Systems and methods for detection of defects in electrodes

Abstract

Systems and methods for identifying defects in electrodes are described. A system for detecting defects in an electrode may include at least one camera and at least one processing device configured to detect the presence or absence of one or more defects in an electrode using an image input from the camera. Camera-based image analysis may be used to improve product quality and reliability.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims priority to and the benefit of U.S. Provisional Application No. 63 / 315,349, filed on March 1, 2022, the disclosure of which is hereby incorporated by reference in its entirety. Background Art

[0003] Electrodes produced by calendering rollers may be damaged by defects that reduce the performance of endless sheets used to form electrochemical cells and capacitors. These defects may be caused by surface defects in the calendering rollers (including damage and impurities present on the surface of the rollers), defects in the dry electrode composition mixture, and errors in the settings of the calendering rollers. These same impurities may also damage equipment rollers such as calendering rollers and clamping rollers by causing surface depressions. These equipment rollers are critical because they handle and deform the powders and sheets formed into electrochemical cells, and surface depressions on the equipment rollers produce formed sheets that are outside the size specifications. In addition, impurities themselves may be embedded in the endless sheets. These impurities and equipment roller surface defects can lead to reduced electrochemical cell performance, lower reliability, and higher product failure rates.

[0004] There is a need for improved inspection techniques for identifying and locating defects in produced electrodes. Summary of the invention

[0005] In some embodiments, a system for detecting defects in an electrode may include: at least one camera and at least one processing device, wherein the at least one processing device is configured to detect the presence of one or more defects in the electrode using image input from the camera.

[0006] In some embodiments, the at least one camera may include two or more cameras.

[0007] In some embodiments, the at least one camera may be an optical camera.

[0008] In some embodiments, the at least one camera can have a resolution of at least about 0.5 mm.

[0009] In some embodiments, the at least one camera may be configured to periodically capture image input.

[0010] In some embodiments, the at least one camera may be configured to capture image input based on external input, the external input comprising at least one of a sensor input and a user input.

[0011] In some embodiments, the at least one camera may be configured to wirelessly transmit the image input to the at least one processing device.

[0012] In some embodiments, the at least one processing device may be configured to receive at least one image and analyze the image input to detect the presence of one or more defects in the electrode.

[0013] In some embodiments, the at least one processing device may be configured to output a report or signal regarding the presence of a defect in the electrode.

[0014] In some embodiments, the at least one processing device can be configured to count defects in the electrode.

[0015] In some embodiments, the at least one processing device may be configured to determine a physical location of a defect in the electrode.

[0016] In some embodiments, the system may further include at least one sorting device.

[0017] In some embodiments, a method for detecting the presence of a defect in an electrode may include providing at least one electrode, obtaining at least one image of the electrode using at least one camera, and analyzing the at least one image using at least one processing device to detect the presence of the defect.

[0018] In some embodiments, the at least one image may be acquired periodically.

[0019] In some embodiments, the at least one image may be obtained based on external input, the external input comprising at least one of a sensor input and a user input.

[0020] In some embodiments, the analysis can be qualitative.

[0021] In some embodiments, the analysis can be quantitative.

[0022] In some embodiments, the method may further include determining whether the presence of a defect is acceptable.

[0023] In some embodiments, the method may further include determining a physical location of a defect in the electrode.

[0024] In some embodiments, the method may further include sorting the electrodes based on the presence of defects. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The present disclosure will be more fully understood from the following detailed description taken in conjunction with the accompanying drawings, in which:

[0026] Figure 1Depicted is an electrode with an identification mark according to one embodiment.

[0027] Figure 2 A system including a camera and electrodes is depicted according to an embodiment.

[0028] Figure 3A An illustrative example of a system including multiple cameras and electrodes is depicted according to an implementation.

[0029] Figure 3B A second illustrative example of a system including multiple cameras and electrodes according to an implementation is depicted.

