Data calibration method, chip and device for time-interleaved analog-to-digital converter

Abstract

The present invention discloses a data calibration method, chip and device for a time-interleaved analog-to-digital converter, and relates to the technical field of time-interleaved analog-to-digital converters. The method comprises: obtaining the original sampling data of the target channel of the time-interleaved analog-to-digital converter ADC, the original sampling data being the data obtained by sampling a preset number of sub-ADCs of the target channel, determining the time deviation corresponding to each sub-ADC according to the original sampling data, for each sub-ADC, using a preset delay function based on the time deviation corresponding to the current sub-ADC and the preset order of the preset time delay filter, determining the filter coefficient corresponding to the current sub-ADC, using the preset time delay filter, based on the filter coefficients corresponding to each sub-ADC, filtering the original sampling data. By adopting the above technical solution, the calibration accuracy of the sampling data of the time-interleaved analog-to-digital converter can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of time-interleaved analog-to-digital converters, and in particular to a data calibration method, chip and device for a time-interleaved analog-to-digital converter. Background Art

[0002] Analog-to-Digital Converters (ADC) are an important field in the integrated circuit industry. As a bridge between analog and digital, ADCs convert analog signals generated in daily life into digital signals. ADCs have been used in many scenarios such as 5G communications, optical communications, phased radar, and image acquisition. With the development of emerging fields such as artificial intelligence and the Internet of Things, there are increasingly higher requirements for the speed and accuracy of data acquisition. In today's ADC analog circuit design, there are huge challenges in designing ADCs with high sampling rate and high precision. Therefore, the time interleaving technology is used to design ADCs to meet the application requirements of high speed and high precision.

[0003] For time-interleaved ADC, sampling time mismatch seriously restricts its performance, and a certain calibration scheme is needed to calibrate the sampling data of time-interleaved ADC. Currently, the commonly used solutions for sampling time mismatch are analog domain calibration and digital domain calibration.

[0004] However, the accuracy of existing calibration schemes still needs to be improved. Summary of the invention

[0005] The present invention provides a data calibration method, device, chip, equipment, medium and product for a time-interleaved analog-to-digital converter, which can solve the problem of low accuracy when calibrating the sampling data of the time-interleaved ADC.

[0006] According to one aspect of the present invention, there is provided a data calibration method for a time-interleaved analog-to-digital converter, comprising:

[0007] Acquire original sampling data of a target channel of a time-interleaved analog-to-digital converter ADC, wherein the original sampling data is data obtained by sampling a preset number of sub-ADCs of the target channel;

[0008] Determine the time deviation corresponding to each of the sub-ADCs according to the original sampling data;

[0009] For each of the sub-ADCs, using a preset delay function based on a time deviation corresponding to the current sub-ADC and a preset order of a preset delay filter, determine a filter coefficient corresponding to the current sub-ADC;

[0010] The preset time delay filter is used to filter the original sampled data based on the filter coefficients corresponding to each of the sub-ADCs.

[0011] According to another aspect of the present invention, there is provided a data calibration device for a time-interleaved analog-to-digital converter, comprising:

[0012] A raw data acquisition module, used to acquire raw sampled data of a target channel of a time-interleaved analog-to-digital converter ADC, wherein the raw sampled data is data sampled by a preset number of sub-ADCs of the target channel;

[0013] A time deviation determining module, configured to determine a time deviation corresponding to each of the sub-ADCs according to the original sampling data;

[0014] A filter coefficient determination module, configured to determine, for each of the sub-ADCs, a filter coefficient corresponding to the current sub-ADC using a preset delay function based on a time deviation corresponding to the current sub-ADC and a preset order of a preset delay filter;

[0015] The filtering processing module is used to use the preset time delay filter to filter the original sampling data based on the filter coefficients corresponding to each of the sub-ADCs.

[0016] According to another aspect of the present invention, a chip is provided, wherein the chip comprises a computer program, and when the computer program is executed in the chip, the data calibration method for a time-interleaved analog-to-digital converter described in any embodiment of the present invention is implemented.

[0017] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:

[0018] At least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can perform the data calibration method for the time-interleaved analog-to-digital converter described in any embodiment of the present invention.

[0019] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the data calibration method for a time-interleaved analog-to-digital converter described in any embodiment of the present invention when executed.

[0020] According to another aspect of the present invention, a computer program product is provided. The computer program product comprises a computer program. When the computer program is executed by a processor, the computer program implements the data calibration method for a time-interleaved analog-to-digital converter according to any embodiment of the present invention.

