A pitch adjustable differential channel signal reading device

Abstract

The application belongs to the technical field of integrated circuit testing equipment, and discloses a differential channel signal reading device with adjustable spacing, which comprises a connecting base, displacement tables, radio frequency probes, a probe display unit and a signal adapter, wherein two displacement tables are fixedly arranged on the connecting base; two radio frequency probes are respectively installed on the displacement tables, can realize translation in the XYZ plane and are used for measuring the + end and the - end of the differential signal of the integrated circuit; the probe display unit is used for observing the position of the radio frequency probe and the butt joint data of the needle tip of the radio frequency probe and the measured object; and the signal adapter is used for converting the signal interface of the chip testing clamp into a plane interface that can be read by the probe. Through the application, the reading of the differential signal in the differential channel calibration process of the integrated circuit testing system can be realized, the spacing of the reading path can be arbitrarily adjusted, the quick compatible adaptation of different packaging clamps is realized, and the problems of fixed spacing of the traditional integrated double probes, difficulty in adapting different specifications of clamps and the like are overcome.

Description

Technical Field

[0001] This invention belongs to the technical field of integrated circuit testing equipment, and more specifically, relates to a differential channel signal reading device with adjustable spacing. Background Technology

[0002] In the field of integrated circuit testing technology, the most commonly used equipment is the integrated circuit test system. Calibration of the test system ensures accurate test results. During the testing of differential signals in integrated circuits, the impact of the test link on signal integrity cannot be ignored. Therefore, the calibration of an integrated circuit test system with differential signal testing capabilities must include a complete test link, and the differential signals of the integrated circuit test system must be calibrated at the test fixture end.

[0003] However, further research shows that the specifications of the test fixtures in the existing technology are matched with the specifications of the chip under test. Different test fixtures are characterized by different spacing and distribution of signal points. In this case, it is necessary to design a differential channel signal reading device with adjustable spacing to be compatible with the signal reading requirements of test fixtures of different specifications, so as to better cooperate with other equipment to complete high-precision calibration work. Summary of the Invention

[0004] In view of the above-mentioned defects or needs of the prior art, the purpose of the present invention is to provide a differential channel signal reading device with adjustable spacing. By fully combining the application requirements of integrated circuit testing, the structure and mutual arrangement of the entire device have been redesigned. Accordingly, it can effectively solve the differential signal reading problem of integrated circuit testing systems with different specifications of test fixtures in a compact and easy-to-operate manner, while having the advantages of high efficiency, high precision and good adaptability.

[0005] To achieve the above objectives, according to the present invention, a differential channel signal reading device with adjustable spacing is provided. The device includes a connecting base, two displacement stages, two radio frequency probes, and a probe display unit, characterized in that:

[0006] The connecting base is arranged in a horizontal plane, and the two displacement stages, namely the first and second displacement stages, are fixedly set on the connecting base at a 90° angle. The X-axis of the first displacement stage is perpendicular to the X-axis of the second displacement stage, the Y-axis of the first displacement stage is perpendicular to the Y-axis of the second displacement stage, and the X-axis, Y-axis and Z-axis of the two displacement stages are orthogonal to each other.

[0007] The two radio frequency probes, namely the first and second radio frequency probes, are each mounted on each of the displacement stages via probe mounting bases, wherein each probe mounting base is fixed to the Z-axis of the corresponding displacement stage, thereby driving the radio frequency probe to translate in the XYZ axis coordinate system via the displacement stage; wherein the first radio frequency probe is used to measure the positive terminal of the differential signal of the integrated circuit, and the second radio frequency probe is used to measure the negative terminal of the differential signal of the integrated circuit.

[0008] The probe display unit is used to observe the position of the two radio frequency probes and the docking data between their tips and the object under test, thereby providing a reference for adjusting the displacement of the two displacement stages;

[0009] The signal adapter is secured in the test fixture by a wedge-shaped protrusion to achieve self-tightening and to maintain a stable contact connection with the signal section of the fixture, thereby transmitting the signal from the fixture to the adapter, facilitating the connection of the probe to the signal link.

[0010] More preferably, the connecting base is made of an insulating material with a certain strength, including but not limited to polycarbonate, nylon, engineering plastics, etc., and its upper surface is provided with an array of threaded holes for the installation of the two displacement stages.

[0011] More preferably, one side of the connecting base is rectangular or square with a hollowed-out shape, and its size is the same as that of the test fixture on the integrated circuit test system, typically a test fixture suitable for BGA packaging, so as to nest the BGA test fixture, while allowing the connecting base of the displacement stage to be quickly placed around the test fixture of the integrated circuit test system.

