Elevator abnormality management method and management device based on current characteristics

Abstract

The present invention relates to the field of elevator monitoring technology, specifically disclosing a method and device for managing elevator anomalies based on current characteristics. The method is applied to a DC elevator comprising multiple semiconductor buck modules. The method comprises: determining the elevator electrical component to which each semiconductor buck module is connected; obtaining the maximum operating current of each elevator electrical component; determining the maximum output current of each semiconductor buck module based on the maximum operating current; obtaining the real-time output current of each semiconductor buck module; performing anomaly analysis based on the real-time output current and the corresponding maximum output current to generate an anomaly analysis result; and performing corresponding anomaly management operations based on the anomaly analysis result. By utilizing the current monitoring characteristics and switch characteristics of the semiconductor buck module, elevator anomalies can be analyzed and managed without the need for configuring additional monitoring and management devices, thereby reducing the cost of implementing the function, improving elevator safety, and enhancing the reliability of anomaly monitoring.

Description

Technical Field

[0001] The present invention relates to the technical field of elevator monitoring, and in particular to an elevator abnormality management method based on current characteristics and an elevator abnormality management device based on current characteristics. Background Art

[0002] Elevators are an indispensable indoor means of transportation in people's lives. They provide great convenience for people's indoor transportation and are therefore widely used in life. Since elevators run up and down in indoor spaces, their safety has attracted much attention.

[0003] In traditional elevator systems, AC-powered elevators are often used due to the good transmission characteristics of AC power and its universal application. However, with the continuous development of new energy technologies, DC input power supplies are increasingly used in various scenarios in life. At the same time, DC elevators have a better riding experience than AC elevators, so they are gradually being used.

[0004] In a DC elevator, all elevator components are replaced with DC drive components. During operation, a single DC input power supply is used to provide power to all DC drive components through different voltage steps. However, since all DC drive components use the same input power, a malfunction in one DC drive component can affect the entire elevator system, rendering the elevator inoperable. However, existing technologies lack a comprehensive monitoring solution for DC elevator malfunctions. Summary of the Invention

[0005] In order to overcome the above-mentioned technical problems existing in the prior art, an embodiment of the present invention provides an elevator abnormality management method and management device based on current characteristics. By utilizing the current monitoring characteristics and switch characteristics of the semiconductor step-down module, elevator abnormalities are analyzed and managed without the need to configure additional monitoring and management devices, thereby reducing the cost of function implementation, improving the safety of elevator use, and improving the reliability of abnormality monitoring.

[0006] To achieve the above-mentioned objectives, an embodiment of the present invention provides an elevator abnormality management method based on current characteristics, which is applied to a DC elevator, wherein the DC elevator includes multiple semiconductor buck modules. The method includes: determining the elevator electrical components to which each semiconductor buck module is connected; obtaining the maximum operating current of each of the elevator electrical components; determining the maximum output current of each semiconductor buck module based on the maximum operating current; obtaining the real-time output current of each semiconductor buck module; performing abnormality analysis based on the real-time output current and the corresponding maximum output current to generate an abnormality analysis result; and performing corresponding abnormality management operations based on the abnormality analysis result.

[0007] Preferably, the abnormality analysis is performed based on the real-time output current and the corresponding maximum output current to generate the abnormality analysis result, including: judging whether the real-time output current is greater than the maximum output current; if so, determining that the load operating condition of the corresponding semiconductor buck module is abnormal; and generating the corresponding abnormality analysis result according to the semiconductor buck module with the abnormal load operating condition and the real-time output current.

[0008] Preferably, the performing of abnormality analysis based on the real-time output current and the corresponding maximum output current to generate abnormality analysis results also includes: obtaining historical operating data of the DC elevator; obtaining component operating data of each elevator electrical component based on the historical operating data; determining the current characteristics of each elevator electrical component based on the component operating data; in the case of determining that there is an abnormality in the load operating condition of a semiconductor buck module, determining the abnormal component based on the current characteristics and the real-time output current; and generating corresponding abnormality analysis results based on the semiconductor buck module with the abnormal load operating condition and the abnormal component.

