Method, device and equipment for determining offset of wave, and storage medium

Abstract

Embodiments of the present application provide a method, device and equipment for determining the offset of a wave, and a storage medium. The method comprises: obtaining loss data of the wave at a first operating temperature; determining whether the loss data meets the requirements of a preset index; and in the case that the loss data meets the requirements of the preset index, determining a target offset of the wave at the first operating temperature based on the loss data and the preset index. By obtaining the loss data of the wave at the first operating temperature, and combining the requirements of the preset index corresponding to the loss data, the target offset of the wave at the first operating temperature is determined, and the chips are screened according to the target offset, which ensures the qualified rate of finished products and improves the utilization rate of chips.

Description

Technical Field

[0001] This invention relates to the field of optical fiber communication technology, and more specifically to a method, apparatus, device, and storage medium for determining wave offset. Background Technology

[0002] In optical communication systems, especially in wavelength division multiplexing (WDM) optical networks, filters are core components. Filters can typically be placed in front of a photodetector to form a tuned receiver, or they can be placed inside a laser cavity to form a wavelength-tunable light source. Filters have a wide range of applications.

[0003] In practical applications, changes in ambient temperature can cause changes in filter insertion loss and wavelength shift. Furthermore, wavelength shift can further cause changes in filter insertion loss, bandwidth, and crosstalk performance. Therefore, when selecting components or chips for room temperature applications, a certain degree of redundancy needs to be considered. If necessary, a temperature compensation packaging scheme should also be adopted to ensure that the filter performance meets certain requirements within the operating temperature range, thereby guaranteeing the normal operation of the optical communication network.

[0004] The selection of specifications for room temperature applications requires consideration of a certain degree of redundancy. Since chips account for a significant portion of product costs, minimizing redundancy is generally preferable to ensure chip utilization. However, in production, product yield is a critical indicator, and the manufacturing process for filters is complex and multifaceted, with each process using the previous one as raw material for the next. Given the inherent volatility of manufacturing processes, a smaller redundancy in chip specification selection often leads to a lower yield in subsequent processes, resulting in a contradictory situation of a lower final product yield. Therefore, improving chip utilization in earlier processes while ensuring the yield of later processes is a pressing issue that needs to be addressed.

[0005] There is currently no effective solution to the above problems. Summary of the Invention

[0006] In view of this, the main objective of the present invention is to provide a method, apparatus, device and storage medium for determining the offset of a wave.

[0007] To achieve the above objectives, the technical solution of the present invention is implemented as follows:

[0008] This invention provides a method for determining the offset of a wave, comprising:

[0009] Obtain the loss data of the wave at the first operating temperature;

[0010] Determine whether the loss data meets the requirements of the preset indicators;

[0011] If the loss data meets the requirements of the preset index, the target offset of the wave at the first operating temperature is determined based on the loss data and the preset index.

[0012] In the above scheme, the loss data includes the accuracy data of the wave; the preset index includes the accuracy index; the method further includes:

[0013] Determine the first wavelength data of the wave at the first operating temperature;

[0014] The first wavelength data is processed based on a preset method to determine the accuracy data of the wave at the first operating temperature;

[0015] If the accuracy data meets the requirements of the accuracy index, the target offset of the wave at the first operating temperature is determined based on the accuracy data and the accuracy index.

[0016] In the above scheme, the loss data includes the insertion loss data of the wave; the preset index includes the insertion loss index; the method further includes:

[0017] Based on the insertion loss data, the second wavelength data of the wave at the first operating temperature is determined;

[0018] Based on the insertion loss index, the third wavelength data of the wave at the first operating temperature is determined;

[0019] If the insertion loss data meets the requirements of the insertion loss index, the target offset of the wave at the first operating temperature is determined based on the second wavelength data and the third wavelength data.

[0020] In the above scheme, the loss data includes the bandwidth data of the wave, and the bandwidth data includes first bandwidth data and second bandwidth data; the preset index includes a bandwidth index; the method further includes:

[0021] Determine the fourth wavelength data of the wave at the first operating temperature;

[0022] The first bandwidth data and the second bandwidth data are determined based on the fourth wavelength data;

[0023] If the first bandwidth data and the second bandwidth data meet the requirements of the bandwidth index, the target offset of the wave at the first operating temperature is determined based on the bandwidth index.

[0024] In the above scheme, the loss data includes the crosstalk data of the wave; the preset index includes the crosstalk index; the method further includes:

[0025] If the crosstalk data meets the requirements of the crosstalk index, the target offset of the wave at the first operating temperature is determined based on the crosstalk data and the crosstalk index.

[0026] In the above scheme, the method further includes:

[0027] Obtain the first loss data from a plurality of loss data of the wave at a first operating temperature; wherein the first loss data is any one of the plurality of loss data;

[0028] The first offset of the wave at the first operating temperature is determined based on the first loss data and a first preset index among a plurality of preset indicators; wherein, the first preset index characterizes an index corresponding to the first loss data.

[0029] Based on the first offset and the second loss data among the plurality of loss data, the target offset of the wave at the first operating temperature is determined; wherein, the second loss data represents any loss data among the plurality of loss data other than the first loss data.

[0030] In the above scheme, after determining the target offset of the wave at the first operating temperature based on the loss data at the first operating temperature and the preset index, the method further includes:

[0031] Obtain the loss data of the wave at a second operating temperature; wherein, the second operating temperature represents any operating temperature other than the first operating temperature;

[0032] Determine whether the loss data at the second operating temperature meets the requirements of the preset index;

[0033] If the loss data at the second operating temperature meets the requirements of the preset index, the target offset of the wave at the second operating temperature is determined based on the loss data at the second operating temperature and the preset index.

[0034] The operating offset of the wave is determined based on the target offset at the first operating temperature and the target offset at the second operating temperature.

[0035] This invention provides a device for determining the offset of a wave, the device comprising: an interaction module, a control module, a storage module, and a calculation module; the control module is connected to the interaction module, the storage module, and the calculation module respectively.

[0036] The interaction module is used to input calculation instructions and send the calculation instructions to the control module;

[0037] The control module is used to receive the operation instruction, retrieve the operation task corresponding to the operation instruction from the storage module, and allocate the operation task to the operation module.

[0038] The calculation module is used to receive the calculation task, calculate the offset of the wave based on the calculation task, and store the offset of the wave as the calculation result in the storage module.

[0039] The storage module is used to store the computation task corresponding to the computation instruction, and to store the computation result.

[0040] In the above scheme, the device includes:

[0041] The control module is also used to send the calculation results stored in the storage module to the interaction module;

[0042] The interaction module is also used to receive and display the calculation results sent by the control module.

[0043] In the above scheme, the computing module includes: a laser emitting unit, a polarization control unit, a beam splitting unit, a filter under test, a power monitoring unit, and a computing unit;

[0044] The laser emitting unit is used to emit laser light with a specific wavelength;

[0045] The polarization control unit is used to control the laser traversal polarization state;

[0046] The beam splitting unit is used to split the laser beam into multiple paths;

[0047] The filter under test is used to transmit the laser;

[0048] The power monitoring unit is used to monitor the optical power of the laser;

[0049] The computing unit is used to calculate the offset of the wave based on the wavelength-transmittance data corresponding to the optical power.

