PCIE (Peripheral Component Interface Express) automatic test system and method
Through the PCIE automated testing system and methods, the remote computer and the lane automatic switching module are used to realize the automatic capture and analysis of PCIE data signals, solving the problems of long test cycles and many manual interventions in the existing technology, and achieving efficient and accurate complete Automated testing reduces costs and manual participation.
Patent Information
- Application Number
- CN202411007574.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-25
- Publication Date
- 2024-12-17
AI Technical Summary
The existing PCIE testing methods require a lot of manual intervention, long test cycles, and frequent server power-down and restart, resulting in low testing efficiency and high cost, especially when switching lane and preset, it requires frequent manual operations, which affects the accuracy of the test results.
A PCIE automated testing system and method is designed to send commands to the test equipment through a remote computer to realize automatic capture and analysis of PCIE data signals. The lane automatic switching module is used to automatically switch lane, and fully automated testing is achieved in combination with the communication module to ensure the test. The accuracy of the results and complete the PCIE secondary chain building without power off to achieve fully automated operations.
It greatly reduces the test cycle and cost, realizes fully automated PCIE testing, improves the accuracy and efficiency of test results, and reduces manual intervention. The entire machine can complete the consistency test of all lane without frequent power-down and restart.
Smart Images
Figure CN119155205A_ABST
Abstract
Description
Technical Field
[0001] The present invention belongs to the field of PCIE test technology, and in particular relates to a PCIE automatic test system and method. Background Art
[0002] The PCIE test in the prior art is that the PCIE signal at the DUT end under test is networked using a CLB fixture and a high-bandwidth oscilloscope. After the PCIE link is established, the oscilloscope uses a manual and semi-automatic solution to perform the test. The current 4.0 involves 16 lanes, each with 11 presets. It is necessary to manually input a pulse signal at the RX end to complete the switching code type. After testing the current lane, the DUT under test needs to be powered off and manually switched to other lanes. Currently, it is estimated that it takes about 30 minutes to test a lane. Generally, it takes 10 minutes for the server to complete the second power-on after AC power is off. The PCIE4.0 consistency test of a single lane takes 40 minutes, and the manual switching of code types requires the test engineer to manually switch the device according to the oscilloscope prompts through the Toggle button of the fixture. The operation is very cumbersome, especially in some Preset-related test items that require frequent switching. Since there are 11 Preset values at 8Gbps and 16Gbps, all Preset values currently tested are covered during the test process, and the entire test cycle is relatively long.
[0003] Therefore, how to improve the existing PCIE test method, realize fully automated testing, reduce human intervention in testing, ensure the accuracy of test results, and at the same time, realize fully automated operations when switching lanes and switching presets, and complete the PCIE secondary link establishment trigger test task without powering off the server, so that the consistency test of all lanes of a single PCIE slot can be completed after powering on once, greatly reducing the test cycle and cost, is a technical problem that needs to be solved urgently. Summary of the invention
[0004] The purpose of the present invention is to improve the existing PCIE test method, realize fully automated testing, reduce human intervention in testing, ensure the accuracy of test results, and at the same time, realize fully automated operation in switching lanes and switching presets, and complete the PCIE secondary link establishment trigger test task without powering off the server, so that the consistency test of all lanes of a single PCIE slot can be completed by powering on once, greatly reducing the test cycle and cost.
[0005] In a first aspect, a PCIE automated testing method is provided, comprising the following steps: S1: Turn on the server and monitor the connection status and performance parameters of each module of the current PCIE automated test system; determine whether the PCIE automated test system is abnormal, if not, execute step S2, if yes, maintain the PCIE automated test system; S2: The remote computer sends a test command to the test device, and the test device sends a PCIE link establishment signal to the device under test; S3: The test fixture captures the PCIE data signal of the device under test, sends the PCIE data signal waveform to the test device, the test device obtains the PCIE data signal waveform, performs consistency test on lane0 and analyzes the PCIE data signal of lane0, and sends the PCIE data signal analysis result of lane0 to the remote computer through the communication module; S4: The test equipment sends a lane switching command to the lane automatic switching module of the test fixture, and the lane automatic switching module switches from lane 0 to lane 1; S5: The test device sends a PCIE secondary link establishment signal to the device under test, and performs a PCIE data signal test of lane 1 based on step S3; S6: loop through steps S3 to S5 to complete the test of the PCIE data signals of all lanes.
