Battery management system hardware-in-the-loop test method, device, equipment and medium

Abstract

The application discloses a kind of battery management system hardware-in-the-loop test method, device, equipment and medium, belong to vehicle technical field.The method includes: obtaining the single voltage and single temperature of battery pack in charge-discharge test;The single voltage and single temperature are processed, and test single voltage and test single temperature for hardware-in-the-loop test are generated;The test single voltage and test single temperature are input to the battery management system and carry out the hardware-in-the-loop test.The method can process the real single voltage and single temperature obtained in battery pack charge-discharge test, obtain test single voltage and test single temperature suitable for hardware-in-the-loop test, input the test single voltage and test single temperature to the battery management system and carry out hardware-in-the-loop test, reduce the error of test, improve test precision.

Description

Technical Field

[0001] This invention relates to the field of vehicle technology, and in particular to a method, apparatus, equipment, and medium for hardware-in-the-loop testing of a battery management system. Background Technology

[0002] HIL (Hardware-in-the-Loop) simulation testing systems use real-time processors to run simulation models to mimic the operating state of a controlled object. These models connect to the ECU (Electronic Control Unit) under test via I / O interfaces, enabling comprehensive and systematic testing. Considering safety, feasibility, and reasonable cost, HIL simulation testing has become a crucial part of the ECU development process. It reduces the number of real-vehicle road tests, shortens development time, lowers costs, improves ECU software quality, and reduces risks for automakers.

[0003] In related technologies, during the testing of a Battery Management System (HIL), a battery simulation model is used in conjunction with the HIL cabinet hardware board to input signals such as the individual cell voltage and temperature of the battery into the controller of the BMS under test, in order to simulate the individual cell voltage and temperature signals of a real battery.

[0004] However, the battery simulation models mentioned above generally use equivalent circuit models to simulate the external characteristics of the battery pack, and then calculate the individual cell voltage and temperature of the battery. Therefore, the individual cell voltage and temperature received by the controller of the BMS under test are calculated by the battery simulation model, which cannot truly reflect the actual individual cell voltage and temperature of the battery pack, resulting in low test accuracy. Summary of the Invention

[0005] In view of the above problems, the present invention is proposed to provide a method, apparatus, device and medium for hardware-in-the-loop testing of a battery management system to solve the above problems. It can process the actual cell voltage and cell temperature obtained in the battery pack charge and discharge test to obtain test cell voltage and test cell temperature suitable for hardware-in-the-loop testing. The test cell voltage and test cell temperature are then input into the battery management system for hardware-in-the-loop testing, thereby reducing test errors and improving test accuracy.

[0006] In a first aspect, the present invention provides a hardware-in-the-loop testing method for a battery management system, the method comprising:

[0007] Obtain the individual cell voltage and temperature of the battery pack during charge and discharge tests;

[0008] The individual cell voltage and temperature are processed to generate test individual cell voltage and test individual cell temperature for hardware-in-the-loop testing;

[0009] The voltage and temperature of the test cell are input into the battery management system to perform the hardware-in-the-loop test.

[0010] Optionally, before obtaining the cell voltage and cell temperature of the battery pack during the charge-discharge test, the method further includes:

[0011] The battery pack was placed under different operating conditions, and charge and discharge tests were conducted at different charge and discharge rates. Samples were taken at different charge and discharge times to obtain the individual cell voltage and temperature of the battery pack at different charge and discharge times.

[0012] Optionally, the processing of the individual cell voltage and temperature to generate test cell voltage and test cell temperature for hardware-in-the-loop testing includes:

[0013] Select the maximum and minimum single-cell voltage, maximum and minimum single-cell temperature under the same charge / discharge time from the single-cell voltage and single-cell temperature;

[0014] Under the same charge and discharge time, a randomized single-cell voltage is generated between the maximum single-cell voltage and the minimum single-cell voltage, and a randomized single-cell temperature is generated between the maximum single-cell temperature and the minimum single-cell temperature;

[0015] According to the preset charge and discharge test strategy, the random cell voltage and random cell temperature under different charge and discharge times are spliced ​​together to obtain the test cell voltage and test cell temperature for the hardware-in-the-loop test.

[0016] Optionally, the step of splicing the random cell voltage and random cell temperature at different charge / discharge times according to a preset charge / discharge test strategy to obtain the test cell voltage and test cell temperature for the hardware-in-the-loop test includes:

[0017] Obtain the operating conditions in the charge and discharge test strategy, as well as the charge and discharge rate, starting capacity, and ending capacity of each charge and discharge stage;

[0018] Find all random cell voltages and random cell temperatures under the stated operating conditions;

[0019] According to the charge / discharge rate, the initial charge, and the final charge of each charge / discharge stage, the random cell voltage and random cell temperature corresponding to each charge / discharge stage are selected from all the random cell voltages and random cell temperatures.

