Automatic determination device for quantum bit parameters

Abstract

The present invention provides an automated device for determining quantum bit parameters, comprising a guidance module and an execution module. The guidance module is used to determine the quantum bits to be measured on a quantum chip that require parameter determination tasks, as well as the parameter determination tasks required for the quantum bits to be measured. The execution module is used to receive the parameter determination tasks, execute them according to a directed acyclic graph corresponding to the parameter determination tasks, and return the results to the guidance module. The nodes of the directed acyclic graph represent the parameters of the quantum bits to be measured, and the directed edges of the directed acyclic graph represent the dependencies between the parameters. By constructing directed acyclic graphs for different parameter determination tasks, more complex and more reasonable test tasks can be constructed.

Description

Technical Field

[0001] The present invention belongs to the field of quantum computing technology, and in particular relates to a device for automatically determining quantum bit parameters. Background Art

[0002] The existing automated testing system for quantum chips has achieved certain results in improving quantum chip testing efficiency and reducing labor costs. It fully automates the complex parameter setting, recording, updating, and storage functions, and realizes the functions of freely combining nodes and automatically analyzing experimental results.

[0003] While existing automated testing systems have achieved some success, they are also increasingly facing challenges. Test tasks are stored in linked lists, allowing only pre-configured nodes to complete test characterization of quantum chips. Consequently, the execution of test tasks is unidirectional and unable to adapt to more complex testing tasks.

[0004] Therefore, it is necessary to propose an automatic determination device for quantum bit parameters to solve the problem that the existing automated testing system can only complete the test characterization of quantum chips according to pre-set nodes, and to build a more complex and more reasonable test task process.

[0005] It should be noted that the information disclosed in the background technology section of this application is only intended to deepen the understanding of the general background technology of this application, and should not be regarded as an admission or any form of implication that the information constitutes prior art already known to those skilled in the art. Summary of the Invention

[0006] The purpose of the present invention is to provide an apparatus and method for automatically determining quantum bit parameters, and a quantum computer, so as to solve the problem in the prior art that the automated testing and calibration system can only complete the test characterization of quantum chips according to pre-set nodes and cannot adapt to more complex testing tasks, so as to construct a more complex and more reasonable testing task process.

[0007] To achieve the above objectives, in a first aspect, the present invention provides an apparatus for automatically determining quantum bit parameters, comprising:

[0008] A guiding module is used to determine the quantum bits to be measured on the quantum chip that need to perform parameter determination tasks and the parameter determination tasks that need to be performed on the quantum bits to be measured;

[0009] An execution module is configured to receive the parameter determination task, execute the task according to a directed acyclic graph corresponding to the parameter determination task, and return a result to the guidance module, wherein the nodes of the directed acyclic graph represent the parameters of the sub-bits to be measured, and the directed edges of the directed acyclic graph represent the dependencies between the parameters.

[0010] Preferably, the execution module includes:

[0011] A directed acyclic graph database, comprising a first database storing a directed acyclic graph corresponding to the parameter determination task;

[0012] a task receiving unit, configured to receive the parameter determination task and obtain a directed acyclic graph corresponding to the parameter determination task from the first database;

[0013] A directed acyclic graph traversal unit is used to execute the parameter determination task according to the directed acyclic graph corresponding to the parameter determination task, and obtain parameters corresponding to each of the nodes.

[0014] Preferably, the parameter determination task includes a test task and a calibration task, and the directed acyclic graph stored in the first database includes a first type of directed acyclic graph corresponding to the test task and a second type of directed acyclic graph corresponding to the calibration task.

[0015] Preferably, the execution module further includes:

[0016] A decision-making unit is used to determine the theoretical expected value of the task at each node according to the parameters and the obtained parameter acquisition criteria, and judge whether the current node is normal based on the set judgment conditions. If it is normal, enter the subsequent node of the current node; if it is not normal, determine that the current node is abnormal;

[0017] The backtracking unit is used to backtrack to the target node when an exception occurs at a certain node during the execution of the parameter determination task. The target node is the root node that causes the node to be abnormal in the corresponding directed acyclic graph.

