Hall device test system and method, and storage medium

Abstract

The invention provides a Hall device test system and method and a storage medium, and the system is characterized in that the system comprises a controllable current source which outputs a controllable current, and the controllable current acts on a solenoid to control the solenoid to generate a controllable magnetic field; the solenoid is fixed vertically above a test station in the sorting machine, and the controllable magnetic field generated by the solenoid acts on the test station; and the sorting machine controls the Hall devices to be tested to enter the test station, and tests and classifies the Hall devices to be tested according to the controllable magnetic field. According to the Hall device testing system, a complete Hall device testing system is formed through interaction of all components of the system, various magnetic fields suitable for testing are provided to achieve automatic testing of Hall devices, and the Hall devices are tested and classified.

Description

Technical Field

[0001] The present application belongs to the field of semiconductor testing technology, and in particular, relates to a testing system, method and storage medium for a Hall device. Background Art

[0002] Currently, in the semiconductor integrated circuit testing process, the testing of Hall devices generally requires one or more magnetic field environments to achieve Hall function testing.

[0003] The general method of generating a magnetic field environment includes providing a magnetic field by a current-carrying solenoid, providing a magnetic field by a magnet or a magnetic object. In terms of Hall device testing, the magnetic field environment is generally provided by a coil. However, as the functionality of Hall devices becomes more and more diverse and can be applied to different magnetic field environments, the resulting diverse testing of Hall devices is also particularly important, which requires a controllable magnetic field environment to provide different magnetic field environments. Therefore, how to provide a controllable magnetic field environment to achieve automated testing of Hall devices has become a problem to be solved in this field. The test systems existing in the prior art are unable to achieve automated testing or are unable to further classify the Hall devices being tested, so there are many deficiencies.

[0004] In view of this, the present invention proposes a testing system, method and storage medium for Hall devices. The present application forms a complete Hall device testing system through the interaction of various components between the systems, provides various magnetic fields suitable for testing to realize automated testing of Hall devices, and tests and classifies Hall devices. Summary of the invention

[0005] Embodiments of the present application provide a testing system, method, and storage medium for a Hall device.

[0006] In a first aspect, an embodiment of the present application provides a testing system for a Hall device, the system comprising:

[0007] A controllable current source outputs a controllable current, wherein the controllable current acts on the solenoid to control the solenoid to generate a controllable magnetic field;

[0008] A solenoid is fixed vertically above a test station inside the sorting machine, and the controllable magnetic field generated by the solenoid acts on the test station;

[0009] The sorting machine controls the Hall devices to be tested to enter the testing station, and tests and classifies the Hall devices to be tested according to the controllable magnetic field.

[0010] Optionally, the sorting machine clamps the Hall device to be tested and fixes the Hall device to be tested to the testing station.

[0011] Optionally, the testing station tests the Hall devices to be tested according to the controllable magnetic field to generate a test signal, and the sorting machine tests and classifies the Hall devices to be tested according to the received test signal.

[0012] Optionally, the sorting machine determines the failure condition of the Hall device to be tested based on the test signal.

[0013] Optionally, the sorting machine classifies the Hall devices to be tested according to failure conditions of the Hall devices to be tested.

[0014] Optionally, when the controllable current source is connected to the solenoid and outputs a constant current, the constant current acts on the solenoid to control the solenoid to generate a fixed magnetic field;

[0015] When the controllable current source is connected to the solenoid and outputs an alternating current, the constant current acts on the solenoid to control the solenoid to generate an alternating magnetic field;

[0016] When the controllable current source is connected to the solenoid and outputs an increasing or decreasing current, the constant current acts on the solenoid to control the solenoid to generate a gradually increasing magnetic field or a gradually decreasing magnetic field.

[0017] Optionally, the system further includes:

[0018] A display is connected to the sorting machine and displays the test results obtained by the sorting machine.

