Display device and display method in high-temperature operation mode

Abstract

The application discloses a display device and a display method in a high-temperature operation mode, which is used for adjusting VGH / VGL to ensure optimal VGH / VGL margin and avoid abnormal display and other adverse phenomena. The display device comprises a backlight driving board, a TCON board, a display panel and a controller. The controller is configured to perform the following steps: determining a running duration of the backlight driving board at a target temperature, wherein the target temperature represents a temperature greater than a temperature threshold; in response to the running duration meeting a preset condition, determining an optimal gate voltage, wherein the gate voltage is used for controlling opening and closing of a TFT; sending a change command to the TCON board, so that the TCON board updates a current gate voltage to the optimal gate voltage, and sending display data and a driving signal to the display panel, wherein the driving signal is generated based on the optimal gate voltage.

Description

Technical Field

[0001] This invention relates to the field of display technology, and in particular to a display device and a display method for high-temperature operation. Background Technology

[0002] Wide-temperature LCD screens can operate normally between -20℃ and +70℃, and their humidity tolerance is also wider than that of ordinary LCD screens. Wide-temperature LCD screens need to withstand both high and low temperatures, thus placing higher demands on the stability and reliability of the display.

[0003] In reliability testing, when operating under simulated high-temperature extreme environments, due to the characteristic drift of the TFT (Thin Film Transistor) cells in the wide-temperature LCD screen at high temperatures, the VGH (gate start voltage) / VGL (gate turn-off voltage) margin is insufficient, which may lead to abnormal display and other adverse phenomena. Summary of the Invention

[0004] This invention provides a display device and a display method for high-temperature operation, which is used to adjust VGH / VGL to ensure optimal VGH / VGL margin and avoid abnormal phenomena such as abnormal display.

[0005] In a first aspect, an embodiment of the present invention provides a display device, including a backlight driver board, a TCON board, a display panel, and a controller, wherein the controller is configured to perform the following steps:

[0006] Determine the operating time of the backlight driver board at a target temperature, wherein the target temperature represents a temperature greater than a temperature threshold.

[0007] In response to the runtime meeting a preset condition, an optimal gate voltage is determined, wherein the gate voltage is used to control the turning on and off of the TFT;

[0008] A change command is sent to the TCON board, which updates the current gate voltage to the optimal gate voltage, and sends display data and drive signals to the display panel, wherein the drive signals are generated based on the optimal gate voltage.

[0009] Secondly, an embodiment of the present invention provides a display method for high-temperature operation, the method comprising:

[0010] Determine the operating time of the backlight driver board at a target temperature, wherein the target temperature represents a temperature greater than a temperature threshold.

[0011] In response to the runtime meeting a preset condition, an optimal gate voltage is determined, wherein the gate voltage is used to control the turning on and off of the TFT;

[0012] A change command is sent to the TCON board, which updates the current gate voltage to the optimal gate voltage, and sends display data and drive signals to the display panel, wherein the drive signals are generated based on the optimal gate voltage.

[0013] Thirdly, embodiments of the present invention also provide a display device operating at high temperatures, the device comprising:

[0014] The runtime module is used to determine the runtime of the backlight driver board at a target temperature, wherein the target temperature represents a temperature greater than a temperature threshold.

[0015] A gate voltage determination module is used to determine an optimal gate voltage in response to the runtime meeting a preset condition, wherein the gate voltage is used to control the turning on and off of the TFT;

[0016] The gate voltage update module is used to send a change command to the TCON board, so that the TCON board updates the current gate voltage to the optimal gate voltage and sends display data and drive signals to the display panel, wherein the drive signals are generated based on the optimal gate voltage.

[0017] Fourthly, embodiments of the present invention also provide an electronic device, including a processor and a memory, wherein the memory is used to store a program executable by the processor, and the processor is used to read the program in the memory and perform the following steps:

[0018] Determine the operating time of the backlight driver board at a target temperature, wherein the target temperature represents a temperature greater than a temperature threshold.

[0019] In response to the runtime meeting a preset condition, an optimal gate voltage is determined, wherein the gate voltage is used to control the turning on and off of the TFT;

[0020] A change command is sent to the TCON board, which updates the current gate voltage to the optimal gate voltage, and sends display data and drive signals to the display panel, wherein the drive signals are generated based on the optimal gate voltage.

[0021] Fifthly, embodiments of the present invention also provide a computer storage medium having a computer program stored thereon, which, when executed by a processor, is used to implement the steps of the method described in any of the second aspects above.

[0022] In a sixth aspect, this application provides a computer program product comprising: computer program code, which, when run on a computer, causes the computer to perform the method described in any one of the second aspects.

[0023] These or other aspects of this application will become more apparent in the following description of embodiments. Attached Figure Description

[0024] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0025] Figure 1 A schematic diagram of a constant-scale group architecture provided in an embodiment of the present invention;

[0026] Figure 2 This is a schematic diagram of the variation curve of TFT characteristics provided in an embodiment of the present invention;

[0027] Figure 3 A schematic diagram of a display device provided in an embodiment of the present invention;

[0028] Figure 4 This is a schematic diagram of a display device module architecture provided in an embodiment of the present invention;

[0029] Figure 5 A schematic diagram of the curve of LVGL current versus LVGL voltage provided for an embodiment of the present invention;

[0030] Figure 6 A schematic diagram of the leakage current of a TFT as a function of gate voltage (VG) is provided for an embodiment of the present invention.

[0031] Figure 7 This is a schematic diagram of power-on / off timing changes provided in an embodiment of the present invention;

[0032] Figure 8 This invention provides a schematic diagram of the power-on / off GOA timing for a display module.

[0033] Figure 9 A schematic diagram of an amplifier circuit provided in an embodiment of the present invention;

[0034] Figure 10 A control flowchart of an MCU for a backlight driver board provided in an embodiment of the present invention;

[0035] Figure 11 A flowchart illustrating the implementation of a current detection subroutine provided in an embodiment of the present invention;

[0036] Figure 12 A schematic diagram of the mapping relationship between operating time and gate voltage at high temperature provided for an embodiment of the present invention;

[0037] Figure 13 A flowchart of automatic gate voltage adjustment provided in an embodiment of the present invention;

[0038] Figure 14 A flowchart of a temperature adjustment procedure provided in an embodiment of the present invention;

[0039] Figure 15 A flowchart illustrating the implementation of gate voltage adjustment and temperature adjustment in an embodiment of the present invention;

[0040] Figure 16 A flowchart illustrating the implementation of gate voltage adjustment and temperature adjustment in an embodiment of the present invention;

[0041] Figure 17 A flowchart illustrating an implementation method for displaying a high-temperature operating state according to an embodiment of the present invention;

[0042] Figure 18 A schematic diagram of a display device operating at high temperature provided in an embodiment of the present invention;

[0043] Figure 19 This is a schematic diagram of an electronic device provided in an embodiment of the present invention. Detailed Implementation

[0044] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this invention, and not all of them. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0045] In this embodiment of the invention, the term "and / or" describes the relationship between associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. The character " / " generally indicates that the preceding and following associated objects have an "or" relationship.

