An electromagnetic interference tester probe and a testing method

Abstract

An electromagnetic interference tester probe includes a detection part, a rotating part and a connecting part. The detection part is provided with a test end, the rotating part is provided with a rotating ring, and the test end is fixedly connected to the rotating ring. There are multiple detection parts. The rotating ring is fixed to the rotating part in a manner that can rotate relative to the rotating part. The rotating ring is provided with a conductive end, the detection part is provided with a detection circuit, and the conductive end is electrically connected to the detection circuit. The rotating part is provided with a docking end, and the docking end is electrically connected to the connecting part. The connecting part can be directly or indirectly electrically connected to the electromagnetic interference tester. A testing method for an electromagnetic interference tester probe uses Internet of Things technology to control the movement of the probe and achieve the testing of electromagnetic interference. With such a design, after connecting the probe once, it can meet the testing needs of multiple functions, that is, rotate the required detection part to the testing position to connect the instrument for testing, without the need to repeatedly replace the probe by disassembly, and remote operation and control can be achieved under the Internet of Things technology.

Description

Technical Field

[0001] The present invention belongs to the fields of electromagnetic interference testing and Internet of Things sensors, and particularly relates to an electromagnetic interference tester probe and a testing method. Background Art

[0002] An electromagnetic interference tester is a tool for detecting the electromagnetic interference intensity generated by various powered products during operation. It usually includes a spectrum analyzer and probes of various models. Different probes have different resolutions and detection ranges. Some near-field probes are used to detect the electric field, and some near-field probes detect the magnetic field. Especially for the detection of the magnetic field, it is difficult for too small a probe to find the position where electromagnetic radiation exists, and it is easy to miss detections. If the detection is carried out gradually and comprehensively in a small area, it is a waste of time. Too large a probe cannot accurately locate the position of electromagnetic radiation. Generally, multiple probes may need to be prepared in electromagnetic interference testing, corresponding to different detection ranges. To ensure the stability of signal conduction, the signal line of the probe usually needs to be tightly connected through a threaded structure, which makes it very inconvenient to replace the probe and wastes a lot of time.

[0003] Generally, there are differences in the structures of each circuit board to be detected. Therefore, electromagnetic interference testing using probes is basically manual operation. When the operator is performing the detection, on the one hand, they need to operate a certain probe and watch the movement of the probe, and on the other hand, they need to pay attention to the change of the waveform, and need to take into account the change of the waveform during the movement process, which brings certain difficulties to the test. With the development of Internet of Things technology, some probes have begun to achieve network control, that is, the probe is installed on the robotic arm of the robot. Using the position recognition technology of the robot, after the operator moves the probe once, the robotic arm can repeat the corresponding operation. However, if multiple detection probes are required, setting up multiple robotic arms greatly increases the cost. If a single robotic arm is used, there is also the problem of how to replace the probe. Existing spectrum analyzers cannot connect multiple probes at the same time.

[0004] In addition, there are also certain differences in the structures of the electric field probe and the electromagnetic probe. Of course, there are also probes that can detect both the electric field and the magnetic field. For example, the patent with the patent announcement number "CN117783702B" and the patent name "Dual-component near-field probe and system for simultaneously measuring vertical magnetic field and vertical electric field" discloses a probe that can detect the electric field and the magnetic field. However, if this probe is directly used to detect an unfamiliar circuit, it is also very difficult to find the position of electromagnetic radiation because its detection range is small.

[0005] The patent publication number "CN115980463A" and the patent name is "A near-field scanning probe", which discloses a probe that realizes the switching of multiple coils through a single-pole multi-throw switch. Although it can cover a wider frequency spectrum range, this probe has a multi-layer structure. When some coils are connected and working, the magnetic field direction may be covered by other non-working coils, which will inevitably cause certain interference to the magnetic field detection. Especially for high-frequency magnetic field detection, it will seriously affect the accuracy of magnetic field detection and also affect the sensitivity and resolution.

[0006] The patent publication number "CN210487911U" and the patent name is "A circuit testing device", which discloses a probe that realizes the switching of multiple test circuits through a single-pole multi-throw switch. However, this patent does not disclose how the specific structure of the test circuits is distributed, whether the test circuits will affect each other, and how to control the influence between the circuits. Summary of the Invention

[0007] In view of the above-mentioned prior art, the object of the present invention is to provide a probe and a testing method for an electromagnetic interference tester. This probe combines the functions of multiple probes, and there is no mutual interference between the testing probe and the non-testing probe. It is suitable for most electromagnetic interference tests and can also realize remote control operations or automatic mobile tests under the conditions of the Internet of Things.

