Return control method and system for thermal printer

Abstract

The present invention discloses a return control method and system for a thermal printer, which matches corresponding abnormal modules according to a plurality of abnormal data; in each abnormal module, an abnormal parameter is defined based on the corresponding abnormal data, and an abnormal level of the thermal printer is defined based on the plurality of abnormal parameters and the corresponding abnormal module, so as to control the abnormal state of the thermal printer. The return logic built into the thermal printer is triggered according to the return signal of the thermal printer, and in the return logic of the thermal printer, an abnormal distribution map of the thermal printer is constructed according to the plurality of abnormal parameters and corresponding positions, and an abnormal event of the thermal printer is defined according to the plurality of abnormal modules and the abnormal signal of the thermal printer. At this time, the thermal printer performs return processing by itself, and does not need to be triggered by an external device, so that the autonomous formation of the return address is realized, and the corresponding return is performed according to the return address.

Description

Technical Field

[0001] The present invention relates to the technical field of thermal printers, and in particular to a return control method and system for thermal printers. Background Art

[0002] With the development of science and technology, thermal printers are gradually used in life, and print on printing media through laser print heads. At this time, the thermal printer is associated with the mobile phone, and triggers the corresponding return processing based on the mobile phone. The thermal printer outputs an abnormal signal and explains the abnormal event. However, the existing mobile phone return program is not deeply associated with the abnormal events of the thermal printer, which affects the accuracy of the return of the thermal printer. At the same time, the thermal printer cannot realize autonomous return. Summary of the invention

[0003] The purpose of the present invention is to overcome the shortcomings of the prior art. The present invention provides a return control method and system for a thermal printer, which monitors the thermal printer in real time, collects multiple real-time operating data of the thermal printer in a working state, and constructs an operating data set based on the multiple real-time operating data; screens multiple abnormal data based on the operating data set, and matches corresponding abnormal modules according to the multiple abnormal data; in each abnormal module, defines abnormal parameters based on the corresponding abnormal data, and defines the abnormal level of the thermal printer based on the multiple abnormal parameters and the corresponding abnormal modules, thereby performing an overall control on the multiple abnormal parameters and the corresponding abnormal modules, so as to introduce the abnormal level of the thermal printer, thereby controlling the abnormal state of the thermal printer, and realizing online abnormal control of the thermal printer.

[0004] Furthermore, if the abnormality level of the thermal printer is greater than the abnormality level threshold, a return signal of the thermal printer is triggered, and a return logic built into the thermal printer is triggered according to the return signal of the thermal printer. In the return logic of the thermal printer, an abnormality distribution map of the thermal printer is constructed according to multiple abnormal parameters and corresponding positions, and an abnormality level ranking table of the abnormal module is constructed based on the abnormality distribution map and the abnormality level; the sorting of multiple abnormal modules is triggered based on the abnormality level ranking table of the abnormal module, and the abnormal events of the thermal printer are defined according to the multiple abnormal modules and the abnormal signals of the thermal printer, and The return address is defined according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table. At this time, the thermal printer handles the return by itself and does not need to be triggered by an external device. The return address is defined according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table, and the autonomous formation of the return address is realized. The corresponding return is carried out according to the return address. It is compatible with the abnormal events of the thermal printer and the model of the thermal printer, realizes the accurate return of the thermal printer, and real-time control of the abnormal response of the thermal printer during the working process and the subsequent autonomous return.

[0005] The embodiment of the present invention provides a return control method for a thermal printer, which is applied to a return control scenario of a thermal printer;

[0006] The return control method of the thermal printer comprises:

[0007] Monitor the thermal printer in real time, collect multiple real-time operation data of the thermal printer in a working state, and construct an operation data set based on the multiple real-time operation data;

[0008] Filter multiple abnormal data based on the running data set, and match corresponding abnormal modules according to the multiple abnormal data;

[0009] In each abnormal module, an abnormal parameter is defined based on the corresponding abnormal data, and an abnormal level of the thermal printer is defined based on the plurality of abnormal parameters and the corresponding abnormal module;

[0010] If the abnormality level of the thermal printer is greater than the abnormality level threshold, the return signal of the thermal printer is triggered, and the return logic built into the thermal printer is triggered according to the return signal of the thermal printer. At this time, the thermal printer performs the return process by itself and does not need to be triggered by an external device;

[0011] In the return logic of the thermal printer, an abnormal distribution map of the thermal printer is constructed according to multiple abnormal parameters and corresponding positions, and an abnormal level ranking table of the abnormal module is constructed based on the abnormal distribution map and abnormal level;

[0012] The sorting of multiple exception modules is triggered based on the exception level sorting table of the exception modules, the abnormal events of the thermal printer are defined according to the abnormal signals of the multiple exception modules and the thermal printer, and the return address is defined according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table.

[0013] Optionally, the real-time monitoring of the thermal printer and collecting a plurality of real-time operation data of the thermal printer in a working state, and constructing an operation data set based on the plurality of real-time operation data, include:

[0014] Locate thermal printers and monitor them in real time;

[0015] In real-time monitoring of thermal printers, locate the data space of thermal printers;

[0016] Based on the traversal of the data space of the thermal printer, a plurality of real-time operation data of the thermal printer in the working state are collected;

[0017] Dividing the real-time data of the plurality of working modules according to the plurality of real-time operation data, wherein the plurality of working modules are respectively located at different positions of the thermal printer;

[0018] Corresponding module data is constructed based on the real-time data of multiple working modules, and a running data set is constructed based on the multiple module data.

[0019] Optionally, screening a plurality of abnormal data based on the running data set, and matching corresponding abnormal modules according to the plurality of abnormal data, includes:

[0020] Freeze run data collection;

[0021] Define the screening method according to the data content of the running data set, the data distribution form of each working module and the model of the thermal printer;

[0022] Based on the screening method, the screening of the running data set is triggered, and multiple abnormal data are screened out;

[0023] Traversing multiple abnormal data, and defining working modules corresponding to the multiple abnormal data according to the traversal of the multiple abnormal data;

[0024] Define the priority of each abnormal data based on the abnormal data and the functions of the corresponding work module;

[0025] Collect matching coefficients of multiple abnormal data;

[0026] Define core abnormal data according to the matching coefficients of multiple abnormal data and the priority of each abnormal data;

[0027] Match the corresponding exception module based on the core abnormal data.

