An intelligent monitoring method for crystallizer temperature suitable for different cooling intensities

Abstract

The present invention relates to the field of data processing technology, and specifically to a method for intelligently monitoring the temperature of a crystallizer suitable for different cooling intensities, comprising: obtaining the basic cooling intensity of each monitoring position according to the distance difference between different monitoring positions and cooling equipment; obtaining the temperature change rate at each moment according to the temperature change of the monitoring position, thereby obtaining the response time of each monitoring position, and then obtaining the degree of response of each monitoring position to the change of cooling intensity, combining the basic cooling intensity of the monitoring position, obtaining the cooling intensity adjustment amount of each monitoring position and the actual cooling intensity of each monitoring position, combining the normal standard temperature of the crystallizer with the temperature of each monitoring position at the current moment, obtaining the temperature abnormality of the crystallizer at the current moment, and realizing intelligent monitoring. The present invention realizes the cooling intensity monitoring of different positions of the crystallizer by analyzing the temperature change and the performance of the cooling intensity of the crystallizer at different positions.

Description

Technical Field

[0001] The invention relates to the technical field of data processing, and in particular to an intelligent monitoring method for crystallizer temperature applicable to different cooling intensities. Background Art

[0002] A crystallizer is a device or apparatus used to control and promote the crystallization of solutes in a solution, usually consisting of a container, a cooling system, a stirring device, and a temperature control system. Among them, the temperature control system can ensure the stability of the crystallization process, the quality of the crystallization, and the production efficiency. Therefore, crystallizer temperature monitoring plays a vital role in various fields such as production and metallurgy.

[0003] At present, the monitoring method of the crystallizer temperature is usually only aimed at monitoring the temperature abnormalities of various parts of the crystallizer. The cooling intensity at different positions inside the crystallizer is different. When the cooling intensity of the crystallizer is changed, the response speed and degree of response at different positions are different, resulting in inaccurate and in-time analysis of the abnormal temperature of the crystallizer. Summary of the invention

[0004] The invention provides a crystallizer temperature intelligent monitoring method applicable to different cooling intensities to solve the existing problems.

[0005] The present invention provides a method for intelligently monitoring the temperature of a crystallizer with different cooling intensities by using the following technical solutions:

[0006] An embodiment of the present invention provides a method for intelligently monitoring the temperature of a crystallizer applicable to different cooling intensities, the method comprising the following steps:

[0007] Obtain the temperature at different monitoring positions, as well as the initial cooling intensity and normal standard temperature of the crystallizer;

[0008] According to the difference in distance between different monitoring positions and cooling equipment, the basic cooling intensity of each monitoring position is obtained;

[0009] According to the temperature change of each monitoring position, the temperature change rate of each monitoring position at each moment is obtained; according to the temperature change rate of each monitoring position at each moment, the response time of each monitoring position is obtained; according to the temperature change rate of each monitoring position at each moment, combined with the response time of each monitoring position, the response degree of each monitoring position to the change of cooling intensity is obtained;

[0010] According to the basic cooling intensity of each monitoring position and the response degree to the change of cooling intensity, the cooling intensity adjustment amount of each monitoring position is obtained; according to the cooling intensity adjustment amount of each monitoring position and the basic cooling intensity of each monitoring position, the real cooling intensity of each monitoring position is obtained;

[0011] According to the normal standard temperature of the crystallizer, the temperature of each monitoring position at the current moment, and the actual cooling intensity of each monitoring position, the temperature abnormality of the crystallizer at the current moment is obtained, and the intelligent monitoring of the crystallizer temperature abnormality is realized according to the temperature abnormality of the crystallizer at the current moment.

[0012] Further, obtaining the basic cooling intensity of each monitoring position includes:

[0013]

[0014] in, Indicates The basic cooling intensity of each monitoring location, Indicates the initial cooling intensity of the crystallizer, Indicates The distance between each monitoring location and the cooling equipment.

[0015] Furthermore, the step of obtaining the temperature change rate of each monitoring position at each moment includes the following specific steps:

[0016] The first The monitoring location is The temperature at the time and The monitoring location is The temperature difference at time The monitoring location is The rate of temperature change at a given moment.