[0008] The technical solution of the present invention is realized as follows: An electromagnetic interference tester probe includes a detection part, a rotating part, and a connecting part. The detection part is provided with a plurality of test ends, the rotating part is provided with several rotating rings, and each test end is fixedly connected to a corresponding rotating ring. There are a plurality of detection parts, and each rotating ring is fixed to the rotating part in a manner that can rotate relative to the rotating part. The rotating ring rotates relative to the rotating part through a transmission structure under manual or Internet of Things control. The rotating ring is provided with a conductive end, the detection part is provided with a detection circuit, and the conductive end is electrically connected to the detection circuit. The rotating part is provided with a docking end, and the docking end is electrically connected to the connecting part. The connecting part can be directly or indirectly electrically connected to the electromagnetic interference tester. When the detection part rotates relative to the rotating part to the test position, the docking end is electrically connected to the conductive end. When the detection part rotates relative to the rotating part to the non-test position, the docking end is disconnected from the conductive end.

[0009] The beneficial effects of such a design are as follows: After the connecting part is directly or indirectly connected to the electromagnetic interference tester at one time, the test requirements of multiple functions can be met. That is, when the required detection part is rotated to the test position, the instrument can be connected to conduct the test, without the need to repeatedly disassemble and replace the probe. That is, multiple probes are installed together, and the connection state is directly controlled by rotation without operating other switches. The instrument can be connected at the rotated test position and disconnected at other positions, which is convenient and fast. For the electromagnetic interference test of some complex products, it may be necessary to frequently switch the probes. Using the probe of the present application can achieve rapid switching, greatly saving the test time, increasing the detection range of the probe without basically changing the performance of the probe. Compared with the prior art, the test efficiency for complex products is greatly increased. Especially when applied to Internet of Things probes, the number of robotic arms is greatly reduced. One robotic arm can complete multiple tests, and there is no need to set multiple probe connection positions, avoiding affecting the probe detection, improving the detection stability and reducing the labor cost.

[0010] Further, the rotating ring is provided with a rotating hole, and the rotating part is provided with a rotating shaft. The rotating hole and the rotating shaft are matched in size. The conductive end is located on the inner surface of the rotating hole, and the docking end is located on the outer surface of the rotating shaft. In this way, multiple rotating rings can be installed through one rotating shaft, and the installation is convenient and simple.

[0011] Further, the detection part includes an upper detection part, a middle detection part, and a lower detection part. The rotating ring includes an upper rotating ring, a middle rotating ring, and a lower rotating ring. The upper detection part has one located above the middle detection part, the middle detection part has at least one, and the lower detection part has one located below the middle detection part. The upper detection part is fixedly connected to the upper rotating ring, the middle detection part is fixedly connected to the middle rotating ring, and the lower detection part is fixedly connected to the lower rotating ring. In this way, one probe is equivalent to at least the functions of 3 existing probes, and the requirements for different resolutions, different detection ranges, and different functions can be realized.

[0012] Further, the outer surface of the rotating shaft is a conical surface. The upper rotating ring is provided with an upper rotating hole, the middle rotating ring is provided with a middle rotating hole, and the lower rotating ring is provided with a lower rotating hole. The upper rotating hole, the middle rotating hole, and the lower rotating hole are all conical surfaces with different radii and are matched with the rotating shaft. Such a design can not only lock the rotating rings together when the rotating shaft moves axially, but also tightly connect the conductive end and the docking end that need to be connected at the test position, avoiding deviation of the detection results caused by poor contact.

[0013] Further, the rotating part is provided with a positioning wheel. The positioning wheel is fixed to the lower end of the rotating shaft in a threaded manner. The upper end of the positioning wheel abuts against the lower surface of the lower rotating ring. The upper end of the rotating shaft is provided with a limiting part, and the lower end of the limiting part abuts against the upper rotating ring. In this way, the locking function of the rotating ring is realized by controlling the clamping force on the rotating ring through the distance between the positioning wheel and the limiting part.

[0014] Furthermore, the limiting part includes an abutting cam, a vertical shaft, and an eccentric cam. The rotating shaft is fixedly perpendicular to the vertical shaft. The outer surface of the eccentric cam is provided with a cylindrical surface that matches the upper surface of the abutting cam. The lower surface of the abutting cam is provided with an annular plane that directly or indirectly abuts against the upper plane of the upper rotating ring. The eccentric cam is provided with an eccentric circular hole. The central axis of the eccentric circular hole deviates from the central axis of the cylindrical surface by a certain distance and the central axis of the eccentric circular hole is parallel to the central axis of the cylindrical surface. The vertical shaft is installed in the eccentric circular hole so that the eccentric cam can rotate relative to the rotating shaft. The positioning wheel is fixed to the lower end of the rotating shaft. The upper end of the positioning wheel abuts against the lower surface of the lower rotating ring. In this way, rotating the eccentric cam can quickly control the distance between the abutting cam and the positioning wheel, achieving rapid locking. The abutting cam only provides an axial force to the rotating ring and does not affect the rotation angle of the rotating ring. The eccentric cam can achieve the locking function when the eccentric distance is small. For this application, the eccentric distance is about 1 mm, and the self-locking function can be fully realized, that is, rotating the eccentric cam can quickly lock and unlock.