[0019] In a second aspect, an embodiment of the present application provides a method for testing a Hall device, comprising:

[0020] Set the output controllable current;

[0021] Generate a controllable magnetic field according to the controllable current;

[0022] The Hall devices to be tested are tested and classified according to the controllable magnetic field.

[0023] In a third aspect, an embodiment of the present application provides a terminal device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor applies the system as described above when executing the computer program.

[0024] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the system as described above is applied.

[0025] The present application provides a test system for a Hall device, characterized in that the system includes: a controllable current source, outputting a controllable current, the controllable current acting on a solenoid to control the solenoid to generate the controllable magnetic field; a solenoid fixed vertically above a test station inside a sorting machine, the controllable magnetic field generated by the solenoid acting on the test station; a sorting machine, controlling the Hall device to be tested to enter the test station, and testing and classifying the Hall device to be tested according to the controllable magnetic field. The present application forms a complete Hall device test system through the interaction of various components between the systems, provides various magnetic fields suitable for testing to realize automated testing of Hall devices, and tests and classifies Hall devices. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0027] Figure 1 It is a structural schematic diagram of a Hall device testing system provided in an embodiment of the present application;

[0028] Figure 2 It is a schematic diagram of the specific structure of a Hall device testing system provided in an embodiment of the present application;

[0029] Figure 3 is a test flow chart of a Hall device provided in an embodiment of the present application;

[0030] Figure 4 It is a schematic diagram of the structure of the terminal device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0031] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0032] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, wholes, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or combinations thereof.

[0033] It should also be understood that the term “and / or” used in the specification and appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0034] As used in the specification and appended claims of this application, the term "if" can be interpreted as "when" or "uponce" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "uponce it is determined" or "in response to determining" or "uponce [described condition or event] is detected" or "in response to detecting [described condition or event]", depending on the context.

[0035] In addition, in the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.

[0036] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0037] Currently, in the semiconductor integrated circuit testing process, the testing of Hall devices generally requires one or more magnetic field environments to achieve Hall function testing.

[0038] The general method of generating a magnetic field environment includes providing a magnetic field by a current-carrying solenoid, a magnet or a magnetic object. In terms of Hall device testing, the magnetic field environment is generally provided by a coil. However, as the functionality of Hall devices becomes more and more diverse and can be applied to different magnetic field environments, the resulting diverse testing of Hall devices is also particularly important, which requires a controllable magnetic field environment to provide different magnetic field environments. Therefore, how to provide a controllable magnetic field environment to achieve automated testing of Hall devices has become a problem to be solved in this field.

[0039] In the prior art, the Hall device is only detected based on the magnetic field, and a sorting machine is not introduced to detect the Hall device in conjunction with the magnetic field. Therefore, the Hall device cannot be classified according to the detection signal. In the present application, the solenoid is arranged vertically above the sorter, which can make the variable magnetic field act directly on the Hall device so that the test station can test the Hall device. The present application forms a complete test system through the interaction between various parts of the system, and classifies the Hall devices to be tested according to the test signal.

[0040] In view of this, the present invention proposes a testing system, method and storage medium for Hall devices. The present application forms a complete Hall device testing system through the interaction of various components between the systems, provides various magnetic fields suitable for testing to realize automated testing of Hall devices, and tests and classifies Hall devices.

[0041] This scheme provides a magnetic field control method for Hall chip testing. The scheme mainly uses a solenoid and a current source to form a magnetic field control system, and cooperates with a sorting machine to form an automated testing system. The coil generates a magnetic field to act on the Hall device, and the Hall device is tested by the testing machine. The entire system can realize automated testing.

[0042] like Figure 1 As shown, Figure 1 It is a structural schematic diagram of a Hall device test system provided in an embodiment of the present application. The test system of the present application mainly includes three modules, a controllable current source 100, a solenoid 200 and a sorting machine 300.

[0043] The controllable current source 100 outputs a controllable current, and the controllable current acts on the solenoid to control the solenoid to generate the controllable magnetic field.