[0020] The random cell voltage and random cell temperature corresponding to each charge / discharge stage are sequentially spliced ​​together according to the order of the charge / discharge stages to obtain the test cell voltage and test cell temperature used for the hardware-in-the-loop test.

[0021] Optionally, after inputting the test cell voltage and the test cell temperature into the battery management system for the hardware-in-the-loop test, the method further includes:

[0022] Obtain the simulation data output by the battery management system;

[0023] Based on the simulation data, the test results of the battery management system are determined.

[0024] Optionally, determining the test results of the battery management system based on the simulation data includes:

[0025] If the simulation data includes the first relationship curve between open circuit voltage and state of charge obtained by the battery management system using the SOC algorithm, then the second relationship curve between open circuit voltage and state of charge obtained by the battery pack charge and discharge test is obtained.

[0026] Determine the goodness of fit between the first relationship curve and the second relationship curve;

[0027] If the degree of fit is greater than the preset degree of fit threshold, then the SOC algorithm test result of the battery management system is determined to be passed.

[0028] Optionally, determining the test results of the battery management system based on the simulation data includes:

[0029] If the simulation data includes the simulated state of charge, then the actual state of charge obtained from the battery pack charge-discharge test is acquired.

[0030] If the error between the simulated state of charge and the actual state of charge is less than the error threshold, then the state of charge test result of the battery management system is determined to be passed.

[0031] In a second aspect, the present invention provides a hardware-in-the-loop testing device for a battery management system, the device comprising:

[0032] The acquisition module is used to acquire the individual cell voltage and temperature of the battery pack during charge and discharge tests.

[0033] A generation module is used to process the individual cell voltage and the individual cell temperature to generate test individual cell voltage and test individual cell temperature for hardware-in-the-loop testing.

[0034] An input module is used to input the voltage and temperature of the test cell into the battery management system for the hardware-in-the-loop test.

[0035] Thirdly, the present invention provides an electronic device comprising: a memory and a processor, the memory and the processor being communicatively connected to each other, the memory storing computer instructions, and the processor executing the computer instructions to perform the method as described in the first aspect.

[0036] Fourthly, the present invention provides a computer-readable storage medium storing computer instructions for causing the computer to perform the method as described in the first aspect.

[0037] The technical solutions provided in the embodiments of the present invention have at least the following technical effects or advantages:

[0038] This invention provides a method, apparatus, device, and medium for hardware-in-the-loop testing of a battery management system. The method acquires the individual cell voltages and temperatures of the battery pack during charge-discharge tests to obtain the actual individual cell voltages and temperatures, rather than those calculated by a model. The individual cell voltages and temperatures are processed to generate test individual cell voltages and temperatures suitable for hardware-in-the-loop testing. These test individual cell voltages and temperatures are then input into the battery management system for hardware-in-the-loop testing, thereby more accurately simulating the real state of the battery pack and resulting in smaller test result errors and higher accuracy.

[0039] The above description is merely an overview of the technical solution of the present invention. In order to better understand the technical means of the present invention and to implement it in accordance with the contents of the specification, and to make the above and other objects, features and advantages of the present invention more apparent and understandable, specific embodiments of the present invention are described below. Attached Figure Description

[0040] Various other advantages and benefits will become apparent to those skilled in the art upon reading the following detailed description of preferred embodiments. The accompanying drawings are for illustrative purposes only and are not intended to limit the invention. Furthermore, the same reference numerals denote the same parts throughout the drawings. In the drawings:

[0041] Figure 1 This is a structural block diagram of a hardware-in-the-loop testing system provided in an embodiment of the present invention;

[0042] Figure 2 This is a flowchart of a hardware-in-the-loop testing method for a battery management system provided in an embodiment of the present invention;

[0043] Figure 3 This is a structural block diagram of a hardware-in-the-loop testing device for a battery management system provided in an embodiment of the present invention. Detailed Implementation

[0044] To make the objectives, technical solutions, and advantages of this application clearer, the embodiments of this application will be described in further detail below with reference to the accompanying drawings.

[0045] Before providing a detailed description of the hardware-in-the-loop testing method for the battery management system of the present invention, a brief introduction to the implementation environment involved in the present invention will be given first.

[0046] Figure 1 This is a structural block diagram of a hardware-in-the-loop testing system provided in an embodiment of the present invention, such as... Figure 1 As shown, the hardware-in-the-loop test system 100 includes HIL test software 101, battery voltage simulator 102, battery temperature simulator 103, insulation resistance simulator 104, I / O board 105, CAN communication board 106, low voltage power supply 107, high voltage power supply 108, and BMS (i.e., battery management system under test) 109.

