An integrated apparatus for cleaning, testing and sorting of implants and a method of testing

Abstract

The application discloses a kind of cleaning, detection and sorting integrated device of implant, comprising: conveying channel, conveying implant to be measured;Rotary table, the rotary table is equipped with up and down through limiting hole;Limiting piece, it clamps or loosens the implant to be measured in the limiting hole;First image collector, it is used to collect the overhead image of implant to be measured in the limiting hole;Second image collector, it is used to collect the side view image of implant to be measured in the limiting hole;Image detection device, it is used to detect the overhead image and the side view image.The cleaning, detection, sorting integrated device of implant of the application can realize the unmanned of implant production line.The application also discloses a kind of detection method.The detection method of the application realizes the quick and accurate implant size and appearance detection by comparing overhead image and side view image with standard overhead image and side view image.The application can be applied in implant manufacturing field.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of implant manufacturing, in particular to an integrated device for cleaning, detecting and sorting implants and a detection method. BACKGROUND

[0002] At present, the production process of implants generally includes machining, cleaning, size and shape detection, and model sorting. First, the machining personnel refer to the machining drawing to machine the bar stock, then the cleaning personnel clean the machined implants to remove oil and debris, then the detection personnel detect the size and shape of the implants, and finally the packaging personnel sort and package the implants according to the model.

[0003] In order to improve the production efficiency of implants and realize unmanned workshop construction, an automatic production line is designed according to the production process of implants. Since the machining stage is usually completed by machines, its modification is easy to implement, so the difficulty lies in the modification of the cleaning and size and shape detection stages of the implants. At present, there is no integrated device for cleaning, detecting and sorting implants for automatic production lines. SUMMARY

[0004] The present application aims to provide an integrated device for cleaning, detecting and sorting implants and a detection method to solve one or more technical problems in the prior art and at least provide a beneficial choice or create conditions.

[0005] To solve the above technical problems, the technical solutions adopted are as follows:

[0006] An integrated device for cleaning, detecting and sorting implants, comprising:

[0007] a conveying channel for conveying implants to be detected;

[0008] a turntable rotatably arranged below the conveying channel, the turntable being provided with a limiting hole extending vertically therethrough, and the rotating track of the limiting hole passing below the bottom end of the conveying channel;

[0009] a limiting member arranged in the limiting hole, the limiting member clamping or releasing the implant to be detected in the limiting hole;

[0010] a first image collector located above the turntable, the first image collector being used to collect a top view image of the implant to be detected in the limiting hole;

[0011] a second image collector located at the periphery of the turntable, the second image collector being used to collect a side view image of the implant to be detected in the limiting hole;

[0012] an image detection device for detecting the top view image and the side view image.

[0013] The beneficial effects of the present application are: the processed and cleaned test implant is conveyed from the top of the conveying channel to the limiting hole of the rotating disc, the limiting piece clamps the test implant in the limiting hole, then the rotating disc drives the test implant to rotate below the first image collector, the first image collector collects the overhead image of the test implant, the rotating disc drives the test implant to rotate beside the second image collector, the second image collector collects the side view image of the test implant, and finally the interface size of the test implant in the overhead image and the contour size of the test implant in the side view image are detected by the image detection device, without manual detection, the cleaning, detection and sorting integrated device can realize the unmanned production line of the implant, and greatly improve the automation level of the implant automatic production line.

[0014] As a further improvement of the above technical solution, the cleaning, detection and sorting integrated device of the implant further comprises:

[0015] A diameter sorting assembly is provided with a plurality of sorting slides, the diameter sorting assembly conveys the test implant to the corresponding sorting slide according to the diameter, and the top end of the conveying channel is connected with a plurality of sorting slides;

[0016] A laser sensor is provided with a detection head facing a plurality of sorting slides, the laser sensor measures the distance from the test implant to the detection head, and the laser sensor samples at a constant frequency and obtains a plurality of sampling points according to the length of the test implant;

[0017] A controller obtains the diameter and length information of the test implant according to the distance measured by the laser sensor and the number of sampling points, and the controller transmits the diameter and length information to the image detection device;

[0018] The image detection device stores the standard overhead image and the standard side view image of the qualified implant corresponding to the diameter and the length, the image detection device retrieves the corresponding standard overhead image and standard side view image according to the diameter and length information, and the image detection device compares the overhead image with the standard overhead image and compares the side view image with the standard side view image.

[0019] The diameter sorting assembly is used to convey the to-be-tested implant into the corresponding sorting slide, and then the laser sensor is used to measure the distance from the to-be-tested implant to the detection head; since the sampling frequency is constant, the longer the to-be-tested implant is, the more sampling points the laser sensor obtains; according to the number of sampling points output by the laser sensor, the controller conveys the length model information to the image detection device, so that the controller can determine the diameter and length information of the to-be-tested implant according to the above distance and sampling points; finally, the image detection device retrieves the corresponding standard top view image and standard side view image according to the diameter and length information, compares the top view image of the to-be-tested implant with the standard top view image of the qualified implant, compares the side view image of the to-be-tested implant with the standard side view image of the qualified implant, and detects whether the to-be-tested implant is qualified according to the similarity of the two; the cleaning, testing and sorting integrated device of the implant can simultaneously test to-be-tested implants of different diameters and lengths, and greatly improves the testing efficiency of the implant.