[0044] In an embodiment of the present application, a controllable current source is a circuit or device that can control the output current. It can output a DC or AC current that meets the requirements, and can adjust the output current. Current control is usually achieved by adjusting the output voltage or the internal circuit. In one possible implementation, a rotary converter unit can be used, and an AC motor and a DC generator can be used to form a unit to obtain an adjustable DC voltage. In another possible implementation, a static controlled rectifier can be used to obtain an adjustable DC voltage. In an embodiment of the present application, a controllable current source is connected to a solenoid and acts on the solenoid to generate a controllable magnetic field. A magnetic field is generated by the flow of current in a conductor. When the current source is a controllable current source and is connected to a conductor solenoid, a variable magnetic field can be generated in the solenoid conductor.

[0045] The solenoid 200 is fixed vertically above the test station inside the sorting machine, and the controllable magnetic field generated by the solenoid acts on the test station.

[0046] In the embodiment of the present application, the solenoid refers to a multi-wound wire, the interior of the winding can be hollow, or have a metal core. When current passes through the wire, a uniform magnetic field is generated inside the solenoid. The solenoid is a very important component, and the solenoid can also be used as an electromagnet or an inductor. In the embodiment of the present application, the position of the solenoid is fixed, and it needs to be fixed vertically above the test station inside the sorter. When current passes through the solenoid, it is beneficial for the magnetic field generated by the solenoid to act directly on the test station to test the Hall device.

[0047] The sorting machine 300 controls the Hall devices to be tested to enter the testing station, and tests and classifies the Hall devices to be tested according to the controllable magnetic field.

[0048] In the embodiment of the present application, a handler is a device that performs weight grading and screening on products. In the present embodiment, the handler is a chip handler, which can be compared to an automatic feeder. The working principle of the chip handler mainly involves optical measurement technology, image processing technology, and scanning of detection means such as laser, infrared, and X-ray. The chip handler first delivers the chip to be tested to the detection area via a conveyor belt, scans the chip surface using an optical sensor, generates an image, and analyzes and processes the image to determine the quality and specifications of the chip. This process realizes the automatic sorting of chips, has high-speed processing capabilities and ultra-high precision, can significantly shorten the production cycle, reduce production costs, and improve corporate competitiveness.

[0049] The sorting machine mentioned in the present application includes but is not limited to a chip sorting machine, such as a laser diode chip test sorting machine, which tests photoelectric parameters and obtains chip type, quality, speed and other parameters through scanning by laser, infrared, X-ray and other detection means, and classifies the chips into different grades or types according to the test results, and finally collects them into corresponding containers. The sorting machine provided in the embodiment of the present application can be a Palide pressure test sorting machine, which is not specifically limited here.

[0050] like Figure 2 As shown, Figure 2 It is a specific structural diagram of a Hall device testing system provided in an embodiment of the present application.

[0051] The controllable current source is connected to the solenoid, and the current forms a magnetic field through the conductor. The magnetic field changes as the current type changes, forming a controllable magnetic field. The solenoid is fixed vertically above the test station so that it can directly act on the sorter test station. The sorter controls the Hall device to be tested to be fixed in the test station, and realizes the sorter automatically entering the test station to detect and classify the Hall device to be tested according to the test signal.

[0052] Furthermore, the sorting machine clamps the Hall device to be tested and fixes the Hall device to be tested on the testing station.

[0053] In the test system of the Hall device of the present application, the sorting machine has automatic equipment for classifying or testing integrated circuit chips. There is a test station inside the sorting machine, which distinguishes qualified products from unqualified products by testing, classifying and testing various characteristics of the chips, such as size, weight, appearance, electrical performance, etc. First, the integrated circuit chips need to be sent to the test station of the sorting machine in an orderly manner, and the performance parameters of each chip are tested one by one using a probe or other test equipment. The sorting machine has a clamp, which is used to fix the Hall device to be tested on the test station of the sorting gas.

[0054] Furthermore, the testing station tests the Hall devices to be tested according to the controllable magnetic field to generate a test signal, and the sorting machine tests and classifies the Hall devices to be tested according to the received test signal.