[0050] This invention provides a device for determining the offset of a wave, comprising:

[0051] The first acquisition module is used to acquire the loss data of the wave at the first operating temperature;

[0052] The judgment module is used to determine whether the loss data meets the requirements of the preset index.

[0053] The first determining module is used to determine the target offset of the wave at the first operating temperature based on the loss data and the preset index, provided that the loss data meets the requirements of the preset index.

[0054] This invention provides a device for determining the offset of a wave, including a memory and a processor. The memory stores a computer program that can run on the processor, and the processor executes the program to implement the steps in the method described above.

[0055] This invention provides a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the steps of the method described above.

[0056] This invention provides a method, apparatus, device, and storage medium for determining wave offset. The method includes: acquiring wave loss data at a first operating temperature; determining whether the loss data meets the requirements of a preset indicator; and, if the loss data meets the preset indicator requirements, determining a target wave offset at the first operating temperature based on the loss data and the preset indicator. By acquiring the wave loss data at the first operating temperature and combining it with the preset indicator requirements corresponding to the loss data, the target wave offset at the first operating temperature is determined. Chips are then screened based on the target offset, ensuring a high chip yield rate. Attached Figure Description

[0057] Figure 1 This is a schematic diagram illustrating the implementation process of the method for determining the offset of a wave according to an embodiment of the present invention;

[0058] Figure 2 This is a schematic diagram of the wavelength-transmittance curve of the filter under normal temperature conditions, which is the method for determining the wave offset in an embodiment of the present invention.

[0059] Figure 3 This is a partially enlarged schematic diagram of the wavelength-transmittance curve of the filter under normal temperature conditions, which is the method for determining the wave offset in an embodiment of the present invention.

[0060] Figure 4 This is a schematic diagram illustrating the definition of center wavelength and wavelength accuracy in the method for determining wave offset according to an embodiment of the present invention.

[0061] Figure 5 This is a schematic diagram illustrating the definition of insertion loss in the wave offset determination method of this invention.

[0062] Figure 6 This is a schematic diagram illustrating the bandwidth definition in the wave offset determination method of this invention.

[0063] Figure 7 This is a schematic diagram illustrating the crosstalk definition in the wave offset determination method of this invention.

[0064] Figure 8This is a schematic diagram of the composition of the device for determining the offset of a wave according to an embodiment of the present invention;

[0065] Figure 9 This is a schematic diagram of the composition of the device for determining the offset of a wave according to an embodiment of the present invention;

[0066] Figure 10 This is a schematic diagram of a hardware entity structure of a device for determining the offset of a wave according to an embodiment of the present invention. Detailed Implementation

[0067] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the specific technical solutions of the invention will be further described in detail below with reference to the accompanying drawings of the embodiments of the present invention. The following embodiments are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0068] In related technologies, temperature variations in the optical communication network environment can cause changes in filter specifications. Therefore, a certain degree of redundancy needs to be considered when selecting specifications for room temperature or chip performance. In production, chips account for a significant proportion of product cost. To ensure chip utilization, it is generally desirable to minimize the redundancy in filter chip specification selection. However, considering the volatility of manufacturing processes, especially temperature compensation, smaller redundancy in specification selection can lead to a contradictory phenomenon: a lower final product yield. To address this contradiction, this embodiment proposes a wavelength offset specification for filters, based on which chips and temperature compensation designs are selected, improving chip utilization while ensuring product yield.

[0069] This embodiment proposes a method for determining the offset of a wave. This method is applied to a wave offset determination device. The function implemented by this method can be achieved by the processor in the wave offset determination device calling program code. Of course, the program code can be stored in a computer storage medium. It can be seen that the computing device includes at least a processor and a storage medium.

[0070] Figure 1 This is a schematic diagram illustrating the implementation process of the wave offset determination method according to an embodiment of the present invention, as shown below. Figure 1 As shown, the method includes:

[0071] Step 101: Obtain the loss data of the wave at the first operating temperature;

[0072] Step 102: Determine whether the loss data meets the requirements of the preset indicators;

[0073] Step 103: If the loss data meets the requirements of the preset index, determine the target offset of the wave at the first operating temperature based on the loss data and the preset index.

[0074] In step 101: the process for determining the wave offset can be determined according to the actual situation and is not limited here. As an example, the method for determining the wave offset can be a method for evaluating the offset of a filter wavelength.

[0075] The first operating temperature can be determined based on actual conditions and is not limited here. As an example, the first operating temperature can be any temperature under normal conditions. The loss data can be data of the defined indicators of the wave at the first operating temperature. The loss data is related to the first operating temperature. Specifically, the loss data can be any of the following: accuracy data, insertion loss data, bandwidth data, and crosstalk data. The loss data can also be indicator data such as passband flatness data and polarization-related loss data, and the calculation method for the corresponding wave offset is the same.

[0076] In step 102: the preset index can be a defined index of the wave related to the loss data. Specifically, the preset index can be any one of the following: accuracy index, insertion loss index, bandwidth index, and crosstalk index. Determining whether the loss data meets the requirements of the preset index can be done by determining whether the accuracy data meets the accuracy index requirements, or whether the insertion loss data meets the insertion loss index requirements, or whether the bandwidth data meets the bandwidth index requirements, or whether the crosstalk data meets the crosstalk index requirements.

[0077] In step 103: the process of determining the target offset of the wave at the first operating temperature based on the loss data and the preset index can be determined according to the actual situation and is not limited here. As an example, the target offset of the wave at the first operating temperature can be determined based on wavelength-transmittance data, combined with the loss data and the preset index.

[0078] This invention provides a method for determining the offset of a wave. The method involves acquiring wave loss data at a first operating temperature; determining whether the loss data meets the requirements of a preset indicator; and, if the loss data meets the preset indicator, determining the target offset of the wave at the first operating temperature based on the loss data and the preset indicator. By acquiring the wave loss data at the first operating temperature and combining it with the preset indicator requirements corresponding to the loss data, the target offset of the wave at the first operating temperature is determined. Chips are then screened based on the target offset, ensuring both the finished product qualification rate and the chip utilization rate.

[0079] In an optional embodiment of the present invention, the loss data includes the accuracy data of the wave; the preset index includes the accuracy index; and the method further includes:

[0080] Determine the first wavelength data of the wave at the first operating temperature;

[0081] The first wavelength data is processed based on a preset method to determine the accuracy data of the wave at the first operating temperature;

[0082] If the accuracy data meets the requirements of the accuracy index, the target offset of the wave at the first operating temperature is determined based on the accuracy data and the accuracy index.

[0083] In this embodiment, the first wavelength data can be determined according to the actual situation, and is not limited here. As an example, the first wavelength data can be the center wavelength, which represents the wavelength value corresponding to the center of the spectral range covered by the peak insertion loss decrease ndB.