[0047] The input ports of the battery voltage simulator 102, battery temperature simulator 103, insulation resistance simulator 104, I / O board 105, CAN communication board 106, low-voltage power supply 107, and high-voltage power supply 108 are connected to the output port of the HIL test software 101, and their output ports are connected to the input port of the BMS under test 109; the output port of the BMS under test 109 is connected to the input port of the CAN communication board 106, and the output port of the CAN communication board 106 is connected to the input port of the HIL test software 101.

[0048] During hardware-in-the-loop testing, HIL test software 101 outputs the individual cell voltage and temperature, as well as the insulation resistance and total voltage of the battery pack. Battery voltage simulator 102 converts the individual cell voltage output by HIL test software 101 into a real voltage and sends it to the BMS 109 under test. Battery temperature simulator 103 converts the individual cell temperature output by HIL test software into a real temperature and sends it to the BMS 109 under test. Insulation resistance simulator 104 converts the insulation resistance value output by HIL test software 101 into a real insulation resistance value and sends it to the BMS 109 under test. High-voltage power supply 108 converts the total voltage output by HIL test software 101 into a real voltage. The total voltage is sent to the BMS109 under test. The low-voltage power supply 107 provides power to various hardware devices. The I / O board 105 outputs a voltage value representing the battery output current according to the initial charge / discharge rate (or current) and sends it to the BMS109 under test. The BMS109 under test converts the received test cell voltage, test cell temperature, total voltage, and insulation value into real-time SOC and other simulation data according to the preset battery management system algorithm. The CAN communication board 106 sends the simulation data output by the BMS109 under test to the HIL test software 101. The HIL test software 101 analyzes the test results based on the received simulation data.

[0049] Next, the hardware-in-the-loop testing method for the battery management system of the present invention will be described in detail with reference to the accompanying drawings.

[0050] Figure 2 This is a flowchart of a hardware-in-the-loop testing method for a battery management system provided in an embodiment of the present invention, such as... Figure 2 As shown, the method includes:

[0051] Step S210: Obtain the individual cell voltage and temperature of the battery pack during the charge and discharge test.

[0052] In this embodiment, in the past, when conducting hardware-in-the-loop testing of the battery management system, the cell voltage and cell temperature input to the battery management system were values ​​calculated by the equivalent circuit model. Although the accuracy of the model is constantly improving, it is difficult for the model to model the physical and chemical changes that occur in the battery under different operating conditions. Therefore, the calculated cell voltage and cell temperature have a certain error compared with the actual cell voltage and cell temperature of the battery, resulting in errors in the hardware-in-the-loop test results. The battery management system is a key link connecting the vehicle system, motor and battery pack. The integrity and accuracy of its functions will directly affect the safety, energy consumption and service life of the vehicle. Therefore, it is essential to improve the accuracy of the hardware-in-the-loop testing of the battery management system.

[0053] Therefore, by conducting real charge-discharge tests on the battery pack and collecting the actual individual cell voltages and temperatures during the tests, this application can reduce test errors and improve test accuracy by using the actual individual cell voltages and temperatures for hardware-in-the-loop testing of the battery management system.

[0054] Optionally, prior to step S210, the method includes:

[0055] The battery pack was placed under different operating conditions, and charge and discharge tests were conducted at different charge and discharge rates. Samples were taken at different charge and discharge times to obtain the individual cell voltage and temperature of the battery pack at different charge and discharge times.

[0056] In this embodiment, to simulate different operating conditions of the battery pack in a real vehicle, the battery pack is subjected to charge-discharge tests under different conditions. Since the internal reactions of the battery pack differ under different charge-discharge rates, the battery pack is also controlled to undergo charge-discharge tests at different rates. During the charge-discharge process, the individual cell voltage and temperature are sampled at regular intervals, with each sampling occurring at a different charge-discharge time. Finally, the individual cell voltage and temperature, varying with charge-discharge time under different operating conditions and charge-discharge rates, can be obtained. The individual cell voltage includes the initial individual cell voltage and initial individual cell temperature when the charge-discharge time is 0, meaning there is an initial individual cell voltage and initial individual cell temperature for each operating condition.

[0057] The operating conditions refer to the test conditions under which the battery pack is subjected to, which may include ambient temperature and / or ambient humidity. This means that the battery pack is placed under different ambient temperatures and / or different ambient humidity conditions for charge and discharge tests.

[0058] In this embodiment, multiple charge-discharge tests can be performed under the same operating conditions and charge-discharge rates to obtain multiple sets of individual cell voltages and temperatures under the same operating conditions and charge-discharge rates. These individual cell voltages and temperatures are recorded in tables, resulting in multiple data tables. These multiple data tables form a data matrix. All data matrices for all operating conditions and all charge-discharge rates are stored in a database, so that the database stores the individual cell voltages and temperatures varying with charge-discharge time under different operating conditions and charge-discharge rates. The database is then deployed in the HIL testing software. The table format can be a Matlab m-file or a five-dimensional array from the Simulink Database.