[0018] Preferably, the backtracking unit is also used to backtrack to the dependent predecessor node and re-execute when an exception occurs at a certain node during the execution of the parameter determination task. If the predecessor node is normal, the node where the exception occurs is executed again. If the exception occurs again, an error is output; if the predecessor node is abnormal, backtracking continues.

[0019] Preferably, the decision unit is used to construct a first formula based on the theoretical expected value and the acquired parameters, and the first formula is:

[0020]

[0021] Among them, R 2is the degree of offset, y fit is the theoretical expected value, y raw is the parameter obtained, is the average value of the parameter corresponding to the current node;

[0022] The offset degree is obtained based on the first formula, and a criterion is obtained based on the offset degree.

[0023] Preferably, the directed acyclic graph database further includes a second database, and the second database is used to store historical data of corresponding parameters of each node obtained after the sub-bit to be measured executes the directed acyclic graph.

[0024] Preferably, the decision unit further adjusts the judgment condition according to the historical data stored in the second database.

[0025] Preferably, the directed acyclic graph database also includes a third database, which is used to store processing strategies for exceptions. When a node is judged to be abnormal, the decision unit searches the third database to see whether it contains a processing strategy for the exception. If so, the strategy is executed; if not, the backtracking unit performs backtracking.

[0026] Preferably, the guiding module includes:

[0027] a task input unit, configured to receive input of a sub-bit to be measured for which a parameter determination task needs to be performed and the parameter determination task to be performed on the sub-bit to be measured;

[0028] The quantum bit database is used to receive the execution result of the parameter determination task returned by the execution module.

[0029] Preferably, the quantum bit database also stores information of each quantum bit on a quantum chip, and the information of each quantum bit is independent of each other.

[0030] Preferably, the guiding module further includes:

[0031] Monitoring policy library, used to store monitoring policies;

[0032] The monitoring unit is used to periodically execute the monitoring strategy in the monitoring strategy library, and if the execution result of the monitoring strategy is abnormal, send a specific calibration task to the execution module.

[0033] Preferably, the execution module further includes:

[0034] a construction unit, configured to construct a directed acyclic graph corresponding to the parameter determination task when the task receiving unit cannot find the directed acyclic graph corresponding to the parameter determination task from the first database;

[0035] A configuration unit configures the directed acyclic graph constructed by the construction unit into the first database.

[0036] In a second aspect, the present invention provides a quantum computer comprising the apparatus for automatically determining quantum bit parameters provided in the first aspect of the present invention.

[0037] In a third aspect, the present invention provides a method for automatically determining quantum bit parameters, comprising:

[0038] Determining a quantum bit to be measured on the quantum chip that needs to perform a parameter determination task and a parameter determination task that needs to be performed on the quantum bit to be measured;

[0039] A directed acyclic graph corresponding to the task is determined to be executed according to the parameters and a result is obtained, wherein the nodes of the directed acyclic graph represent the parameters of the sub-bits to be measured, and the directed edges of the directed acyclic graph represent the dependency relationships between the parameters.

[0040] In a fourth aspect, the present invention provides a readable storage medium having a computer program stored thereon, which, when executed, can implement the method for automatically determining the quantum bit parameters provided in the third aspect of the present invention.

[0041] Compared with the prior art, the technical solution of the present invention has the following beneficial effects:

[0042] The automated quantum bit parameter determination device provided by the present invention includes a guidance module and an execution module. The guidance module is used to determine the quantum bits to be measured on the quantum chip that require parameter determination tasks and the parameter determination tasks required for the quantum bits to be measured. The execution module executes the parameter determination tasks according to the directed acyclic graph corresponding to the directed acyclic graph and returns the results to the guidance module. The nodes of the directed acyclic graph represent the parameters of the quantum bits to be measured, and the directed edges of the directed acyclic graph represent the dependencies between the parameters. By constructing directed acyclic graphs for different parameter determination tasks, more complex and more reasonable testing tasks can be constructed.