[0084] The accuracy index can be determined based on the actual situation and is not limited here. As an example, the accuracy index can be the wavelength accuracy requirement.

[0085] The process of determining the first wavelength data of the wave at the first operating temperature can be determined according to the actual situation and is not limited here. As an example, based on the wavelength-transmittance data under the first operating temperature condition, the center wavelength corresponding to the center of the spectral range covered by the peak insertion loss decrease ndB is determined.

[0086] The step of processing the first wavelength data based on a preset method to determine the accuracy data of the wave at the first operating temperature can be as follows: a preset wavelength data is determined according to a preset criterion, and the preset wavelength data and the first wavelength data are processed based on the preset method to determine the accuracy data of the wave at the first operating temperature.

[0087] The determination of the preset wavelength data based on preset criteria can be determined according to actual circumstances and is not limited here. As an example, one of the ITU wavelengths can be selected according to the International Telecommunication Union (ITU) standards.

[0088] Based on the preset method, the preset wavelength data and the first wavelength data are processed to determine the accuracy data of the wave at the first operating temperature. This can be achieved by subtracting the first wavelength data and the preset wavelength data to determine the accuracy data of the wave at the first operating temperature.

[0089] When the accuracy data meets the requirements of the accuracy index, determining the target offset of the wave at the first operating temperature based on the accuracy data and the accuracy index can be achieved by subtracting each accuracy value in the accuracy index from the accuracy data to obtain the target offset of the wave at the first operating temperature. The target offset can be an accuracy offset, and the accuracy offset can be a range of possible accuracy offsets.

[0090] For ease of understanding, we can assume a 48-channel filter (wavelength division multiplexer) with a channel spacing of 100GHz, and starting frequencies of 196100GHz and 191400GHz respectively. According to the ITU standard, one of the ITU wavelengths is selected as λ. ITU =1529.553nm(f ITU =196000GHz) channel. Figure 2 This is a schematic diagram of the wavelength-transmittance curve of the filter under normal temperature conditions, illustrating the method for determining wave offset according to an embodiment of the present invention. Figure 2 The ordinate represents transmittance. Figure 2 The horizontal axis represents wavelength. In related technologies, insertion loss and transmittance have an inverse relationship. The wavelength-transmittance data of the channel at room temperature (25°C) are as follows: Figure 2 As shown. Figure 2 Local magnification, Figure 3 This is a partially enlarged schematic diagram of the wavelength-transmittance curve of the filter under normal temperature conditions, as shown in the embodiment of the method for determining the wave offset of the present invention. Figure 3 The ordinate represents transmittance. Figure 3 The horizontal axis represents wavelength. Wavelength-transmittance data for wavelengths selected between 1524-1534 nm are shown below. Figure 3 As shown. Figure 4 This is a schematic diagram illustrating the definition of center wavelength and wavelength accuracy in the method for determining wave offset according to an embodiment of the present invention, as shown below. Figure 4 As shown, based on the wavelength-transmittance data of this channel at room temperature (25℃), the center wavelength λ corresponding to the center of the spectral range covered by the 3dB peak insertion loss reduction is determined. c The wavelength is 1529.526 nm. The accuracy data of the wave is calculated as shown in formula (1):

[0091] Δλ=λ c -λ ITU (1)

[0092] In equation (1), Δλ represents the wave precision data. Based on the above equation (1), the wave precision data Δλ is determined to be -27 pm. Based on the wavelength precision requirement Δλ... WA [-40,40]pm, the wave accuracy is determined to meet the wavelength accuracy requirement, and the wave accuracy offset is calculated as shown in formula (2):

[0093] Δλ range =Δλ WA +λ ITU -λ C (2)

[0094] In equation (2), Δλ range Let be the accuracy offset of the wave. According to the above formula (2), the accuracy offset range of the wave at a normal temperature of 25℃ is calculated to be [-13, 67] pm.

[0095] In an optional embodiment of the present invention, the loss data includes the insertion loss data of the wave; the preset index includes the insertion loss index; and the method further includes:

[0096] Based on the insertion loss data, the second wavelength data of the wave at the first operating temperature is determined;

[0097] Based on the insertion loss index, the third wavelength data of the wave at the first operating temperature is determined;

[0098] If the insertion loss data meets the requirements of the insertion loss index, the target offset of the wave at the first operating temperature is determined based on the second wavelength data and the third wavelength data.

[0099] In this embodiment, the insertion loss data can be determined according to the actual situation. The insertion loss data can be the maximum insertion loss within the effective bandwidth of the channel, the peak insertion loss, or the center wavelength insertion loss, and is not limited here. The calculation method for the wavelength offset is the same. As an example, the insertion loss data can be the maximum insertion loss within the effective bandwidth of the channel.

[0100] The determination of the second wavelength data of the wave at the first operating temperature based on the insertion loss data can be achieved by determining the second wavelength data of the wave at the first operating temperature based on the maximum insertion loss within the effective bandwidth of the channel and the wavelength-transmittance data of the wave at room temperature.

[0101] The insertion loss metric can be determined based on actual conditions and is not limited here. The insertion loss metric can be the insertion loss requirement within the effective bandwidth. As an example, the insertion loss metric can be within 6dB within the effective bandwidth ±12.5GHz.

[0102] The determination of the third wavelength data of the wave at the first operating temperature based on the insertion loss index can be achieved by determining the third wavelength data of the wave at the first operating temperature based on the insertion loss index requirement within the effective bandwidth and the wavelength-transmittance data of the wave at room temperature.

[0103] When the insertion loss data meets the insertion loss index requirements, based on the second wavelength data and the third wavelength data, the target offset of the wave at the first operating temperature can be determined by subtracting the third wavelength data from the second wavelength data, provided that the maximum insertion loss within the effective bandwidth of the channel is less than the insertion loss index requirement within the effective bandwidth. The target offset can be an insertion loss offset, and the insertion loss offset can be a range of possible insertion loss offsets.

[0104] For ease of understanding, Figure 5 This is a schematic diagram illustrating the definition of insertion loss in the wave offset determination method of this invention, as shown in the example. Figure 5 As shown, it can be assumed that the insertion loss data represents the maximum insertion loss within the effective bandwidth of the channel. It is particularly important to note that temperature-dependent wavelength shift does not affect the peak insertion loss, but temperature-dependent loss does. The insertion loss shift based on the wave-dependent insertion loss data can be calculated using either the center wavelength or the ITU wavelength. In this embodiment, the ITU wavelength is used. Based on the wavelength-transmittance data, the insertion loss within the effective bandwidth of the + / -12.5GHz channel at a normal temperature of 25℃ is calculated to be 5dB. At this point, the minimum wavelength λ within the effective bandwidth is... min With the maximum value λ max The calculations are shown in formulas (3) and (4) respectively:

[0105]

[0106]

[0107] In equations (3) and (4), c represents the speed of light constant, and c = 299792458 m / s, Δf passband This represents the effective bandwidth of the channel. In this embodiment of the invention, Δf... passband Substituting 25GHz into the equation, where Δf passband / 2 corresponds to 12.5GHz, -Δf passband / 2 corresponds to -12.5GHz.