[0059] It should be noted that in charge-discharge tests, the more tests conducted and the shorter the sampling interval, the larger and more detailed the amount of data obtained, and the more accurate the test results will be.

[0060] Step S220: Process the individual cell voltage and temperature to generate test cell voltage and test cell temperature for hardware-in-the-loop testing.

[0061] In this embodiment, the cell voltage and temperature obtained from the charge-discharge test are retrieved from the database, and the cell voltage and temperature are processed by HIL test software to generate test cell voltage and test cell temperature suitable for hardware-in-the-loop testing, making the test results more accurate.

[0062] Optionally, step S220 includes:

[0063] The first step is to select the maximum and minimum single-cell voltage, maximum and minimum single-cell temperature for the same charge and discharge time from the single-cell voltage and single-cell temperature.

[0064] In this embodiment, multiple charge-discharge tests were conducted under the same operating conditions and charge-discharge rate. Different individual cells may be tested in these multiple tests. Therefore, the voltages and temperatures of the multiple cells obtained under the same operating conditions, charge-discharge rate, and charge-discharge time will vary slightly. Even for the same individual cell, the voltage and temperature measured in each test may vary slightly. Therefore, the maximum, minimum, maximum, and minimum individual cell voltages, temperatures, and temperatures under the same operating conditions, charge-discharge rate, and charge-discharge time are selected to ensure that the tested individual cell voltages under the same operating conditions, charge-discharge rate, and charge-discharge time are between the maximum and minimum individual cell voltages, and the tested individual cell temperatures are between the maximum and minimum individual cell temperatures, thus making the tests more accurate.

[0065] The second step is to randomly generate a random cell voltage between the maximum and minimum cell voltages, and a random cell temperature between the maximum and minimum cell temperatures, under the same charge and discharge time.

[0066] In this embodiment, to ensure that the tested cell voltage falls between the maximum and minimum cell voltages at the corresponding charge / discharge time, and the tested cell temperature falls between the maximum and minimum cell temperatures at the corresponding charge / discharge time, a cell voltage can be randomly generated between the maximum and minimum cell voltages at each charge / discharge time, serving as the random cell voltage for that charge / discharge time. Similarly, a cell temperature can be randomly generated between the maximum and minimum cell temperatures at each charge / discharge time, serving as the random cell temperature for that charge / discharge time. Finally, the random cell voltages and random cell temperatures corresponding to each charge / discharge time under different operating conditions and different charge / discharge rates are obtained.

[0067] The third step involves splicing together the random cell voltages and random cell temperatures under different charge and discharge times according to the preset charge and discharge test strategy to obtain the test cell voltage and test cell temperature.

[0068] In this embodiment, HIL testing mainly includes tests such as high voltage, fast charging and slow charging, insulation detection, fault diagnosis, state of charge (SOC) and SOC algorithm. Among these, the SOC and SOC algorithm tests require inputting the cell voltage and temperature to the battery management system. Different charge and discharge test strategies are used for testing the SOC and SOC algorithm, and each charge and discharge test strategy may have different requirements for operating conditions and charge / discharge rates.

[0069] Optional, the third step includes:

[0070] Obtain the operating conditions in the charge / discharge test strategy, as well as the charge / discharge rate, initial capacity, and final capacity of each charge / discharge stage; find all random cell voltages and random cell temperatures under the operating conditions; select the random cell voltage and random cell temperature corresponding to each charge / discharge stage from all the random cell voltages and random cell temperatures according to the charge / discharge rate, initial capacity, and final capacity of each charge / discharge stage; and concatenate the random cell voltages and random cell temperatures corresponding to each charge / discharge stage in the order of the charge / discharge stages to obtain the test cell voltage and test cell temperature.

[0071] In this embodiment, we first understand the operating conditions and charge / discharge rates required in the charge / discharge test strategy. To realistically simulate the charge / discharge process of a battery pack, the charge / discharge process is generally divided into several stages. For example, the charge / discharge stages include the early stage, the middle stage, the late stage, and the late stage. The charge / discharge rate and the amount of charge / discharged will be different in each stage.

[0072] Then, the random cell voltage and random cell temperature corresponding to all charge / discharge rates under the operating conditions required by the charge / discharge test strategy are found. Next, according to the requirements for charge / discharge rate and charge / discharge capacity for each charge / discharge stage, the corresponding random cell voltage and random cell temperature are found. Finally, the random cell voltages and random cell temperatures corresponding to all charge / discharge stages are concatenated sequentially according to the order of the charge / discharge stages to obtain the random cell voltage and random cell temperature corresponding to a complete charge / discharge process. This serves as the final test cell voltage and test cell temperature corresponding to the charge / discharge test strategy, used for hardware-in-the-loop testing.

