An automatic inventory and grabbing method for probes on a metallurgical probe rack.

Abstract

This invention discloses an automatic inventory and gripping method for probes on a metallurgical probe rack, including an automatic inventory method and an automatic gripping method. The automatic inventory method involves mounting a detection device and a clamping device on the actuator of a drive unit. The drive unit drives the detection device to scan the metallurgical probe rack. The scan data is processed by a calculation unit to obtain the quantity and arrangement information of the probes to be gripped on the metallurgical probe rack, determining the probe's number and position information. The drive unit then drives the detection device to scan the probes to be gripped. The scan data is processed by a calculation unit to obtain the probe's position and orientation information. The clamping device then grips the probes using the automatic gripping method. This invention utilizes a detection device to inventory the probes placed on the probe rack, selects suitable probes for pre-grip positioning detection based on the inventory results, and uses a clamping device to grip the probes. After the probes are gripped, the automatic probe attachment to the secondary gun can be performed.

Description

Technical Field

[0001] This invention relates to probe storage rack technology in the metallurgical industry, and more specifically, to an automatic inventory and retrieval method for probes on metallurgical probe racks. Background Technology

[0002] In the KR (hot metal pretreatment) and LF (refining) sections of the steel smelting process, specialized metallurgical lances automatically perform various tasks such as temperature measurement, sampling, and oxygen determination. However, the connection and removal of the probes used in these processes are still primarily done manually. The working environment in metallurgical areas is harsh, characterized by high temperatures and high dust levels, making manual work labor-intensive and risky. Therefore, robotic automation is urgently needed in these sections. While retaining the automatic operation of the specialized metallurgical lances, the robotic automation tasks mainly include probe grabbing from the rack, automatic probe connection from the auxiliary lance, and automatic probe removal from the auxiliary lance. Therefore, accurate and stable automatic inventory and grabbing technology for metallurgical probes from the rack is crucial for completing the robotic automation transformation of the entire specialized metallurgical lance area. Summary of the Invention

[0003] To address the aforementioned deficiencies in the existing technology, the purpose of this invention is to provide an automatic inventory and gripping method for probes on a metallurgical probe rack. This method utilizes a detection device to arrange and inventory the probes placed on the probe rack, selects appropriate probes based on the inventory results for pre-grip positioning detection, and uses a clamping device to grip the probes. After the probes are gripped, an automatic probe attachment operation can be performed on the auxiliary gun.

[0004] To achieve the above objectives, the present invention adopts the following technical solution:

[0005] An automatic inventory and grabbing method for probes on a metallurgical probe rack, including an automatic inventory method and an automatic grabbing method;

[0006] The automatic inventory method involves installing both the detection device and the clamping device on the actuator at the end of a drive device (such as a multi-degree-of-freedom robot). The drive device drives the detection device to scan the metallurgical probe rack. The scan data is processed by a calculation unit to obtain the number and arrangement information of the probes on the metallurgical probe rack. Based on this information, the number and position information of the probe to be grabbed are determined.

[0007] The driving device then drives the detection device to scan the probe to be grasped. The scanning data is used by the calculation unit to obtain the position and orientation information of the probe. Based on this information, the clamping device grasps the probe using the automatic grasping method.

[0008] Preferably, the automatic inventory method includes the following steps:

[0009] Step a: Set up an array scanning area around the metallurgical probe rack, with the end of the probe to be grabbed on the metallurgical probe rack located within the array scanning area;

[0010] Step b: The detection device moves and scans along a certain coordinate axis in the fixed reference coordinate system O-XYZ in the array scanning area. Based on the difference between adjacent measured values ​​exceeding the set threshold or the jump of the digital signal, combined with the position change of the driving device itself, the number and arrangement information of the probes in the array scanning area are obtained by the calculation unit.

[0011] Step c: Based on the number and arrangement information of the probes in the inventory scanning area, and the preset probe grabbing order of the warehouse rack, send the number or location information of the probe to be grabbed to the control unit to complete the automatic judgment of the probes on the metallurgical probe warehouse rack; if the number and arrangement information of the probes in the inventory scanning area conflict with the preset information, then enter fault handling I.

[0012] Preferably, the automatic capture method includes the following steps:

[0013] Step 1: Set up an inventory result verification scanning area for the probe to be grabbed within the inventory scanning area, with the end of the probe to be grabbed located within the inventory result verification scanning area.

