Test card and test system

Abstract

The application relates to a test card and a test system. The test card is matched in size with the smallest test section in a connector to be tested, and the smallest test section is obtained by dividing the connector to be tested according to the signal transmission type of the connector to be tested; the test card is used for characteristic impedance testing of the connector to be tested. The size of the test card can be designed based on the size of the smallest test section in the connector to be tested, instead of full-size design, so that the manufacturing cost of the test card can be reduced, the length of the test line designed in the test card is short, the test link in the test card is simplified, the test efficiency can be improved to a certain extent, the transmission loss on the test line can be reduced during the use of the test card, the high-frequency component loss of the rising edge of the test signal is reduced, and the test precision or accuracy is improved.

Description

Technical Field

[0001] The present application relates to the field of server technology, and in particular to a test card and a test system. Background Art

[0002] With the development of servers, servers are widely used in various fields. Generally, various boards in a server are connected through corresponding connectors, and signals are transmitted through the connectors.

[0003] In practical applications, since the characteristic impedance of the selected board connector will seriously affect the signal transmission performance, it is particularly important to test the characteristic impedance of the connector.

[0004] However, the test card in the related art may have the problem of inaccurate test results for the characteristic impedance of the connector. Summary of the Invention

[0005] Based on this, it is necessary to provide a test card and a test system to address the above technical issues, so as to obtain more accurate test results when testing the characteristic impedance of the connector.

[0006] In a first aspect, an embodiment of the present application provides a test card whose size matches the size of a minimum test segment in a connector to be tested, where the minimum test segment is obtained by dividing the connector to be tested according to its signal transmission type;

[0007] Test card, used to perform characteristic impedance test on the connector under test.

[0008] In this embodiment, the size of the test card matches the size of the minimum test section in the connector to be tested. The minimum test section is obtained by dividing the connector to be tested according to the signal transmission type of the connector to be tested, and the test card is used to perform a characteristic impedance test on the connector to be tested. The size of the above-mentioned test card can be designed to match the size of the minimum test section in the connector to be tested, rather than a full-size design. This not only reduces the production cost of the test card, but also shortens the length of the test line designed in the test card, simplifies the test link in the test card, and improves the test efficiency to a certain extent. In addition, the transmission loss on the test line can be reduced during the use of the test card, thereby reducing the loss of high-frequency components on the rising edge of the test signal, thereby improving the test precision or accuracy. In addition, the shorter test line design can avoid cable twists, thereby reducing the loss of the test card and reducing the testing difficulty of the test card. At the same time, the above-mentioned test card has no restrictions on the size of the connector to be tested, thereby improving the versatility of the test card.

[0009] In one embodiment, the size of the test card is equal to the size of the smallest test section in the connector to be tested.

[0010] The embodiment can set the size of the test card equal to the size of the smallest test section in the connector to be tested, so as to minimize the size of the test card, and shorten the length of the test line designed in the test card to the greatest extent on the basis of ensuring the test function of the test card, so that the test precision of the test card is higher.

[0011] In one of the embodiments, the test card comprises a test component and an auxiliary fixing component, the auxiliary fixing component is arranged on the side surface of the body of the test card.

[0012] The test component is used to connect the test device and the connector to be tested, and perform characteristic impedance test on the connector to be tested when receiving the test signal input by the test device.

[0013] The auxiliary fixing component is used to fix the test card.

[0014] In the embodiment, the test card comprises a test component and an auxiliary fixing component, the auxiliary fixing component is arranged on the side surface of the body of the test card; the test component is used to connect the test device and the connector to be tested, and perform characteristic impedance test on the connector to be tested when receiving the test signal input by the test device; and the auxiliary fixing component is used to fix the test card. The test card can fix the test component through the auxiliary fixing component, so that the test component can perform characteristic impedance test on the connector to be tested in a higher stability, thereby improving the test precision of the test component, that is, the test precision of the test card is higher.

[0015] In one of the embodiments, the test component comprises a plurality of test terminals, a gold finger and a test line; each test terminal and the test line are arranged on the body, the test component is connected with the test device through each test terminal, and each test terminal is connected with the gold finger through the test line, and the gold finger is connected with the body.

[0016] The test card controls the gold finger to perform characteristic impedance test on the connector to be tested when receiving the test signal.

[0017] The test component in the embodiment comprises a plurality of test terminals, a gold finger and a test line; the test card can control the gold finger in the test component to perform accurate test on the characteristic impedance of the connector to be tested when receiving the test signal.

[0018] In one of the embodiments, the body of the test card is in a T-shaped structure, the T-shaped structure comprises a horizontal structure and a vertical structure, one long side of the horizontal structure is fixedly connected with one short side of the vertical structure; and the other short side of the vertical structure is connected with the gold finger.

[0019] In this embodiment, the body of the test card is a T-shaped structure, which includes a transverse structure and a longitudinal structure. A long side of the transverse structure is fixedly connected to a short side of the longitudinal structure, and the other short side of the longitudinal structure is connected to a gold finger. The body of the above-mentioned test card is set to a T-shaped structure, so that the test card can be fitted into the groove of the connector to be tested, thereby improving the tight connection between the connector to be tested and the test card, thereby improving the success rate of the test card in performing characteristic impedance testing on the connector to be tested.

