A test device and a method for transmitting test signals.

Abstract

This application belongs to the field of electronic equipment technology, specifically disclosing a test device and a method for transmitting test signals. The test device includes: a controller, an adjustable power supply module, and a level conversion module; the test signal port of the controller is connected to a first-side signal port of the level conversion module, and the test signal port of the device under test (DUT) is connected to a second-side signal port of the level conversion module; the voltage control port of the controller is connected to the controlled end of the adjustable power supply module, and the power supply output port of the adjustable power supply module is connected to the second-side power supply port of the level conversion module; the controller is used to determine and output a voltage control signal to the adjustable power supply module based on a level indication signal. By setting a level conversion module between the controller and the DUT, and adjusting the power supply voltage on the corresponding side of the level conversion module according to the DUT's level standard, the test device is adaptable to testing DUTs under various level standards, effectively improving compatibility.

Description

Technical Field

[0001] This application belongs to the field of electronic equipment technology, and more specifically, relates to a test device and a method for transmitting test signals. Background Technology

[0002] In the testing equipment and instrumentation industry, a single testing device is often used to test different types or models of products (devices under test). Different devices under test require different signal levels; for example, the testing device might output a 3.3V signal, but the device under test might require 1.2V or 1.8V, or other levels. Conventional designs require an adapter board to convert the 3.3V signal level to 1.2V or 1.8V. When multiple signals are required, the adapter board design becomes very complex, necessitating a redesign of the 1.2V or 1.8V power supply, further complicating the design and increasing the cost of the adapter board. Summary of the Invention

[0003] In view of the shortcomings of the prior art, the purpose of this application is to effectively improve the compatibility of testing equipment.

[0004] To achieve the above objectives, in a first aspect, this application provides a testing device, comprising: a controller, an adjustable power supply module, and a level conversion module;

[0005] The level conversion module has a first-side power port, a second-side power port, a first-side signal port, and a second-side signal port. The level standard of the first-side signal port matches the voltage of the first-side power port, and the level standard of the second-side signal port matches the voltage of the second-side power port.

[0006] The test signal port of the controller is connected to the first signal port of the level conversion module. The voltage of the first power port of the level conversion module is the same as the power supply voltage of the controller. The test signal port of the device under test is connected to the second signal port of the level conversion module.

[0007] The voltage control port of the controller is connected to the controlled terminal of the adjustable power supply module, and the power supply output port of the adjustable power supply module is connected to the second power supply port of the level conversion module.

[0008] The controller is used to output a voltage control signal to the adjustable power supply module through the voltage control port based on the level indication signal. That is, the controller can obtain the level indication signal, determine the voltage control signal based on the level indication signal, and output the voltage control signal to the adjustable power supply module through the voltage control port. The level indication signal is used to indicate the upper limit of the logic high level range in the level standard of the device under test, and the voltage control signal is used to indicate that the supply voltage of the adjustable power supply module is consistent with the level standard of the device under test.

[0009] The adjustable power supply module is used to adjust the supply voltage based on a voltage control signal;

[0010] The level conversion module is used to receive signals from either signal port, perform signal level conversion, and output the level-converted signal from the other signal port.

[0011] In one possible implementation, the level indication signal is a reference voltage signal, and the reference voltage represented by the reference voltage signal has a preset ratio with the upper limit of the logic high level range in the level standard of the device under test;

[0012] The controller is used to determine the upper limit of the logic high level range in the level standard of the device under test based on the reference voltage and the preset ratio;

[0013] The voltage control signal is determined based on the upper limit of the logic high level range in the voltage level standard of the device under test.

[0014] In one possible implementation, the test equipment further includes a reference voltage signal feedback module, which outputs a reference voltage signal to the controller.

[0015] In one possible implementation, the reference voltage signal feedback module includes: an analog-to-digital converter (ADC) unit and a first resistor. The analog input terminal of the ADC unit serves as the signal acquisition port of the reference voltage signal feedback module, and the digital output terminal of the ADC unit serves as the voltage feedback port of the reference voltage signal feedback module. The first terminal of the first resistor is connected to the power supply, and the second terminal of the first resistor is connected to the analog input terminal of the ADC unit.

[0016] The testing equipment is also equipped with a second resistor, the first end of which is connected to the second end of the first resistor, and the second end of the second resistor is grounded.

