An intelligent high frequency power tester

Abstract

The present invention provides an intelligent high-frequency power tester, comprising a front panel, a test module, a communication module, a power module and a shell. The front panel is equipped with a touch display screen and a plurality of physical control buttons for displaying a control interface and receiving user instructions. The test module is responsible for testing the electrical parameters of the target power-consuming end. The display interface includes a plurality of display areas, and the user can customize the layout to optimize the display parameters and respond to button operations according to their own needs. The test module is equipped with a processor, a memory and a test circuit. The machine-readable instructions stored in the memory enable the processor to perform operations such as electrical parameter testing, data storage, custom interface settings and priority calculations, and generate a recommended display interface layout. In the harmonic test mode, the main parameter area, the secondary parameter area and the status display area are merged into one display area to display a waveform or a bar graph of the harmonic data. The storage module is used to store test data, custom and recommended display interface layout schemes.

Description

Technical Field

[0001] The invention belongs to the technical field of testing instruments, and in particular relates to an intelligent high-frequency power tester. Background Art

[0002] With the rapid development of power systems and electronic equipment, high-frequency power testers are playing an increasingly important role in power monitoring, energy management, equipment maintenance and other fields. Traditional power testers mostly use a fixed display interface and function button layout, which cannot meet the diverse needs of users. Especially in complex electrical parameter testing and data analysis, the fixed interface often limits the user's operating efficiency and the convenience of data acquisition. In addition, the harmonic problem in modern power systems is becoming increasingly prominent, and accurately testing and analyzing harmonic components is crucial to monitoring power quality. However, existing equipment also has certain limitations in harmonic testing and display, and it is difficult to intuitively present the fluctuations and changes in harmonic data.

[0003] According to the relevant public technologies, the technical solution with publication number JP2009103538A proposes a power testing system, which is equipped with multiple controllable on and off circuit breakers, so that the test system can handle the power of multiple input lines without affecting each other; the technical solution with publication number WO2022226266A1 proposes a power meter, which uses multiple built-in sensors to measure various influences on power measurement in the environment, so as to appropriately correct the real-time measured value of power; the technical solution with publication number EP3460942A1 proposes an intelligent power meter, which is connected to the meter through blockchain to realize the calculation of electricity costs through data measured by the power meter, and ensure the fairness and accuracy of the measurement data.

[0004] The above technical solutions all propose various optimization technical solutions for the tester, but the current technical solutions rarely mention the way to intelligently optimize the user interface, and there is still a need to propose technical improvement solutions that can better improve the user experience.

[0005] The foregoing discussion of the background art is intended only to facilitate an understanding of the present invention. This discussion does not acknowledge or admit that any of the material referred to is part of the common general knowledge. Summary of the invention

[0006] The object of the present invention is to provide an intelligent high-frequency power tester, comprising a front panel, a test module, a communication module, a power module and a housing. The front panel is equipped with a touch display screen and a plurality of physical control buttons for displaying a control interface and receiving user instructions. The test module is responsible for testing the electrical parameters of the target power-consuming end. The display interface includes a plurality of display areas, and the user can customize the layout to optimize the display parameters and respond to button operations according to their own needs. The test module is equipped with a processor, a memory and a test circuit. The machine-readable instructions stored in the memory enable the processor to perform operations such as electrical parameter testing, data storage, custom interface settings and priority calculations, and generate a recommended display interface layout. In the harmonic test mode, the main parameter area, the secondary parameter area and the status display area are merged into one display area to display a waveform or a bar graph of the harmonic data. The storage module is used to store test data, custom and recommended display interface layout schemes.

[0007] The present invention adopts the following technical scheme: an intelligent high-frequency power tester, the tester comprising a front panel, a test module, a communication module, a power module and a housing;

[0008] The front panel includes a touch screen and a plurality of physical control buttons; the front panel is coupled to the test module in signal communication, displays a display interface for controlling the tester through the touch screen, receives user commands through the touch screen and the plurality of physical control buttons, and further sends the user commands to the test module;

[0009] The test module is configured to test the electrical parameters of the target power-consuming end; the test module is connected to the communication module via a signal input and output end, and is used to send and receive data via the communication module;

[0010] The communication module is connected to the external device via a signal terminal and is used to send and receive data with the external device;

[0011] The power supply module is connected to the front panel and the power input terminal of the test module respectively, and is used to provide power;

[0012] The front panel, test module, communication module and power module are respectively fixedly installed in the housing, and the housing is used to provide position fixation and protection for the above components;

[0013] The display area in the display interface includes a main parameter area, a secondary parameter area, a status display area, a function key area, a function option area and a page turning area; the layout of the main parameter area, the secondary parameter area, the status display area, the function key area and the function option area allows the user to make custom adjustments, and correctly display the corresponding parameters based on the custom layout, and correctly respond to the corresponding operations of the buttons;