[0017] Furthermore, the step of obtaining the response time of each monitoring location includes the following specific steps:

[0018] The temperature threshold is preset, the moment when the cooling intensity of the cooling device starts to change is recorded as the tth moment, and the time interval from the tth moment to the stable moment is recorded as the The response time of each monitoring location.

[0019] Furthermore, the specific method of obtaining the stable moment is as follows:

[0020] If after time t When the temperature change rate of each monitoring position is greater than the temperature threshold at each moment, the next moment is determined; and so on, until there is a constant , making the The monitoring location is When the temperature change rate at the moment is less than or equal to the temperature threshold, Time is recorded as The stable moment of a monitoring position.

[0021] Furthermore, the step of obtaining the response degree of each monitoring position to the change of cooling intensity includes the following specific steps:

[0022]

[0023] in, Indicates the moment when the cooling intensity of the cooling equipment begins to change. Indicates The monitoring location is The rate of temperature change at a given moment; Indicates The response degree of each monitoring location to the change of cooling intensity, Indicates The response time of each monitoring location.

[0024] Furthermore, the step of obtaining the cooling intensity adjustment amount at each monitoring position includes the following specific steps:

[0025]

[0026] in, Indicates The cooling intensity adjustment amount for each monitoring position, Indicates The basic cooling intensity of each monitoring location, Indicates The response of each monitoring location to changes in cooling intensity.

[0027] Furthermore, the actual cooling intensity of each monitoring position is obtained, and the specific steps include the following:

[0028] The first The basic cooling intensity at the first monitoring position is The difference in cooling intensity adjustment at each monitoring position is recorded as The actual cooling intensity at each monitoring location.

[0029] Furthermore, the step of obtaining the temperature abnormality of the crystallizer at the current moment includes the following specific steps:

[0030]

[0031] in, Indicates the degree of abnormal temperature of the crystallizer at time r, Indicates the number of monitoring positions in the crystallizer, Indicates The temperature of a monitoring location at time r, Indicates the normal standard temperature of the crystallizer. Indicates The actual cooling intensity at each monitoring location.

[0032] Furthermore, the intelligent monitoring of the abnormal temperature of the crystallizer according to the abnormal temperature degree of the crystallizer at the current moment includes the following specific steps:

[0033] A temperature abnormality threshold is preset. When the temperature abnormality is greater than or equal to the preset temperature abnormality threshold, the inside of the crystallizer needs to be inspected.

[0034] The beneficial effects of the technical solution of the present invention are: according to the difference in distances between different monitoring positions and cooling equipment, the basic cooling intensity of each monitoring position is obtained, which serves as the basis for the subsequent calculation of the actual cooling intensity; according to the temperature change of the monitoring position, the temperature change rate at each moment is obtained. Since each monitoring position has a certain time to respond to the cooling equipment, the response time of each monitoring position is obtained, and the response degree of each monitoring position to the change in cooling intensity is obtained. Combined with the basic cooling intensity of the monitoring position, the cooling intensity adjustment amount of each monitoring position and the actual cooling intensity of each monitoring position are obtained. Combined with the normal standard temperature of the crystallizer and the temperature of each monitoring position at the current moment, the temperature abnormality of the crystallizer at the current moment is obtained, thereby achieving the accuracy and timeliness of intelligent monitoring of crystallizer temperature abnormalities. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0036] Figure 1 The present invention is a flowchart of the steps of a method for intelligently monitoring the temperature of a crystallizer applicable to different cooling intensities. DETAILED DESCRIPTION

[0037] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following is a detailed description of the specific implementation method, structure, features and effects of a crystallizer temperature intelligent monitoring method applicable to different cooling intensities proposed by the present invention in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

[0038] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0039] The specific scheme of the intelligent monitoring method of the crystallizer temperature applicable to different cooling intensities provided by the present invention is described in detail below with reference to the accompanying drawings.

[0040] See also Figure 1 , which shows a flow chart of a method for intelligently monitoring the temperature of a crystallizer with different cooling intensities provided by an embodiment of the present invention, the method comprising the following steps:

[0041] Step S001, obtaining the temperatures at different monitoring positions, the initial cooling intensity of the crystallizer and the normal standard temperature of the crystallizer.