[0108] According to the above formulas (3) and (4), the second wavelength data is calculated based on the insertion loss data, that is, the effective bandwidth range is [1529.456, 1529.651] nm. Based on the insertion loss index that the in-band insertion loss requirement is within 6dB, combined with the wavelength-transmittance data at room temperature of 25℃, from 1529.456 nm to the short wavelength direction, the wavelength corresponding to 6dB insertion loss is determined to be 1529.154 nm; from 1529.651 nm to the long wavelength direction, the wavelength corresponding to 6dB insertion loss is determined to be 1529.907 nm. The third wavelength data is calculated, that is, the bandwidth range corresponding to the insertion loss index is [1529.154, 1529.907] nm.

[0109] At this point, the bandwidth offset of the wave calculated based on the second wavelength data and the third wavelength data can be: from 1529.456nm to the shorter wavelength direction, 1529.456 - 1529.154 = 0.302nm = 302pm; from 1529.651nm to the longer wavelength direction, 1529.907 - 1529.651 = 0.256nm = 256pm. In summary, the insertion loss offset range for the wave requiring an insertion loss of less than 6dB is [-302, 256]pm.

[0110] In an optional embodiment of the present invention, the loss data includes the bandwidth data of the wave, the bandwidth data including first bandwidth data and second bandwidth data; the preset index includes a bandwidth index; the method further includes:

[0111] Determine the fourth wavelength data of the wave at the first operating temperature;

[0112] The first bandwidth data and the second bandwidth data are determined based on the fourth wavelength data;

[0113] If the first bandwidth data and the second bandwidth data meet the requirements of the bandwidth index, the target offset of the wave at the first operating temperature is determined based on the bandwidth index.

[0114] In this embodiment, the fourth wavelength data can be determined according to actual conditions and is not limited here. As an example, the fourth wavelength data can be the first wavelength value and the second wavelength value corresponding to the spectral range covered by the peak insertion loss decrease ndB. As an example, the first wavelength value can characterize the short wavelength value corresponding to the peak insertion loss decrease ndB; the second wavelength value can characterize the long wavelength value corresponding to the peak insertion loss decrease ndB, and vice versa.

[0115] The bandwidth metric can be determined based on actual conditions and is not limited here. As an example, the bandwidth metric can be a requirement based on the ndB net bandwidth.

[0116] The first bandwidth data can be determined based on actual conditions and is not limited here. As an example, the first bandwidth data can be the full bandwidth data. The second bandwidth data can be determined based on actual conditions and is not limited here. As an example, the second bandwidth data can be the net bandwidth data.

[0117] The determination of the first bandwidth data and the second bandwidth data based on the fourth wavelength data can be performed as follows: determining the first bandwidth value based on the first wavelength value; determining the second bandwidth value based on the second wavelength value; summing the first bandwidth value and the second bandwidth value to obtain the first bandwidth data; and accumulating the smaller wavelength value between the first wavelength value and the second wavelength value twice to obtain the second bandwidth data.

[0118] If the first bandwidth data and the second bandwidth data meet the bandwidth index requirements, the target offset of the wave at the first operating temperature can be determined based on the bandwidth index if the first bandwidth data and the second bandwidth data are greater than the index requirements based on the ndB net bandwidth. The target offset of the wave at the first operating temperature can be determined based on the bandwidth index, the fourth wavelength data, and the ITU wavelength selected according to the ITU standard. The target offset can be a bandwidth offset, and the bandwidth offset can be a bandwidth offset range.

[0119] For ease of understanding, Figure 6 This is a schematic diagram illustrating the bandwidth definition in the wave offset determination method of this invention, as shown in the example. Figure 6 As shown, assuming the ndB bandwidth is defined as the spectral width covered by the peak insertion loss reduction ndB, the full bandwidth = BW1 + BW2, and the net bandwidth = 2 × min(BW1, BW2). Under this bandwidth definition, the full bandwidth specification is not affected by wavelength shift. The specification requirement based on the ndB net bandwidth is BW1 + BW2. net GHz, the maximum wavelength shift Δλ towards the shortwave direction nBW- The maximum wavelength shift Δλ towards the longer wavelength direction nBW+ The calculations are shown in formulas (5) and (6) respectively:

[0120]

[0121]

[0122] In equations (5) and (6), c represents the speed of light constant, and c = 299792458 m / s, λ n- λ represents the short-wavelength value corresponding to the decrease in peak insertion loss (ndB) at room temperature (25℃). n+This represents the long wavelength value corresponding to the peak insertion loss decrease in dB at a normal temperature of 25℃. This calculation and analysis approach also applies to the definition of ndB bandwidth based on ITU wavelength insertion loss decrease in dB, etc. The calculation approach for wavelength offset is the same. Based on the definition of wavelength-transmittance data, the short wavelength and long wavelength values ​​corresponding to a 3dB decrease in peak insertion loss at a normal temperature of 25℃ are calculated as λ. 3- =1529.025nm and λ 3+ =1530.027nm. The calculation of the first bandwidth value BW1 and the second bandwidth value BW2 are shown in formulas (7) and (8), respectively:

[0123] BW1=c / λ 3- -f ITU =c / 1529.025-196000=67.7GHz (7)

[0124] BW2 = f ITU -c / λ 3+ =196000-c / 1530.027=60.67GHz (8)

[0125] At this time, BW1 = 67.7 GHz and BW2 = 60.67 GHz. Based on this, the net bandwidth data and the full bandwidth data are 121.34 GHz and 128.37 GHz, respectively. Based on the requirement that the 3dB net bandwidth index is above 120 GHz, and combined with the wavelength-transmittance data under normal temperature of 25℃, if there is a shift towards the shortwave direction, the calculation of the maximum wavelength shift is as shown in formula (9):

[0126]

[0127] Based on the requirement of a 3dB net bandwidth of over 120GHz, and combined with the wavelength-transmittance data at a normal temperature of 25℃, if the wavelength shifts towards longer wavelengths, the maximum wavelength shift is calculated as shown in formula (10):

[0128] In summary, the bandwidth offset range for a wave with an insertion loss of 3dB and a bandwidth requirement within 120GHz is [-5, 59]pm.

[0129] In an optional embodiment of the present invention, the loss data includes crosstalk data of the wave; the preset index includes a crosstalk index; and the method further includes:

[0130] If the crosstalk data meets the requirements of the crosstalk index, the target offset of the wave at the first operating temperature is determined based on the crosstalk data and the crosstalk index.

[0131] In this embodiment, determining the target offset of the wave at the first operating temperature based on the crosstalk data and the crosstalk index when the crosstalk data meets the requirements of the crosstalk index can be done when the crosstalk data exceeds the requirements of the crosstalk index. The target offset can be a crosstalk offset, and the crosstalk offset can be a range of possible crosstalk offsets.

