Radio frequency calibration method and device of equipment, electronic equipment and readable medium

Abstract

The invention relates to an equipment radio frequency calibration method and device, electronic equipment and a readable medium, and the method comprises the steps: obtaining a first gain value, carrying out the calibration test of to-be-tested equipment through a test system and the first gain value, and enabling the first gain value to be an average value of all gain values in a gain set, the gain set is a plurality of gain values obtained by counting batch equipment on the production line; under the condition that the first gain value does not pass the calibration test, a cycle parameter is obtained, and the cycle parameter is obtained through a gain set in advance; performing loop testing on the to-be-tested equipment by using the loop parameter and the first gain value until a second gain value meeting a preset condition is determined; and outputting a second gain value as a calibration result of the to-be-tested equipment through the test system. The problem that the radio frequency calibration result of the equipment cannot be quickly and accurately obtained is solved.

Description

Technical Field

[0001] The present application relates to the field of communication technology, and in particular to a radio frequency calibration method, device, electronic device and readable medium for a device. Background Art

[0002] In mobile communication systems, the RF performance of mobile stations (such as mobile phones, wireless data terminals, etc.) is crucial. Due to the discreteness of analog components (such as amplifiers, filters, antennas, etc.), even devices from the same production line may have different RF performance. These differences may affect the signal transmission power, receiving sensitivity, frequency stability, spectrum purity and other aspects, and further affect the communication quality between the mobile station and the base station, so the mobile station must be calibrated.

[0003] In the existing production line calibration algorithm, technicians need to manually adjust the RGI (Radio Gain Index) to achieve the desired power based on the differences in the individual units of the RF front end. This will introduce errors when calibrating the RF of the device, and the efficiency is low, making it impossible to quickly and accurately obtain the RF calibration results of the device.

[0004] To address the above-mentioned problems, no effective solution has been proposed yet. Summary of the invention

[0005] The present application provides a method, apparatus, electronic device and readable medium for RF calibration of a device to solve the above-mentioned technical problem of "unable to quickly and accurately obtain the RF calibration result of the device".

[0006] According to one aspect of an embodiment of the present application, the present application provides a method for RF calibration of a device, comprising: obtaining a first gain value, and using a test system and the first gain value to perform a calibration test on the device to be tested, wherein the first gain value is an average value of each gain value in a gain set, and the gain set is a plurality of gain values ​​obtained by statistically analyzing batch devices on a production line; if the first gain value fails the calibration test, obtaining a cycle parameter, wherein the cycle parameter is obtained in advance through the gain set; performing a cycle test on the device to be tested using the cycle parameter and the first gain value until a second gain value that meets preset conditions is determined; and outputting the second gain value as a calibration result of the device to be tested through the test system.

[0007] Optionally, a cyclic test is performed on the device under test using the cyclic parameters and the first gain value until a second gain value that meets the preset conditions is determined, including: performing an overlay operation on the first gain value to obtain a third gain value; comparing the third gain value with the cyclic parameters to determine whether the third gain value is less than a maximum value in the cyclic parameters; if the third gain value is less than the maximum value, obtaining an actual output power corresponding to the third gain value through the device under test; if the difference between the actual output power and the target output power is less than or equal to an error threshold, determining the third gain value as the second gain value that meets the preset conditions.

[0008] Optionally, after comparing the third gain value with the cycle parameters, the method further includes: if the third gain value is greater than or equal to the maximum value of the cycle parameters, stopping the cycle test; determining the device under test as an abnormal device, and reporting abnormal information of the device under test.

[0009] Optionally, after obtaining the actual output power corresponding to the third gain value, the method further includes: if the difference between the actual output power and the target output power is greater than an error threshold, continuing to perform a cyclic test on the device under test using the cyclic parameters and the third gain value.

[0010] Optionally, before obtaining the cycle parameters, the method also includes calculating the cycle parameters in the following manner: generating a normal distribution curve based on each gain value in the gain set; obtaining an expected value and a standard deviation from the normal distribution curve; determining the smallest integer greater than or equal to the standard deviation as a first value, and determining the smallest integer greater than or equal to twice the standard deviation as a second value; adding the expected value to the first value to obtain a minimum value, and adding the expected value to the second value to obtain a maximum value; determining the minimum value and the maximum value as the cycle parameters.