[0020] As a further improvement of the above technical solution, each sorting slide is provided with a cleaning station, and the cleaning, testing and sorting integrated device of the implant further comprises:

[0021] A plurality of clamps are provided one by one on the plurality of cleaning stations, and the clamps limit or loosen the to-be-tested implant located on the cleaning station;

[0022] A plurality of cleaning and drying mechanisms are provided one by one on the plurality of cleaning stations, and the cleaning and drying mechanisms spray fluid to clean and dry the to-be-tested implant.

[0023] The clamps and cleaning and drying mechanisms are arranged at the cleaning stations of each sorting slide, the to-be-tested implant is limited by the clamps, so that the cleaning and drying mechanisms spray fluid to clean and dry the to-be-tested implant, and the oil stains and debris on the surface of the to-be-tested implant do not affect the detection result.

[0024] As a further improvement of the above technical solution, the side wall of the sorting slide cooperates with the clamps to form a cleaning space, and the to-be-tested implant moves in the cleaning space; the cleaning and drying mechanism comprises at least two nozzles, and the two nozzles are arranged on the upper and lower sides of the cleaning space, respectively.

[0025] The to-be-tested implant can move in the cleaning space, and when the cleaning and drying mechanism sprays fluid to clean and dry the to-be-tested implant, the to-be-tested implant rotates and moves in the cleaning space under the impact of the fluid, so as to clean the oil stains and debris on different sides of the to-be-tested implant; the nozzles on the upper and lower sides of the cleaning space, the upper nozzle is used to clean the interface of the implant crown end and the outer side wall on the upper side, and the lower nozzle is used to clean the implant top end and the outer side wall, thereby improving the cleaning effect.

[0026] As a further improvement of the above technical solution, the controller is electrically connected to the laser sensor and the rotating disc, the limiting holes are multiple, the multiple limiting holes correspond to the multiple diameter and length information one by one, the inner taper of each limiting hole is consistent with the outer taper of the corresponding implant to be measured, and the controller rotates the corresponding limiting hole to below the bottom end of the conveying channel according to the diameter and length information.

[0027] The controller rotates the limiting hole with the corresponding taper to below the bottom end of the conveying channel according to the diameter and length information, so that the implant to be measured falls into the limiting hole with the corresponding taper, and the implant to be measured is stably assembled in the limiting hole by the corresponding limiting member, thereby avoiding loosening of the implant to be measured during image acquisition by the first image collector and the second image collector, preventing the top view image and the side view image of the implant to be measured from being skewed, and improving the accuracy of image comparison.

[0028] As a further improvement of the above technical solution, the implant cleaning, detecting and sorting integrated device further comprises:

[0029] A plurality of good product grooves are distributed below the rotating track of the limiting hole.

[0030] A defective product groove is arranged below the rotating track of the limiting hole.

[0031] The controller controls the rotation of the rotating disc, so that the qualified implant is rotated into the corresponding good product groove along with the limiting hole, and the qualified implant is packed into different good product grooves according to the diameter type, thereby realizing type sorting of the implant, and the unqualified implant is put into the defective product groove.

[0032] As a further improvement of the above technical solution, each sorting slide is provided with a slot penetrating upward and downward, a plurality of slots are distributed in the upward and downward direction, the width of the plurality of slots decreases from top to bottom, and the laser sensor is located obliquely above the plurality of slots.

[0033] The slot of the sorting slide is used for sorting different diameter implants to be measured. Since the width of the plurality of slots decreases from top to bottom, the implant to be measured falls from top to bottom until it is limited by the slot with the corresponding width, and the laser sensor detects the implant to be measured from the oblique upper side of the plurality of slots. The controller can determine the position of the implant to be measured in the slot according to the distance of the implant to be measured measured by the laser sensor, and then output the diameter type information of the implant to be measured to the image detection device. Since the sampling frequency of the laser sensor is fixed, the longer the implant, the longer the time it takes to pass through the laser projection line, and the more the number of sampling points, and then the controller outputs the length type information of the implant to be measured to the image detection device.

[0034] As a further improvement of the above technical solution, the limiting member comprises:

[0035] A sliding block is slidingly arranged in the limiting hole, and a limiting cavity is formed between the sliding block and the side wall of the limiting hole;

[0036] An elastic member is connected to the sliding block and the limiting hole, and the elastic force of the elastic member causes the sliding block to have a tendency to compress the limiting cavity;

[0037] A driving member is started to cause the sliding block to expand the limiting cavity against the elastic force of the elastic member.

[0038] The to-be-tested implant is limited in the limiting cavity formed by the sliding block and the side wall of the limiting hole, and the driving member is started to release the to-be-tested implant so as to facilitate the to-be-tested implant to fall downward.

[0039] A detection method comprises the following steps:

[0040] S1, a standard implant is placed into the implant cleaning, detecting and sorting integrated device to obtain a standard top view image and a standard side view image of the standard implant;

[0041] S2, a to-be-tested implant enters the implant cleaning, detecting and sorting integrated device;

[0042] S3, the first image collector collects the top view image of the to-be-tested implant, and the image detection device compares the top view image with the standard top view image to obtain a top view similarity;

[0043] S4, the second image collector collects the side view image of the to-be-tested implant, and the image detection device compares the side view image with the standard side view image to obtain a side view similarity;

[0044] S5, the image detection device sets a top view standard similarity and a side view standard similarity, and if the top view similarity is not less than the top view standard similarity and the side view similarity is not less than the side view standard similarity, it is determined that the to-be-tested implant is qualified, otherwise it is determined that the to-be-tested implant is unqualified.