[0014] Preferably, the test module is configured with at least one processor, a memory, and a test circuit for testing electrical parameters of the target power-consuming end; the memory stores machine-readable instructions, and the machine-readable instructions enable the processor to perform one or more of the following operations:

[0015] Operating the test circuit to perform an electrical parameter test on a target power-consuming terminal, collecting test data, and storing the collected test data in the memory;

[0016] Provide users with customized display interface settings and store user-defined display interface layouts;

[0017] Calculate the comprehensive display priority of the data and use it to determine the parameters to be displayed first;

[0018] Reset the display interface according to the custom display interface layout;

[0019] Preferably, in the test module, the machine-readable instructions stored in the memory further include causing the processor to execute: generating a solution for a recommended display interface layout;

[0020] Preferably, in the display interface, the main parameter area, the sub-parameter area, and the status display area are combined into one display area under the display interface of the harmonic test, and the display interface of the harmonic test allows display in a harmonic waveform interface or a harmonic bar graph interface, so as to present the harmonic data in the form of a curve or a bar graph;

[0021] Preferably, the test signal frequency range of the tester is 0.5 Hz to 100 kHz, and the bandwidth range of the test signal is 0.5 Hz to 100 kHz;

[0022] Preferably, the test module further includes providing an integral calculation function; the integral calculation function includes: power integration and current integration; wherein the integration mode is divided into an automatic integration mode and a manual integration mode;

[0023] Preferably, the test module also includes providing a calculation function; the calculation function is used to calculate the statistical values ​​of power, voltage and current; the calculation function includes the calculation of the following values: peak factor, four arithmetic operations, average active power during integration;

[0024] Preferably, the test module also includes an average value calculation function, which is used to calculate the average value of multiple real-time test values ​​obtained within a time period and then display it to the user to avoid affecting the actual display effect due to large fluctuations in real-time test values; the calculation methods of the average value calculation function include: exponential average, linear average;

[0025] Preferably, the tester further comprises a storage module, wherein the storage module comprises a module for storing:

[0026] Data collected during the test;

[0027] User-defined display interface layout scheme;

[0028] The recommended display interface layout solution generated by the testing module.

[0029] The beneficial effects achieved by the present invention are:

[0030] 1. The power tester of this technical solution allows users to freely adjust the layout of the display interface, including the main parameter area, the secondary parameter area, the status display area, the function key area and the function option area; users can customize the interface layout according to their own needs to improve the readability of data and the convenience of operation;

[0031] 2. In the harmonic test mode, the tester of the technical solution combines the main parameter area, the sub-parameter area and the status display area into one display area, and supports harmonic waveform and bar graph display; this makes the display of harmonic data more intuitive, which is convenient for users to analyze and monitor power quality;

[0032] 3. The tester of this technical solution has perfect calculation and storage functions, including integral calculation of power and current, statistical value calculation (such as peak factor and average active power), and average value calculation function for smoothing test value fluctuations; at the same time, the storage module can save test data and user-defined display interface layout, providing comprehensive data management and optimization experience;

[0033] 4. The software and hardware parts of the tester of this technical solution adopt a modular design. The various working modules and components of the hardware part of the tester, as well as the instructions, parameters, and algorithms of the software part can be conveniently replaced and / or upgraded later, thereby reducing the construction cost and maintenance cost of the system. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] The present invention can be further understood from the following description in conjunction with the accompanying drawings. The components in the figures are not necessarily drawn to scale, but the emphasis is placed on illustrating the principles of the embodiments. In different views, the same reference numerals designate corresponding parts.

[0035] Description of the accompanying figures: 1-front panel; 2-display screen; 3-function selection key; 4-setting key; 5-direction key; 6-export interface; 7-start key; 20-display interface; 21-main parameter display area; 22-secondary parameter display area; 23-main function status display area; 24-function key display area; 25-function option display area; 26-page display area; 700-computing architecture; 702-bus; 704-processor; 706-main memory; 708-read-only memory; 710-storage device; 712-display; 714-input device; 716-cursor control device; 718-network device;

[0036] Figure 1 is a schematic diagram of a front panel of the tester described in an embodiment of the present invention;

[0037] Figure 2 A schematic diagram of a display interface in an embodiment of the present invention;

[0038] Figure 3 This is a schematic diagram of an interface of the integral calculation function of the tester described in an embodiment of the present invention;

[0039] Figure 4 A schematic diagram of a selection interface for an average function of a tester according to an embodiment of the present invention;

[0040] Figure 5 A schematic diagram of the waveform of the harmonic test displayed by the Class B integrated interface in an embodiment of the present invention;

[0041] Figure 6 A schematic diagram of a bar chart of a harmonic test displayed by the Class B integrated interface in an embodiment of the present invention;

[0042] Figure 7 Schematic diagram of the computing architecture used by the test module in the embodiment of the present invention. DETAILED DESCRIPTION

[0043] In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention is further described in detail below in conjunction with its embodiments; it should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention. For those skilled in the art, after reviewing the following detailed description, other systems, methods and / or features of the present embodiment will become apparent. It is intended that all such additional systems, methods, features and advantages are included in this specification. Included within the scope of the present invention and protected by the appended claims. Additional features of the disclosed embodiments are described in the following detailed description, and these features will be apparent from the following detailed description.