[0011] Optionally, after the test system outputs the second gain value as the calibration result of the device under test, the method further includes: monitoring each gain value output by the test system, and determining whether the gain value is greater than the minimum value of the cycle parameter and less than the maximum value of the cycle parameter; if the first number of gain values ​​continuously output by the test system are all greater than the minimum value and less than the maximum value, it is determined that there is an abnormality in the test system.

[0012] Optionally, after determining that there is an abnormality in the test system, the method further includes: performing line loss measurement on the test system to determine whether there is a loss abnormality in the test system; or performing interference source detection on the test environment where the test system is located to determine whether there is an interference source in the test environment; or performing performance detection on the receiving end of the test system to determine whether there is a performance abnormality in the receiving end of the test system.

[0013] Optionally, after the test system outputs the second gain value as the calibration result of the device under test, the method further includes: accumulating the number of gain values ​​output by the test system; when the accumulated number of gain values ​​is equal to the second number, adding the second number of gain values ​​to the gain set to obtain a new gain set; and re-obtaining a new first gain value and a new cycle parameter based on the new gain set.

[0014] According to another aspect of an embodiment of the present application, the present application provides a radio frequency calibration device for a device, comprising: a first acquisition module, used to obtain a first gain value, and use a test system and the first gain value to perform a calibration test on the device to be tested, wherein the first gain value is an average value of each gain value in a gain set, and the gain set is a plurality of gain values ​​obtained by statistically analyzing batch devices on a production line; a second acquisition module, used to obtain a cycle parameter when the first gain value fails the calibration test, wherein the cycle parameter is obtained in advance through the gain set; a test module, used to perform a cycle test on the device to be tested using the cycle parameter and the first gain value until a second gain value that meets preset conditions is determined; and an output module, used to output the second gain value as a calibration result of the device to be tested through the test system.

[0015] According to another aspect of an embodiment of the present application, the present application provides an electronic device, including a memory, a processor, a communication interface and a communication bus, wherein the memory stores a computer program that can be run on the processor, the memory and the processor communicate through the communication bus and the communication interface, and the steps of the above method are implemented when the processor executes the computer program.

[0016] According to another aspect of an embodiment of the present application, the present application also provides a computer-readable medium having a non-volatile program code executable by a processor, and the program code enables the processor to execute the above method.

[0017] The above technical solution provided by the embodiment of the present application has the following advantages compared with the related art:

[0018] The present application provides a radio frequency calibration method for a device, including: obtaining a first gain value, and using a test system and the first gain value to perform a calibration test on the device to be tested, wherein the first gain value is the average value of each gain value in a gain set, and the gain set is a plurality of gain values ​​obtained by statistically analyzing batch devices on a production line; when the first gain value fails the calibration test, obtaining a cycle parameter, wherein the cycle parameter is obtained in advance through the gain set; performing a cycle test on the device to be tested using the cycle parameter and the first gain value until a second gain value that meets preset conditions is determined; and outputting the second gain value as a calibration result of the device to be tested through the test system. Gain values ​​and cycle parameters are calculated by obtaining a large amount of gain data on the production line in advance, and then the device to be tested and the gain value are automatically cycle tested using the cycle parameters until a gain value that meets preset conditions is output as a calibration result, thereby solving the problem of being unable to quickly and accurately obtain the radio frequency calibration result of the device. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the related technologies, the drawings required for use in the embodiments or the related technical descriptions are briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0021] Figure 1 A flowchart of an optional radio frequency calibration method for a device provided according to an embodiment of the present application;

[0022] Figure 2 An algorithm block diagram of radio frequency calibration of an optional device provided according to an embodiment of the present application;

[0023] Figure 3 A block diagram of a radio frequency calibration device of an optional device provided according to an embodiment of the present application;

[0024] Figure 4 A schematic diagram of an optional electronic device structure provided in an embodiment of the present application. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0026] In the subsequent description, the suffixes such as "module", "component" or "unit" used to represent elements are only used to facilitate the description of the present application and have no specific meaning. Therefore, "module" and "component" can be used interchangeably.

[0027] In mobile communication systems, the RF performance of mobile stations (such as mobile phones, wireless data terminals, etc.) is crucial. Due to the discreteness of analog components (such as amplifiers, filters, antennas, etc.), even devices from the same production line may have different RF performance. These differences may affect the signal transmission power, receiving sensitivity, frequency stability, spectrum purity and other aspects, and further affect the communication quality between the mobile station and the base station, so the mobile station must be calibrated.