[0046] The application scenarios described in the embodiments of this invention are for the purpose of more clearly illustrating the technical solutions of the embodiments of this invention, and do not constitute a limitation on the technical solutions provided by the embodiments of this invention. Those skilled in the art will understand that with the emergence of new application scenarios, the technical solutions provided by the embodiments of this invention are also applicable to similar technical problems. In the description of this invention, unless otherwise stated, "multiple" means two or more.

[0047] Before introducing the display device and high-temperature operation method provided in the embodiments of this application, the technical background of the embodiments of this application will be described in detail below for ease of understanding.

[0048] Wide-temperature LCD screens can operate normally between -20℃ and +70℃, and their humidity tolerance is also wider than that of ordinary LCD screens. Wide-temperature LCD screens need to withstand both high and low temperatures, thus placing higher demands on their stability and reliability. In reliability testing, simulating extreme high-temperature environments, due to the characteristic drift of the TFT (Thin Film Transistor) cells in the wide-temperature LCD screen at high temperatures, and insufficient VGH (gate start-up voltage) / VGL (gate turn-off voltage) margin, abnormal display phenomena may occur.

[0049] Liquid crystal displays (LCDs) require voltage control to generate grayscale. A display that uses thin-film transistors (TFTs) to generate voltage and control the rotation of liquid crystals is called a TFT LCD. Taking TFT LCDs as an example, outdoor wide-temperature display devices need to withstand both high and low temperatures, thus placing higher demands on the stability and reliability of the display products. In reliability testing, when simulating extreme high-temperature environments, due to the characteristic drift of TFT cells at high temperatures and insufficient VGH / VGL margin, defects such as image distortion may occur.

[0050] Wide-temperature-range displays are typically used in scenarios requiring operation in extreme temperature environments. These scenarios include, but are not limited to: the automotive industry, for use in car dashboards, navigation systems, and entertainment systems, requiring reliable operation under both high and low temperatures; outdoor environments, such as outdoor displays, billboards, and road signs, which need to withstand harsh conditions including high temperatures, low temperatures, and high humidity; and industrial control, for control panels of industrial equipment and robots, which need to operate stably in factory environments. These application scenarios place the following demands on wide-temperature-range display products:

[0051] Stability and reliability are crucial for wide-temperature display devices. They must operate stably for extended periods under extreme temperatures, unaffected by temperature fluctuations. Durability is essential to withstand external environmental factors such as vibration and impact, resulting in a long service life. Visibility is paramount; information must be clearly displayed under various lighting conditions, offering high brightness and contrast. Energy efficiency is paramount; low power consumption ensures stable performance even at low temperatures. Cost-effectiveness is also key, with lower production and maintenance costs, making them suitable for large-scale applications. Therefore, wide-temperature display devices require continuous improvement and optimization in stability, durability, visibility, energy efficiency, and cost-effectiveness to meet the needs of various fields. This necessitates higher backlight brightness and greater reliability for extended operation at both high and low temperatures.

[0052] like Figure 1 As shown in the diagram, this embodiment also provides a standard modular architecture diagram, including a BLU (backlight unit), a Converter (backlight driver board), and a TCON (Timer Control Register, logic board). In this embodiment, the TCON consists of four parts: the timing control circuit of the TFT LCD, and the OC (open cell, display panel). The backlight driver board includes an LED Driver (Light-Emitting Diode Driver) and a MCU (Microcontroller Unit). The TCON board transmits display data and drive signals to the OC for display. The TCON board sends LD (local dimming) data to the Converter via SPI (Serial Peripheral Interface). The Converter is responsible for driving the BLU, controlling the backlight brightness through current or PWM (Pulse Width Modulation) duty cycle. The Converter does not control any voltage on the TCON board. Duty cycle refers to the proportion of the on-time relative to the total time within a pulse cycle. In the telecommunications field, duty ratio has the following meaning: For example, a pulse sequence with a pulse width of 1μs and a signal period of 4μs has a duty ratio of 0.25.

[0053] Current technology, during prolonged high-temperature operation, exhibits changes in TFT characteristics as the operating time increases, such as... Figure 2 As shown, the horizontal axis represents the gate voltage VG (in V), and the vertical axis represents the TFT leakage current (in A). Different curves represent the TFT characteristic curves corresponding to different operating times. It can be seen that as the high-temperature operating time increases, the TFT characteristics shift to the left. Therefore, the optimal VGH and VGL will change. If a fixed VGH and VGL voltage is used like in ordinary wide-temperature display devices, the VGH / VGL margin problem is likely to occur, resulting in abnormal images. Furthermore, the high brightness of the backlight heat dissipation generates high temperatures. For TFT LCDs, the surface POL (Polarizer) will be burned under prolonged high temperatures, resulting in poor images.

[0054] To address this technical problem, this embodiment provides a display device and method suitable for high-temperature operation. By monitoring the temperature and operating time of the backlight driver board, it determines the optimal gate voltage corresponding to the target temperature and operating time when the operating time of the backlight driver board at the target temperature meets preset conditions. This allows the TCON board (logic board) to send a command to the display panel by updating the optimal gate voltage, thereby solving the problem of insufficient gate voltage margin (insufficient VGH / VGL margin) after a period of high-temperature operation, which leads to abnormal screen display.

[0055] It should be noted that the display device in this embodiment includes, but is not limited to, a wide-temperature display device. The display screen of the wide-temperature display device can be TFT LCD, LED, Mini-LED, etc. This embodiment does not impose too many limitations on it.

[0056] At temperature, such as Figure 3 As shown, the display device provided in this embodiment includes a backlight driver board 300, a TCON board 301, a display panel 302, and a controller 303. The controller 303 is configured to perform the following steps:

[0057] Determine the target operating time of the backlight driver board 300, wherein the target temperature represents a temperature greater than a temperature threshold.

[0058] In response to the runtime meeting a preset condition, an optimal gate voltage is determined, wherein the gate voltage is used to control the turning on and off of the TFT;

[0059] A change command is sent to the TCON board 301, which updates the current gate voltage to the optimal gate voltage and sends display data and drive signals to the display panel 302, wherein the drive signals are generated based on the optimal gate voltage.

[0060] Optionally, the gate voltage in this embodiment includes, but is not limited to, VGL, VGH, and LVGL (the smaller VGL). This embodiment does not impose too many limitations on this.