[0014] Step 2: The detection device moves and scans along a certain coordinate axis of the fixed reference coordinate system O-XYZ in the scanning area of ​​the inventory result verification. Based on the difference between adjacent measured values ​​exceeding the set threshold or the jump of the digital signal, combined with the position change of the driving device itself, the calculation unit determines whether there are other probes interfering with the probe to be grasped in the scanning area of ​​the inventory result verification. If not, proceed to step 3; if so, proceed to fault handling II.

[0015] Step 3: Set the measurement scanning area of ​​the axial direction and end face of the probe to be grasped within the scanning area of ​​the inventory result verification, with the end of the probe to be grasped located within the measurement scanning area;

[0016] Step 4: The detection device moves and scans along a certain coordinate axis in the fixed reference coordinate system O-XYZ in the measurement scanning area. Based on the difference between adjacent measured values ​​exceeding the set threshold or the jump of the digital signal, combined with the position change of the drive device itself, the calculation unit obtains the position and attitude information of the axial direction and end face of the probe to be grasped. If the measurement result meets the preset threshold range, proceed to step 5; otherwise, proceed to fault handling III.

[0017] Step 5: Based on the position and orientation information of the axial direction and end face of the probe being grasped, the clamping device adjusts its position and orientation to align with the position and orientation of the probe being grasped. The reading of the detection device is used as a reference for the alignment of position and orientation. If the reading of the detection device is correct, proceed to step 6. If the reading of the detection device is incorrect, make fine adjustments and continue to judge. If there is still an error after fine adjustments, proceed to fault handling IV.

[0018] Step 6: The clamping device closes. If the closing signal of the clamping device is correct and the reading of the detection device is within the preset range, the gripping is completed. The driving device drives the actuator to leave the metallurgical probe holder. If the closing signal of the clamping device is incorrect or the reading of the detection device is not within the preset range, the fault handling V is entered.

[0019] Preferably, the arrangement and scanning area is a cuboid, including three dimensional parameters: length L1, width W1, and height H1.

[0020] The inventory result verification scanning area is a cuboid, containing three dimensional parameters: length L2, width W2, and height H2.

[0021] The measurement scanning area is a cuboid, containing dimensional parameters in three dimensions: length L3, width W3, and height H3.

[0022] The L, W, and H dimensions of the layout scanning area, the inventory result verification scanning area, and the measurement scanning area are all aligned with the coordinate axes of the fixed reference coordinate system O-XYZ.

[0023] Preferably, the fault handling methods I to V include repeating the scan, leaving the scan area, and issuing an alarm.

[0024] Preferably, the specific handling methods for fault handling I to V are as follows:

[0025] The fault handling I: Repeat steps a to c p times. If the result of the i-th time is the same as that of the (i-1)-th time, and if the number and arrangement information of the probes in the arrangement and inventory scanning area still conflict with the preset information, then evacuate the arrangement and inventory scanning area and issue an alarm.

[0026] The fault handling II: Repeat steps a to c q times. If the correct probe to be grabbed is found, proceed to steps 1 and 2 to continue running.

[0027] Fault handling III: Remove the measurement and scanning area and issue an alarm;

[0028] The fault handling IV: After the first occurrence of this fault, the probe to be grasped is set to none. The control unit determines whether there are other probes that can be grasped in this case. If there are, the process proceeds to steps 1 to 4. After the nth occurrence of this fault, the measurement and scanning area is evacuated and an alarm is issued.

[0029] The fault handling method V is the same as that of fault handling IV.

[0030] The number of repetitions p, q, and n in fault handling I, II, and IV are set according to the actual application scenario.

[0031] Preferably, the opening of the clamping device is larger than the outer diameter of the probe to be grasped;

[0032] The drive device has at least three degrees of freedom.

[0033] Preferably, if the driving device has six or more degrees of freedom, then in step 4, the method for determining the axial attitude information of the probe to be grasped is as follows:

[0034] By finding a generatrix vector on the outer surface of the probe to be grasped, and combining it with the outer diameter information of the probe to be grasped, the axial attitude information of the probe to be grasped can be obtained.

[0035] The method for locating the position information of the upper surface of the probe to be captured is as follows:

[0036] Based on the axial posture information of the probe to be grasped, the detection device moves along the axial direction of the probe to be grasped to find the end face position of the probe to be grasped, thereby obtaining the end face position information of the probe to be grasped.

