A method for measuring tea leaf area index
By using optical measurement instruments in the measurement of tea leaf area index and combining the optimization of branch correction coefficient, the measurement error problem caused by branch ridge occlusion is solved, and the measurement accuracy of leaf area index of densely planted tea trees is improved.
Patent Information
- Application Number
- CN202410130344.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-01-31
- Publication Date
- 2024-12-31
- Estimated Expiration
- 2044-01-31
AI Technical Summary
The existing method of measuring tea leaves area index has the problem of branch trunk occlusion, which leads to inaccurate measurement results. Especially in the case of intensive planting, the measurement accuracy is low and the scope of application is limited.
The leaf area index was measured in the preset experimental sample area by optical measurement instrument, and the measurement results were corrected by the pre-acquisition branch correction coefficient. The branch projection data and leaf area index of different experimental samples were fitted by linear regression method. True value, optimize branch correction coefficient to improve measurement accuracy.
The error caused by branches and trunk occlusion is effectively corrected and the measurement accuracy of the tea leaf area index is improved. Especially when shrub-type tea trees are densely planted, the optimized branch correction coefficient further improves the measurement accuracy.
Smart Images
Figure CN118089600B_ABST