[0073] For example, a certain charge and discharge test strategy requires: in the early stage of charging, use a charging rate of 0.2C to charge the battery from 0% to 30%; in the middle stage of charging, use a charging rate of 2C to charge the battery from 30% to 80%; in the later stage of charging, use a charging rate of 0.5C to charge the battery from 80% to 90%; and in the later stage of charging, use a charging rate of 0.1C to charge the battery from 90% to 100%.

[0074] In the process of splicing the test cell voltage and test cell temperature, firstly, the random cell voltage and random cell temperature of a single battery cell during the charge from 0% to 30% at a 0.2C charging rate are found as the test cell voltage and temperature corresponding to the early stage of charging. The random cell voltage corresponding to 30% charge at a 0.2C charging rate is then determined and recorded as the first random cell voltage. Next, a random cell voltage equal to the first random cell voltage is found at a 2C charging rate, and then the random cell voltage corresponding to 80% charge is found and recorded as the second random cell voltage. This first random cell voltage is then... The random cell voltages and corresponding random cell temperatures between the second and third random cell voltages are used as the test cell voltages and temperatures during the mid-charging stage. Next, at a charging rate of 0.5C, a random cell voltage equal to the second random cell voltage is found, and then the random cell voltage corresponding to 90% of the charge is found and recorded as the third random cell voltage. All random cell voltages and corresponding random cell temperatures between these two random cell voltages are used as the test cell voltages and temperatures during the later stages of charging. Similarly, the test cell voltages and temperatures for the later stages of charging are found. The test cell voltages and temperatures corresponding to each charging stage are concatenated in chronological order to obtain the test cell voltages and temperatures under this charge / discharge test strategy. The recording method for individual cell voltage and temperature is the same as that for individual cell voltage and temperature. It is recorded in the order of time from the start to the end of charging and discharging, that is, in order of charging and discharging time from shortest to longest. This can reflect the changes in individual cell voltage and temperature throughout the entire charging and discharging process. When performing hardware-in-the-loop testing, the individual cell voltage and temperature are also input in the order of changes in charging and discharging time.

[0075] It should be noted that when recording the battery pack's charging and discharging time, the changes in battery capacity must also be recorded, that is, the battery capacity and individual cell voltage should be recorded accordingly. Existing measurement methods can be used to measure battery capacity, and will not be elaborated upon here.

[0076] Step S230: Input the test cell voltage and test cell temperature into the battery management system for hardware-in-the-loop testing.

[0077] In this embodiment, after determining the test conditions, the initial cell voltage and initial cell temperature corresponding to the test conditions can be found. When conducting hardware-in-the-loop experiments, the corresponding initial cell voltage and initial cell temperature can be input into the battery management system first. Then, after the test officially begins, the test cell voltage and test cell temperature can be input into the battery management system.

[0078] This invention uses and processes individual cell voltages and temperatures from a database to obtain test cell voltages and temperatures, replacing the cell voltages and temperatures output by the equivalent circuit model. This yields more realistic cell voltages and temperatures, which are then input into the battery management system for hardware-in-the-loop testing, reducing testing errors and improving testing accuracy. Furthermore, the method is simple, requiring no model construction, thus improving the operating efficiency of the HIL testing software 101 and the robustness of the output data.

[0079] Optionally, after step S230, the method further includes:

[0080] Step S240: Obtain the simulation data output by the battery management system.

[0081] During hardware-in-the-loop testing, the battery management system calculates the corresponding simulation data based on the received test cell voltage, test cell temperature, insulation value, and total voltage using its internal algorithms.

[0082] Step S250: Based on the simulation data, determine the test results of the battery management system.

[0083] In this embodiment, the test results of the battery management system can be obtained by analyzing the simulation data.

[0084] Optionally, step S250 includes:

[0085] If the simulation data includes the first relationship curve between open-circuit voltage and state of charge calculated by the battery management system using the SOC algorithm, then the second relationship curve between open-circuit voltage and state of charge obtained from the battery pack charge-discharge test is obtained; the fitting degree of the first relationship curve and the second relationship curve is determined; if the fitting degree is greater than the preset fitting degree threshold, then the test result of the SOC algorithm of the battery management system is determined to be passed.

[0086] In this embodiment, if the hardware-in-the-loop test verifies the SOC algorithm, the simulation data will include a first relationship curve between open-circuit voltage and state of charge. This curve is then fitted and compared with a second relationship curve between open-circuit voltage and state of charge obtained from the battery pack charge-discharge test to obtain the goodness of fit. If the goodness of fit is greater than a preset goodness of fit threshold, it indicates that the SOC algorithm is relatively accurate and the test passes; if the goodness of fit is less than or equal to the goodness of fit threshold, it indicates that the SOC algorithm has a large error and the test fails.