[0028] In the existing production line calibration algorithm, technicians need to manually adjust the RGI method to achieve the expected power based on the differences in the individual units of the RF front end. This will introduce errors when calibrating the RF of the device, and the efficiency is low, and it is impossible to quickly and accurately obtain the RF calibration results of the device.

[0029] In order to solve the problem mentioned in the background technology, according to one aspect of the embodiment of the present application, a radio frequency calibration method for a device is provided, such as Figure 1 As shown, including:

[0030] Step 101, obtaining a first gain value, and using a test system and the first gain value to perform a calibration test on a device under test, wherein the first gain value is an average value of each gain value in a gain set, and the gain set is a plurality of gain values ​​obtained by statistically analyzing batch devices on a production line;

[0031] Step 103, when the first gain value fails the calibration test, obtaining a cycle parameter, wherein the cycle parameter is obtained in advance through a gain set;

[0032] Step 105, performing a cyclic test on the device to be tested using the cyclic parameter and the first gain value until a second gain value that meets a preset condition is determined;

[0033] Step 107: Output the second gain value as the calibration result of the device under test through the test system.

[0034] The gain set is obtained through statistical results of the production line. The specific method includes: performing APT (Adaptive Power Tuning) calibration on batches of DUT (Design Under Test) to obtain a set of RGI values ​​(RF Gain Index) that reach the expected power to form a gain set.

[0035] In the subsequent calibration process, the first gain value and the cycle parameter used are obtained by analyzing the gain set.

[0036] The technical solution provided by this application is based on the actual needs of the production line yield. Without increasing the testing cost, it uses an adaptive algorithm to replace the traditional manual adjustment, which can reduce the shipment of false good products, improve the actual yield, and avoid large-scale recalls of mobile stations.

[0037] The present application proposes to calculate the first gain value and the cycle parameter by obtaining the gain data on a large number of production lines in advance, and then automatically perform a cycle test on the device to be tested and the first gain value through the cycle parameter until the first gain value that meets the preset conditions is output as the calibration result. By setting the cycle test to make the process of gain value intelligent, the error introduced by the numerical adjustment can be reduced, and the calibration efficiency can also be improved.

[0038] As an optional embodiment, a cyclic test is performed on the device under test using a cyclic parameter and a first gain value until a second gain value that meets a preset condition is determined, including: performing an overlay operation on the first gain value to obtain a third gain value; comparing the third gain value with the cyclic parameter to determine whether the third gain value is less than a maximum value in the cyclic parameter; if the third gain value is less than the maximum value, obtaining an actual output power corresponding to the third gain value through the device under test; if the difference between the actual output power and the target output power is less than or equal to an error threshold, determining the third gain value as a second gain value that meets the preset condition.

[0039] Specifically, the first gain value is superimposed by adding a fixed value (eg, 1) to the first gain value to obtain the third gain value. That is, in one step of the loop test, a simple superposition operation is performed on the gain value.

[0040] Comparing the third gain value with the cycle parameter is to determine whether the third gain value is less than the maximum value in the cycle parameter. How to obtain the maximum value and what the maximum value represents will be explained below.

[0041] The error threshold is an arbitrary value close to zero, and this application does not limit the specific value of the error threshold.

[0042] Acquiring the actual output power corresponding to the third gain value through the device under test means determining the actual output power at the third gain value through power scanning.

[0043] Specifically, the preset condition is that the current gain value is less than the maximum value in the cycle parameter, and the difference between the actual output power and the target output power at the current gain value is less than or equal to the error threshold.

[0044] The loop test process will end only when a second gain value that meets the preset condition is found (or a gain value greater than the maximum value in the loop parameter appears).

[0045] The reasonable range of RGI is set by introducing production line statistical data, and then the target output power is achieved through adaptive iteration through cyclic testing. The calibration results can be output automatically and quickly without human intervention.

[0046] As an optional embodiment, after comparing the third gain value with the cycle parameter, the method also includes: if the third gain value is greater than or equal to the maximum value of the cycle parameter, stopping the cycle test; determining the device under test as an abnormal device, and reporting abnormal information of the device under test.

[0047] Since most gain values ​​should be distributed between the minimum and maximum values ​​of the loop parameters, only gain values ​​that are less than the maximum value in the loop parameters can continue to be tested. Once a gain value is greater than the maximum value in the loop parameters, it can be preliminarily determined that the current gain value is invalid and the device under test may have an abnormality.

[0048] Since the initial first gain value is the expected value, there will be no situation where the gain value is less than the minimum value in the loop parameter, so this application does not consider this.