[0006] Preferably, in step S4, the test device sends a lane switching command to the lane automatic dial switch via USB, and the lane automatic dial switch realizes automatic switching of the lane.
[0007] Preferably, the PCIE data signal test in step S3 includes testing and analyzing the quality, amplitude, stability and timing of the PCIE data signal.
[0008] In a second aspect, a PCIE automated testing system is provided for implementing any one of the PCIE automated testing methods described, comprising a remote computer, a testing device, a testing fixture and a communication module; the signal output end of the testing device is connected to the signal input end of the device under test, the testing fixture is bidirectionally connected to the testing device, and the signal output end of the testing device is connected to the input end of the remote computer via the communication module.
[0009] Preferably, the test fixture includes a CLB fixture and a lane automatic switching module, the signal input end of the automatic switching module is connected to the signal output end of the test device, and the signal output end of the remote computer and the signal output end of the test device are connected to the signal input end of the device under test.
[0010] Preferably, a signal generator is further included, the signal output end of the test equipment is connected to the signal input end of the signal generator, and the signal output end of the signal generator is connected to the signal input end of the test fixture.
[0011] Preferably, the lane automatic switching module includes a lane automatic dial switch, and the test device is connected to the lane automatic dial switch via USB.
[0012] Preferably, the testing equipment is an oscilloscope.
[0013] The beneficial effects of the present invention include: The present invention provides a PCIE automated test system and method, which first monitors the connection status and performance parameters of each module of the current PCIE automated test system; a remote computer sends a test command to a test device, and the test device sends a PCIE link establishment signal to the device under test. The test fixture captures the PCIE data signal of the device under test, sends the PCIE data signal waveform to the test device, the test device obtains the PCIE data signal waveform, performs a consistency test on lane0 and analyzes the PCIE data signal of lane0, and sends the PCIE data signal analysis result of lane0 to the remote computer through a communication module; the test device sends a lane switching command to the lane automatic switching module of the test fixture, and the lane automatic switching module switches from lane0 to lane1; the test device sends a PCIE secondary link establishment signal to the device under test, and performs a PCIE data signal test on lane1; until the test of the PCIE data signals of all lanes is completed.
[0014] The lane automatic module switches the lane of the device under test, automatically switches the preset of the lane under test, and the acquired waveform automatically calls the analysis software for result analysis to realize the fully automated PCIE test. The whole machine does not need to be powered off and restarted to trigger the PCIE link establishment of each lane. After the waveform file is captured, the test terminal triggers the PCIE secondary link establishment process. After the link establishment is completed, the test of the next lane is automatically started until all lane tests are completed. BRIEF DESCRIPTION OF THE DRAWINGS
[0015] Figure 1 The figure is a flow chart of the PCIE automatic testing method of the present invention. DETAILED DESCRIPTION
[0016] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application usually described and shown in the drawings here can be arranged and designed in various configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.
[0017] The following is combined with Figure 1 The present invention is further described in detail: See also Figure 1 , a PCIE automated testing method, comprising the following steps: S1: Turn on the server and monitor the connection status and performance parameters of each module of the current PCIE automated test system; determine whether the PCIE automated test system is abnormal, if not, execute step S2, if yes, maintain the PCIE automated test system; S2: The remote computer sends a test command to the test device, and the test device sends a PCIE link establishment signal to the device under test; S3: The test fixture captures the PCIE data signal of the device under test, sends the PCIE data signal waveform to the test device, the test device obtains the PCIE data signal waveform, performs consistency test on lane0 and analyzes the PCIE data signal of lane0, and sends the PCIE data signal analysis result of lane0 to the remote computer through the communication module; S4: The test equipment sends a lane switching command to the lane automatic switching module of the test fixture, and the lane automatic switching module switches from lane 0 to lane 1; S5: The test device sends a PCIE secondary link establishment signal to the device under test, and performs a PCIE data signal test of lane 1 based on step S3; S6: loop through steps S3 to S5 to complete the test of the PCIE data signals of all lanes.