[0061] During implementation, the temperature of the backlight driver board can be monitored. When the temperature of the backlight driver board reaches the target temperature, that is, when the temperature of the backlight driver board is greater than the temperature threshold, such as when the temperature of the backlight driver board is greater than 60°C, the running time of the backlight driver board at the target temperature is recorded. When the running time meets the preset conditions, the optimal gate voltage is determined.

[0062] In some embodiments, the backlight driver board includes a temperature measurement circuit; the controller is specifically configured to perform:

[0063] After the backlight driver board is powered on, the voltage of the temperature measuring circuit is read, and the temperature of the backlight driver board is determined based on the read voltage; in response to the temperature of the backlight driver board being greater than the temperature threshold, the temperature of the backlight driver board is determined as the target temperature.

[0064] Optionally, the temperature measuring circuit in this embodiment includes, but is not limited to, a thermistor, or a temperature sensor, etc., and this embodiment does not impose excessive limitations on it. In implementation, by reading the voltage of the temperature measuring circuit on the backlight driver board, the read voltage is converted into the temperature of the backlight driver board, thereby determining whether the temperature of the backlight driver board is greater than the temperature threshold. When the temperature of the backlight driver board is greater than the temperature threshold, the temperature of the backlight driver board at this time is determined as the target temperature, that is, it is determined that the backlight driver board has reached the target temperature.

[0065] Optionally, the preset conditions in this embodiment include, but are not limited to: the runtime exceeding at least one duration threshold; or, the runtime reaching at least one preset duration. In implementation, the current optimal gate voltage is determined when the runtime of the backlight driver board at the target temperature exceeds at least one duration threshold; or, the current optimal gate voltage is determined when the runtime of the backlight driver board at the target temperature reaches at least one preset duration. For example, the current optimal gate voltage is determined when the runtime of the backlight driver board at the target temperature reaches 200 hours.

[0066] In some embodiments, the backlight driver board includes a storage circuit, the memory being used to store the operating time of the backlight driver board at a target temperature.

[0067] Optionally, the storage circuit in this embodiment includes, but is not limited to, various storage elements such as EEPROM (Electrically Erasable Programmable Read-Only Memory) and Flash (Flash Memory). In implementation, the storage circuit can store the current temperature of the backlight driver board and / or the operating time of the backlight driver board at the target temperature, thereby determining whether the operating time of the backlight driver board meets the preset conditions.

[0068] In some embodiments, the controller in this embodiment includes, but is not limited to, an MCU (Microcontroller Unit), which is located on the backlight driver board; the controller is specifically configured to execute:

[0069] The backlight driver board sends a change command to the TCON board via the Inter-Integrated Circuit (IICBus, or IIC) bus. This command allows the TCON board to update the current gate voltage to the optimal gate voltage by modifying the voltage of the power management integrated circuit.

[0070] In implementation, a controller, such as an MCU, is set in the backlight driver board. The MCU determines the optimal gate voltage and sends a change command to the TCON board. The TCON board modifies the voltage of the PMIC (Power Management IC), thereby updating the current gate voltage to the optimal gate voltage. Based on this optimal gate voltage, a drive signal is generated and sent to the display panel along with display data. The PMIC, located within the TCON, is used to change the voltage and provide the voltage for the drive signal.

[0071] like Figure 4 As shown in the diagram, this embodiment provides a schematic diagram of a display device module architecture, including four parts: BLU, backlight driver board (Converter), TCON, and display panel (OC). The backlight driver board includes an LED driver, MCU, temperature measurement circuit, and storage circuit. The TCON board includes a PMIC.

[0072] The Converter is responsible for driving the BLU, controlling backlight brightness through current or PWM duty cycle. By adding temperature sensing circuits such as thermistors and storage circuits such as EEPROM (Electrically Erasable Programmable Read-Only Memory) to the Converter, it can detect the operating ambient temperature of the display device (module) and store the high-temperature operating time of the module. By reading the high-temperature operating time, when the time threshold is reached, the Converter MCU calculates the optimal gate voltages, such as VGL and LVGL voltage values. The Converter MCU sends a change command to the TCON board via IIC. After receiving the change command, the PMIC in the TCON board generates new VGL and LVGL voltages based on the optimal gate voltage, generating new drive signals. The TCON board transmits the display data and the new drive signals to the display panel (OC) to improve the problem of insufficient VGL margin, achieve the best display effect, and avoid the occurrence of poor image quality.

[0073] In some embodiments, this embodiment can adjust the gate voltage by detecting the gate current, thereby obtaining the optimal gate voltage. The specific implementation is as follows:

[0074] The gate voltage is iteratively adjusted according to a set step size until the number of iterations reaches a threshold or the gate current corresponding to the adjusted gate voltage is minimized; the optimal gate voltage is determined based on the gate voltage corresponding to the minimum gate current.

[0075] In practice, this embodiment can use the MCU to iteratively adjust the gate voltage. After each iteration, the gate current corresponding to the adjusted gate voltage is calculated. When the minimum gate current is detected, the gate voltage corresponding to the minimum gate current is determined as the optimal gate voltage for the current running time.

[0076] In some embodiments, since the gate current is relatively small, to improve detection accuracy, this embodiment can detect the gate current by first increasing it, and then detecting the minimum gate current after multiple iterative adjustments to the gate voltage. The specific iterative adjustment process is as follows:

[0077] The gate voltage is adjusted in the nth iteration according to the set step size to obtain the nth gate voltage, where n is an integer greater than or equal to 1;

[0078] Read the output voltage of the amplifier circuit at the (n+1)th iteration and convert it into the gate current at the (n+1)th iteration; the gate current at the first iteration is obtained by reading the output voltage of the amplifier circuit at the first iteration before iterative adjustment.

[0079] If the gate current in the (n+1)th iteration is less than the gate current in the nth iteration, then the next iteration adjustment continues; otherwise, the optimal gate voltage is determined based on the gate voltage in the nth iteration.

[0080] In practice, when the backlight driver board operates at the target temperature for a duration that meets the preset conditions, the first output voltage of the amplifier circuit is directly read and converted into the first gate current. Then, the gate voltage is iteratively adjusted according to the set step size to obtain the first gate voltage. At this time, the second output voltage of the amplifier circuit is read and converted into the second gate current. The second gate current is compared with the first gate current. If the second gate current is less than the first gate current, the gate voltage is iteratively adjusted again to obtain the second gate voltage. This process is repeated. Otherwise, the optimal gate voltage is determined based on the gate voltage corresponding to the first gate current (i.e., the gate voltage before iterative adjustment).

[0081] Optionally, this embodiment can perform iterative adjustment by increasing the gate voltage by a set step size, or by decreasing the gate voltage by a set step size. This embodiment does not impose too many limitations on the specific iterative adjustment method.

[0082] In some embodiments, the controller is specifically configured to perform: upon receiving a restart command and before the backlight is turned on, iteratively adjust the gate voltage in a set step size.