[0017] The ratio between the resistance value of the first resistor and the resistance value of the second resistor is determined based on the supply voltage and reference voltage at the first terminal of the first resistor.

[0018] Optionally, the test equipment carries a second resistor via an adapter plate.

[0019] In one possible implementation, the reference voltage signal feedback module is specifically a photoelectric conversion module. The photoelectric conversion module is used to receive the target optical signal sent by the device under test and convert the target optical signal into a reference voltage signal. The target optical signal is used to indicate the level standard of the device under test.

[0020] In one possible implementation, a first switch is configured between the test signal port of the controller and the first-side signal port of the level conversion module, and a second switch is configured between the test signal port of the controller and the test signal port of the device under test.

[0021] The controller is also used to control the first switch to open and the second switch to close when the upper limit of the logic high level range in the level standard of the device under test is the same as the upper limit of the logic high level range in the level standard of the controller.

[0022] Alternatively, if the upper limit of the logic high level range in the level standard of the device under test is different from the upper limit of the logic high level range in the level standard of the controller, the first switch is closed and the second switch is opened.

[0023] Secondly, this application provides a method for transmitting a test signal, applied to the test apparatus described in the first aspect or any possible implementation thereof, comprising:

[0024] Obtain the level indication signal;

[0025] Based on the level indication signal, a voltage control signal is generated;

[0026] If it is determined that the adjustable power supply module has completed voltage regulation, a test signal is sent.

[0027] In one possible implementation, the level indication signal is a reference voltage signal, and the reference voltage represented by the reference voltage signal has a preset ratio with the upper limit of the logic high level range in the level standard of the device under test;

[0028] Based on the level indication signal, a voltage control signal is generated, including:

[0029] Based on the reference voltage and preset ratio, determine the upper limit of the logic high level range in the level standard of the device under test;

[0030] A voltage control signal is generated based on the upper limit of the logic high level range in the voltage level standard of the device under test.

[0031] In one possible implementation, determining that the adjustable power supply module performs voltage regulation includes:

[0032] Monitor the time interval between the current moment and the moment the voltage control signal is generated;

[0033] If the time interval is greater than or equal to the preset delay, it is determined that the adjustable power supply module has completed voltage regulation.

[0034] In one possible implementation, determining that the adjustable power supply module performs voltage regulation includes:

[0035] Monitor the voltage at the power output port of the adjustable power module;

[0036] If the voltage at the power output port of the adjustable power supply module is the same as the upper limit of the logic high level range in the level standard of the device under test, it is determined that the adjustable power supply module has completed voltage regulation.

[0037] In one possible implementation, after sending the test signal, the following is also included:

[0038] Receive test feedback signals sent by the device under test.

[0039] It is understandable that the beneficial effects of the second aspect mentioned above can be found in the relevant descriptions of the first aspect mentioned above, and will not be repeated here.

[0040] Overall, the technical solutions conceived in this application have the following beneficial effects compared with the prior art:

[0041] By setting up a level conversion module between the controller and the device under test (DUT), and adjusting the power supply voltage on the corresponding side of the level conversion module according to the DUT's level standard, the test equipment can adaptively adjust the output level according to the DUT's level requirements, adapting to test DUTs under various level standards and effectively improving the compatibility of the test equipment. Attached Figure Description

[0042] Figure 1 This is a schematic diagram illustrating the testing of the device under test using a testing device, as provided in an embodiment of this application.

[0043] Figure 2 This is a schematic diagram illustrating the working principle of the level conversion chip provided in the embodiments of this application;

[0044] Figure 3 This is a schematic diagram of a test device equipped with a reference voltage signal feedback module, provided in an embodiment of this application, for acquiring a reference voltage.

[0045] Figure 4 This is a schematic diagram illustrating the working principle of a reference voltage signal feedback module provided in an embodiment of this application;

[0046] Figure 5 This is a flowchart illustrating the test signal transmission method provided in the embodiments of this application.