[0018] The PCIE automated testing method provided by the present invention first starts the server required for the test, and ensures that the connection of each module of the PCIE test system is good and the performance parameters are in a normal state, and then performs subsequent operations, so as to avoid the situation that the subsequent test results are abnormal or inaccurate due to the module connection state of the test system itself or the state of not being in a normal performance parameter. After ensuring that the connection state of each module of the test system is good and the performance parameters are normal, a test command is sent to the test device through a remote computer. After receiving the test command, the test device initiates an access request to the device under test, sends a PCIE link establishment signal to the device under test, and then captures the PCIE data signal of the device under test through a test fixture, and sends the obtained PCIE data signal waveform to the test device. After the test device obtains the PCIE data signal waveform, it analyzes the PCIE data signal of lane0, and then sends the data analysis result to the remote computer through a communication module.
[0019] After completing the test of the PCIE data signal of lane0, the test equipment sends a command to switch lanes to the lane automatic switching module of the test fixture. After receiving the command to switch lanes, the lane automatic switching module switches from lane0 to lane1. After the switching action is completed, the test equipment sends a PCIE secondary link establishment signal to the device under test, and captures the PCIE data signal of the device under test through the test fixture again, and sends the obtained PCIE data signal waveform of lane1 to the test equipment. After the test equipment obtains the PCIE data signal waveform, it analyzes the PCIE data signal of lane1, and then sends the PCIE data analysis result of lane1 to the remote computer through the communication module. Then continue to test the PCIE data of other lanes until the automated test of all lanes is completed.
[0020] In the above scheme, in step S4, the test device sends a lane switching command to the lane automatic dial switch via USB, and the lane is automatically switched through the lane automatic dial switch. The PCIE data signal test in step S3 includes testing and analyzing the quality, amplitude, stability and timing of the PCIE data signal.
[0021] In the above PCIE test process, there is no need to use manual or semi-automatic testing methods for testing. Instead, the lanes are automatically switched based on the lane automatic switching module, and the lanes of the device under test are automatically switched according to the preset order. The PCIE data signal waveform is obtained, and the analysis software is automatically called for result analysis, and the PCIE data analysis results are directly sent to the remote computer through the communication module. The whole machine does not need to be powered off and restarted to trigger the PCIE link establishment of each lane. After the PCIE data signal waveform file is captured, the test terminal triggers the PCIE secondary link establishment process. After the link establishment is completed, the test of the next lane is automatically started. No human intervention is required, which greatly reduces the labor cost, and the results of the entire test process are more accurate.
[0022] A PCIE automated testing system, used to implement any one of the PCIE automated testing methods described above, comprising a remote computer, a test device, a test fixture and a communication module; the signal output end of the test device is connected to the signal input end of the device under test, the test fixture is bidirectionally connected to the test device, and the signal output end of the test device is connected to the input end of the remote computer through the communication module.
[0023] The test fixture includes a CLB fixture and a lane automatic switching module, the signal input end of the automatic switching module is connected to the signal output end of the test device, and the signal output end of the remote computer and the signal output end of the test device are connected to the signal input end of the device under test. It also includes a signal generator, the signal output end of the test device is connected to the signal input end of the signal generator, and the signal output end of the signal generator is connected to the signal input end of the test fixture. The lane automatic switching module includes a lane automatic dial switch, and the test device is connected to the lane automatic dial switch via USB. The test device is an oscilloscope.