[0042] The purpose of this embodiment is to monitor the cooling intensity at different positions of the crystallizer by analyzing the temperature change and the cooling intensity of the crystallizer at different positions; therefore, it is necessary to install a plurality of evenly distributed temperature sensors in the crystallizer to monitor the temperatures at different monitoring positions in the crystallizer, each sensor location corresponds to a monitoring position, and according to the wear-resistant layer thickness of the crystallizer copper tube, the cooling water volume and the steel type, obtain the a priori initial cooling intensity of the crystallizer and the normal standard temperature of the crystallizer at different initial cooling intensities; obtain the moment when the cooling intensity of the cooling equipment begins to change; in this embodiment, the number of installed sensors is 20, the monitoring frequency is once per second, and the monitoring time is one week, which is described as an example, and this embodiment is not specifically limited.

[0043] Step S002: obtaining a basic cooling intensity at each monitoring position according to the difference in distance between different monitoring positions and the cooling device.

[0044] It should be noted that, due to the different distances between the cooling device in the crystallizer and different positions, the cooling intensity for different positions is also different; when the low temperature transmitted by the cooling device is transmitted to the monitoring position at a short distance, the temperature is low, and the cooling effect on the monitoring position is good, while when the low temperature transmitted by the cooling device is transmitted to the monitoring position at a long distance, the temperature is high, and the cooling effect is reduced. Therefore, this embodiment obtains the basic cooling intensity of each monitoring position according to the distance between the monitoring position and the cooling device.

[0045] Specifically, The base cooling strength for each monitor position is calculated as:

[0046]

[0047] in, Indicates The basic cooling intensity of each monitoring location, Indicates the initial cooling intensity of the crystallizer, Indicates The distance between each monitoring location and the cooling equipment.

[0048] Step S003: Obtain the response degree of each monitoring position to the change in cooling intensity according to the response time and temperature change of each monitoring position to the change in cooling intensity of the cooling device.

[0049] It should be noted that when the cooling intensity of the cooling equipment suddenly increases, the temperature of each monitoring location will gradually decrease to a stable state. The time required for the temperature to gradually decrease is the response time of the monitoring location to the change in cooling intensity. The shorter the response time, the more susceptible the temperature of the monitoring location is to change due to the adjustment of the cooling intensity of the cooling equipment, that is, the greater the response degree of the monitoring location. By analyzing the changes in the temperature change rate, the temperature change situation of each monitoring location can be represented.

[0050] Specifically, for The monitoring location is The temperature change rate at the moment is:

[0051]

[0052] in, Indicates The monitoring location is The temperature change rate at time, Indicates The monitoring location is The temperature of the moment, Indicates The monitoring location is The temperature at the moment. It should be noted that when When the The monitoring location is The temperature change rate at the moment The monitoring location is The rate of temperature change at a given moment.

[0053] It should be further explained that after the cooling intensity of the cooling equipment changes, the speed of temperature change caused by the change is also different at different monitoring locations. When the cooling intensity change has a large impact on the monitoring location, the temperature of the monitoring location will change faster after the cooling intensity changes, that is, the response to the change in the cooling intensity of the cooling equipment is greater; on the contrary, when the temperature changes more slowly, it means that the monitoring location is less responsive to the cooling intensity of the cooling equipment.

[0054] Specifically, a temperature threshold is preset, and the moment when the cooling intensity of the cooling device begins to change is recorded as the tth moment. If the temperature change rate of each monitoring position at each moment is greater than the temperature threshold, the next moment is determined; and so on, until there is a constant , making the The monitoring location is When the temperature change rate at the moment is less than or equal to the temperature threshold, Time is recorded as The stable moment of the monitoring position, the constant Recorded as The response time of each monitoring position; in this embodiment, the preset temperature threshold is 1 degree Celsius, which is used as an example for description. Other embodiments may set other values, and this embodiment does not specifically limit it.