[0044] The same or similar reference numerals in the drawings of the embodiments of the present invention correspond to the same or similar components; in the description of the present invention, it should be understood that if there are terms such as "upper", "lower", "left", "right" and the like indicating the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, it is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or component referred to must have a specific orientation. The invention is constructed and operated in a specific orientation, so the terms describing the positional relationship in the drawings are only used for exemplary description and cannot be understood as a limitation of this patent. For ordinary technicians in this field, the specific meanings of the above terms can be understood according to the specific circumstances.

[0045] Embodiment 1: Exemplarily, an intelligent high-frequency power tester is proposed, the tester comprising a front panel, a test module, a communication module, a power module and a housing;

[0046] The front panel includes a touch screen and a plurality of physical control buttons; the front panel is coupled to the test module in signal communication, displays a display interface for controlling the tester through the touch screen, receives user commands through the touch screen and the plurality of physical control buttons, and further sends the user commands to the test module;

[0047] The test module is configured to test the electrical parameters of the target power-consuming end; the test module is connected to the communication module via a signal input and output end, and is used to send and receive data via the communication module;

[0048] The communication module is connected to the external device via a signal terminal and is used to send and receive data with the external device;

[0049] The power supply module is connected to the front panel and the power input terminal of the test module respectively, and is used to provide power;

[0050] The front panel, test module, communication module and power module are respectively fixedly installed in the housing, and the housing is used to provide position fixation and protection for the above components;

[0051] The display area in the display interface includes a main parameter area, a secondary parameter area, a status display area, a function key area, a function option area and a page turning area; the layout of the main parameter area, the secondary parameter area, the status display area, the function key area and the function option area allows the user to make custom adjustments, and correctly display the corresponding parameters based on the custom layout, and correctly respond to the corresponding operations of the buttons;

[0052] Preferably, the test module is configured with at least one processor, a memory, and a test circuit for testing electrical parameters of the target power-consuming end; the memory stores machine-readable instructions, and the machine-readable instructions enable the processor to perform one or more of the following operations:

[0053] Operating the test circuit to perform an electrical parameter test on a target power-consuming terminal, collecting test data, and storing the collected test data in the memory;

[0054] Provide users with customized display interface settings and store user-defined display interface layouts;

[0055] Calculate the comprehensive display priority of the data and use it to determine the parameters to be displayed first;

[0056] Reset the display interface according to the custom display interface layout;

[0057] Preferably, in the test module, the machine-readable instructions stored in the memory further include causing the processor to execute: generating a solution for a recommended display interface layout;

[0058] Preferably, in the display interface, the main parameter area, the sub-parameter area, and the status display area are combined into one display area under the display interface of the harmonic test, and the display interface of the harmonic test allows display in a harmonic waveform interface or a harmonic bar graph interface, so as to present the harmonic data in the form of a curve or a bar graph;

[0059] Preferably, the test signal frequency range of the tester is 0.5 Hz to 100 kHz, and the bandwidth range of the test signal is 0.5 Hz to 100 kHz;

[0060] Preferably, the test module further includes providing an integral calculation function; the integral calculation function includes: power integration and current integration; wherein the integration mode is divided into an automatic integration mode and a manual integration mode;

[0061] Preferably, the test module also includes providing a calculation function; the calculation function is used to calculate the statistical values ​​of power, voltage and current; the calculation function includes the calculation of the following values: peak factor, four arithmetic operations, average active power during integration;

[0062] Preferably, the test module also includes an average value calculation function, which is used to calculate the average value of multiple real-time test values ​​obtained within a time period and then display it to the user to avoid affecting the actual display effect due to large fluctuations in real-time test values; the calculation methods of the average value calculation function include: exponential average, linear average;

[0063] Preferably, the tester further comprises a storage module, wherein the storage module comprises a module for storing:

[0064] Data collected during the test;

[0065] User-defined display interface layout scheme;

[0066] The recommended display interface layout solution generated by the test module;

[0067] Specifically, as attached Figure 1 The figure shows an exemplary configuration of the front panel of the tester; the front panel 1 includes a display screen 2, a function selection key 3, a setting key 4, a direction key 5, an export interface 6 and a start key 7;

[0068] Preferably, the screen type of the display screen 2 may be TFT LCD, OLED, IPS LCD, etc.; the display screen 2 is a multi-touch screen, which may adopt capacitive multi-touch technology, support finger clicks, and have gesture operation functions, such as realizing advanced operations such as zooming, sliding, and double-clicking the screen through fingers;

[0069] Preferably, the display screen 2 is a color screen with a 6-bit or 8-bit color display depth; the color screen can express the diversity of test data through multiple colors, as well as data showing multiple states of the detection target or the tester itself;