[0083] In implementation, the timing of current detection, i.e., the timing of iterative adjustment of the gate voltage, can be controlled by setting current detection parameters. Specifically, when the backlight driver board's operating time at the target temperature reaches a time threshold, the current detection parameter can be enabled. When the display device is restarted after the next power outage, current detection begins through the amplification circuit, iteratively adjusting the gate voltage until the optimal gate voltage is determined, at which point the current detection parameter is disabled.

[0084] It should be noted that the gate voltage in this embodiment refers to the voltage of the GOA (GateDriven on Array) circuit that controls the TFT to turn on and off. The gate voltage is used to control the TFT to turn on and off. VGH is the positive power supply input pin of the TFT LCD, which is used to control the TFT to turn on; VGL or LVGL is the negative power supply input pin of the TFT LCD, which is used to control the TFT to turn off.

[0085] In practice, taking the adjustment of VGL and LVGL as an example, this embodiment provides a method to periodically confirm the optimal VGL by monitoring the PMIC output current in the TCON board and to adjust VGL and LVGL in real time. The detection principle is as follows:

[0086] When both STV (vertical sync signal) and CLK (clock) output low level, the TFT is off. At this time, when the L255 displays a completely white image, the TFT leakage current is at its highest. Testing shows that when the gate voltage (LVGL voltage) changes, the gate current (LVGL current) also changes, reaching its lowest point at a certain gate voltage level. Figure 5 As shown in the figure, this embodiment provides a schematic diagram of the LVGL current changing with the LVGL voltage. The horizontal axis represents the LVGL voltage (unit: V), and the vertical axis represents the LVGL current (unit: A). The current along the vertical axis is plotted in units of 100A. #1 and #2 represent different test display devices (test modules). The upward curve of #1 represents the gate current changing with the gate voltage when the gate voltage of test module 1 is adjusted from small to large. The downward curve of #1 represents the gate current changing with the gate voltage when the gate voltage of test module 1 is adjusted from large to small. Similarly, the upward curve of #2 represents the gate current changing with the gate voltage when the gate voltage of test module 2 is adjusted from small to large. The downward curve of #2 represents the gate current changing with the gate voltage when the gate voltage of test module 2 is adjusted from large to small. As can be seen from the figure, the lowest (optimal) LVGL current is between -7V and -8V.

[0087] Accordingly, such as Figure 6 As shown in the figure, this embodiment also provides a schematic diagram of the leakage current of a TFT as a function of the gate voltage (VG). The horizontal axis represents the VG voltage (in V), and the vertical axis represents the TFT leakage current (in A). Curve 1-1 indicates that the tested display device is facing upwards and the tested display area is region 1. Here, "facing upwards" means that the displayed side is facing upwards in the direction perpendicular to the horizontal plane. Similarly, curve 1-2 indicates that the tested display device is facing upwards and the tested display area is region 2, and so on. Curve SD_1-1 indicates that the tested display device is facing downwards and the tested display area is region 1. Here, "back facing upwards" means that the non-display side is facing upwards. Curve SD_1-2 indicates that the tested display device is facing downwards and the tested display area is region 2, and so on. As can be seen from the figure, within the gate voltage range of -7V to -8V, the optimal (minimum) TFT leakage current I corresponds to... off It can be seen that the optimal LVGL current and the optimal I off The corresponding gate voltage ranges are matched.

[0088] Based on the principle that the range of the optimal LVGL current and the gate voltage corresponding to the optimal Ioff are matched, in order to improve the problem of TFT characteristic drift caused by long-term operation of display devices under high temperature and high brightness, resulting in insufficient VGL margin, this embodiment proposes to amplify the LVGL current and read it through the MCU. According to the relevant experience of TFT characteristic drift, the optimal LVGL current is detected after the display module (display device) has been working for a period of time.

[0089] Taking a 55-inch wide-temperature display device as an example, after the high-temperature operating time recorded by the MCU in the backlight driver board reaches 200 hours, the current detection parameter is set to enabled. When the backlight driver board is powered off and restarted next time, the gate voltage is iteratively adjusted according to the set step size before the backlight is turned on. Figure 7 As shown in the diagram, this embodiment provides a power-on / off timing variation diagram. T1 represents the power-on time, T2 represents the time required to send a valid signal, T3 represents the duration after sending a valid signal and before the backlight is turned on, T4 represents the duration for the host to send the IIC command, T5 represents the duration for the power signal to be at a low level, T7 represents the duration after restarting and before the host sends the IIC command, and T9 represents the duration for the clock lock signal after power-on. During the T3 time period, i.e., before the backlight is turned on, optimal LVGL current detection is performed to determine the optimal gate voltage.

[0090] After power-on, the TCON board outputs a clock signal where STV and CLK are both low. This signal is then converted to LVGL by a level shifter. Figure 8 As shown in the diagram, this embodiment provides a GOA timing diagram for powering on / off of a display module. The duration of the low-level signals STV and CLK is approximately 1500ms, and VDD1 / VDD2 represent power signals. Simultaneously, the TCON board outputs a built-in pure white (L255) image to the display panel (OC). At this time, the TFT is not turned on and leakage current is at its maximum. Based on the above timing relationship, it can be seen that after receiving the restart command, the minimum gate current needs to be detected during the period before the backlight is turned on, thereby determining the optimal gate voltage. Since the duration of the low-level signals STV and CLK is approximately 1500ms, T3 can be greater than 1500ms and less than T7, where T7 represents the duration before the host sends the IIC command after restarting.

[0091] In some embodiments, to accurately determine the minimum (optimal) gate current, an amplifier circuit can be added to the TCON board to improve the accuracy of determining the minimum gate current by amplifying the gate current value. For example... Figure 9 As shown, this embodiment provides a schematic diagram of an amplifier circuit. In practice, when the MCU of the backlight driver board sends a command to the PMIC of the TCON board via IIC, the LVGL current will change when the LVGL voltage is adjusted. Therefore... Figure 9 The voltage difference across resistor R904 changes, and this voltage is amplified by a differential amplifier circuit. After two stages of amplification, the voltage enters the MCU's ADC pin. The MCU acquires the output voltage data from the amplifier circuit, calculates the corresponding gate current, determines the optimal LVGL based on the minimum gate current, and writes it to the PMIC. This process can be repeated at least once every 200hr / 100hr.

[0092] It should be noted that the amplifier circuit provided in this embodiment is only an example, and other circuits with current amplification function can also replace the above amplifier circuit. This embodiment does not impose too many limitations on this.

[0093] like Figure 10 As shown in the figure, this embodiment also provides a control flow of the MCU of the backlight driver board, as detailed below:

[0094] Step 1000: Power on the backlight driver board;

[0095] Step 1001: Read the voltage of the thermistor in the backlight driver board and calculate the temperature based on the read voltage;

[0096] Step 1002: Determine if the temperature is greater than 60℃. If yes, proceed to step 1003; otherwise, proceed to step 1004.