[0015] Furthermore, the rotating part is provided with a positioning bracket that can be clamped. The positioning bracket includes a rotating ring, a connecting rod, and a positioning plate. The rotating ring is connected to the connecting rod. The inner hole of the rotating ring matches the cylindrical surface of the eccentric cam. The positioning plate is perpendicular to the connecting rod. Multiple positioning holes are provided on the side surface of the positioning plate. The test end is fixedly connected to the rotating ring through a transition rod. The transition rod matches the positioning holes so that after the rotating ring rotates to a certain angle, the transition rod can be clamped and positioned through the positioning holes. In this way, the detection part in the non-test position can be neatly clamped into the positioning holes of the positioning plate. Of course, the clamping position can also be set as the test position, so that the positioning is more accurate. The detection part in the non-test position uses other structures to achieve locking and positioning.

[0016] Furthermore, the rotating ring is provided with a clamping post. On the side of the positioning plate opposite to the positioning holes, there is a clamping hole that matches the size of the clamping post. Different transition rods are bent at a certain angle at a certain position so that different detection parts are located in different directions. The detection part provided with the clamping post can achieve precise positioning in both the test position and the non-test position. Other locking structures may not be used, or it can be used together with other locking structures.

[0017] Furthermore, an arc-shaped abutting surface that matches the rotating ring is provided on the side of the positioning plate close to the rotating ring. The positioning plate is made of an elastic material. The eccentric cam is provided with a locking handle. The arc-shaped abutting surface can achieve the positioning of the positioning plate to prevent the positioning plate from rotating and being unable to achieve clamping after the position is changed. Setting the locking handle makes it more labor-saving to rotate the eccentric cam.

[0018] A testing method for a probe of an electromagnetic interference tester. Using the probe of the electromagnetic interference tester described above, first, rotate the locking handle to the non-locking position, select a suitable detection part according to the test requirements, rotate the selected detection part to the test position and snap the clamping post into the clamping hole; secondly, rotate the remaining detection parts to the non-test position so that the transition rod is snapped into the positioning hole; thirdly, rotate the locking handle to the locking position and check whether the rotating ring is locked. If it is not locked, adjust the locking force by rotating the positioning wheel to achieve locking; finally, rotate the locking handle to the non-locking position, replace the detection part and repeat the above steps for testing or rotate the detection part to the non-test position to stop the test. By adopting this testing method, rapid switching of the detection part can be achieved, with higher detection efficiency for complex products. There is no need to frequently disassemble and replace the probe, and it can be achieved by rotating the detection part. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 Schematic perspective view of Embodiment 1 of the present invention;

[0020] Figure 2 Another perspective schematic perspective view of Embodiment 1 of the present invention;

[0021] Figure 3 Schematic locking state view of Embodiment 1 of the present invention;

[0022] Figure 4 Schematic unlocking state view of Embodiment 1 of the present invention;

[0023] Figure 5 Schematic perspective view of the main structure of the rotating part of Embodiment 1 of the present invention;

[0024] Figure 6 Schematic perspective view of the connection state of the rotating shaft and the vertical shaft of Embodiment 1 of the present invention;

[0025] Figure 7 Exploded schematic view of the main structure of the rotating part of Embodiment 1 of the present invention;

[0026] Figure 8 Schematic connection view of the detection part and the rotating ring of Embodiment 1 of the present invention;

[0027] Figure 9 Schematic perspective view of Embodiment 2 of the present invention;

[0028] Figure 10 Schematic locking state view of Embodiment 2 of the present invention;

[0029] Figure 11 Schematic perspective view of the positioning plate of Embodiment 2 of the present invention;

[0030] Figure 12 Schematic connection view of the detection part and the rotating ring of Embodiment 2 of the present invention;

[0031] Figure 13 Schematic diagram of the rotating shaft and connecting components of Embodiment 2 of the present invention;

[0032] Figure 14 Schematic diagram of the rotating shaft and connecting components of Embodiment 3 of the present invention;

[0033] Figure 15 Schematic three-dimensional diagram of Embodiment 5 of the present invention;

[0034] Figure 16 Schematic diagram of the rotating shaft and connecting arm of Embodiment 5 of the present invention;