[0020] In one embodiment, each of the test terminals is disposed on a surface of the transverse structure.

[0021] In this embodiment, each test terminal in the test component is arranged on the surface of the horizontal structure and can be arranged close to the test equipment to facilitate connection with the test equipment.

[0022] In one embodiment, the auxiliary fixing component is provided on a side surface of the longitudinal structure.

[0023] In this embodiment, the auxiliary fixing components in the test component can be arranged on the side surface of the longitudinal structure to facilitate fixing the test card in the slots on the fixing frame, thereby increasing the stability of the test card during application.

[0024] In one embodiment, the auxiliary fixing component includes: a first fixing component and a second fixing component, the first fixing component and the second fixing component are respectively arranged on the outer surfaces of both sides of the longitudinal structure, and the first fixing component and the second fixing component are symmetrical about the long axis direction of the longitudinal structure.

[0025] The auxiliary fixing component in this embodiment may include a first fixing component and a second fixing component, thereby improving the portability of the test card. By symmetrically designing the first fixing component and the second fixing component, the balance of the auxiliary fixing component on the test card can be improved, thereby improving the stability of the test card when the test card is connected to the connector to be tested.

[0026] In a second aspect, an embodiment of the present application provides a test system, the system comprising: a test device and a test card according to any one of the embodiments of the first aspect; the test device is connected to the test card,

[0027] The test equipment is used to control the test card to perform a characteristic impedance test on the connector to be tested, and obtain the characteristic impedance of the connector to be tested.

[0028] The test system in the embodiments of the present applicationapplicationinclude a test device and a test card, the test device is connected to the test card; the test device is configured to control the test card to perform characteristic impedance testing on a to-be-tested connector, and obtain the characteristic impedance of the to-be-tested connector. The size of the test card in the test systemapplicationbe designed to match the size of the smallest test section in the to-be-tested connector, rather than a full-size design. In this way, the manufacturing cost of the test card can be reduced, the length of the test line designed in the test card can be shortened, the test link in the test card can be simplified, the test efficiency can be improved to a certain extent, the transmission loss on the test line can be reduced during use of the test card, the loss of the high-frequency component of the rising edge of the test signal can be reduced, and thus the test precision or accuracy can be improved. Meanwhile, the size of the to-be-tested connector is not limited in the test card in the test system, and the versatility of the test system is improved.

[0029] In one of the embodiments, the system further includes a fixing frame;

[0030] When the fixing frame is connected to the to-be-tested connector, the fixing frame is configured to install an auxiliary fixing component in the test card to fix the test card.

[0031] The test system in the embodiments of the present applicationapplicationfurther include a fixing frame, when the fixing frame is connected to the to-be-tested connector, the fixing frame is configured to install an auxiliary fixing component in the test card to fix the test card, thereby enhancing the stability of the test card during application, improving the test precision of the test card, and further improving the test precision of the test system.

[0032] In one of the embodiments, the fixing frame has a ring structure.

[0033] In the embodiment, the fixing frame of the test system has a ring structure, thereby reducing the complexity when the fixing frame is connected to the to-be-tested connector, and improving the convenience of connection.

[0034] In one of the embodiments, the inner ring of the ring structure has a shape matching the outer shape of the to-be-tested connector.

[0035] In the embodiment, the inner ring of the ring structure has a shape matching the outer shape of the to-be-tested connector, so that during application, the fixing frameapplicationbe arranged outside the to-be-tested connector to tightly combine the fixing frame with the to-be-tested connector, thereby enhancing the stability when the test card is connected to the fixing frame, improving the test precision of the test card, and further improving the test precision of the test system.

[0036] In one of the embodiments, the inner ring of the ring structureapplicationinclude a plurality of slots, and the slot positions of the slotsapplicationcorrespond to the slot positions of the ground terminals on the to-be-tested connector.

[0037] In this embodiment, the inner ring of the fixed frame includes a plurality of slots, each of which can be inserted into an auxiliary fixing component in the test card to enhance the stability of the connection between the test card and the connector to be tested.

[0038] In one embodiment, the outer ring in the annular structure is configured as a fool-proof structure, and the fool-proof structure is achieved by a missing corner design on the outer ring.

[0039] In this embodiment, the outer ring of the fixed frame opening can be set as an anti-fouling structure, so that when the fixed frame opening is connected to the connector to be tested, the different pin ends of the connector to be tested can be distinguished from the outside, so that the characteristic impedance obtained by the test system can be matched with the correct pin end, avoiding the problem of inaccurate test results caused by the confusion of matching different characteristic impedances with the pin ends. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 is a side view of a connector to be tested in one embodiment;

[0041] Figure 2 is a top view of a connector to be tested in one embodiment;

[0042] Figure 3 is a front view of a test card in another embodiment;

[0043] Figure 4 A structural diagram of a test system in another embodiment;

[0044] Figure 5 FIG1 is a top view of a test system in another embodiment after the fixed frame and the test card are connected to the connector to be tested.