[0132] The crosstalk data can be determined based on actual conditions and is not limited here. As an example, the crosstalk data can be adjacent crosstalk data, non-adjacent crosstalk data, or total crosstalk data. The crosstalk index can be determined based on actual conditions and is not limited here. As an example, the crosstalk index can be an adjacent crosstalk requirement index, a non-adjacent crosstalk requirement index, or a total crosstalk requirement index. The target offset can be an adjacent crosstalk offset, a non-adjacent crosstalk offset, or a total crosstalk offset. The adjacent crosstalk offset can be an adjacent crosstalk offset range, the non-adjacent crosstalk offset can be a non-adjacent crosstalk offset range, and the total crosstalk offset can be a total crosstalk offset range.

[0133] For ease of understanding, Figure 7 This is a schematic diagram illustrating the crosstalk definition in the wave offset determination method of this invention. It is assumed that adjacent crosstalk (AX) is defined as the difference between the maximum insertion loss within the effective bandwidth of the channel and the minimum insertion loss of adjacent channels within their corresponding effective bandwidths. Figure 7 As shown, adjacent crosstalk is usually taken as the minimum of the left and right adjacent crosstalk. Based on wavelength-transmittance data, the adjacent crosstalk at room temperature (25℃) is calculated to be 7.58dB. Given the requirement of adjacent crosstalk being above 4dB, and considering the wavelength-transmittance data at room temperature (25℃), if the wavelength shifts towards shorter wavelengths, the maximum value of insertion loss within the effective bandwidth of the channel and the minimum value of insertion loss within the corresponding effective bandwidth of the adjacent channel will both change, and the corresponding difference will also change. As the wavelength shifts towards shorter wavelengths, when the adjacent crosstalk first falls below 4dB, the adjacent crosstalk offset for the short-wavelength shift is calculated. Similarly, the adjacent crosstalk offset for the long-wavelength shift can be calculated, thus determining the acceptable range of adjacent crosstalk offset.

[0134] Assume that non-adjacent crosstalk (NX) is defined as the difference between the maximum insertion loss within the effective bandwidth of a channel and the minimum insertion loss of non-adjacent channels within their respective effective bandwidths. Figure 7As shown, non-adjacent crosstalk is typically taken as the minimum value among all non-adjacent crosstalk values. Based on wavelength-transmittance data, the non-adjacent crosstalk at room temperature (25℃) is calculated to be 38.33 dB. Given that the non-adjacent crosstalk requirement is above 30 dB, and considering the wavelength-transmittance data at room temperature (25℃), if shifting towards shorter wavelengths, the non-adjacent crosstalk offset amount for the first time below 30 dB can be calculated for shorter wavelengths. Similarly, the non-adjacent crosstalk offset amount for longer wavelengths can be calculated, thus determining the acceptable offset range for non-adjacent crosstalk.

[0135] Assuming total crosstalk (TX) is defined as the sum of all adjacent crosstalk and non-adjacent crosstalk, the total crosstalk TX of channel j... j The calculation is shown in formula (11):

[0136]

[0137] In equation (11), 1 ≤ j ≤ N, 1 ≤ i ≤ N, N represents the total number of channels, and i, j, and N are all positive integers. AX j,i This represents the adjacent crosstalk of channel j to channel i, where AX j,j-1 Indicates left adjacent crosstalk, AX j,j+1 Indicates right adjacent crosstalk, NX j,i This represents the non-adjacent crosstalk between channel j and channel i, i.e., i≠j, j±1. Based on wavelength-transmittance data, the total crosstalk index at room temperature (25℃) is calculated to be 5.66dB. Given the requirement of a total crosstalk of at least 3dB, and considering the wavelength-transmittance data at 25℃, if the total crosstalk first falls below 3dB when shifting towards shorter wavelengths, the total crosstalk offset for the short-wavelength shift can be calculated. Similarly, the total crosstalk offset for the long-wavelength shift can be calculated, thus determining the acceptable range of total crosstalk offset.

[0138] In some embodiments, the wavelength offset is the intersection of wavelength offsets based on wavelength accuracy, insertion loss, net bandwidth, and crosstalk. For ease of understanding, the wavelength offset range based on wavelength accuracy, insertion loss, and bandwidth is determined to be [-5, 59] pm by intersecting the wavelength offsets based on wavelength accuracy, insertion loss, net bandwidth, and crosstalk.

[0139] In an optional embodiment of the present invention, the method further includes:

[0140] Obtain the first loss data from a plurality of loss data of the wave at a first operating temperature; wherein the first loss data is any one of the plurality of loss data;

[0141] The first offset of the wave at the first operating temperature is determined based on the first loss data and a first preset index among a plurality of preset indicators; wherein, the first preset index characterizes an index corresponding to the first loss data.

[0142] Based on the first offset and the second loss data among the plurality of loss data, the target offset of the wave at the first operating temperature is determined; wherein, the second loss data represents any loss data among the plurality of loss data other than the first loss data.

[0143] In this embodiment, the first loss data can be determined according to actual conditions and can be any one of accuracy data, insertion loss data, bandwidth data, and crosstalk data, without limitation. As an example, the first loss data can be accuracy data. The first preset index can be determined according to actual conditions and is not limited here. As an example, the first preset index can be any one of accuracy index, insertion loss index, bandwidth index, and crosstalk index.

[0144] The determination of the first offset of the wave at the first operating temperature based on the first loss data and the first preset index among the multiple preset indicators can be, on the other hand, the determination of the accuracy offset of the wave at the first operating temperature based on the accuracy data and the accuracy index.

[0145] The step of determining the target offset of the wave at the first operating temperature based on the precision offset and the second loss data among the plurality of loss data can be achieved by iterating through the precision offset and the second loss data among the plurality of loss data to determine the target offset of the wave at the first operating temperature.

[0146] The second loss data can be determined based on the actual situation, and can be any of the following: insertion loss data, bandwidth data, and crosstalk data, excluding the first loss data which is precision data. No limitation is made here. As an example, the second loss data can be insertion loss data.

[0147] The step of determining the target offset of the wave at the first operating temperature based on the precision offset and the second loss data among the plurality of loss data can be as follows: determining whether the insertion loss data satisfies the precision offset; if the insertion loss data satisfies the precision offset, determining whether the bandwidth data satisfies the precision offset; if the bandwidth data satisfies the precision offset, determining whether the crosstalk data satisfies the precision offset; and if the crosstalk data satisfies the precision offset, determining the target offset of the wave at the first operating temperature.

[0148] For ease of understanding, the wave precision offset calculated based on the wave precision data can be substituted into the calculation to determine whether the insertion loss data meets the requirements. If it does, the wave precision offset calculated based on the wave precision data is the target wave offset between the wave precision data and the insertion loss data. Otherwise, the range is narrowed based on the wave precision offset calculated based on the wave precision data to calculate the insertion loss offset corresponding to the insertion loss data. Following this method, the insertion loss offset is substituted into the bandwidth data and crosstalk data to finally calculate the target offset [-Δλ] that meets the requirements for wavelength precision, insertion loss, bandwidth, and crosstalk. - ,Δλ + ].