[0043] The method for automatically determining quantum bit parameters, quantum computer, and readable storage medium proposed in the present invention belong to the same inventive concept as the device for automatically determining quantum bit parameters provided in the present invention, and therefore have the same beneficial effects, and will not be described in detail here. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0045] Figure 1 1 is a schematic structural diagram of an apparatus for automatically determining quantum bit parameters provided by one embodiment of the present invention;

[0046] Figure 2 is an exemplary directed acyclic graph provided by an embodiment of the present invention;

[0047] Figure 3 A schematic flow chart of a method for automatically determining quantum bit parameters provided by one embodiment of the present invention. DETAILED DESCRIPTION

[0048] The following describes specific embodiments of the present invention in more detail with reference to schematic diagrams. The advantages and features of the present invention will become more apparent from the following description and claims. It should be noted that the drawings are greatly simplified and not to exact scale, and are intended solely to facilitate and clearly illustrate the embodiments of the present invention.

[0049] In the description of the present invention, it should be understood that the terms "center", "up", "down", "left", "right", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as a limitation on the present invention.

[0050] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of the technical features indicated. Thus, a feature specified as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, "plurality" means at least two, such as two, three, etc., unless otherwise specifically defined.

[0051] An embodiment of the present invention provides an automatic determination device for quantum bit parameters, see Figure 1 , Figure 1 A schematic diagram of the apparatus for automatically determining qubit parameters provided in this embodiment, the apparatus comprising:

[0052] A guidance module is used to determine the quantum bits to be measured on the quantum chip that need to perform parameter determination tasks and the parameter determination tasks that need to be performed on the quantum bits to be measured;

[0053] The quantum chip has multiple quantum bits, each of which has a series of parameters, such as bit frequency, bit relaxation time, bit decoherence time, fidelity of single-gate operation, etc. Before using the quantum chip, we need to perform a series of test tasks on the quantum chip to obtain a series of parameters for each quantum bit. In addition, since quantum bits are extremely susceptible to interference from environmental noise, which causes the quantum bit parameters to drift, we need to perform calibration tasks on the drifting quantum bit parameters.

[0054] and an execution module, configured to receive the parameter determination task, execute the task according to a directed acyclic graph corresponding to the parameter determination task, and return a result to the guidance module, wherein the nodes of the directed acyclic graph represent the parameters of the sub-bits to be measured, and the directed edges of the directed acyclic graph represent the dependencies between the parameters.

[0055] The automated qubit parameter determination device provided by the present invention organizes the parameters required for executing a task into a directed acyclic graph (DAG) according to a specific order and the dependencies between the parameters. This process then transforms the test or calibration task for the qubit to be measured into a traversal of the DAG. When the task reaches a node, physical experiments and data analysis are performed to obtain the parameters corresponding to the node.

[0056] It should be noted that different parameter determination tasks correspond to different directed acyclic graphs. By constructing directed acyclic graphs for different parameter determination tasks, more complex and more reasonable testing tasks can be constructed. Corresponding directed acyclic graphs are also constructed for calibration tasks, thereby enabling parameter calibration of quantum chips.

[0057] Specifically, the execution module includes a directed acyclic graph database, a task receiving unit and a directed acyclic graph traversal unit; the directed acyclic graph database includes a first database storing a directed acyclic graph corresponding to the parameter determination task; the task receiving unit is used to receive the parameter determination task and obtain the directed acyclic graph corresponding to the parameter determination task from the first database; the directed acyclic graph traversal unit is used to execute the parameter determination task according to the directed acyclic graph corresponding to the parameter determination task, and obtain the parameters corresponding to each of the nodes.