[0009] Preferably, performing abnormality analysis based on the real-time output current and the corresponding maximum output current to generate abnormality analysis results also includes: obtaining the current operation instruction of the DC elevator; generating expected current data corresponding to each semiconductor step-down module based on the current operation instruction; determining the expected data characteristics of the expected current data; performing abnormality analysis based on the expected data characteristics and the current characteristics to generate corresponding abnormality analysis results.

[0010] Preferably, the performing of corresponding abnormal management operations based on the abnormal analysis results includes: determining, based on the abnormal analysis results, an abnormal semiconductor buck module with an abnormal load operating condition; judging whether the abnormal semiconductor buck module is connected to necessary safety components; if so, controlling the DC elevator to perform a stop operation, and shutting down the abnormal semiconductor buck module after the DC elevator stops; otherwise, shutting down the abnormal semiconductor buck module.

[0011] Correspondingly, the present invention also provides an elevator abnormality management device based on current characteristics, wherein the DC elevator includes multiple semiconductor step-down modules, and the device includes: a component determination unit for determining the elevator electrical component to which each semiconductor step-down module is connected; a first current acquisition unit for acquiring the maximum operating current of each of the elevator electrical components; a current determination unit for determining the maximum output current of each semiconductor step-down module based on the maximum operating current; a second current acquisition unit for acquiring the real-time output current of each semiconductor step-down module; an abnormality analysis unit for performing abnormality analysis based on the real-time output current and the corresponding maximum output current to generate an abnormality analysis result; and an abnormality management unit for performing corresponding abnormality management operations based on the abnormality analysis result.

[0012] Preferably, the abnormality analysis unit includes: a first judgment module, used to judge whether the real-time output current is greater than the maximum output current; an analysis module, used to determine that there is an abnormality in the load operating condition of the corresponding semiconductor buck module when the real-time output current is greater than the maximum output current; and generate corresponding abnormality analysis results based on the semiconductor buck module with abnormal load operating condition and the real-time output current.

[0013] Preferably, the abnormality analysis unit also includes: a first data acquisition module for acquiring historical operating data of the DC elevator; a second data acquisition module for acquiring component operating data of each elevator electrical component based on the historical operating data; a feature determination module for determining the current feature of each elevator electrical component based on the component operating data; an abnormal component determination module for determining the abnormal component based on the current feature and the real-time output current when it is determined that there is an abnormality in the load operating condition of the semiconductor buck module; and an analysis module for generating corresponding abnormality analysis results based on the semiconductor buck module with abnormal load operating condition and the abnormal component.

[0014] Preferably, the abnormality analysis unit also includes: an instruction acquisition module for acquiring the current operating instruction of the DC elevator; an expected data generation module for generating expected current data corresponding to each semiconductor step-down module based on the current operating instruction; a feature determination module for determining the expected data feature of the expected current data; and an analysis module for performing abnormality analysis based on the expected data feature and the current feature to generate a corresponding abnormality analysis result.

[0015] Preferably, the abnormality management unit includes: an abnormality determination module, which is used to determine, based on the abnormality analysis result, that there is an abnormal semiconductor buck module with an abnormal load operating condition; a second judgment module, which is used to judge whether the abnormal semiconductor buck module is connected to necessary safety components; a first management module, which is used to control the DC elevator to perform a stop operation when the necessary safety components are connected, and to shut down the abnormal semiconductor buck module after the DC elevator stops; and a second management module, which is used to shut down the abnormal semiconductor buck module when the necessary safety components are not connected.

[0016] The technical solution provided by the present invention has at least the following technical effects:

[0017] By using a semiconductor step-down module as a step-down device for the DC power supply based on the switching power supply used in traditional elevators, the current monitoring characteristics and switching characteristics of the semiconductor step-down module can be fully utilized to monitor abnormal operation of the elevator. Abnormal conditions in the operation of the elevator can be discovered in a timely manner, and corresponding control measures can be taken in a timely manner without the need to configure additional monitoring devices, thereby reducing the cost of function implementation and improving the safety of elevator use.