[0045] Reference numerals:

[0046] Test card 10; Test component 11;

[0047] Test terminal 111; Gold finger 112;

[0048] Auxiliary fixing component 12. DETAILED DESCRIPTION

[0049] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0050] In the server field, various boards in the server are connected through corresponding board connectors (i.e., connectors), and signals are transmitted between different types of boards through the connectors. In actual applications, since the characteristic impedance of the selected board connector will affect the reflection, loss, and interference of the transmitted signal, thereby seriously affecting the signal transmission performance, it is particularly important to test the characteristic impedance of the connector. In the related art, the characteristic impedance of the connector is mainly tested through a full-size test card. However, due to the long test line of the test card in the related art, the rise time of the test signal received by the test card is long and the high-frequency component is missing, resulting in the problem of inaccurate test results of the characteristic impedance of the connector. Based on this, the embodiment of the present application provides a test card 10, which can obtain more accurate test results when testing the characteristic impedance of the connector.

[0051] The embodiment of the present application provides a test card 10, the size of which matches the size of the smallest test section in the connector to be tested. The smallest test section is obtained by dividing the connector to be tested according to the signal transmission type of the connector to be tested.

[0052] The test card 10 is used to perform characteristic impedance testing on the connector to be tested.

[0053] In practical applications, the connectors to be tested may be designed in a symmetrical array, such as Figure 1 Shown is a side view of a connector to be tested. Figure 2 It should be noted that the connector to be tested is provided with a plurality of ground pins and a plurality of signal pins, and the ground pins and the signal pins can be arranged at equal distances from each other.

[0054] The signal transmission type of the connector under test can be either a single-ended signal transmission type or a differential signal transmission type. If the signal transmission type of the connector under test is single-ended, the connector under test can be a connector that transmits single-ended signals; if the signal transmission type of the connector under test is differential, the connector under test can be a connector that transmits differential signals.

[0055] At the same time, if the connector to be tested is a connector that transmits single-ended signals, a ground pin is set on both sides of each signal pin on the connector to be tested; if the connector to be tested is a connector that transmits differential signals, every two signal pins on the connector to be tested are set adjacent to each other, and a ground pin is set on both sides of every two adjacent signal pins.

[0056] Specifically, the connector under test can be divided according to its signal transmission type to obtain n minimum test segments (n greater than or equal to 2) in the connector under test. If the signal transmission type of the connector under test is single-ended and a ground pin is provided on either side of each signal pin, the dividing point of the minimum test segment can be the middle position of each ground pin on the connector under test. If the signal transmission type of the connector under test is single-ended and two ground pins are provided on either side of each signal pin, the dividing point of the minimum test segment can be the middle position of every two adjacent ground pins on the connector under test. Furthermore, if the signal transmission type of the connector under test is differential and a ground pin is provided on either side of each signal pin, the dividing point of the minimum test segment can be the middle position of each ground pin on the connector under test. If the signal transmission type of the connector under test is differential and two adjacent ground pins are provided on either side of every two adjacent signal pins on the connector under test, the dividing point of the minimum test segment can be the middle position of every two adjacent ground pins on the connector under test.

[0057] The dimensions of each minimum test segment can be equal. Optionally, the dimensions of the test card 10 can match the dimensions of the minimum test segment in the connector to be tested. That is, the width of the test card 10 can match the length of the minimum test segment in the connector to be tested, such as the width of the test card 10 being equal to 2, 3, or 4 times the length of the minimum test segment. Furthermore, in the embodiment of the present application, the width of the test card 10 can ensure that the TX signals transmitted by the TX signal group pins and the RX signals transmitted by the RX signal group pins covered by the test card 10 meet any crosstalk testing requirements.

[0058] The length of the minimum test segment can be equal to the distance between three adjacent pins on the connector under test (including one signal pin and two ground pins on either side of it), or can be equal to the distance between four adjacent pins on the connector under test (including two adjacent signal pins and two ground pins on either side of them). However, in this embodiment of the present application, the width of the test card 10 is less than the length of the connector under test (i.e., the full size of the connector under test). Optionally, the number of signal pins on the connector under test can be an even number.

[0059] In one embodiment, the size of the test card 10 is equal to the size of the smallest test section in the connector to be tested.

[0060] The dimensions of the test card 10 can be equal to the dimensions of the smallest test section in the connector under test. If the connector under test uses single-ended signal transmission, the test card 10, when connected to the connector under test, can cover two signal pins that are positioned opposite each other on the connector under test. In this case, the test card 10 can perform a characteristic impedance test on the two signal pins on the connector under test, allowing the test equipment to obtain the characteristic impedance of the two signal pins.

[0061] At the same time, if the signal transmission type of the connector to be tested is a differential signal transmission type, then when the test card 10 is connected to the connector to be tested, it can cover four signal pins, that is, two signal group pins, and the two signal group pins are arranged relatively to each other, wherein the signal group pin can be a TX signal group pin or an RX signal group pin; the TX signal group pin is used to transmit the TX signal, and the RX signal group pin is used to transmit the RX signal). Optionally, the TX signal group pin and the RX signal group pin are both composed of two adjacent signal pins. In this case, the test card 10 can perform a characteristic impedance test on the four signal pins on the connector to be tested, so that the test equipment can obtain the characteristic impedance of the TX signal group pin or the RX signal group pin. It should be noted here that when the test card 10 is connected to the connector to be tested, the TX signal group pin and the RX signal group pin on the connector to be tested are respectively located on both sides of the test card 10.