[0055] Hall devices, such as chips, are usually composed of Hall elements, signal conditioning circuits, and output interfaces. The Hall element is the core of the chip. It is generally made of semiconductor materials, and current channels are evenly distributed on the surface of the material. The signal conditioning circuit is used to amplify and process the weak electrical signals output by the Hall device to enhance the stability and reliability of the signal. The output interface converts the conditioned electrical signals into a form that can be used by external circuits. Hall chips generally work under constant DC current to produce the Hall effect. When a magnetic field acts on the Hall element, a potential difference will be generated on both sides of the element. By conditioning and amplifying the potential difference, a voltage signal proportional to the magnetic field strength can be obtained.

[0056] The Hall effect refers to the fact that when current passes through a conductor, a potential difference is generated on both sides of the conductor under the action of a magnetic field perpendicular to the direction of the current. This potential difference is called the Hall voltage, and its magnitude is related to the current, the strength of the magnetic field, and the material properties of the conductor. The basic principle of the Hall effect is the Lorentz force, that is, the Lorentz force exerted on electrons in a magnetic field causes the electrons to gather inside the conductor, thereby generating a potential difference. In the embodiment of the present application, a test signal, such as a voltage signal, is obtained by the potential difference generated at both ends when a magnetic field acts on the Hall device to be tested, so as to test the Hall device to be tested and classify its functionality.

[0057] In the embodiment of the present application, the solenoid is the main device for generating the magnetic field. The device is fixed to the sorting machine and is provided with current by a current source. The energized solenoid is similar to a magnet. The magnetic field outside the energized solenoid is similar to the bar magnetic field. The direction of the magnetic field can be determined by the direction of the current and the right-hand Ampere's law. The magnitude of the magnetic field is related to the energized current, and the magnitude of the magnetic field is different at different positions. Here, the solenoid is fixed to the sorting machine, so the distance does not change, and the magnitude of the magnetic field is only related to the current.

[0058] Furthermore, the sorting machine determines the failure status of the Hall device to be tested according to the test signal.

[0059] In the embodiment of the present application, in one possible implementation, according to the different Hall effects, the Hall chip can be divided into a linear Hall chip and a switch Hall chip. The voltage signal output by the linear Hall chip is proportional to the magnetic field strength and can be used to measure the magnitude of the magnetic field. The switch Hall chip outputs a high or low level signal under a specific magnetic field, which can be used to detect the switch state of the magnetic field.

[0060] In another possible implementation, the test station in the sorting machine can use a probe or other test equipment to test the performance parameters of each Hall device to be tested one by one based on a test signal such as a voltage signal or a current signal to detect the failure of the Hall device to be tested.

[0061] Furthermore, the sorting machine classifies the Hall devices to be tested according to the failure conditions of the Hall devices to be tested.

[0062] In the embodiment of the present application, the failure condition may include connectivity failure, electrical parameter failure and functional failure. Connectivity failure includes open circuit, short circuit and resistance value change. Most of the field failures are caused by electrostatic discharge (ESD) and over-stress (EOS). Electrical parameter failure, the main manifestations are parameter values ​​exceeding the specified range (out of tolerance) and parameter instability. The main failure modes that may occur are detected, including gate breakdown of MOS devices, pn junction breakdown of bipolar devices, secondary breakdown of power transistors, latch-up effect of CMOS circuits, Al-Si mutual dissolution of metal-semiconductor contacts, ohmic contact degradation, pn junction leakage, Au-Al bonding failure, chip breakage, hot carrier injection, chip breakage, chip bonding failure, metal electromigration, ohmic contact degradation, chip breakage, lead breakage, electrical parameter changes, soft errors, external lead corrosion, metallization corrosion, electrical parameter drift, etc.