[0028] Optionally, in each abnormal module, an abnormal parameter is defined based on the corresponding abnormal data, and an abnormal level of the thermal printer is defined based on multiple abnormal parameters and the corresponding abnormal module, including:

[0029] In each abnormal module, the abnormal factors of the abnormal module are defined based on the corresponding abnormal data;

[0030] Correlate multiple abnormal factors in each abnormal module;

[0031] Constructing a corresponding abnormal factor set according to multiple abnormal factors;

[0032] Define abnormal parameters according to the abnormal factor set and the corresponding abnormal module's responsibilities;

[0033] Freeze multiple abnormal parameters;

[0034] Associating multiple abnormal parameters and corresponding abnormal models, and defining correlation coefficients between the multiple abnormal parameters and the corresponding abnormal models;

[0035] The abnormality level of the thermal printer is defined based on a plurality of abnormality parameters, a correlation coefficient and a corresponding abnormality module.

[0036] Optionally, if the abnormality level of the thermal printer is greater than the abnormality level threshold, a return signal of the thermal printer is triggered, and a return logic built into the thermal printer is triggered according to the return signal of the thermal printer. At this time, the thermal printer performs return processing by itself and does not need to be triggered by an external device, including:

[0037] Fixed abnormal level of thermal printer;

[0038] comparing the abnormality level of the thermal printer with the abnormality level threshold;

[0039] If the abnormality level of the thermal printer is greater than the abnormality level threshold, a return signal of the thermal printer is triggered;

[0040] The return signal based on the thermal printer triggers the return logic built into the thermal printer;

[0041] Responding to the return logic according to the return control space built into the thermal printer;

[0042] In the response process of the return logic, the thermal printer performs the return autonomously. At this time, the thermal printer performs the return processing by itself and does not need to be triggered by external devices.

[0043] Optionally, in the return logic of the thermal printer, an abnormal distribution map of the thermal printer is constructed according to a plurality of abnormal parameters and corresponding positions, and an abnormal level ranking table of the abnormal module is constructed based on the abnormal distribution map and the abnormal level, including:

[0044] In the return logic of thermal printers, multiple abnormal parameters are fixed;

[0045] Matching corresponding positions based on multiple abnormal parameters;

[0046] Matching a corresponding three-dimensional model according to a model of a thermal printer, and associating the three-dimensional model, a plurality of abnormal parameters, and a corresponding position;

[0047] An abnormal distribution map of the thermal printer is constructed according to the three-dimensional model, multiple abnormal parameters and corresponding positions. At this time, multiple abnormal parameters are presented in the three-dimensional model, and corresponding abnormal areas are matched based on the multiple abnormal parameters.

[0048] Optionally, in the return logic of the thermal printer, an abnormal distribution map of the thermal printer is constructed according to a plurality of abnormal parameters and corresponding positions, and an abnormal level ranking table of the abnormal module is constructed based on the abnormal distribution map and the abnormal level, further comprising:

[0049] Divide multiple functional areas based on the three-dimensional model, and associate multiple functional areas and multiple abnormal areas;

[0050] Define overlaps based on multiple functional areas and multiple exception areas;

[0051] The corresponding abnormal level is defined based on the overlapping part, and the abnormal level ranking table of the abnormal module is constructed based on the abnormal distribution map and the abnormal level.

[0052] Optionally, the abnormal level ranking table based on the abnormal modules triggers the sorting of multiple abnormal modules, and defines the abnormal events of the thermal printer according to the abnormal signals of the multiple abnormal modules and the thermal printer, and defines the return address according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table, including:

[0053] Anomaly level ranking table of freeze-frame anomaly module;

[0054] Triggering the sorting of multiple exception modules based on the exception level sorting table of the exception modules;

[0055] In the sorting of multiple abnormal modules, multiple abnormal modules are dynamically matched;

[0056] Defining corresponding matching coefficients according to dynamic matching of multiple abnormal modules;

[0057] A plurality of abnormal combinations are defined based on a plurality of abnormal modules and corresponding matching coefficients.

[0058] Optionally, the abnormal level ranking table based on the abnormal modules triggers the sorting of multiple abnormal modules, and defines the abnormal events of the thermal printer according to the abnormal signals of the multiple abnormal modules and the thermal printer, and defines the return address according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table, and further includes:

[0059] Correlate multiple abnormal combinations and abnormal signals of thermal printers;

[0060] defining abnormal events of the thermal printer based on multiple abnormal combinations and abnormal signals of the thermal printer;

[0061] Associate abnormal events of thermal printers, models of thermal printers, and return matching tables;

[0062] Define the return address based on the thermal printer exception event, the thermal printer model, and the return matching table.

[0063] In addition, an embodiment of the present invention further provides a return control system for a thermal printer, the return control system for the thermal printer comprising:

[0064] The acquisition module is used to monitor the thermal printer in real time, collect a plurality of real-time operation data of the thermal printer in a working state, and construct an operation data set based on the plurality of real-time operation data;

[0065] A screening module, used for screening a plurality of abnormal data based on the running data set, and matching corresponding abnormal modules according to the plurality of abnormal data;

[0066] An abnormality level module, used to define abnormal parameters based on corresponding abnormal data in each abnormal module, and define an abnormality level of the thermal printer based on multiple abnormal parameters and corresponding abnormal modules;

[0067] The return module is used to trigger the return signal of the thermal printer if the abnormality level of the thermal printer is greater than the abnormality level threshold, and trigger the return logic built into the thermal printer according to the return signal of the thermal printer. At this time, the thermal printer performs the return processing by itself and does not need to be triggered by an external device;

[0068] An abnormality level ranking table module is used to construct an abnormality distribution map of the thermal printer according to multiple abnormal parameters and corresponding positions in the return logic of the thermal printer, and to construct an abnormality level ranking table of the abnormality module based on the abnormality distribution map and the abnormality level;

[0069] The return address module is used to trigger the sorting of multiple exception modules based on the exception level sorting table of the exception modules, and define the abnormal events of the thermal printer according to the abnormal signals of the multiple exception modules and the thermal printer, and define the return address according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table.

[0070] In an embodiment of the present invention, through the method in the embodiment of the present invention, the thermal printer is monitored in real time, and multiple real-time operation data of the thermal printer in a working state are collected, and an operation data set is constructed based on the multiple real-time operation data; multiple abnormal data are filtered based on the operation data set, and corresponding abnormal modules are matched according to the multiple abnormal data; in each abnormal module, abnormal parameters are defined based on the corresponding abnormal data, and the abnormal level of the thermal printer is defined based on the multiple abnormal parameters and the corresponding abnormal modules, so as to perform an overall control on the multiple abnormal parameters and the corresponding abnormal modules, so as to introduce the abnormal level of the thermal printer, thereby controlling the abnormal state of the thermal printer, and realizing online abnormal control of the thermal printer.