[0062] In this embodiment, the size of the test card can be set to be equal to the size of the smallest test section in the connector to be tested, so as to minimize the size of the test card. On the basis of ensuring the test function of the test card, the length of the test line designed in the test card can be greatly shortened, making the test accuracy of the test card higher.

[0063] In practical applications, the connection position between the test card 10 and the connector to be tested is not fixed and can be multiple. That is, during the characteristic impedance test, the connection position of the test card 10 can be moved to perform the characteristic impedance test on the connector to be tested.

[0064] In this embodiment, the size of the test card matches the size of the smallest test section in the connector to be tested. The smallest test section is obtained by dividing the connector to be tested according to the signal transmission type of the connector to be tested. The test card is used to perform a characteristic impedance test on the connector to be tested. The size of the above-mentioned test card can be designed to match the size of the smallest test section in the connector to be tested, rather than a full-size design. This not only reduces the production cost of the test card, but also shortens the length of the test line designed in the test card, simplifies the test link (including the test line) in the test card, and can improve the test efficiency to a certain extent. In addition, the transmission loss on the test line can be reduced during the use of the test card, thereby reducing the loss of high-frequency components on the rising edge of the test signal, thereby improving the test precision or accuracy. In addition, the shorter test line design can avoid cable twists, thereby reducing the loss of the test card and reducing the testing difficulty of the test card. At the same time, the above-mentioned test card has no restrictions on the size of the connector to be tested, thereby improving the versatility of the test card.

[0065] The components of the test card 10 are described below. In one embodiment, Figure 3 As shown, the test card 10 includes: a test component 11 and an auxiliary fixing component 12, the auxiliary fixing component 12 is provided on the side surface of the body of the test card 10;

[0066] The test component 11 is used to connect the test equipment and the connector to be tested, and perform a characteristic impedance test on the connector to be tested when receiving a test signal input by the test equipment; the auxiliary fixing component 12 is used to fix the test card 10.

[0067] In practical applications, the test component 11 can be implemented using multiple test channel selectors, test circuits, test lines, processors, and protection circuits. Optionally, the test component 11 can be communicatively connected to a test device; and during a characteristic impedance test, the test component 11 can be in contact with the connector under test.

[0068] Specifically, the test device may be a computer device, a server, etc. The computer device may be, but is not limited to, a personal computer, a laptop computer, a tablet computer, etc. The test items of the test card 10 may be configured on the test device, and the test card 10 may be controlled to test the connector under test in a test mode corresponding to the configured test items.

[0069] Optionally, the test items may be performance parameters such as insertion loss, voltage standing wave ratio, and frequency. If the test item is insertion loss, the test mode corresponding to the test item may be an insertion loss test mode; if the test item is voltage standing wave ratio, the test mode corresponding to the test item may be a voltage standing wave ratio test mode; if the test item is frequency, the test mode corresponding to the test item may be a frequency test mode.

[0070] In the embodiment of the present application, the test item described above can be characteristic impedance, and the test mode corresponding to the test item is characteristic impedance test mode. The embodiment of the present application is described by taking that the test device configures the test item of the test card 10 as characteristic impedance, and in this case, the test card 10 can be in the characteristic impedance test mode.

[0071] Optionally, the test device can input a test signal (i.e. a step signal) to the test card 10, and the test card 10 starts to perform the characteristic impedance test after receiving the test signal. In this case, the test device can obtain the characteristic impedance of the connector under test tested by the test card 10. The test device can output the characteristic impedance of the connector under test in the form of voice broadcast, text view, table, etc.

[0072] In one embodiment, continuing to refer to Figure 3 The test component 11 described above includes a plurality of test terminals 111, a gold finger 112 and a test line (not shown in the test line in the embodiment) Figure 3 Each test terminal 111 and the test line are arranged on the body, the test component 11 is connected with the test device through each test terminal 111, and each test terminal 111 is connected with the gold finger 112 through the test line, the gold finger 112 is connected with the body.

[0073] In this case, the test card 10 controls the gold finger 112 to perform the characteristic impedance test on the connector under test when receiving the test signal.

[0074] In actual application, the test component 11 can include a plurality of test terminals 111, a gold finger 112 and a test line. Meanwhile, each test terminal 111 in the test card 10 can be connected with the corresponding pin in the gold finger 112 through the test line arranged in the test card 10, so as to control the gold finger 112 to perform the characteristic impedance test on the connector under test and transmit the characteristic impedance of the connector under test tested to the test device. Optionally, each test terminal 111 described above can be, but is not limited to, a 3.5mm, 2.92mm, 2.4mm radio frequency coaxial (SMA) connector.

[0075] Optionally, the body of the test card 10 can be a plate made of glass fiber, epoxy resin, etc., and the surface is covered with a copper layer. In the embodiment of the present application, the body can be a PCB. Each test terminal 111 can be a metal spring piece. Each test terminal 111 can be arranged at different positions on the surface layer of the body. In actual application, the body is provided with a copper hole, and each test terminal 111 can be connected with the test line through the copper hole. Meanwhile, the test line can be arranged on the surface layer or the inner layer of the body.