[0087] Optionally, step S250 further includes:

[0088] If the simulation data includes the simulated state of charge (SOC), then the actual SOC obtained from the battery pack charge-discharge test is acquired; if the error between the simulated SOC and the actual SOC is less than the error threshold, then the SOC test result of the battery management system is determined to be passed.

[0089] In this embodiment, if the hardware-in-the-loop test verifies the state of charge, the simulation data will include the simulated state of charge. Then, the simulated state of charge and the actual state of charge will be compared. If the error between them is large, it indicates that the state of charge output by the battery management system is unstable and the test fails; if the error is small, it indicates that the state of charge output by the battery management system is relatively stable and the test passes.

[0090] It should be noted that when recording battery power during battery pack charge and discharge tests, the battery power can also be converted into charge state for recording.

[0091] Based on the same inventive concept, embodiments of the present invention also provide a hardware-in-the-loop testing device for a battery management system. Figure 3 This is a structural block diagram of a hardware-in-the-loop testing device for a battery management system provided in an embodiment of the present invention, as shown below. Figure 3 As shown, the device 300 includes an acquisition module 301, a generation module 302, and an input module 303.

[0092] The acquisition module 301 is used to acquire the individual cell voltage and individual cell temperature of the battery pack during the charge and discharge test;

[0093] The generation module 302 is used to process the individual cell voltage and temperature to generate the test individual cell voltage and temperature for hardware-in-the-loop testing.

[0094] Input module 303 is used to input the test cell voltage and test cell temperature into the battery management system for hardware-in-the-loop testing.

[0095] Optionally, device 300 also includes:

[0096] The control module is used to place the battery pack under different operating conditions, control the battery pack to carry out charge and discharge tests at different charge and discharge rates, and sample at different charge and discharge times to obtain the individual cell voltage and individual cell temperature of the battery pack at different charge and discharge times.

[0097] Optionally, the generation module 302 includes:

[0098] A screening unit is used to screen the maximum and minimum single-cell voltage, maximum and minimum single-cell temperature under the same charge and discharge time from the single-cell voltage and single-cell temperature.

[0099] The generation unit is used to randomly generate a random cell voltage between the maximum cell voltage and the minimum cell voltage, and a random cell temperature between the maximum cell temperature and the minimum cell temperature, under the same charge and discharge time.

[0100] The splicing unit is used to splice random cell voltages and random cell temperatures under different charge and discharge times according to a preset charge and discharge test strategy, so as to obtain the test cell voltage and test cell temperature for hardware-in-the-loop testing.

[0101] Optionally, the splicing unit is also used for:

[0102] Obtain the operating conditions in the charge and discharge test strategy, as well as the charge and discharge rate, starting capacity, and ending capacity for each charge and discharge stage;

[0103] Find all random cell voltages and random cell temperatures under the operating conditions;

[0104] Based on the charge / discharge rate, initial charge, and final charge of each charge / discharge stage, select the random cell voltage and random cell temperature corresponding to each charge / discharge stage from all random cell voltages and random cell temperatures.

[0105] The random cell voltage and random cell temperature corresponding to each charge and discharge stage are spliced ​​together in the order of the charge and discharge stages to obtain the test cell voltage and test cell temperature for hardware-in-the-loop testing.

[0106] Optionally, the device 300 also includes a determining module for:

[0107] Obtain the simulation data output by the battery management system;

[0108] Based on simulation data, the test results of the battery management system are determined.

[0109] Optionally, the determination module is also used for:

[0110] If the simulation data includes the first relationship curve between open circuit voltage and state of charge calculated by the battery management system using the SOC algorithm, then obtain the second relationship curve between open circuit voltage and state of charge obtained from the battery pack charge and discharge test.

[0111] Determine the goodness of fit between the first and second relationship curves;

[0112] If the fit is greater than the preset fit threshold, the SOC algorithm test result of the battery management system is determined to be passed.

[0113] Optionally, the determination module is also used for:

[0114] If the simulation data includes the simulated state of charge, then the actual state of charge obtained from the battery pack charge-discharge test is obtained.

[0115] If the error between the simulated state of charge and the actual state of charge is less than the error threshold, then the state of charge test result of the battery management system is determined to be passed.

[0116] It is understood that the device provided in the above embodiments is only illustrated by the division of the above functional modules. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above.

[0117] This invention also provides an electronic device that may include a processor and a memory, wherein the processor and the memory may be interconnected via a bus or other means.

[0118] The processor may be a central processing unit (CPU), an application-specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of this application.