[0045] The standard implant is placed into the implant cleaning, detecting and sorting integrated device to obtain a standard top view image and a standard side view image, so that the standard top view image and the standard side view image are more close to the top view image and the side view image collected by the to-be-tested implant actually detected by the implant cleaning, detecting and sorting integrated device, and the comparison of the top view image with the standard top view image is more accurate to obtain a top view similarity, and the comparison of the side view image with the standard side view image is more accurate to obtain a side view similarity.

[0046] As a further improvement of the above technical solution, in the step S4, the image detection device measures the difference between the interface angle of the to-be-tested implant and the interface angle of the standard implant as θ°, the rotating disc has a rotating station, the rotating disc drives the to-be-tested implant into the rotating station, and the cleaning, testing and sorting integrated device of the implant further comprises a rotating member, the rotating member is arranged on the periphery of the rotating station, the rotating member is started to drive the to-be-tested implant to rotate around an axis, and before the step S5, the rotating member drives the to-be-tested implant to rotate θ°.

[0047] According to the image detection device, the difference between the interface angle of the to-be-tested implant and the interface angle of the standard implant is measured, then the rotating disc drives the to-be-tested implant into the rotating station, and the rotating member drives the to-be-tested implant to rotate θ° around an axis, so that the angle of the to-be-tested implant towards the second image collector is consistent with the angle of the standard implant towards the second image collector, thereby ensuring that the side view image of the to-be-tested implant collected by the second image collector is more similar to the standard side view image of the standard implant, and the side view similarity obtained by comparing the side view image with the standard side view image is more accurate. BRIEF DESCRIPTION OF DRAWINGS

[0048] The application will be further described below in combination with the drawings and embodiments.

[0049] Figure 1 is a cleaning, testing and sorting integrated device of an implant provided by the application, and a structural schematic view of an embodiment thereof;

[0050] Figure 2 is a cleaning, testing and sorting integrated device of an implant provided by the application, and a sectional view schematic view of a diameter sorting assembly in an embodiment thereof;

[0051] Figure 3 is a detection method provided by the application, and a comparison schematic view of a standard top view image and a top view image in an embodiment thereof;

[0052] Figure 4 is a detection method provided by the application, and a comparison schematic view of a standard side view image and a side view image when the to-be-tested implant is not rotated θ° in an embodiment thereof.

[0053] 100, diameter sorting assembly, 110, sorting slide, 111, cleaning station, 112, cleaning space, 113, slot, 120, clamp, 130, cleaning and drying mechanism, 200, conveying channel, 300, rotating disc, 310, limiting hole, 320, rotating station, 400, first image collector, 500, second image collector, 600, laser sensor, 700, good product groove, 710, defective product groove, 800, rotating member. DETAILED DESCRIPTION

[0054] The specific embodiments of the present application will be described in detail in this part, the preferred embodiments of the present application are shown in the drawings, the role of the drawings is to supplement the description of the text part with figures, so that people can intuitively and visually understand each technical feature and the overall technical scheme of the present application, but it cannot be understood as a limitation on the protection scope of the present application.

[0055] In the description of the present application, it should be understood that the orientation description, such as the orientation or position relationship indicated by up, down, front, back, left, right and the like, is based on the orientation or position relationship shown in the drawings, which is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, therefore it cannot be understood as a limitation on the present application.

[0056] In the description of the present application, if the word such as "several" is described, its meaning is one or more, the meaning of more than two is more than two, greater than, less than, more than, etc. It is understood as not including the number, above, below, within, etc. It is understood as including the number.

[0057] In the description of the present application, unless otherwise explicitly limited, the words such as setting, installation, connection and the like should be understood in a broad sense, and the person skilled in the art can reasonably determine the specific meaning of the above words in the present application in combination with the specific content of the technical scheme.

[0058] Referring to Figures 1 to 2 The cleaning, detection and sorting integrated device of the implant of the present application is as follows:

[0059] The cleaning, detection and sorting integrated device of the implant comprises a diameter sorting assembly 100, a clamp 120, a cleaning and drying mechanism 130, a conveying channel 200, a rotating disc 300, a limiting piece, a first image collector 400, a second image collector 500, an image detection device, a laser sensor 600, a controller, a good product tank 700, a substandard product tank 710 and a rotating piece 800.

[0060] The diameter sorting assembly 100 comprises a material collecting box and a plurality of sorting slides 110, the top of the material collecting box is open, the inside of the material collecting box is provided with a material collecting cavity, the material collecting cavity is aligned with the discharging port of the machine tool, the top of the material collecting cavity is in the form of a funnel structure with a large upper part and a small lower part, and the plurality of sorting slides 110 extend into the material collecting cavity, the plurality of sorting slides 110 are distributed in the up-down direction, and each sorting slide 110 gradually inclines downward from front to back.