[0076] Meanwhile, the gold fingers 112 in the test component 11 can be composed of multiple golden conductive contacts, each of which can be a contact pin. After the test card 10 is connected to the connector under test, the gold fingers 112 in the test component 11 are actually connected to the test part of the connector under test.

[0077] The test line length can be set as follows: using tools such as high-frequency electromagnetic simulation software HFSS and three-dimensional electromagnetic field simulation software CST to create a 3D model of test component 11 (including 3D models of each test terminal 111, gold finger 112, and test line). A test signal (i.e., a step signal) is then input to each test terminal 111. A probe is added to the gold finger 112 position in the 3D model to capture the rise time of the test signal as it passes through the test signal link (i.e., each test terminal 111 --> test line --> gold finger 112). Simultaneously, by adjusting the length of the test line in the 3D model, if the rise time corresponding to the current length of the test line captured by the probe meets the ideal rise time, the current length of the test line can be determined as the maximum length of the test line in test component 11. In practical applications, the length of the test line in test component 11 can be less than or equal to the current length of the test line in the 3D model.

[0078] The test component in this embodiment includes multiple test terminals, gold fingers and test lines; the above-mentioned test card can control the gold fingers in the test component to accurately test the characteristic impedance of the connector to be tested when receiving the test signal.

[0079] The test card 10 is further provided with an auxiliary fixing component 12 for fixing the test card 10 when connected to the connector to be tested, so that the test card 10 is more stable during the test process, thereby improving the test accuracy.

[0080] Alternatively, the auxiliary fixing member 12 may be a spring clip, a fixing screw, an adhesive component, or the like. If the auxiliary fixing member 12 is a fixing screw, a nut can be passed through the fixing screw and connected to the connector under test to secure the test card 10. If the auxiliary fixing member is an adhesive component, the adhesive component can be connected to the connector under test to secure the test card 10. Furthermore, the auxiliary fixing member 12 may be disposed on a side surface of the body of the test card 10 or disposed across the side surface of the body with one end exposed outside the side surface.

[0081] In this embodiment, a test card includes a test component and an auxiliary fixing component. The auxiliary fixing component is disposed on a side surface of the test card body. The test component is used to connect a test device to a connector under test and, upon receiving a test signal input from the test device, perform a characteristic impedance test on the connector under test. The auxiliary fixing component is used to secure the test card. The auxiliary fixing component secures the test component to the test card, allowing the test component to perform a characteristic impedance test on the connector under test with high stability. This improves the test component's test accuracy, thereby increasing the test accuracy of the test card.

[0082] In one embodiment, see Figure 3 The body of the test card 10 is a T-shaped structure, which includes a horizontal structure and a vertical structure. A long side of the horizontal structure is fixedly connected to a short side of the vertical structure; the other short side of the vertical structure is connected to the gold finger 112.

[0083] In practical applications, the body of the test card 10 may be a T-shaped structure, which includes a transverse structure and a longitudinal structure. Optionally, both the transverse structure and the longitudinal structure may be solid structures.

[0084] Among them, the horizontal structure can be Figure 3 The structure in the horizontal direction, the longitudinal structure can be Figure 3 Optionally, the center of a long side of the transverse structure and the center of a short side of the longitudinal structure may be fixedly connected, and the fixed connection may be by welding, threaded connection, key connection, pin connection, etc.

[0085] Meanwhile, the other short side of the longitudinal structure can be detachably connected to the gold finger 112. Optionally, the other short side of the longitudinal structure can be designed as a slot, and the gold finger 112 can be inserted into the slot to connect with the main body of the test card 10. The length of the gold finger 112 is the same as the length of the other short side of the longitudinal structure.

[0086] In one embodiment, each of the test terminals is disposed on a surface of the transverse structure.

[0087] It should be noted that the gold finger 112 in the test component 11 is connected to the connector to be tested, that is, the other short side of the longitudinal structure of the test component 11 is connected close to the connector to be tested. In the embodiment of the present application, in order to improve the communication between the test component 11 and the test equipment, each test terminal 111 in the test component 11 can be set on the surface of the transverse structure to be close to the test equipment. Optionally, the surface of the transverse structure can be the front surface or the back surface of the transverse structure.

[0088] The test terminals can be arranged on the surface of the transverse structure, so that the test terminals can be connected with the gold fingers through the test lines on the body of the test card, and the test card can realize the characteristic impedance test function.

[0089] In the embodiment, the body of the test card is in a T-shaped structure, the T-shaped structure includes a transverse structure and a longitudinal structure, one long side of the transverse structure is fixedly connected with one short side of the longitudinal structure, and the other short side of the longitudinal structure is connected with the gold fingers; the body of the test card is arranged in the T-shaped structure, so that the test card can be mounted in the groove of the connector to be tested, the close connection between the connector to be tested and the test card is improved, and the success rate of the characteristic impedance test of the test card on the connector to be tested is improved.

[0090] In one embodiment, the auxiliary fixing component 12 in the test component 11 is arranged on the side surface of the longitudinal structure.

[0091] The auxiliary fixing component 12 in the test component 11 can be arranged on the side surface of the longitudinal structure, and can be in a ring-shaped structure, an L-shaped structure or a U-shaped structure.

