Mainboard testing equipment

Abstract

The invention provides mainboard testing equipment which comprises a first testing box body and a second testing box body, and the first testing box body and the second testing box body are arranged in a spaced mode. The supporting assembly comprises a mounting turntable, and the mounting turntable is rotatably arranged around a first axis; the clamping assembly is arranged on the mounting turntable, and the mounting turntable drives the clamping assembly to move between the first test box body and the second test box body; and the clamping assembly comprises a first clamping part and a second clamping part which are oppositely arranged, the first clamping part and the second clamping part are respectively used for clamping the to-be-detected workpiece, and the clamping assembly is arranged in a manner of being capable of overturning around a second axis so as to adjust the position of the to-be-detected workpiece through the first clamping part and the second clamping part. The problems that in the prior art, the mainboard performance testing time is long, the automation degree is low, and the testing efficiency is reduced are solved.

Description

Technical Field

[0001] The present invention relates to the technical field of server motherboard performance testing, and in particular to a motherboard testing device. Background Art

[0002] The motherboard is also called the machine board, system board or motherboard. It is generally divided into commercial motherboard and industrial motherboard. The motherboard is installed in the chassis or equipment. It is one of the most basic and important components of microcomputers, automation equipment, servers, etc. The motherboard is generally a rectangular circuit board, on which the main circuit system of the computer is installed, generally including BIOS chip, I / O control chip, keyboard and panel control switch interface, indicator light connector, expansion slot, DC power supply connector of the motherboard and plug-in card, etc. The motherboard generally adopts an open structure. Most motherboards have several expansion slots for the control cards (adapters) of PC peripheral devices to plug in. By replacing these plug-in cards, the corresponding subsystems of the microcomputer can be partially upgraded, giving manufacturers and users greater flexibility in configuring models. In short, the motherboard plays a pivotal role in the entire microcomputer, equipment, and server system. The type and grade of the motherboard determine the type and grade of the entire system. The performance of the motherboard affects the performance of the entire system.

[0003] With the development of digital technology, the output of servers and automation equipment in various fields has increased exponentially, and the demand for motherboards has increased rapidly. In order to improve the quality of motherboards, motherboard products are tested before leaving the factory to screen out defective products. There are generally two main ways to test motherboards in traditional ways: vertical testing and horizontal testing. The vertical test is to place the motherboard upright for testing, while the horizontal test is to place the motherboard horizontally for testing. In practice, no matter which test method is used, only one motherboard can be tested at a time. At the same time, during the test, only one side of the motherboard can be tested. When the other side of the motherboard needs to be tested, it needs to be manually taken out, and then the motherboard is turned around and tested again, resulting in a long test time, low automation, and low test efficiency. Summary of the invention

[0004] The main purpose of the present invention is to provide a motherboard testing device to solve the problems in the prior art that the motherboard performance test takes a long time, has a low degree of automation, and reduces the test efficiency.

[0005] In order to achieve the above-mentioned object, according to one aspect of the present invention, a motherboard testing device is provided, comprising: a first test box and a second test box, the first test box and the second test box are arranged at an interval; a supporting assembly, the supporting assembly comprising a mounting turntable, the mounting turntable being rotatably arranged around a first axis; a clamping assembly, arranged on the mounting turntable, and the clamping assembly is driven to move between the first test box and the second test box by the mounting turntable; the clamping assembly comprises a first clamping portion and a second clamping portion arranged opposite to each other, the first clamping portion and the second clamping portion are respectively used to clamp a workpiece to be tested, and the clamping assembly is flippably arranged around a second axis to adjust the position of the workpiece to be tested by the first clamping portion and the second clamping portion; when the mounting turntable rotates to the first position, the clamping assembly is opposite to the first test box, and the first working surface of the workpiece to be tested on the first clamping portion and the second clamping portion is detected simultaneously through the first test box; when the mounting turntable rotates to the second position, the clamping assembly is opposite to the second test box, the clamping assembly flips around the second axis, and the second working surface of the workpiece to be tested on the first clamping portion and the second clamping portion is detected simultaneously through the second test box.

[0006] Furthermore, there are at least two groups of clamping assemblies, which are spaced apart along the circumferential direction of the mounting turntable, so that the first test box and the second test box can simultaneously detect the workpieces to be tested in the two groups of clamping assemblies.

[0007] Furthermore, the first test box and / or the second test box includes: a test plug for being inserted into the workpiece to be tested to detect the workpiece to be tested; a first driving component connected to the test plug, and the first driving component is telescopically arranged to drive the test plug to move closer to or away from the mounting turntable.

[0008] Furthermore, the motherboard testing device also includes: a heat dissipation component, which is arranged above and / or below the clamping component, the heat dissipation component is opposite to the clamping component and is arranged at a distance, and the heat dissipation component is used to blow air flow to the clamping component to dissipate heat for the workpiece to be tested on the clamping component.

[0009] Furthermore, an installation slot is provided on the installation turntable, and the clamping assembly is installed in the installation slot. The support assembly also includes: a support shaft, which is provided on the side wall of the installation slot. The clamping assembly is connected to the support shaft, and the clamping assembly is flippably provided around the support shaft; wherein, there are multiple installation slots, and the multiple installation slots are spaced apart along the circumferential direction of the installation turntable. There are multiple groups of clamping assemblies, and the multiple clamping assemblies are provided in each installation slot one by one.

