Shape memory alloy wire training and performance testing platform

Abstract

The invention belongs to the technical field of shape memory alloy material training and performance testing, and particularly relates to a shape memory alloy wire training and performance testing platform which comprises a training testing mechanism which comprises a plurality of testing track sets and training track sets, the testing track sets are used for conducting performance testing on SMA wires, and the training track sets are used for conducting performance testing on the SMA wires; the training track group is used for performing thermal mechanical training on the SMA wire; the SMA wire power supply mechanism comprises a plurality of SMA wire power supplies and relays; the data acquisition mechanism comprises a data acquisition card, an infrared thermometer, a data acquisition power supply, a current sensor, a voltage sensor, a displacement sensor and a force sensor; according to the shape memory alloy wire training and performance testing platform, various data such as current, voltage, wire length change, tension and temperature can be measured synchronously, a plurality of testing track groups and training track groups can be built in parallel, different SMA wires can be trained and tested at the same time, the working efficiency is high, and operation is convenient.

Description

Technical Field

[0001] The invention belongs to the technical field of shape memory alloy material training and performance testing, and in particular relates to a shape memory alloy wire training and performance testing platform. Background Art

[0002] Shape memory alloy (SMA) has superior shape memory effect, superelasticity, high strength, high plasticity, good corrosion resistance, and excellent biocompatibility. As a new type of intelligent material, it has been widely used in aerospace, medical equipment, automotive engineering, automatic control, instrumentation, and robotics.

[0003] Shape memory alloys can memorize the shape of the low-temperature martensite phase. After obvious plastic deformation, they can automatically recover to the original memorized shape when the temperature rises to a certain level. Superelasticity refers to the phenomenon that when stress is applied to a shape memory alloy at a high temperature to cause a large deformation, the alloy can still recover to its original shape before deformation after the stress is released.

[0004] Usually, when using the shape memory effect of SMA as an actuator, an external load is first applied to the SMA to cause deformation, and then a phase change is generated by heating to generate strain recovery force to achieve driving. When the SMA is subjected to an external load, a recovery strain is generated when it is heated and recovered. During the cooling process, the external load induces martensitic transformation and generates prestrain. This cycle is repeated periodically. This periodic thermal cycle under the action of external forces is usually called a thermomechanical cycle. However, the memory stability of general SMAs is poor. As the number of thermomechanical cycles increases, the memory performance can gradually stabilize, that is, the recovery strain reaches a stable value. Therefore, before using SMA as an actuator, the SMA material needs to be trained with thermomechanical cycles dozens or even thousands of times to improve the memory stability of the SMA material.

[0005] In addition, since different alloy proportions and heat treatment conditions have a great influence on the mechanical properties of shape memory alloys when they are manufactured, in order to study the mechanical property attenuation and high temperature recovery performance of different shape memory alloy wires, it is also necessary to heat and cool the shape memory alloy wires in a cycle, and detect the parameters such as the current, voltage, temperature, tension, and wire length change of the shape memory alloy wires. How to test and train its performance parameters is also the key to its application in engineering, and using appropriate equipment for quantitative experimental research and training is a key technology.

[0006] At present, the shape memory alloy wire experimental training platform generally applies a load to the shape memory alloy wire through a heavy object, and controls the power on and off of the alloy wire to train the shape memory effect of the alloy wire. During the training process, multiple sensors are used to measure the current, voltage, length change and other data of the alloy wire. During the test, as the memory alloy wire is powered on and off, the temperature of the memory alloy wire will change and the shape memory effect will occur, thereby changing the length, and the resistance of the memory alloy wire will also change with the temperature. These data are interrelated, influence each other, and change dynamically during the training process, so the synchronization of the measurement of each data is very important.

[0007] The study of the thermo-mechanical properties of shape memory alloy wires requires monitoring of the current, voltage, length change, tension and temperature of the alloy wires. However, the existing shape memory alloy wire experimental training platforms measure each parameter independently and cannot guarantee the synchronization of the measurement data. Therefore, it is difficult to meet the requirements of the comprehensiveness and synchronization of the experimental data for the study of the thermo-mechanical properties of shape memory alloy wires. If the current, voltage, length change, tension and temperature of the alloy wire cannot be measured synchronously, it is impossible to grasp the relationship between the temperature, resistance, stress and strain of the memory alloy wire, which is not conducive to the study of the characteristics of shape memory alloys.

[0008] In addition, the existing shape memory alloy wire training and testing platform can generally only train or test one alloy wire at a time. If multiple alloy wires need to be trained at the same time, multiple training platforms are required, which takes up more resources and has low efficiency.

[0009] If a test platform with high synchronization of data measurement and collection and capable of training multiple shape memory alloy wires at the same time can be provided, it will greatly facilitate the production and research of shape memory alloy wires. Summary of the invention

[0010] The purpose of the present invention is to provide a shape memory alloy wire training and performance testing platform with high synchronization of data measurement and acquisition and capable of training multiple shape memory alloy wires at the same time, in order to facilitate the production and research of shape memory alloy wires.