[0049] By determining the abnormality of the device under test by judging the abnormality of the gain value, it is possible to reduce the serious consequences of failure of other RF indicators, increased production line defective rate, and even customer returns and large-scale recalls due to excessively high mobile station transmission power.

[0050] As an optional embodiment, after obtaining the actual output power corresponding to the third gain value, the method further includes: if the difference between the actual output power and the target output power is greater than the error threshold, continuing to perform a cyclic test on the device to be tested using the cyclic parameters and the third gain value.

[0051] If the difference between the actual output power and the target output power is greater than the error threshold, it means that the current gain value has not passed the calibration test, and then the next loop step needs to be executed. The content of each loop step is the same.

[0052] The above-mentioned step of using the test system and the first gain value to calibrate the device to be tested is essentially to detect whether the difference between the output power at the first gain value and the target output power is less than or equal to the error threshold. If the difference between the output power and the target output power is less than or equal to the error threshold, the calibration is passed and there is no need for subsequent cyclic testing. Otherwise, it is determined that the calibration has failed.

[0053] As an optional embodiment, before obtaining the cycle parameters, the method also includes calculating the cycle parameters in the following manner: generating a normal distribution curve based on each gain value in the gain set; obtaining an expected value and a standard deviation from the normal distribution curve; determining the smallest integer greater than or equal to the standard deviation as a first value, and determining the smallest integer greater than or equal to twice the standard deviation as a second value; adding the expected value to the first value to obtain a minimum value, and adding the expected value to the second value to obtain a maximum value; determining the minimum value and the maximum value as the cycle parameters.

[0054] By performing data analysis on each gain value in the gain set, a normal distribution curve can be generated. The purpose of analyzing each gain value in the gain set and obtaining a normal distribution curve is to gain a deeper understanding of the distribution of the calibration results of the device.

[0055] The expected value and standard deviation are extracted from the normal distribution curve. The expected value represents the center position of the data, and the standard deviation measures the degree of dispersion of the data points relative to the expected value. Through the normal distribution, a more reasonable RGI value range can be determined, and this range can be set as the qualified standard for production quality control during production testing.

[0056] The cycle parameters are calculated by the expected value and the standard deviation, including: adding the expected value to the standard deviation rounded up to obtain a minimum value, and adding 2 times the standard deviation rounded up to the expected value to obtain a maximum value. The naming of the minimum value and the maximum value is only used to distinguish the two values ​​in the cycle parameters.

[0057] In the normal distribution curve, the point corresponding to "expected value + standard deviation" is located on the right side of the curve, one standard deviation away from the expected value (mean). According to the properties of the normal distribution, about 68.27% (about two-thirds) of the data points will fall within the range of "expected value + standard deviation". Therefore, "expected value + standard deviation" represents the dividing line of a relatively right (or relatively large) part of the data set, and about 34.135% (half of 68.27%) of the data points will be greater than "expected value + standard deviation".

[0058] Similarly, the point corresponding to "expected value + 2 standard deviations" is located further to the right of the curve, two standard deviations away from the expected value. According to the properties of the normal distribution, approximately 95.45% of the data points will fall within the range of "expected value + 2 standard deviations". Therefore, "expected value + 2 standard deviations" represents the dividing line of a relatively rightward (or relatively larger) portion of the data set, and approximately 2.275% (i.e. (95.45% - 50%) / 2) of the data points will be greater than "expected value + 2 standard deviations".

[0059] Since the decimal point of the standard deviation is unknown, in order to simplify the process, this application directly rounds up the standard deviation and 2 times the standard deviation and uses integers to perform parameter calculations.

[0060] In addition, the first gain value mentioned in this application is the average value of each gain value in the gain set. When the sample data volume is large enough, the average value of the normal distribution curve approaches the expected value. Therefore, in this application, the expected value can also be directly used as the first gain value.

[0061] Figure 2 This is an algorithm block diagram of the RF calibration of a device provided by the present application. As shown in the figure, an initial RGI is set first, and then the output power under the initial RGI is obtained through power scanning, and then it is determined whether the output power meets the standard (that is, whether the difference between the output power and the expected power is within the allowable range). If the output power meets the standard, the initial RGI is output as the calibration result. If the output power does not meet the standard, the loop parameters are obtained and the event loop is executed on the initial RGI (that is, the loop test of the present application) until the calibration result is obtained.