[0047] In all the accompanying drawings, the same reference numerals are used to denote the same elements or structures, wherein:

[0048] 10: Controller; 11: Test signal port of the controller; 12: Voltage control port of the controller; 20: Adjustable power supply module; 21: Controlled terminal of the adjustable power supply module; 22: Power supply output port of the adjustable power supply module; 30: Level conversion module; 31: First-side signal port of the level conversion module; 32: First-side power supply port of the level conversion module; 33: Second-side signal port of the level conversion module; 34: Second-side power supply port of the level conversion module; 40: Reference voltage signal feedback module; 41: Signal acquisition port of the reference voltage signal feedback module; 42: Voltage feedback port of the reference voltage signal feedback module; 50: Device under test; 51: Test signal port of the device under test; 52: Optical signal output port of the device under test. Detailed Implementation

[0049] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0050] The terms "first" and "second," etc., used in the specification and claims herein are used to distinguish different objects, not to describe a specific order of objects. For example, "first-side power port" and "second-side power port," etc., are used to distinguish power ports on different sides, not to describe a specific order of power ports.

[0051] In the embodiments of this application, the terms "exemplary" or "for example" are used to indicate that something is an example, illustration, or description. Any embodiment or design that is described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design. Specifically, the use of the terms "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0052] In the description of the embodiments of this application, unless otherwise stated, "multiple" means two or more, for example, multiple processing units means two or more processing units, multiple elements means two or more elements, etc.

[0053] The embodiments of this application are described below with reference to the accompanying drawings.

[0054] Figure 1 This is a schematic diagram illustrating the testing of the device under test using a testing device, as provided in an embodiment of this application. Figure 1 As shown, the test equipment includes: a controller 10 (which can be an MCU or an FPGA), an adjustable power supply module 20, and a level conversion module 30;

[0055] The level conversion module 30 has a first-side power port 32, a second-side power port 34, a first-side signal port 31, and a second-side signal port 33. The level standard of the first-side signal port 31 is consistent with the voltage of the first-side power port 32, and the level standard of the second-side signal port 33 is consistent with the voltage of the second-side power port 34.

[0056] The test signal port 11 of the controller 10 is connected to the first signal port 31 of the level conversion module 30. The voltage of the first power supply port 32 of the level conversion module 30 is the same as the power supply voltage of the controller 10. The test signal port 51 of the device under test 50 is connected to the second signal port 33 of the level conversion module 30.

[0057] The voltage control port 12 of the controller 10 is connected to the controlled terminal 21 of the adjustable power module 20, and the power output port 22 of the adjustable power module 20 is connected to the second power port 34 of the level conversion module 30.

[0058] The controller 10 is used to acquire the level indication signal, determine the voltage control signal based on the level indication signal, and output the voltage control signal to the adjustable power module 20 through the voltage control port 12. The level indication signal is used to indicate the upper limit of the logic high level range in the level standard of the device under test 50, and the voltage control signal is used to indicate that the power supply voltage of the adjustable power module 20 is consistent with the level standard of the device under test 50.

[0059] The adjustable power supply module 20 is used to adjust the supply voltage based on a voltage control signal;

[0060] The level conversion module 30 is used to receive signals from either signal port, perform signal level conversion, and output the level-converted signal from the other signal port.

[0061] This section explains the concept of voltage level standards, which are specifications for logic high (usually represented as "1") and logic low (usually represented as "0") voltage levels defined in digital circuits.

[0062] For example, the TTL (Transistor-Transistor Logic) level standard typically defines the TTL logic high level as 2V to 5V and the TTL logic low level as 0V to 0.8V. The power supply voltage of a TTL circuit is usually 5V, and the power supply voltage (5V) of a TTL circuit is the same as the upper limit (5V) of the TTL logic high level range.

[0063] For example, the CMOS (Complementary Metal-Oxide-Semiconductor) level standard typically defines the CMOS logic high level as between 3.5V and 5V, and the CMOS logic low level as between 0V and 1.5V. The power supply voltage of the CMOS circuit is usually 5V, and the power supply voltage (5V) of the CMOS circuit is the same as the upper limit (5V) of the CMOS logic high level range.

[0064] For example, the LVTTL (Low Voltage TTL) level standard typically defines the LVTTL logic high level as 2V to 3.3V and the LVTTL logic low level as 0V to 0.8V. The power supply voltage of LVTTL circuits is usually 3.3V, and the power supply voltage (3.3V) of LVTTL circuits is the same as the upper limit of the LVTTL logic high level range (3.3V).