[0035] In the figure: 1, detection part; 2, rotating part; 3, connecting part; 4, positioning frame; 5, transition rod; 6, connecting arm; 7, rotating wheel; 8, driving wheel; 9, moving shaft; 10, robotic arm; 11, test end; 12, upper detection part; 13, middle detection part; 14, electric field detection part; 15, lower detection part; 16, detection rod; 17, mating connection terminal; 20, clamping post; 21, rotating ring; 22, conductive end; 23, docking end; 24, rotating hole; 25, rotating shaft; 26, positioning wheel; 27, limiting part; 28, abutting cam; 29, vertical shaft; 30, eccentric cam; 31, bushing; 32, through hole; 33, eccentric round hole; 34, arc groove; 35, locking handle; 40, rotating ring; 41, left rotating ring; 42, right rotating ring; 43, connecting rod; 44, positioning plate; 45, positioning hole; 46, clamping hole; 51, screw connection terminal; 211, upper rotating ring; 212, middle rotating ring; 213, electric field rotating ring; 214, lower rotating ring; 241, upper rotating hole; 242, middle rotating hole; 243, lower rotating hole. Detailed implementation manners

[0036] As required, detailed embodiments of the present invention are disclosed herein, but it should be understood that the disclosed embodiments are only illustrative of the present invention, and the present invention can be implemented in different and alternative forms. The drawings are not drawn to scale, the eccentric cam is exaggerated, and the size of the detection part is reduced to show the details of the rotating part. In addition, up, down, left, and right are relative orientations in the view, and the upper orientation of the rotating probe in actual use may also be located below the actual position. Therefore, the specific structures and functional details disclosed herein should not be construed as limiting, but only as a representative basis to teach those skilled in the art to adopt the present invention differently. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the present invention without creative efforts shall fall within the protection scope of the present invention.

[0037] Embodiment 1:

[0038] As Figure 1 , Figure 2 , Figure 3 ,Figure 4 and Figure 5 As shown, an electromagnetic interference tester probe includes a detection part 1, a rotating part 2 and a connecting part 3. The detection part 1 is provided with a test end 11, and the rotating part 2 is provided with a rotating ring 21. The test end 11 is fixedly connected to the rotating ring 21. There are multiple detection parts 1, and the rotating ring 21 is fixed to the rotating part 2 in a manner that can rotate relative to the rotating part 2. The rotating ring 21 rotates relative to the rotating part 2 through a transmission structure under manual or Internet of Things control. The rotating ring 21 is provided with a conductive end 22. The test end 11 of the detection part 1 is provided with a detection circuit, and the detection circuit is a coil circuit for detecting magnetic field changes or a circuit for detecting electric fields. The conductive end 22 is electrically connected to the detection circuit. The non-test area of the entire circuit can be wrapped with a metal layer to shield interference signals. The rotating part 2 is provided with a docking end 23, and the docking end 23 is electrically connected to the connecting part 3. The connecting part 3 is a common wiring terminal that can be directly or indirectly electrically connected to an electromagnetic interference tester through a wire or an amplifier. When the detection part 1 rotates relative to the rotating part 2 to the test position, the docking end 23 is electrically connected to the conductive end 22. When the detection part 1 rotates relative to the rotating part 2 to the non-test position, the docking end 23 is disconnected from the conductive end 22.

[0039] As Figure 6 、 Figure 7 and Figure 8 shown, the docking end 23 and the conductive end 22 can be elastic conductive terminals, that is, elastic abutment is achieved by relying on a spring or an elastic metal sheet, so that the electrical conductivity is better. Multiple test positions and non-test positions can be set, but usually using one position is easier to operate. The range of the test position can be smaller than the range of the non-test position, and the test position and the non-test position can also be set opposite to each other at 180 degrees. The docking end 23 and the conductive end 22 can be designed as a pair, and a complete circuit can be realized by using an external shielding structure. They can also be designed as two pairs, so that a complete circuit can be directly formed by using the docking end 23 and the conductive end 22.

[0040] As Figure 8 shown, the rotating ring 21 is provided with a rotating hole 24, and the rotating part 2 is provided with a rotating shaft 25. The rotating hole 24 and the rotating shaft 25 are of matching sizes. The conductive end 22 is located on the inner surface of the rotating hole 24, and the docking end 23 is located on the outer surface of the rotating shaft 25.

[0041] As Figure 1 、 Figure 7 and Figure 8As shown, the detection unit 1 includes an upper detection unit 12, a middle detection unit 13, an electric field detection unit 14, and a lower detection unit 15. The rotating ring 21 includes an upper rotating ring 211, a middle rotating ring 212, an electric field rotating ring 213, and a lower rotating ring 214. The upper detection unit 12 has one located above the middle detection unit 13. The middle detection unit 13 has at least one. The lower detection unit 15 has one located below the middle detection unit 13. The electric field detection unit 14 can be set as the middle detection unit 13 above the lower detection unit 15. The upper detection unit 12 is fixedly connected to the upper rotating ring 211. The middle detection unit 13 is fixedly connected to the middle rotating ring 212. The lower detection unit 15 is fixedly connected to the lower rotating ring 214.