[0021] The data calibration scheme for a time-interleaved analog-to-digital converter of an embodiment of the present invention obtains the original sampling data of the target channel of the time-interleaved analog-to-digital converter ADC, the original sampling data is the data obtained by sampling a preset number of sub-ADCs of the target channel, the time deviation corresponding to each sub-ADC is determined according to the original sampling data, and for each sub-ADC, a preset delay function is used based on the time deviation corresponding to the current sub-ADC and the preset order of the preset delay filter to determine the filter coefficient corresponding to the current sub-ADC, and the preset delay filter is used to filter the original sampling data based on the filter coefficients corresponding to each sub-ADC. By adopting the above technical scheme, for each sub-ADC in a single channel of the time-interleaved analog-to-digital converter, the corresponding filter coefficient for filtering can be determined according to the corresponding time deviation and filter order, so that the data collected by each sub-ADC can be personalized and accurately filtered, so as to realize accurate calibration of the sampling data of each sub-ADC in the time-interleaved ADC, thereby improving the calibration accuracy of the sampling data of the overall time-interleaved analog-to-digital converter.

[0022] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0024] Figure 1 is a flow chart of a data calibration method for a time-interleaved analog-to-digital converter provided according to an embodiment of the present invention;

[0025] Figure 2 is a flow chart of another data calibration method for a time-interleaved analog-to-digital converter provided according to an embodiment of the present invention;

[0026] Figure 3 This is a schematic diagram of sampling data splitting provided by an embodiment of the present invention;

[0027] Figure 4is a schematic diagram of a phase deviation determination process provided by an embodiment of the present invention;

[0028] Figure 5 is a flow chart of another data calibration method for a time-interleaved analog-to-digital converter provided according to an embodiment of the present invention;

[0029] Figure 6 is a schematic diagram of a filtering process provided by an embodiment of the present invention;

[0030] Figure 7 is a structural schematic diagram of a data calibration device for a time-interleaved analog-to-digital converter provided according to an embodiment of the present invention;

[0031] Figure 8 It is a structural schematic diagram of an electronic device for implementing a data calibration method for a time-interleaved analog-to-digital converter according to an embodiment of the present invention. DETAILED DESCRIPTION

[0032] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0033] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0034] Figure 1It is a flow chart of a data calibration method for a time-interleaved analog-to-digital converter provided according to an embodiment of the present invention. This embodiment is applicable to the case of filtering the sampled data of the time-interleaved analog-to-digital converter. The method can be executed by a data calibration device for the time-interleaved analog-to-digital converter. The data calibration device for the time-interleaved analog-to-digital converter can be implemented in the form of hardware and / or software. The data calibration device for the time-interleaved analog-to-digital converter can be configured in a chip or an electronic device. Among them, the chip can be an application-specific integrated circuit (Application Specific Integrated Circuit, ASIC) chip, specifically a chip integrated with a time-interleaved analog-to-digital converter (hereinafter referred to as ADC) (referred to as a time-interleaved ADC chip or ADC chip), and the chip can also be a chip that can establish a connection relationship with the ADC chip (referred to as an external chip), such as a field programmable gate array (Field Programmable Gate Array, FPGA) chip, etc. The electronic device can be a device integrated with the above chip, such as a device integrated with the above ASIC chip, and specifically can be a device in various fields, including but not limited to communication equipment (such as 5G equipment or optical communication equipment), instrumentation equipment (such as oscilloscopes), radar equipment (such as vehicle-mounted laser radar or radar in electronic countermeasures) and medical security imaging equipment, etc. The electronic device may also be a computer, a server or other device, and the data calibration method for the time-interleaved analog-to-digital converter may be processed as software running in the electronic device.

[0035] like Figure 1 As shown, the method includes:

[0036] Step 101: Acquire original sampling data of a target channel of a time-interleaved analog-to-digital converter ADC, wherein the original sampling data is data obtained by sampling a preset number of sub-ADCs of the target channel.

[0037] The ADC in the embodiment of the present invention may include one or more channels, each channel includes multiple sub-ADCs, and the number of channels and the specific number of sub-ADCs in each channel are not limited. The target channel may be any channel in the ADC. If there are multiple channels in the ADC, each channel may be used as a target channel, and filtering processing is performed separately by adopting the data calibration scheme for the time-interleaved analog-to-digital converter provided by the embodiment of the present invention.