[0061] Each sorting chute 110 is provided with a slot 113 extending in the front-rear direction, the slot 113 penetrating the sorting chute 110 in the up-down direction, the width of the slot 113 in the left-right direction decreases successively from top to bottom, the test implant 10 falls from the top of the collecting cavity and is guided to the upper side of the plurality of sorting chutes 110 through the funnel structure, and then the test implant 10 falls successively into the slots 113 of the plurality of sorting chutes 110 until the width of the slot 113 in the left-right direction matches the outer diameter of the test implant 10, so that the test implant 10 is intercepted on the sorting chute 110 where the slot 113 is located.

[0062] The top of each slot 113 is provided with a tapered port that is large at the top and small at the bottom. Since the shape of the test implant 10 is similar to the circular truncated cone structure with the large crown end and the small top end, the tapered port helps guide the top end of the test implant 10 to fall into the slot 113, while the crown end of the test implant 10 is blocked by the left and right side walls of the slot 113, so that the test implant 10 can slide along the slot 113.

[0063] The rear side of each sorting chute 110 is provided with a cleaning station 111, and the sliding track of the test implant 10 in the sorting chute 110 passes through the cleaning station. Each cleaning station 111 is provided with a clamp 120 and a cleaning and drying mechanism 130.

[0064] In the embodiment, the clamp 120 is composed of three left-right extending positioning rods, the sorting chute 110 is provided with three positioning holes penetrating in the left-right direction at the cleaning station, the three positioning rods are correspondingly arranged in the three positioning holes, one positioning rod is located at the upper side of the cleaning station 111, one positioning rod is located at the front side of the cleaning station, and one positioning rod is located at the rear side of the cleaning station 111. The three positioning rods slide in the left-right direction, the three positioning rods are located at the right side of the cleaning station 111, the three positioning rods move left and right by being driven by a straight push rod, and the three positioning rods form a cleaning space 112 with the side wall of the slot 113 after being inserted into the cleaning station 111.

[0065] After the test implant 10 is limited in the cleaning space 112, the test implant 10 can slide up and down or rotate around the vertical axis in the cleaning space 112.

[0066] The cleaning and drying mechanism 130 includes a liquid pipeline, a gas pipeline, a switching valve, a fluid pump, and two spray heads. The liquid pipeline and the gas pipeline are connected to the inlet end of the switching valve through a three-way joint, the outlet end of the switching valve is communicated with the two spray heads, the two spray heads are respectively arranged at the upper side and the lower side of the cleaning space 112, and the two spray heads are respectively arranged at the left side and the right side of the cleaning space 112, that is, the two spray heads are located at two opposite corners of the cleaning space 112.

[0067] When the cleaning and drying mechanism 130 is working, the switching valve is connected to the liquid pipeline, the liquid pipeline is connected to the liquid storage container, the liquid storage container stores cleaning liquid, the fluid pump is started to send the cleaning liquid from the liquid pipeline to the two spray heads, the two spray heads spray the cleaning liquid from the upper and lower sides to wash the test implant 10 in the cleaning space 112, the liquid can be water, oil removal agent solution, etc. Since the two spray heads are located at the upper left side and the lower right side of the test implant 10, the liquid is intermittently sprayed by the two spray heads in sequence, so that the test implant 10 moves up and down and rotates around the vertical axis during the process of washing the test implant 10 by the liquid, so as to facilitate the liquid to wash the oil stains and debris on different sides of the test implant 10.

[0068] Then the switching valve is connected to the gas pipeline, the gas pipeline is connected to the compressed gas source, the compressed gas flows to the two spray heads, the two spray heads spray the compressed gas from the upper and lower sides to dry the test implant 10 in the cleaning space 112, so as to remove the cleaning liquid adhered to the outer side wall and the interface of the test implant 10, and avoid the cleaning liquid droplets on the outer surface of the test implant 10 from interfering with image detection.

[0069] The laser sensor 600 is arranged obliquely above the plurality of sorting slides 110, the laser sensor 600 is a laser triangulation displacement sensor, a light beam emitted by a semiconductor laser of the laser triangulation displacement sensor irradiates on a target; a receiving lens collects the light rays reflected or diffused by the target surface and focuses on a photosensitive element. When the distance to the target changes, the angle of the light rays passing through the receiving lens will also change, so that the distance of the target is calculated by the angle of the received light rays.

[0070] The detection head of the laser sensor 600 faces the grooves 113 of the plurality of sorting slides 110, the cleaning stations 111 of the plurality of sorting slides 110 are distributed along the up-down direction, the detection head of the laser sensor 600 faces above the uppermost cleaning station 111, when the test implant 10 falls into any one of the sorting slides 110 and is limited in front of the cleaning station 111, the laser emitted by the laser sensor 600 can pass through the plurality of grooves 113 obliquely from above, the laser emitted by the laser sensor 600 can irradiate on the falling test implant 10, and the light reflected by the test implant 10 can be received by the receiving lens of the laser sensor 600, so that the distance between the test implant 10 and the laser sensor 600 is determined by the angle of the received light rays. If the test implant 10 falls and leaves the measurement area of the laser sensor 600, the laser sensor 600 measures the change in distance, and then the three positioning rods of the cleaning station 111 are started to insert into the cleaning space 112 surrounded by the side walls of the grooves 113, so that the test implant is limited in the cleaning space 112 for cleaning and drying.

[0071] In addition, since the sampling frequency of the laser sensor 600 is fixed, the longer the implant 10, the longer the time through the laser projection line, and thus the more the number of sampled points.