[0010] Furthermore, the clamping assembly also includes: a mounting frame connected to the supporting shaft, and the first clamping part and the second clamping part are respectively arranged on the mounting frame; a second driving component is arranged in the mounting frame, and the second driving component is divided into two groups, and the two groups of second driving components are connected to the first clamping part and the second clamping part one by one, so that the first clamping part and / or the second clamping part are in a clamping state or a released state.

[0011] Further, the first clamping part and / or the second clamping part includes: a first clamping plate and a second clamping plate; each group of second driving parts includes: two moving parts, the two moving parts are movably arranged in directions approaching or moving away from each other, the two moving parts are respectively connected to the first clamping plate and the second clamping plate, and the first clamping plate and the second clamping plate are driven to move by the two moving parts.

[0012] Furthermore, the first clamping plate includes a first plate segment and a second plate segment, the second clamping plate includes a third plate segment and a fourth plate segment, the first plate segment and the third plate segment are arranged opposite to each other, the second plate segment and the fourth plate segment are arranged opposite to each other, and the moving parts include a first moving part and a second moving part; each group of second driving parts also includes: a first threaded rod, two first moving parts are arranged on the first threaded rod at intervals, the thread directions of the two ends of the first threaded rod are opposite, and the two first moving parts are respectively threadedly connected to the two ends of the first threaded rod; a second threaded rod, two second moving parts are arranged on the second threaded rod at intervals, the thread directions of the two ends of the second threaded rod are opposite, and the two second moving parts are respectively threadedly connected to the two ends of the second threaded rod; a first driving gear is arranged in the mounting frame, and the first driving gear is rotatably arranged around its own axis; two second driving gears are respectively meshed with the first driving gear, and the two second driving gears are respectively sleeved on the first threaded rod and the second threaded rod to drive the first threaded rod and the second threaded rod to rotate.

[0013] Furthermore, the heat dissipation component includes: a ventilation pipe, which is passed through the mounting turntable and rotates relative to the ventilation pipe; and a blowing disc body, which is provided with a plurality of blowing holes, and the ventilation pipe is connected to the blowing disc body.

[0014] Furthermore, the motherboard testing device also includes: a mounting table, on which the first test box, the second test box and the supporting assembly are respectively arranged; a transferring component, which is movably arranged along a predetermined trajectory; a first conveying platform, which is used to convey the workpiece to be tested, and the transferring component is used to absorb the workpiece to be tested on the first conveying platform to the first clamping part and the second clamping part; a second conveying platform, which is arranged below the mounting turntable, and the mounting turntable is rotated to the third position, and the first clamping part or the second clamping part is switched to a released state, so that the unqualified workpiece to be tested that has completed the test falls onto the second conveying platform; a third conveying platform, which is arranged below the mounting turntable, and the mounting turntable is rotated to the fourth position, and the first clamping part or the second clamping part is switched to a released state, so that the qualified workpiece to be tested that has completed the test falls onto the third conveying platform.

[0015] According to the technical solution of the present invention, a motherboard testing device comprises a first test box, a second test box, a supporting assembly and a clamping assembly, wherein the first test box and the second test box are arranged at intervals, the supporting assembly comprises a mounting turntable, and the mounting turntable is rotatably arranged around a first axis; the clamping assembly is arranged on the mounting turntable, and the mounting turntable drives the clamping assembly to move between the first test box and the second test box; the clamping assembly comprises a first clamping portion and a second clamping portion arranged opposite to each other, the first clamping portion and the second clamping portion are respectively used to clamp a workpiece to be tested, and the clamping assembly is flippably arranged around a second axis to adjust the position of the workpiece to be tested through the first clamping portion and the second clamping portion; when the mounting turntable rotates to the first position, the clamping assembly is opposite to the first test box, and the first working surface of the workpiece to be tested on the first clamping portion and the second clamping portion is detected simultaneously through the first test box; when the mounting turntable rotates to the second position, the clamping assembly is opposite to the second test box, the clamping assembly flips around the second axis, and the second working surface of the workpiece to be tested on the first clamping portion and the second clamping portion is detected simultaneously through the second test box. In this way, the turntable is installed to drive the clamping assembly to rotate, so that it rotates to a relative position with the first test box or is set relative to the second test box. The first clamping part and the second clamping part are set on the clamping assembly, so that one group of clamping assemblies can clamp two workpieces to be tested at the same time. In this way, the first test box and the second test box can test the two workpieces to be tested at the same time, which greatly improves the test efficiency of the workpieces to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The drawings constituting a part of the present application are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0017] Figure 1 A schematic diagram showing a first viewing angle of a motherboard testing device according to the present invention is shown;

[0018] Figure 2A schematic diagram showing a second viewing angle of a motherboard testing device according to the present invention is shown;

[0019] Figure 3 Shown according to Figure 2 An enlarged view of part A;

[0020] Figure 4 A schematic diagram showing a first viewing angle of a clamping assembly in a motherboard testing device according to the present invention;

[0021] Figure 5 A schematic diagram showing a second viewing angle of a clamping assembly in a motherboard testing device according to the present invention;

[0022] Figure 6 A schematic diagram showing a third viewing angle of a motherboard testing device according to the present invention is shown;

[0023] Figure 7 Shown according to Figure 6 Magnified view of part B.