[0018] Other features and advantages of the embodiments of the present invention will be described in detail in the subsequent detailed description. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The accompanying drawings are used to provide a further understanding of the embodiments of the present invention and constitute a part of the specification. Together with the following detailed description, they are used to explain the embodiments of the present invention, but do not constitute a limitation of the embodiments of the present invention. In the accompanying drawings:

[0020] Figure 1 This is a specific implementation flow chart of the elevator abnormality management method based on current characteristics provided by an embodiment of the present invention;

[0021] Figure 2 It is a structural diagram of an elevator abnormality management device based on current characteristics provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0022] The following describes the specific implementation of the embodiment of the present invention in detail with reference to the accompanying drawings. It should be understood that the specific implementation described herein is only used to illustrate and explain the embodiment of the present invention and is not used to limit the embodiment of the present invention.

[0023] The terms "system" and "network" in the embodiments of the present invention can be used interchangeably. "Multiple" refers to two or more. In view of this, "multiple" can also be understood as "at least two" in the embodiments of the present invention. "And / or" describes the association relationship of associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / ", unless otherwise specified, generally indicates that the previous and next associated objects are in an "or" relationship. In addition, it should be understood that in the description of the embodiments of the present invention, words such as "first" and "second" are only used to distinguish the purpose of description, and cannot be understood as indicating or implying relative importance, nor can they be understood as indicating or implying order.

[0024] See Figure 1 An embodiment of the present invention provides an elevator abnormality management method based on current characteristics, which is applied to a DC elevator. The DC elevator includes multiple semiconductor step-down modules. The method includes:

[0025] S10) determining the elevator electrical components to which each semiconductor step-down module is connected;

[0026] S20) obtaining the maximum operating current of each of the elevator electrical components;

[0027] S30) determining a maximum output current of each semiconductor step-down module based on the maximum operating current;

[0028] S40) obtaining the real-time output current of each semiconductor step-down module;

[0029] S50) performing an abnormality analysis based on the real-time output current and the corresponding maximum output current to generate an abnormality analysis result;

[0030] S60) Executing corresponding abnormality management operations based on the abnormality analysis result.

[0031] In one possible implementation, an embodiment of the present invention is applied to a DC elevator powered by a DC input power supply. Multiple semiconductor step-down modules are configured within the elevator to convert this DC input power supply into multiple low-voltage DC power supplies to meet the needs of other low-voltage-driven elevator electrical components within the elevator. During abnormality management, the elevator electrical components connected to each semiconductor step-down module are first determined, and the maximum operating current of each elevator electrical component is obtained. Based on this maximum operating current, the maximum output current of each semiconductor step-down module can be determined. If the output current of a semiconductor step-down module exceeds this maximum output current, the elevator electrical component it is connected to must be abnormal.

[0032] Therefore, by obtaining the real-time output current of each semiconductor step-down module in real time and performing abnormality analysis based on the above-mentioned maximum output current, it is possible to analyze whether there is any abnormality in the operation of each electrical component of the current elevator. If so, the corresponding abnormality management operation is immediately executed.

[0033] In an embodiment of the present invention, by using the current data throughout the entire elevator system in a DC elevator, the operating status of each elevator electrical component in the DC elevator is analyzed to determine whether there are abnormal components in the DC elevator. Once an abnormal component is found, the corresponding abnormal management operation is immediately executed, effectively improving the safety of elevator operation.

[0034] In an embodiment of the present invention, the abnormality analysis is performed based on the real-time output current and the corresponding maximum output current to generate the abnormality analysis result, including: determining whether the real-time output current is greater than the maximum output current; if so, determining that the load operating condition of the corresponding semiconductor buck module is abnormal; and generating a corresponding abnormality analysis result based on the semiconductor buck module with the abnormal load operating condition and the real-time output current.

[0035] In the embodiment of the present invention, by monitoring the current data flowing through each semiconductor step-down module, abnormal operating conditions in the elevator can be discovered, thereby improving the safety of elevator operation.