[0037] Preferably, the method for determining the axial attitude information of the probe to be grasped further includes:

[0038] When determining the probe, first determine the probe generatrix vector P. In a fixed reference coordinate system, denote the probe generatrix vector P as P(p1,p2,p3), and the standard axis vector A as A(a1,a2,a3). Based on the axis-angle transformation form, the vector P is determined by the rotation angle around the rotation axis R. We get A;

[0039] Among them, rotation angle for:

[0040]

[0041] The shaft R is:

[0042]

[0043] The unit vector R0 corresponding to the axis of rotation R is:

[0044]

[0045] Using Rodrigues' rotation formula, the rotation matrix T from vector P to vector A is obtained as follows:

[0046]

[0047] Based on the selected Euler angle order, the corresponding Euler angles are obtained, thereby determining the axial attitude information of the probe to be grasped.

[0048] Preferably, the metallurgical probe rack has a fixed placement slot for placing the probe;

[0049] The fixed placement slots between different layers include one or a combination of staggered and non-staggered types;

[0050] The spacing between the fixed placement slots on the same layer must meet the minimum space requirements for the clamping device to operate, and maintain a redundancy.

[0051] The detection device employs one or more of photoelectric sensors and point laser rangefinders, with at least one such sensor.

[0052] The automatic inventory and grabbing method for probes on a metallurgical probe rack provided by this invention has the following beneficial effects:

[0053] 1) The automatic inventory and grabbing method of the present invention uses a detection device to count and arrange the probes on the probe rack, and obtains the number and arrangement information of the probes on the probe rack. The data is complete and the measurement results are highly accurate.

[0054] 2) The automatic inventory and gripping method of the present invention first verifies the inventory results according to the number and arrangement information of the probes on the probe rack. If there is no interference, the axial direction and end face of the probe to be gripped are measured by the detection device, and the position and posture information are calculated. The drive device drives the clamping device on the actuator to complete the gripping of the probe. The measurement results are accurate and the gripping reliability is high. Attached Figure Description

[0055] Figure 1 This is a schematic diagram of the driving device, actuator, detection device, clamping device, metallurgical probe rack, probe, probe to be grasped, and fixed reference coordinate system in the automatic inventory and grasping method of the present invention.

[0056] Figure 2 This is a schematic diagram of the driving device, the execution mechanism, the detection device, and the clamping device in the automatic inventory and grasping method of the present invention;

[0057] Figure 3 This is a schematic diagram showing two types of metallurgical probe racks used in the automatic inventory and grabbing method of the present invention: staggered and non-staggered.

[0058] Figure 4 This is a schematic diagram of the drive device, actuator, detection device, and clamping device in the automatic inventory and gripping method of the present invention at the scanning preparation position of two types of metallurgical probe racks;

[0059] Figure 5 This is a schematic diagram of a metallurgical probe rack filled with probes in the automatic inventory and grabbing method of the present invention.

[0060] Figure 6 This is a schematic diagram of the automatic inventory and grabbing method of the present invention, in which the metallurgical probe rack is not fully covered with probes and the probes to be grabbed have been identified.

[0061] Figure 7 This is a schematic diagram of the arrangement of the inventory scanning area in the automatic inventory and grasping method of the present invention;

[0062] Figure 8 This is a schematic diagram of the scanning area for checking inventory results in the automatic inventory and capture method of the present invention;

[0063] Figure 9 This is a schematic diagram of the measurement and scanning area in the automatic inventory and grasping method of the present invention;

[0064] Figure 10 This is a schematic diagram of the measurement scanning path of the detection device in the measurement scanning area of ​​the automatic inventory and grasping method of the present invention for the probe to be grasped;

[0065] Figure 11 This is a schematic diagram illustrating the principle of the automatic inventory and grasping method of the present invention, which involves scanning the axial direction and end face of the probe to be grasped and then processing the scanning results.

[0066] Figure 12 yes Figure 11 A schematic diagram of the relevant parameters for coordinate transformation.

