug on the bolt in the bolt assembly 7-5 via the positive wire 19. A large pulse current can be transmitted from the four second copper lugs 3-6 of the current guiding mechanism 3 to the current inlet 24-1, and the wire is tightened using the wire clamping screw 24-4. The current is transmitted from the current outlet 24-2 to the current generator 21 through the negative wire 23.

[0088] The detection mechanism also includes a current sensor and a voltage sensor. The current sensor is connected between the current generator 21 and the bus 24, and the voltage sensor is connected to the positive and negative poles of the current generator 21.

[0089] 7. Recycling organizations

[0090] The function of the recovery mechanism 18 is to retrieve and secure the scratching rod mechanism 7 that has been pushed down from the release mechanism 11, in order to prevent scratch marks from being caused by the ball sample 7-14 returning due to gravity on the scratching rod mechanism 7. This also helps to increase the stability and ease of operation of the device. The recovery mechanism 18 has a symmetrical structure, which will be described below.

[0091] like Figure 10 As shown, the recycling mechanism 18 includes a first support body 17, a forward slide, a reverse slide, a slide base 18-1, a right slide 18-3, a left slide 18-4, a third spring 18-5, a left baffle 18-6, a slide groove 18-9, a right baffle, a left cover plate 18-10, a connector 18-11, and a locking screw 18-2, wherein:

[0092] The two connectors 18-11 are bolted to the vertical plate of the first support 17; the slide base 18-1 is mounted on the two first supports 17, and the slide base 18-1 is inclined (see reference). Figure 1 By adjusting the slide seat 18-1, the angle of the recovery rod 7-2 can be adjusted to accurately recover the rubbing rod mechanism 7.

[0093] The slide base 18-1 is provided with a mounting rod 18-12. The forward slide and the reverse slide are slidably connected to the mounting rod 18-12. The left slide 18-4 is installed in the slide groove 18-9 on the forward slide, and the right slide 18-3 is installed in the slide groove 18-9 on the reverse slide. In addition, the locking screw 18-2 is installed on the forward slide or the reverse slide. It should be understood that in this invention, the locking screw 18-2 can also be set as two, and the two locking screws 18-2 can be installed on the forward slide and the reverse slide respectively.

[0094] The left baffle 18-6 is fixed on one side wall of the left slide 18-4, and the left cover plate 18-10 is fixed on the other side wall of the left slide 18-4; the right baffle is fixed on one side wall of the right slide 18-3, and the right cover plate is fixed on the other side wall of the right slide 18-3.

[0095] Linear bearings 18-7 are provided on both the left baffle 18-6 and the right baffle. Optical shafts 18-8 are provided on the left end face of the left slide 18-4 and the right end face of the right slide 18-3. The two optical shafts 18-8 are respectively passed through the two linear bearings 18-7. The third spring 18-5 is sleeved on each of the linear bearings 18-7. The opposite surfaces of the left slide 18-4 and the right slide 18-3 are provided with concave surfaces. Therefore, the entire recycling mechanism 18 is symmetrical.

[0096] The following describes the installation method for the 18 components of the recycling mechanism:

[0097] First, the third spring 18-5 is fitted onto the optical shaft 18-8, then the optical shaft 18-8 passes through the linear bearing 18-7. Simultaneously, the left slide 18-4 is placed into the slide groove 18-9. The two slide grooves 18-9 are installed downwards on the forward and reverse slides with locking screws 18-2. At this time, the left cover plate 18-10 is installed to limit the left slide 18-4. After installation, the left slide 18-4 abuts against the left cover plate 18-10 under the force of the third spring 18-5. The right side of the left slide 18-4 is provided with a concave surface and a sloping surface. When the rubbing rod mechanism 7 rotates and enters the recovery mechanism 18, the sloping surface helps to improve the acceptance of the recovery mechanism 18, while the concave surface is for stable insertion of the rubbing rod mechanism 7.