[0030] Figure 4 A diagram depicting a process sequence for validating an electrode according to an embodiment.

[0031] Figure 5 Depicts a comparison of a template image and a captured image of an electrode according to an embodiment.

[0032] definition

[0033] As used herein, the term "about" when immediately preceding a numerical value means a range of plus or minus 10% of the numerical value, for example, "about 50" means 45 to 55, "about 25,000" means 22,500 to 27,500, etc., unless the context of the present disclosure indicates otherwise or is inconsistent with such an interpretation.

[0034] The present disclosure is not limited by the specific embodiments described in this application, which are intended to be illustrative of various aspects. Without departing from the spirit and scope of the present disclosure, many modifications and changes can be made, as will be easily understood by those skilled in the art. In addition to those methods and devices listed herein, those skilled in the art will easily understand the functionally equivalent methods and devices within the scope of the present disclosure from the foregoing description. Such modifications and changes are intended to fall within the scope of the appended claims. The present disclosure is only limited by the terms of the appended claims and the full range of equivalents to which these claims are entitled. It should be understood that the present disclosure is not limited to specific methods, reagents, compounds, compositions or biological systems that can certainly vary. It should also be understood that the terms used herein are only used for the purpose of describing specific embodiments, and are not intended to be restrictive.

[0035] As used in this document, the singular forms "a", "an", and "the" include plural references unless the context clearly dictates otherwise. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art. Nothing in this disclosure should be construed as an admission that the embodiments described in the present disclosure are not entitled to antedate such disclosure by virtue of prior invention. As used in this document, the term "including" means "including, but not limited to."

[0036] While various compositions, methods, and apparatus are described in terms of "comprising" various components or steps (interpreted to mean "including but not limited to"), the compositions, methods, and apparatus may also "consist essentially of" or "consist of" the various components and steps, and such terms should be interpreted as defining a substantially closed group of members.

[0037] With respect to the use of substantially any plural and / or singular terms herein, those skilled in the art can translate from the plural to the singular and / or from the singular to the plural as is appropriate to the context and / or application. For clarity, various singular / plural arrangements may be expressly set forth herein.

[0038] It will be understood by those skilled in the art that, in general, the terms used herein and particularly in the appended claims (e.g., the bodies of the appended claims) are generally intended to be "open" terms (e.g., the term "including" should be interpreted as "including but not limited to," the term "having" should be interpreted as "having at least," the term "includes" should be interpreted as "including but not limited to," etc.). It will also be understood by those skilled in the art that if a specific number of an introduced claim recitation is intended, such intent will be explicitly recited in the claim, and in the absence of such a recitation, such intent is absent. For example, as an aid to understanding, the following appended claims may contain the use of the introductory phrases "at least one" and "one or more" to introduce claim recitations. However, the use of such phrases should not be interpreted as implying that the introduction of a claim recitation by the indefinite article "a" or "an" limits any particular claim containing such introduced claim recitation to embodiments containing only one such recitation, even when the same claim includes the introductory phrases "one or more" or "at least one" and an indefinite article such as "a" or "an" (e.g., "a" and / or "an" should be interpreted as meaning "at least one" or "one or more"); the same applies to the use of definite articles used to introduce claim recitations. Furthermore, even if a specific number of introduced claim recitations is explicitly recited, those skilled in the art will recognize that such recitation should be interpreted as meaning at least the recited number (e.g., the straightforward recitation "two recitations" without other modifiers means at least two recitations, or two or more recitations). Furthermore, in those cases where a convention similar to “at least one of A, B, and C, etc.” is used, generally speaking, such construction is intended to be within the meaning that one skilled in the art would understand the convention (e.g., “a system having at least one of A, B, and C” would include but is not limited to systems having A alone, B alone, C alone, A and B together, A and C together, B and C together, and / or A, B, and C together, etc.). In those cases where a convention similar to “at least one of A, B, or C, etc.” is used, generally speaking, such construction is intended to be within the meaning that one skilled in the art would understand the convention (e.g., “a system having at least one of A, B, or C” would include but is not limited to systems having A alone, B alone, C alone, A and B together, A and C together, B and C together, and / or A, B, and C together, etc.). One skilled in the art would also understand that, in practice, any transitional words and / or phrases presenting two or more alternatives, whether in the specification, claims, or drawings, should be understood to contemplate the possibility of including one, either, or both of the items. For example, the phrase "A or B" will be understood to include the possibilities of "A" or "B" or "A and B."