[0055] According to The temperature change rate of the first monitoring position from the moment when the cooling intensity of the cooling equipment starts to change to the moment when it stabilizes, combined with the The response time of each monitoring location is The response degree of the monitoring position to the change of cooling intensity; The response of each monitoring location to the change in cooling intensity is calculated as:

[0056]

[0057] in, Indicates the moment when the cooling intensity of the cooling equipment begins to change. Indicates The monitoring location is The rate of temperature change at a given moment; Indicates The response degree of each monitoring location to the change of cooling intensity, Indicates The response time of each monitoring location.

[0058] The shorter the response time of the monitoring position to the change in cooling intensity and the greater the degree of temperature influence, the greater the degree of response of the monitoring position to the change in cooling intensity.

[0059] Step S004: Obtain the cooling intensity adjustment amount of each monitoring position according to the basic cooling intensity of each monitoring position and the response degree to the cooling intensity change, so as to obtain the real cooling intensity of the monitoring position.

[0060] It should be noted that due to the influence of factors such as the crystalline material in the crystallizer, the actual cooling intensity at the monitoring position is different from the expected basic cooling intensity. Therefore, it is necessary to adjust the basic cooling intensity of each monitoring position according to the response degree of each monitoring position to the change of the cooling intensity of the cooling equipment to obtain the actual cooling intensity of each monitoring position.

[0061] It should be further explained that the greater the response of the monitoring location to the change in cooling intensity, the faster and more effectively the temperature at the monitoring location can change after the cooling intensity of the cooling equipment changes, and the faster it can drop to a stable temperature when cooling is required, and the better the cooling effect, and the greater the cooling intensity of the corresponding monitoring location, that is, the smaller the degree of reduction in the basic cooling intensity.

[0062] Specifically, based on the basic cooling intensity of each monitoring location, calculate the Cooling intensity adjustment for each monitoring position:

[0063]

[0064] Further, The actual cooling intensity at each monitoring location is calculated as:

[0065]

[0066] in, Indicates The cooling intensity adjustment amount for each monitoring position, Indicates The basic cooling intensity of each monitoring location, Indicates The response degree of each monitoring location to the change of cooling intensity, Indicates The actual cooling intensity at each monitoring location.

[0067] Step S005: Obtain the degree of temperature abnormality of the crystallizer at the current moment according to the actual cooling intensity of each monitoring position and the temperature of the crystallizer at the current moment.

[0068] It should be noted that the corresponding temperature at the monitoring position with a large actual cooling intensity is more stable, and the temperature can be adjusted more promptly when the cooling intensity of the cooling equipment changes, and temperature abnormalities are less likely to occur. At the monitoring position with a small actual cooling intensity, the temperature is more likely to rise or fall too quickly, resulting in temperature abnormalities. When the cooling intensity of the cooling equipment changes, the temperature cannot be adjusted in time. Therefore, the monitoring position with a small cooling intensity is more likely to cause temperature abnormalities in the crystallizer.

[0069] Specifically, the current moment is recorded as the rth moment, and the calculation method of the abnormal degree of the crystallizer temperature is:

[0070]

[0071] in, Indicates the degree of abnormal temperature of the crystallizer at time r, Indicates the number of monitoring positions in the crystallizer, Indicates The temperature of a monitoring location at time r, Indicates the normal standard temperature of the crystallizer. Indicates The actual cooling intensity at each monitoring location.

[0072] Indicates The degree of deviation between the temperature of each monitoring position at the rth moment and the normal standard temperature of the crystallizer. The greater the deviation, the more likely it is that the crystallizer at the rth moment will have an abnormal temperature.

[0073] A temperature anomaly threshold is preset. When the degree of temperature anomaly is greater than or equal to the preset temperature anomaly threshold, it indicates that the temperature of the crystallizer is abnormal and the inside of the crystallizer needs to be checked; when the degree of temperature anomaly is less than the preset temperature anomaly threshold, it indicates that the temperature of the crystallizer is within the normal range; in this embodiment, the preset temperature anomaly threshold is 0.5, and other values ​​may be set in other embodiments, which are not specifically limited in this embodiment.

[0074] So far, the present invention is completed.