[0038] For example, taking a four-channel high-speed and high-precision ADC chip with a sampling rate of 10Ghz and a resolution of 10bit as an example, there are a total of 128 sub-ADCs, each of which has an operating frequency of 312.5Mhz. The overall ADC has 4 channels, and each channel uses 32 sub-ADCs to interleave to obtain a sampling rate of 10Ghz. Each of the 4 channels can be used as a target channel to execute the data calibration method for the time-interleaved analog-to-digital converter in the embodiment of the present invention.

[0039] In the embodiment of the present invention, data sampled by a preset number of sub-ADCs of the target channel is recorded as original sampling data. For example, in the above example, the preset number is 32, and the original sampling data is the sampling data obtained by interleaving the sampling order of the 32 sub-ADCs.

[0040] Exemplarily, in the case of executing the data calibration method for a time-interleaved analog-to-digital converter of an embodiment of the present invention within an ADC chip, the sampling data output by the ADC module can be directly obtained from the inside of the chip as the original sampling data; for an external chip, the original sampling data can be captured from the output of the ADC chip; for an electronic device, the original sampling data captured and forwarded by the external chip from the output of the ADC chip can be received.

[0041] Step 102: Determine the time deviation corresponding to each of the sub-ADCs according to the original sampling data.

[0042] The time deviation in the embodiment of the present invention can also be recorded as skew deviation, which is generally in the picosecond (ps) level. For each sub-ADC of the target channel, the corresponding time deviation is determined respectively, and the specific calculation method is not limited. For example, the phase deviation of each sub-ADC can be calculated first, and then the corresponding time deviation can be determined according to the phase deviation.

[0043] Step 103: for each of the sub-ADCs, determine a filter coefficient corresponding to the current sub-ADC by using a preset delay function based on a time deviation corresponding to the current sub-ADC and a preset order of a preset delay filter.

[0044] Exemplarily, the preset time delay filter may be a finite impulse response filter (FIR), a fractional delay filter, an all-pass filter or a linear phase FIR filter, etc. The order of the filter may be the number of coefficients in a set of filter coefficients (also referred to as a filter coefficient group). Generally, the higher the order of the filter, the better the filtering effect, but the higher the amount of calculation, therefore, the order used may be determined according to the actual filtering requirements, and is referred to as the preset order.

[0045] In the embodiment of the present invention, for each sub-ADC of the target channel, the corresponding filter coefficient is determined by using the corresponding time deviation and the preset order, and is specifically determined by using a preset delay function. The preset delay function may be, for example, a Sinc function, a Lagrangian function, or a polynomial function (such as Hermite).

[0046] Step 104: Use the preset time delay filter to filter the original sampled data based on the filter coefficients corresponding to the sub-ADCs.

[0047] Exemplarily, after determining the filter coefficients corresponding to each sub-ADC, for the original sampling data, determine which sub-ADC specifically collected each sampling data, and then use the filter coefficients corresponding to the sub-ADC to perform filtering processing to obtain accurate filtered data, so as to achieve calibration of the original sampling data.

[0048] The data calibration method for a time-interleaved analog-to-digital converter of an embodiment of the present invention obtains the original sampling data of the target channel of the time-interleaved analog-to-digital converter ADC, the original sampling data is the data obtained by sampling a preset number of sub-ADCs of the target channel, the time deviation corresponding to each sub-ADC is determined according to the original sampling data, and for each sub-ADC, a preset delay function is used based on the time deviation corresponding to the current sub-ADC and the preset order of the preset delay filter to determine the filter coefficient corresponding to the current sub-ADC, and the preset delay filter is used to filter the original sampling data based on the filter coefficients corresponding to each sub-ADC. By adopting the above technical solution, for each sub-ADC in a single channel of the time-interleaved analog-to-digital converter, the corresponding filter coefficient for filtering can be determined according to the corresponding time deviation and filter order, so that the data collected by each sub-ADC can be personalized and accurately filtered, thereby improving the calibration accuracy of the sampling data of the overall time-interleaved analog-to-digital converter.

[0049] Figure 2 1 is a flow chart of another method for calibrating data of a time-interleaved analog-to-digital converter according to an embodiment of the present invention. This embodiment is optimized on the basis of the above embodiment, and the steps for determining the filter coefficients are refined to improve the accuracy of the filter coefficients. Figure 2 As shown, the method includes:

[0050] Step 201: Acquire the original sampling data of the target channel of the ADC.

[0051] Step 202: Determine the time deviation corresponding to each sub-ADC according to the original sampling data.