[0039] In addition, where features or aspects of the disclosure are described in terms of Markush groups, those skilled in the art will recognize that the disclosure is also thereby described in terms of any individual member or subgroup of members of the Markush group.

[0040] As will be understood by those skilled in the art, for any and all purposes, such as in providing a written description, all ranges disclosed herein also encompass any and all possible sub-ranges and combinations of sub-ranges thereof. Any listed range can be easily recognized as fully describing and enabling the same range to be decomposed into at least equal two parts, three parts, four parts, five parts, ten parts, etc. As a non-limiting example, each range discussed herein can be easily decomposed into a lower third, a middle third, and an upper third, etc. As will be understood by those skilled in the art, all languages ​​such as "at most", "at least", etc. include the narrated numbers, and refer to the ranges that can be subsequently decomposed into sub-ranges as discussed above. Finally, as will be understood by those skilled in the art, the range includes each individual member. Therefore, for example, a group with 1 to 3 units refers to a group with 1, 2 or 3 units. Similarly, a group with 1 to 5 units refers to a group with 1, 2, 3, 4 or 5 units, etc.

[0041] Various above-disclosed and other features and functions or their replacements can be combined into many other different systems or applications. Those skilled in the art may subsequently make various currently unforeseeable or unforeseen substitutions, modifications, changes or improvements therein, each of which is also intended to be included in the disclosed embodiments. DETAILED DESCRIPTION

[0042] The present disclosure is not limited to the particular systems, devices and methods described, as these may vary. The terminology used in the description is for the purpose of describing the particular versions or implementations only and is not intended to limit the scope.

[0043] system

[0044] A system may be assembled to aid in detecting defects in fabricated electrodes.

[0045] In one example, a system may include at least one camera and at least one processing device configured to detect the presence or absence of one or more defects in an electrode using image input from the camera.

[0046] Figure 1An electrode 101 is illustrated comprising one or more markings 102. The one or more markings 102 may be etched into the electrode 101 via laser or chemical etching. The one or more markings 102 may have been imparted to the electrode 101 by similar physical markings on the surface of a roll used to calender the electrode 101.

[0047] Figure 2 A system is illustrated having an electrode web 202, at least one camera 201, and a processing device (not shown) configured to detect the presence or absence of one or more defects in the electrode using image input from the at least one camera.

[0048] The number of cameras can generally be any number, such as 1 or 2 or more. For example, 1, 2, 3, 4, 5, 6 or more cameras can be used.

[0049] Each camera can generally be any camera type. For example, each camera can be an optical camera. Each camera can generally have any minimum resolution. For example, the minimum resolution can be at least about 0.5 mm, at least about 0.4 mm, at least about 0.3 mm, at least about 0.2 mm, or at least about 0.1 mm. The minimum resolution can be at least sufficient to detect defects. For example, the size of a dent can be at least about 0.5 mm, so the minimum resolution can be selected to be at least about 0.5 mm to detect the dent.

[0050] When two or more cameras are used in the system, the cameras can generally be configured in any orientation. For example, the cameras can be oriented relative to the surface to be imaged. Each camera can generally be oriented at any angle relative to the surface to be imaged, such as about 0 degrees, about 5 degrees, about 10 degrees, about 15 degrees, about 20 degrees, about 25 degrees, about 30 degrees, or within a range between any two of these values. In examples where two or more cameras are used, the cameras can be oriented at the same angle or different angles relative to the surface to be imaged. Figure 3A and Figure 3B An example of two camera system orientations is shown. Figure 3A As shown, the two cameras 301 / 302 may be positioned on opposite sides of the electrode 303. Alternatively, as Figure 3B As shown, the two cameras 304 / 305 may be positioned facing the same surface of the electrode 306 .