[0070] Exemplarily, the function selection key 3 includes a plurality of physical keys with serial number identifications, and the function selection keys can be used to quickly select multiple sub-options in a control function, or select multiple sub-functions in a function; in an exemplary embodiment, the number of the function selection keys can be 4, 5 or 6; the labels of the function selection keys can be "F1", "F2", "F3", ...;

[0071] Exemplarily, the setting key 4 may include a plurality of physical keys with designated shortcut functions; in some embodiments, the setting key 4 may be clearly identified as "start", "stop", "voltage gear", and "current gear" so that the user can quickly perform specific operations without branch selection; and the setting key 4 may include shortcut keys for selecting to enter several major types of operation interfaces of the tester, for example, including a "test" key for entering a test interface; a "system" key for entering a system bottom-level setting interface of the tester;

[0072] Exemplarily, the direction key 5 may include a plurality of physical keys with directional markings; in some embodiments, the direction key 5 is used to change the selected target position in the display interface, and to move the position of the selection box in a plurality of display positions on the two-dimensional display interface in a manner of "up", "down", "left", and "right" to select different controllable or adjustable objects;

[0073] Exemplarily, the function selection key 3 and the multiple physical keys of the setting key 4 are configured as transparent keys with dynamic display function, the key body is made of transparent material, and the bottom layer of the key is equipped with electronic components with variable display content;

[0074] The body of the physical key is made of transparent material, such as polycarbonate (PC), silicone or acrylic acid (PMMA), which has good light transmittance and mechanical strength; the transparent property of the key body makes the bottom display content clearly visible; the physical key body is covered with an electronic display element, such as an electronic ink screen (E-Ink), an organic light emitting diode (OLED) or a liquid crystal display (LCD), which can dynamically change the display content on the key surface; the display element can update the key display information in real time according to system requirements; the electronic display element is driven by a display driving circuit, which is embedded in the bottom layer of the key, and changes the display content of the electronic display element by receiving a control signal from a test module; preferably, the driving circuit adopts a low-power design to ensure long-term stable operation;

[0075] Furthermore, a touch feedback device is integrated in the button body, such as a capacitive touch sensor or a mechanical feedback mechanism, for providing physical feedback when the button is pressed; when the physical button is pressed, the touch feedback device detects the pressing action and transmits a signal to the test module;

[0076] Furthermore, preferably, the display contents of the function selection key 3 and the setting key 4 can be displayed in association with the display interface 20 of the display screen 2, and the display contents of one or more physical keys of the function selection key 3 and the setting key 4 can be changed accordingly based on different display interface contents; Figure 2 To Attachment Figure 6 As shown in , the display content of the function selection key 3 physical key can be adjusted according to the mode displayed in the function key display area 24;

[0077] As attached Figure 2 As shown, a display interface 20 of the tester is displayed on the display screen 2. In an exemplary embodiment, the display interface 20 includes the following display areas:

[0078] Main parameter display area 21: located in the middle left of the interface, used to display the main test parameters, such as voltage, current, power, etc.;

[0079] Auxiliary parameter display area 22: located in the middle right of the interface, used to display auxiliary test parameters, such as frequency, power factor, harmonic components, etc.;

[0080] Main function status display area 23: a narrow and long area located above the main parameter display area and the auxiliary parameter display area, which displays the main function status information, such as the current test mode, data refresh rate, etc.;

[0081] Function key display area 24: located on the left side of the main parameter display area, including four function selection keys, each of which corresponds to a function selection; and, preferably, the four function selection keys correspond to four physical function selection keys respectively;

[0082] Function option display area 25: located below the main parameter display area, it displays detailed options and operations of the currently selected function;

[0083] Page turning display area 26: located below the auxiliary parameter display area 22, used to display the page up key and the page down key;

[0084] Exemplarily, in the display interface 20, the integration of the display areas is triggered based on the data display density;

[0085] For example, when the data density on the real-time monitoring interface of the system is too high, resulting in insufficient display area to display all key information, the system triggers the layout adjustment mechanism; the adjustment methods include:

[0086] Merge display area: When the data density is too high, the system merges the main parameter display area, the secondary parameter display area and the main function status display area to form a larger comprehensive display area for displaying more data;

[0087] Dynamically adjust the size ratio of the display area: that is, dynamically adjust the size and aspect ratio of each display area according to the needs of the display content, so that important data can occupy a larger display space and display more reasonably; for example, when the amount of data of certain parameters increases, its display area can be temporarily expanded;

[0088] Hierarchical information display: By displaying information in a hierarchical manner, for example, by displaying the depth of color or changing the transparency of different information, important information is displayed in the main position first, and secondary information is displayed by turning pages or scrolling, ensuring that users can quickly obtain the data they are most concerned about;

[0089] Intelligent push of key parameters: When certain key parameters fluctuate abnormally, the system automatically pushes these parameters to the main parameter display area to ensure that users notice these changes at the first time;