[0067] Reference numerals in the attached figures: 1. Drive device; 2. Actuator; 3. Detection device; 4. Clamping device; 5. Metallurgical probe rack; 6. Probe; 7. Probe to be grabbed; 8. Fixed reference coordinate system; 9. Layout of inventory scanning area; 10. Inventory result verification scanning area; 11. Measurement scanning area for the probe to be grabbed; 12. Measurement scanning path for the probe to be grabbed; 13. Reference coordinate system for scanning result processing. Detailed Implementation

[0068] To better understand the above-mentioned technical solutions of the present invention, the technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0069] Combination Figures 1 to 6 As shown, the automatic inventory and gripping method for probes on a metallurgical probe rack provided by this invention employs a drive device 1 with an actuator 2 mounted on it. The actuator 2 is equipped with a detection device 3 and a clamping device 4. In a preferred embodiment, the drive device 1 drives the actuator 2, causing the detection device 3 to scan and inventory the probes 6 on the probe rack 5. After completing the scan and inventory, the probe 7 to be gripped is identified, and then a pre-grip inventory check is performed, followed by gripping and measurement to complete the gripping operation.

[0070] Combination Figure 7 As shown, the automatic inventory method for probes 6 on the metallurgical probe rack 5 includes the following steps:

[0071] Step a: Set up an inventory scanning area 9 around the metallurgical probe rack 5. The inventory scanning area 9 is a cuboid with three dimensional parameters: length L1, width W1 and height H1. The end of the probe 6 on the metallurgical probe rack 5 is located within the inventory scanning area 9.

[0072] Step b: Drive device 1 drives actuator 2 to use detection device 3 to move and scan in the layout and inventory scanning area 9 along the +Y direction of the fixed reference coordinate system 8O-XYZ to obtain the number and layout information of probe 6 in the layout and inventory scanning area 9.

[0073] Step c: Based on the number and arrangement of probes 6 within the inventory scanning area 9, and the preset probe grabbing order, the probe number or location information to be grabbed 7 can be sent to the control unit to complete the automatic inventory of probes 6 on the metallurgical probe rack 5. If the number and arrangement of probes 6 within the inventory scanning area 9 conflict with the preset information, fault handling I will be initiated.

[0074] Combination Figures 8 to 10 As shown, the automatic gripping method for the probe 6 on the metallurgical probe rack 5 includes the following steps:

[0075] Step 1: Set up the inventory result verification scanning area 10 of the probe 7 to be grabbed within the inventory scanning area 9. The inventory result verification scanning area 10 is a cuboid with three dimensions: length L2, width W2 and height H2. The end of the probe 7 to be grabbed is located within the inventory result verification scanning area 10.

[0076] Step 2: Drive device 1 drives actuator 2 to use detection device 3 to move and scan the inventory result verification scanning area 10 along the +Y direction of the fixed reference coordinate system 8O-XYZ. Based on the difference between adjacent measured values ​​exceeding the set threshold or the jump of digital signal, combined with the position change of drive device 2 itself, the calculation unit can determine whether there are other probes 6 in the inventory result verification scanning area 10 that interfere with the probe 7 to be grasped. If not, proceed to step 3; if so, proceed to fault handling II.

[0077] Step 3: Set up a measurement scanning area 11 for the axial direction and end face of the probe 7 to be grasped within the inventory result verification scanning area 10 of the probe 7 to be grasped. The measurement scanning area 11 of the probe 7 to be grasped is a cuboid, which includes three dimensions: length L3, width W3 and height H3. The end of the probe 7 to be grasped is located within the measurement scanning area 11.

[0078] Step 4: The drive device 1 drives the actuator 2 to use the detection device 3 to move and scan the measurement scanning area 11 of the probe 7 to be grasped along the +Y direction of the fixed reference coordinate system 8O-XYZ. Based on the difference between the measured adjacent values ​​exceeding the set threshold or the jump of the digital signal, combined with the position change of the drive device 2 itself, the axial and end face position and attitude information of the probe 7 to be grasped can be obtained by the calculation unit. If the measurement result meets the preset threshold range, proceed to step 5; otherwise, proceed to fault handling III.

[0079] Step 5: Based on the axial and end face position and attitude information of the probe 7 to be grasped, the clamping device 4 on the actuator 2 is driven by the drive device 1 to adjust its position and attitude so that the clamping device 4 is aligned with the position and attitude of the probe 7 to be grasped. The reading of the detection device 3 can be used as a rough reference for the alignment of position and attitude. If the reading of the detection device 3 is correct, proceed to step 6. If there is an error, make fine adjustments and continue to judge. If there is still an error after fine adjustments, proceed to fault handling IV.