[0065] This section explains the meaning of "the level standard of the first (or second) side signal port matches the voltage of the first (or second) side power port." For a given level standard, if the upper limit of the logic high-level range in that level standard is the same as the voltage of the power port, then that level standard is considered to match the voltage of the power port. Similarly, "the supply voltage of the adjustable power module matches the level standard of the device under test" means that the supply voltage of the adjustable power module is the same as the upper limit of the logic high-level range in the level standard of the device under test.

[0066] For example, if the level standard of the first-side signal port is the TTL level standard, and the upper limit of the logic high level range in the TTL level standard is 5V, then if the voltage of the first-side power supply port is 5V, it is considered that the level standard of the first-side signal port matches the voltage of the first-side power supply port.

[0067] For example, if the level standard of the second-side signal port is the LVTTL level standard, and the upper limit of the logic high level range in the LVTTL level standard is 3.3V, then if the voltage of the second-side power supply port is 3.3V, it is considered that the level standard of the second-side signal port matches the voltage of the second-side power supply port.

[0068] An illustrative example is provided here regarding how to ensure that the voltage at the first-side power port of the level conversion module is the same as the power supply voltage of the controller. For example, the same power supply can be used to power the first-side power ports of both the controller and the level conversion module. Alternatively, two power supplies can be used to power the first-side power ports of the controller and the level conversion module respectively, but the power supply voltages output by the two power supplies must remain the same.

[0069] An example is provided here of how the controller acquires the level indication signal.

[0070] For example, the device under test can send a specific optical signal carrying the upper limit of the logic high level range to the test equipment. Correspondingly, the test equipment can be equipped with a photoelectric sensor. The photoelectric sensor detects the specific optical signal, performs photoelectric conversion, generates a level indication signal (electrical signal), and provides it to the controller. After the controller obtains the level indication signal, it can determine the upper limit of the logic high level range in the level standard of the device under test.

[0071] This section provides an illustrative example of an adjustable power supply module. The adjustable power supply module can provide adjustable DC voltage and current output. It has a corresponding command set, which allows control over the output of a specified supply voltage. After acquiring the level indication signal, the controller can determine the upper limit of the logic high-level range in the level standard of the device under test (DUT). Then, according to the command set of the adjustable power supply module, the controller can generate a voltage control signal to instruct the adjustable power supply module to adjust the supply voltage to the upper limit of the logic high-level range in the DUT's level standard, ensuring that the supply voltage of the adjustable power supply module matches the level standard of the DUT.

[0072] The above-described method of receiving a signal from one signal port, performing signal level conversion, and outputting the converted signal from the other signal port is illustrated here.

[0073] For example, when the controller sends a signal (such as SPI / I2C / GPIO) through the test signal port, the level conversion module can receive the signal from the first signal port, perform signal level conversion, and output the level-converted signal from the second signal port.

[0074] For example, when the device under test sends a signal through the test signal port, the level conversion module can receive the signal from the second signal port, perform signal level conversion, and output the level-converted signal from the first signal port.

[0075] It is evident that bidirectional communication is possible between the testing equipment and the device under test during the testing process.

[0076] The implementation of the level conversion module is illustrated here. Specifically, the level conversion module can use a bidirectional level conversion chip (such as the TXS0104EPWR chip or the TXB0304 chip). The chip automatically identifies the conversion direction by detecting the drive current of the external port. The chip can convert the level in two directions, that is, from the low voltage domain to the high voltage domain, and from the high voltage domain to the low voltage domain.

[0077] For example, Figure 2 This is a schematic diagram illustrating the working principle of the level conversion chip provided in the embodiments of this application, as shown below. Figure 2As shown, taking the transmission of a signal from the test device to the device under test as an example, VCCI represents the upper limit of the logic high level range in the controller's level standard (usually this upper limit is equal to the controller's power supply voltage), and VCCO represents the upper limit of the logic high level range in the level standard of the device under test. Figure 2 The signal input can come from the controller. For signals input to the level conversion chip, the upper limit of the logic high level range is VCCI, and the lower limit of the logic high level range is 0V. Figure 2 The signal can be output to the device under test (DUT). For the signal output from the level conversion chip, the upper limit of its logic high level range is VCCO, and the lower limit of its logic high level range is 0V. Therefore, in this example, the supply voltage on the signal input side of the level conversion chip is VCCI, and the supply voltage on the signal output side of the level conversion chip is VCCO. The level conversion chip receives the signal from the signal port of the device under test, performs signal level conversion, and outputs the level-converted signal from the signal port of the device under test.