[0071] Furthermore, if the abnormality level of the thermal printer is greater than the abnormality level threshold, a return signal of the thermal printer is triggered, and a return logic built into the thermal printer is triggered according to the return signal of the thermal printer. In the return logic of the thermal printer, an abnormality distribution map of the thermal printer is constructed according to multiple abnormal parameters and corresponding positions, and an abnormality level ranking table of the abnormal module is constructed based on the abnormality distribution map and the abnormality level; the sorting of multiple abnormal modules is triggered based on the abnormality level ranking table of the abnormal module, and the abnormal events of the thermal printer are defined according to the multiple abnormal modules and the abnormal signals of the thermal printer, and The return address is defined according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table. At this time, the thermal printer handles the return by itself and does not need to be triggered by an external device. The return address is defined according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table, and the autonomous formation of the return address is realized. The corresponding return is carried out according to the return address. It is compatible with the abnormal events of the thermal printer and the model of the thermal printer, realizes the accurate return of the thermal printer, and real-time control of the abnormal response of the thermal printer during the working process and the subsequent autonomous return. BRIEF DESCRIPTION OF THE DRAWINGS

[0072] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0073] Figure 1 is a flow chart of a return control method for a thermal printer in an embodiment of the present invention;

[0074] Figure 2 is a flow chart of S11 in the return control method of a thermal printer in an embodiment of the present invention;

[0075] Figure 3 is a flow chart of S12 in the return control method of a thermal printer in an embodiment of the present invention;

[0076] Figure 4 is a flow chart of S13 in the return control method of the thermal printer in an embodiment of the present invention;

[0077] Figure 5 is a flow chart of S14 in the return control method of the thermal printer in an embodiment of the present invention;

[0078] Figure 6 is a flow chart of S15 in the return control method of a thermal printer in an embodiment of the present invention;

[0079] Figure 7 is a flow chart of S16 in the return control method of a thermal printer in an embodiment of the present invention;

[0080] Figure 8 Schematic diagram of the structure of the return control system of the thermal printer in the embodiment of the present invention;

[0081] Fig. 9 The figure is a hardware diagram of an electronic device according to an exemplary embodiment. DETAILED DESCRIPTION

[0082] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0083] See also Figures 1 to 9 , a return control method for a thermal printer, applied to a return control scenario of a thermal printer; the return control method for a thermal printer includes:

[0084] Step S11: monitoring the thermal printer in real time, collecting a plurality of real-time operation data of the thermal printer in a working state, and constructing an operation data set based on the plurality of real-time operation data;

[0085] Step S12: screening multiple abnormal data based on the running data set, and matching corresponding abnormal modules according to the multiple abnormal data;

[0086] Step S13: in each abnormal module, defining abnormal parameters based on corresponding abnormal data, and defining abnormal levels of the thermal printer based on multiple abnormal parameters and corresponding abnormal modules;

[0087] Step S14: If the abnormality level of the thermal printer is greater than the abnormality level threshold, a return signal of the thermal printer is triggered, and the return logic built into the thermal printer is triggered according to the return signal of the thermal printer. At this time, the thermal printer performs the return process by itself and does not need to be triggered by an external device;

[0088] Step S15: in the return logic of the thermal printer, an abnormal distribution map of the thermal printer is constructed according to a plurality of abnormal parameters and corresponding positions, and an abnormal level ranking table of the abnormal module is constructed based on the abnormal distribution map and the abnormal level;

[0089] Step S16: Trigger the sorting of multiple abnormal modules based on the abnormal level sorting table of the abnormal modules, and define the abnormal events of the thermal printer according to the abnormal signals of the multiple abnormal modules and the thermal printer, and define the return address according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table.

[0090] In an embodiment of the present invention, through the method in the embodiment of the present invention, the thermal printer is monitored in real time, and multiple real-time operation data of the thermal printer in a working state are collected, and an operation data set is constructed based on the multiple real-time operation data; multiple abnormal data are filtered based on the operation data set, and corresponding abnormal modules are matched according to the multiple abnormal data; in each abnormal module, abnormal parameters are defined based on the corresponding abnormal data, and the abnormal level of the thermal printer is defined based on the multiple abnormal parameters and the corresponding abnormal modules, so as to perform an overall control on the multiple abnormal parameters and the corresponding abnormal modules, so as to introduce the abnormal level of the thermal printer, thereby controlling the abnormal state of the thermal printer, and realizing online abnormal control of the thermal printer.

[0091] Furthermore, if the abnormality level of the thermal printer is greater than the abnormality level threshold, a return signal of the thermal printer is triggered, and a return logic built into the thermal printer is triggered according to the return signal of the thermal printer. In the return logic of the thermal printer, an abnormality distribution map of the thermal printer is constructed according to multiple abnormal parameters and corresponding positions, and an abnormality level ranking table of the abnormal module is constructed based on the abnormality distribution map and the abnormality level; the sorting of multiple abnormal modules is triggered based on the abnormality level ranking table of the abnormal module, and the abnormal events of the thermal printer are defined according to the multiple abnormal modules and the abnormal signals of the thermal printer, and The return address is defined according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table. At this time, the thermal printer handles the return by itself and does not need to be triggered by an external device. The return address is defined according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table, and the autonomous formation of the return address is realized. The corresponding return is carried out according to the return address. It is compatible with the abnormal events of the thermal printer and the model of the thermal printer, realizes the accurate return of the thermal printer, and real-time control of the abnormal response of the thermal printer during the working process and the subsequent autonomous return.

[0092] refer to Figure 2 , in step S11, the thermal printer is monitored in real time, and a plurality of real-time operation data of the thermal printer in a working state are collected, and an operation data set is constructed based on the plurality of real-time operation data;

[0093] In the specific implementation process of the present invention, the specific steps may be:

[0094] S111: locating the thermal printer and performing real-time monitoring on the thermal printer;

[0095] S112: locating a data space of the thermal printer in real-time monitoring of the thermal printer;

[0096] S113: collecting a plurality of real-time operation data of the thermal printer in a working state based on traversing the data space of the thermal printer;

[0097] S114: dividing the real-time data of the plurality of working modules according to the plurality of real-time operation data, wherein the plurality of working modules are respectively located at different positions of the thermal printer;

[0098] S115: Construct corresponding module data based on the real-time data of multiple working modules, and construct an operation data set according to the multiple module data.

[0099] In the embodiment of the present application, the thermal printer is located and monitored in real time, and the real-time monitoring of the thermal printer is realized, so as to facilitate further processing of the thermal printer. At this time, in the real-time monitoring of the thermal printer, the data space of the thermal printer is located, the data space of the thermal printer is introduced, and the data space of the thermal printer is traversed, so that multiple real-time operation data of the thermal printer in the working state are collected based on the traversal of the data space of the thermal printer, and the introduction of multiple real-time operation data is realized, and the working state of the thermal printer is limited, so as to realize the real-time control of the thermal printer in the working state.