[0097] Step 1003: The MCU timer starts timing and records the running time at high temperature;

[0098] Step 1004: Determine whether the runtime is greater than the runtime threshold. If yes, proceed to step 1005; otherwise, proceed to step 1003.

[0099] Step 1005: Set current detection to enabled. When the device is powered on and restarted next time, the current detection subroutine will be entered to determine the optimal gate voltage.

[0100] For example, when the runtime is greater than 200 hours, current detection is enabled.

[0101] like Figure 11 As shown in the figure, this embodiment also provides an implementation flow of a current detection subroutine, as detailed below:

[0102] Step 1100: The MCU of the backlight driver board reads the output voltage value of the amplifier circuit and converts the output voltage value into the gate current value;

[0103] Step 1101: Reduce the LVGL voltage in 0.2V increments;

[0104] Step 1102: Calculate the gate current value again;

[0105] Step 1103: Determine if the gate current has decreased. If yes, proceed to step 1101; otherwise, proceed to step 1104.

[0106] Step 1104, LVGL + 0.2V, VGL = LVGL + 1V;

[0107] Step 1105: Write VGL and LVGL into the PMIC of the TCON board via IIC.

[0108] In practice, LVGL is restored to the previous voltage; at this point, the value of LVGL is the optimal leakage current I. off The corresponding gate voltage value is determined, and then VGL is determined according to the relationship VGL = LVGL + 1V, and written to the PMIC via IIC.

[0109] Step 1106: The PMIC updates the current gate voltage to the optimal gate voltage, and the TCON board sends display data and drive signals to the display panel.

[0110] In this embodiment, when the display device is detected to have operated at high temperatures for a duration exceeding the threshold, the MCU performs current detection and adjusts the VGL / LVGL voltage. The TCON board has an LVGL current amplification circuit. When the current detection flag is enabled, the TCON board sends a special GOA timing sequence upon power-on. The backlight driver board has a thermistor circuit and an EEPROM circuit. The backlight driver board sends a write signal to the EEPROM to record and store the high-temperature operating time. The backlight driver board and the TCON board are connected by an IIC line. When the operating time meets the monitoring duration nodes, the backlight driver board sends an IIC command to the TCON board to modify the PMIC voltage.

[0111] In some embodiments, this embodiment also provides a method for determining the optimal gate voltage by looking up a table, as shown below:

[0112] Based on the mapping relationship between runtime and gate voltage, the gate voltage corresponding to the runtime of the backlight driver board at the target temperature is determined; the gate voltage corresponding to the runtime at the target temperature is determined as the optimal gate voltage.

[0113] In practice, the mapping relationship between different running lengths and gate voltages is measured in advance through detection. Based on this mapping relationship, the gate voltage corresponding to the running length of the backlight driver board at the target temperature is determined and used as the optimal gate voltage.

[0114] In practice, one running time corresponds to a set of optimal gate voltages, and each set of gate voltages includes, but is not limited to, VGH, VGL, LVGL, etc.

[0115] During implementation, when the runtime at the target temperature reaches the critical time node (each runtime) of the TFT characteristic offset curve, the MCU reads the VGH, VGL, and LVGL values ​​corresponding to the runtime by looking up a table (as shown in Table 1), and sends an IIC command to the TCON board to update the VGH, VGL, and LVGL settings of the PMIC.

[0116] Table 1. Mapping relationship between runtime and gate voltage

[0117] Runtime (hr) VGL(V) LVGL(V) 0 -9 -10 … … … 300 -11 -12 … … … 700 -12 -13 … … … 1000 -13 -14

[0118] In some embodiments, the controller is specifically configured to determine the mapping relationship between the runtime and the gate voltage in the following manner:

[0119] The TFT characteristic curve of the display device is collected, wherein the TFT characteristic curve represents the relationship between the gate voltage and TFT leakage current of the display device under different operating times;

[0120] Based on the TFT characteristic curve, the relationship between gate voltage and operating time was simulated.

[0121] Based on the relationship curve between the gate voltage and the operating time, and the preset gate voltage margin, the mapping relationship between the operating time and the gate voltage is determined.

[0122] like Figure 12 As shown, this embodiment also provides a mapping relationship curve between operating time and gate voltage at high temperature. Taking a 4V gate voltage margin as an example, the optimal gate voltage corresponding to different operating times is simulated based on the VGH change curve of 34V and the VGH change curve of 40V over time.

[0123] The process of building the high-temperature / room-temperature time-varying VGH model is as follows:

[0124] 1) Initial VGH settings;

[0125] The initial VGH setting is greater than the charging rate NG (insufficient) voltage, where the simulated result of the charging rate NG voltage is 32V; the charging rate specifically includes the charging rate of each pixel unit of the display panel.

[0126] 2) High temperature / normal temperature time-varying VGH setting;

[0127] Among them, based on the simulation conditions of the display panel (OC), the TFT characteristic curves of accelerated high temperature / normal temperature 34V / 40V are simulated, where the TFT characteristic curve is the leakage current changing with the gate voltage VGH.

[0128] 3) Simulate the VGH margin variation curve at high temperature / room temperature over a period of time using the VGH data in the TFT characteristic curve, and further simulate the VGH margin variation curve at high temperature / room temperature.

[0129] 4) Based on the VGH 34V Margin NG curve, retain the 4V Margin until VGH is set to 34V;

[0130] 5) When VGH Margin < 4V, retain 4V Margin according to the VGH 40V Margin NG curve until VGH is set to 40V.

[0131] The process of building the time-varying VGL curve model is as follows:

[0132] 1) The initial VGL is set to -9V;

[0133] 2) Three display panels were put into high temperature and three into normal temperature operation tests to test the VGL Margin changes at different times;

[0134] 3) Change the VGL / LVGL setting value in the TCON module to ensure that the margin is not less than 3V, and obtain the optimal value of VGL for high temperature / normal temperature time variation.

[0135] like Figure 13 As shown in the figure, this embodiment also provides an automatic gate voltage adjustment process, as detailed below:

[0136] Step 1300: Power on the backlight driver board;

[0137] Step 1301: Read the voltage of the thermistor in the backlight driver board and calculate the temperature based on the read voltage;

[0138] Step 1302: Determine if the temperature is greater than 60℃. If yes, proceed to step 1303; otherwise, proceed to step 1304.

[0139] Step 1303: The MCU timer starts timing and records the running time at high temperature;

[0140] Step 1304: Determine whether the runtime is greater than the runtime threshold. If yes, proceed to step 1305; otherwise, proceed to step 1303.