[0051] At least one camera may be configured to obtain at least one image and transmit the at least one image to a processing device for analysis. At least one camera may be configured to obtain images periodically or based on external input. In some embodiments, each image may include a static image. In some embodiments, at least one image may include a video at a predetermined frame rate. Image capture may be prompted based on external input from a sensor (e.g., temperature, humidity, etc.) or a user. For example, a temperature sensor may detect that a machine surface has exceeded a predetermined threshold temperature and periodically capture images to analyze product quality until the temperature drops below the threshold. The camera may be configured to transmit images via wires / cables or wirelessly (such as via a network, Wi-Fi, or Bluetooth connection).

[0052] The processing device can generally be any type of processing device, such as a desktop computer, a laptop computer, a tablet computer, a mobile phone, etc. The processing device can be configured to receive at least one image and analyze the image to detect the presence or absence of one or more defects in the electrode. The processing device can be configured to correct any image distortion caused by the positioning of at least one camera. Image distortion correction can be performed based on the known placement of at least one camera or automatically. Markers (such as those disclosed herein) can assist in automatic correction of image distortion. The processing device can be further configured to output a report or signal about the presence or absence of a defect in the electrode.

[0053] The presence or absence of defects can be qualitative (e.g., "no defects" or "defects detected") or quantitative (e.g., "zero defects," "one defect," or "two defects"). The processing device can be configured to compare the number of detected defects to a standard value or threshold, wherein if the number of detected defects is below the standard value or threshold, the electrode is identified as acceptable, and if the number of detected defects is above the standard value or threshold, the electrode is identified as unacceptable. The processing device may additionally or alternatively compare the number of detected defects to an average number of defects over a period of time to detect changes in production quality. The detected defects can be measured in a variety of ways. For example, the number of defects per square meter can be measured. In some examples, the number of defects may be no more than about 1 defect / m 2 , no more than about 0.5 defects / m 2 , no more than about 0.4 defects / m 2 , no more than about 0.3 defects / m 2 , no more than about 0.2 defects / m 2 , no more than 0.1 defect / m 2 In an ideal situation, the number of defects will be less than the detection limit of the system, that is, no defects detected / m 2 .

[0054] In some embodiments, the processing device may be configured to count the detected defect as a simple number. In some embodiments, the processing device may be configured to report the physical location of the detected defect in the electrode.

[0055] The system may also include at least one sorting device. For example, the sorting device may be configured to divert electrodes having an unacceptable number of defects. In some embodiments, the faulty electrodes may be diverted to a waste container, a recycling bin, or any other suitable container.

[0056] The system may also include at least one database of detected defects. The system may be configured to compare one or more acquired images with the at least one database of detected defects. The system may be configured to add a newly detected image of a defect to one of the at least one database.

[0057] method

[0058] Methods may be performed to help detect defects in fabricated electrodes.

[0059] In one example, a method for detecting the presence or absence of one or more defects in an electrode is provided. In one embodiment, the method includes providing at least one electrode, obtaining at least one image of the at least one electrode using at least one camera, and analyzing the at least one image using at least one processing device to detect the presence or absence of one or more defects.

[0060] At least one image may be obtained periodically or based on external input. The at least one image may be a static image or a video. The type of image and image capture rate may be selected based on factors such as line speed and roll diameter.

[0061] The analysis may be performed qualitatively (e.g., "no defects" or "defects detected") or quantitatively (e.g., "zero defects," "one defect," or "two defects"). The analysis may compare the number of defects detected to a standard value or threshold, wherein if the number of defects detected is below the standard value or threshold, the electrode is identified as acceptable, and if the number of defects detected is above the standard value or threshold, the electrode is identified as unacceptable. The analysis may additionally or alternatively compare the number of defects detected to an average value over a period of time to detect changes in production quality. The analysis may be performed for the entire electrode or may be performed for a portion of the electrode.