[0149] In an optional embodiment of the present invention, after determining the target offset of the wave at the first operating temperature based on the loss data at the first operating temperature and the preset index, the method further includes:

[0150] Obtain the loss data of the wave at a second operating temperature; wherein, the second operating temperature represents any operating temperature other than the first operating temperature;

[0151] Determine whether the loss data at the second operating temperature meets the requirements of the preset index;

[0152] If the loss data at the second operating temperature meets the requirements of the preset index, the target offset of the wave at the second operating temperature is determined based on the loss data at the second operating temperature and the preset index.

[0153] The operating offset of the wave is determined based on the target offset at the first operating temperature and the target offset at the second operating temperature.

[0154] In this embodiment, the first operating temperature can be determined according to actual conditions and is not limited here. As an example, the first operating temperature can be any temperature at room temperature, and the second operating temperature represents any operating temperature other than the first operating temperature. Specifically, the first operating temperature can be 25°C, wherein the operating temperature is -5 to 65°C, and the second operating temperature represents any operating temperature from -5 to 65°C other than 25°C.

[0155] The determination of the wave's working offset based on the target offset at the first operating temperature and the target offset at the second operating temperature can be achieved by intersecting the target offset at the first operating temperature and the target offset at the second operating temperature (excluding the first operating temperature) to obtain the offset with the smallest range. The offset with the smallest range is then used as the wave's working offset, thus completing the temperature compensation design for the target offset.

[0156] Based on the target offset calculated using the wavelength offset evaluation method, temperature compensation is designed so that the target offset range within the filter's operating temperature is smaller than the wavelength operating offset range after temperature compensation.

[0157] This invention provides an embodiment of the invention that obtains the loss data of the wave at a first operating temperature and, in conjunction with the requirements of the preset index corresponding to the loss data, determines the target offset of the wave at the first operating temperature. By introducing temperature-related losses, the target offset can be further evaluated. The evaluation method provided by this invention is simple and efficient, and can be used to screen chips and temperature compensation designs, thereby improving chip utilization while ensuring product qualification rate.

[0158] Based on the above method, embodiments of the present invention also provide a device for determining the offset of a wave, wherein the filter index determination device can be a device for evaluating the offset of a filter wavelength. Figure 8 This is a schematic diagram of the composition of the wave offset determination device according to an embodiment of the present invention, as shown below. Figure 8 As shown, the device 800 includes: an interaction module 801, a control module 802, a storage module 803, and a calculation module 804; the control module 802 is connected to the interaction module 801, the storage module 803, and the calculation module 804 respectively.

[0159] The interaction module 801 is used to input calculation instructions and send the calculation instructions to the control module;

[0160] The control module 802 is used to receive the operation instruction, retrieve the operation task corresponding to the operation instruction from the storage module, and allocate the operation task to the operation module.

[0161] The calculation module 804 is used to receive the calculation task, calculate the offset of the wave based on the calculation task, and store the offset of the wave as the calculation result in the storage module.

[0162] The storage module 803 is used to store the operation task corresponding to the operation instruction and to store the operation result.

[0163] In this embodiment, the interaction module 801 can be a web client, the control module 802 can be a server, the storage module 803 can be a database, and the calculation module 804 can be an offset calculation system. Offset calculation instructions are input through the web client and sent to the server. After receiving the offset calculation instructions, the server retrieves the recorded offset calculation tasks from the database and assigns the offset calculation tasks to the offset calculation system. The offset calculation system records the offset calculation results in the database. Specifically, the web client is used to input the offset calculation instructions; the server is used to retrieve the offset calculation tasks corresponding to the offset calculation instructions from the database and assign the offset calculation tasks to the offset calculation system; the database is used to record the offset calculation tasks and offset calculation results corresponding to the offset calculation instructions; and the offset calculation system is used to receive offset calculation tasks and perform offset calculations.

[0164] In an optional embodiment of the present invention, the device 800 further includes:

[0165] The control module 802 is also used to send the calculation results stored in the storage module to the interaction module;

[0166] The interaction module 801 is also used to receive and display the calculation results sent by the control module.

[0167] In this embodiment, the offset calculation results stored in the database are uploaded to the web interface via a server for display. The server is also configured to send the offset calculation results stored in the database to the web interface; the web interface is further configured to receive and display the offset calculation results sent by the server.

[0168] In an optional embodiment of the present invention, the computing module 804 includes: a laser emitting unit 8041, a polarization control unit 8042, a beam splitting unit 8043, a filter under test 8044, a power monitoring unit 8045, and a computing unit 8046.

[0169] The laser emitting unit 8041 is used to emit laser light with a specific wavelength;

[0170] The polarization control unit 8042 is used to control the laser traversal polarization state;

[0171] The beam splitting unit 8043 is used to split the laser beam into multiple paths;

[0172] The filter under test 8044 is used to pass the laser;

[0173] The power monitoring unit 8045 is used to monitor the optical power of the laser;

[0174] The calculation unit 8046 is used to calculate the offset of the wave based on the wavelength-transmittance data corresponding to the optical power.

[0175] In this embodiment, the laser emitting unit 8041 can be a tunable laser, the polarization control unit 8042 can be a polarization controller, the beam splitting unit 8043 can be a beam splitter, the power monitoring unit 8045 can be a multi-channel power meter, and the calculation unit 8046 can be an offset calculation device. The main function of the tunable laser is to emit light within a certain wavelength range; the main function of the polarization controller is to allow the incoming light to traverse all polarization states; the main function of the beam splitter is to split the light into multiple paths, enabling simultaneous testing of many devices, i.e., the devices share a single light source and polarization controller; the main function of the offset calculation device is to perform offset calculations; and the main function of the multi-channel power meter is to monitor the power value.

[0176] The tunable laser emits light, and the wavelength of the light emitted by the tunable laser scans within a certain wavelength range. After the polarization controller traverses all polarization states, the light emitted by the tunable laser is split by the beam splitter. At this time, the beam splitter is first connected to the multi-channel power meter to obtain the stored light value; then the beam splitter is connected to the filter under test, and the light split by the beam splitter enters the filter under test respectively. After the light is output from the filter under test, it reaches the multi-channel power meter to obtain the power value. Combined with the synchronization function, the wavelength value is obtained, and the stored light value is subtracted to finally obtain the wavelength-transmittance data. The offset calculation device calculates the offset of the wave based on the wavelength-transmittance data.

[0177] This embodiment also provides a device for determining the wave offset. Figure 9 This is a schematic diagram of the structural composition of the wave offset determination device according to an embodiment of the present invention, as shown below. Figure 9 As shown, the device 900 includes:

[0178] The first acquisition module 901 is used to acquire the loss data of the wave at the first operating temperature;

[0179] The judgment module 902 is used to determine whether the loss data meets the requirements of the preset index;

[0180] The first determining module 903 is used to determine the target offset of the wave at the first operating temperature based on the loss data and the preset index, provided that the loss data meets the requirements of the preset index.