[0100] Furthermore, the real-time data of multiple working modules are divided according to multiple real-time operation data. At this time, the multiple working modules are respectively located at different positions of the thermal printer, and the multiple working modules are respectively parts such as the print head, the mobile device, and the environmental device. The multiple working modules respectively control different dimensions, so that corresponding module data are constructed based on the real-time data of the multiple working modules, and an operation data set is constructed according to the multiple module data, thereby introducing an operation data set to realize further processing of the operation data set.

[0101] refer to Figure 3 , in step S12, a plurality of abnormal data are screened based on the running data set, and corresponding abnormal modules are matched according to the plurality of abnormal data;

[0102] In the specific implementation process of the present invention, the specific steps may be:

[0103] S121: freeze frame running data collection;

[0104] S122: defining a screening method according to the data content of the running data set, the data distribution form of each working module, and the model of the thermal printer;

[0105] S123: triggering the screening of the running data set based on the screening method, and screening out a plurality of abnormal data;

[0106] S124: traversing the plurality of abnormal data, and defining the working modules corresponding to the plurality of abnormal data according to the traversal of the plurality of abnormal data;

[0107] S125: defining the priority of each abnormal data based on the abnormal data and the functions of the corresponding work modules;

[0108] S126: Collect matching coefficients of multiple abnormal data;

[0109] S127: defining core abnormal data according to the matching coefficients of the plurality of abnormal data and the priority of each abnormal data;

[0110] S128: Matching corresponding abnormal modules based on the core abnormal data.

[0111] In an embodiment of the present application, an operation data set is frozen to facilitate processing of the operation data set, so that a screening method is defined according to the data content of the operation data set, the data distribution form of each working module, and the model of the thermal printer. The data content of the operation data set, the data distribution form of each working module, and the model of the thermal printer are introduced to achieve overall control of the data content of the operation data set, the data distribution form of each working module, and the model of the thermal printer, so as to facilitate multi-dimensional control of the data content of the operation data set, the data distribution form of each working module, and the model of the thermal printer, thereby ensuring the accuracy of the screening method. At this time, the screening method includes local screening, overall screening, or keyword precise screening.

[0112] At this time, the filtering of the running data set is triggered based on the filtering method, and multiple abnormal data are filtered out, so as to introduce multiple abnormal data and realize further processing of multiple abnormal data. At the same time, multiple abnormal data are traversed, and the work modules corresponding to the multiple abnormal data are defined according to the traversal of the multiple abnormal data, so as to define the priority of each abnormal data based on the abnormal data and the functions of the corresponding work module, and introduce the priority of each abnormal data.

[0113] Therefore, matching coefficients of multiple abnormal data are collected, and matching is performed on the multiple abnormal data. The matching degrees of the multiple abnormal data are presented through the matching coefficients, so that the core abnormal data are defined according to the matching coefficients of the multiple abnormal data and the priorities of each abnormal data. Multi-dimensional control of the matching coefficients of the multiple abnormal data and the priorities of each abnormal data is achieved, and the core abnormal data is introduced to ensure the accuracy of the core abnormal data. At the same time, the corresponding abnormal module is matched based on the core abnormal data to achieve further processing of the abnormal module.

[0114] refer to Figure 4 , in step S13, in each abnormal module, an abnormal parameter is defined based on the corresponding abnormal data, and an abnormal level of the thermal printer is defined based on the multiple abnormal parameters and the corresponding abnormal module;

[0115] In the specific implementation process of the present invention, the specific steps may be:

[0116] S131: In each abnormal module, define the abnormal factor of the abnormal module based on the corresponding abnormal data;

[0117] S132: Associating multiple abnormal factors in each abnormal module;

[0118] S133: constructing a corresponding abnormal factor set according to the multiple abnormal factors;

[0119] S134: defining abnormal parameters according to the abnormal factor set and the functions of the corresponding abnormal modules;

[0120] S135: freeze multiple abnormal parameters; associate multiple abnormal parameters with corresponding abnormal models, and define correlation coefficients between the multiple abnormal parameters and the corresponding abnormal models;

[0121] S136: defining an abnormality level of the thermal printer based on the plurality of abnormality parameters, the correlation coefficient and the corresponding abnormality module.

[0122] In an embodiment of the present application, a thermal printer is monitored in real time, and multiple real-time operating data of the thermal printer in a working state are collected, and an operating data set is constructed based on the multiple real-time operating data; multiple abnormal data are screened based on the operating data set, and corresponding abnormal modules are matched according to the multiple abnormal data; in each abnormal module, abnormal parameters are defined based on the corresponding abnormal data, and the abnormal level of the thermal printer is defined based on the multiple abnormal parameters and the corresponding abnormal modules, so that the multiple abnormal parameters and the corresponding abnormal modules are controlled in an integrated manner, so as to introduce the abnormal level of the thermal printer, thereby controlling the abnormal state of the thermal printer and realizing online abnormal control of the thermal printer.

[0123] In each abnormal module, the abnormal factors of the abnormal module are defined based on the corresponding abnormal data, and the abnormal factors of the abnormal module are further controlled. At this time, multiple abnormal factors are frozen to facilitate locating multiple abnormal factors in one abnormal module, thereby associating multiple abnormal factors in each abnormal module, so as to facilitate further abnormal control of each abnormal module, covering all abnormal factors in the abnormal module.

[0124] At this time, a corresponding abnormal factor set is constructed based on multiple abnormal factors; abnormal parameters are defined according to the abnormal factor set and the functions of the corresponding abnormal modules, which is compatible with the consideration of the abnormal factor set and the functions of the corresponding abnormal modules, realizes multi-dimensional control of the abnormal factor set and the functions of the corresponding abnormal modules, and ensures the accuracy of abnormal parameters.

[0125] Therefore, multiple abnormal parameters are frozen; multiple abnormal parameters and corresponding abnormal models are associated, and correlation coefficients between multiple abnormal parameters and corresponding abnormal models are defined, so as to realize the association between multiple abnormal parameters and corresponding abnormal models, and introduce correlation coefficients, so as to present the degree of association between multiple abnormal parameters and corresponding abnormal models through correlation coefficients, and then define the abnormal level of the thermal printer based on multiple abnormal parameters, correlation coefficients and corresponding abnormal modules, perform multi-dimensional control on multiple abnormal parameters, correlation coefficients and corresponding abnormal modules, so as to introduce the abnormal level of the thermal printer, and ensure the accuracy of the abnormal level of the thermal printer.