[0042] As Figure 1 , Figure 7 and Figure 8 shown, the rotating part 2 is provided with a positioning wheel 26. The positioning wheel 26 is fixed to the lower end of the rotating shaft 25 in a threaded manner. To increase the friction, the outer surface of the positioning wheel 26 can be rubber-coated or designed with uneven patterns. The upper end of the positioning wheel 26 abuts against the lower surface of the lower rotating ring 214. The upper end of the rotating shaft 25 is provided with a limiting part 27. The lower end of the limiting part 27 abuts against the upper rotating ring 211.

[0043] As Figure 1 , Figure 5 , Figure 6 and Figure 7 shown, the rotating part 2 further includes a contact cam 28, a vertical shaft 29, and an eccentric cam 30. The rotating shaft 25 and the vertical shaft 29 are perpendicularly and fixedly connected to each other. For convenient installation, a bushing 31 perpendicular to the rotating shaft 25 is provided on the rotating shaft 25. The length of the bushing 31 is the same as or less than the diameter of the rotating shaft 25. The vertical shaft 29 is installed in the bushing 31. The outer surface of the eccentric cam 30 is provided with a cylindrical surface that matches the upper surface of the contact cam 28. The upper surface of the contact cam 28 is a concave cylindrical surface. The lower surface of the contact cam 28 is provided with an annular plane that directly or indirectly abuts against the upper plane of the upper rotating ring 211. The side surface of the contact cam 28 is a cylindrical surface. The center of the contact cam 28 is provided with a through hole 32 so that the rotating shaft 25 can pass through the through hole 32. The eccentric cam 30 is provided with an eccentric circular hole 33. The central axis of the eccentric circular hole 33 deviates from the central axis of the cylindrical surface by a certain distance and the central axis of the eccentric circular hole 33 is parallel to the central axis of the cylindrical surface. The vertical shaft 29 is installed in the eccentric circular hole 33 so that the eccentric cam 30 can rotate relative to the rotating shaft 25. The positioning wheel 26 is fixed to the lower end of the rotating shaft 25. The upper end of the positioning wheel 26 abuts against the lower surface of the lower rotating ring 214.

[0044] As Figure 1 , Figure 5 , Figure 6 and Figure 7As shown, for the convenience of the rotation of the eccentric cam 30, an arc-shaped groove 34 is provided in the middle area of the cylindrical surface of the eccentric cam 30. The width of the arc-shaped groove 34 is the same as or slightly larger than the diameter of the rotating shaft 25. In this way, when the eccentric cam 30 rotates relative to the rotating shaft 25, it will not interfere with the rotating shaft 25. The eccentric cam 30 is provided with a locking handle 35 to facilitate the rotation of the eccentric cam 30. The locking handle 35 extends outward from the cylindrical surface of the eccentric cam 30 in an arc shape and approaches the rotating ring 21 side when in the locking position. In this way, it occupies less space in the locking position and avoids interfering with the use of the probe.

[0045] As Figure 1 , Figure 5 , Figure 6 and Figure 7 shown, the rotating part 2 is provided with a positioning frame 4 that can be clamped. The positioning frame 4 includes a left rotating ring 41, a right rotating ring 42, a connecting rod 43, and a positioning plate 44. The left rotating ring 41 and the right rotating ring 42 are connected by the connecting rod 43. The left inner hole of the left rotating ring 41 and the right inner hole of the right rotating ring 42 are both matched with the cylindrical surface of the eccentric cam 30. The positioning plate 44 is perpendicular to the connecting rod 43. A plurality of positioning holes 45 are provided on the side of the positioning plate 44. The test end 11 and the rotating ring 21 are fixedly connected by a transition rod 5. The transition rod 5 is matched with the positioning holes 45 so that after the rotating ring 21 rotates to a certain angle, the transition rod 5 can be clamped and positioned through the positioning holes 45. The lower surface of the positioning hole 45 near one end of the positioning wheel 26 is designed with a certain taper. Since there is a certain axial displacement before and after the locking of the rotating ring 21 near one end of the positioning wheel 26, that is, it moves downward in the attached drawing, the positioning holes 45 are also adjusted accordingly to facilitate the rotation of the transition rod 5 into the positioning holes 45 to achieve clamping and positioning. The opening position of the positioning holes 45 is slightly smaller and has elasticity, which can achieve quick clamping.

[0046] As Figure 3 shown, in this state, the eccentric cam 30 is in the locked state. The upper rotating ring 211, the middle rotating ring 212, the electric field rotating ring 213, and the lower rotating ring 214 are tightly installed together and do not rotate relative to each other under the action of friction. At this time, the electromagnetic interference test is carried out, and the probe connection is very stable. The lower detection part 15 in the figure is in the test position, and the upper detection part 12, the middle detection part 13, and the electric field detection part 14 are in the non-detection position. The transition rod 5 is clamped with the positioning holes 45 in the non-test position.