[0072] The controller is electrically connected to the laser sensor 600, the laser sensor 600 sends the measured distance information of the to-be-measured implant 10 to the laser sensor 600 to the controller, the controller stores a plurality of distance ranges with different value ranges, each distance range corresponds to an implant diameter model information, a plurality of implant diameter model information and a plurality of slot 113 width of sorting slide 110 one-to-one, the controller determines that the received distance information is located in a certain distance range, thereby determining the implant diameter model information corresponding to the distance range, in addition, the controller stores a plurality of sampling point number ranges with different value ranges, each sampling point range corresponds to an implant diameter model information, the controller determines that the sampling point number information is located in a certain distance range, thereby determining the implant diameter model information corresponding to the sampling point number range, and finally sends the implant diameter model information to the image detection device.

[0073] The rear end of each sorting slide 110 is open, and the rear end of the plurality of sorting slides 110 is provided with a sliding groove penetrating in the up-down direction, and the rear end of the plurality of slots 113 is communicated with the sliding groove, so that the to-be-measured implant 10 sliding downward from the cleaning station 111 can be slid into the sliding groove.

[0074] The bottom end of the sliding groove is communicated with the top end of the conveying channel 200, and the conveying channel 200 is in a cylindrical shape, so that the to-be-measured implant 10 can slide in a posture with the bottom end facing downward after sliding into the conveying channel 200, and the bottom end of the conveying channel 200 faces downward.

[0075] The turntable 300 is an electric turntable, and the turntable 300 is provided with a plurality of limiting holes 310 penetrating in the up-down direction, the plurality of limiting holes 310 are distributed at equal distances around the rotation axis of the turntable 300, the distances from the plurality of limiting holes 310 to the rotation axis of the turntable 300 are equal, so that the trajectories of the plurality of limiting holes 310 coincide with each other as the turntable 300 rotates, the turntable 300 is located below the bottom end of the conveying channel 200, and the rotation trajectory of each limiting hole 310 is located below the bottom end of the conveying channel 200.

[0076] The controller is electrically connected to the rotating disc 300, the controller controls the rotation of the rotating disc 300, the controller records the rotation angle of the plurality of limiting holes 310 rotating below the bottom end of the conveying channel 200, the controller corresponds the plurality of limiting holes 310 to the plurality of implant diameter and length information one by one, wherein the inner taper of the limiting hole 310 should be consistent with the outer taper of the corresponding implant, after the controller determines the implant diameter and length information, the controller controls the rotating disc 300 to rotate so that the corresponding limiting hole 310 rotates below the bottom end of the conveying channel 200, so that the to-be-measured implant 10 in the conveying channel 200 can fall into the corresponding limiting hole 310.

[0077] Each limiting hole 310 is provided with a limiting piece, the limiting piece is composed of a sliding block, an elastic piece and a driving piece, the bottom of each limiting hole 310 is provided with a groove extending in the horizontal direction, the sliding block is slidingly arranged in the groove, the sliding block slides in the horizontal direction in the groove, the side of the sliding block facing the limiting hole 310 is provided with a tapered groove, the tapered groove and the inner side wall of the limiting hole 310 form a conical limiting cavity, wherein the taper of the limiting cavity is consistent with the taper of the limiting hole, the elastic piece is a compression spring, the two ends of the elastic piece are connected to the sliding block and the groove, the elastic piece pushes the sliding block to compress the limiting cavity, when the to-be-measured implant 10 falls into the limiting hole 310, the to-be-measured implant 10 is clamped in the limiting cavity by the sliding block.

[0078] The bottom of the sliding block is provided with a wedge-shaped block, the side of the wedge-shaped block facing the limiting hole 310 is a slope, the slope gradually inclines upward away from the limiting hole 310. The driving piece includes a linear push rod and a cylinder, the linear push rod pushes the cylinder to move up and down, the driving piece is connected to the rotating disc 300, the driving piece rotates with the rotating disc 300, the cylinder is located directly below the limiting cavity, the linear push rod pushes the cylinder to move upward, the top end of the cylinder abuts against the slope of the wedge-shaped block, because the slope abuts against the top end of the cylinder, as the cylinder continuously rises, the wedge-shaped block gradually moves away from the limiting hole 310, so that the limiting cavity expands, and the to-be-measured implant 10 in the limiting cavity falls into the cylinder.

[0079] The first image collector 400 is arranged above the rotating disc 300, the first image collector 400 is a camera, the first image collector 400 is located above the rotation track of the limiting hole 310, and the lens of the first image collector 400 directly faces the rotation track of the limiting hole 310.

[0080] Since the relative position between the first image collector 400 and the bottom end of the conveying channel 200 is fixed, the controller records the angle of each limiting hole 310 from below the bottom end of the conveying channel 200 to below the first image collector 400. When the implant 10 to be measured falls into the limiting hole, and the limiting member clamps the implant 10 to be measured in the limiting hole 310, the controller controls the rotation of the rotating disc 300 to rotate the implant 10 to be measured to be directly below the first image collector 400, and the first image collector 400 shoots a top view image of the implant 10 to be measured, which contains the interface shape, interface appearance, interface diameter, crown end diameter and other information of the implant 10 to be measured.