[0126] refer to Figure 5 , S14: If the abnormality level of the thermal printer is greater than the abnormality level threshold, the return signal of the thermal printer is triggered, and the return logic built into the thermal printer is triggered according to the return signal of the thermal printer. At this time, the thermal printer performs the return processing by itself and does not need to be triggered by an external device;

[0127] In the specific implementation process of the present invention, the specific steps may be:

[0128] S141: freeze the abnormal level of thermal printer;

[0129] S142: comparing the abnormality level of the thermal printer with the abnormality level threshold;

[0130] S143: If the abnormality level of the thermal printer is greater than the abnormality level threshold, a return signal of the thermal printer is triggered;

[0131] S144: triggering a return logic built into the thermal printer based on a return signal of the thermal printer;

[0132] S145: responding to the return logic according to the return control space built into the thermal printer;

[0133] S146: In the response process of the return logic, the thermal printer performs the return autonomously. At this time, the thermal printer performs the return processing by itself and does not need to be triggered by an external device.

[0134] In an embodiment of the present application, the abnormality level of the thermal printer is frozen, and the abnormality level of the thermal printer is further controlled. At this time, the abnormality level of the thermal printer is compared with the abnormality level threshold, thereby realizing the comparison between the abnormality level of the thermal printer and the abnormality level threshold. At this time, the abnormality level threshold is matched by the model of the thermal printer.

[0135] At this time, if the abnormality level of the thermal printer is greater than the abnormality level threshold, the return signal of the thermal printer is triggered, and the return signal of the thermal printer is further processed. At the same time, the return signal of the thermal printer triggers the return logic built into the thermal printer. The return logic is stored in the thermal printer and can perform autonomous returns based on the thermal printer, reducing the assistance of external devices, increasing the functional effect of the thermal printer, and combining the abnormality detection of the thermal printer.

[0136] Therefore, the return control space built into the thermal printer responds to the return logic; in the response process of the return logic, the thermal printer performs the return autonomously. At this time, the thermal printer performs the return processing by itself and does not need to be triggered by an external device.

[0137] refer to Figure 6 , S15: in the return logic of the thermal printer, an abnormal distribution map of the thermal printer is constructed according to a plurality of abnormal parameters and corresponding positions, and an abnormal level ranking table of the abnormal module is constructed based on the abnormal distribution map and the abnormal level;

[0138] In the specific implementation process of the present invention, the specific steps may be:

[0139] S151: In the return logic of the thermal printer, multiple abnormal parameters are frozen;

[0140] S152: Matching corresponding positions based on multiple abnormal parameters;

[0141] S153: matching a corresponding three-dimensional model according to the model of the thermal printer, and associating the three-dimensional model, a plurality of abnormal parameters, and a corresponding position;

[0142] S154: constructing an abnormal distribution map of the thermal printer according to the three-dimensional model, the multiple abnormal parameters and the corresponding positions. At this time, the multiple abnormal parameters are presented in the three-dimensional model, and the corresponding abnormal areas are matched based on the multiple abnormal parameters;

[0143] S155: Divide a plurality of functional areas based on the three-dimensional model, and associate the plurality of functional areas and the plurality of abnormal areas;

[0144] S156: defining overlapping parts according to a plurality of functional areas and a plurality of abnormal areas;

[0145] S157: Define the corresponding abnormality level based on the overlapping part, and construct an abnormality level ranking table of the abnormal module based on the abnormality distribution map and the abnormality level.

[0146] In an embodiment of the present application, in the return logic of the thermal printer, multiple abnormal parameters are frozen and further controlled. At this time, based on the matching of the corresponding positions of the multiple abnormal parameters, the positions corresponding to the multiple abnormal parameters are introduced. At the same time, the corresponding three-dimensional model is matched according to the model of the thermal printer, and the three-dimensional model, multiple abnormal parameters and corresponding positions are introduced to facilitate the association of the three-dimensional model, multiple abnormal parameters and corresponding positions.

[0147] At this time, an abnormal distribution map of the thermal printer is constructed according to the three-dimensional model, multiple abnormal parameters and corresponding positions. At this time, multiple abnormal parameters are presented in the three-dimensional model, and corresponding abnormal areas are matched based on the multiple abnormal parameters, so that the abnormal areas can be presented in the abnormal distribution map, thereby controlling multiple abnormal areas.

[0148] Furthermore, multiple functional areas are divided based on the three-dimensional model, and the multiple functional areas and multiple abnormal areas are associated, and comparison is performed based on the multiple functional areas and the multiple abnormal areas, so as to define overlapping parts according to the multiple functional areas and the multiple abnormal areas, thereby defining corresponding abnormal levels based on the overlapping parts, and constructing an abnormality level ranking table of the abnormal module based on the abnormal distribution map and the abnormality level, thereby ensuring the accuracy of the abnormality level ranking table of the abnormal module and controlling the further processing of the abnormality level ranking table of the abnormal module.

[0149] refer to Figure 7 , S16: triggering the sorting of multiple abnormal modules based on the abnormal level sorting table of the abnormal modules, and defining the abnormal event of the thermal printer according to the abnormal signals of the multiple abnormal modules and the thermal printer, and defining the return address according to the abnormal event of the thermal printer, the model of the thermal printer and the return matching table;

[0150] In the specific implementation process of the present invention, the specific steps may be:

[0151] S161: abnormality level ranking table of the freeze abnormality module;

[0152] S162: triggering sorting of multiple abnormal modules based on the abnormal level sorting table of the abnormal modules;

[0153] S163: dynamically matching the multiple abnormal modules in the sorting of the multiple abnormal modules;

[0154] S164: defining corresponding matching coefficients according to dynamic matching of multiple abnormal modules;

[0155] S165: defining multiple abnormal combinations based on multiple abnormal modules and corresponding matching coefficients;

[0156] S166: Associating the plurality of abnormal combinations with the abnormal signal of the thermal printer; defining an abnormal event of the thermal printer based on the plurality of abnormal combinations and the abnormal signal of the thermal printer;

[0157] S167: Associating the abnormal event of the thermal printer, the model of the thermal printer, and the return matching table; defining the return address according to the abnormal event of the thermal printer, the model of the thermal printer, and the return matching table.