[0052] Optionally, this step may include: splitting the original sampling data to obtain sub-acquisition data corresponding to each of the sub-ADCs; for each sub-ADC, determining a phase deviation of the current sub-ADC relative to the reference sub-ADC according to the sub-acquisition data corresponding to the current sub-ADC and the sub-acquisition data corresponding to the reference sub-ADC, and determining a corresponding time deviation according to the phase deviation; wherein the reference sub-ADC is one of the preset number of sub-ADCs. Thus, the time deviation corresponding to each sub-ADC can be accurately determined.

[0053] Exemplarily, the data collected on each channel of the ADC is obtained by interleaving the sampling data of a preset number of sub-ADCs. Therefore, in order to calculate the phase deviation of each sub-ADC, the original sampling data is split into a preset number of portions of data according to the sampling order of the sub-ADCs. Each portion of data corresponds to data sampled by a sub-ADC and is recorded as sub-sampled data.

[0054] Figure 3 It is a sampling data splitting schematic diagram provided by an embodiment of the present invention. As exemplified in the foregoing, the target channel includes 32 sub-ADCs, and the data in the original sampling data are interleaved according to the sampling order of each sub-ADC. AD1 is the data sampled by sub-ADC1. All AD1s in the original sampling data are split out and merged into sub-sampling data corresponding to sub-ADC1 (sub-ADC1 data), and so on, to obtain sub-sampling data corresponding to the 32 sub-ADCs respectively.

[0055] Exemplarily, the reference sub-ADC may be any sub-ADC in the target channel, for example, the first sub-ADC. For each sub-sampled data, a Fast Fourier Transform (FFT) is performed to obtain the corresponding frequency domain data, determine the main frequency position in the frequency domain data, and calculate the phase angle value corresponding to each sub-ADC according to the main frequency position. For each sub-ADC, the difference between the phase angle values ​​of the current sub-ADC and the reference sub-ADC is calculated to obtain the corresponding phase deviation (also referred to as phase error).

[0056] For example, taking the reference sub-ADC as the first sub-ADC (sub-ADC1), Figure 4 is a schematic diagram of a phase deviation determination process provided by an embodiment of the present invention, such as Figure 4 As shown, except for ADC1, the difference between the phase angle value of each sub-ADC and the phase angle value of ADC1 is calculated to obtain the corresponding phase deviation. Among them, the phase deviation corresponding to ADC1 is 0.

[0057] Exemplarily, after the phase deviation is obtained, the phase deviation may be converted into a corresponding time deviation, such as calculating the corresponding time deviation according to the phase deviation and the frequency of the sampled signal.

[0058] Step 203: for each sub-ADC, calculate the difference between multiple target values ​​and the time deviation corresponding to the current sub-ADC, calculate the function value of the Sinc function with the difference as a variable, and determine the filter coefficient corresponding to the current sub-ADC according to the function value.

[0059] The values ​​of the multiple target values ​​constitute an arithmetic progression with 1 as the first term and the tolerance, and the number of the multiple target values ​​is equal to the preset order of the preset time delay filter.

[0060] In the embodiment of the present invention, the preset delay function is a Sinc function.

[0061] When the variable of the Sinc function is 0, the function value is 1; when the variable of the Sinc function is not 0, the function value is sin(πx) / πx, where x is the variable.

[0062] In the embodiment of the present invention, the difference between the target value and the time deviation is used as the variable of the Sinc function, assuming that the preset order is X, the target value is 1, 2, 3, ..., X, and each target value corresponds to one of a set of filter coefficients of the current sub-ADC. For example, if X is 5, the target value is 1, 2, 3, 4 and 5 respectively, and assuming that the time deviation is recorded as u, the variable x of the Sinc function is 1-u, 2-u, 3-u, 4-u and 5-u, thereby obtaining 5 filter coefficients.

[0063] By adopting the Sinc function, the data of the points that do not need to be moved can be attenuated to close to 0, while the data of the points that need to be moved is almost unaffected, so that each time deviation can be adjusted to achieve the effect of time shift and obtain the corresponding filter coefficient.

[0064] Optionally, after obtaining the function value, a preset process may be performed based on the function value to obtain a filter coefficient corresponding to the current sub-ADC. The preset process may include, for example, a windowing process.

[0065] Step 204: Use a preset time delay filter to filter the original sampled data based on the filter coefficients corresponding to each sub-ADC.