[0063] Further, when the controllable current source is connected to the solenoid and outputs a constant current, the constant current acts on the solenoid to control the solenoid to generate a fixed magnetic field;

[0064] When the controllable current source is connected to the solenoid and outputs an alternating current, the constant current acts on the solenoid to control the solenoid to generate an alternating magnetic field;

[0065] When the controllable current source is connected to the solenoid and outputs an increasing or decreasing current, the constant current acts on the solenoid to control the solenoid to generate a gradually increasing magnetic field or a gradually decreasing magnetic field.

[0066] In the embodiment of the present application, the current source provides current for the solenoid, and the current source provides different currents according to the magnetic field requirements when the Hall device is tested. For example, when the magnetic field environment requires a magnetic field of a fixed size, the current source outputs a constant current of a size to generate a fixed magnetic field; when the magnetic field environment requires an alternating magnetic field, the current source outputs an alternating current to generate an alternating magnetic field; when the magnetic field environment requires a gradual increasing magnetic field, the current source outputs an increasing current to generate a gradual magnetic field. That is, the size of the magnetic field is completely controlled by the current source. The test of the Hall device is generally implemented by a tester. Here, the current source uses the resource board FPVI10 of the ACCO STS8200 tester. The board can provide a current of ±10A, and the output current size is completely controllable. The Hall device to be tested is the object of this design. In the process of realizing automated testing, its position is controlled by the sorting machine. When the Hall device to be tested arrives at the test station, the tester controls the FPVI10 resources to provide current action and solenoid, thereby generating a magnetic field to act on the Hall device to be tested. The size of the magnetic field in this process can be controlled according to actual needs.

[0067] Furthermore, the system also includes: a display connected to the sorting machine and displaying the test results obtained by the sorting machine.

[0068] In the embodiment of the present application, the test system also includes a display, which is connected to the sorting machine to present the test results and classification results of the Hall device to be tested by the sorting machine according to the test signal. The detected failure type and failure cause can be presented and returned to the operator, which is beneficial for the operator to select the corresponding maintenance strategy according to the detection result of the Hall device to be tested.

[0069] It should be noted that the various components included in the Hall device test system in the present application cannot be replaced by other modules or devices. Any module or device that replaces the above-mentioned test system cannot achieve an equivalent effect. In the embodiment of the present application, a sorting machine is selected to test the Hall device to be tested. Since the sorting machine can classify the test results of the Hall device according to the test signal, and can distinguish the Hall devices in different failure conditions, and display the failure conditions and causes on the display, this is something that ordinary testing platforms cannot do. In the prior art, only the Hall device is tested and no special type of classification can be performed. Since the sorting machine is also part of the system, and the various parts in the test system need to interact with each other to complete the entire test process, the present application forms a complete Hall device test system through the interaction of various components between the systems. This solution can not only provide a stable magnetic field for the Hall device test, but also provide a variable magnetic field with strong versatility, provide various magnetic fields suitable for testing to realize the automated testing of the Hall device, and test and classify the Hall device.

[0070] like Figure 3 As shown, Figure 3 This is a test flow chart of a Hall device provided in an embodiment of the present application.

[0071] Based on the above-mentioned Hall device testing system, the present application also provides a Hall device testing method, the method comprising:

[0072] S100, set the output controllable current;

[0073] S200, generating a controllable magnetic field according to the controllable current;

[0074] S300: testing and classifying the Hall devices to be tested according to the controllable magnetic field.

[0075] In an embodiment of the present application, first, an output controllable current is set on a controllable current source, wherein the controllable current may include a constant current, an alternating current, and an increasing or decreasing current. A magnetic field is generated corresponding to the Hall effect current. Since the current is controllable, the magnetic field is also controllable. The corresponding generation of different magnetic fields is beneficial to meeting the test environment of each Hall device to be tested. The Hall devices to be tested are tested and classified according to the controllable magnetic field. The testing and classification process has been described in detail in the above-mentioned test system and will not be repeated here.