[0158] In the specific implementation process of the present invention, if the abnormality level of the thermal printer is greater than the abnormality level threshold, the return signal of the thermal printer is triggered, and the return logic built into the thermal printer is triggered according to the return signal of the thermal printer. In the return logic of the thermal printer, an abnormality distribution map of the thermal printer is constructed according to multiple abnormal parameters and corresponding positions, and an abnormality level ranking table of the abnormal module is constructed based on the abnormality distribution map and the abnormality level; the sorting of multiple abnormal modules is triggered based on the abnormality level ranking table of the abnormal module, and the abnormality of the thermal printer is defined according to the multiple abnormal modules and the abnormal signal of the thermal printer. Event, and define the return address according to the abnormal event of the thermal printer, the model of the thermal printer and the return matching table. At this time, the thermal printer processes the return by itself and does not need to be triggered by an external device. The return address is defined by the abnormal event of the thermal printer, the model of the thermal printer and the return matching table, and the autonomous formation of the return address is realized. The corresponding return is made according to the return address. It is compatible with the abnormal events of the thermal printer and the model of the thermal printer, realizes the accurate return of the thermal printer, and real-time control of the abnormal response of the thermal printer during the working process and the subsequent autonomous return.

[0159] In an embodiment of the present application, the abnormality level ranking table of the abnormal module is fixed, and the abnormality level ranking table of the abnormal module is further developed, so that the ranking of multiple abnormal modules is triggered based on the abnormality level ranking table of the abnormal module, thereby achieving reasonable ranking of multiple abnormal modules.

[0160] At this time, in the sorting of multiple abnormal modules, multiple abnormal modules are dynamically matched to facilitate dynamic matching of multiple abnormal modules, thereby defining corresponding matching coefficients according to the dynamic matching of multiple abnormal modules, and presenting the matching degree of multiple abnormal modules through the matching coefficients.

[0161] Therefore, multiple abnormal combinations are defined based on multiple abnormal modules and corresponding matching coefficients; multiple abnormal combinations and abnormal signals of the thermal printer are associated; abnormal events of the thermal printer are defined based on the multiple abnormal combinations and abnormal signals of the thermal printer, thereby achieving multiple interactions of multiple abnormal combinations and abnormal signals of the thermal printer, thereby ensuring the accuracy of abnormal events of the thermal printer.

[0162] Furthermore, the abnormal events of the thermal printer, the model of the thermal printer, and the return matching table are associated; the return address is defined according to the abnormal events of the thermal printer, the model of the thermal printer, and the return matching table. At this time, the thermal printer processes the return by itself, and does not need to be triggered by an external device. The return address is defined by the abnormal events of the thermal printer, the model of the thermal printer, and the return matching table, realizing the autonomous formation of the return address, and the corresponding return is carried out according to the return address. It is compatible with the abnormal events of the thermal printer and the model of the thermal printer, realizing the accurate return of the thermal printer, and real-time control of the abnormal response of the thermal printer during the working process and the subsequent autonomous return.

[0163] In an embodiment of the present invention, through the method in the embodiment of the present invention, the thermal printer is monitored in real time, and multiple real-time operation data of the thermal printer in a working state are collected, and an operation data set is constructed based on the multiple real-time operation data; multiple abnormal data are filtered based on the operation data set, and corresponding abnormal modules are matched according to the multiple abnormal data; in each abnormal module, abnormal parameters are defined based on the corresponding abnormal data, and the abnormal level of the thermal printer is defined based on the multiple abnormal parameters and the corresponding abnormal modules, so as to perform an overall control on the multiple abnormal parameters and the corresponding abnormal modules, so as to introduce the abnormal level of the thermal printer, thereby controlling the abnormal state of the thermal printer, and realizing online abnormal control of the thermal printer.

[0164] Furthermore, if the abnormality level of the thermal printer is greater than the abnormality level threshold, a return signal of the thermal printer is triggered, and a return logic built into the thermal printer is triggered according to the return signal of the thermal printer. In the return logic of the thermal printer, an abnormality distribution map of the thermal printer is constructed according to multiple abnormal parameters and corresponding positions, and an abnormality level ranking table of the abnormal module is constructed based on the abnormality distribution map and the abnormality level; the sorting of multiple abnormal modules is triggered based on the abnormality level ranking table of the abnormal module, and the abnormal events of the thermal printer are defined according to the multiple abnormal modules and the abnormal signals of the thermal printer, and The return address is defined according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table. At this time, the thermal printer handles the return by itself and does not need to be triggered by an external device. The return address is defined according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table, and the autonomous formation of the return address is realized. The corresponding return is carried out according to the return address. It is compatible with the abnormal events of the thermal printer and the model of the thermal printer, realizes the accurate return of the thermal printer, and real-time control of the abnormal response of the thermal printer during the working process and the subsequent autonomous return.

[0165] See also Figure 8 , Figure 8 It is a schematic diagram of the structural composition of the return control system of the thermal printer in an embodiment of the present invention.

[0166] like Figure 8 As shown, a return control system of a thermal printer, the return control system of the thermal printer comprises:

[0167] The acquisition module 21 is used to monitor the thermal printer in real time, and to acquire a plurality of real-time operation data of the thermal printer in a working state, and to construct an operation data set based on the plurality of real-time operation data;

[0168] A screening module 22, used for screening a plurality of abnormal data based on the running data set, and matching corresponding abnormal modules according to the plurality of abnormal data;

[0169] An abnormality level module 23, used to define abnormal parameters based on corresponding abnormal data in each abnormal module, and define an abnormality level of the thermal printer based on multiple abnormal parameters and corresponding abnormal modules;

[0170] The return module 24 is used to trigger the return signal of the thermal printer if the abnormality level of the thermal printer is greater than the abnormality level threshold, and trigger the return logic built into the thermal printer according to the return signal of the thermal printer. At this time, the thermal printer performs the return processing by itself and does not need to be triggered by an external device;

[0171] The abnormality level ranking table module 25 is used to construct an abnormality distribution map of the thermal printer according to multiple abnormality parameters and corresponding positions in the return logic of the thermal printer, and to construct an abnormality level ranking table of the abnormality module based on the abnormality distribution map and the abnormality level;

[0172] The return address module 26 is used to trigger the sorting of multiple abnormal modules based on the abnormal level sorting table of the abnormal modules, and define the abnormal events of the thermal printer according to the abnormal signals of the multiple abnormal modules and the thermal printer, and define the return address according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table.

[0173] See also Fig. 9 , refer to the following Fig. 9 The electronic device 40 according to this embodiment of the present invention will be described. Fig. 9 The electronic device 40 shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present invention.

[0174] like Fig. 9 As shown, the electronic device 40 is in the form of a general computing device. The components of the electronic device 40 may include but are not limited to: at least one processing unit 41, at least one storage unit 42, and a bus 43 connecting different system components (including the storage unit 42 and the processing unit 41).

[0175] The storage unit stores program codes, which can be executed by the processing unit 41, so that the processing unit 41 executes the steps according to various exemplary embodiments of the present invention described in the above “Embodiment Method” section of this specification.