[0081] The rotating member 800 is located above the rotating disc 300, and the rotating member 800 includes a lifting mechanism and a rotating mechanism. The lifting mechanism drives the rotating mechanism to move in the up-down direction, and the rotating mechanism rotates around a vertical axis. The rotating mechanism is located above the rotation track of the limiting hole 310. The position below the rotating disc 300 corresponding to the rotating member 800 is the rotating station 320. The bottom of the rotating mechanism is provided with a connector for inserting the crown end interface of the implant 10 to be measured.

[0082] The relative position between the rotating mechanism and the first image collector 400 is fixed, and the controller records the angle of each limiting hole 310 from below the first image collector 400 to below the rotating mechanism. When the first image collector 400 shoots a top view image of the implant 10 to be measured, the controller controls the rotation of the rotating disc 300 to rotate the implant 10 to be measured to be below the rotating mechanism. The lifting mechanism drives the rotating mechanism to move downward, so that the connector of the rotating mechanism is inserted into the interface of the crown end of the implant 10 to be measured. Then, the rotating mechanism rotates to drive the implant 10 to be measured to rotate, adjusts the angle of the implant 10 to be measured, and then the lifting mechanism drives the rotating mechanism to rise to separate the connector from the implant 10 to be measured.

[0083] The second image collector 500 is arranged on the periphery of the rotating disc 300. The second image collector 500 is a camera, and the lens of the second image collector 500 faces the rotating disc 300. The thickness of the rotating disc 300 is small, and the limiting member clamps the crown end of the implant 10 to be measured, so that the lower side of the implant 10 to be measured is exposed below the rotating disc 300. The second image collector 500 is used to shoot a side view image of the lower side of the implant 10 to be measured.

[0084] Since the relative position between the second image collector 500 and the rotating mechanism is fixed, the controller records the angle of each limiting hole 310 from the position below the rotating mechanism to the position in front of the lens of the second image collector 500, and when the implant 10 to be detected is adjusted in angle by the rotating mechanism, the controller controls the rotation of the rotating disc 300 to rotate the implant 10 to be detected to the position in front of the lens of the second image collector 500, and the second image collector 500 captures the side view image of the lower side of the implant 10 to be detected, which contains the information such as the contour, diameter, taper angle, thread shape and pitch of the implant 10 to be detected.

[0085] The image detection device is electrically connected to the first image collector 400 and the second image collector 500, the rotating member 800 is controlled by a separate control device, the control device is electrically connected to the image detection device, and the control device controls the rotation angle of the rotating member 800.

[0086] A plurality of good product grooves 700 and a substandard product groove 710 are arranged below the rotating disc 300, the plurality of good product grooves 700 are distributed at intervals around the rotation axis of the rotating disc 300, the plurality of good product grooves 700 correspond to the plurality of implant diameter models one by one, and all the good product grooves 700 are located directly below the rotation track of the limiting hole 310, and the substandard product groove 710 is also located directly below the rotation track of the limiting hole 310.

[0087] When the image detection device detects that the implant 10 to be detected is a qualified product, the controller controls the rotating disc 300 to rotate to make the limiting hole 310 rotate above the corresponding good product groove 700 according to the diameter model information of the implant 10 to be detected, and then the limiting member releases the implant to fall into the corresponding good product groove 700, so as to sort and store the qualified implant. When the image detection device detects that the implant 10 to be detected is a substandard product, the controller controls the rotating disc 300 to rotate to make the limiting hole 310 rotate above the substandard product groove 710, and the limiting member releases the implant to fall into the corresponding substandard product groove 710, so as to collect the substandard implant.

[0088] Referring to Figures 3 to 4 The detection method of the present application is as follows:

[0089] A standard implant is placed in the above-mentioned implant cleaning, detecting and sorting integrated device, the standard implant is a qualified product, and then the standard implant falls into the limiting hole 310 of the rotating disc 300 through the diameter sorting assembly 100 and the conveying channel 200, and then the controller controls the rotating disc 300 to rotate to make the standard implant rotate below the first image collector 400, and the first image collector 400 captures the standard overhead image of the standard implant, and then the controller controls the rotating disc 300 to rotate to make the standard implant rotate in front of the lens of the second image collector 500, and the second image collector 500 captures the standard side view image of the standard implant.

[0090] The plurality of standard implants of different diameters are placed into the cleaning, detecting and sorting integrated device one by one, to obtain standard top view images and standard side view images of the plurality of standard implants of different diameters, and the standard top view images and the standard side view images are stored in the image detecting device.

[0091] The finished implant 10 to be detected is placed into the collecting box of the cleaning, detecting and sorting integrated device, the diameter sorting assembly 100 transfers the implant 10 to be detected into the corresponding sorting slide 110, the laser sensor 600 detects the implant 10 to be detected sliding down, the clamp 120 is activated to limit the implant 10 to be detected in the cleaning space 112, the laser sensor 600 works to make the controller obtain the diameter information of the implant 10 to be detected, and then the implant 10 to be detected is washed and dried by the washing and drying mechanism 130 of the cleaning station 111 to remove oil stains and debris on the outer surface of the implant 10 to be detected.

[0092] The clamp 120 is opened to make the implant 10 to be detected enter the conveying channel 200, the controller controls the rotating disc 300 to rotate according to the diameter information of the implant 10 to be detected, so that the corresponding limiting hole 310 is rotated to below the bottom end of the conveying channel 200, and then the implant 10 to be detected falls from the conveying channel 200 into the limiting hole 310 and is clamped by the limiting piece.