[0024] The above drawings include the following reference numerals:

[0025] 110, first test box; 120, second test box; 130, test plug; 140, first drive component; 200, support assembly; 210, mounting turntable; 211, mounting notch; 220, support shaft; 240, third drive component; 300, clamping assembly; 310, first clamping part; 320, second clamping part; 330, mounting frame; 340, second drive component; 311, first clamping plate; 312, second clamping plate; 341, moving component; 3110, first plate segment; 3111, second plate segment; 3120, The third plate section; 3121, the fourth plate section; 342, the first threaded rod; 343, the second threaded rod; 344, the first drive gear; 345, the second drive gear; 400, the heat dissipation component; 410, the vent pipe; 411, the blowing plate; 412, the blowing hole; 413, the blower; 414, the first connecting pipe; 415, the second connecting pipe; 500, the mounting platform; 600, the transfer component; 610, the mechanical arm; 620, the fixing seat; 630, the suction cup; 700, the first conveying platform; 800, the second conveying platform; 900, the third conveying platform;

[0026] 221, third driving gear; 250, fourth driving component; 251, transmission rack; 314, rubber pad; 346, second driving motor; 241, third driving motor; 242, third motor shaft; 243, fourth driving gear; 244, fifth driving gear. DETAILED DESCRIPTION

[0027] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0028] As mentioned in the background technology, before the server motherboard leaves the factory, its performance needs to be tested, specifically by plugging the plug into the jack on the motherboard and powering on the motherboard to ensure that the electrical connection performance of the motherboard is good. In the existing testing equipment, only one motherboard can be tested at a time, and because there are jacks on both sides of the motherboard, the test process can only be completed on the jacks on one side. After the test is completed, the motherboard is manually turned over to test the jacks on the other side, which reduces the test efficiency of the motherboard; therefore, in view of the above technical problems, the motherboard testing device provided by the present application includes a first test box 110 and a second test box 120, and the workpieces to be tested are clamped on the first clamping portion 310 and the second clamping portion 320 respectively, so that a clamping assembly 300 clamps two workpieces to be tested at the same time, and the clamping assembly 300 is installed by the turntable 21 0 is driven to rotate, when the mounting turntable 210 can drive the clamping assembly 300 to rotate to the first position, the first test box 110 simultaneously detects the first working surfaces of the two workpieces to be tested, and then the mounting turntable 210 continues to rotate, and the clamping assembly 300 is flipped, so that the second working surfaces of the two workpieces to be tested face the second test box 120, and the second working surfaces are detected by the second test box 120. In actual application, the first test box 110 and the second test box 120 can also work at the same time, that is, when the second test box 120 is working, the first test box 110 simultaneously detects the two workpieces to be tested on the other group of clamping assemblies 300. This arrangement not only improves the automatic control of the test equipment, but also reduces the degree of manual participation, thereby greatly improving the test efficiency of the performance test of the motherboard.

[0029] Please refer to Figures 1 to 7The present invention provides a motherboard testing device, comprising: a first test box 110 and a second test box 120, the first test box 110 and the second test box 120 are arranged at an interval; a support assembly 200, the support assembly 200 comprises a mounting turntable 210, the mounting turntable 210 is rotatably arranged around a first axis; a clamping assembly 300, arranged on the mounting turntable 210, the mounting turntable 210 drives the clamping assembly 300 to move between the first test box 110 and the second test box 120; the clamping assembly 300 comprises a first clamping portion 310 and a second clamping portion 320 arranged opposite to each other, the first clamping portion 310 and the second clamping portion 320 are respectively used to clamp a workpiece to be tested, and the clamping The assembly 300 is arranged to be flippable around the second axis so as to adjust the position of the workpiece to be tested through the first clamping portion 310 and the second clamping portion 320; when the mounting turntable 210 rotates to the first position, the clamping assembly 300 is opposite to the first test box 110, and the first working surface of the workpiece to be tested on the first clamping portion 310 and the second clamping portion 320 is detected simultaneously through the first test box 110; when the mounting turntable 210 rotates to the second position, the clamping assembly 300 is opposite to the second test box 120, the clamping assembly 300 is flipped around the second axis, and the second working surface of the workpiece to be tested on the first clamping portion 310 and the second clamping portion 320 is detected simultaneously through the second test box 120.

[0030] The motherboard testing device provided by the present application includes a first test box 110, a second test box 120, a support assembly 200 and a clamping assembly 300. The first test box 110 and the second test box 120 are arranged at intervals. The support assembly 200 includes a mounting turntable 210, which is rotatably arranged around a first axis. The clamping assembly 300 is arranged on the mounting turntable 210, and the mounting turntable 210 drives the clamping assembly 300 to move between the first test box 110 and the second test box 120. The clamping assembly 300 includes a first clamping portion 310 and a second clamping portion 320 arranged opposite to each other, and the first clamping portion 310 and the second clamping portion 320 are respectively used to clamp the workpiece to be tested. The clamping assembly 300 is arranged to be flippable around the second axis to adjust the position of the workpiece to be tested through the first clamping portion 310 and the second clamping portion 320; when the mounting turntable 210 rotates to the first position, the clamping assembly 300 is opposite to the first test box 110, and the first working surface of the workpiece to be tested on the first clamping portion 310 and the second clamping portion 320 is detected simultaneously through the first test box 110; when the mounting turntable 210 rotates to the second position, the clamping assembly 300 is opposite to the second test box 120, and the clamping assembly 300 is flipped around the second axis, and the second working surface of the workpiece to be tested on the first clamping portion 310 and the second clamping portion 320 is detected simultaneously through the second test box 120. In this way, the turntable 210 is installed to drive the clamping assembly 300 to rotate, so that it rotates to a relative position with the first test box 110 or is set relative to the second test box 120. The first clamping part 310 and the second clamping part 320 are set on the clamping assembly 300, so that a group of clamping assemblies 300 can clamp two workpieces to be tested at the same time. In this way, the first test box 110 and the second test box 120 can test the two workpieces to be tested at the same time, which greatly improves the test efficiency of the workpieces to be tested.