[0066] The data calibration method for a time-interleaved analog-to-digital converter provided in an embodiment of the present invention obtains the original sampling data of the target channel of the ADC, determines the time deviation corresponding to each sub-ADC, takes the difference between the target value determined according to the order of the preset filter and the time deviation as the Sinc function variable, and determines the filter coefficient corresponding to each sub-ADC according to the function value of the Sinc function, so that the filter coefficient corresponding to each sub-ADC can be determined more accurately, further improving the filtering effect.

[0067] Figure 5 This is a flowchart of another data calibration method for a time-interleaved analog-to-digital converter provided according to an embodiment of the present invention. This embodiment is optimized on the basis of the above embodiment, and refines the steps of filtering the original sampled data using a preset delay filter based on the filter coefficients corresponding to each sub-ADC, thereby further improving the filtering effect. Figure 5 As shown, the method includes:

[0068] Step 501: Acquire the original sampling data of the target channel of the ADC.

[0069] Step 502: Split the original sampling data to obtain sub-collection data corresponding to each sub-ADC.

[0070] Step 503 : for each sub-ADC, determine the phase deviation of the current sub-ADC relative to the reference sub-ADC according to the sub-acquisition data corresponding to the current sub-ADC and the sub-acquisition data corresponding to the reference sub-ADC, and determine the corresponding time deviation according to the phase deviation.

[0071] Optionally, the reference sub-ADC is the first sub-ADC of the target channel.

[0072] Step 504: for each sub-ADC, calculate the difference between the multiple target values ​​and the time deviation corresponding to the current sub-ADC, calculate the function value of the Sinc function with the difference as a variable, and determine the filter coefficient corresponding to the current sub-ADC according to the function value.

[0073] Step 505: According to the data sequence in the original sampled data, determine the current data to be filtered in the original sampled data in turn, determine the target sub-ADC that collects the current data to be filtered, use a preset delay filter, calculate the multiplication and accumulation value of the filter coefficient corresponding to the target sub-ADC and the current data to be filtered, and obtain the filtered data.

[0074] Wherein, the amount of data in the current data to be filtered is equal to the preset order.

[0075] Prior to this step, a set of filter coefficients corresponding to each sub-ADC has been determined, and the original sampled data is filtered using the determined filter coefficients, specifically, filtering is completed by multiplying and accumulating the original sampled data with the filter coefficients.

[0076] Figure 6 is a schematic diagram of a filtering process provided by an embodiment of the present invention, such as Figure 6 As shown, assuming that the preset order is X, each group of filter coefficients includes X filter coefficients. X data are obtained from the original sampled data in the order from the front to the back, respectively recorded as ADC data 1, ADC data 2, ADC data 3, ..., ADC data X, determine which sub-ADC these X data are collected by, and obtain the corresponding filter coefficients. If the first determined data to be filtered is collected by sub-ADC1, then the filter coefficient corresponding to sub-ADC1 is obtained, and each data is multiplied by the corresponding filter coefficient, such as ADC data 1 is multiplied by filter coefficient 1, ADC data 2 is multiplied by filter coefficient 2, and so on. Finally, the sum of the X products is calculated to obtain the filtered data corresponding to the current data to be filtered.

[0077] Exemplarily, after obtaining the filtered data corresponding to the current data to be filtered, determine whether there is any data that has not been filtered in the original sampling data. If so, continue to determine the new current data to be filtered based on the data order in the original sampling data, and perform corresponding filtering until all the data in the original sampling data have been filtered.

[0078] Optionally, according to the data sequence in the original sampled data, the current data to be filtered in the original sampled data is determined in sequence, which may specifically include: supplementing the target number of data before and after the original sampled data to obtain the original sampled data after complement, wherein the target number is determined according to the preset order; according to the data sequence in the original sampled data after complement, the current data to be filtered in the original sampled data after complement is determined in sequence. The advantage of such a setting is that it can avoid the original first data from being unable to obtain data in front for filtering.

[0079] Exemplarily, in a set of filter coefficients, the filter coefficient in the middle usually has the largest value. In order to ensure that the first data can be multiplied by the filter coefficient with the largest value, a certain amount of data can be supplemented before the original sampling data. The value of the supplemented data can be 0, and the target number can be (preset order - 1) / 2.