[0098] Before the scratching test, i.e. before the scratching rod mechanism 7 enters the recovery mechanism 18, adjust the forward and reverse slides to drive the left and right slides inward until the diameter of the cylinder that can be clamped by the concave surfaces of the left and right slides is smaller than the diameter of the rod 7-2. At this time, tighten the locking screw 18-2 (i.e., the locking screw 18-2 abuts against the corresponding mounting rod 18-12 after being screwed in) to prevent the forward and reverse slides from moving accidentally. When the rod 7-2 rotates and enters the recovery mechanism 18 under the gravity of the open weight 7-4, the left slide 18-4 and right slide 18-3 of the recovery mechanism 18 open to both sides first after being subjected to force. Then, when the rod 7-2 enters the concave surfaces of the two slides, the third spring 18-5 rebounds and the two slides lock the rod 7-2, completing the recovery.

[0099] If multiple scratching tests are required, first loosen the locking screw 18-2, and adjust the forward and reverse slides to drive the left slide 18-4 and the right slide 18-3 to move outward in opposite directions until the diameter of the clampable cylinder formed by the concave surfaces of the two slides is greater than the diameter of the rod 7-2. At this point, the rod 7-2 can be removed, and the torque motor 12 can drive the entire scratching rod mechanism 7 back into the release mechanism 11.

[0100] The release mechanism 11 and the retrieval mechanism 18 have the same structure. However, the slide base 18-1 in the release mechanism 11 is horizontally inverted. Alternatively, the release mechanism 11 and the retrieval mechanism 18 can be designed with some differences. For example, the release mechanism 11 may not have a connector 18-11; instead, the slide base 18-1 in the release mechanism 11 may have a threaded hole on its end face, allowing it to be directly connected to the support body of the release mechanism 11 by screws. This results in the entire release mechanism 11 being positioned downwards (see reference). Figure 1 ).

[0101] The principles of this invention will now be briefly explained.

[0102] like Figure 11 As shown, during the rubbing process, the pulse current is generated by the current generator 21 (i.e., Figure 11 The high current generator in the middle generates the current, which starts from the positive terminal 20 of the power supply, passes through the positive terminal wire 19, and the scrubbing rod mechanism 7 (i.e., Figure 11 The first copper lug 7-12, ball clamp 7-13, ball sample 7-14, turntable sample 2, and flow guiding mechanism 3 (i.e., the scrubbing rod device) on the device. Figure 11 The current-carrying device, current-carrying wire 28, current-carrying bus 24, negative wire 23 and positive power supply 20 are then transmitted back to the current generator 21 to form a current-carrying circuit.

[0103] Figure 12 The diagram shown illustrates the basic principle of a single-shot simulated armature-track force-electric transient impact-scratch test. A brief description follows:

[0104] The rubbing pair consists of a ball sample 7-14 mounted on the rubbing rod mechanism 7 and a turntable sample 2 driven to rotate by a high-speed motor 29. First, the rubbing rod mechanism 7 is fixed on the release mechanism 11, which is the initial position before the rubbing test begins. A lifting platform can be used to control the length from the center of the rotating shaft 16 to the ball sample 7-14 to be slightly greater than the length from the center of the rotating shaft 16 to the surface of the turntable sample 2. The purpose is to ensure that the rubbing pair has a transient force-electric impact process during the rubbing process, and at the same time, it is beneficial to improve the current carrying stability during rubbing.

[0105] Select the mass of the weight 7-4 on the opening of the rubbing rod mechanism 7 as needed to control the impact potential energy during the rubbing process. According to the magnitude of the normal load and its curve characteristics in the rubbing test, select a suitable first spring 7-8-1 and install it into the elastic component 7-6. The purpose is threefold: first, to simulate the time-varying curve characteristics of the normal load between the armature-track rubbing pair during electromagnetic launch; second, to make the ball sample 7-14 squeeze across the surface of the turntable sample 2 under the impact potential energy, forming a complete and stable transient force-electric impact effect, preventing damage to the rubbing rod mechanism 7 or the turntable sample 2 due to lack of buffer during the rubbing process; and third, to ensure that the ball sample 7-14 can stably transfer the current to the turntable sample 2 at the moment of rubbing.