[0062] It should be noted that the present application directly uses the first gain value as the initial RGI for calibration test. However, before the test is performed with the first gain value, an empirical value obtained during the experiment may be used to perform a calibration test. If the test fails, the calibration test may be performed with the first gain value as the initial RGI.

[0063] As an optional embodiment, after the test system outputs the second gain value as the calibration result of the device to be tested, the method also includes: monitoring each gain value output by the test system, and determining whether the gain value is greater than the minimum value of the cycle parameter and less than the maximum value of the cycle parameter; if the first number of gain values ​​continuously output by the test system are all greater than the minimum value and less than the maximum value, it is determined that there is an abnormality in the test system.

[0064] During the loop test, as long as the gain value is less than the maximum value in the loop parameters, it will not be listed as an abnormal situation. However, the optimal situation is that the gain value output by the test system is less than the minimum value in the loop parameters. If the output gain value is between the minimum and maximum values ​​of the loop parameters, it is still considered that the gain value is slightly too large. Therefore, we also further monitor the gain values ​​that meet the conditions output by the test system.

[0065] If the number of gain values ​​continuously output by the test system between the minimum and maximum values ​​of the loop parameter is less than a first number (e.g., 10), the operation is not performed; if the number of gain values ​​continuously output by the test system between the minimum and maximum values ​​of the loop parameter reaches a first number, and the output power corresponding to these gain values ​​meets the standard, then it indicates that there may be some abnormalities in the test system.

[0066] By monitoring the output results of the test system to determine whether there is an abnormality in the test system, errors in subsequent calibration caused by the abnormality of the test system can be avoided in a timely manner.

[0067] After determining that the test system has an anomaly, it is necessary to further determine the specific content of the anomaly. Next, the anomaly detection of the test system is explained in detail.

[0068] As an optional embodiment, after determining that there is an abnormality in the test system, the method also includes: performing line loss measurement on the test system to determine whether there is a loss abnormality in the test system; or performing interference source detection on the test environment where the test system is located to determine whether there is an interference source in the test environment; or performing performance detection on the receiving end of the test system to determine whether there is a performance abnormality in the receiving end of the test system.

[0069] Optionally, line loss measurement is performed on the test system, including: connecting the measuring device to the test system under test; starting the measuring device, allowing the signal to pass through the test system and recording the measurement results; evaluating the line loss of the test system through the measurement results (such as the amplitude-frequency response curve, power loss value, etc.), so as to determine whether there is any line loss abnormality in the test system.

[0070] Optionally, interference source detection is performed on the test environment where the test system is located to determine whether there is an interference source in the test environment, including: using measuring equipment to detect interference sources in the test environment where the test system is located, for example, using an electromagnetic field strength meter to perform basic electromagnetic environment measurements on the test environment, and / or using a spectrum analyzer to scan and analyze the spectrum of the test environment, and / or using a near-field probe to perform close-range detection of suspected interference sources, etc.; organizing and analyzing the data collected during the detection process (including electromagnetic field strength data, spectrum analysis data, and near-field detection data, etc.) to identify interference sources in the test environment.

[0071] Optionally, a performance test is performed on the receiving end of the test system to determine whether there is a performance abnormality in the receiving end of the test system, including: performing single performance tests such as sensitivity test, dynamic range test, signal-to-noise ratio test, etc. on the receiving end.

[0072] Although the present application only provides abnormality detection for the above three situations, in actual situations, there may be many abnormal situations of the test system. In addition to the above situations, there may also be other situations such as abnormalities in the internal components of the test system, which will not be described one by one in the present application.

[0073] Since different types of exceptions require different treatment measures, further determining the type of exception in the test system helps to accurately locate the problem, so that operators can perform targeted repairs on the exception.

[0074] As an optional embodiment, after the test system outputs the second gain value as the calibration result of the device under test, the method further includes: accumulating the number of gain values ​​output by the test system; when the accumulated number of gain values ​​is equal to the second number, adding the second number of gain values ​​to the gain set to obtain a new gain set; and re-obtaining a new first gain value and a new cycle parameter based on the new gain set.

[0075] The previous gain set is obtained based on the statistical results of the production line. After a series of calibration work, if the number of gain values ​​that meet the conditions output by the test system reaches a second number (e.g., 1,000), that is, if the test system outputs a sufficient number of gain values ​​that meet the conditions, the output results of the test system can be added to the original gain set to update the gain set.