[0058] The parameter determination task includes a test task and a calibration task. The directed acyclic graph stored in the first database includes a first-type directed acyclic graph corresponding to the test task and a second-type directed acyclic graph corresponding to the calibration task. By constructing directed acyclic graphs corresponding to the parameter task and the calibration task, respectively, testing and calibration of quantum bits are achieved.

[0059] The directed acyclic graph of the test task and the calibration task is stored in the first database, and the directed acyclic graph corresponding to the parameter determination task is obtained through the task acquisition unit. The directed acyclic graph traversal unit executes the task according to the directed acyclic graph, thereby realizing the storage of the directed acyclic graph and the conversion from the task to the directed acyclic graph.

[0060] Additionally, the execution module further includes a decision-making unit and a backtracking unit.

[0061] The decision unit is used to determine the theoretical expected value of the task at each node based on the parameters and the obtained parameter acquisition criteria, and judge whether the current node is normal based on the set judgment conditions. If it is normal, enter the subsequent node of the current node; if it is not normal, determine that the current node is abnormal.

[0062] For example, if the corresponding parameter of a node is bit frequency, the bit frequency obtained when the task is executed at the node based on the theoretical expected value of the bit frequency of the qubit to be measured and the parameter determination criterion can be used to determine the difference between the theoretical expected value and the obtained bit frequency. The judgment condition is set to not allow the difference between the two to exceed a specific value, thereby determining whether the bit frequency obtained by the current node is normal. It should be noted that there are many parameters for quantum bits, and different methods for obtaining criteria are used for different parameters. Moreover, the judgment conditions for each quantum bit with the same parameters are different, so this is not limited here.

[0063] For example, the decision unit may adopt a goodness of fit method to obtain the criterion, specifically:

[0064] A first formula is constructed based on the theoretical expected value and the obtained parameters, where the first formula is:

[0065]

[0066] Among them, R 2 is the degree of offset, y fit is the theoretical expected value, y raw is the parameter obtained, is the average value of the parameter corresponding to the current node;

[0067] The offset degree is obtained based on the first formula, and a criterion is obtained based on the offset degree.

[0068] It should be noted that the R 2 The closer the value is to 1, the smaller the offset is.

[0069] The backtracking unit is used to backtrack to a target node when an exception occurs at a certain node during the execution of the parameter determination task. The target node is a root node in the corresponding directed acyclic graph that causes the node to be abnormal.

[0070] For example, reference Figure 2 , Figure 2 An exemplary directed acyclic graph is provided for this embodiment. Assuming that the parameters determine that an exception occurs when the task is executed to node C, it is necessary to trace back to the root node that causes the exception. The root node may be B1, or it may be A, or it may be the predecessor node of A. We can trace back one node at a time until we find the root node that causes the exception of the node, or we can derive a predecessor node that often causes the exception of the node based on a large amount of statistical experience. For example, a large amount of statistical experience shows that the node that often causes the exception of node C is node A. Then, when an exception occurs in node C, we can directly jump to the predecessor node A.

[0071] By combining the decision unit with the backtracking unit, it is possible to automatically backtrack to the node that caused the error when an error occurs during the directed acyclic graph traversal process. The automated testing system in the existing technology can only report an error and exit when encountering an exception, and does not have the backtracking function.

[0072] Specifically, the backtracking unit will backtrack to the predecessor node on which it depends and re-execute the physical experiment and data analysis to obtain the corresponding parameters of the predecessor node. If the predecessor node is normal, the node where the exception occurred will be executed again. If it is abnormal again, an error will be output; if the predecessor node is abnormal, backtracking will continue.

[0073] The backtracking unit re-executes physical experiments and data analysis on the previous node it depends on. If this execution shows that the previous node is normal, the physical experiment and data analysis are re-executed on the node where the abnormality occurs. If it is normal this time, the abnormality of the current node has been calibrated. If the abnormality still occurs this time, the abnormal system of the current node cannot be calibrated and an error will be output. The quantum chip automatic testing device in the prior art only performs physical experiments and data analysis in a fixed order and cannot backtrack when encountering an abnormality. The present invention can also calibrate the node where the abnormality occurs through the backtracking unit, thereby improving the degree of automation. In addition, even if the calibration of the backtracking unit fails, the physical experiment and data analysis of the abnormal node are performed again by using the backtracking function. These data can be saved, which is convenient for R&D personnel to compare historical data to determine the real cause of the node abnormality.