[0181] In other embodiments, the loss data includes the wave accuracy data; the preset index includes an accuracy index; the first acquisition module 901 includes a first determination unit and a processing unit; the first determination module 903 includes a second determination unit.

[0182] The first determining unit is used to determine the first wavelength data of the wave at the first operating temperature;

[0183] The processing unit is used to process the first wavelength data based on a preset method to determine the accuracy data of the wave at the first operating temperature.

[0184] The second determining unit is configured to determine the target offset of the wave at the first operating temperature based on the accuracy data and the accuracy index, provided that the accuracy data meets the requirements of the accuracy index.

[0185] In other embodiments, the loss data includes insertion loss data of the wave; the preset index includes an insertion loss index; the first determining unit is further configured to determine a second wavelength data of the wave at the first operating temperature based on the insertion loss data; and to determine a third wavelength data of the wave at the first operating temperature based on the insertion loss index; the second determining unit is further configured to determine a target offset of the wave at the first operating temperature based on the second wavelength data and the third wavelength data, provided that the insertion loss data meets the requirements of the insertion loss index.

[0186] In other embodiments, the loss data includes the bandwidth data of the wave, the bandwidth data including first bandwidth data and second bandwidth data; the preset index includes a bandwidth index; the first determining unit is further configured to determine a fourth wavelength data of the wave at the first operating temperature; determine the first bandwidth data and the second bandwidth data based on the fourth wavelength data; the second determining unit is further configured to determine the target offset of the wave at the first operating temperature based on the bandwidth index if the first bandwidth data and the second bandwidth data meet the requirements of the bandwidth index.

[0187] In other embodiments, the loss data includes crosstalk data of the wave; the preset index includes a crosstalk index; the second determining unit is further configured to determine the target offset of the wave at the first operating temperature based on the crosstalk data and the crosstalk index, provided that the crosstalk data meets the requirements of the crosstalk index.

[0188] In other embodiments, the device 900 further includes:

[0189] The second determining module is used to acquire a first loss data among multiple loss data of the wave at a first operating temperature; wherein, the first loss data is any one of the multiple loss data;

[0190] The third determining module is used to determine the first offset of the wave at the first operating temperature based on the first loss data and a first preset index among a plurality of preset indexes; wherein, the first preset index characterizes an index corresponding to the first loss data;

[0191] The fourth determining module is used to determine the target offset of the wave at the first operating temperature based on the first offset and the second loss data among the plurality of loss data; wherein the second loss data represents any loss data other than the first loss data among the plurality of loss data.

[0192] In other embodiments, after determining the target offset of the wave at the first operating temperature based on the loss data at the first operating temperature and the preset index, the device 900 further includes:

[0193] The second acquisition module is used to acquire the loss data of the wave at a second operating temperature; wherein, the second operating temperature represents any operating temperature other than the first operating temperature;

[0194] The second judgment module is used to determine whether the loss data at the second operating temperature meets the requirements of the preset index.

[0195] The fifth determining module is used to determine the target offset of the wave at the second operating temperature based on the loss data at the second operating temperature and the preset index, provided that the loss data at the second operating temperature meets the requirements of the preset index.

[0196] The sixth determining module is used to determine the operating offset of the wave based on the target offset at the first operating temperature and the target offset at the second operating temperature.

[0197] It should be noted that, in the embodiments of the present invention, if the above-described method for determining the wave offset is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. Based on this understanding, the technical embodiments of the present invention, or the parts that contribute to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a wave offset determination device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as a USB flash drive, external hard drive, read-only memory (ROM), magnetic disk, or optical disk. Thus, the embodiments of the present invention are not limited to any specific hardware and software combination.

[0198] Correspondingly, embodiments of the present invention provide a device for determining the offset of a wave, including a memory and a processor. The memory stores a computer program that can run on the processor. When the processor executes the program, it implements the steps in the wave offset determination method provided in the above embodiments.

[0199] Correspondingly, embodiments of the present invention provide a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps in the wave offset determination method provided in the above embodiments.

[0200] It should be noted that the descriptions of the storage medium and device embodiments above are similar to those of the method embodiments above, and have similar beneficial effects. For technical details not disclosed in the storage medium and device embodiments of the present invention, please refer to the descriptions of the method embodiments of the present invention for understanding.

[0201] It should be noted that, Figure 10 This is a schematic diagram of a hardware entity structure of a wave offset determination device according to an embodiment of the present invention, as shown below. Figure 10 As shown, the hardware entity of the wave offset determination device 1000 includes a processor 1001 and a memory 1003. Optionally, the wave offset determination device 1000 may also include a communication interface 1002.

[0202] It is understood that memory 1003 can be volatile memory or non-volatile memory, or both. Non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), ferromagnetic random access memory (FRAM), flash memory, magnetic surface memory, optical disc, or compact disc read-only memory (CD-ROM); magnetic surface memory can be disk storage or magnetic tape storage. Volatile memory can be random access memory (RAM), which is used as an external cache. By way of example, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Synchronous Static Random Access Memory (SSRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic Random Access Memory (SDRAM), Double Data Rate Synchronous Dynamic Random Access Memory (DDRSDRAM), Enhanced Synchronous Dynamic Random Access Memory (ESDRAM), SyncLink Dynamic Random Access Memory (SLDRAM), and Direct Rambus Random Access Memory (DRRAM).The memory 1003 described in this embodiment of the invention is intended to include, but is not limited to, these and any other suitable types of memory.

[0203] The methods disclosed in the above embodiments of the present invention can be applied to or implemented by processor 1001. Processor 1001 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by the integrated logic circuit of the hardware in processor 1001 or by instructions in the form of software. The processor 1001 may be a general-purpose processor, a digital signal processor (DSP), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Processor 1001 can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of the present invention. The general-purpose processor may be a microprocessor or any conventional processor, etc. The steps of the methods disclosed in the embodiments of the present invention can be directly manifested as being executed by a hardware decoding processor, or being executed by a combination of hardware and software modules in the decoding processor. The software modules may be located in a storage medium, which is located in memory 1003. Processor 1001 reads the information in memory 1003 and completes the steps of the aforementioned method in conjunction with its hardware.

[0204] In an exemplary embodiment, the device for determining the wave offset may be implemented by one or more application-specific integrated circuits (ASICs), DSPs, programmable logic devices (PLDs), complex programmable logic devices (CPLDs), field-programmable gate arrays (FPGAs), general-purpose processors, controllers, microcontrollers (MCUs), microprocessors, or other electronic components to perform the aforementioned method.

[0205] In the several embodiments provided by this invention, it should be understood that the disclosed methods and apparatus can be implemented in other ways. The apparatus embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components may be combined, or integrated into another observation, or some features may be ignored or not executed. In addition, the communication connections between the various components shown or discussed may be through some interfaces, indirect coupling or communication connections between devices or units, and may be electrical, mechanical, or other forms.