[0076] A new first gain value and a new loop parameter can be obtained again through the new gain set. The specific calculation method is the same as the above-mentioned method for obtaining the old first gain value and loop parameter, which will not be repeated here.

[0077] By adding the output results of the test system to the original gain set and then performing subsequent calibration tests, the diversity of the data set can be increased, making the setting of the gain value more reasonable.

[0078] The present application provides a radio frequency calibration method for a device, including: obtaining a first gain value, and using a test system and the first gain value to perform a calibration test on the device to be tested, wherein the first gain value is the average value of each gain value in a gain set, and the gain set is a plurality of gain values ​​obtained by statistically analyzing batch devices on a production line; when the first gain value fails the calibration test, obtaining a cycle parameter, wherein the cycle parameter is obtained in advance through the gain set; performing a cycle test on the device to be tested using the cycle parameter and the first gain value until a second gain value that meets preset conditions is determined; and outputting the second gain value as a calibration result of the device to be tested through the test system. Gain values ​​and cycle parameters are calculated by obtaining a large amount of gain data on the production line in advance, and then the device to be tested and the gain value are automatically cycle tested using the cycle parameters until a gain value that meets preset conditions is output as a calibration result, thereby solving the problem of being unable to quickly and accurately obtain the radio frequency calibration result of the device.

[0079] According to another aspect of the embodiment of the present application, the present application provides a radio frequency calibration device for a device, such as Figure 3 As shown, including:

[0080] A first acquisition module 302 is used to acquire a first gain value, and use the test system and the first gain value to perform a calibration test on the device under test, wherein the first gain value is an average value of each gain value in a gain set, and the gain set is a plurality of gain values ​​obtained by statistically analyzing batch devices on a production line;

[0081] A second acquisition module 304 is used to acquire a cycle parameter when the first gain value fails the calibration test, wherein the cycle parameter is obtained in advance through the gain set;

[0082] A testing module 306, configured to perform a cyclic test on the device under test using the cyclic parameter and the first gain value until a second gain value meeting a preset condition is determined;

[0083] The output module 308 is used to output the second gain value as the calibration result of the device under test through the test system.

[0084] It should be noted that the first acquisition module 302 in this embodiment can be used to execute step 101 in the embodiment of the present application, the second acquisition module 304 in this embodiment can be used to execute step 103 in the embodiment of the present application, the test module 306 in this embodiment can be used to execute step 105 in the embodiment of the present application, and the output module 308 in this embodiment can be used to execute step 107 in the embodiment of the present application.

[0085] Optionally, the testing module 306 includes:

[0086] The superposition submodule is used to perform a superposition operation on the first gain value to obtain a third gain value; compare the third gain value with the cycle parameter to determine whether the third gain value is less than a maximum value in the cycle parameter;

[0087] an acquisition submodule, configured to acquire, through the device under test, an actual output power corresponding to the third gain value if the third gain value is less than a maximum value;

[0088] The determination submodule is used to determine the third gain value as the second gain value that meets the preset condition if the difference between the actual output power and the target output power is less than or equal to the error threshold.

[0089] Optionally, the test module 306 also includes a first processing submodule, which is used to stop the cycle test if the third gain value is greater than or equal to the maximum value of the cycle parameter after comparing the third gain value with the cycle parameter; determine the device under test as an abnormal device, and report abnormal information of the device under test.

[0090] Optionally, the test module 306 also includes a second processing submodule, which is used to continue to perform a cyclic test on the device under test using the cyclic parameters and the third gain value after obtaining the actual output power corresponding to the third gain value if the difference between the actual output power and the target output power is greater than the error threshold.

[0091] Optionally, the device also includes a first processing module, which is used to calculate the cycle parameters in the following manner before obtaining the cycle parameters: generate a normal distribution curve based on each gain value in the gain set; obtain an expected value and a standard deviation from the normal distribution curve; determine the smallest integer greater than or equal to the standard deviation as a first value, and determine the smallest integer greater than or equal to twice the standard deviation as a second value; add the expected value to the first value to obtain a minimum value, and add the expected value to the second value to obtain a maximum value; determine the minimum value and the maximum value as the cycle parameters.

[0092] Optionally, the device also includes a second processing module, which is used to monitor the various gain values ​​output by the test system after the test system outputs the second gain value as the calibration result of the device to be tested, and to determine whether the gain value is greater than the minimum value of the cycle parameter and less than the maximum value of the cycle parameter; if the first number of gain values ​​continuously output by the test system are all greater than the minimum value and less than the maximum value, it is determined that there is an abnormality in the test system.