[0106] Secondly, the electromagnetic clutch 14 is de-energized to eliminate the torque transmission relationship between the torque motor 12 and the scraping rod mechanism 7. The current generator 21 is activated, providing a large pulse current to the current-carrying circuit. The release mechanism 11 knob is adjusted to release the scraping rod mechanism 7. At this point, the scraping rod mechanism 7 accelerates downwards around the rotating shaft 16 under the influence of the weight; this is the acceleration position. Then, the ball sample 7-14, under the action of the elastic component 7-6, achieves a very short-duration impact compression with the turntable sample 2, thus realizing high-speed electromechanical transient impact scraping. The high speed is reflected in the fact that the rotation direction of the turntable sample 2 is opposite to the downward rotation direction of the scraping rod mechanism 7; their speeds can be superimposed, further increasing the scraping speed between the ball sample 7-14 and the turntable sample 2 on top of the original high speed generated by the high-speed motor 29. Finally, after the ball sample 7-14 of the rubbing rod mechanism 7 passes over the turntable sample 2, it continues to rotate around the rotating shaft 16 by inertia. At this time, it will impact and enter the recovery mechanism 18 and be fixed and recovered. This completes the single test of armature-track force transient impact rubbing.

[0107] Alternatively, if multiple scratch tests are to be performed after a single scratch test, the specific implementation method is as follows: First, the electromagnetic clutch 14 is energized, allowing the torque motor 12 to transmit torque from the electromagnetic clutch 14 to the rod 7-2, and the retraction mechanism 18 is adjusted to release its clamping fixation on the scratching rod mechanism 7. Then, the torque motor 12 is turned on, driving the scratching rod mechanism 7 to rotate toward the release mechanism 11.

[0108] It should be noted that, before the previous test, the length from the center of the rotating shaft 16 to the ball sample 7-14 was greater than the vertical distance from the center of the rotating shaft 16 to the turntable sample 2. To prevent the ball sample 7-14 from damaging the original scratch marks on the surface of the turntable sample 2 when the scratching rod mechanism 7 returns to the release mechanism 11, the corresponding lifting platform (i.e., raising the x-axis slide 6 on the second z-axis slide) needs to be raised before starting the torque motor 12. After the ball sample 7-14 passes the turntable sample 2, the lifting platform can be adjusted so that the total length of the scratching rod mechanism 7 is greater than the vertical distance from the center of the rotating shaft 16 to the turntable sample 2, preparing for the next scratching test. The scratching rod mechanism 7 returns to the release mechanism 11 under the drive of the torque motor 12.

[0109] The turntable specimen 2 is designed with a large diameter, allowing it to be reused repeatedly for both single and multiple scratch tests. This means the scratch radius from the scratch point to the center of the turntable specimen 2 can be reduced, and the preset linear velocity can be achieved by increasing the rotational speed of the turntable specimen 2. The specific implementation method is as follows: Figure 1 As shown, after the scratch test, if a new scratch radius is desired, the x-axis slide 6 can be moved a specified distance in the positive x-direction. The advantages are: scratch tests can continue without replacing the turntable sample 2, significantly saving material costs and improving testing efficiency.

[0110] In addition, when preparing for the next scratch test and needing to replace the ball sample 7-14, the present invention can also remove the ball sample 7-14 while the entire scratch rod mechanism 7 is still on the recovery mechanism 18, and then install a new ball sample 7-14 when the entire scratch rod mechanism 7 rotates to the release mechanism 11, in preparation for the next test. It should be understood that when performing continuous tests, the entire turntable sample 2 does not need to be replaced.

[0111] In summary, considering the unique force-electric transient impact "scratching" process of the armature-track, as well as its economy, ease of operation, current-carrying stability, and in-situ observation capabilities, this invention provides a test device for simulating the force-electric transient impact scratching of the armature-track. This device can simulate single and multiple consecutive scratches of the armature-track, and can observe the state of the friction pair in situ as well as measure friction force, friction coefficient, current, voltage, and contact resistance signals.

[0112] The above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention in any way. Although the present invention has been disclosed above with reference to preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art can make some modifications or alterations to the above-disclosed technical content to create equivalent embodiments without departing from the scope of the technical solution of the present invention. Any simple modifications, equivalent changes and alterations made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solution of the present invention shall still fall within the scope of the technical solution of the present invention.