[0080] The data calibration method for a time-interleaved analog-to-digital converter provided by an embodiment of the present invention obtains the original sampling data of the target channel of the ADC, first splits the original sampling data to obtain the sub-acquisition data corresponding to each sub-ADC, determines the phase deviation of each sub-ADC relative to the first sub-ADC according to the sub-acquisition data of each sub-ADC, and then determines the time deviation corresponding to each sub-ADC according to the phase deviation. The difference between the target value determined according to the order of the preset filter and the time deviation is a Sinc function variable, and the filter coefficient corresponding to each sub-ADC is determined according to the function value of the Sinc function. According to the data sequence in the original sampling data, the current data to be filtered in the original sampling data is determined in turn, and the target sub-ADC for collecting the current data to be filtered is determined. The preset time delay filter is used to calculate the multiplication and accumulation value of the filter coefficient corresponding to the target sub-ADC and the current data to be filtered to obtain the filtered data, which can further improve the accuracy of the filtered data, better solve the sampling time deviation problem existing in the time-interleaved ADC, and improve the filtering effect.

[0081] It should be noted that the filter coefficients obtained in the embodiment of the present invention can be saved, and after obtaining the new original sampling data of the target channel, the saved filter coefficients can be directly used for filtering, thereby further improving the filtering efficiency. When the device with integrated ADC is restarted or needs to be calibrated, the method provided in the embodiment of the present invention can be used again to determine the filter coefficients corresponding to each sub-ADC of each channel.

[0082] Figure 7 1 is a schematic diagram of a data calibration device for a time-interleaved analog-to-digital converter according to an embodiment of the present invention. Figure 7 As shown, the device comprises:

[0083] The original data acquisition module 701 is used to acquire the original sampling data of the target channel of the time-interleaved analog-to-digital converter ADC, wherein the original sampling data is the data obtained by sampling a preset number of sub-ADCs of the target channel;

[0084] A time deviation determining module 702, configured to determine a time deviation corresponding to each of the sub-ADCs according to the original sampling data;

[0085] A filter coefficient determination module 703 is used to determine, for each of the sub-ADCs, a filter coefficient corresponding to the current sub-ADC using a preset delay function based on a time deviation corresponding to the current sub-ADC and a preset order of a preset delay filter;

[0086] The filtering processing module 704 is used to use the preset time delay filter to perform filtering processing on the original sampling data based on the filter coefficients corresponding to each of the sub-ADCs.

[0087] The data calibration device for a time-interleaved analog-to-digital converter in an embodiment of the present invention can determine the corresponding filter coefficients for filtering for each sub-ADC in a single channel of the time-interleaved analog-to-digital converter according to the corresponding time deviation and filter order, so that each sub-ADC can obtain personalized and accurate filtering processing, thereby improving the calibration accuracy of the sampling data of the overall time-interleaved analog-to-digital converter.

[0088] Optionally, the preset delay function is a Sinc function; wherein, the method of using the preset delay function to determine the filter coefficient corresponding to the current sub-ADC based on the time deviation corresponding to the current sub-ADC and the preset order of the preset delay filter includes: calculating the difference between multiple target values ​​and the time deviation corresponding to the current sub-ADC, wherein the values ​​of the multiple target values ​​constitute an arithmetic progression with 1 as the first term and a tolerance, and the number of the multiple target values ​​is equal to the preset order of the preset delay filter; calculating the function value of the Sinc function with the difference as a variable; and determining the filter coefficient corresponding to the current sub-ADC according to the function value.

[0089] Optionally, a time deviation determination module includes:

[0090] A data splitting unit, used for splitting the original sampling data to obtain sub-collected data corresponding to each sub-ADC;

[0091] A time deviation determining unit is used to determine, for each sub-ADC, a phase deviation of the current sub-ADC relative to the reference sub-ADC according to sub-acquisition data corresponding to the current sub-ADC and sub-acquisition data corresponding to the reference sub-ADC, and determine a corresponding time deviation according to the phase deviation; wherein the reference sub-ADC is one of the preset number of sub-ADCs.

[0092] Optionally, the filtering processing module is used to: determine the current data to be filtered in the original sampling data in sequence according to the data order in the original sampling data, determine the target sub-ADC for collecting the current data to be filtered, use the preset time delay filter, calculate the multiplication and accumulation value of the filter coefficient corresponding to the target sub-ADC and the current data to be filtered, and obtain the filtered data, wherein the number of data in the current data to be filtered is equal to the preset order.

[0093] Optionally, determining the current data to be filtered in the original sampling data in sequence according to the data sequence in the original sampling data includes: supplementing a target number of data before and after the original sampling data to obtain the complemented original sampling data, wherein the target number is determined according to the preset order; determining the current data to be filtered in the complemented original sampling data in sequence according to the data sequence in the complemented original sampling data.

[0094] The data calibration device for a time-interleaved analog-to-digital converter provided in an embodiment of the present invention can execute the data calibration method for a time-interleaved analog-to-digital converter provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the execution method.