[0024] In summary, first monitor the connection status and performance parameters of each module of the current PCIE automated test system; the remote computer sends a test command to the test equipment, and the test equipment sends a PCIE link establishment signal to the device under test. The test fixture captures the PCIE data signal of the device under test, sends the PCIE data signal waveform to the test equipment, the test equipment obtains the PCIE data signal waveform, performs consistency test on lane0 and analyzes the PCIE data signal of lane0, and sends the PCIE data signal analysis result of lane0 to the remote computer through the communication module; the test equipment sends a lane switching command to the lane automatic switching module of the test fixture, and the lane automatic switching module switches from lane0 to lane1; the test equipment sends a PCIE secondary link establishment signal to the device under test, and performs a PCIE data signal test on lane1; until the test of the PCIE data signals of all lanes is completed.
[0025] The lane of the device under test is switched through the lane automatic module, and the lane under test is automatically switched according to the preset order. The acquired waveform automatically calls the analysis software for result analysis to realize the fully automated PCIE test. The whole machine does not need to be powered off and restarted to trigger the PCIE link establishment of each lane. After the waveform file is captured, the test terminal triggers the PCIE secondary link establishment process. After the link establishment is completed, the test of the next lane is automatically started until all lane tests are completed.
[0026] The above-mentioned embodiments only express the specific implementation method of the present application, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the protection scope of the present application. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the technical solution concept of the present application, and these all belong to the protection scope of the present application.
Claims
1. A PCIE automated testing method, characterized in that: The following steps are involved: S1: Turn on the server and monitor the connection status and performance parameters of each module of the current PCIE automated test system; determine whether the PCIE automated test system is abnormal, if not, execute step S2, if yes, maintain the PCIE automated test system; S2: The remote computer sends a test command to the test device, and the test device sends a PCIE link establishment signal to the device under test; S3: The test fixture captures the PCIE data signal of the device under test, sends the PCIE data signal waveform to the test device, the test device obtains the PCIE data signal waveform, performs consistency test on lane0 and analyzes the PCIE data signal of lane0, and sends the PCIE data signal analysis result of lane0 to the remote computer through the communication module; S4: The test equipment sends a lane switching command to the lane automatic switching module of the test fixture, and the lane automatic switching module switches from lane 0 to lane 1; S5: The test device sends a PCIE secondary link establishment signal to the device under test, and performs a PCIE data signal test of lane 1 based on step S3; S6: loop through steps S3 to S5 to complete the test of the PCIE data signals of all lanes.
2. A PCIE automated testing method according to claim 1, characterized in that: In step S4, the test device sends a lane switching command to the lane automatic dial switch through the USB, and the lane automatic dial switch realizes automatic switching of the lane.
3. A PCIE automated testing method according to claim 1, characterized in that: The PCIE data signal test in step S3 includes testing and analyzing the quality, amplitude, stability and timing of the PCIE data signal.
4. A PCIE automated testing system, used to implement a PCIE automated testing method according to any one of claims 1 to 3, characterized in that: It includes a remote computer, a test device, a test fixture and a communication module; the signal output end of the test device is connected to the signal input end of the device under test, the test fixture and the test device are bidirectionally connected, and the signal output end of the test device is connected to the input end of the remote computer through the communication module.
5. A PCIE automated testing system and method according to claim 4, characterized in that: The test fixture includes a CLB fixture and a lane automatic switching module, the signal input end of the automatic switching module is connected to the signal output end of the test device, and the signal output end of the remote computer and the signal output end of the test device are connected to the signal input end of the device under test.
6. A PCIE automated testing system according to claim 4, characterized in that: It also includes a signal generator, the signal output end of the test equipment is connected to the signal input end of the signal generator, and the signal output end of the signal generator is connected to the signal input end of the test fixture.
7. A PCIE automated testing system according to claim 4, characterized in that: The lane automatic switching module includes a lane automatic dial switch, and the test device is connected to the lane automatic dial switch via a USB.
8. A PCIE automated testing system according to claim 4, characterized in that: The testing device is an oscilloscope.