[0090] Data summary mode: When the data density is too high, the system can automatically enter the data summary mode, displaying only the summary information of key parameters, and the user can choose to view detailed data;

[0091] Real-time data comparison: When performing multi-parameter monitoring, the system can dynamically adjust the layout and display real-time data comparison charts to help users analyze the relationship between various parameters more intuitively;

[0092] Furthermore, it also includes a user-defined layout. Through the user-defined layout option, the user can preset different display layouts as needed, and the system automatically switches to the most suitable preset layout according to the real-time data; including the function of each virtual button in the main parameter display area 21, the secondary parameter display area 22 and the main function status display area 23, so as to make customized adjustments based on one's own usage habits and usage needs;

[0093] Exemplarily, the main parameter display area 21 and the auxiliary parameter display area 22 each occupy about 30% of the area of ​​the display interface 20;

[0094] Exemplarily, the main parameter display area 21, the secondary parameter display area 22 and the main function status display area 23 can be integrated based on the needs of display content to form a Class A integrated interface;

[0095] Exemplarily, the main parameter display area 21, the secondary parameter display area 22, the main function status display area 23 and the page turning display area 26 can be integrated based on the need of displaying content, thereby forming a Class B integrated interface;

[0096] In an exemplary embodiment, as shown in the attached Figure 3 As shown, it is a schematic diagram of the interface of the integral calculation function of the tester; the integral calculation function is divided into two types, namely power integration and current integration, and the integration mode is divided into automatic integration and manual integration; illustratively, after user-defined adjustment, the content is displayed in the manner of the Class A integrated interface;

[0097] In an exemplary embodiment, the tester can perform exponential averaging or moving averaging on numerical data in the measurement function of conventional tests; the numerical value is displayed after averaging calculation for situations where the numerical value display is unstable and difficult to read due to large changes in power supply or load, or low input signal frequency; the numerical value averaging calculation is divided into two types: exponential averaging or linear averaging; the selection interface of the averaging function is as shown in the attached figure. Figure 4 As shown;

[0098] The exponential average (EP) is the exponential average of the numerical data using the specified decay constant according to the following calculation formula:

[0099]

[0100] In the above formula, D n is the value displayed after the nth exponential averaging, the first displayed value D1 = M1; M n is the real-time measured value for the nth time; K is the attenuation constant set by the technician or user;

[0101] Among them, the exponential average (Lin) calculates the moving average with the specified number of averages according to the following formula, that is:

[0102]

[0103] In the above formula, E h is the value displayed after the linear average of j numerical data from the h-(j-1)th time to the hth time; P h-(j-1) is the real-time measured value of the h-(j-1)th time, and so on; the average number of j presets is set by the technician or the user.

[0104] Embodiment 2: This embodiment should be understood to include at least all the features of any of the above embodiments, and further improve upon them;

[0105] In some embodiments, the tester implements dynamic adjustment of the display interface of the front panel 1 during the harmonic test;

[0106] Harmonic testing is a test method used to analyze harmonic components in power systems. Harmonics refer to the phenomenon that the voltage or current waveform in the AC power supply deviates from the ideal sinusoidal waveform. The deviation is caused by nonlinear loads. Harmonic testing measures and analyzes the harmonic components in voltage and current to evaluate their impact on power systems and equipment. Harmonics are sinusoidal waves in power systems whose frequencies are integer multiples of the fundamental frequency. The fundamental frequency is usually the operating frequency of the target power consumption end, commonly 50Hz or 60Hz; while harmonics are integer multiples of the fundamental frequency, as low as 2 times, 3 times, etc. Harmonic components are superimposed on the fundamental wave, causing voltage and current waveforms to be distorted. Harmonics are mainly caused by nonlinear loads, such as rectifiers, inverters, electronic ballasts, switching power supplies, etc. These electronic components will generate non-sinusoidal currents during operation, thereby introducing harmonics into the working circuit of the power consumption end.

[0107] Exemplarily, when performing a harmonic test, the tester includes the following steps:

[0108] (1) Real-time acquisition of voltage and current signals;

[0109] (2) Fourier transform: Decompose the collected signal into harmonic components through Fourier transform;

[0110] (3) Calculate the amplitude, phase, and frequency of each harmonic and evaluate the total harmonic distortion (THD);

[0111] Finally, the test module generates harmonic analysis statistics according to the calculation results and displays them on the display screen 2;

[0112] In a preferred embodiment, the display interface 20 of the display screen 2 is dynamically adjusted in layout so that the display interface 20 can be automatically adjusted according to changes in real-time test data, so that users can quickly identify and handle abnormal situations;

[0113] Preferably, the display interface 20 is manually or automatically switched to a waveform graph or a bar graph as required, as shown in the attached Figure 5 and attached Figure 6 As shown; among them, Figure 5 Schematic diagram of the waveform of the harmonic test displayed by the Class B integrated interface; Figure 6 A schematic diagram of a bar graph of harmonic testing displayed on the Class B integrated interface