[0080] Step 6: The clamping device 4 on the actuator 2 closes. If the closing signal of the clamping device 4 is correct and the reading of the detection device 3 is within the preset range, the gripping is completed, and the drive device 1 drives the actuator 2 to leave the metallurgical probe holder 5. If the closing signal of the clamping device 4 is incorrect or the reading of the detection device 3 is not within the preset range, the fault handling V is entered.

[0081] The troubleshooting methods for fault handling I to V include repeating the scan, leaving the scan area, and issuing an alarm.

[0082] The specific methods for handling faults I to V are as follows:

[0083] Fault Handling I: Repeat steps a to c twice. If the result of the second time is the same as that of the first time, and if the number and arrangement information of probes 6 in the arrangement and scanning area 9 still conflict with the preset information, then remove the arrangement and scanning area 9 and issue an alarm.

[0084] Troubleshooting II: Repeat steps a to c once. If the correct probe 7 to be captured is found, proceed to steps 1 and 2 to continue running.

[0085] Fault Handling III: Retreat from the measurement and scanning area and issue an alarm;

[0086] Fault Handling IV: After the first occurrence of this fault, the probe 7 to be grabbed is set to none. The control unit determines whether there are other probes to be grabbed in this situation. If there are, proceed to steps 1 to 4. After the second occurrence of this fault, the measurement scanning area 11 is evacuated and an alarm is issued.

[0087] Troubleshooting V: The handling method is the same as that for Troubleshooting IV.

[0088] Specifically, in step a, the arrangement of the inventory scanning area 9 should completely cover the metallurgical probe rack 5 which is filled with probes 6, and the L1 dimension, W1 dimension and H1 dimension should have a certain scale of redundancy.

[0089] Method 1 for determining the number and arrangement of probes 6 in step b: The driving device 1 matches the approximate position of all probes 6 on the metallurgical probe rack 5. If a signal change of the detection device 3 is detected near the relevant probe 6, then probe 6 exists at that position. The number and arrangement of probes 6 can be obtained by moving the detection device 3 along the +Y direction. Method 2: The driving device 1 matches the approximate position of all probes 6 on the metallurgical probe rack 5. If a change in the measured value of the detection device 3 is detected near the relevant probe 6, and the measured value is close to the position of probe 6 in the Z direction, then probe 6 exists at that position. The number and arrangement of probes 6 can be obtained by moving the detection device 3 along the +Y direction.

[0090] The preset information in step c generally refers to the inheritance of information after the last automatic inventory and capture, or it can be the number and arrangement information of probes 6 on the metallurgical probe rack 5 obtained through the means.

[0091] In step 1, the scanning area 10 for inventory result verification must completely cover the probe 6 in the area above the probe 7 to be captured, and a certain amount of redundancy must be left in the L2, W2 and H2 dimensions.

[0092] In step 2, one method for determining whether there are other probes 6 interfering with the probe 7 to be grasped is as follows: The driving device 1 matches the approximate positions of all probes 6 in the inventory result verification scanning area 10 on the metallurgical probe rack 5. If a signal jump of the detection device 3 is detected near the relevant probe 6, then the probe 6 at that position is present. The detection device 3 can determine whether there are other probes 6 interfering with the probe 7 to be grasped by moving along the +Y direction in the inventory result verification scanning area 10. The other method is as follows: The driving device 1 matches the approximate positions of all probes 6 in the inventory result verification scanning area 10 on the metallurgical probe rack 5. If a change in the measurement value of the detection device 3 is detected near the relevant probe 6, and the measurement value is close to the position of the probe 6 at that position in the Z direction, then the probe 6 at that position is present. The detection device 3 can determine whether there are other probes 6 interfering with the probe 7 to be grasped by moving along the +Y direction in the inventory result verification scanning area 10.

[0093] The L, W, and H dimensions of the inventory scanning area 9, the inventory result verification scanning area 10 of the probe 7 to be grasped, and the axial and end face measurement scanning area 11 of the probe 7 to be grasped are all aligned on the periphery of the metallurgical probe rack 5. In this embodiment, the Y direction of the fixed reference coordinate system 8O-XYZ is aligned with the L dimension, the X direction is aligned with the W dimension, and the Z direction is aligned with the H dimension.