[0141] Step 1305: Based on the mapping relationship between runtime and gate voltage, determine the gate voltage corresponding to the runtime of the backlight driver board at the target temperature; and determine the gate voltage corresponding to the runtime at the target temperature as the optimal gate voltage.

[0142] Step 1306: Send a change command to the TCON board. The PMIC of the TCON board updates the current gate voltage to the optimal gate voltage. The TCON board sends display data and drive signals to the display panel.

[0143] In some embodiments, the backlight driver board of this embodiment includes a temperature measurement circuit; the controller is further configured to execute:

[0144] The temperature of the backlight driver board is monitored by the temperature measuring circuit; in response to the temperature of the backlight driver board exceeding a first threshold, the current of the backlight driver board is reduced, or the duty cycle of the pulse width modulation is reduced.

[0145] Optionally, the first threshold is determined based on the temperature of the backlight driver board when the temperature of the polarizing film of the display device reaches its maximum operating temperature.

[0146] In practice, since the backlight driver board is mounted on the back panel, at high temperatures, as the backlight brightness increases, the LED strip temperature rises, and the back panel temperature rises accordingly. There is a linear correlation between the backlight brightness and the temperature of the thermistor in the converter's backlight driver board. Simultaneously, the screen surface temperature is also linearly correlated with the backlight brightness and LED strip temperature. Therefore, it can be determined that, assuming the screen surface reaches the maximum operating temperature of the polarizing film (POL), the temperature of the thermistor on the backlight driver board is T. max The temperature Tr of the thermistor on the backlight driver board exceeds T. max At -5 degrees Celsius, temperature adjustment begins, reducing the current of the backlight driver board or the duty cycle of the pulse width modulation (PWM) to reduce brightness and lower the temperature of the LED strip, ensuring that the screen surface temperature does not exceed the POL tolerance temperature and preventing POL burn-in.

[0147] like Figure 14 As shown in the figure, this embodiment also provides a flow chart of a temperature adjustment procedure, and the specific implementation steps are as follows:

[0148] Step 1400: Monitor the temperature of the backlight driver board using the temperature measurement circuit of the backlight driver board;

[0149] Step 1401: Determine whether the temperature of the backlight driver board is greater than the first threshold T. max -n, if so, execute step 1402; otherwise, execute step 1403.

[0150] Where n represents a number greater than zero.

[0151] Step 1402: Reduce the current of the backlight driver board, or reduce the duty cycle of the pulse width modulation.

[0152] Step 1403: Execute the main program.

[0153] The main program can be a program used to determine the optimal gate voltage and update the current gate voltage to the optimal gate voltage, or it can be another program.

[0154] This embodiment can solve the problem that under long-term high temperature / high brightness / 7×24hr use conditions, the TFT characteristics decay faster than normal use, and the VGH / VGL margin is insufficient, resulting in abnormal picture; it can solve the problem that high brightness backlight heat causes POL burn-in under high temperature environment, resulting in abnormal picture; it can also solve the problem that the high temperature working time cannot be quantified and recorded.

[0155] like Figure 15 As shown, this embodiment also provides an implementation process for gate voltage adjustment and temperature adjustment, as detailed below:

[0156] Step 1500: Power on the backlight driver board;

[0157] Step 1501: Read the voltage of the thermistor in the backlight driver board and calculate the temperature based on the read voltage;

[0158] Step 1502: Determine if the temperature is greater than 60℃. If yes, proceed to step 1503; otherwise, proceed to step 1504.

[0159] Step 1503: The MCU timer starts timing and records the running time at high temperature;

[0160] Step 1504: Determine whether the runtime is greater than the runtime threshold. If yes, proceed to step 1505; otherwise, proceed to step 1503.

[0161] Step 1505: Enable current detection;

[0162] Step 1506: After powering on and restarting, the MCU of the backlight driver board reads the initial output voltage value of the amplifier circuit and converts the initial output voltage value into the gate current value.

[0163] Step 1507: Reduce the LVGL voltage in 0.2V increments and recalculate the gate current value;

[0164] Step 1508: Determine if the gate current has decreased. If yes, proceed to step 1507; otherwise, proceed to step 1509.

[0165] Step 1509: LVGL+0.2V, VGL=LVGL+1V, write VGL and LVGL into the PMIC of the TCON board via IIC;

[0166] Step 1510: The PMIC updates the current gate voltage to the optimal gate voltage, and the TCON board sends display data and drive signals to the display panel.

[0167] Step 1511: Monitor the temperature of the backlight driver board using the temperature measurement circuit of the backlight driver board;

[0168] Step 1512: Determine whether the temperature of the backlight driver board is greater than the first threshold Tmax-n. If yes, proceed to step 1513; otherwise, end.

[0169] Where n represents a number greater than zero.

[0170] Step 1513: Reduce the current of the backlight driver board, or reduce the duty cycle of the pulse width modulation.

[0171] This embodiment adds a temperature measurement circuit and a storage circuit to the backlight driver board to detect the operating temperature of the display module and record the operating time at high temperatures in the storage element. When the operating time exceeds the time threshold, the LVGL and VGL are adjusted by detecting the LVGL current. Through the IIC connection with the TCON board, commands are sent to adjust the VGL and LVGL voltages to improve the VGL margin, achieve the optimal display effect, avoid defects, and extend product life. At the same time, by monitoring the temperature, when it approaches the POL tolerance threshold, the backlight driver board reduces the backlight drive current or reduces the PWM duty cycle to avoid exceeding the POL tolerance temperature and causing burn-in that leads to poor image quality.

[0172] like Figure 16 As shown, this embodiment also provides an implementation process for gate voltage adjustment and temperature adjustment, as detailed below:

[0173] Step 1600: Power on the backlight driver board;

[0174] Step 1601: Read the voltage of the thermistor in the backlight driver board and calculate the temperature based on the read voltage;

[0175] Step 1602: Determine if the temperature is greater than 60℃. If yes, proceed to step 1603; otherwise, proceed to step 1604.

[0176] Step 1603: The MCU timer starts timing and records the running time at high temperature;

[0177] Step 1604: Determine whether the runtime is greater than the runtime threshold. If yes, proceed to step 1605; otherwise, proceed to step 1603.

[0178] Step 1605: Based on the mapping relationship between runtime and gate voltage, determine the gate voltage corresponding to the runtime of the backlight driver board at the target temperature; determine the gate voltage corresponding to the runtime at the target temperature as the optimal gate voltage.

[0179] Step 1606: Send a change command to the TCON board. The PMIC of the TCON board updates the current gate voltage to the optimal gate voltage. The TCON board sends display data and drive signals to the display panel.

[0180] Step 1607: Monitor the temperature of the backlight driver board using the temperature measurement circuit of the backlight driver board;

[0181] Step 1608: Determine whether the temperature of the backlight driver board is greater than the first threshold Tmax-n. If yes, proceed to step 1609; otherwise, end.