[0062] Analyzing the electrode may also include comparing at least one collected image to a template image. Figure 4, the method may include: receiving a template of an electrode 401, capturing two or more images of the electrode 402, comparing at least two images of the electrode to the template 403, and determining which images deviate from the template 404. If the deviation is below a threshold deviation, the method may include indicating that there is no error 406. If the deviation is above a threshold deviation, the method may include indicating that there is an error 405. The threshold may be a single image showing the deviation. Alternatively, in an embodiment with multiple cameras, images from alternative sources may be used similarly to the template. By relying on images from multiple cameras, deviations caused by a single camera (e.g., due to calibration errors or interference from the lens) may be ignored.

[0063] Figure 5 Depicted is an exemplary comparison between a template 501 and a collected image 502. The template 501 and the collected image 502 may each include a marker 503. By comparing the two images 501 / 502, any deviation 504 may be detected.

[0064] The method may also include sorting the electrodes. The presence or absence of defects may be used to automatically sort the electrodes. Electrodes that "pass" the analysis step may be sorted to be separated from electrodes that "fail" the analysis step. Sorting may include transferring defective electrodes to a waste container, recycling bin, or other suitable container.

[0065] The method may further comprise comparing one or more of the acquired images to at least one database of previously detected defects.The method may further comprise adding any newly detected images of the defect to the database.

Claims

1. A system for detecting defects in an electrode, the system include: At least one camera; as well as At least one processing device is configured to detect the presence of one or more defects in the electrode using the image input from the camera.

2. The system of claim 1, wherein the at least one camera comprises two or more cameras.

3. The system of any one of claims 1 to 2, wherein the at least one camera is an optical camera.

4. The system of any one of claims 1 to 3, wherein the at least one camera has a resolution of at least about 0.5 mm.

5. The system of any one of claims 1 to 4, wherein the at least one camera is configured to periodically capture image input.

6. The system of any one of claims 1 to 4, wherein the at least one camera is configured to capture image input based on external input, the external input comprising at least one of a sensor input and a user input.

7. The system of any one of claims 1 to 6, wherein the at least one camera is configured to wirelessly transmit the image input to the at least one processing device.

8. The system of any one of claims 1 to 7, wherein the at least one processing device is further configured to receive at least one image and analyze the image input to detect the presence of one or more defects in the electrode.

9. The system of any one of claims 1 to 8, wherein the at least one processing device is further configured to output a report or signal regarding the presence of a defect in the electrode.

10. The system of any one of claims 1 to 9, wherein the at least one processing device is further configured to count defects in the electrode.

11. The system of any one of claims 1 to 10, wherein the at least one processing device is further configured to determine a physical location of a defect in the electrode.

12. The system according to any one of claims 1 to 11, further comprising: include: At least one sorting device.

13. A method of detecting the presence of a defect in an electrode, the method include: providing at least one electrode; obtaining at least one image of the electrode using at least one camera; as well as The image is analyzed using at least one processing device to detect the presence of the defect. The method of claim 13 , wherein the at least one image is acquired periodically.

15. The method of claim 13, wherein the at least one image is obtained based on an external input, the external input comprising at least one of a sensor input and a user input.

16. The method of any one of claims 14 to 15, wherein the analysis is qualitative.

17. The method of any one of claims 14 to 15, wherein the analysis is quantitative.

18. The method of any one of claims 14 to 17, further comprising: include: A determination is made as to whether the presence of the defect is acceptable.

19. The method of any one of claims 14 to 18, further comprising: include: The physical location of the defect in the electrode is determined.

20. The method of any one of claims 14 to 19, further comprising: include: The electrodes are sorted based on the presence of defects.

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