[0176] The storage unit 42 may include a readable medium in the form of a volatile storage unit, such as a random access memory unit (RAM) 421 and / or a cache memory unit 422 , and may further include a read-only memory unit (ROM) 423 .

[0177] The storage unit 42 may also include a program / utility 424 having a set (at least one) of program modules 425, such program modules 425 including but not limited to: an operating system, one or more application programs, other program modules, and program data, each of which or some combination may include an implementation of a network environment.

[0178] Bus 43 may represent one or more of several types of bus structures, including a memory unit bus or memory unit controller, a peripheral bus, an accelerated graphics port, a processing unit, or a local bus using any of a variety of bus architectures.

[0179] The electronic device 40 may also communicate with one or more external devices (e.g., keyboards, pointing devices, Bluetooth devices, etc.), one or more devices that enable a user to interact with the electronic device 40, and / or any device that enables the electronic device 40 to communicate with one or more other computing devices (e.g., routers, modems, etc.). Such communication may be performed via an input / output (I / O) interface 44. Furthermore, the electronic device 40 may also communicate with one or more networks (e.g., a local area network (LAN), a wide area network (WAN), and / or a public network, such as the Internet) via a network adapter 45. Fig. 9 As shown, the network adapter 45 communicates with other modules of the electronic device 40 via the bus 43. It should be understood that although Fig. 9 Not shown, other hardware and / or software modules may be used in conjunction with the electronic device 40, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup planning systems.

[0180] Through the description of the above implementation, it is easy for those skilled in the art to understand that the example implementation described here can be implemented by software, or by software combined with necessary hardware. Therefore, the technical solution according to the implementation of the present disclosure can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (which can be a CD-ROM, a USB flash drive, a mobile hard disk, etc.) or on a network, and includes a number of instructions to enable a computing device (which can be a personal computer, a server, a terminal device, or a network device, etc.) to execute the method according to the implementation of the present disclosure.

[0181] Those skilled in the art can understand that all or part of the steps in the various methods of the above embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable storage medium, and the storage medium can include: a read-only memory (ROM), a random access memory (RAM), a disk or an optical disk, etc. In addition, it stores computer program instructions, and when the computer program instructions are executed by a computer, the computer executes the above method.

[0182] In addition, the above is a detailed introduction to the return control method and system of the thermal printer provided in the embodiment of the present invention. Specific examples are used herein to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea; at the same time, for those skilled in the art, according to the idea of ​​the present invention, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present invention.

Claims

1. A return control method for a thermal printer, characterized in that: Applied to the return control scenario of thermal printers; The return control method of the thermal printer comprises: Monitor the thermal printer in real time, collect multiple real-time operation data of the thermal printer in a working state, and construct an operation data set based on the multiple real-time operation data; Filter multiple abnormal data based on the running data set, and match corresponding abnormal modules according to the multiple abnormal data; In each abnormal module, an abnormal parameter is defined based on the corresponding abnormal data, and an abnormal level of the thermal printer is defined based on the plurality of abnormal parameters and the corresponding abnormal module; If the abnormality level of the thermal printer is greater than the abnormality level threshold, the return signal of the thermal printer is triggered, and the return logic built into the thermal printer is triggered according to the return signal of the thermal printer. At this time, the thermal printer performs the return process by itself and does not need to be triggered by an external device; In the return logic of the thermal printer, an abnormal distribution map of the thermal printer is constructed according to multiple abnormal parameters and corresponding positions, and an abnormal level ranking table of the abnormal module is constructed based on the abnormal distribution map and abnormal level; Triggering the sorting of multiple abnormal modules based on the abnormal level sorting table of the abnormal modules, defining abnormal events of the thermal printer according to the abnormal signals of the multiple abnormal modules and the thermal printer, and defining a return address according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table; The real-time monitoring of the thermal printer, collecting multiple real-time operation data of the thermal printer in a working state, and constructing an operation data set based on the multiple real-time operation data include: locating the thermal printer and monitoring the thermal printer in real time; locating the data space of the thermal printer in the real-time monitoring of the thermal printer; collecting multiple real-time operation data of the thermal printer in a working state based on the traversal of the data space of the thermal printer; dividing the real-time data of multiple working modules according to the multiple real-time operation data, at this time, the multiple working modules are respectively located at different positions of the thermal printer; constructing corresponding module data based on the real-time data of the multiple working modules, and constructing an operation data set based on the multiple module data; The method of screening multiple abnormal data based on the operation data set and matching corresponding abnormal modules according to the multiple abnormal data includes: freezing the operation data set; defining a screening method according to the data content of the operation data set, the data distribution form of each working module and the model of the thermal printer; triggering the screening of the operation data set based on the screening method, and screening out multiple abnormal data; traversing the multiple abnormal data, and defining the working modules corresponding to the multiple abnormal data according to the traversal of the multiple abnormal data; defining the priority of each abnormal data based on the abnormal data and the functions of the corresponding working module; collecting matching coefficients of the multiple abnormal data; defining core abnormal data according to the matching coefficients of the multiple abnormal data and the priority of each abnormal data; matching the corresponding abnormal module based on the core abnormal data; In each abnormal module, abnormal parameters are defined based on corresponding abnormal data, and the abnormal level of the thermal printer is defined based on multiple abnormal parameters and the corresponding abnormal module, including: in each abnormal module, abnormal factors of the abnormal module are defined based on corresponding abnormal data; multiple abnormal factors in each abnormal module are associated; a corresponding abnormal factor set is constructed according to multiple abnormal factors; abnormal parameters are defined according to the abnormal factor set and the functions of the corresponding abnormal module; multiple abnormal parameters are fixed; multiple abnormal parameters are associated with corresponding abnormal models, and correlation coefficients between multiple abnormal parameters and corresponding abnormal models are defined; and the abnormal level of the thermal printer is defined based on multiple abnormal parameters, correlation coefficients and corresponding abnormal modules.

2. The return control method of a thermal printer according to claim 1, characterized in that: If the abnormality level of the thermal printer is greater than the abnormality level threshold, the return signal of the thermal printer is triggered, and the return logic built into the thermal printer is triggered according to the return signal of the thermal printer. At this time, the thermal printer performs the return processing by itself and does not need to be triggered by an external device, including: Fixed abnormal level of thermal printer; comparing the abnormality level of the thermal printer with the abnormality level threshold; If the abnormality level of the thermal printer is greater than the abnormality level threshold, a return signal of the thermal printer is triggered; The return signal based on the thermal printer triggers the return logic built into the thermal printer; Responding to the return logic according to the return control space built into the thermal printer; In the response process of the return logic, the thermal printer performs the return autonomously. At this time, the thermal printer performs the return processing by itself and does not need to be triggered by external devices.