[0093] The controller controls the rotating disc 300 to rotate to make the implant 10 to be detected rotate directly below the first image collector 400, the first image collector 400 shoots a top view image of the implant 10 to be detected, and the image detecting device calls the standard top view image of the standard implant of the corresponding type according to the diameter information of the implant 10 to be detected.

[0094] The image detecting device compares the top view image with the standard top view image, such as the interface shape, the interface appearance, the interface diameter, the crown end diameter and the like, and then checks whether the top view image has extra feature points, such as burrs, scratches or edge collapse and the like, if the interface shape, the interface appearance, the interface diameter, the crown end diameter and the like of the top view image and the standard top view image are compared, the similarity of the information is compared, and the similarity threshold value can be freely set by the user. When the similarity is greater than the threshold value, and there is no extra feature point, it is proved that the top view image of the implant 10 to be detected is qualified, and subsequent detection is performed. Otherwise, the controller controls the rotating disc 300 to rotate to make the implant 10 to be detected rotate above the defective groove 710, and then the limiting piece releases the implant 10 to be detected to fall into the defective groove 710.

[0095] Reference Figure 3In the embodiment, the interface of the measured implant 10 and the standard implant is a regular hexagon. The image detection device measures the angle between the first corner and the reference line, which is a horizontal extension line to the left. The angle in the standard top view is a, and the angle in the top view of the measured implant 10 is b. When the first image collector 400 captures the measured implant 10 and the standard implant at the same position, the measured implant 10 and the standard implant are machined by the same machining program, and the same interface shape has the same obvious features and key points. Therefore, the shapes of the measured implant 10 and the standard implant are theoretically completely consistent. According to the comparison between the top view and the standard top view, the deflection angle θ of the measured implant 10 relative to the standard implant around the vertical axis is a-b, that is, the difference between the interface angle of the measured implant and the interface angle of the standard implant is θ°.

[0096] Then the controller controls the rotation of the turntable 300 to rotate the measured implant 10 to the lower side of the rotating member 800. The lifting mechanism of the rotating member 800 drives the rotating mechanism to descend, and the joint of the rotating mechanism is inserted into the interface of the measured implant 10. According to the deflection angle θ°, the rotating mechanism rotates θ°, so that the measured implant 10 and the standard implant have the same angle at the same position.

[0097] The controller controls the rotation of the turntable 300 to rotate the measured implant 10 to the front of the lens of the second image collector 500, and the second image collector 500 captures the side view of the measured implant 10.

[0098] The image detection device compares the side view with the standard side view, such as the appearance of the outer contour, the radius, the taper angle, the thread shape, the thread pitch, the coincidence degree of the thread, the coincidence degree of the cutting edge, and other information. Then, the distinguishing features such as burrs, scratches, or edge collapse are checked. If the appearance of the outer contour, the radius, the taper angle, the thread shape, the thread pitch, the coincidence degree of the thread, the coincidence degree of the cutting edge, and other information of the side view and the standard side view are similar, the similarity threshold can be freely set by the user. When the similarity is greater than the threshold, and there is no extra feature point, it is proved that the side view of the measured implant 10 is qualified. Then the controller controls the turntable 300 to rotate the qualified implant to the upper side of the good product groove 700 corresponding to the diameter type, and the limiting member releases the implant to fall into the corresponding good product groove 700, thereby completing the type sorting of the implant. Otherwise, the controller controls the turntable 300 to rotate the qualified implant to the upper side of the defective product groove 710, and the limiting member releases the implant to fall into the corresponding defective product groove 710.

[0099] When the above-mentioned image detection device compares the top view image with the standard top view image, the image recognition uses the SIFT or SURF method. If the angles are different, the SIFT and SURF methods can still find the key points in the same position in the original image and rotate them to a fixed direction, thereby ensuring the rotation invariance. At the same time, the rotation angle θ of the image can be accurately calculated, the features of the rotated image are extracted, and the image is matched with the standard image. The local features of the implant interface can be used to compare the similarity of the two images, and even subtle differences can be detected.

[0100] Specifically, the SIFT and SURF methods can measure the similarity between two images by calculating the distance between the local feature vectors in the two images. Common distance measures include Euclidean distance, Hamming distance, etc. If the distance between most local feature vectors in the two images is small, they are considered to be similar, i.e. the size of the implant 10 to be tested is qualified, otherwise they are considered to be dissimilar. In summary, whether the multiple sizes of the interface are qualified can be determined by taking pictures of the implant interface.

[0101] When the above-mentioned image detection device compares the side view image with the standard side view image, the SIFT or SURF method can also be used.

[0102] The preferred embodiments of the present application are described in detail above, but the present application is not limited to the above-mentioned embodiments. Those skilled in the art can make various equivalent modifications or replacements without departing from the spirit of the present application. These equivalent modifications or replacements are all included in the scope defined by the claims of the present application.