[0092] In the embodiment, the auxiliary fixing component in the test component is arranged on the side surface of the longitudinal structure, so that the test card can be fixed in the slot of the fixing frame, and the stability of the test card in the application process is improved.

[0093] In one embodiment, the auxiliary fixing component 12 includes a first fixing component and a second fixing component, the first fixing component and the second fixing component are arranged on the two side surfaces of the longitudinal structure respectively, and the first fixing component and the second fixing component are symmetrical about the long axis direction of the longitudinal structure.

[0094] In actual application, the auxiliary fixing component 12 can include a first fixing component and a second fixing component, and the structures of the first fixing component and the second fixing component can be the same. Alternatively, the first fixing component and the second fixing component can be fixing pins, which can be in a columnar structure, such as a cylindrical structure, a square columnar structure or a ladder columnar structure. In the embodiment, the columnar structure can be a square columnar structure.

[0095] Meanwhile, the first fixing component and the second fixing component can be arranged on the two side surfaces of the longitudinal structure respectively, and the first fixing component and the second fixing component are symmetrical about the long axis direction of the longitudinal structure. Alternatively, the long axis direction of the longitudinal structure can be consistent with the long side direction of the longitudinal structure.

[0096] The auxiliary fixing component in this embodiment may include a first fixing component and a second fixing component, thereby improving the portability of the test card. By symmetrically designing the first fixing component and the second fixing component, the balance of the auxiliary fixing component on the test card can be improved, thereby improving the stability of the test card when the test card is connected to the connector to be tested.

[0097] In this embodiment, each test terminal in the test component is arranged on the surface of the horizontal structure and can be arranged close to the test equipment to facilitate connection with the test equipment.

[0098] The present application also provides a test system. Figure 4 As shown, the test system may include a test device and a test card 10 in any of the above embodiments; the test device is connected to the test card 10,

[0099] The test device is used to control the test card 10 to perform a characteristic impedance test on the connector to be tested, and obtain the characteristic impedance of the connector to be tested.

[0100] in, Figure 4 The test system is illustrated using a personal computer as the test device. In this embodiment of the present application, the test card 10 can communicate with the test device via the test terminals 111. It should be noted that the test card 10 can be configured with test items on the test device, and the test card 10 can be controlled to test the connector under test in the test mode corresponding to the configured test items.

[0101] Optionally, the test items may be performance parameters such as insertion loss, voltage standing wave ratio, and frequency. If the test item is insertion loss, the test mode corresponding to the test item may be an insertion loss test mode; if the test item is voltage standing wave ratio, the test mode corresponding to the test item may be a voltage standing wave ratio test mode; if the test item is frequency, the test mode corresponding to the test item may be a frequency test mode.

[0102] In the embodiment of the present application, the test item may be characteristic impedance, and the test mode corresponding to the test item is a characteristic impedance test mode. The embodiment of the present application is described by assuming that the test equipment configures the test item of the test card 10 as characteristic impedance. When the test equipment configures the test item of the test card 10 as characteristic impedance, the test card 10 may be in the characteristic impedance test mode.

[0103] Optionally, the test device can input a test signal (i.e., a step signal) to the test card 10. Upon receiving the test signal, the test card 10 begins performing a characteristic impedance test. At this point, the test device can obtain the characteristic impedance of the connector under test as measured by the test card 10. The test device can output the characteristic impedance of the connector under test in the form of voice broadcast, text display, or a table.

[0104] The test system in the embodiments of the present application can include a test device and a test card, the test device is connected to the test card; the test device is used to control the test card to perform characteristic impedance testing on the to-be-tested connector, and obtain the characteristic impedance of the to-be-tested connector. The size of the test card in the test system can be designed to match the size of the smallest test section in the to-be-tested connector, rather than full-size design. In this way, the manufacturing cost of the test card can be reduced, the length of the test line designed in the test card can be shortened, the test link in the test card can be simplified, the test efficiency can be improved to a certain extent, the transmission loss on the test line can be reduced during the use of the test card, the loss of the high-frequency component of the rising edge of the test signal is reduced, and then the test precision or accuracy is improved. Meanwhile, the test card in the test system has no size limitation on the to-be-tested connector, and the universality of the test system is improved.

[0105] In one embodiment, the test system further includes a fixed frame opening, which is used to install the auxiliary fixing component 12 in the test card 10 to fix the test card 10 when the fixed frame opening is connected to the to-be-tested connector.

[0106] In actual application, the fixed frame opening can include a plurality of frame opening assemblies, and each frame opening assembly can be provided with a slot for installing the auxiliary fixing component 12 in the test card 10 to fix the test card 10.

[0107] Optionally, the number of frame opening assemblies included in the fixed frame opening can be equal to the number of the smallest test sections in the to-be-tested connector; the structure of each frame opening assembly can be the same, and each frame opening assembly can be arranged at the middle position of each smallest test section in the to-be-tested connector, and used to fix the auxiliary fixing component 12 in the test card 10 through the slot when the test card 10 is connected to each smallest test section in the to-be-tested connector.

[0108] It should be noted that the detachable connection between each frame opening assembly and the corresponding smallest test section in the to-be-tested connector can be adhesive connection, threaded connection, pin connection, buckle connection or key connection, etc. Optionally, each frame opening assembly can be made of pure metal material or alloy material.