[0012] More preferably, the main body size of the signal adapter matches the size of the test fixture on the integrated circuit test system, but wedge-shaped protrusions are symmetrically arranged at the upper and lower edges, so that the signal adapter can have four or more points in the longitudinal or transverse direction that slightly exceed the inner frame size of the test fixture by about 0.5mm to 1mm. The signal adapter is securely installed on the test fixture through an interference fit.

[0013] More preferably, for the two radio frequency probes, their probe pins are preferably of GS structure and have a tilt angle of 30° to 60°.

[0014] More preferably, the probe display unit includes a local magnification module and a display module, wherein the local magnification module adjusts the focus to be near the test point through a gimbal to magnify the docking details of the RF probe; and the display module is used to display the magnified image of the test point.

[0015] More preferably, the components of the differential channel signal reading device described above are preferably designed and manufactured in a modular manner.

[0016] In summary, the technical solutions conceived by this invention have the following main technical advantages compared with the prior art:

[0017] (1) Compared with the traditional differential signal displacement stage, the differential channel signal reading device of the present invention completely separates the differential + and differential - stages of the traditional differential probe. By using two independent probes under the operation of two displacement stages, it is possible to adapt to test fixtures with different spacings.

[0018] (2) The differential channel signal reading device of the present invention has a local magnification display function, which can clearly observe the contact between the probe and the fixture, and facilitate the adjustment of the probe's micro-motion in the coordinate system, making the positioning and contact more accurate;

[0019] (3) The signal adapter included in the differential channel signal reading device of the present invention is designed with a wedge-shaped protrusion, which can be quickly and firmly installed on the test fixture, greatly simplifying the signal conversion and lead-out work of the test fixture and improving the efficiency of signal testing.

[0020] (4) The differential channel signal reading device according to the present invention has a compact overall structure and is easy to operate. It effectively solves the problem of differential signal reading in integrated circuit test systems with different specifications of test fixtures. The spacing of the differential positive and negative sign reading paths can be adjusted arbitrarily, realizing rapid compatibility and adaptation of different package fixtures. It overcomes the problems of fixed spacing of traditional integrated dual probes and difficulty in adapting to different specifications of fixtures, and thus has broad application prospects. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of a differential channel signal reading device according to a preferred embodiment of the present invention;

[0022] Figure 2 This is a three-dimensional structural view of the differential channel signal reading device;

[0023] Figure 3 This is a perspective view of the connecting base according to the present invention;

[0024] Figure 4 This is a perspective view of the signal adapter according to the present invention.

[0025] In all the accompanying drawings, the same reference numerals are used to denote the same elements or structures, wherein:

[0026] 1-Connecting base, 2-First displacement stage, 2'-Second displacement stage, 3-First RF probe, 3'-Second RF probe. Detailed Implementation

[0027] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0028] Figure 1 This is a schematic diagram of a differential channel signal reading device according to a preferred embodiment of the present invention. Figure 1 As shown, the differential channel signal reading device mainly includes a connecting base, two displacement stages, two RF probes, a probe display unit, and a signal adapter, which will be described in detail below.

[0029] You can view them at the same time. Figure 2 The two radio frequency probes, namely the first and second radio frequency probes, are each mounted on each of the displacement stages via probe mounting bases. Each probe mounting base is fixed to the Z-axis of the corresponding displacement stage, thereby driving the radio frequency probe to translate in the XYZ axis coordinate system via the displacement stage. The first radio frequency probe 3 is used to measure the positive terminal of the differential signal of the integrated circuit, and the second radio frequency probe 3' is used to measure the negative terminal of the differential signal of the integrated circuit.

[0030] Furthermore, the two displacement stages, namely the first and second displacement stages, are fixedly mounted on the connecting base 1 at a 90° angle. The X-axis of the first displacement stage 2 is perpendicular to the X-axis of the second displacement stage 2', the Y-axis of the first displacement stage 2 is perpendicular to the Y-axis of the second displacement stage 2', and the X-axis, Y-axis, and Z-axis of the two displacement stages are orthogonal to each other.

[0031] According to a preferred embodiment of the present invention, the pins of the radio frequency probe are of a GS structure with a large tilt angle of 30° to 60°.

[0032] Figure 3 The connecting base described in this invention is arranged horizontally and is preferably made of an insulating material with a certain strength, including but not limited to polycarbonate, nylon, and engineering plastics. Its upper surface has an array of threaded holes for mounting the displacement stage. Furthermore, according to a preferred embodiment of this invention, one side of the base may be rectangular or square with a recessed area the same size as the test fixture on the integrated circuit test system, for nesting the test fixture, allowing the displacement stage connecting base to be quickly placed around the test fixture of the integrated circuit test system.