[0036] However, in actual applications, simply comparing current values ​​can lead to deviations. For example, if the normal operating current of the first component of an IGBT is 1A and the maximum operating current is 2A, and the normal operating current of the second component is 0.8A and the maximum operating current is 1.5A, then at a certain moment, the maximum current of the second component reaches 1.7A, indicating that the component has experienced an abnormality. However, the maximum current of the IGBT at this time may not have reached the aforementioned threshold, so the abnormality will not be detected. This reduces the accuracy of abnormality monitoring and fails to meet actual needs.

[0037] In order to solve the above technical problems, in an embodiment of the present invention, the abnormality analysis is performed based on the real-time output current and the corresponding maximum output current to generate the abnormality analysis result, which also includes: obtaining the historical operation data of the DC elevator; obtaining the component operation data of each elevator electrical component based on the historical operation data; determining the current characteristics of each elevator electrical component based on the component operation data; in the case of determining that there is an abnormality in the load operation condition of the semiconductor buck module, determining the abnormal component according to the current characteristics and the real-time output current; and generating corresponding abnormality analysis results according to the semiconductor buck module with the abnormal load operation condition and the abnormal component.

[0038] In one possible implementation, since the operation of each elevator electrical component in a DC elevator is independent, its current characteristics deviate from the current characteristics of other elevator electrical components. First, the historical operation data of the DC elevator is obtained, and the component operation data of each elevator electrical component is extracted therefrom. The current characteristics of each elevator electrical component during normal operation can be extracted through the component operation data. The current characteristics include but are not limited to current period characteristics, current intensity characteristics, current fluctuation characteristics, etc. For example, the current intensity characteristics, peak and valley characteristics, duration characteristics, etc. are extracted and monitored on a daily basis.

[0039] In one embodiment, when it is determined that a semiconductor buck module has an abnormal load operating condition, such as when its real-time output current is greater than the maximum output current, the abnormal component is determined to have an abnormality based on the current characteristics and the actual output current. Specifically, at a certain moment, if an abnormal load operating condition of a semiconductor buck module is monitored, the output current characteristics are immediately analyzed. Based on the current time period characteristics of each elevator electrical component under its load, the time period in which the current difference occurs can be analyzed. Then, based on other current characteristics of the elevator electrical components operating within this time period, the abnormal component is determined to have an abnormality. At this time, a corresponding abnormality analysis result is generated based on the abnormal component, such as the name of the semiconductor buck module, the name / number of the abnormal component, and the abnormal data.

[0040] In the embodiment of the present invention, by utilizing the current characteristic differences of each elevator electrical component during the operation of the elevator, the current data during the operation of the elevator is monitored in real time, and abnormal conditions are discovered in a timely manner, and the abnormal components with abnormalities are quickly located, which greatly improves the accuracy of abnormality analysis and provides technicians with accurate abnormality positioning, which is beneficial to subsequent elevator maintenance processing, improves work efficiency, and improves the safety of elevator use.

[0041] However, in actual application, the above technical solution is still subject to the need to wait until the semiconductor buck module monitors a current value greater than the maximum output current. In some cases, although there is an abnormality in the elevator electrical components loaded by the semiconductor buck module, the abnormal current change amplitude is small, and therefore the abnormality of the output current of the semiconductor buck module cannot be monitored.

[0042] In an embodiment of the present invention, performing an abnormality analysis based on the real-time output current and the corresponding maximum output current to generate an abnormality analysis result also includes: obtaining a current operating instruction of the DC elevator; generating expected current data corresponding to each semiconductor step-down module based on the current operating instruction; determining an expected data feature of the expected current data; performing an abnormality analysis based on the expected data feature and the current feature to generate a corresponding abnormality analysis result.