[0031] Among them, adjusting the position of the workpiece to be measured by the first clamping part 310 and the second clamping part 320 means flipping the first clamping part 310 and the second clamping part 320 to drive the workpiece to be measured on the first clamping part 310 and the second clamping part 320 to move, so that the circumferential surface of the rotating disk 210 is installed to face outward. The above-mentioned arrangement can make the first working surface of the workpiece to be measured face outward or the second working surface of the workpiece to be measured face outward, so as to cooperate with the first test box 110 and the second test box 120.

[0032] In a specific implementation, there are at least two groups of clamping assemblies 300, and at least two groups of clamping assemblies 300 are arranged at intervals along the circumferential direction of the mounting turntable 210, so that the first test box 110 and the second test box 120 can simultaneously detect the workpieces to be tested in the two groups of clamping assemblies 300. Preferably, there are four groups of clamping assemblies 300, and the four groups of clamping assemblies 300 are evenly arranged along the circumferential direction of the mounting turntable 210. When the first test box 110 and the second test box 120 simultaneously test the workpieces to be tested on two groups of clamping assemblies 300, the other two groups of clamping assemblies 300 can be in a loading state or a unloading state, so that during the rotation of the mounting turntable 210, the loading, detection and unloading of the workpieces to be tested are realized.

[0033] Specifically, the first test box 110 and / or the second test box 120 include: a test plug 130, which is inserted into the workpiece to be tested to detect the workpiece to be tested; a first driving component 140, which is connected to the test plug 130, and the first driving component 140 is retractably arranged to drive the test plug 130 to approach or move away from the mounting turntable 210. Preferably, the first driving component 140 is a hydraulic rod or an electric push rod. When the mounting turntable 210 drives the clamping assembly 300 to move to the first position or the second position, the first driving component 140 drives the test plug 130 to extend until it is matched with the socket on the workpiece to be tested to detect the workpiece to be tested. After the detection is completed, the first driving component 140 retracts to pull the test plug 130 out of the socket.

[0034] Since the mainboard will generate heat during the test, the mainboard testing device further includes: a heat dissipation assembly 400, which is arranged above and / or below the clamping assembly 300. The heat dissipation assembly 400 is opposite to and spaced from the clamping assembly 300, and the heat dissipation assembly 400 is used to blow air to the clamping assembly 300 to dissipate heat from the workpiece to be tested on the clamping assembly 300. Preferably, the heat dissipation assembly 400 is arranged in two groups, and the two groups of heat dissipation assemblies 400 are respectively located above and below the clamping assembly 300, so that the surfaces of the two mainboards can be timely dissipated at the same time.

[0035] In order to facilitate the installation of the clamping assembly 300, the installation turntable 210 is provided with an installation slot 211, and the clamping assembly 300 is installed in the installation slot 211. The support assembly 200 also includes: a support shaft 220, which is provided on the side wall of the installation slot 211, the clamping assembly 300 is connected to the support shaft 220, and the clamping assembly 300 is flippably arranged around the support shaft 220; wherein, there are multiple installation slots 211, and the multiple installation slots 211 are arranged at intervals along the circumferential direction of the installation turntable 210, and the clamping assembly 300 is multiple groups, and the multiple clamping assemblies 300 are arranged in each installation slot 211 in a one-to-one correspondence. The support shaft 220 drives the clamping assembly 300 to flip, thereby adjusting the orientation of the first clamping part 310 and the second clamping part 320, and realizing the adjustment of the orientation of the first working surface and the second working surface of the workpiece to be measured.

[0036] Specifically, a fourth driving component 250 and a transmission rack 251 are also provided in the mounting groove 211, and a third driving gear 221 is sleeved on the supporting shaft 220, and the third driving gear 221 is meshed with the transmission rack 251. The fourth driving component 250 is telescopically arranged and is drivingly connected to the transmission rack 251. During the extension and retraction process of the fourth driving component 250, the transmission rack 251 drives the third driving gear 221 to rotate, thereby driving the supporting shaft 220 to rotate. In this way, the fourth driving component 250 is arranged in the mounting groove 211, so that the overall structure is more compact. At the same time, when the clamping assembly 300 is rotated, the two will not interfere with each other.

[0037] In the embodiment provided in the present application, the clamping assembly 300 further includes: a mounting frame 330, connected to the support shaft 220, the first clamping portion 310 and the second clamping portion 320 are respectively arranged on the mounting frame 330; a second driving component 340, arranged in the mounting frame 330, the second driving component 340 is two groups, and the two groups of second driving components 340 are connected to the first clamping portion 310 and the second clamping portion 320 in a one-to-one correspondence, so that the first clamping portion 310 and / or the second clamping portion 320 are in a clamping state or a release state. By setting the mounting frame 330, the second driving component 340 is arranged in the mounting frame 330, and the clamping assembly 300 is integrated, so that it is convenient to be installed on the mounting turntable 210. In addition, through the two groups of second driving components 340, the first clamping portion 310 and the second clamping portion 320 are independently controlled to achieve clamping or release of the workpiece.

[0038] In the specific implementation process, Figures 3 to 5As shown, the first clamping part 310 and / or the second clamping part 320 include: a first clamping plate 311 and a second clamping plate 312; each group of second driving parts 340 includes: two moving parts 341, the two moving parts 341 are movably arranged in a direction of approaching or moving away from each other, the two moving parts 341 are respectively connected to the first clamping plate 311 and the second clamping plate 312, and the first clamping plate 311 and the second clamping plate 312 are driven to move by the two moving parts 341. Among them, the two moving parts 341 are both sliders or moving plates. Preferably, rubber pads 314 are respectively arranged on the clamping surfaces of the first clamping plate 311 and the second clamping plate 312 to protect the workpiece to be measured when the workpiece to be measured is clamped.