[0182] Where n represents a number greater than zero.

[0183] Step 1609: Reduce the current of the backlight driver board, or reduce the duty cycle of the pulse width modulation.

[0184] This embodiment adds a temperature measurement circuit and a storage circuit to the backlight driver board to detect the operating temperature of the display module and record the operating time at high temperatures in the storage circuit. When the operating time exceeds the time threshold, the optimal VGH, VGL, and LVGL voltages are determined by looking up a table. Through the IIC connection with the TCON board, commands are sent to adjust the VGH, VGL, and LVGL voltages to improve VGH margin and VGL margin, achieve optimal display effect, avoid defects, and extend product life. At the same time, by monitoring the temperature, when it approaches the POL tolerance threshold, the backlight driver board reduces the backlight drive current or reduces the PWM duty cycle to avoid exceeding the POL tolerance temperature and causing burn-in that leads to poor image quality.

[0185] Based on the same inventive concept, this invention also provides a display method for high-temperature operation. Since the principle of this method in solving the problem is similar to that of the display device, the implementation of this method can refer to the implementation of the display device, and repeated details will not be described again.

[0186] like Figure 17 As shown, the specific implementation process of this method is as follows:

[0187] Step 1700: Determine the operating time of the backlight driver board at the target temperature, wherein the target temperature represents a temperature greater than a temperature threshold.

[0188] Step 1701: In response to the running time meeting a preset condition, determine the optimal gate voltage, wherein the gate voltage is used to control the turning on and off of the TFT;

[0189] Step 1702: Send a change command to the TCON board, so that the TCON board updates the current gate voltage to the optimal gate voltage and sends display data and drive signals to the display panel, wherein the drive signals are generated based on the optimal gate voltage.

[0190] As an optional implementation, determining the optimal gate voltage includes:

[0191] The gate voltage is iteratively adjusted according to the set step size until the number of iterations reaches the threshold or the gate current corresponding to the adjusted gate voltage is the minimum.

[0192] The optimal gate voltage is determined based on the gate voltage corresponding to the minimum gate current.

[0193] As an optional implementation, the TCON board includes an amplifier circuit for increasing the gate current; determining the optimal gate voltage includes:

[0194] The gate voltage is adjusted in the nth iteration according to the set step size to obtain the nth gate voltage, where n is an integer greater than or equal to 1;

[0195] Read the output voltage of the amplifier circuit at the (n+1)th iteration and convert it into the gate current at the (n+1)th iteration; the gate current at the first iteration is obtained by reading the output voltage of the amplifier circuit at the first iteration before iterative adjustment.

[0196] If the gate current in the (n+1)th iteration is less than the gate current in the nth iteration, then the next iteration adjustment continues; otherwise, the optimal gate voltage is determined based on the gate voltage in the nth iteration.

[0197] As an optional implementation, the iterative adjustment of the gate voltage according to a set step size includes:

[0198] Upon receiving a restart command and before the backlight is turned on, the gate voltage is iteratively adjusted according to a set step size.

[0199] As an optional implementation, determining the optimal gate voltage includes:

[0200] Based on the mapping relationship between runtime and gate voltage, determine the gate voltage corresponding to the runtime of the backlight driver board at the target temperature;

[0201] The gate voltage corresponding to the operating time at the target temperature is determined as the optimal gate voltage.

[0202] As an optional implementation, the mapping relationship between the runtime and the gate voltage is determined in the following manner:

[0203] The TFT characteristic curve of the display device is collected, wherein the TFT characteristic curve represents the relationship between the gate voltage and TFT leakage current of the display device under different operating times;

[0204] Based on the TFT characteristic curve, the relationship between gate voltage and operating time was simulated.

[0205] Based on the relationship curve between the gate voltage and the operating time, and the preset gate voltage margin, the mapping relationship between the operating time and the gate voltage is determined.

[0206] As an optional implementation, the backlight driving board includes a temperature sensing circuit; the method further includes:

[0207] The temperature of the backlight driver board is monitored by a temperature measuring circuit.

[0208] In response to the temperature of the backlight driver board exceeding a first threshold, the current of the backlight driver board is reduced, or the duty cycle of the pulse width modulation is reduced.

[0209] As an optional implementation, the first threshold is determined based on the temperature of the backlight driver board when the temperature of the polarizing film of the display device reaches its maximum operating temperature.

[0210] As an optional implementation, the backlight driver board includes a storage circuit, the memory being used to store the operating time of the backlight driver board at a target temperature.

[0211] As an optional implementation, the backlight driver board includes an MCU; the step of sending a change command to the TCON board includes:

[0212] The MCU of the backlight driver board sends a change command to the TCON board via the integrated circuit bus. The TCON board updates the current gate voltage to the optimal gate voltage by modifying the voltage of the power management integrated circuit.

[0213] Based on the same inventive concept, this embodiment of the invention also provides a display device operating at high temperatures. Since this device is the same as the device in the method of this embodiment of the invention, and the principle of the device in solving the problem is similar to that of the method, the implementation of this device can refer to the implementation of the method, and the repeated parts will not be described again.

[0214] like Figure 18 As shown, the device includes:

[0215] The runtime determination module 1800 is used to determine the runtime of the backlight driver board at a target temperature, wherein the target temperature represents a temperature greater than a temperature threshold.

[0216] A gate voltage determination module 1801 is used to determine an optimal gate voltage in response to the runtime meeting a preset condition, wherein the gate voltage is used to control the turning on and off of the TFT;

[0217] The gate voltage update module 1802 is used to send a change command to the TCON board, so that the TCON board updates the current gate voltage to the optimal gate voltage and sends display data and drive signals to the display panel, wherein the drive signals are generated based on the optimal gate voltage.

[0218] Based on the same inventive concept, this embodiment of the invention also provides an electronic device. Since this device is the same as the device in the method of this embodiment of the invention, and the principle of the device in solving the problem is similar to that of the method, the implementation of this device can refer to the implementation of the method, and the repeated parts will not be described again.

[0219] like Figure 19 As shown, the electronic device includes a processor 1900 and a memory 1901. The memory 1901 stores programs executable by the processor 1900, and the processor 1900 reads the programs from the memory 1901 and performs the following steps:

[0220] Determine the operating time of the backlight driver board at a target temperature, wherein the target temperature represents a temperature greater than a temperature threshold.

[0221] In response to the runtime meeting a preset condition, an optimal gate voltage is determined, wherein the gate voltage is used to control the turning on and off of the TFT;

[0222] A change command is sent to the TCON board, which updates the current gate voltage to the optimal gate voltage, and sends display data and drive signals to the display panel, wherein the drive signals are generated based on the optimal gate voltage.