[0095] The embodiment of the present invention further provides a chip. The chip includes a computer program, and when the computer program is executed in the chip, the data calibration method for the time-interleaved analog-to-digital converter described in any embodiment of the present invention is implemented. Optionally, the chip is an ASIC chip or an FPGA chip. Optionally, the ASIC chip includes a time-interleaved ADC chip.

[0096] An embodiment of the present invention further provides an electronic device, wherein the electronic device is configured with a chip described in any of the embodiments of the present invention. The electronic device configured with the above-mentioned ASIC chip can be a device in various fields, including but not limited to communication equipment (such as 5G equipment or optical communication equipment), instrumentation equipment (such as oscilloscopes), radar equipment (such as vehicle-mounted laser radar or radar in electronic countermeasures), and medical security imaging equipment, etc.

[0097] Figure 8 A schematic diagram of the structure of an electronic device 10 that can be used to implement an embodiment of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or required herein.

[0098] like Figure 8As shown, the electronic device 10 includes at least one processor 11, and a memory connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 to the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. The input / output (I / O) interface 15 is also connected to the bus 14.

[0099] A number of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0100] The processor 11 may be a variety of general and / or dedicated processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 performs the various methods and processes described above, such as a data calibration method for a time-interleaved analog-to-digital converter.

[0101] In some embodiments, the data calibration method for the time-interleaved analog-to-digital converter may be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as a storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the data calibration method for the time-interleaved analog-to-digital converter described above may be performed. Alternatively, in other embodiments, the processor 11 may be configured to perform the data calibration method for the time-interleaved analog-to-digital converter in any other appropriate manner (e.g., by means of firmware).

[0102] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0103] Computer programs for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that when the computer program is executed by the processor, the functions / operations specified in the flow chart and / or block diagram are implemented. The computer program may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0104] In the context of the present invention, a computer-readable storage medium may be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, device, or equipment. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices, or equipment, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0105] To provide interaction with a user, the systems and techniques described herein may be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or trackball) through which the user can provide input to the electronic device. Other types of devices may also be used to provide interaction with the user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).

[0106] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0107] A computing system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The client and server relationship is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.

[0108] An embodiment of the present invention provides a computer program product, including a computer program, which, when executed by a processor, implements the data calibration method for a time-interleaved analog-to-digital converter provided by the above embodiment.

[0109] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.

[0110] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A data calibration method for a time-interleaved analog-to-digital converter, characterized in that: include: Acquire original sampling data of a target channel of a time-interleaved analog-to-digital converter ADC, wherein the target channel is any one channel of the ADC, and the original sampling data is data obtained by sampling a preset number of sub-ADCs of the target channel; the original sampling data includes at least one of sampling data output by an ADC module obtained from inside an ADC chip, sampling data captured by an external chip from the output of the ADC chip, and sampling data received by an electronic device and captured and forwarded by an external chip from the output of the ADC chip, wherein the external chip is a chip capable of establishing a connection relationship with the ADC chip; Determine the time deviation corresponding to each of the sub-ADCs according to the original sampling data; For each of the sub-ADCs, using a preset delay function based on a time deviation corresponding to the current sub-ADC and a preset order of a preset delay filter, determine a filter coefficient corresponding to the current sub-ADC; Using the preset time delay filter, based on the filter coefficients corresponding to each of the sub-ADCs, to perform filtering processing on the original sampled data; The step of determining the time deviation corresponding to each of the sub-ADCs according to the original sampling data includes: Splitting the original sampling data to obtain sub-collected data corresponding to each sub-ADC; For each sub-ADC, determine a phase deviation of the current sub-ADC relative to the reference sub-ADC according to the sub-acquisition data corresponding to the current sub-ADC and the sub-acquisition data corresponding to the reference sub-ADC, and determine a corresponding time deviation according to the phase deviation; wherein the reference sub-ADC is the first sub-ADC among the preset number of sub-ADCs; The preset delay function is a Sinc function; and the method of using the preset delay function to determine the filter coefficient corresponding to the current sub-ADC based on the time deviation corresponding to the current sub-ADC and the preset order of the preset delay filter includes: Calculating the difference between a plurality of target values ​​and the time deviation corresponding to the current sub-ADC, wherein the values ​​of the plurality of target values ​​constitute an arithmetic progression with 1 as the first term and a tolerance, and the number of the plurality of target values ​​is equal to a preset order of a preset delay filter; Taking the difference as a variable, calculating the function value of the Sinc function; A filter coefficient corresponding to the current sub-ADC is determined according to the function value.