[0078] Understandably, after acquiring the level indication signal, the controller can determine the level standard of the device under test (DUT). Based on this level standard, it then determines and outputs a voltage control signal to the adjustable power supply module, controlling the module to adjust the supply voltage so that the voltage at its output port matches the DUT's level standard. Since the adjustable power supply module's output port is connected to the second-side power port of the level conversion module, and the level standard of the second-side signal port matches the voltage at the second-side power port, the level standard at the second-side signal port remains identical to the DUT's level standard after the adjustable power supply module completes the voltage adjustment.

[0079] After the adjustable power supply module completes the power supply voltage regulation, the controller can send a test signal through the test signal port. Since the voltage of the first-side power supply port of the level conversion module is the same as the controller's power supply voltage (usually the controller's power supply voltage is the same as the upper limit of the logic high level range in the controller's level standard), the test signal sent by the controller conforms to the level standard of the first-side signal port of the level conversion module. The level conversion module can correctly identify the test signal through the first-side signal port. Correctly identifying the test signal specifically means that at each moment, it correctly determines whether the logic state represented by the test signal is logic high (usually represented as "1") or logic low (usually represented as "0").

[0080] Furthermore, when the level conversion module receives a test signal through the first-side signal port, the level conversion module can convert the test signal from the level standard of the first-side signal port to the level standard of the second-side signal port, and send the test signal to the device under test through the second-side signal port. The device under test can receive the test signal through the test signal port. Since the level standard of the second-side signal port of the level conversion module is the same as the level standard of the device under test, the device under test can correctly identify the test signal.

[0081] Therefore, by arranging a level conversion module between the controller and the device under test, and adjusting the supply voltage of the corresponding side (the side connected to the device under test, that is, the second side) on the level conversion module according to the level standard of the device under test, the test device can adaptively adjust the output level according to the level requirements of the device under test, adapt to the devices under test with various level standards, and effectively improve the compatibility of the test device.

[0082] In a possible implementation manner, the level indication signal is a reference voltage signal, and there is a preset ratio between the reference voltage represented by the reference voltage signal and the upper limit value of the logical high level range in the level standard of the device under test;

[0083] The controller is configured to determine the upper limit value of the logical high level range in the level standard of the device under test based on the reference voltage and the preset ratio;

[0084] Determine the voltage control signal based on the upper limit value of the logical high level range in the level standard of the device under test.

[0085] Specifically, the level indication signal may be a reference voltage signal, and there is a preset ratio between the reference voltage represented by the reference voltage signal and the upper limit value of the logical high level range in the level standard of the device under test. After obtaining the reference voltage signal, the controller can determine the upper limit value of the logical high level range according to the preset ratio.

[0086] It can be understood that the upper limit value of the logical high level range in the level standard of the device under test can be determined by VCCO = k × Vfb, where Vfb represents the reference voltage, k represents the preset ratio or the voltage adjustment coefficient, and VCCO represents the upper limit value of the logical high level range in the level standard of the device under test. The value of k can be configured to be greater than 1, that is, k>1. In this case, Vfb < VCCO, which can realize representing a larger upper limit value VCCO with a smaller reference voltage Vfb. By configuring an appropriate preset ratio k, it can be ensured that the reference voltage is within the voltage range of the test device, and the reference voltage signal can be effectively obtained.

[0087] In a possible implementation manner, Figure 3This is a schematic diagram illustrating the acquisition of a reference voltage using a test device equipped with a reference voltage signal feedback module, as provided in an embodiment of this application. Figure 3 As shown, the test equipment also includes a reference voltage signal feedback module 40, which can be a photoelectric conversion module. The reference voltage signal feedback module 40 is equipped with a signal acquisition port 41 and a voltage feedback port 42.

[0088] The signal acquisition port 41 of the reference voltage signal feedback module 40 and the optical signal output port 52 of the device under test 50 establish a communication connection through optical communication. The voltage feedback port 42 of the reference voltage signal feedback module 40 is connected to the controller.