[0093] Optionally, the second processing module is also used to perform line loss measurement on the test system after determining that there is an abnormality in the test system, so as to determine whether there is a loss abnormality in the test system; or to perform interference source detection on the test environment where the test system is located, so as to determine whether there is an interference source in the test environment; or to perform performance detection on the receiving end of the test system, so as to determine whether there is a performance abnormality in the receiving end of the test system.

[0094] Optionally, the device also includes a third processing module, which is used to accumulate the number of gain values ​​output by the test system after the test system outputs the second gain value as the calibration result of the device to be tested; when the accumulated number of gain values ​​is equal to the second number, add the second number of gain values ​​to the gain set to obtain a new gain set; and re-obtain a new first gain value and a new cycle parameter based on the new gain set.

[0095] It should be noted here that the examples and application scenarios implemented by the above modules and corresponding steps are the same, but are not limited to the contents disclosed in the above embodiments.

[0096] According to another aspect of the embodiments of the present application, the present application provides an electronic device, such as Figure 4 As shown, it includes a memory 401, a processor 403, a communication interface 405 and a communication bus 407. The memory 401 stores a computer program that can be run on the processor 403. The memory 401 and the processor 403 communicate through the communication interface 405 and the communication bus 407. When the processor 403 executes the computer program, the steps of the above method are implemented.

[0097] The memory and processor in the above electronic device communicate via a communication bus and a communication interface. The communication bus may be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. The communication bus may be divided into an address bus, a data bus, a control bus, etc.

[0098] The memory may include a random access memory (RAM) or a non-volatile memory, such as at least one disk memory. Optionally, the memory may also be at least one storage device located away from the aforementioned processor.

[0099] The above-mentioned processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0100] The electronic device provided in the embodiment of the present application may specifically be a module capable of realizing a communication function or a terminal device including the module, etc. The terminal device may be a mobile terminal or a smart terminal. The mobile terminal may specifically be at least one of a mobile phone, a tablet computer, a laptop computer, etc.; the smart terminal may specifically be a terminal including a wireless communication module such as a smart car, a smart watch, a shared bicycle, a smart cabinet, etc.; the module may specifically be a wireless communication module, such as any one of a 2G communication module, a 3G communication module, a 4G communication module, a 5G communication module, and a NB-IOT communication module.

[0101] According to another aspect of the embodiments of the present application, a computer-readable medium having a non-volatile program code executable by a processor is provided.

[0102] Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments, and this embodiment will not be described in detail here.

[0103] When the embodiments of the present application are specifically implemented, reference may be made to the above-mentioned embodiments, which have corresponding technical effects.

[0104] It is understood that the embodiments described herein may be implemented in hardware, software, firmware, middleware, microcode, or a combination thereof. For hardware implementation, the processing unit may be implemented in one or more application specific integrated circuits (ASIC), digital signal processors (DSP), digital signal processing devices (DSPD), programmable logic devices (PLD), field programmable gate arrays (FPGA), general purpose processors, controllers, microcontrollers, microprocessors, other electronic units for performing the functions described in the present application, or a combination thereof.

[0105] For software implementation, the technology described herein can be implemented by a unit that performs the functions described herein. The software code can be stored in a memory and executed by a processor. The memory can be implemented in the processor or outside the processor.

[0106] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0107] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0108] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the modules is only a logical function division. There may be other division methods in actual implementation, such as multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0109] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0110] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0111] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the embodiment of the present application is essentially or the part that contributes to the prior art or the part of the technical solution can be embodied in the form of a software product, which is stored in a storage medium, including several instructions to make a computer device (which can be a personal computer, a server, or a network device, etc.) perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a ROM, a RAM, a magnetic disk or an optical disk. It should be noted that, in this article, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is any such actual relationship or order between these entities or operations. Moreover, the term "include", "include" or any other variant thereof is intended to cover non-exclusive inclusion, so that the process, method, article or device including a series of elements includes not only those elements, but also includes other elements that are not explicitly listed, or also includes elements inherent to such a process, method, article or device. Without more constraints, an element defined by the phrase "comprising a..." does not exclude the existence of other identical elements in the process, method, article or apparatus comprising the element.

[0112] The above description is only a specific implementation of the present application, so that those skilled in the art can understand or implement the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments shown herein, but will conform to the widest range consistent with the principles and novel features applied for herein.