[0114] Preferably, the test module includes statistics of the total harmonic distortion (THD), individual harmonic amplitude, fundamental power factor (PF), distortion power (DP) and other data of the input signal;

[0115] Preferably, the user sets the thresholds of various parameters in the system of the tester, and the thresholds set by the user are stored in the memory of the device; when a parameter exceeds the preset threshold, the system will trigger the layout adjustment; preferably, the user can intervene and adjust the threshold during the test process, and the system will immediately respond and apply the new threshold;

[0116] Preferably, when a parameter exceeds a preset threshold, the system automatically adjusts the interface layout to make the parameter exceeding the threshold more conspicuous, so that the user can handle it in time;

[0117] In some embodiments, the tester forms a dynamic display layout adjustment strategy based on factors such as the user's concern for the displayed data, the degree of deviation of the data from conventional values, and the density of the data, and determines the priority and adjustment method of the display layout by designing one or more calculation formulas to integrate these factors;

[0118] Preferably, the user can first preset the degree of concern for each parameter, assuming that the degree of concern weight is W, where the weight of the i-th test parameter is W i , such as voltage, current, power, etc., the weight range can be set from 0 to 1;

[0119] Preferably, the method includes calculating the deviation degree of the measured value of the test parameter, the deviation degree D i The current test value R of the i-th test parameter i Compared with the conventional value P i The degree of deviation is calculated by the following formula:

[0120]

[0121] Among them, the current test value R i You can take the average value within a time period instead of the instantaneous value. The time period can be set to 1s, 5s or 10s.

[0122] Preferably, the data density M of the necessary display data for each parameter is calculated, namely:

[0123] M = N / A;

[0124] Where N is the number of all characters that need to be displayed; A is the standard density value, and the maximum amount of data allowed to be displayed can be calculated by the preset display resolution and pixel density PPI of the display screen 2 as the standard density value. For example, taking a display area with a resolution of 320*240 and a screen with a PPI of 200 as an example, considering the necessary character spacing and character clarity, the number of characters that can be displayed is about 200; the data density of the i-th test parameter is calculated as M i ;

[0125] Preferably, the comprehensive display priority P of the i-th test parameter is performed i Calculate, that is:

[0126] P i =W i ·D i ·M i ;

[0127] Next, the dynamic adjustment strategy is executed, which exemplarily includes the following steps:

[0128] S100: Determine the priority display parameters according to the comprehensive display priority P i The size of the parameter to be displayed first is determined; the priority display parameters are the parameters with the highest comprehensive display priority; the comprehensive display priority P i , determines the order of multiple parameter display pages of the i-th parameter. For example, if the comprehensive display priority of voltage is higher and current is relatively lower, the voltage value is displayed on the first page first, and the current value is displayed on the second page;

[0129] S200: adjusting the display area, dynamically adjusting the size of each display area according to the comprehensive display priority of the priority display parameter, so that the priority display parameter occupies a larger display space;

[0130] S300: hierarchical display of information, with priority parameters displayed in prominent positions, and secondary parameters displayed by page turning or scrolling, ensuring that users can quickly obtain the data they are most concerned about;

[0131] S400: merging display areas. When multiple parameters need to be displayed at the same time, or a large amount of data of the same parameter needs to be displayed at the same time, the system uses the Class A integrated interface or the Class B integrated interface to form a larger integrated display area for displaying more data.

[0132] The above only takes the harmonic test function of the tester applying the present technical solution as an example to illustrate an exemplary application method of the present technical solution; the display interface of other functions of the tester can also be implemented according to the present technical solution, which will not be described in detail here.

[0133] Embodiment 3: This embodiment should be understood to include at least all the features of any of the above embodiments, and further improve upon them;

[0134] For example, as shown in the attached Figure 7 As shown, the implementation of the computing architecture 700 used by the test module is described; the computing architecture 700 can be applied to the data storage, calculation and result output process of each working module in the identification and judgment system;

[0135] Illustratively, computer system 700 includes a bus 702 or other communication mechanism for communicating information, one or more processors 704 coupled to bus 702 for processing information; processor 704 may be, for example, one or more general-purpose microprocessors;

[0136] The computer system 700 also includes a main memory 706, such as a random access memory (RAM), cache, and / or other dynamic storage device, coupled to the bus 702 for storing information and instructions to be executed by the processor 704; the main memory 706 may also be used to store temporary variables or other intermediate information during the execution of instructions to be executed by the processor 704; these instructions, when stored in a storage medium accessible to the processor 704, present the computer system 700 as a special-purpose machine customized to perform the operations specified in the instructions;

[0137] The computer system 700 may also include a read-only memory (ROM) 708 or other static storage device coupled to the bus 702 for storing static information and instructions for the processor 704; a storage device 710 such as a disk, an optical disk, or a USB drive (flash drive) will be coupled to the bus 702 for storing information and instructions;