[0074] Additionally, the directed acyclic graph database further includes a second database for storing historical data of parameters corresponding to each node obtained after the sub-bit to be measured executes the directed acyclic graph. Furthermore, the decision unit can adjust the judgment condition based on the historical data stored in the second database.

[0075] The second database records the historical data of the automatic quantum bit parameter determination device performing various test tasks or calibration tasks, and continuously adjusts the judgment conditions based on the historical data, so that the test tasks and calibration tasks can be run more smoothly and automatically, reducing or even eliminating the need for human intervention, thereby improving the operating stability and degree of automation of the automatic quantum bit parameter determination device.

[0076] In addition, the directed acyclic graph database also includes a third database, which is used to store strategies for handling exceptions. When a node is judged to be abnormal, the decision unit can first search the third database to see whether there is a strategy for handling the current abnormal state. If so, the strategy is executed; if not, the backtracking unit performs backtracking.

[0077] By establishing the exception handling strategy library, frequent backtracking can be avoided, and more exception handling problems can be solved in conjunction with backtracking.

[0078] The guidance module includes a task input unit and a quantum bit database. The task input unit is used to receive input of the quantum bits to be measured that need to perform tasks and the parameter determination tasks that need to be performed on the quantum bits to be measured. The parameter determination tasks include test tasks or calibration tasks. The quantum bit database is used to receive the execution results of the parameter determination tasks returned by the execution module.

[0079] Additionally, the quantum bit database is also used to store information about each quantum bit on the quantum chip, and the information about each quantum bit is independent of each other.

[0080] The information of each quantum bit on the quantum chip is managed through the quantum bit database, making it easy to find the information of a certain quantum bit.

[0081] In addition, the execution module also includes a construction unit and a configuration unit. The construction unit is used to construct a directed acyclic graph corresponding to the parameter determination task when the task receiving unit cannot find the directed acyclic graph corresponding to the parameter determination task from the first database; the configuration unit is used to configure the directed acyclic graph constructed by the construction unit into the first database.

[0082] Through the configuration unit and the construction unit, the directed acyclic graph in the first database is updated and expanded, so that the automatic determination device of the quantum bit parameters can achieve more and more complex testing tasks and calibration tasks.

[0083] In addition, the guidance module also includes a monitoring strategy library and a monitoring unit. The monitoring strategy library is used to store monitoring strategies. The monitoring unit is used to periodically execute the monitoring strategies in the monitoring strategy library. If the execution result of the monitoring strategy is abnormal, a specific calibration task is sent to the execution module.

[0084] Since the performance of quantum bits is easily disturbed by environmental noise, it is necessary to calibrate their parameters when they drift. Through the monitoring unit and the monitoring strategy library, a monitoring strategy is regularly executed on the quantum chip to determine whether the parameters of a certain quantum bit drift. If drift occurs, the corresponding calibration task is executed, which can realize the automatic calibration of quantum bits on the quantum chip. The existing quantum chip automatic testing system can only be used for testing and cannot automatically calibrate quantum bits.

[0085] In summary, the automatic determination device for quantum bit parameters provided by the present invention includes a guidance module and an execution module. The guidance module is used to determine the quantum bits to be measured on the quantum chip that need to perform parameter determination tasks and the parameter determination tasks that need to be performed on the quantum bits to be measured; the execution module is used to receive the parameter determination tasks, execute according to the directed acyclic graph corresponding to the parameter determination tasks, and return the results to the guidance module. The nodes of the directed acyclic graph represent the parameters of the quantum bits to be measured, and the directed edges of the directed acyclic graph represent the dependencies between the parameters. The technical solution of the present invention can construct more complex and more reasonable test tasks by constructing directed acyclic graphs for different tasks, and also construct corresponding directed acyclic graphs for calibration tasks, thereby realizing parameter calibration of the quantum chip.