Claims

1. An integrated device for cleaning, detecting, and sorting implants, characterized in that: include: The delivery channel transports the implant to be tested. A turntable is rotatably disposed below the conveying channel. The turntable has a vertically penetrating limiting hole, and the rotation trajectory of the limiting hole passes below the bottom end of the conveying channel. A limiting member is provided in the limiting hole, and the limiting member clamps or releases the implant to be tested in the limiting hole; A first image acquisition device is located above the turntable, and the first image acquisition device is used to acquire a top view image of the implant to be tested in the limiting hole; The second image acquisition device is located on the periphery of the turntable. The second image acquisition device is used to acquire a side view image of the implant to be tested in the limiting hole. An image detection device for detecting the top view image and the side view image; A diameter sorting component is provided with multiple sorting slides. The diameter sorting component transports the implant to be tested into the corresponding sorting slide according to its diameter. The top of the transport channel is connected to multiple sorting slides. Each sorting chute is equipped with a cleaning station, and the integrated device for cleaning, inspecting, and sorting implants further includes: Multiple clamps are provided, one-to-one, on multiple cleaning stations. The clamps limit or release the implant to be tested located at the cleaning station. Multiple cleaning and drying mechanisms are provided, and each of the multiple cleaning and drying mechanisms is correspondingly set at a multiple cleaning station. The cleaning and drying mechanisms spray fluid to clean and dry the implant to be tested. The fixture consists of three positioning rods extending to the left and right. The sorting slide has three positioning holes that extend in the left and right direction at the cleaning station. The three positioning rods are inserted into the three positioning holes one by one. The three positioning rods slide in the left and right direction. The three positioning rods are located on the right side of the cleaning station. The three positioning rods are driven by a linear push rod to move left and right. After the three positioning rods are inserted into the cleaning station, they form a cleaning space with the side wall.

2. The integrated device for cleaning, detecting, and sorting implants according to claim 1, characterized in that: The integrated device for cleaning, testing, and sorting implants also includes: A laser sensor, with its detection head facing multiple sorting chutes, measures the distance from the implant to be tested to the detection head, and samples at a constant frequency to obtain multiple sampling points based on the length of the implant to be tested. The controller determines the diameter and length information of the implant to be tested based on the distance measured by the laser sensor and the number of sampling points, and the controller transmits the diameter and length information to the image detection device; The image detection device stores standard top view images and standard side view images of qualified implants with corresponding diameters and lengths. The image detection device retrieves the corresponding standard top view image and standard side view image based on the diameter and length information. The image detection device compares the top view image with the standard top view image and compares the side view image with the standard side view image.

3. The integrated device for cleaning, detecting, and sorting implants according to claim 2, characterized in that: The sidewall of the sorting chute, when engaged with the clamp, forms a cleaning space in which the implant to be tested moves. The cleaning and drying mechanism includes at least two nozzles, which are respectively located on the upper and lower sides of the cleaning space.

4. The integrated device for cleaning, detecting, and sorting implants according to claim 2, characterized in that: The controller is electrically connected to the laser sensor and the turntable. There are multiple limiting holes, and each limiting hole corresponds one-to-one with a diameter and length information. The inner cone taper of each limiting hole is consistent with the outer cone taper of the corresponding implant to be tested. The controller rotates the corresponding limiting hole to below the bottom end of the delivery channel according to the diameter and length information.

5. The integrated device for cleaning, detecting, and sorting implants according to claim 4, characterized in that: The integrated device for cleaning, testing, and sorting implants also includes: Multiple good product slots are spaced apart below the rotation trajectory of the limiting hole; The defective product slot is located below the rotation trajectory of the limiting hole.

6. The integrated device for cleaning, detecting, and sorting implants according to claim 2, characterized in that: Each of the sorting slides is provided with a vertically penetrating slot, and the multiple slots are distributed at intervals along the vertical direction. The width of the multiple slots decreases sequentially from top to bottom, and the laser sensor is located diagonally above the multiple slots.

7. The integrated device for cleaning, detecting, and sorting implants according to claim 1, characterized in that: The limiting component includes: A slider is slidably disposed in the limiting hole, and a limiting cavity is formed between the slider and the side wall of the limiting hole; An elastic element is connected to the slider and the limiting hole, and the elastic force of the elastic element causes the slider to have a tendency to compress the limiting cavity; A driving component is activated to cause the slider to expand the limiting cavity against the elastic force of the elastic element.

8. A detection method, characterized in that: Includes the following steps: S1. The standard implant is placed in the integrated device for cleaning, testing and sorting of implants as described in any one of claims 1 to 7 for testing, and a standard top view image and a standard side view image of the standard implant are obtained. S2. The implant to be tested enters the integrated device for cleaning, testing and sorting the implant; S3. The first image acquisition device acquires the top view image of the implant to be tested, and the image detection device compares the top view image with the standard top view image to obtain the top view similarity. S4. The second image acquisition device acquires the side view image of the implant to be tested, and the image detection device compares the side view image with the standard side view image to obtain the side view similarity. S5. The image detection device sets a top-view standard similarity and a side-view standard similarity. If the top-view similarity is not less than the top-view standard similarity and the side-view similarity is not less than the side-view standard similarity, the implant to be tested is determined to be qualified; otherwise, the implant to be tested is determined to be unqualified.

9. The detection method according to claim 8, characterized in that: In step S4, the image detection device measures the difference θ° between the interface angle of the implant to be tested and the interface angle of the standard implant. The turntable has a rotating station, and the turntable drives the implant to be tested into the rotating station. The integrated device for cleaning, detecting and sorting implants also includes a rotating component, which is located around the rotating station. The rotating component is activated to drive the implant to be tested to rotate around the axis. Before step S5, the rotating component drives the implant to be tested to rotate θ°.

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