[0039] Specifically, the first clamping plate 311 includes a first plate segment 3110 and a second plate segment 3111, the second clamping plate 312 includes a third plate segment 3120 and a fourth plate segment 3121, the first plate segment 3110 and the third plate segment 3120 are arranged opposite to each other, the second plate segment 3111 and the fourth plate segment 3121 are arranged opposite to each other, and the moving component 341 includes a first moving component and a second moving component; each group of second driving components 340 also includes: a first threaded rod 342, two first moving components are arranged on the first threaded rod 342 at intervals, the thread directions of the two ends of the first threaded rod 342 are opposite, and the two first moving components are respectively connected to the first threaded rod 342. The two ends are threadedly connected; the second threaded rod 343, on which two second moving parts are arranged at intervals, the thread directions of the two ends of the second threaded rod 343 are opposite, and the two second moving parts are respectively threadedly connected with the two ends of the second threaded rod 343; the first driving gear 344 is arranged in the mounting frame 330, and the first driving gear 344 is rotatably arranged around its own axis; the two second driving gears 345 are respectively meshed with the first driving gear 344, and the two second driving gears 345 are respectively sleeved on the first threaded rod 342 and the second threaded rod 343 to drive the first threaded rod 342 and the second threaded rod 343 to rotate. Among them, the first driving gear 344 drives the two second driving gears 345 to rotate at the same time to ensure that the first threaded rod 342 and the second threaded rod 343 rotate synchronously, so that the first moving part and the second moving part are synchronized, and the first clamping plate 311 and the second clamping plate 312 are synchronously moved.

[0040] like Figure 7As shown, the support assembly 200 also includes: a third driving component 240, which is driven and connected to the mounting turntable 210, and the mounting turntable 210 is driven to rotate by the third driving component 240; each group of heat dissipation components 400 includes: a ventilation pipe 410, which is passed through the mounting turntable 210, and the mounting turntable 210 rotates relative to the ventilation pipe 410; a blowing disk body 411, and a plurality of blowing holes 412 are provided on the blowing disk body 411, and the ventilation pipe 410 is connected to the blowing disk body 411. Specifically, the heat dissipation assembly 400 is divided into two groups, which are respectively arranged above and below the clamping assembly 300. Furthermore, a hair dryer 413 and a first connecting pipe 414 are installed below the mounting platform 500. The two ends of the first connecting pipe 414 are respectively connected to the hair dryer and the ventilation pipe 410 to provide an air source. The ventilation pipe 410 is connected to a second connecting pipe 415, and the second connecting pipe 415 is connected to a blowing disk 411. Preferably, each group of heat dissipation assemblies 400 includes multiple second connecting pipes 415 and multiple blowing disks 411 to correspond to multiple groups of clamping assemblies 300 respectively, so as to achieve simultaneous heat dissipation of the workpieces to be measured on multiple groups of clamping assemblies 300.

[0041] In the specific implementation process, the third driving component 240 also includes a third driving motor 241, a third motor shaft 242, a fourth driving gear 243 and a fifth driving gear 244. The third driving motor 241 is arranged on the mounting table 500 through a support plate. The third motor shaft 242 of the third driving motor 241 is sleeved with a fourth driving gear 243. The fifth driving gear 244 is connected to the bottom surface of the mounting turntable 210 and meshes with the fourth driving gear 243. The mounting turntable 210 is driven to rotate by the fourth driving gear 243 and the fifth driving gear 244. The thickness of the fifth driving gear 244 is greater than that of the fourth driving gear 243. This avoids friction between the mounting turntable 210 and the fourth driving gear 243 when the fifth driving gear 244 drives the mounting turntable 210 to rotate.

[0042] The motherboard testing device also includes: a mounting platform 500, on which the first test box 110, the second test box 120 and the support assembly 200 are respectively arranged; a transfer component 600, which is movably arranged along a predetermined track; a first conveying platform 700, which is used to convey the workpiece to be tested, and the transfer component 600 is used to absorb the workpiece to be tested on the first conveying platform 700 to the first clamping part 310 and the second clamping part 320; a second conveying platform 800, which is arranged below the mounting turntable 210, and the mounting turntable 210 rotates to the third position, and the first clamping part 310 or the second clamping part 320 switches to a released state, so that the unqualified workpiece to be tested that has been tested falls onto the second conveying platform 800; a third conveying platform 900, which is arranged below the mounting turntable 210, and the mounting turntable 210 rotates to the fourth position, and the first clamping part 310 or the second clamping part 320 switches to a released state, so that the qualified workpiece to be tested that has been tested falls onto the third conveying platform 900. The transfer component 600 includes a mechanical arm 610, a fixed seat 620 and a suction cup 630. The mechanical arm 610 is arranged on the mounting platform 500. The end of the mechanical arm 610 is provided with a fixed seat 620. A plurality of suction cups 630 are provided on the fixed seat 620. The fixed seat 620 is a hollow structure, which is used to provide negative pressure for the suction cup 630 to adsorb the workpiece to be tested on the first conveying platform 700 to the first clamping part 310 and the second clamping part 320. When the workpiece to be tested is detected as a defective product, the clamping assembly 300 moves to the upper part of the second conveying platform 800. At this time, if the workpiece to be tested clamped by the first clamping part 310 is If the workpiece to be tested is an unqualified product, the first clamping part 310 is turned over to face the second conveying platform 800, and the first clamping part 310 is loosened, so that the unqualified workpiece to be tested falls directly onto the second conveying platform 800 for conveying. When the workpiece to be tested is a qualified product, the clamping assembly 300 moves to the top of the third conveying platform 900. At this time, if the workpiece to be tested clamped by the second clamping part 320 is a qualified product, the second clamping part 320 is turned over to face the third conveying platform 900, and the second clamping part 320 is loosened, so that the qualified workpiece to be tested falls directly onto the third conveying platform 900 for conveying. Preferably, the first conveying platform 700, the second conveying platform 800 and the third conveying platform 900 are belt conveyors respectively.