[0047] As Figure 4 shown, in this state, the eccentric cam 30 is in the non-locked state. At this time, there is a large gap 215 between the positioning wheel 26 and the lower rotating ring 214. In the figure, it is appropriately exaggerated for obvious calibration. The actual gap is about 1 mm. In this way, it can be ensured that the upper rotating ring 211, the middle rotating ring 212, the electric field rotating ring 213, and the lower rotating ring 214 can rotate freely. The positioning holes 45 have a certain limiting effect, but with a relatively large force, the transition rod 5 can be disengaged from the positioning holes 45.

[0048] Example 2:

[0049] As Figure 9 , Figure 10 , Figure 11 , Figure 12 and Figure 13 shown, a transition rod 5 is provided on the side wall of the rotating ring 21. A spiral connection terminal 51 is provided on the transition rod 5. A detection rod 16 is provided on the detection part 1. A mating connection terminal 17 is provided on the detection rod 16 and is fixedly connected to the spiral connection terminal 51 by a thread. The spiral connection terminal 51 is matched with an existing near-field probe, and the existing near-field probe can be directly installed on the spiral connection terminal 51 for use. In this way, more probes can be compatible to achieve more detection functions. The rotating ring 21 is provided with a clamping post 20. A clamping hole 46 is provided on the side of the positioning plate 44 opposite to the positioning hole 45, and the size of the clamping hole 46 matches that of the clamping post 20. Different transition rods 5 are bent at a certain angle at a certain position so that different detection parts 1 are located in different directions. Multiple rotating rings 21 can be provided as needed, and the transition rods 5 can also be set in different directions as needed. The clamping post 20 and the transition rod 5 can be designed at a certain angle as needed, and the included angle range is about 90 degrees - 270 degrees.

[0050] As Figure 11 shown, an arc-shaped abutting surface is provided on the side of the positioning plate 44 close to the rotating ring 21 and is matched with the rotating ring 21. The positioning plate 44 is made of an elastic material. As Figure 10 shown, the eccentric cam 30 is provided with a locking handle 35.

[0051] Referring Figure 11 to Example 1, the rotating part 2 is provided with a positioning bracket 4 that can be clamped. The positioning bracket 4 includes a rotating ring 40, a connecting rod 43 and a positioning plate 44. The rotating ring 40 is connected to the connecting rod 43. The inner hole of the rotating ring 40 is matched with the cylindrical surface of the eccentric cam 30. The positioning plate 44 is perpendicular to the connecting rod 43. A plurality of positioning holes 45 are provided on the side surface of the positioning plate 44. The test end 11 is fixedly connected to the rotating ring 21 through the transition rod 5. The transition rod 5 is matched with the positioning holes 45 so that the transition rod 5 can be clamped and positioned through the positioning holes 45 after the rotating ring 21 rotates to a certain angle. The positioning wheel 26 and the rotating shaft 25 can be provided as an integral structure, and the rotating shaft 25 is connected to the vertical shaft 29 by a thread.

[0052] Example 3:

[0053] As Figure 8 and 14As shown, the outer surface of the rotating shaft 25 is conical. The docking end 23 is located on the conical surface of the rotating shaft 25. The upper rotating ring 211 is provided with an upper rotating hole 241, the middle rotating ring 212 is provided with a middle rotating hole 242, and the lower rotating ring 214 is provided with a lower rotating hole 243. The upper rotating hole 241, the middle rotating hole 242, and the lower rotating hole 243 are all conical surfaces with different radii and are matched with the rotating shaft 25. The positioning wheel 26 can be integrally formed with the rotating shaft 25, and the rotating shaft 25 is threadedly connected to the vertical shaft 29. Using elastic conductive terminals for a long time is likely to cause the elasticity to deteriorate. Relying on the conical surface to achieve fixed connection can ensure that it will not fail, and even if the connection becomes loose, it can be adjusted.

[0054] Embodiment 4:

[0055] A testing method for a probe of an electromagnetic interference tester, using the probe of the electromagnetic interference tester in the above embodiment. First, rotate the locking handle 35 to the non-locking position, that is, as Figure 4 shown, select a suitable detection part 1 according to the test requirements, rotate the selected detection part 1 to the test position and snap the clamping post 20 into the clamping hole 46; secondly, rotate the remaining detection parts 1 to the non-test position so that the transition rod 5 is snapped into the positioning hole 45; thirdly, rotate the locking handle 35 to the locking position, that is, as Figure 1 and Figure 3 shown, check whether the rotating ring 21 is locked. If not locked, adjust the locking force by rotating the positioning wheel 26 to achieve locking; finally, rotate the locking handle 35 to the non-locking position, replace the detection part 1 and repeat the above steps for testing or rotate the detection part 1 to the non-test position to stop the test.