3. The return control method of a thermal printer according to claim 2, characterized in that: In the return logic of the thermal printer, an abnormal distribution map of the thermal printer is constructed according to a plurality of abnormal parameters and corresponding positions, and an abnormal level ranking table of the abnormal module is constructed based on the abnormal distribution map and the abnormal level, including: In the return logic of thermal printers, multiple abnormal parameters are fixed; Matching corresponding positions based on multiple abnormal parameters; Matching a corresponding three-dimensional model according to a model of a thermal printer, and associating the three-dimensional model, a plurality of abnormal parameters, and a corresponding position; An abnormal distribution map of the thermal printer is constructed according to the three-dimensional model, multiple abnormal parameters and corresponding positions. At this time, multiple abnormal parameters are presented in the three-dimensional model, and corresponding abnormal areas are matched based on the multiple abnormal parameters.

4. The return control method of a thermal printer according to claim 3, characterized in that: In the return logic of the thermal printer, an abnormal distribution map of the thermal printer is constructed according to a plurality of abnormal parameters and corresponding positions, and an abnormal level ranking table of the abnormal module is constructed based on the abnormal distribution map and the abnormal level, and further includes: Divide multiple functional areas based on the three-dimensional model, and associate multiple functional areas and multiple abnormal areas; Define overlaps based on multiple functional areas and multiple exception areas; The corresponding abnormal level is defined based on the overlapping part, and the abnormal level ranking table of the abnormal module is constructed based on the abnormal distribution map and the abnormal level.

5. The return control method of a thermal printer according to claim 4, characterized in that: The abnormal level ranking table based on the abnormal modules triggers the sorting of multiple abnormal modules, and defines the abnormal events of the thermal printer according to the abnormal signals of the multiple abnormal modules and the thermal printer, and defines the return address according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table, including: Anomaly level ranking table of freeze-frame anomaly module; Triggering the sorting of multiple exception modules based on the exception level sorting table of the exception modules; In the sorting of multiple abnormal modules, multiple abnormal modules are dynamically matched; Defining corresponding matching coefficients according to dynamic matching of multiple abnormal modules; A plurality of abnormal combinations are defined based on a plurality of abnormal modules and corresponding matching coefficients.

6. The return control method of a thermal printer according to claim 5, characterized in that: The abnormal level ranking table based on the abnormal modules triggers the sorting of multiple abnormal modules, and defines the abnormal events of the thermal printer according to the abnormal signals of the multiple abnormal modules and the thermal printer, and defines the return address according to the abnormal events of the thermal printer, the model of the thermal printer and the return matching table, and also includes: Associating multiple abnormal combinations and abnormal signals of the thermal printer; defining abnormal events of the thermal printer based on the multiple abnormal combinations and the abnormal signals of the thermal printer; Associate the abnormal events of the thermal printer, the model of the thermal printer, and the return matching table; define the return address according to the abnormal events of the thermal printer, the model of the thermal printer, and the return matching table.

7. A return control system for a thermal printer, characterized in that: The return control system of the thermal printer is applied to the return control method of the thermal printer as claimed in any one of claims 1 to 6, and the return control system of the thermal printer includes: The acquisition module is used to monitor the thermal printer in real time, collect a plurality of real-time operation data of the thermal printer in a working state, and construct an operation data set based on the plurality of real-time operation data; A screening module, used for screening a plurality of abnormal data based on the running data set, and matching corresponding abnormal modules according to the plurality of abnormal data; An abnormality level module, used to define abnormal parameters based on corresponding abnormal data in each abnormal module, and define an abnormality level of the thermal printer based on multiple abnormal parameters and corresponding abnormal modules; The return module is used to trigger the return signal of the thermal printer if the abnormality level of the thermal printer is greater than the abnormality level threshold, and trigger the return logic built into the thermal printer according to the return signal of the thermal printer. At this time, the thermal printer performs the return processing by itself and does not need to be triggered by an external device; An abnormality level ranking table module is used to construct an abnormality distribution map of the thermal printer according to multiple abnormal parameters and corresponding positions in the return logic of the thermal printer, and to construct an abnormality level ranking table of the abnormality module based on the abnormality distribution map and the abnormality level; A return address module, used to trigger the sorting of multiple abnormal modules based on the abnormal level sorting table of the abnormal modules, and define the abnormal event of the thermal printer according to the abnormal signals of the multiple abnormal modules and the thermal printer, and define the return address according to the abnormal event of the thermal printer, the model of the thermal printer and the return matching table; The real-time monitoring of the thermal printer, collecting multiple real-time operation data of the thermal printer in a working state, and constructing an operation data set based on the multiple real-time operation data include: locating the thermal printer and monitoring the thermal printer in real time; locating the data space of the thermal printer in the real-time monitoring of the thermal printer; collecting multiple real-time operation data of the thermal printer in a working state based on the traversal of the data space of the thermal printer; dividing the real-time data of multiple working modules according to the multiple real-time operation data, at this time, the multiple working modules are respectively located at different positions of the thermal printer; constructing corresponding module data based on the real-time data of the multiple working modules, and constructing an operation data set based on the multiple module data; The method of screening multiple abnormal data based on the operation data set and matching corresponding abnormal modules according to the multiple abnormal data includes: freezing the operation data set; defining a screening method according to the data content of the operation data set, the data distribution form of each working module and the model of the thermal printer; triggering the screening of the operation data set based on the screening method, and screening out multiple abnormal data; traversing the multiple abnormal data, and defining the working modules corresponding to the multiple abnormal data according to the traversal of the multiple abnormal data; defining the priority of each abnormal data based on the abnormal data and the functions of the corresponding working module; collecting matching coefficients of the multiple abnormal data; defining core abnormal data according to the matching coefficients of the multiple abnormal data and the priority of each abnormal data; matching the corresponding abnormal module based on the core abnormal data; In each abnormal module, abnormal parameters are defined based on corresponding abnormal data, and the abnormal level of the thermal printer is defined based on multiple abnormal parameters and the corresponding abnormal module, including: in each abnormal module, abnormal factors of the abnormal module are defined based on corresponding abnormal data; multiple abnormal factors in each abnormal module are associated; a corresponding abnormal factor set is constructed according to multiple abnormal factors; abnormal parameters are defined according to the abnormal factor set and the functions of the corresponding abnormal module; multiple abnormal parameters are fixed; multiple abnormal parameters are associated with corresponding abnormal models, and correlation coefficients between multiple abnormal parameters and corresponding abnormal models are defined; and the abnormal level of the thermal printer is defined based on multiple abnormal parameters, correlation coefficients and corresponding abnormal modules.

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