[0089] When the reference voltage signal feedback module 20 is specifically a photoelectric conversion module, the reference voltage signal feedback module 20 receives the target light signal (e.g., infrared light) sent by the optical signal output port 52 of the device under test through the signal acquisition port 41, converts the target light signal into a reference voltage signal, and then outputs the reference voltage signal to the controller through the voltage feedback port 42. The target light signal is used to indicate the level standard of the device under test.

[0090] Figure 4 This is a schematic diagram illustrating the working principle of a reference voltage signal feedback module provided in an embodiment of this application, as shown below. Figure 4 As shown, the reference voltage signal feedback module includes: an analog-to-digital converter (ADC) and a first resistor R1. The analog input terminal of the ADC serves as the signal acquisition port 41 of the reference voltage signal feedback module, and the digital output terminal of the ADC serves as the voltage feedback port 42 of the reference voltage signal feedback module. The first end of the first resistor R1 is connected to the power supply, and the second end of the first resistor R1 is connected to the analog input terminal of the ADC.

[0091] The test equipment is also equipped with a second resistor R2. The first end of the second resistor R2 is connected to the second end of the first resistor, and the second end of the second resistor is grounded.

[0092] The ratio between the resistance values ​​of the first resistor R2 and the second resistor R2 is determined based on the supply voltage and reference voltage at the first terminal of the first resistor.

[0093] Optionally, the test equipment carries a second resistor via an adapter board. The adapter board can be snapped onto the mainboard of the test equipment. When the reference voltage needs to be adjusted, the adapter board can be replaced to achieve efficient adjustment of the reference voltage.

[0094] The power supply connected to the first terminal of the first resistor is illustrated here. The same power supply can be used to power both the controller and the first terminal of the first resistor; alternatively, two power supplies can be used to power the first power ports of the controller and the level conversion module respectively, but the output voltages of the two power supplies must remain the same. The supply voltage at the first terminal of the first resistor can be the same as the supply voltage of the controller.

[0095] It is understandable that a reference voltage corresponds to an upper limit value, and the reference voltage can be calculated based on the upper limit value of the logic high level range in the level standard of the device under test.

[0096] In order to form a reference voltage at the signal acquisition port, the supply voltage and the reference voltage can be used as known quantities. According to the voltage divider principle in the circuit, Vfb = VCC × R2 / (R1 + R2) can be obtained. VCC represents the supply voltage of the power supply connected to the first terminal of the first resistor. Then, the ratio between the two resistors can be obtained according to this formula. Then, the resistance values ​​of the first resistor and the second resistor can be configured according to this ratio to ensure that a reference voltage is formed at the signal acquisition port.

[0097] Therefore, by selecting a suitable resistor R2 at the device under test (DUT) end, it can be ensured that the supply voltage of the adjustable power module matches the DUT's voltage level standard. For any two DUTs using the same voltage level standard, the resistance value of R2 used in one DUT is the same as that used in the other DUT; for two DUTs using different voltage level standards, the resistance value of R2 used in one DUT is different from that used in the other DUT. Signal level matching is achieved by configuring a single resistor R2, eliminating the need for an adapter board and reducing overall design complexity.

[0098] In one possible implementation, a first switch is configured between the test signal port of the controller and the first-side signal port of the level conversion module, and a second switch is configured between the test signal port of the controller and the test signal port of the device under test.

[0099] The controller is also used to control the first switch to open and the second switch to close when the upper limit of the logic high level range in the level standard of the device under test is the same as the upper limit of the logic high level range in the level standard of the controller.

[0100] Alternatively, if the upper limit of the logic high level range in the level standard of the device under test is different from the upper limit of the logic high level range in the level standard of the controller, the first switch is closed and the second switch is opened.

[0101] Understandably, if the upper limit of the logic high level range in the level standard of the device under test is the same as the upper limit of the logic high level range in the level standard of the controller, it means that signal transmission can be achieved between the test device and the device under test without level conversion. In this case, by controlling the first switch to open and the second switch to close, the test signal port of the controller can be directly connected to the test signal port of the device under test, shortening the transmission path of the test signal and improving the signal transmission quality.