[0056] Embodiment 5:

[0057] As Figure 12 、 Figure 15 and Figure 16As shown in the figure, an electromagnetic interference tester probe used in the Internet of Things environment includes a detection part 1, a rotating part 2 and a connecting arm 6. The detection part 1 is provided with a test end 11. An outer rotating ring 21 is provided on the rotating part 2. The test end 11 is fixedly connected to the rotating ring 21. There are multiple detection parts 1. Corresponding to this, multiple rotating rings 21 are provided and are fixed to the outside of the rotating shaft 25 of the rotating part 2 in a manner that can rotate relative to the rotating part 2. The rotating ring 21 is provided with a conductive end 22. The test end 11 of the detection part 1 is provided with a detection circuit. The detection circuit is a coil circuit for detecting magnetic field changes or a circuit for detecting an electric field. The conductive end 22 is electrically connected to the detection circuit. The non-test area of the entire circuit can be wrapped with a metal layer to shield interference signals. The rotating part 2 is provided with a docking end 23. The docking end 23 is electrically connected to the electromagnetic interference tester. When the detection part 1 rotates relative to the rotating part 2 to the test position, the docking end 23 is electrically connected to the conductive end 22. When the detection part 1 rotates relative to the rotating part 2 to the non-test position, the docking end 23 is disconnected from the conductive end 22. The connecting arm 6 is fixed to the lower end of the robotic arm 10. An axially moving driving structure and a circumferentially rotating driving member are provided inside the robotic arm 10, so that the robotic arm can drive the moving shaft 9 to move axially and drive the driving wheel 8 on the moving shaft 9 to rotate. There are multiple rotating rings 21 and each rotating ring 21 is provided with a rotating wheel 7. The rotating wheel 7 is a partial structure of a gear. The driving wheel 8 is a partial structure of a gear or a complete gear. The driving wheel 8 and the rotating wheel 7 have the same module so that the driving wheel 8 can mesh with the rotating wheel 7. When the moving shaft 9 drives the driving wheel 8, it can mesh with different rotating wheels 7 to realize the control of the positions of different detection parts 1. The rotating ring 21 can be reset by a spring or limited by an elastic snap ring structure, that is, under a small external force, the rotating ring 21 does not rotate, and under a large external force, the rotating ring 21 can rotate. The robotic arm 10 is controlled by the control system of the robot so that the robotic arm 10 can be controlled in an Internet of Things manner. Generally, the robot has a coordinate memory function. Therefore, when using this probe, an operator can first manually hold the probe and quickly perform a test position movement, so that each coordinate will be recorded. After that, automatic position movement can be carried out using Internet of Things technology. Of course, at key positions, the automatic position movement can be paused, and the probe can be remotely controlled manually using Internet of Things technology. After the test at the key position is completed, the position movement can continue. In this way, using Internet of Things technology, the change of the waveform can be focused on during the test, making the test simpler and more labor-saving.

Claims

1. An electromagnetic interference tester probe, characterized in that: The invention comprises a detection part (1), a rotating part (2) and a connecting part (3), wherein the detection part (1) is provided with a plurality of test ends (11), the rotating part (2) is provided with a plurality of rotating rings (21), each of the test ends (11) is connected and fixed to a corresponding rotating ring (21), the rotating ring (21) is fixed to the rotating part (2) in a manner that it can rotate relative to the rotating part (2), each of the rotating rings (21) can rotate relative to the rotating part (2) through a transmission structure under human power or Internet of Things control, each of the rotating rings (21) is provided with a conductive end (22), the detection part (1) The test end (11) is provided with a detection circuit, the conductive end (22) is electrically connected to the detection circuit, the rotating part (2) is provided with a docking end (23), the docking end (23) is electrically connected to the connecting part (3), the connecting part (3) can be directly or indirectly electrically connected to an electromagnetic interference tester, when the detection part (1) is rotated to a test position relative to the rotating part (2), the docking end (23) is electrically connected to the conductive end (22), and when the detection part (1) is rotated to a non-test position relative to the rotating part (2), the docking end (23) is electrically disconnected from the conductive end (22).

2. The electromagnetic interference tester probe according to claim 1, characterized in that: The rotating ring (21) is provided with a rotating hole (24), the rotating part (2) is provided with a rotating shaft (25), the rotating hole (24) and the rotating shaft (25) are matched in size, the conductive end (22) is located on the inner surface of the rotating hole (24), and the docking end (23) is located on the outer surface of the rotating shaft (25).