[0109] In one embodiment, the fixed frame opening is a ring structure.

[0110] In the embodiments of the present application, the fixed frame opening can be an integral ring structure. Optionally, the fixed frame opening can be made of pure metal material or alloy material, but in the embodiments of the present application, the fixed frame opening can be made of plastic material, such as acrylonitrile-styrene-butadiene copolymer, polylactide, etc. In actual application, the fixed frame opening can be arranged on the outer surface of the to-be-tested connector when the fixed frame opening is connected to the to-be-tested connector.

[0111] In this embodiment, the fixed frame opening of the test system is designed as a ring structure, thereby reducing the complexity of connecting the fixed frame opening with the connector to be tested and improving the convenience of connection.

[0112] The test system in the embodiment of the present application also includes a fixed frame opening, which is used to install auxiliary fixing components in the test card to fix the test card when the fixed frame opening is connected to the connector to be tested, thereby enhancing the stability of the test card during application, improving the test accuracy of the test card, and thereby improving the test accuracy of the test system.

[0113] In one embodiment, the inner ring of the annular structure includes a plurality of slots, and the slot position of each slot corresponds to the slot position of each ground terminal on the connector to be tested.

[0114] The inner ring of the fixed frame can be provided with multiple slots for inserting auxiliary fixing components in the test card 10 when the test card 10 is connected to the connector under test; each slot is designed in a symmetrical array on the inner ring of the fixed frame. Optionally, the number of slots on the fixed frame can be equal to twice the number of the minimum test segments divided as described above, and the test card 10 can insert auxiliary fixing components into different slots to test the signal pins on different minimum test segments. In actual application, the test card 10 is only inserted into two opposing slots at a time to test the signal pins on one minimum test segment. After testing the signal pins on the minimum test segment, the test card 10 can be removed from the current two slots and then inserted into two other opposing slots to test the signal pins on another minimum test segment, and so on, until all signal pins on each minimum test segment are tested. It should be noted that the slot positions of each slot on the inner ring correspond to the slot positions of each ground terminal on the connector under test.

[0115] At the same time, if a grounding pin is set on both sides of each signal pin or two adjacent signal pins on the connector to be tested, the slot position of each slot on the fixed frame mouth on the inner ring can correspond to the middle position of each grounding terminal on the connector to be tested, and can also correspond to a certain distance on either side of the middle position of each grounding terminal; if two grounding pins are set on both sides of each signal pin or two adjacent signal pins on the connector to be tested, the slot position of each slot on the fixed frame mouth on the inner ring can correspond to the middle position of every two adjacent grounding terminals on the connector to be tested, and can also correspond to a certain distance on either side of the middle position of every two adjacent grounding terminals.

[0116] In the embodiments of the present application, the slot position of each slot on the inner ring of the fixed frame is only required to be able to match the slot position of the auxiliary fixing assembly on the test card 10 when the test card 10 is connected with the connector to be tested. Alternatively, the slot depth of each slot can be greater than or equal to the height of the auxiliary fixing assembly on the test card 10.

[0117] In one embodiment, the outer ring in the ring structure is provided as a foolproof structure, which is achieved by a notched corner on the outer ring.

[0118] It should be noted that the outer ring in the ring structure can be designed as a foolproof structure, which can be achieved by a boss on the outer ring of the ring structure. The boss can be circular, square, rectangular, diamond-shaped, etc.

[0119] In the embodiments of the present application, the foolproof structure can be achieved by a notched corner on the outer ring of the ring structure. The notched corner can be triangular, circular, diamond-shaped, square, etc. However, in the embodiments of the present application, the notched corner can be rectangular.

[0120] In actual applications, since the connector to be tested is designed in an array symmetry, i.e., the ground pins and the signal pins are designed in an array symmetry, the outer ring in the ring structure can be designed as a foolproof structure to distinguish different pin ends of the connector to be tested.

[0121] For example, if the signal transmission type of the connector to be tested is a differential signal transmission type, the symmetrical signal pins on both sides of the connector to be tested can transmit TX signals, and the symmetrical signal pins on the other side can transmit RX signals. In the embodiments of the present application, when the fixed frame is connected with the connector to be tested, the foolproof structure on the fixed frame can be used to distinguish the TX pin end and the RX pin end of the connector to be tested.

[0122] As shown in FIG. 8, Figure 5 FIG. 8 is a top view of the test card and the fixed frame connected with the connector to be tested (of a differential signal transmission type) in the test system, Figure 5 FIG. 8(a) is a schematic view of the test card whose width is equal to twice the length of the minimum test section, Figure 5The outermost rectangle in the figure represents the outer edge of the base plate of the connector under test. The rectangle with a rectangular notch in the upper left corner represents the outer ring of the fixed frame. The rectangle with multiple protruding slots on the inner side of the outer ring represents the inner ring of the fixed frame. After the test card is connected to the connector under test, it is located on the leftmost side of the connector under test. The multi-fold line structure passing through the small black rectangular blocks on both sides of the test card is an auxiliary fixing component in the test card. The two adjacent signal pins on the connector under test on both sides of the test card can transmit TX signals and RX signals (i.e., TX0, TX1, RX0 and RX1). The small black rectangular blocks represent ground pins. The slot position of each slot in the figure corresponds to the middle position of the corresponding ground pin.