[0119] Memory may include mass storage for data or instructions. For example, and not limitingly, memory may include hard disk drives (HDDs), floppy disk drives, flash memory, optical disks, magneto-optical disks, magnetic tape, or Universal Serial Bus (USB) drives, or combinations of two or more of these. Where appropriate, memory may include removable or non-removable (or fixed) media. Where appropriate, memory may be internal or external to an electronic device. In a particular embodiment, memory may be non-volatile solid-state memory.

[0120] In one instance, the memory may be read-only memory (ROM). In one instance, the ROM may be a mask-programmed ROM, a programmable ROM (PROM), an erasable PROM (EPROM), an electrically erasable PROM (EEPROM), an electrically rewritable ROM (EAROM), or flash memory, or a combination of two or more of these.

[0121] The processor reads and executes computer program instructions stored in memory to implement any of the hardware-in-the-loop testing methods for the battery management system in the above embodiments.

[0122] In one example, the electronic device may further include a communication interface and a bus. The processor, memory, and communication interface are connected via the bus to communicate with each other. The communication interface is primarily used to enable communication between the various modules, devices, units, and / or equipment in the embodiments of this application. Where appropriate, the bus may include one or more buses.

[0123] Furthermore, in conjunction with the battery management system hardware-in-the-loop testing method in the above embodiments, this invention can be implemented using a computer-readable storage medium. This computer-readable storage medium stores computer program instructions; when executed by a processor, these computer program instructions implement any of the battery management system hardware-in-the-loop testing methods described in the above embodiments.

[0124] The technical solutions described in the embodiments of this application have at least the following technical effects or advantages:

[0125] This invention provides a method, apparatus, device, and medium for hardware-in-the-loop testing of a battery management system. The method acquires the individual cell voltages and temperatures of the battery pack during charge-discharge tests to obtain the actual individual cell voltages and temperatures, rather than those calculated by a model. The individual cell voltages and temperatures are processed to generate test individual cell voltages and temperatures suitable for hardware-in-the-loop testing. These test individual cell voltages and temperatures are then input into the battery management system for hardware-in-the-loop testing, thereby more accurately simulating the real state of the battery pack and resulting in smaller test result errors and higher accuracy.

[0126] Numerous specific details are set forth in the specification provided herein. However, it will be understood that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures, and techniques have not been shown in detail so as not to obscure the understanding of this specification.

[0127] Similarly, it should be understood that, in order to simplify this disclosure and aid in understanding one or more of the various aspects of the invention, in the above description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together in a single embodiment, figure, or description thereof. However, this method of disclosure should not be construed as reflecting an intention that the claimed invention requires more features than are expressly recited in each claim. Rather, as reflected in the following claims, inventive aspects lie in fewer than all features of a single foregoing disclosed embodiment. Therefore, the claims following the detailed description are hereby expressly incorporated into this detailed description, wherein each claim itself is a separate embodiment of the invention.

[0128] It should be noted that the above embodiments are illustrative of the invention and not restrictive, and that those skilled in the art can devise alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses should not be construed as limiting the claims. The word "comprising" does not exclude the presence of components or steps not listed in the claims. The word "a" or "an" preceding a component does not exclude the presence of a plurality of such components. The invention can be implemented by means of hardware comprising several different components and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by the same item of hardware. The use of the words first, second, and third, etc., does not indicate any order. These words can be interpreted as names.

Claims

1. A hardware-in-the-loop testing method for a battery management system, characterized in that, The method, applied to a hardware-in-the-loop test system, which includes test software and a battery management system, comprises: The battery pack was placed under different operating conditions, and the battery pack was controlled to undergo charge and discharge tests at different charge and discharge rates. Samples were taken at different charge and discharge times to obtain the individual cell voltage and individual cell temperature of the battery pack at different charge and discharge times. Obtain the individual cell voltage and temperature of the battery pack during charge-discharge tests; The individual cell voltage and temperature are processed to generate test individual cell voltage and test individual cell temperature for hardware-in-the-loop testing; The test cell voltage and test cell temperature are input into the battery management system through the test software to perform the hardware-in-the-loop test. The process of processing the individual cell voltage and temperature to generate test cell voltage and test cell temperature for hardware-in-the-loop testing includes: Select the maximum and minimum single-cell voltage, maximum and minimum single-cell temperature under the same charge / discharge time from the single-cell voltage and single-cell temperature; Under the same charge and discharge time, a randomized single-cell voltage is generated between the maximum single-cell voltage and the minimum single-cell voltage, and a randomized single-cell temperature is generated between the maximum single-cell temperature and the minimum single-cell temperature; According to the preset charge and discharge test strategy, the random cell voltage and random cell temperature under different charge and discharge times are spliced ​​together to obtain the test cell voltage and test cell temperature for the hardware-in-the-loop test. The step of splicing together the random cell voltage and random cell temperature at different charge / discharge times according to a preset charge / discharge test strategy to obtain the test cell voltage and test cell temperature for the hardware-in-the-loop test includes: Obtain the operating conditions in the charge and discharge test strategy, as well as the charge and discharge rate, starting capacity, and ending capacity of each charge and discharge stage; Find all random cell voltages and random cell temperatures under the stated operating conditions; According to the charge / discharge rate, the initial charge, and the final charge of each charge / discharge stage, the random cell voltage and random cell temperature corresponding to each charge / discharge stage are selected from all the random cell voltages and random cell temperatures; The random cell voltage and random cell temperature corresponding to each charge / discharge stage are sequentially spliced ​​together according to the order of the charge / discharge stages to obtain the test cell voltage and test cell temperature used for the hardware-in-the-loop test.