Claims

1. A test apparatus for simulating armature-track force-electric transient impact and friction, wherein, The test apparatus includes an optical plate (1) and a turntable mechanism, a drive mechanism, and a scrubbing rod mechanism (7) mounted on the optical plate (1), wherein, The driving mechanism is used to drive the rubbing rod mechanism (7) to rub on the turntable mechanism. The rubbing rod mechanism (7) includes a rod (7-2), an elastic component, a three-dimensional force sensor (7-8), an insulating double-headed flange (7-9), a connecting flange (7-10), a lock nut (7-11), a first copper lug (7-12), a ball clamp (7-13), and a ball sample (7-14) connected in sequence. One end of the rod (7-2) is connected to the driving mechanism. The turntable mechanism includes a turntable sample (2), a rotating shaft (36), an insulating disk (37), an insulating cylindrical pin (38), and an insulating rhomboid pin (39). The rotating shaft (36) passes through the optical plate (1) and is connected by a rotating mechanism at the bottom of the optical plate (1). The insulating disk (37) is detachably connected to the rotating shaft (36). The insulating cylindrical pin (38) and the insulating rhomboid pin (39) are installed on the end face of the rotating shaft (36). The insulating disk (37) is installed on the insulating cylindrical pin (38) and the insulating rhomboid pin (39). The elastic component includes a first spring (7-6-1), a hollow shaft (7-6-2), and a sliding block (7-6-4). One end of the hollow shaft (7-6-2) is provided with four through keyways arranged in a ring, and a limiting screw (7-6-3) is installed in the keyway. One end of the sliding block (7-6-4) is provided with four keys arranged in a ring. One end of the sliding block (7-6-4) is inserted into the hollow shaft (7-6-2) and fixed to the hollow shaft (7-6-2) by the keyways, keys and limiting screw (7-6-3). The other end of the sliding block (7-6-4) is flange-shaped and connected to one end of the insulating double-headed flange (7-9). The other end of the hollow shaft (7-6-2) is flange-shaped and connected to the other end of the rod (7-2) by bolts.

2. The test apparatus for simulating armature-track electro-electric transient impact and friction according to claim 1, wherein, The test apparatus also includes two flow guiding mechanisms (3), which are symmetrically arranged on both sides of the turntable mechanism. The flow guiding mechanism (3) includes a yz-axis slide (4), an insulating plate (3-8), and a flow guiding assembly. The yz-axis slide (4) includes a y-axis slide (4-3) and a first z-axis slide (4-2), which are mounted on the optical flat plate (1) by a screw structure. The first z-axis slide (4-2) is mounted on the y-axis slide (4-3). The insulating plate (3-8) is connected to the upper end face of the first z-axis slide (4-2) by screws. The flow guiding assembly is mounted on the upper end face of the insulating plate (3-8).

3. The test apparatus for simulating armature-track electro-electric transient impact and friction according to claim 2, wherein, The flow guiding assembly includes a follower bearing (3-1), a follower bearing seat (3-2), a ball-and-rod joint bearing (3-3), a second fixing collar (3-5), a second copper lug (3-6), an end face bearing (3-7), a smooth rod screw (3-9), a second spring (3-11), two temporary limiting rings (3-10), and two rotating rods (3-4). The upper end face of one side of the insulating plate (3-8) is provided with a threaded hole. Above the threaded hole, the end face bearing (3-7), one end of the rotating rod (3-4) and the second copper lug (3-6) are placed concentrically and fixed by the smooth rod screw (3-9). The second fixing collar (3-5) is fitted and fixed in the middle of the two rotating rods (3-4). One end of the ball-rod spherical bearing (3-3) is threaded to the other end of the rotating rod (3-4), and the other end of the ball-rod spherical bearing (3-3) is threaded to one end of the follower bearing seat (3-2). The follower bearing (3-1) is fixed on the follower bearing seat (3-2). The second spring (3-11) is hung on the second fixing collar (3-5). The temporary limiting ring (3-10) is installed at one end of the follower bearing seat (3-2) and the other end of the rotating rod (3-4).