Claims

1. A radio frequency calibration method for a device, characterized in that: include: Obtaining a first gain value, and performing a calibration test on the device to be tested using the test system and the first gain value, wherein the first gain value is an average of gain values ​​in a gain set, and the gain set is a plurality of gain values ​​obtained by statistically analyzing batch devices on a production line; In a case where the first gain value fails the calibration test, obtaining a cycle parameter, wherein the cycle parameter is obtained in advance through the gain set; Performing a cyclic test on the device under test using the cyclic parameter and the first gain value until a second gain value that meets a preset condition is determined; The second gain value is outputted by the test system as a calibration result of the device under test.

2. The method according to claim 1, characterized in that The step of performing a cyclic test on the device under test by using the cyclic parameter and the first gain value until a second gain value meeting a preset condition is determined includes: Performing a superposition operation on the first gain value to obtain a third gain value; Comparing the third gain value with the cycle parameter to determine whether the third gain value is less than a maximum value among the cycle parameters; If the third gain value is less than the maximum value, obtaining, through the device under test, an actual output power corresponding to the third gain value; If the difference between the actual output power and the target output power is less than or equal to the error threshold, the third gain value is determined as the second gain value that meets the preset condition.

3. The method according to claim 2, characterized in that After comparing the third gain value with the cycle parameter, the method further comprises: If the third gain value is greater than or equal to the maximum value of the cycle parameters, stopping the cycle test; The device under test is determined to be an abnormal device, and abnormal information of the device under test is reported.

4. The method according to claim 2, characterized in that: After acquiring the actual output power corresponding to the third gain value, the method further includes: If the difference between the actual output power and the target output power is greater than the error threshold, the cycle test is continued to be performed on the device under test using the cycle parameter and the third gain value.

5. The method according to claim 1, characterized in that: Before obtaining the cycle parameters, the method further includes calculating the cycle parameters in the following manner: generating a normal distribution curve according to each of the gain values ​​in the gain set; Obtaining an expected value and a standard deviation from the normal distribution curve; determining a smallest integer greater than or equal to the standard deviation as a first value, and determining a smallest integer greater than or equal to twice the standard deviation as a second value; Adding the expected value to the first value to obtain a minimum value, and adding the expected value to the second value to obtain a maximum value; The minimum value and the maximum value are determined as the cycle parameters.

6. The method according to claim 1, characterized in that After the test system outputs the second gain value as a calibration result of the device under test, the method further includes: Monitor each gain value output by the test system, and determine whether the gain value is greater than a minimum value of the cycle parameter and less than a maximum value of the cycle parameter; If the first number of gain values ​​continuously output by the test system are all greater than the minimum value and less than the maximum value, it is determined that the test system is abnormal.

7. The method according to claim 6, characterized in that After determining that the test system is abnormal, the method further includes: Measuring line loss of the test system to determine whether there is abnormal loss in the test system; or Perform interference source detection on the test environment where the test system is located to determine whether there is an interference source in the test environment; or A performance test is performed on the receiving end of the test system to determine whether the receiving end of the test system has performance abnormalities.

8. The method according to claim 1, characterized in that After the test system outputs the second gain value as a calibration result of the device under test, the method further includes: Accumulating the number of gain values ​​output by the test system; When the accumulated number of gain values ​​is equal to a second number, adding the gain values ​​of the second number to the gain set to obtain a new gain set; A new first gain value and a new cycle parameter are obtained again according to the new gain set.

9. A radio frequency calibration device for a device, characterized in that: include: A first acquisition module is used to acquire a first gain value, and perform a calibration test on the device under test using the test system and the first gain value, wherein the first gain value is an average value of each gain value in a gain set, and the gain set is a plurality of gain values ​​obtained by statistically analyzing batch devices on a production line; A second acquisition module, configured to acquire a cycle parameter when the first gain value fails the calibration test, wherein the cycle parameter is obtained in advance through the gain set; A testing module, used for performing a cyclic test on the device under test using the cyclic parameter and the first gain value until a second gain value that meets a preset condition is determined; An output module is used to output the second gain value as a calibration result of the device under test through the test system.

10. An electronic device, comprising a memory, a processor, a communication interface and a communication bus, wherein the memory stores a computer program that can be run on the processor, and the memory and the processor communicate through the communication bus and the communication interface, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 8 are implemented.

11. A computer readable medium having a non-volatile program code executable by a processor, characterized in that: The program code enables the processor to execute the method according to any one of claims 1 to 8.

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