[0206] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of the units may be selected to achieve the purpose of this embodiment according to actual needs.

[0207] Those skilled in the art will understand that all or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments. The aforementioned storage medium includes various media that can store program code, such as mobile storage devices, read-only memory (ROM), magnetic disks, or optical disks.

[0208] Alternatively, if the integrated units described above in the embodiments of the present invention are implemented as software functional units and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical embodiments of the present invention, or the parts that contribute to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a wave offset determination device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, ROMs, magnetic disks, or optical disks.

[0209] The wave offset determination method, apparatus, and computer storage medium described in this invention are only examples of embodiments of this invention, but are not limited thereto. Any method, apparatus, and computer storage medium involving the wave offset determination are within the protection scope of this invention.

[0210] It should be understood that the phrase "one embodiment" or "an embodiment" throughout the specification means that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of the invention. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification does not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. It should be understood that in the various embodiments of the invention, the sequence numbers of the above-described processes do not imply a sequential order of execution; the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the invention. The sequence numbers of the above-described embodiments of the invention are merely descriptive and do not represent the superiority or inferiority of the embodiments.

[0211] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0212] The above description is merely an embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A method of determining an offset of a wave, characterized by, The method comprises: obtaining loss data of a wave of a filter at a first operating temperature, wherein the loss data comprises any one of precision data, insertion loss data, bandwidth data, and crosstalk data; determining whether the loss data meets a requirement of a preset index, wherein the preset index comprises any one of a precision index, an insertion loss index, a bandwidth index, and a crosstalk index; in a case where the loss data meets the requirement of the preset index, determining a target offset of the wave at the first operating temperature based on the loss data and the preset index, wherein the target offset represents a range of offset amounts; screening a filter according to the target offset.

2. The method of claim 1, wherein, The method further comprises: determining first wavelength data of the wave at the first operating temperature; processing the first wavelength data based on a preset manner to determine precision data of the wave at the first operating temperature; in a case where the precision data meets the requirement of the precision index, determining a target offset of the wave at the first operating temperature based on the precision data and the precision index.

3. The method of claim 1, wherein, The method further comprises: determining second wavelength data of the wave at the first operating temperature based on the insertion loss data; determining third wavelength data of the wave at the first operating temperature based on the insertion loss index; in a case where the insertion loss data meets the requirement of the insertion loss index, determining a target offset of the wave at the first operating temperature based on the second wavelength data and the third wavelength data.

4. The method of claim 1, wherein, The bandwidth data comprises first bandwidth data and second bandwidth data; the method further comprises: determining fourth wavelength data of the wave at the first operating temperature; determining the first bandwidth data and the second bandwidth data based on the fourth wavelength data; in a case where the first bandwidth data and the second bandwidth data meet the requirement of the bandwidth index, determining a target offset of the wave at the first operating temperature based on the bandwidth index.

5. The method of claim 1, wherein, The method further comprises: in a case where the crosstalk data meets the requirement of the crosstalk index, determining a target offset of the wave at the first operating temperature based on the crosstalk data and the crosstalk index.

6. The method of claim 1, wherein, The method further comprises: obtaining first loss data of the wave at a first operating temperature from a plurality of loss data; wherein the first loss data is any one of the plurality of loss data; determining a first offset of the wave at the first operating temperature based on the first loss data and a first preset index from a plurality of preset indexes; wherein the first preset index represents an index corresponding to the first loss data; determining a target offset of the wave at the first operating temperature based on the first offset and second loss data from the plurality of loss data; wherein the second loss data represents any one of the plurality of loss data other than the first loss data.

7. The method of claim 1, wherein, After determining the target offset of the wave at the first operating temperature based on the loss data at the first operating temperature and the preset index, the method further comprises: obtaining loss data of the wave at a second operating temperature, wherein the second operating temperature represents any operating temperature except the first operating temperature; determining whether the loss data at the second operating temperature meets a requirement of a preset index; in a case where the loss data at the second operating temperature meets the requirement of the preset index, determining a target offset of the wave at the second operating temperature based on the loss data at the second operating temperature and the preset index; determining an operating offset of the wave based on the target offset at the first operating temperature and the target offset at the second operating temperature.

8. An apparatus for determining an offset of a wave, characterized by The device comprises an interaction module, a control module, a storage module and an operation module; the control module is connected with the interaction module, the storage module and the operation module respectively; The interaction module is configured to input an operation instruction and send the operation instruction to the control module; The control module is configured to receive the operation instruction, call an operation task corresponding to the operation instruction in the storage module, and distribute the operation task to the operation module; The operation module is configured to receive the operation task, calculate the offset of the wave based on the operation task, and store the offset of the wave as an operation result in the storage module; wherein the calculation of the offset of the wave based on the operation task comprises: obtaining loss data of a wave of a to-be-tested filter at a first operating temperature, wherein the loss data comprises any one of precision data, insertion loss data, bandwidth data and crosstalk data; determining whether the loss data meets a requirement of a preset index, wherein the preset index comprises any one of a precision index, an insertion loss index, a bandwidth index and a crosstalk index; in a case where the loss data meets the requirement of the preset index, determining a target offset of the wave at the first operating temperature based on the loss data and the preset index, wherein the target offset represents a range of offset, and is used for screening filters; The storage module is configured to store the operation task corresponding to the operation instruction and store the operation result.

9. The apparatus of claim 8, wherein, Comprising: The control module is further configured to send the operation result stored in the storage module to the interaction module; The interaction module is further configured to receive and display the operation result sent by the control module.

10. The apparatus of claim 8, wherein, The operation module comprises a laser emission unit, a polarization control unit, a light splitting unit, a to-be-tested filter, a power monitoring unit and an operation unit; The laser emission unit is configured to emit laser with a wavelength; The polarization control unit is configured to control the laser to traverse a polarization state; The light splitting unit is configured to split the laser; The to-be-tested filter is configured to pass the laser; The power monitoring unit is configured to monitor the optical power of the laser; The operation unit is configured to operate the offset of the wave based on wavelength-transmittance data corresponding to the optical power.

11. An apparatus for determining an offset of a wave, characterized by Comprising: The first obtaining module is configured to obtain loss data of a wave of a filter at a first operating temperature, wherein the loss data is any one of precision data, insertion loss data, bandwidth data, and crosstalk data. The first determining module is configured to determine whether the loss data meets a requirement of a preset index, wherein the preset index is any one of a precision index, an insertion loss index, a bandwidth index, and a crosstalk index. The first determining module is configured to determine a target offset of the wave at the first operating temperature based on the loss data and the preset index when the loss data meets the requirement of the preset index, wherein the target offset represents a range of offset amounts; and filter the filter according to the target offset.

12. A device for determining an offset of a wave, comprising a memory and a processor, the memory storing a computer program operable on the processor, characterized in that, The processor implements the steps in the method of any one of claims 1 to 7 when executing the program.

13. A computer readable storage medium having stored thereon a computer program, characterized in that The computer program implements the steps in the method of any one of claims 1 to 7 when executed by the processor.

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