[0138] And further, coupled to the bus 702 may also include a display 712 for displaying various information, data, media, etc., an input device 714 for allowing a user of the computer system 700 to control, manipulate, and / or interact with the computer system 700;

[0139] A preferred way to interact with the management system may be through a cursor control device 716, such as a computer mouse or similar control / navigation mechanism;

[0140] Furthermore, the computer system 700 may also include a network device 718 coupled to the bus 702; wherein the network device 718 may include, for example, a wired network card, a wireless network card, a switching chip, a router, a switch, and other components;

[0141] In general, the terms "engine", "component", "system", "database", etc., as used herein, may refer to logic embodied in hardware or firmware, or to a collection of software instructions, possibly with entry and exit points, written in a programming language such as Java, C, or C++; software components may be compiled and linked into executable programs, installed in a dynamic link library, or may be written in an interpreted programming language (e.g., BASIC, Perl, or Python); it should be understood that software components may be called from other components or from themselves, and / or may be called in response to detected events or interrupts;

[0142] Software components configured to execute on a computing device may be provided on a computer-readable medium, such as a compact disc, digital video disc, flash drive, diskette, or any other tangible medium, or as a digital download (and may be initially stored in a compressed or installable format that requires installation, decompression, or decryption prior to execution); such software code may be stored in part or in whole on a memory device of the executing computing device for execution by the computing device; software instructions may be embedded in firmware, such as an EPROM; it is also understood that hardware components may be composed of connected logic units (such as gates and flip-flops), and / or may be composed of programmable units (such as programmable gate arrays or processors);

[0143] Computer system 700 includes custom hardwired logic, one or more ASICs or FPGAs, firmware, and / or program logic that, in combination with the computer system, renders computer system 700 a special-purpose computing device;

[0144] According to one or more embodiments, the techniques herein may be performed by computer system 700 in response to processor 704 executing one or more sequences of one or more instructions contained in main memory 706; such instructions may be read into main memory 706 from another storage medium, such as storage device 710; execution of the sequences of instructions contained in main memory 706 causes processor 704 to perform the process steps described herein; in alternative embodiments, hard-wired circuitry may be used in place of or in combination with software instructions;

[0145] As used herein, the term "non-transitory media" and similar terms refer to any media that store data and / or instructions that cause a machine to operate in a specific manner; such non-transitory media may include non-volatile media and / or volatile media; non-volatile media include, for example, optical or magnetic disks, such as storage device 710; volatile media include dynamic memory, such as main memory 706;

[0146] Among them, common forms of non-transitory media include, for example, floppy disks, diskettes, hard disks, solid-state drives, magnetic tapes or any other magnetic data storage medium, CD-ROMs, any other optical data storage medium, any physical medium having a pattern of holes, RAM, PROM and EPROM, FLASH-EPROM, NVRAM, any other memory chip or cartridge, and network versions thereof;

[0147] Non-transient media are distinct from transmission media but may be used in conjunction with transmission media; transmission media participate in the transmission of information between non-transient media; for example, transmission media include coaxial cables, copper wires, and optical fibers, including the wires that make up bus 702; transmission media may also take the form of sound waves or light waves, such as radio waves and infrared data communications.

[0148] Although the present invention has been described above with reference to various embodiments, it should be understood that many changes and modifications may be made without departing from the scope of the present invention. That is, the methods, systems and devices discussed above are examples. Various configurations may appropriately omit, replace or add various processes or components. For example, in alternative configurations, the method may be performed in an order different from the order described, and / or various components may be added, omitted and / or combined. Moreover, the features described with respect to certain configurations may be combined in various other configurations, such as different aspects and elements of the configurations may be combined in a similar manner. In addition, the elements therein may be updated as the technology develops, i.e., many elements are examples and do not limit the scope of the present disclosure or claims.

[0149] Specific details are given in the specification to provide a thorough understanding of the exemplary configurations including implementations. However, the configurations may be practiced without these specific details. For example, well-known circuits, processes, algorithms, structures, and techniques have been shown without unnecessary details to avoid obscuring the configurations. This description provides only example configurations and does not limit the scope, applicability, or configurations of the claims. On the contrary, the foregoing description of the configurations will provide those skilled in the art with an enabling description for implementing the described techniques. Various changes may be made to the functions and arrangements of the elements without departing from the spirit or scope of the present disclosure.

[0150] In summary, it is intended that the above detailed description is considered to be illustrative rather than restrictive, and it should be understood that the above embodiments should be understood to be only used to illustrate the present invention and not to limit the scope of protection of the present invention. After reading the contents of the present invention, the technician can make various changes or modifications to the present invention, and these equivalent changes and modifications also fall within the scope defined by the claims of the present invention.