[0123] In this embodiment, the outer ring of the fixed frame opening can be set as an anti-foolproof structure, so that when the fixed frame opening is connected to the connector to be tested, the different pin ends of the connector to be tested can be distinguished from the outside, so that the characteristic impedance obtained by the test system can be matched with the correct pin end, avoiding the problem of inaccurate test results caused by the confusion of matching different characteristic impedances with the pin ends.

[0124] In one embodiment, the shape of the inner ring in the annular structure matches the outer shape of the connector to be tested.

[0125] In actual use, the connector under test can be mounted on the bottom plate of the connector under test. When the test card 10 is connected to the connector under test, as long as the gold fingers 112 of the test card 10 are in good contact with the tested portion of the connector under test, it is sufficient. To improve the stability of the test card 10 during use, the inner ring shape of the fixed frame can be configured to match the outer shape of the connector under test. During use, the fixed frame is positioned outside the connector under test to ensure a tight fit between the fixed frame and the connector under test.

[0126] Optionally, the inner ring size of the annular structure can be greater than or equal to the size of the connector under test, that is, the inner ring length of the annular structure is greater than or equal to the length of the connector under test, but the inner ring width of the annular structure is greater than or equal to the width of the connector under test. The inner ring length of the fixed frame opening can be referred to as the opening length of the fixed frame opening, and the inner ring width of the fixed frame opening can be referred to as the opening width of the fixed frame opening.

[0127] In this embodiment, the shape of the inner ring in the annular structure matches the outer shape of the connector to be tested, so that during application, the fixed frame opening can be set on the outside of the connector to be tested, so that the fixed frame opening and the connector to be tested are tightly combined, thereby enhancing the stability of the connection between the test card and the fixed frame opening, thereby improving the test accuracy of the test card and further improving the test accuracy of the test system.

[0128] In the embodiment, the inner ring of the fixed frame opening includes a plurality of slots, each slot being capable of inserting a test card auxiliary fixing component to enhance the stability of the test card when connected to the connector under test.

[0129] Any combination of the technical features in the above embodiments can be made. In order to make the description simple, all possible combinations of the technical features in the above embodiments are not described, however, as long as the combination of the technical features does not exist, it should be considered as the scope of the description.

[0130] The above embodiments only express several implementation manners of the application, the description is more specific and detailed, but it should not be understood as a limitation on the scope of the patent. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the application, a number of modifications and improvements can be made, which are within the scope of the application. Therefore, the protection scope of the patent of the application should be subject to the appended claims.

Claims

1. A test card, characterized in that: The test card includes a test component and an auxiliary fixing component, wherein the auxiliary fixing component is provided on a side surface of the test card body; the size of the test card matches the size of the smallest test section in the connector to be tested, wherein the smallest test section is obtained by dividing the connector to be tested according to the signal transmission type of the connector to be tested; The test component includes: a plurality of test terminals, gold fingers and test lines; each of the test terminals and the test lines are arranged on the body, the test component is connected to the test equipment through each of the test terminals, and each of the test terminals is connected to the gold fingers through the test lines, and the gold fingers are connected to the body; Among them, the testing component is used to connect the testing equipment and the connector to be tested, and when receiving the test signal input by the testing equipment, control the gold finger to perform a characteristic impedance test on the connector to be tested; the auxiliary fixing component is used to fix the test card.

2. The test card according to claim 1, wherein: The size of the test card is equal to the size of the smallest test section in the connector to be tested.

3. The test card according to claim 1 or 2, characterized in that: The body of the test card is a T-shaped structure, which includes a horizontal structure and a vertical structure. A long side of the horizontal structure is fixedly connected to a short side of the vertical structure; the other short side of the vertical structure is connected to a gold finger.

4. The test card according to claim 3, wherein: The auxiliary fixing component is arranged on a side surface of the longitudinal structure.

5. The test card according to claim 4, wherein: The auxiliary fixing component includes: a first fixing component and a second fixing component, the first fixing component and the second fixing component are respectively arranged on the outer surfaces of both sides of the longitudinal structure, and the first fixing component and the second fixing component are symmetrical about the long axis direction of the longitudinal structure.

6. A testing system, characterized in that: The system comprises: a test device and a test card according to any one of claims 1 to 5; the test device is connected to the test card; The testing device is used to control the testing card to perform a characteristic impedance test on the connector to be tested, so as to obtain the characteristic impedance of the connector to be tested.

7. The system according to claim 6, characterized in that The system further comprises: a fixed frame opening; When the fixing frame is connected to the connector to be tested, it is used to install the auxiliary fixing component in the test card to fix the test card.

8. The system according to claim 7, characterized in that The fixed frame opening is a ring-shaped structure; the shape of the inner ring in the ring-shaped structure matches the outer shape of the connector to be tested.

9. The system according to claim 8, characterized in that The inner ring of the annular structure includes a plurality of slots, and the slot position of each slot corresponds to the slot position of each ground terminal on the connector to be tested.

10. The system according to claim 8, wherein: The outer ring in the annular structure is configured as a fool-proof structure, and the fool-proof structure is achieved by a notch design on the outer ring.

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