[0102] This application also provides a method for transmitting test signals, applicable to any of the aforementioned test devices. Figure 5 This is a flowchart illustrating the test signal transmission method provided in an embodiment of this application, as shown below. Figure 5 As shown, the method includes:

[0103] Step S101: Obtain the level indication signal;

[0104] Step S102: Generate a voltage control signal based on the level indication signal;

[0105] In step S103, if it is determined that the adjustable power supply module has completed voltage regulation, a test signal is sent.

[0106] It is understandable that the adjustable power supply module needs a certain amount of time to adjust the supply voltage to the specified upper limit value (the upper limit of the logic high level range in the level standard of the device under test) after receiving the voltage control signal. If the test signal is sent during the adjustment period of the adjustable power supply module, the level conversion module may not be able to perform the signal level conversion correctly, which will reduce the signal transmission quality. Therefore, sending the test signal after confirming that the adjustable power supply module has completed the voltage adjustment can ensure that the level conversion module performs the signal level conversion correctly and ensure the signal transmission quality.

[0107] The entire control system can use the controller's pre-programmed settings to automatically adjust the signal voltage without requiring manual control, making the equipment simple to use.

[0108] In one possible implementation, the level indication signal is a reference voltage signal, and the voltage value of the reference voltage signal has a preset ratio with the upper limit of the logic high level range in the level standard of the device under test;

[0109] Step S102 above includes:

[0110] Based on the reference voltage signal and the preset ratio, determine the upper limit of the logic high level range in the level standard of the device under test;

[0111] The voltage control signal is determined based on the upper limit of the logic high level range in the voltage level standard of the device under test.

[0112] In one possible implementation, the aforementioned determination of the adjustable power supply module to perform voltage regulation includes:

[0113] Monitor the time interval between the current moment and the moment the voltage control signal is generated;

[0114] If the time interval is greater than or equal to the preset delay, the adjustable power supply module is confirmed to have completed voltage regulation.

[0115] Understandably, an adjustable power supply module needs a certain amount of time to adjust the supply voltage to the specified upper limit after receiving a voltage control signal. A suitable preset delay can be configured, giving the adjustable power supply module sufficient time to complete voltage regulation. Specifically, after generating the voltage control signal, the time interval between the current moment and the moment the voltage control signal is generated can be monitored according to the preset delay. When the time interval is greater than or equal to the preset delay, it is determined that the adjustable power supply module has completed voltage regulation.

[0116] In one possible implementation, the aforementioned determination of the adjustable power supply module to perform voltage regulation includes:

[0117] Monitor the voltage at the power output port of the adjustable power module;

[0118] If the voltage at the power output port of the adjustable power supply module is the same as the upper limit of the logic high level range in the level standard of the device under test, it is determined that the adjustable power supply module has completed voltage regulation.

[0119] In one possible implementation, after sending the test signal, a test feedback signal sent by the device under test is received.

[0120] Specifically, when the controller sends a test signal through the test signal port, the level conversion module can receive the test signal from the first side signal port, perform signal level conversion, and output the level-converted test signal from the second side signal port.

[0121] After receiving the test signal, the device under test can perform the corresponding action according to the test signal and send a test feedback signal through the test signal port.

[0122] When the device under test sends a signal through the test signal port, the level conversion module can receive the test feedback signal from the second signal port, perform signal level conversion, and output the level-converted test feedback signal from the first signal port, so that the controller can receive the test feedback signal.

[0123] Therefore, during the testing process, the testing equipment and the device under test can communicate bidirectionally.

[0124] It should be understood that expressions such as “comprising” and “may include” used in this application indicate the existence of the disclosed functions, operations, or constituent elements, and do not limit one or more additional functions, operations, and constituent elements. In this application, terms such as “comprising” and / or “having” are to be interpreted as indicating a particular characteristic, number, operation, constituent element, component, or combination thereof, but not to exclude the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components, or combinations thereof.

[0125] Furthermore, the mathematical concepts mentioned in the embodiments of this application, such as symmetry, equality, parallelism, and perpendicularity, are limitations specific to the current technological level, rather than absolute and strict mathematical definitions. Slight deviations are permissible; approximations of symmetry, equality, parallelism, and perpendicularity are all acceptable. For example, "A and B are parallel" means that A and B are parallel or approximately parallel, and the angle between A and B can be between 0 and 10 degrees. "A and B are perpendicular" means that A and B are perpendicular or approximately perpendicular, and the angle between A and B can be between 80 and 100 degrees.