Claims

1. An intelligent high-frequency power tester, characterized in that: The tester comprises a front panel, a test module, a communication module, a power module and a housing; The front panel includes a touch screen and a plurality of physical control buttons; the front panel is coupled to the test module in signal communication, displays a display interface for controlling the tester through the touch screen, receives user instructions through the touch screen and the plurality of physical control buttons, and further sends the user instructions to the test module; The test module is configured to test the electrical parameters of the target power-consuming end; the test module is connected to the communication module via a signal input and output end, and is used to send and receive data via the communication module; The communication module is connected to the external device via a signal terminal and is used to send and receive data with the external device; The power supply module is connected to the front panel and the power input terminal of the test module respectively, and is used to provide power; The front panel, test module, communication module and power module are respectively fixedly installed in the housing, and the housing is used to provide position fixation and protection for the above components; The display area in the display interface includes a main parameter area, a secondary parameter area, a status display area, a function key area, a function option area and a page turning area; the layout of the main parameter area, the secondary parameter area, the status display area, the function key area and the function option area allows the user to make custom adjustments, and correctly display the corresponding parameters based on the custom layout, and correctly respond to the corresponding operations of the buttons; The tester forms an adjustment strategy for a dynamic display layout; including calculating the degree of deviation of the measured value of the test parameter, the degree of deviation D i The current test value R of the i-th test parameter i Compared with the conventional value P i The degree of deviation is calculated by the following formula: ； This includes calculating the data density M of the necessary display data for each parameter, namely: M=N / A; Where N is the number of characters to be displayed; A is the standard density value, and the comprehensive display priority P of the i-th test parameter is i Calculate, that is: P i =W i ×D i ×M i ; W i is the weight of the i-th test parameter, M i is the data density of the i-th test parameter. Next, the dynamic adjustment strategy is executed, including the following steps: S100: Determine the priority display parameters according to the comprehensive display priority P i The size of the parameter to be displayed first is determined; the priority display parameters are the parameters with the highest comprehensive display priority; according to the comprehensive display priority P i , determines the order of multiple parameter display pages of the i-th parameter; S200: adjusting the display area, dynamically adjusting the size of each display area according to the comprehensive display priority of the priority display parameter, so that the priority display parameter occupies a larger display space; S300: hierarchical display of information, with priority display parameters displayed in a prominent position, and secondary parameters displayed by page turning or scrolling; S400: Merge display area. When multiple parameters need to be displayed at the same time, or a large amount of data of the same parameter needs to be displayed at the same time, the system uses the Class A integrated interface, the Class B integrated interface or forms a larger integrated display area to display more data. The Class A integrated interface is integrated with the main parameter display area, the secondary parameter display area and the main function status display based on the needs of the display content; The class B integrated interface is integrated with a main parameter display area, a sub-parameter display area, a main function status display area and a page turning display area based on the needs of displaying content.

2. The tester according to claim 1, characterized in that: The test module is configured with at least one processor, a memory, and a test circuit for testing electrical parameters of a target power-consuming terminal; the memory stores machine-readable instructions, and the machine-readable instructions enable the processor to perform one or more of the following operations: Operating the test circuit to perform an electrical parameter test on a target power-consuming terminal, collecting test data, and storing the collected test data in the memory; Provide users with customized display interface settings and store user-defined display interface layouts; Calculate the comprehensive display priority of the data and use it to determine the parameters to be displayed first; Reset the display interface according to the customized display interface layout.

3. The tester according to claim 2, characterized in that: In the test module, the machine-readable instructions stored in the memory further include causing the processor to execute: a solution for generating a recommended display interface layout.

4. The tester according to claim 3, characterized in that: In the display interface, the main parameter area, sub-parameter area, and status display area are merged into one display area under the display interface of the harmonic test, and the display interface of the harmonic test allows display in a harmonic waveform interface or a harmonic bar graph interface to present the harmonic data in the form of a curve or a bar graph.

5. The tester according to claim 4, characterized in that: The test signal frequency range of the tester is 0.5Hz~100kHz, and the bandwidth range of the test signal is 0.5Hz~100kHz.

6. The tester according to claim 5, characterized in that: The test module also includes an integral calculation function; the integral calculation function includes: power integration and current integration; wherein the integration mode is divided into an automatic integration mode and a manual integration mode.

7. The tester according to claim 6, characterized in that: The test module also includes providing a calculation function; the calculation function is used to calculate statistical values ​​of power, voltage, and current; the calculation function includes calculation of the following values: peak factor, four arithmetic operations, and average active power during integration.

8. The tester according to claim 7, characterized in that: The test module also includes an average value calculation function, which is used to calculate the average value of multiple real-time test values ​​obtained within a time period and then display them to the user to avoid affecting the actual display effect due to large fluctuations in real-time test values; The calculation methods of the average value calculation function include: exponential average and linear average.

9. The tester according to claim 8, characterized in that: The tester further comprises a storage module, wherein the storage module comprises a module for storing: Data collected during the test; User-defined display interface layout scheme; The recommended display interface layout solution generated by the testing module.

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