4. The test apparatus for simulating armature-track electro-electric transient impact and friction according to claim 1, wherein, The test apparatus further includes a recovery mechanism (18) and a release mechanism (11). The recovery mechanism (18) includes a first support (17), a forward slide, a reverse slide, a slide base (18-1), a right slide (18-3), a left slide (18-4), a third spring (18-5), a left baffle (18-6), a slide groove (18-9), a right baffle, a left cover plate (18-10), and a connector (18-11). The two connectors (18-11) are bolted to the vertical plate of the first support (17); the slide base (18-1) is mounted on the two first supports (17) and the slide base (18-1) is inclined. The slide base (18-1) is provided with a mounting rod (18-12). The positive slide and the negative slide are slidably connected to the mounting rod (18-12). The left slide (18-4) is installed in the slide groove (18-9) on the positive slide, and the right slide (18-3) is installed in the slide groove (18-9) on the negative slide. The left baffle (18-6) is fixed on one side wall of the left slide (18-4), and the left cover plate (18-10) is fixed on the other side wall of the left slide (18-4); the right baffle is fixed on one side wall of the right slide (18-3), and the right baffle is fixed on the other side wall of the right slide (18-3); Linear bearings (18-7) are provided on both the left baffle (18-6) and the right baffle. Optical shafts (18-8) are provided on the left end face of the left slide (18-4) and the right end face of the right slide (18-3). The two optical shafts (18-8) are respectively passed through the two linear bearings (18-7). The third spring (18-5) is sleeved on each of the linear bearings (18-7). The left slide (18-4) and the right slide (18-3) are both provided with concave surfaces on their opposite surfaces; The release mechanism (11) and the recovery mechanism (18) have the same structure, wherein the slide base (18-1) in the release mechanism (11) is horizontally inverted.

5. The test apparatus for simulating armature-track electro-electric transient impact and friction according to claim 4, wherein, The recycling mechanism (18) also includes a locking screw (18-2), wherein, The locking screw (18-2) is installed on the positive slide or the negative slide.

6. The test apparatus for simulating armature-track electro-electric transient impact and friction according to claim 1, wherein, The drive mechanism includes a drive base (10), a rotating shaft (16), a bearing housing (15), a torque motor (12), a first transmission belt (13), and an electromagnetic clutch, wherein, The drive base (10) is mounted on a frame provided on the upper surface of the optical flat plate (1). The torque motor (12) and the bearing seat (15) are both mounted on the drive base (10). The rotating shaft (16) is connected to the electromagnetic clutch (14) via the bearing seat (15). The limiting ring (14-1) provided on the electromagnetic clutch (14) is connected to the bearing seat (15) by fixing screws (14-2) to limit the rotation of the support part of the electromagnetic clutch (14); The torque motor (12) transmits torque to the electromagnetic clutch (14) via the first transmission belt (13).

7. The test apparatus for simulating armature-track electro-electric transient impact and friction according to claim 3, wherein, The rubbing rod mechanism (7) further includes an open weight (7-4) and a bolt assembly (7-5), wherein, The other end of the rod (7-2) is provided with two first fixed collars (7-3), and the opening of the open weight (7-4) surrounds the other end of the rod (7-2) and the open weight (7-4) is located between the two first fixed collars (7-3). The bolt assembly (7-5) includes a bolt and a nut. The bolt is inserted into an opening, and the head of the bolt contacts the bottom of the open weight (7-4). The nut is installed at the tail of the bolt and contacts the top of the open weight (7-4). A third copper lug is installed on both the bolt and the nut. The third copper lug on the nut is connected to a second copper lug (3-6) via a wire.

8. The test apparatus for simulating armature-track electro-electric transient impact and friction according to claim 7, wherein, The test apparatus further includes a detection mechanism, which comprises a busbar (24) and a current generator (21). The busbar (24) includes a current inlet (24-1), a current outlet (24-2), a set screw (24-3), a wire clamping screw (24-4), an insulating support (24-5), and a slot (24-6). The insulating support base (24-5) is connected to the optical plate (1) by a wire screw (24-4). There are four current inlets (24-1), and the four current inlets (24-1) are connected to the four second copper lugs (3-6) by a busbar (28). The current outlet (24-2) is connected to the negative power supply (22) of the current generator (21) via the negative wire (23), and the positive power supply (20) of the current generator (21) is connected to the third copper lug on the bolt via the positive wire (19).

9. The test device for simulating armature-track force-electric transient impact and friction according to claim 1, wherein the rotating mechanism comprises a high-speed motor (29), a large pulley (33), a second transmission belt (34), and a small pulley (35), wherein, The output end of the high-speed motor (29) is connected to the large pulley (33), the large pulley (33) is connected to the small pulley (35) through the second transmission belt (34), and the small pulley (35) is connected to the rotating shaft (36).

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