[0033] Figure 4The signal adapter described in this invention has a main body size that matches the size of the test fixture on the integrated circuit test system. Two wedge-shaped protrusions are symmetrically arranged at the top and bottom edges, so that the signal adapter 4 has four points in the longitudinal direction that slightly exceed the inner frame size of the test fixture by about 0.5mm to 1mm. By means of interference fit, the signal adapter 4 is snapped onto the test fixture, realizing the installation and fixation of the signal adapter 4 in the open state of the fixture, without the need for additional fasteners.

[0034] In addition, the probe display unit is used to observe the position of the two radio frequency probes and the docking data between their tips and the object under test, thereby providing a reference for adjusting the displacement of the two displacement stages.

[0035] According to a preferred embodiment of the present invention, the probe display unit preferably includes a local magnification module and a display module, wherein the local magnification module adjusts the focus to be near the test point through a gimbal to magnify the docking details of the RF probe; the display module is used to display the magnified image of the test point.

[0036] In summary, the differential channel signal reading device according to the present invention has a compact overall structure and is easy to operate. It effectively solves the problem of differential signal reading in integrated circuit test systems with different specifications of test fixtures. Moreover, the spacing of the differential positive and negative sign reading paths can be adjusted arbitrarily, realizing rapid compatibility and installation with different package fixtures. It overcomes the problems of fixed spacing of traditional integrated dual probes and difficulty in adapting to different specifications of fixtures, and therefore has broad application prospects.

[0037] Those skilled in the art will readily understand that the above description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A differential channel signal reading device with adjustable spacing, the device comprising a connecting base, two displacement stages, two radio frequency probes, a probe display unit, and a signal adapter, characterized in that: The connecting base is arranged in a horizontal plane, and the two displacement stages, namely the first and second displacement stages, are fixedly set on the connecting base at a 90° angle. The X-axis of the first displacement stage is perpendicular to the X-axis of the second displacement stage, the Y-axis of the first displacement stage is perpendicular to the Y-axis of the second displacement stage, and the X-axis, Y-axis and Z-axis of the two displacement stages are orthogonal to each other. The two radio frequency probes, namely the first and second radio frequency probes, are each mounted on each of the displacement stages via probe mounting bases, wherein each probe mounting base is fixed to the Z-axis of the corresponding displacement stage, thereby driving the radio frequency probe to translate in the XYZ axis coordinate system via the displacement stage; wherein the first radio frequency probe is used to measure the positive terminal of the differential signal of the integrated circuit, and the second radio frequency probe is used to measure the negative terminal of the differential signal of the integrated circuit. The probe display unit is used to observe the position of the two radio frequency probes and the docking data between their tips and the object under test, thereby providing a reference for adjusting the displacement of the two displacement stages; The signal adapter is secured in the test fixture by a wedge-shaped protrusion to achieve self-tightening and to maintain a stable contact connection with the signal section of the fixture, thereby transmitting the signal from the fixture to the adapter, facilitating the connection of the probe to the signal link.

2. The differential channel signal reading device as described in claim 1, characterized in that, The connecting base is mainly made of insulating material with a certain strength, including polycarbonate, nylon, and engineering plastics, and its upper surface is arranged with an array of threaded holes for mounting the two displacement stages.

3. The differential channel signal reading device as described in claim 1 or 2, characterized in that, The connecting base has a rectangular or square cutout on one side, and its size is the same as that of the test fixture on the integrated circuit test system, so as to nest the test fixture and at the same time allow the connecting base of the displacement stage to be quickly placed around the test fixture of the integrated circuit test system.

4. The differential channel signal reading device as described in claim 1 or 2, characterized in that, For the signal adapter, its main body size matches the size of the test fixture on the integrated circuit test system. At the same time, the wedge-shaped protrusions are symmetrically arranged at the upper and lower edges, so that the signal adapter has four or more points in the longitudinal or transverse direction that exceed the inner frame size of the test fixture by 0.5mm to 1mm, so as to realize the opening installation of the signal adapter on the test fixture.

5. The differential channel signal reading device as described in claim 1 or 2, characterized in that, The probe display unit includes a local magnification module and a display module. The local magnification module adjusts the focus to be near the test point through a gimbal to magnify the docking details of the RF probe. The display module is used to display the magnified image of the test point.

6. The differential channel signal reading device as described in claim 1 or 2, characterized in that, The components of the aforementioned differential channel signal reading device are designed and manufactured in a modular fashion.

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