[0076] Figure 4 Schematic diagram of the structure of the terminal device provided in the embodiment of the present application. Figure 4 As shown, the terminal device 700 of this embodiment includes: at least one processor 710 ( Figure 4 Only one is shown), a memory 720, and a computer program 721 stored in the memory 720 and executable on the at least one processor 710, wherein the processor 710 implements the steps in the above-mentioned Hall device testing method embodiment when executing the computer program 721.

[0077] The terminal device 700 may be a computing device such as a desktop computer, a notebook, a PDA, or a cloud server. The terminal device may include, but is not limited to, a processor 710 and a memory 720. Those skilled in the art will appreciate that Figure 4 It is only an example of the terminal device 700 and does not constitute a limitation on the terminal device 700. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components, for example, it may also include input and output devices, network access devices, etc.

[0078] The processor 710 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0079] In some embodiments, the memory 720 may be an internal storage unit of the terminal device 700, such as a hard disk or memory of the terminal device 700. In other embodiments, the memory 720 may also be an external storage device of the terminal device 700, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc. equipped on the terminal device 700. Further, the memory 720 may also include both an internal storage unit of the terminal device 700 and an external storage device. The memory 720 is used to store an operating system, an application program, a boot loader (Boot Loader), data and other programs, such as the program code of the computer program, etc. The memory 720 may also be used to temporarily store data that has been output or is to be output.

[0080] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0081] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0082] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed in this application can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0083] In the embodiments provided in the present application, it should be understood that the disclosed devices / terminal equipment and methods can be implemented in other ways. For example, the device / terminal equipment embodiments described above are only schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0084] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0085] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0086] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0087] The present application implements all or part of the processes in the above-mentioned embodiment method, and can also be completed through a computer program product. When the computer program product runs on a terminal device, the terminal device can implement the steps in the above-mentioned method embodiments when executing.

[0088] The above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application is described in detail with reference to the above-mentioned embodiments, a person skilled in the art should understand that the technical solutions described in the above-mentioned embodiments can still be modified, or some of the technical features can be replaced by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. A Hall device testing system, characterized in that: The system comprises: A controllable current source outputs a controllable current, wherein the controllable current acts on the solenoid to control the solenoid to generate a controllable magnetic field; A solenoid is fixed vertically above a test station inside the sorting machine, and the controllable magnetic field generated by the solenoid acts on the test station; The sorting machine controls the Hall devices to be tested to enter the testing station, and tests and classifies the Hall devices to be tested according to the controllable magnetic field.

2. The system according to claim 1, characterized in that: The sorting machine clamps the Hall device to be tested and fixes the Hall device to be tested on the testing station.

3. The system according to claim 1, characterized in that: The testing station tests the Hall devices to be tested according to the controllable magnetic field to generate a test signal, and the sorting machine tests and classifies the Hall devices to be tested according to the received test signal.

4. The system according to claim 3, characterized in that: The sorting machine determines the failure status of the Hall device to be tested according to the test signal.

5. The system according to claim 4, characterized in that: The sorting machine classifies the Hall devices to be tested according to the failure conditions of the Hall devices to be tested.

6. The system according to claim 1, characterized in that: When the controllable current source is connected to the solenoid and outputs a constant current, the constant current acts on the solenoid to control the solenoid to generate a fixed magnetic field; When the controllable current source is connected to the solenoid and outputs an alternating current, the constant current acts on the solenoid to control the solenoid to generate an alternating magnetic field; When the controllable current source is connected to the solenoid and outputs an increasing or decreasing current, the constant current acts on the solenoid to control the solenoid to generate a gradually increasing magnetic field or a gradually decreasing magnetic field.

7. The system according to claim 1, characterized in that: The system further comprises: A display is connected to the sorting machine and displays the test results obtained by the sorting machine.

8. A method for testing a Hall device, characterized in that: The method comprises: Set the output controllable current; Generate a controllable magnetic field according to the controllable current; The Hall devices to be tested are tested and classified according to the controllable magnetic field.

9. A terminal device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the system is applied to any one of claims 1 to 7.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, it is applied to the system according to any one of claims 1 to 7.

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