3. The electromagnetic interference tester probe according to claim 2, characterized in that: The detection part (1) comprises an upper detection part (12), a middle detection part (13) and a lower detection part (15); the rotating ring (21) comprises an upper rotating ring (211), a middle rotating ring (212) and a lower rotating ring (214); the upper detection part (12) is provided with one and is located above the middle detection part (13); the middle detection part (13) is provided with at least one; the lower detection part (15) is provided with one and is located below the middle detection part (13); the upper detection part (12) is fixedly connected to the upper rotating ring (211); the middle detection part (13) is fixedly connected to the middle rotating ring (212); and the lower detection part (15) is fixedly connected to the lower rotating ring (214).

4. The electromagnetic interference tester probe according to any one of claims 1 to 3, characterized in that: The rotating part (2) is provided with a positioning wheel (26), the positioning wheel (26) is fixed to the lower end of the rotating shaft (25) in a threaded manner, the upper end of the positioning wheel (26) abuts against the lower surface of the lower rotating ring (214), and the upper end of the rotating shaft (25) is provided with a limiting portion (27), and the lower end of the limiting portion (27) abuts against the upper rotating ring (211).

5. The electromagnetic interference tester probe according to claim 4, characterized in that: The limiting portion (27) comprises a contact cam (28), a vertical shaft (29), and an eccentric cam (30); the rotating shaft (25) and the vertical shaft (29) are fixed perpendicularly to each other; the outer surface of the eccentric cam (30) is provided with a cylindrical surface and matches the upper surface of the contact cam (28); the lower surface of the contact cam (28) is provided with an annular plane and directly or indirectly contacts the upper plane of the upper rotating ring (211); the eccentric cam (30) is provided with an eccentric circular hole (33); the vertical shaft (29) is mounted to the eccentric circular hole (33) so that the eccentric cam (30) can rotate relative to the rotating shaft (25); the positioning wheel (26) is fixed to the lower end of the rotating shaft (25); the upper end of the positioning wheel (26) contacts the lower surface of the lower rotating ring (214).

6. The electromagnetic interference tester probe according to claim 5, characterized in that: The rotating part (2) is provided with a positioning frame (4) capable of being clamped, the positioning frame (4) comprising a rotating ring (40), a connecting rod (43) and a positioning plate (44), the rotating ring (40) being connected to the connecting rod (43), the inner hole of the rotating ring (40) matching the cylindrical surface of the eccentric cam (30), the positioning plate (44) being perpendicular to the connecting rod (43), the side of the positioning plate (44) being provided with a plurality of positioning holes (45), the test end (11) being connected and fixed to the rotating ring (21) via a transition rod (5), the transition rod (5) matching the positioning hole (45) so that after the rotating ring (21) is rotated to a certain angle, the transition rod (5) can be clamped and positioned through the positioning hole (45).

7. The electromagnetic interference tester probe according to claim 6, characterized in that: The rotating ring (21) is provided with a clamping column (20), and a clamping hole (46) is provided on the side of the positioning plate (44) facing away from the positioning hole (45), which matches the size of the clamping column (20), and different transition rods (5) are bent at certain positions at certain angles so that different detection parts (1) are located in different directions.

8. The electromagnetic interference tester probe according to claim 7, characterized in that: The positioning plate (44) is provided with an arc-shaped abutting surface on one side close to the rotating ring (21) to match the rotating ring (21); the positioning plate (44) is made of elastic material; and the eccentric cam (30) is provided with a locking handle (35).

9. The electromagnetic interference tester probe according to claim 8, characterized in that: The outer surface of the rotating shaft (25) is in the form of a conical surface, the upper rotating ring (211) is provided with an upper rotating hole (241), the middle rotating ring (212) is provided with a middle rotating hole (242), and the lower rotating ring (214) is provided with a lower rotating hole (243); the upper rotating hole (241), the middle rotating hole (242), and the lower rotating hole (243) are all in the form of conical surfaces with different radii and match the rotating shaft (25).

10. A method for testing an electromagnetic interference tester probe, characterized in that: Using the electromagnetic interference tester probe of claim 9, firstly, the locking handle (35) is rotated to the unlocking position, and a suitable detection part (1) is selected according to the test requirements, the selected detection part (1) is rotated to the test position and the clamping column (20) is clamped to the clamping hole (46); secondly, the remaining detection parts (1) are rotated to the non-testing position so that the transition rod (5) is clamped to the positioning hole (45); the locking handle (35) is rotated to the locking position again to check whether the rotating ring (21) is locked, and if not locked, the locking force is adjusted by rotating the positioning wheel (26) to achieve locking; finally, the locking handle (35) is rotated to the unlocking position, the detection part (1) is replaced, and the above steps are repeated to perform the test or the detection part (1) is rotated to the non-testing position to stop the test.

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