[0075] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for intelligently monitoring the temperature of a crystallizer suitable for different cooling intensities, characterized in that: The method comprises the following steps: Obtain the temperature at different monitoring positions, as well as the initial cooling intensity and normal standard temperature of the crystallizer; According to the difference in distance between different monitoring positions and cooling equipment, the basic cooling intensity of each monitoring position is obtained; According to the temperature change of each monitoring position, the temperature change rate of each monitoring position at each moment is obtained; according to the temperature change rate of each monitoring position at each moment, the response time of each monitoring position is obtained; according to the temperature change rate of each monitoring position at each moment, combined with the response time of each monitoring position, the response degree of each monitoring position to the change of cooling intensity is obtained; According to the basic cooling intensity of each monitoring position and the response degree to the change of cooling intensity, the cooling intensity adjustment amount of each monitoring position is obtained; according to the cooling intensity adjustment amount of each monitoring position and the basic cooling intensity of each monitoring position, the real cooling intensity of each monitoring position is obtained; According to the normal standard temperature of the crystallizer and the temperature of each monitoring position at the current moment, as well as the actual cooling intensity of each monitoring position, the temperature abnormality of the crystallizer at the current moment is obtained, and the intelligent monitoring of the crystallizer temperature abnormality is realized according to the temperature abnormality of the crystallizer at the current moment; The obtaining of the basic cooling intensity of each monitoring position comprises: in, Indicates The basic cooling intensity of each monitoring location, Indicates the initial cooling intensity of the crystallizer, Indicates The distance between each monitoring location and the cooling equipment; The specific steps of obtaining the response time of each monitoring location are as follows: The temperature threshold is preset, the moment when the cooling intensity of the cooling device starts to change is recorded as the tth moment, and the time interval from the tth moment to the stable moment is recorded as the Response time of each monitoring location; The specific method of obtaining the stable moment is as follows: If after time t When the temperature change rate of each monitoring position is greater than the temperature threshold at each moment, the next moment is determined; and so on, until there is a constant , making the The monitoring location is When the temperature change rate at the moment is less than or equal to the temperature threshold, Time is recorded as The stable moment of each monitoring position; The specific steps of obtaining the response degree of each monitoring position to the change of cooling intensity include the following: in, Indicates the moment when the cooling intensity of the cooling equipment begins to change. Indicates The monitoring location is The rate of temperature change at a given moment; Indicates The response degree of each monitoring location to the change of cooling intensity, Indicates Response time of each monitoring location; The specific steps of obtaining the temperature abnormality of the crystallizer at the current moment are as follows: in, Indicates the degree of abnormal temperature of the crystallizer at time r, Indicates the number of monitoring positions in the crystallizer, Indicates The temperature of a monitoring location at time r, Indicates the normal standard temperature of the crystallizer. Indicates The actual cooling intensity at each monitoring location.

2. According to claim 1, a method for intelligently monitoring the temperature of a crystallizer applicable to different cooling intensities is characterized in that: The specific steps of obtaining the temperature change rate of each monitoring position at each moment are as follows: The first The monitoring location is The temperature at the time and The monitoring location is The temperature difference at time The monitoring location is The rate of temperature change at a given moment.

3. According to claim 1, a method for intelligently monitoring the temperature of a crystallizer applicable to different cooling intensities is characterized in that: The specific steps of obtaining the cooling intensity adjustment amount at each monitoring position are as follows: in, Indicates The cooling intensity adjustment amount for each monitoring position, Indicates The basic cooling intensity of each monitoring location, Indicates The response of each monitoring location to changes in cooling intensity.

4. According to claim 1, a method for intelligently monitoring the temperature of a crystallizer applicable to different cooling intensities is characterized in that: The specific steps of obtaining the actual cooling intensity of each monitoring position are as follows: The first The basic cooling intensity at the first monitoring position is The difference in cooling intensity adjustment at each monitoring position is recorded as The actual cooling intensity at each monitoring location.

5. According to claim 1, a method for intelligently monitoring the temperature of a crystallizer applicable to different cooling intensities is characterized in that: The intelligent monitoring of the abnormal temperature of the crystallizer according to the abnormal temperature degree of the crystallizer at the current moment includes the following specific steps: A temperature abnormality threshold is preset. When the temperature abnormality is greater than or equal to the preset temperature abnormality threshold, the inside of the crystallizer needs to be inspected.

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