[0043] The specific use process includes the following steps:

[0044] Step 1: Place the server motherboard on the belt conveyor (first conveying platform 700), then start the server motherboard testing device, and then use the mechanical arm 610 to drive the fixing seat 620 and the suction cup 630 to move, automatically grab the server motherboard on the belt conveyor, and automatically load it onto the clamping assembly 300;

[0045] Step 2: The testing device tests the loaded mainboard. After the test is completed, the clamping assembly 300 unloads the unqualified server mainboard onto one of the belt conveyors for conveying, and unloads the qualified server mainboard onto another belt conveyor for conveying;

[0046] Step 3: Pack the unqualified server motherboards conveyed by the belt conveyor and return them to the factory for processing, and send the qualified server motherboards to the next processing step for subsequent processing.

[0047] Specifically, the third motor shaft 242 is driven to rotate by the third driving motor 241, and the third motor shaft 242 drives the installation turntable 210 to rotate through the fourth driving gear 243 and the fifth driving gear 244, and the fixing seat 620 is driven to move by the mechanical arm 610, and the fixing seat 620 drives the vacuum suction cup to move, and then the vacuum pump is started to make the suction cup 630 adsorb the server motherboard on the belt conveyor (the first conveying platform 700), and then the fixing seat 620 is driven to move by the mechanical arm 610 to move the server motherboard to the clamping assembly 300, and then the clamping assembly 300 adsorbs the server motherboard. The mainboard is clamped and fixed, and then the installation turntable 210 is driven to rotate by the driving mechanism, and the installation turntable 210 drives the clamping assembly 300 to move, so that the server mainboard is moved to the position of the test plug 130 of the first test box 110, and then the test plug 130 is driven by the first driving component 140 to test the server mainboard, and then the tested server mainboard is turned over by the clamping assembly 300, and then the installation turntable 210 is driven to rotate again to rotate it to the next test position, and then the other side of the mainboard is tested, and then the tested mainboard is put on the belt conveyor for transportation;The fixing seat 620 is driven to move by the robot arm 610, and the fixing seat 620 drives the suction cup 630 to move, and then the vacuum pump is started to make the vacuum suction cup adsorb the server motherboard on the belt conveyor, and then the fixing seat 620 is driven to move by the robot arm 610, and the server motherboard is moved to the top of the installation frame 330 for placement, and then the robot arm 610 repeats the above-mentioned actions to adsorb and grab the server motherboard on the belt conveyor, and then drives the server motherboard to move to the lower position of the installation frame 330, and then the bidirectional threaded rod (the first threaded rod 342, the second threaded rod 343) is driven to rotate by the second driving motor 346, and the bidirectional threaded rod drives the first moving part and the second moving part to move, and then the first conveying part and the second moving part respectively drive the first clamping plate 311 and the second clamping plate 312 of the first clamping part 310 and the second clamping part 320 to clamp and fix the two server motherboards, so as to realize automatic loading of server motherboards of different sizes. After the loading is completed, the driving motor 346 is used to drive the first driving motor 346 to drive the first driving motor 346 to drive the first driving motor 346 to drive the first driving motor 346 to drive the first driving motor 346 to drive the second ... The driving mechanism drives the installation turntable 210 to rotate 90°, drives the server mainboard to rotate to the first first test box 110 position, and then drives the test plug 130 of the first test box 110 to perform a plug-in test on one side of the two server mainboards through the first driving component 140. At this time, the robot arm 610 loads the next clamping component 300. When the test is completed, the driving mechanism drives the installation turntable 210 to rotate 90°, and then drives the support shaft 220 and the installation frame 330 to flip through the fourth driving component 250. 180°, then the two server motherboards are tested by the second test box 120. After the test is completed, the installation turntable 210 is driven to rotate 90°. At this time, the first clamping plate 311 and the second clamping plate 312 no longer clamp the unqualified server motherboards, so that they fall onto the second conveying platform 800 and are conveyed out. The qualified server motherboards are driven to rotate to the loading position, and then the first clamping plate 311 and the second clamping plate 312 no longer clamp them, so that they fall onto the third conveying platform below and are conveyed out, so as to realize the automatic screening of defective products. ;

[0048] From the above description, it can be seen that the above embodiments of the present invention achieve the following technical effects:

[0049] The motherboard testing device provided by the present application includes a first test box 110, a second test box 120, a support assembly 200 and a clamping assembly 300. The first test box 110 and the second test box 120 are arranged at intervals. The support assembly 200 includes a mounting turntable 210, which is rotatably arranged around a first axis. The clamping assembly 300 is arranged on the mounting turntable 210, and the mounting turntable 210 drives the clamping assembly 300 to move between the first test box 110 and the second test box 120. The clamping assembly 300 includes a first clamping portion 310 and a second clamping portion 320 arranged opposite to each other, and the first clamping portion 310 and the second clamping portion 320 are respectively used to clamp the workpiece to be tested. The clamping assembly 300 is arranged to be flippable around the second axis to adjust the position of the workpiece to be tested through the first clamping portion 310 and the second clamping portion 320; when the mounting turntable 210 rotates to the first position, the clamping assembly 300 is opposite to the first test box 110, and the first working surface of the workpiece to be tested on the first clamping portion 310 and the second clamping portion 320 is detected simultaneously through the first test box 110; when the mounting turntable 210 rotates to the second position, the clamping assembly 300 is opposite to the second test box 120, and the clamping assembly 300 is flipped around the second axis, and the second working surface of the workpiece to be tested on the first clamping portion 310 and the second clamping portion 320 is detected simultaneously through the second test box 120. In this way, the turntable 210 is installed to drive the clamping assembly 300 to rotate, so that it rotates to a relative position with the first test box 110 or is set relative to the second test box 120. The first clamping part 310 and the second clamping part 320 are set on the clamping assembly 300, so that a group of clamping assemblies 300 can clamp two workpieces to be tested at the same time. In this way, the first test box 110 and the second test box 120 can test the two workpieces to be tested at the same time, which greatly improves the test efficiency of the workpieces to be tested.

[0050] The fixing seat and the vacuum suction cup are driven to move by the robotic arm, and the vacuum suction cup absorbs the server mainboard on the belt conveyor (the first conveying platform 700), and then the server mainboard is driven to move by the robotic arm to be automatically loaded onto the clamping assembly 300, and then the clamping assembly 300 clamps and fixes the server mainboard, thereby realizing automatic loading of the server mainboard, and then the third driving component 240 drives the installation turntable 210 to rotate, and then cooperates with the test of the test box, and then the clamping assembly 300 automatically unloads the tested mainboard, thereby realizing continuous automatic testing of both sides of the two server mainboards, which greatly improves the testing efficiency of the server mainboard.

[0051] By placing two mainboards into the installation frame position, and then driving the bidirectional threaded rod to rotate through the second drive motor 346, the bidirectional threaded rod drives the moving component and the first / second clamping plate to move to clamp the mainboard, thereby clamping mainboards of different sizes, which is convenient for testing mainboards of different sizes. At the same time, the fourth drive component 250 and the supporting shaft 220 drive the installation frame 330 to flip, thereby realizing continuous plug-in testing on both sides of the mainboard, greatly improving the testing efficiency of the mainboard.

[0052] Air is blown into the connecting pipe through a hair dryer and a pipe, the connecting pipe blows air into the ventilation pipe, the ventilation pipe blows air to the blowing disk, and the blowing disk blows air to the server mainboard surfaces at the top and bottom of the mounting frame 330 through the blowing holes to dissipate heat, thereby achieving simultaneous blowing and dissipating heat for the two tested mainboard surfaces, effectively improving the heat dissipation effect during the mainboard testing process, and further improving the testing effect of the server mainboard.

[0053] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprising" and / or "including" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0054] Unless otherwise specifically stated, the relative arrangement of the parts and steps described in these embodiments, numerical expressions and numerical values ​​do not limit the scope of the present invention. At the same time, it should be understood that, for ease of description, the sizes of the various parts shown in the accompanying drawings are not drawn according to the actual proportional relationship. The technology, method and equipment known to ordinary technicians in the relevant field may not be discussed in detail, but in appropriate cases, the technology, method and equipment should be regarded as a part of the authorization specification. In all examples shown and discussed here, any specific value should be interpreted as being merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once a certain item is defined in an accompanying drawing, it does not need to be further discussed in subsequent drawings.

[0055] For ease of description, spatially relative terms such as "above", "above", "on the upper surface of", "above", etc. may be used here to describe the spatial positional relationship between a device or feature and other devices or features as shown in the figure. It should be understood that spatially relative terms are intended to include different orientations of the device in use or operation in addition to the orientation described in the figure. For example, if the device in the accompanying drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below other devices or structures". Thus, the exemplary term "above" can include both "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatially relative descriptions used here are interpreted accordingly.

[0056] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0057] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein.

[0058] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A motherboard testing device, characterized in that: include: A first test box (110) and a second test box (120), wherein the first test box (110) and the second test box (120) are arranged at an interval; A support assembly (200), the support assembly (200) comprising a mounting turntable (210), the mounting turntable (210) being rotatably arranged around a first axis; A clamping assembly (300) is arranged on the installation turntable (210), and the clamping assembly (300) is driven by the installation turntable (210) to move between the first test box (110) and the second test box (120); The clamping assembly (300) comprises a first clamping portion (310) and a second clamping portion (320) which are arranged opposite to each other, the first clamping portion (310) and the second clamping portion (320) are respectively used to clamp a workpiece to be measured, and the clamping assembly (300) is arranged to be flippable around a second axis so as to adjust the position of the workpiece to be measured by means of the first clamping portion (310) and the second clamping portion (320); When the mounting turntable (210) rotates to a first position, the clamping assembly (300) is opposite to the first test box (110), and the first working surface of the workpiece to be tested on the first clamping portion (310) and the second clamping portion (320) is detected simultaneously through the first test box (110); when the mounting turntable (210) rotates to a second position, the clamping assembly (300) is opposite to the second test box (120), and the clamping assembly (300) is turned around the second axis, and the second working surface of the workpiece to be tested on the first clamping portion (310) and the second clamping portion (320) is detected simultaneously through the second test box (120).