[0223] Based on the same inventive concept, this disclosure provides a computer storage medium comprising: computer program code, which, when executed on a computer, causes the computer to perform any of the high-temperature operating state display methods described above. Since the principle by which the computer storage medium solves the problem is similar to that of the high-temperature operating state display method, the implementation of the computer storage medium can be referred to the implementation of the method, and repeated details will not be elaborated further.

[0224] In specific implementation, computer storage media can include: Universal Serial Bus Flash Drive (USB), portable hard drive, Read-Only Memory (ROM), Random Access Memory (RAM), magnetic disk or optical disk, and other storage media that can store program code.

[0225] Based on the same inventive concept, this disclosure also provides a computer program product, which includes computer program code. When the computer program code is run on a computer, it causes the computer to execute any of the high-temperature operating state display methods described above. Since the principle by which the above-described computer program product solves the problem is similar to that of the high-temperature operating state display method, the implementation of the above-described computer program product can be referred to the implementation of the method, and repeated details will not be described again.

[0226] Computer program products may employ any combination of one or more readable media. A readable medium may be a readable signal medium or a readable storage medium. A readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples (a non-exhaustive list) of readable storage media include: electrical connections having one or more wires, portable disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0227] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage and optical storage) containing computer-usable program code.

[0228] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 Devices that specify the functions in one or more boxes.

[0229] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including an instruction device, which is implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0230] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0231] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A display device, characterized in that, It includes a backlight driver board, a TCON board, a display panel, and a controller, the controller being configured to perform the following steps: Determine the operating time of the backlight driver board at a target temperature, wherein the target temperature represents a temperature greater than a temperature threshold. In response to the runtime meeting a preset condition, an optimal gate voltage is determined, wherein the gate voltage is used to control the turning on and off of the TFT; A change command is sent to the TCON board, which updates the current gate voltage to the optimal gate voltage, and sends display data and drive signals to the display panel, wherein the drive signals are generated based on the optimal gate voltage.

2. The display device according to claim 1, characterized in that, The controller is specifically configured to execute: The gate voltage is iteratively adjusted according to the set step size until the number of iterations reaches the threshold or the gate current corresponding to the adjusted gate voltage is the minimum. The optimal gate voltage is determined based on the gate voltage corresponding to the minimum gate current.

3. The display device according to claim 2, characterized in that, The TCON board includes an amplifier circuit for increasing the gate current; the controller is specifically configured to execute: The gate voltage is adjusted in the nth iteration according to the set step size to obtain the nth gate voltage, where n is an integer greater than or equal to 1; Read the output voltage of the amplifier circuit at the (n+1)th iteration and convert it into the gate current at the (n+1)th iteration; the gate current at the first iteration is obtained by reading the output voltage of the amplifier circuit at the first iteration before iterative adjustment. If the gate current in the (n+1)th iteration is less than the gate current in the nth iteration, then the next iteration adjustment continues; otherwise, the optimal gate voltage is determined based on the gate voltage in the nth iteration.

4. The display device according to claim 2, characterized in that, The controller is specifically configured to execute: Upon receiving a restart command and before the backlight is turned on, the gate voltage is iteratively adjusted according to a set step size.

5. The display device according to claim 1, characterized in that, The controller is specifically configured to execute: Based on the mapping relationship between runtime and gate voltage, determine the gate voltage corresponding to the runtime of the backlight driver board at the target temperature; The gate voltage corresponding to the operating time at the target temperature is determined as the optimal gate voltage.

6. The display device according to claim 5, characterized in that, The controller is specifically configured to determine the mapping relationship between the runtime and the gate voltage in the following manner: The TFT characteristic curve of the display device is collected, wherein the TFT characteristic curve represents the relationship between the gate voltage and TFT leakage current of the display device under different operating times; Based on the TFT characteristic curve, the relationship between gate voltage and operating time was simulated. Based on the relationship curve between the gate voltage and the operating time, and the preset gate voltage margin, the mapping relationship between the operating time and the gate voltage is determined.

7. The display device according to claim 1, characterized in that, The backlight driver board includes a temperature measurement circuit; the controller is further configured to execute: The temperature of the backlight driver board is monitored by the temperature measuring circuit. In response to the temperature of the backlight driver board exceeding a first threshold, the current of the backlight driver board is reduced, or the duty cycle of the pulse width modulation is reduced.

8. The display device according to claim 7, characterized in that, The first threshold is determined based on the temperature of the backlight driver board when the temperature of the polarizing film of the display device reaches its maximum operating temperature.

9. The display device according to claim 1, characterized in that, The backlight driver board includes a temperature measurement circuit; the controller is specifically configured to execute: After the backlight driver board is powered on, the voltage of the temperature measuring circuit is read, and the temperature of the backlight driver board is determined based on the read voltage. In response to the temperature of the backlight driver board being greater than a temperature threshold, the temperature of the backlight driver board is determined to be the target temperature.

10. The display device according to claim 1, characterized in that, The backlight driver board includes a storage circuit for storing the operating time of the backlight driver board at a target temperature.

11. The display device according to claim 1, characterized in that, The controller includes an MCU and is located on the backlight driver board; the controller is specifically configured to execute: The backlight driver board sends a change command to the TCON board via the integrated circuit bus, so that the TCON board can update the current gate voltage to the optimal gate voltage by modifying the voltage of the power management integrated circuit.

12. A display method for high-temperature operation, characterized in that, The method includes: Determine the operating time of the backlight driver board at a target temperature, wherein the target temperature represents a temperature greater than a temperature threshold. In response to the runtime meeting a preset condition, an optimal gate voltage is determined, wherein the gate voltage is used to control the turning on and off of the TFT; A change command is sent to the TCON board, which updates the current gate voltage to the optimal gate voltage and sends display data and drive signals to the display panel, wherein the drive signals are generated based on the optimal gate voltage.

13. The display method according to claim 12, characterized in that, Determining the optimal gate voltage includes: The gate voltage is iteratively adjusted according to the set step size until the number of iterations reaches the threshold or the gate current corresponding to the adjusted gate voltage is the minimum. The optimal gate voltage is determined based on the gate voltage corresponding to the minimum gate current.

14. The display method according to claim 12, characterized in that, Determining the optimal gate voltage includes: Based on the mapping relationship between runtime and gate voltage, determine the gate voltage corresponding to the runtime of the backlight driver board at the target temperature; The gate voltage corresponding to the operating time at the target temperature is determined as the optimal gate voltage.

15. The display method according to claim 12, characterized in that, The method also includes: The temperature of the backlight driver board is monitored by a temperature measuring circuit. In response to the temperature of the backlight driver board exceeding a first threshold, the current of the backlight driver board is reduced, or the duty cycle of the pulse width modulation is reduced.

16. A computer storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, it implements the steps of the method as described in any one of claims 12 to 15.

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