[0043] In one possible embodiment, during elevator operation, the current operating instruction of the DC elevator is obtained, and all elevator electrical components that need to be operated are analyzed based on the current operating instruction, including the elevator electrical components that need to be operated for this elevator operation and the elevator electrical components that maintain normal operation. Then, the expected current data corresponding to each semiconductor buck module is further determined. That is, based on the normal operating current data of all elevator electrical components that need to be operated corresponding to the current operating instruction, the expected current data under each semiconductor buck module can be calculated, and then the expected data characteristics of the expected current data are extracted. At this time, the current characteristics of each semiconductor buck module under the current operating instruction are monitored and analyzed for abnormalities. Once it is found that the current characteristics of any semiconductor buck module do not match the expected data characteristics, it can be determined that the elevator electrical component it is loading may have an abnormality, and the corresponding abnormality analysis result is immediately generated.

[0044] In an embodiment of the present invention, by determining the theoretically normal operating current data of the elevator electrical components that need to be mobilized for each operation instruction during the operation of the elevator, the output current data of each semiconductor step-down module is simulated. Furthermore, by comparing and analyzing the data features instead of analyzing the current values ​​themselves, it is possible to effectively avoid misidentification caused by small data deviations, and at the same time, it is possible to effectively analyze small abnormal features and promptly discover abnormal components with abnormalities, effectively overcoming the technical problem that the current value in the semiconductor step-down module must reach the maximum output current before it can respond, thereby improving the accuracy and response sensitivity of abnormality analysis and meeting actual needs.

[0045] In an embodiment of the present invention, the corresponding abnormal management operation is performed based on the abnormal analysis result, including: determining an abnormal semiconductor buck module with an abnormal load operating condition based on the abnormal analysis result; judging whether the abnormal semiconductor buck module is connected to necessary safety components; if so, controlling the DC elevator to perform a stop operation, and after the DC elevator stops, shutting down the abnormal semiconductor buck module; otherwise, shutting down the abnormal semiconductor buck module.

[0046] In one possible implementation, after determining that an elevator has an abnormality, corresponding abnormality management operations need to be performed immediately. However, elevators are tools for operating in indoor spaces, and directly shutting down the semiconductor buck module may lead to safety risks. Therefore, when performing abnormality management, first determine whether there is an abnormal semiconductor buck module with an abnormal load operating condition, and then determine whether the abnormal semiconductor buck module is connected to the necessary safety components. If so, control the DC elevator to stop the elevator and control the DC elevator to stop at the nearest floor to release the passengers in the elevator car. After the DC elevator stops safely, shut down the semiconductor buck module to protect the safety of the remaining elevator electrical components and avoid larger abnormalities or safety accidents.

[0047] In an embodiment of the present invention, different abnormal control measures are adopted according to the safety of passengers in the elevator car to prioritize the personal safety of passengers. On this basis, abnormal management measures are quickly taken to ensure the safety of other elevator electrical components, avoid the occurrence of safety accidents, and improve the safety of elevator use.

[0048] The following describes an elevator abnormality management device based on current characteristics provided by an embodiment of the present invention with reference to the accompanying drawings.

[0049] See Figure 2 Based on the same inventive concept, an embodiment of the present invention provides an elevator abnormality management device based on current characteristics. The DC elevator includes multiple semiconductor step-down modules. The device includes: a component determination unit, used to determine the elevator electrical component connected to each semiconductor step-down module; a first current acquisition unit, used to obtain the maximum operating current of each of the elevator electrical components; a current determination unit, used to determine the maximum output current of each semiconductor step-down module based on the maximum operating current; a second current acquisition unit, used to obtain the real-time output current of each semiconductor step-down module; an abnormality analysis unit, used to perform abnormality analysis based on the real-time output current and the corresponding maximum output current to generate an abnormality analysis result; and an abnormality management unit, used to perform corresponding abnormality management operations based on the abnormality analysis result.

[0050] In an embodiment of the present invention, the abnormality analysis unit includes: a first judgment module, used to judge whether the real-time output current is greater than the maximum output current; an analysis module, used to determine that there is an abnormality in the load operating condition of the corresponding semiconductor buck module when the real-time output current is greater than the maximum output current; and generate corresponding abnormality analysis results based on the semiconductor buck module with abnormal load operating condition and the real-time output current.