2. The motherboard testing device according to claim 1, characterized in that: The clamping assemblies (300) are in at least two groups, and the at least two groups of the clamping assemblies (300) are arranged at intervals along the circumferential direction of the mounting turntable (210); so that the first test box (110) and the second test box (120) can simultaneously detect the workpieces to be tested in the two groups of the clamping assemblies (300).

3. The motherboard testing device according to claim 1, characterized in that: The first test box (110) and / or the second test box (120) comprises: A test plug (130) is used to be inserted into the workpiece to be tested so as to detect the workpiece to be tested; A first driving component (140) is connected to the test plug (130), and the first driving component (140) is telescopically arranged to drive the test plug (130) to move closer to or farther from the installation turntable (210).

4. The motherboard testing device according to claim 1, characterized in that: The mainboard testing device also includes: A heat dissipation component (400) is arranged above and / or below the clamping component (300); the heat dissipation component (400) is opposite to the clamping component (300) and is arranged at a distance; the heat dissipation component (400) is used to blow airflow toward the clamping component (300) to dissipate heat from the workpiece to be measured on the clamping component (300).

5. The motherboard testing device according to claim 1, characterized in that: The mounting turntable (210) is provided with a mounting notch (211), the clamping assembly (300) is mounted in the mounting notch (211), and the supporting assembly (200) further comprises: A support shaft (220) is arranged on a side wall of the installation slot (211), the clamping assembly (300) is connected to the support shaft (220), and the clamping assembly (300) is arranged around the support shaft (220) in a flippable manner; There are a plurality of mounting slots (211), and the plurality of mounting slots (211) are arranged at intervals along the circumferential direction of the mounting turntable (210); there are a plurality of clamping assemblies (300), and the plurality of clamping assemblies (300) are arranged in respective mounting slots (211) in a one-to-one correspondence.

6. The motherboard testing device according to claim 5, characterized in that: The clamping assembly (300) further comprises: A mounting frame (330) connected to the supporting shaft (220), wherein the first clamping portion (310) and the second clamping portion (320) are respectively arranged on the mounting frame (330); The second driving component (340) is arranged in the mounting frame (330), and the second driving component (340) is divided into two groups. The two groups of the second driving components (340) are connected to the first clamping part (310) and the second clamping part (320) in a one-to-one correspondence, so that the first clamping part (310) and / or the second clamping part (320) are in a clamping state or a released state.

7. The motherboard testing device according to claim 6, characterized in that: The first clamping part (310) and / or the second clamping part (320) comprises: a first clamping plate (311) and a second clamping plate (312); each group of the second driving components (340) comprises: Two movable parts (341), the two movable parts (341) are movably arranged in directions approaching or moving away from each other, the two movable parts (341) are respectively connected to the first clamping plate (311) and the second clamping plate (312), and the first clamping plate (311) and the second clamping plate (312) are driven to move by the two movable parts (341).

8. The motherboard testing device according to claim 7, characterized in that: The first clamping plate (311) includes a first plate segment (3110) and a second plate segment (3111), the second clamping plate (312) includes a third plate segment (3120) and a fourth plate segment (3121), the first plate segment (3110) and the third plate segment (3120) are arranged opposite to each other, the second plate segment (3111) and the fourth plate segment (3121) are arranged opposite to each other, the moving component (341) includes a first moving component and a second moving component; each group of the second driving components (340) further includes: A first threaded rod (342), wherein two first moving parts are arranged on the first threaded rod (342) at intervals, the threads at two ends of the first threaded rod (342) are in opposite directions, and the two first moving parts are respectively threadedly connected to the two ends of the first threaded rod (342); A second threaded rod (343), wherein two second movable components are arranged at intervals on the second threaded rod (343), the threads at two ends of the second threaded rod (343) are in opposite directions, and the two second movable components are respectively threadedly connected to the two ends of the second threaded rod (343); A first driving gear (344) is disposed in the mounting frame (330), wherein the first driving gear (344) is rotatably disposed around its own axis; The two second driving gears (345) are respectively meshed with the first driving gear (344), and the two second driving gears (345) are respectively sleeved on the first threaded rod (342) and the second threaded rod (343) to drive the first threaded rod (342) and the second threaded rod (343) to rotate.

9. The motherboard testing device according to claim 4, characterized in that: The heat dissipation component (400) comprises: A vent pipe (410) is passed through the mounting turntable (210), and the mounting turntable (210) rotates relative to the vent pipe (410); An air blowing disc (411) is provided with a plurality of air blowing holes (412), and the vent pipe (410) is in communication with the air blowing disc (411).

10. The motherboard testing device according to claim 1, characterized in that: The mainboard testing device also includes: A mounting platform (500), wherein the first test box (110), the second test box (120) and the support assembly (200) are respectively arranged on the mounting platform (500); A transfer component (600) is movably arranged along a predetermined track; A first conveying platform (700) is used to convey the workpiece to be measured, and the transfer component (600) is used to absorb the workpiece to be measured on the first conveying platform (700) onto the first clamping part (310) and the second clamping part (320); A second conveying platform (800) is arranged below the mounting turntable (210); when the mounting turntable (210) rotates to a third position, the first clamping portion (310) or the second clamping portion (320) is switched to a released state, so that the unqualified workpiece to be tested that has been tested falls onto the second conveying platform (800); The third conveying platform (900) is arranged below the mounting turntable (210). When the mounting turntable (210) rotates to a fourth position, the first clamping portion (310) or the second clamping portion (320) is switched to a released state, so that a qualified workpiece to be tested that has completed the test falls onto the third conveying platform (900).

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