[0094] Combination Figure 11 and Figure 12 As shown, if the drive device 1 has six or more degrees of freedom, the method for determining the axial attitude information of the probe 7 to be grasped further includes:

[0095] To determine the direction, first obtain the probe generatrix vector P. In a fixed reference coordinate system, denote the probe generatrix vector P as P(p1,p2,p3), and the standard axis vector A as A(a1,a2,a3). Based on the axis-angle transformation form, the vector P is determined by the rotation angle around the rotation axis R. We get A;

[0096] Among them, rotation angle for:

[0097]

[0098] The shaft R is:

[0099]

[0100] The unit vector R0 corresponding to the axis of rotation R is:

[0101]

[0102] Using Rodrigues' rotation formula, the rotation matrix T from vector P to vector A is obtained as follows:

[0103]

[0104] Based on the selected Euler angle order, the corresponding Euler angles are obtained, thereby determining the axial attitude information of the probe 7 to be grasped.

[0105] Those skilled in the art should recognize that the above embodiments are merely illustrative of the present invention and are not intended to limit the present invention. Any variations or modifications to the above embodiments that are within the spirit and essence of the present invention will fall within the scope of the claims of the present invention.

Claims

1. An automatic inventory and grabbing method for probes on a metallurgical probe rack, characterized in that: This includes automatic inventory methods and automatic data capture methods; The automatic inventory method involves installing both the detection device and the clamping device on the actuator at the end of the drive device. The drive device drives the detection device to scan the metallurgical probe rack. The scan data is processed by the calculation unit to obtain the number and arrangement information of the probes on the metallurgical probe rack. Based on this information, the number and position information of the probe to be grabbed are determined. The driving device then drives the detection device to scan the probe to be grasped. The scanning data is processed by the calculation unit to obtain the position and orientation information of the probe. Based on this information, the clamping device grasps the probe using the automatic grasping method. The automatic inventory method further includes the following steps: Step a: Set up an array scanning area around the metallurgical probe rack, with the end of the probe to be grabbed on the metallurgical probe rack located within the array scanning area; Step b: The detection device moves and scans along a certain coordinate axis in the fixed reference coordinate system O-XYZ in the array scanning area. Based on the difference between adjacent measured values ​​exceeding the set threshold or the jump of the digital signal, combined with the position change of the driving device itself, the number and arrangement information of the probes in the array scanning area are obtained by the calculation unit. Step c: Based on the number and arrangement information of the probes within the inventory scanning area, and the preset probe grabbing order, send the number or location information of the probes to be grabbed to the control unit to complete the automatic judgment of the probes on the metallurgical probe rack; if the number and arrangement information of the probes within the inventory scanning area conflict with the preset information, then enter fault handling I. The automatic capture method includes the following steps: Step 1: Set up an inventory result verification scanning area for the probe to be grabbed within the inventory scanning area, with the end of the probe to be grabbed located within the inventory result verification scanning area. Step 2: The detection device moves and scans along a certain coordinate axis of the fixed reference coordinate system O-XYZ in the scanning area of ​​the inventory result verification. Based on the difference between adjacent measured values ​​exceeding the set threshold or the jump of the digital signal, combined with the position change of the driving device itself, the calculation unit determines whether there are other probes interfering with the probe to be grasped in the scanning area of ​​the inventory result verification. If not, proceed to step 3; if so, proceed to fault handling II. Step 3: Set the measurement scanning area of ​​the axial direction and end face of the probe to be grasped within the scanning area of ​​the inventory result verification, with the end of the probe to be grasped located within the measurement scanning area; Step 4: The detection device moves and scans along a certain coordinate axis in the fixed reference coordinate system O-XYZ in the measurement scanning area. Based on the difference between adjacent measured values ​​exceeding the set threshold or the jump of the digital signal, combined with the position change of the drive device itself, the calculation unit obtains the position and attitude information of the axial direction and end face of the probe to be grasped. If the measurement result meets the preset threshold range, proceed to step 5; otherwise, proceed to fault handling III. Step 5: Based on the position and orientation information of the axial direction and end face of the probe being grasped, the clamping device adjusts its position and orientation to align with the position and orientation of the probe being grasped. The reading of the detection device is used as a reference for the alignment of position and orientation. If the reading of the detection device is correct, proceed to step 6. If the reading of the detection device is incorrect, make fine adjustments and continue to judge. If there is still an error after fine adjustments, proceed to fault handling IV. Step 6: The clamping device closes. If the closing signal of the clamping device is correct and the reading of the detection device is within the preset range, the gripping is completed. The driving device drives the actuator to leave the metallurgical probe holder. If the closing signal of the clamping device is incorrect or the reading of the detection device is not within the preset range, the fault handling V is entered.