[0086] Based on the same inventive concept, the present invention provides a quantum computer that includes the apparatus for automatically determining qubit parameters provided by the present invention. This apparatus and the apparatus for automatically determining qubit parameters provided by the present invention share the same inventive concept and have the same beneficial effects, so they will not be described in detail here.

[0087] Based on the same inventive concept, the present invention provides a method for automatically determining quantum bit parameters, see Figure 3 , Figure 3 A flowchart of the method for automatically determining quantum bit parameters provided by the present invention, the method comprising:

[0088] Determining a quantum bit to be measured on the quantum chip that needs to perform a parameter determination task and a parameter determination task that needs to be performed on the quantum bit to be measured;

[0089] A directed acyclic graph corresponding to the task is determined to be executed according to the parameters and a result is obtained, wherein the nodes of the directed acyclic graph represent the parameters of the sub-bits to be measured, and the directed edges of the directed acyclic graph represent the dependency relationships between the parameters.

[0090] Based on the same inventive concept, the present invention also provides a readable storage medium having a computer program stored thereon, which, when run, can implement the method for automatically determining the quantum bit parameters provided by the present invention.

[0091] The automatic testing and calibration method for quantum bits provided by the present invention has the same beneficial effects as the automatic determination device for quantum bit parameters provided by the present invention, and will not be described in detail here.

[0092] The above description is only a description of the preferred embodiments of the present invention and does not limit the scope of the present invention. Any changes and modifications made by ordinary technicians in the field of the present invention based on the above disclosure shall fall within the scope of protection of the claims.

Claims

1. An automatic determination device for quantum bit parameters, characterized in that: include: A guidance module is used to determine the quantum bits to be measured on the quantum chip that need to perform parameter determination tasks and the parameter determination tasks to be performed on the quantum bits to be measured; wherein the parameter determination tasks include test tasks and calibration tasks; an execution module, configured to receive the parameter determination task, execute the task according to a directed acyclic graph corresponding to the parameter determination task, and return a result to the guidance module, wherein the nodes of the directed acyclic graph represent the parameters of the sub-bits to be measured, and the directed edges of the directed acyclic graph represent the dependencies between the parameters; Wherein, the execution module includes: A directed acyclic graph database, comprising a first database storing a directed acyclic graph corresponding to the parameter determination task, a second database storing historical data of parameters corresponding to each node obtained after the sub-bit to be measured executes the directed acyclic graph, and a third database storing strategies for handling exceptions; wherein different parameter determination tasks correspond to different directed acyclic graphs; a task receiving unit, configured to receive the parameter determination task and obtain a directed acyclic graph corresponding to the parameter determination task from the first database; A directed acyclic graph traversal unit is used to perform the parameter determination task according to the directed acyclic graph corresponding to the parameter determination task, obtain the parameters corresponding to each of the nodes and send them to the guidance module.

2. The automatic determination device for quantum bit parameters according to claim 1, characterized in that: The directed acyclic graphs stored in the first database include a first type of directed acyclic graph corresponding to the test task and a second type of directed acyclic graph corresponding to the calibration task.

3. The automatic determination device for quantum bit parameters according to claim 1, characterized in that: The execution module also includes: A decision-making unit is used to determine the theoretical expected value of the task at each node according to the parameters and the obtained parameter acquisition criteria, and judge whether the current node is normal based on the set judgment conditions. If it is normal, enter the subsequent node of the current node; if it is not normal, determine that the current node is abnormal; The backtracking unit is used to backtrack to the target node when an exception occurs at a certain node during the execution of the parameter determination task. The target node is the root node that causes the node to be abnormal in the corresponding directed acyclic graph.