2. The hardware-in-the-loop testing method for a battery management system according to claim 1, characterized in that, After inputting the test cell voltage and the test cell temperature into the battery management system for hardware-in-the-loop testing, the method further includes: Obtain the simulation data output by the battery management system; Based on the simulation data, the test results of the battery management system are determined.

3. The hardware-in-the-loop testing method for a battery management system according to claim 2, characterized in that, The determination of the test results of the battery management system based on the simulation data includes: If the simulation data includes the first relationship curve between open circuit voltage and state of charge calculated by the battery management system using the SOC algorithm, then the second relationship curve between open circuit voltage and state of charge obtained from the battery pack charge and discharge test is obtained. Determine the goodness of fit between the first relationship curve and the second relationship curve; If the degree of fit is greater than the preset degree of fit threshold, then the SOC algorithm test result of the battery management system is determined to be passed.

4. The hardware-in-the-loop testing method for a battery management system according to claim 2, characterized in that, The determination of the test results of the battery management system based on the simulation data includes: If the simulation data includes the simulated state of charge, then the actual state of charge obtained from the battery pack charge-discharge test is acquired. If the error between the simulated state of charge and the actual state of charge is less than the error threshold, then the state of charge test result of the battery management system is determined to be passed.

5. A hardware-in-the-loop testing device for a battery management system, characterized in that, An apparatus for use in a hardware-in-the-loop test system, the hardware-in-the-loop test system including test software and a battery management system, the apparatus comprising: The control module is used to place the battery pack under different operating conditions, control the battery pack to carry out charge and discharge tests at different charge and discharge rates, and sample at different charge and discharge times to obtain the individual cell voltage and individual cell temperature of the battery pack at different charge and discharge times. The acquisition module is used to acquire the individual cell voltage and individual cell temperature of the battery pack during the charge and discharge test; A generation module is used to process the individual cell voltage and the individual cell temperature to generate test individual cell voltage and test individual cell temperature for hardware-in-the-loop testing. The input module is used to input the voltage and temperature of the test cell into the battery management system for the hardware-in-the-loop test; The process of processing the individual cell voltage and temperature to generate test cell voltage and test cell temperature for hardware-in-the-loop testing includes: Select the maximum and minimum single-cell voltage, maximum and minimum single-cell temperature under the same charge / discharge time from the single-cell voltage and single-cell temperature; Under the same charge and discharge time, a randomized single-cell voltage is generated between the maximum single-cell voltage and the minimum single-cell voltage, and a randomized single-cell temperature is generated between the maximum single-cell temperature and the minimum single-cell temperature; According to the preset charge and discharge test strategy, the random cell voltage and random cell temperature under different charge and discharge times are spliced ​​together to obtain the test cell voltage and test cell temperature for the hardware-in-the-loop test. The step of splicing together the random cell voltage and random cell temperature at different charge / discharge times according to a preset charge / discharge test strategy to obtain the test cell voltage and test cell temperature for the hardware-in-the-loop test includes: Obtain the operating conditions in the charge and discharge test strategy, as well as the charge and discharge rate, starting capacity, and ending capacity of each charge and discharge stage; Find all random cell voltages and random cell temperatures under the stated operating conditions; According to the charge / discharge rate, the initial charge, and the final charge of each charge / discharge stage, the random cell voltage and random cell temperature corresponding to each charge / discharge stage are selected from all the random cell voltages and random cell temperatures; The random cell voltage and random cell temperature corresponding to each charge / discharge stage are sequentially spliced ​​together according to the order of the charge / discharge stages to obtain the test cell voltage and test cell temperature used for the hardware-in-the-loop test.

6. An electronic device, characterized in that, include: A memory and a processor, the memory and the processor being communicatively connected to each other, the memory storing computer instructions, the processor executing the computer instructions to perform the method of any one of claims 1-4.

7. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions for causing the computer to perform the method of any one of claims 1-4.

Images