2. The automatic inventory and grabbing method for probes on a metallurgical probe rack according to claim 1, characterized in that: The layout and inventory scanning area is a cuboid, containing three dimensional parameters: length L1, width W1, and height H1. The inventory result verification scanning area is a cuboid, containing three dimensional parameters: length L2, width W2, and height H2. The measurement scanning area is a cuboid, containing dimensional parameters in three dimensions: length L3, width W3, and height H3. The L, W, and H dimensions of the layout scanning area, the inventory result verification scanning area, and the measurement scanning area are all aligned with the coordinate axes of the fixed reference coordinate system O-XYZ.

3. The automatic inventory and grabbing method for probes on a metallurgical probe rack according to claim 1, characterized in that: The fault handling methods I to V include repeating the scan, leaving the scan area, and issuing an alarm.

4. The automatic inventory and grabbing method for probes on a metallurgical probe rack according to claim 3, characterized in that, The specific handling methods for fault handling I to V are as follows: The fault handling I: Repeat steps a to c p times. If the result of the i-th time is the same as that of the (i-1)-th time, and if the number and arrangement information of the probes in the arrangement and inventory scanning area still conflict with the preset information, then evacuate the arrangement and inventory scanning area and issue an alarm. The fault handling II: Repeat steps a to c q times. If the correct probe to be grabbed is found, proceed to steps 1 and 2 to continue running. Fault handling III: Remove the measurement and scanning area and issue an alarm; The fault handling IV: After the first occurrence of this fault, the probe to be grasped is set to none. The control unit determines whether there are other probes that can be grasped in this case. If there are, the process proceeds to steps 1 to 4. After the nth occurrence of this fault, the measurement and scanning area is evacuated and an alarm is issued. The fault handling method V is the same as that of fault handling IV. The number of repetitions p, q, and n in fault handling I, II, and IV are set according to the actual application scenario.

5. The automatic inventory and grabbing method for probes on a metallurgical probe rack according to claim 1, characterized in that: The opening of the clamping device is larger than the outer diameter of the probe to be grasped; The drive device has at least three degrees of freedom.

6. The automatic inventory and grabbing method for probes on a metallurgical probe rack according to claim 5, characterized in that, If the driving device has six or more degrees of freedom, then in step 4, the method for determining the axial attitude information of the probe to be grasped is as follows: By finding a generatrix vector on the outer surface of the probe to be grasped, and combining it with the outer diameter information of the probe to be grasped, the axial attitude information of the probe to be grasped can be obtained. The method for locating the position information of the upper surface of the probe to be captured is as follows: Based on the axial posture information of the probe to be grasped, the detection device moves along the axial direction of the probe to be grasped to find the end face position of the probe to be grasped, thereby obtaining the end face position information of the probe to be grasped.

7. The automatic inventory and grabbing method for probes on a metallurgical probe rack according to claim 6, characterized in that, The method for determining the axial attitude information of the probe to be captured further includes: When determining the probe, first determine the probe generatrix vector P. In a fixed reference coordinate system, denote the probe generatrix vector P as P(p1,p2,p3), and the standard axis vector A as A(a1,a2,a3). Based on the axis-angle transformation form, the vector P is determined by the rotation angle around the rotation axis R. We get A; Among them, rotation angle for: The shaft R is: The unit vector R0 corresponding to the axis of rotation R is: Using Rodrigues' rotation formula, the rotation matrix T from vector P to vector A is obtained as follows: Based on the selected Euler angle order, the corresponding Euler angles are obtained, thereby determining the axial attitude information of the probe to be grasped.

8. The automatic inventory and grabbing method for probes on a metallurgical probe rack according to claim 1, characterized in that: The metallurgical probe rack has a fixed placement slot for placing the probe; The fixed placement slots between different layers include one or a combination of staggered and non-staggered placement methods; The spacing between the fixed placement slots on the same layer must meet the minimum space requirements for the clamping device to operate, and maintain a redundancy. The detection device employs one or more of photoelectric sensors and point laser rangefinders, with at least one such sensor.

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