[0051] In an embodiment of the present invention, the abnormality analysis unit also includes: a first data acquisition module for acquiring historical operating data of the DC elevator; a second data acquisition module for acquiring component operating data of each elevator electrical component based on the historical operating data; a feature determination module for determining the current feature of each elevator electrical component based on the component operating data; an abnormal component determination module for determining the abnormal component based on the current feature and the real-time output current when it is determined that there is an abnormality in the load operating condition of the semiconductor buck module; and an analysis module for generating corresponding abnormality analysis results based on the semiconductor buck module with abnormal load operating condition and the abnormal component.

[0052] In an embodiment of the present invention, the abnormality analysis unit further includes: an instruction acquisition module for acquiring the current operating instruction of the DC elevator; an expected data generation module for generating expected current data corresponding to each semiconductor step-down module based on the current operating instruction; a feature determination module for determining the expected data feature of the expected current data; and an analysis module for performing abnormality analysis based on the expected data feature and the current feature to generate a corresponding abnormality analysis result.

[0053] In an embodiment of the present invention, the abnormality management unit includes: an abnormality determination module, which is used to determine, based on the abnormality analysis result, that there is an abnormal semiconductor buck module with an abnormal load operating condition; a second judgment module, which is used to judge whether the abnormal semiconductor buck module is connected to necessary safety components; a first management module, which is used to control the DC elevator to perform a stop operation when the necessary safety components are connected, and to shut down the abnormal semiconductor buck module after the DC elevator stops; and a second management module, which is used to shut down the abnormal semiconductor buck module when the necessary safety components are not connected.

[0054] The above describes in detail the optional implementation methods of the embodiments of the present invention in conjunction with the accompanying drawings. However, the embodiments of the present invention are not limited to the specific details in the above implementation methods. Within the technical concept of the embodiments of the present invention, various simple modifications can be made to the technical solutions of the embodiments of the present invention, and these simple modifications all fall within the scope of protection of the embodiments of the present invention.

[0055] It should also be noted that the various specific technical features described in the above specific embodiments can be combined in any appropriate manner without contradiction. To avoid unnecessary repetition, the embodiments of the present invention will not further describe various possible combinations.

[0056] Those skilled in the art will understand that all or part of the steps in the above-mentioned embodiments can be implemented by instructing the relevant hardware through a program. The program is stored in a storage medium and includes a number of instructions for causing a single-chip microcomputer, chip, or processor to execute all or part of the steps in the methods described in the various embodiments of the present application. The aforementioned storage medium includes various media that can store program code, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0057] In addition, various implementations of the embodiments of the present invention may be arbitrarily combined, and as long as they do not violate the concept of the embodiments of the present invention, they should also be regarded as the contents disclosed in the embodiments of the present invention.

Claims

1. A method for managing elevator abnormalities based on current characteristics, applied to DC elevators, characterized in that: The DC elevator includes a plurality of semiconductor step-down modules, and the method includes: Determine the elevator electrical components to which each semiconductor step-down module is connected; Obtaining the maximum operating current of each of the elevator electrical components; Determining the maximum output current of each semiconductor buck module based on the maximum operating current; Get the real-time output current of each semiconductor step-down module; Performing an abnormality analysis based on the real-time output current and the corresponding maximum output current to generate an abnormality analysis result; Execute corresponding exception management operations based on the exception analysis results.

2. The method according to claim 1, characterized in that The performing abnormality analysis based on the real-time output current and the corresponding maximum output current to generate an abnormality analysis result includes: Determining whether the real-time output current is greater than the maximum output current; If so, it is determined that the load operating condition of the corresponding semiconductor step-down module is abnormal; A corresponding abnormality analysis result is generated according to the semiconductor buck module with abnormal load operating conditions and the real-time output current.