2. The data calibration method for a time-interleaved analog-to-digital converter according to claim 1, characterized in that: The using the preset delay filter to filter the original sampled data based on the filter coefficients corresponding to each of the sub-ADCs includes: According to the data order in the original sampled data, the current data to be filtered in the original sampled data is determined in turn, and the target sub-ADC for collecting the current data to be filtered is determined. The preset time delay filter is used to calculate the multiplication and accumulation value of the filter coefficient corresponding to the target sub-ADC and the current data to be filtered to obtain filtered data, wherein the number of data in the current data to be filtered is equal to the preset order.

3. The data calibration method for a time-interleaved analog-to-digital converter according to claim 2, characterized in that: The step of sequentially determining the current data to be filtered in the original sampled data according to the data sequence in the original sampled data comprises: Supplementing a target number of data before and after the original sampling data to obtain the original sampling data after complementation, wherein the target number is determined according to the preset order; According to the data sequence in the original sampled data after the complement, the current data to be filtered in the original sampled data after the complement is determined in sequence.

4. A data calibration device for a time-interleaved analog-to-digital converter, characterized in that: include: A raw data acquisition module, used for acquiring raw sampling data of a target channel of a time-interleaved analog-to-digital converter ADC, wherein the target channel is any one channel of the ADC, and the raw sampling data is data obtained by sampling a preset number of sub-ADCs of the target channel; the raw sampling data includes at least one of sampling data output by an ADC module acquired from inside an ADC chip, sampling data captured by an external chip from the output of the ADC chip, and sampling data received by an electronic device and captured and forwarded by an external chip from the output of the ADC chip, wherein the external chip is a chip capable of establishing a connection relationship with the ADC chip; A time deviation determining module, configured to determine a time deviation corresponding to each of the sub-ADCs according to the original sampling data; A filter coefficient determination module, configured to determine, for each of the sub-ADCs, a filter coefficient corresponding to the current sub-ADC using a preset delay function based on a time deviation corresponding to the current sub-ADC and a preset order of a preset delay filter; A filtering processing module, configured to use the preset time delay filter to filter the raw sampled data based on the filter coefficients corresponding to the sub-ADCs; Wherein, the time deviation determination module includes: A data splitting unit, used for splitting the original sampling data to obtain sub-collected data corresponding to each sub-ADC; a time deviation determining unit, configured to determine, for each sub-ADC, a phase deviation of the current sub-ADC relative to the reference sub-ADC according to the sub-acquisition data corresponding to the current sub-ADC and the sub-acquisition data corresponding to the reference sub-ADC, and determine a corresponding time deviation according to the phase deviation; wherein the reference sub-ADC is the first sub-ADC among the preset number of sub-ADCs; Wherein, the preset delay function is a Sinc function; wherein, the method of using the preset delay function to determine the filter coefficient corresponding to the current sub-ADC based on the time deviation corresponding to the current sub-ADC and the preset order of the preset delay filter includes: calculating the difference between multiple target values ​​and the time deviation corresponding to the current sub-ADC, wherein the values ​​of the multiple target values ​​constitute an arithmetic progression with 1 as the first term and a tolerance, and the number of the multiple target values ​​is equal to the preset order of the preset delay filter; calculating the function value of the Sinc function with the difference as a variable; and determining the filter coefficient corresponding to the current sub-ADC according to the function value.

5. A chip, characterized in that: The chip comprises a computer program, and when the computer program is executed in the chip, the data calibration method for a time-interleaved analog-to-digital converter according to any one of claims 1-3 is implemented.

6. The chip according to claim 5, characterized in that: The chip is an application-specific integrated circuit ASIC chip or a field programmable gate array FPGA chip.

7. The chip according to claim 6, characterized in that: The ASIC chip includes a time-interleaved ADC chip.

8. An electronic device, characterized in that: The electronic device is configured with a chip as described in any one of claims 5 to 7.

9. An electronic device, characterized in that: The electronic device comprises: at least one processor; and a memory communicatively connected to the at least one processor; wherein, The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so as to enable the at least one processor to perform the data calibration method for a time-interleaved analog-to-digital converter according to any one of claims 1 to 3.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the data calibration method for a time-interleaved analog-to-digital converter according to any one of claims 1 to 3 when executed.

11. A computer program product, characterized in that The computer program product comprises a computer program, which, when executed by a processor, implements the data calibration method for a time-interleaved analog-to-digital converter according to any one of claims 1-3.

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