[0126] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A testing device, characterized in that, include: Controller, adjustable power supply module, and level conversion module; The level conversion module has a first-side power port, a second-side power port, a first-side signal port, and a second-side signal port. The level standard of the first-side signal port matches the voltage of the first-side power port, and the level standard of the second-side signal port matches the voltage of the second-side power port. The test signal port of the controller is connected to the first signal port of the level conversion module, the voltage of the first power port of the level conversion module is the same as the power supply voltage of the controller, and the test signal port of the device under test is connected to the second signal port of the level conversion module. The voltage control port of the controller is connected to the controlled terminal of the adjustable power module, and the power output port of the adjustable power module is connected to the second power port of the level conversion module. The controller is used to output a voltage control signal to the adjustable power supply module through a voltage control port based on a level indication signal; The level indication signal is a reference voltage signal, and the reference voltage represented by the reference voltage signal has a preset ratio with the upper limit of the logic high level range in the level standard of the device under test; The adjustable power supply module is used to adjust the power supply voltage based on a voltage control signal; The level conversion module is used to receive signals from signal ports on either side, perform signal level conversion, and output the level-converted signal from signal ports on the other side. The testing equipment also includes a reference voltage signal feedback module, which outputs the reference voltage signal to the controller; The reference voltage signal feedback module includes an analog-to-digital converter (ADC) and a first resistor. The analog input terminal of the ADC serves as the signal acquisition port of the reference voltage signal feedback module, and the digital output terminal of the ADC serves as the voltage feedback port of the reference voltage signal feedback module. The first terminal of the first resistor is connected to a power supply, and the second terminal of the first resistor is connected to the analog input terminal of the ADC. VCC represents the supply voltage of the power supply connected to the first terminal of the first resistor, and VCC is a known quantity. The test equipment is also equipped with a second resistor, the first end of which is connected to the second end of the first resistor, and the second end of the second resistor is grounded. The ratio between the resistance value of the first resistor and the resistance value of the second resistor is determined based on the supply voltage and reference voltage at the first terminal of the first resistor.

2. The testing equipment according to claim 1, characterized in that, The controller is used to determine the upper limit of the logic high level range in the level standard of the device under test based on the reference voltage and the preset ratio; The voltage control signal is determined based on the upper limit of the logic high level range in the level standard of the device under test.

3. The testing equipment according to claim 1, characterized in that, The test equipment carries the second resistor via an adapter plate.

4. A method for transmitting a test signal, characterized in that, Applied to the test equipment as described in any one of claims 1-3, comprising: Obtain the level indication signal; Based on the level indication signal, a voltage control signal is generated; If it is determined that the adjustable power supply module has completed voltage regulation, a test signal is sent.

5. The method for transmitting the test signal according to claim 4, characterized in that, The level indication signal is a reference voltage signal, and the reference voltage represented by the reference voltage signal has a preset ratio with the upper limit of the logic high level range in the level standard of the device under test; The generation of a voltage control signal based on the level indication signal includes: Based on the reference voltage and the preset ratio, the upper limit of the logic high level range in the level standard of the device under test is determined; The voltage control signal is generated based on the upper limit of the logic high level range in the level standard of the device under test.

6. The method for transmitting the test signal according to claim 5, characterized in that, The test equipment also includes a reference voltage signal feedback module, which outputs the reference voltage signal to the controller.

7. The method for transmitting the test signal according to claim 6, characterized in that, The reference voltage signal feedback module includes: an analog-to-digital converter and a first resistor. The analog input terminal of the analog-to-digital converter serves as the signal acquisition port of the reference voltage signal feedback module, and the digital output terminal of the analog-to-digital converter serves as the voltage feedback port of the reference voltage signal feedback module. The first terminal of the first resistor is connected to a power supply, and the second terminal of the first resistor is connected to the analog input terminal of the analog-to-digital converter. The test equipment is also equipped with a second resistor, the first end of which is connected to the second end of the first resistor, and the second end of the second resistor is grounded. The ratio between the resistance value of the first resistor and the resistance value of the second resistor is determined based on the supply voltage and reference voltage at the first terminal of the first resistor.

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