3. The method according to claim 1, characterized in that The performing of abnormality analysis based on the real-time output current and the corresponding maximum output current to generate an abnormality analysis result further includes: Obtaining historical operating data of the DC elevator; acquiring component operation data of each elevator electrical component based on the historical operation data; determining a current signature of each elevator electrical component based on the component operating data; When it is determined that the load operating condition of the semiconductor step-down module is abnormal, determining the abnormal component according to the current characteristics and the real-time output current; Corresponding abnormality analysis results are generated according to the semiconductor step-down module and the abnormal component having abnormal load operating conditions.

4. The method according to claim 3, characterized in that The performing of abnormality analysis based on the real-time output current and the corresponding maximum output current to generate an abnormality analysis result further includes: Obtaining the current operation instruction of the DC elevator; generating expected current data corresponding to each semiconductor buck module based on the current operation instruction; determining expected data characteristics of the expected current data; Anomaly analysis is performed based on the expected data feature and the current feature to generate a corresponding abnormality analysis result.

5. The method according to claim 1, wherein The performing corresponding exception management operations based on the exception analysis results includes: Determining an abnormal semiconductor buck module having an abnormal load operating condition based on the abnormality analysis result; Determining whether the abnormal semiconductor step-down module is connected to necessary safety components; If so, controlling the DC elevator to stop, and after the DC elevator stops, shutting down the abnormal semiconductor step-down module; Otherwise, the abnormal semiconductor step-down module is turned off.

6. An elevator abnormality management device based on current characteristics, applied to DC elevators, characterized in that: The DC elevator includes a plurality of semiconductor step-down modules, and the device includes: a component determination unit, configured to determine the elevator electrical component to which each semiconductor step-down module is connected; a first current acquisition unit, configured to acquire the maximum operating current of each of the elevator electrical components; a current determining unit, configured to determine a maximum output current of each semiconductor buck module based on the maximum operating current; A second current acquisition unit is used to acquire the real-time output current of each semiconductor step-down module; an abnormality analysis unit, configured to perform abnormality analysis based on the real-time output current and the corresponding maximum output current, and generate an abnormality analysis result; The exception management unit is used to perform corresponding exception management operations based on the exception analysis result.

7. The device according to claim 6, characterized in that The abnormality analysis unit includes: A first judging module, configured to judge whether the real-time output current is greater than the maximum output current; An analysis module is configured to determine, when the real-time output current is greater than the maximum output current, that there is an abnormality in the load operating condition of the corresponding semiconductor buck module; and generate a corresponding abnormality analysis result based on the semiconductor buck module with the abnormal load operating condition and the real-time output current.

8. The device according to claim 6, characterized in that The abnormality analysis unit further includes: A first data acquisition module is used to acquire historical operation data of the DC elevator; a second data acquisition module, configured to acquire component operation data of each elevator electrical component based on the historical operation data; a characteristic determination module for determining a current characteristic of each elevator electrical component based on the component operation data; an abnormal component determining module, configured to determine the abnormal component according to the current characteristics and the real-time output current when it is determined that the load operating condition of the semiconductor step-down module is abnormal; The analysis module is used to generate corresponding abnormality analysis results according to the semiconductor step-down module and the abnormal component with abnormal load operating conditions.

9. The device according to claim 8, characterized in that The abnormality analysis unit further includes: An instruction acquisition module, used to acquire the current operation instruction of the DC elevator; an expected data generating module, configured to generate expected current data corresponding to each semiconductor step-down module based on the current operation instruction; a feature determination module, configured to determine expected data features of the expected current data; An analysis module is configured to perform an anomaly analysis based on the expected data feature and the current feature, and generate a corresponding anomaly analysis result.

10. The device according to claim 6, characterized in that The exception management unit includes: an abnormality determination module, configured to determine, based on the abnormality analysis result, that an abnormal semiconductor buck module exists in an abnormal load operating condition; A second judgment module is used to judge whether the abnormal semiconductor step-down module is connected to a necessary safety component; a first management module, configured to control the DC elevator to stop when necessary safety components are connected, and to shut down the abnormal semiconductor step-down module after the DC elevator stops; The second management module is configured to shut down the abnormal semiconductor step-down module when necessary safety components are not connected.

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