4. The automatic determination device for quantum bit parameters according to claim 3, characterized in that: The backtracking unit is also used to backtrack to the dependent predecessor node and re-execute when an exception occurs at a node during the execution of the parameter determination task. If the predecessor node is normal, the node where the exception occurs is executed again. If it is abnormal again, an error is output; if the predecessor node is abnormal, backtracking continues.

5. The automatic determination device for quantum bit parameters according to claim 3, characterized in that: The decision unit is used to construct a first formula based on the theoretical expected value and the obtained parameters, where the first formula is: Among them, R 2 is the degree of offset, y fit is the theoretical expected value, y raw is the parameter obtained, is the average value of the parameter corresponding to the current node; The offset degree is obtained based on the first formula, and a criterion is obtained based on the offset degree.

6. The automatic determination device for quantum bit parameters according to claim 3, characterized in that: The decision unit further adjusts the judgment condition according to the historical data stored in the second database.

7. The automatic determination device for quantum bit parameters according to claim 3, characterized in that: When a node is determined to be abnormal, the decision unit searches the third database to see whether it contains a processing strategy for the abnormality. If so, the strategy is executed; if not, the backtracking unit performs backtracking.

8. The automatic determination device for quantum bit parameters according to claim 1, characterized in that: The guiding module includes: a task input unit, configured to receive input of a sub-bit to be measured for which a parameter determination task needs to be performed and the parameter determination task to be performed on the sub-bit to be measured; The quantum bit database is used to receive the execution result of the parameter determination task returned by the execution module.

9. The automatic determination device for quantum bit parameters according to claim 8, characterized in that: The quantum bit database also stores information about each quantum bit on a quantum chip, and the information about each quantum bit is independent of each other.

10. The automatic determination device for quantum bit parameters according to claim 8, characterized in that: The guiding module further includes: Monitoring policy library, used to store monitoring policies; The monitoring unit is used to periodically execute the monitoring strategy in the monitoring strategy library, and if the execution result of the monitoring strategy is abnormal, send the corresponding calibration task to the execution module.

11. The automatic determination device for quantum bit parameters according to claim 8, characterized in that: The execution module also includes: a construction unit, configured to construct a directed acyclic graph corresponding to the parameter determination task when the task receiving unit cannot find the directed acyclic graph corresponding to the parameter determination task from the first database; A configuration unit configures the directed acyclic graph constructed by the construction unit into the first database.

12. A quantum computer, characterized in that: A device for automatically determining quantum bit parameters comprising any one of claims 1 to 11.

13. A method for automatically determining quantum bit parameters, characterized in that: include: Determining a quantum bit to be measured on the quantum chip that requires a parameter determination task to be performed and a parameter determination task to be performed on the quantum bit to be measured; wherein the parameter determination task includes a test task and a calibration task; Determine, according to the parameters, the execution of a directed acyclic graph corresponding to the task and obtain a result, wherein the nodes of the directed acyclic graph represent the parameters of the sub-bits to be measured, and the directed edges of the directed acyclic graph represent the dependency relationships between the parameters; The method includes determining, according to the parameters, executing a directed acyclic graph corresponding to the task and obtaining a result, wherein the nodes of the directed acyclic graph represent the parameters of the sub-bits to be measured, and the directed edges of the directed acyclic graph represent the dependencies between the parameters. Obtaining a directed acyclic graph database, the directed acyclic graph database including a first database storing a directed acyclic graph corresponding to the parameter determination task, a second database storing historical data of parameters corresponding to each node obtained after the sub-bit to be measured executes the directed acyclic graph, and a third database storing a strategy for handling anomalies; Receiving the parameter determination task, and obtaining a directed acyclic graph corresponding to the parameter determination task from a first database; wherein different parameter determination tasks correspond to different directed acyclic graphs; The parameter determination task is performed according to the directed acyclic graph corresponding to the parameter determination task, and the parameters corresponding to each of the nodes are obtained.

14. A readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed, it can implement the method for automatically determining quantum bit parameters as claimed in claim 13.

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