[0011] In view of this, the present invention provides a shape memory alloy wire training and performance testing platform, comprising:

[0012] A training and testing mechanism, comprising a plurality of test track groups and a training track group, wherein the test track group is used to perform performance testing on the SMA wire, and the training track group is used to perform thermomechanical training on the SMA wire;

[0013] An SMA wire power supply mechanism comprises a plurality of SMA wire power supplies and relays, wherein the SMA wire power supplies are respectively connected to each SMA wire and the relay, and the on / off state of each SMA wire can be controlled by the relay;

[0014] The data acquisition mechanism includes a data acquisition card, an infrared thermometer, a data acquisition power supply, a current sensor, a voltage sensor, a displacement sensor and a force sensor. The data acquisition power supply can supply power to other components in the data acquisition mechanism. The infrared thermometer, the current sensor, the voltage sensor, the displacement sensor and the force sensor are connected to the data acquisition card. The data acquisition card can synchronously acquire data detected by various detection devices.

[0015] Furthermore, the training track group and the test track group include:

[0016] A first guide rail, which is a track structure extending in a horizontal direction;

[0017] A third slider, a first slider, and a fourth slider are sequentially arranged on the first guide rail, and the third slider, the first slider, and the fourth slider can slide along the first guide rail and can be fixed at any position on the first guide rail;

[0018] and, a second guide rail, which is arranged on the first slider, the second guide rail is parallel to the first guide rail, and is also a track structure extending in the horizontal direction;

[0019] A second slider is disposed on the second guide rail, and the second slider can slide along the second guide rail;

[0020] One end of the SMA wire is connected to the third slider, and the other end is connected to the second slider. The pulling rope is also connected to the second slider. A loading weight is set at one end of the pulling rope away from the SMA wire, and the loading weight can apply a load to the SMA wire.

[0021] Furthermore, there are two first sliding blocks, a mounting substrate is arranged on the two first sliding blocks, the two first sliding blocks are connected as a whole through the mounting substrate, and a second guide rail is arranged on the mounting substrate.

[0022] Furthermore, a first hook platform and a second hook platform are arranged on the second slider, and the first hook platform and the second hook platform are arranged in sequence along the length direction of the second guide rail and are fixedly connected to the second slider; wherein the first hook platform is detachably connected to the end of the SMA wire, and the second hook platform is detachably connected to the pulling rope.

[0023] Furthermore, the test track group also includes:

[0024] A fifth slider is arranged on the first guide rail, the fifth slider is located between the third slider and the first slider, a displacement sensor is arranged on the fifth slider, a light baffle is arranged at the end of the SMA wire, and the displacement sensor can obtain the length of the SMA wire by detecting the position of the light baffle.

[0025] Furthermore, the positive and negative poles of the data acquisition power supply are respectively connected to the two ends of the SMA wire, and the current sensor is connected in series between the data acquisition power supply and the SMA wire, so that the measuring port of the current sensor forms an electrical connection with the SMA wire, and the current can flow through the SMA wire and be detected by the current sensor; the voltage sensor is connected in parallel to the two ends of the test SMA wire to measure the voltage at the two ends of the SMA wire.

[0026] Further, the infrared thermometer is arranged near the SMA wire through a mechanical arm and is capable of measuring the temperature of the SMA wire;

[0027] The displacement sensor is arranged above the SMA wire, and a light shielding plate that can move with the end of the SMA wire is arranged at the other end of the SMA wire, and the displacement sensor can measure the length of the SMA wire through the light shielding plate;

[0028] The force sensor is fixedly arranged in the training and testing mechanism, and a measuring port of the force sensor is connected to one end of the SMA wire, so that the force sensor can measure the tension of the SMA wire.

[0029] Furthermore, the SMA wire power supply mechanism also includes:

[0030] The first mounting frame is a multi-layer structure, and the SMA wire power supply is installed on the first mounting frame.

[0031] Furthermore, the data collection mechanism also includes:

[0032] The second mounting frame is a multi-layer structure. The data acquisition card, data acquisition power supply, current sensor, and voltage sensor are connected according to the aforementioned circuit and are placed in each layer of the second mounting frame.

[0033] Furthermore, the shape memory alloy wire training and performance testing platform also includes:

[0034] A test platform, which includes a movable table and a breadboard;

[0035] The training and testing mechanism, the SMA wire power supply mechanism, the data acquisition mechanism, and the breadboard are arranged on the desktop of the movable table body.

[0036] The beneficial effects of the present invention are:

[0037] The shape memory alloy wire training and performance testing platform described in the present invention provides a testing device that can synchronously measure multiple data such as current, voltage, wire length change, tension and temperature, and improves the temperature measurement method, which can make temperature measurement more accurate and better meet the needs of multi-point temperature measurement in scientific research. The volume of a single shape memory alloy wire test track in the present invention is relatively small, and multiple test track groups and training track groups can be built in parallel. Different SMA wires can be trained and tested at the same time, with high work efficiency and easy operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 It is a three-dimensional structural schematic diagram of the shape memory alloy wire training and performance testing platform of the present invention;

[0039] Figure 2 It is a front view structural schematic diagram of the shape memory alloy wire training and performance testing platform of the present invention;

[0040] Figure 3 It is a side structural schematic diagram of the shape memory alloy wire training and performance testing platform of the present invention;

[0041] Figure 4 It is a schematic diagram of the top view of the shape memory alloy wire training and performance testing platform of the present invention;

[0042] Figure 5 It is a partial three-dimensional structural schematic diagram of the shape memory alloy wire training and performance testing platform of the present invention;

[0043] Figure 6 is a schematic diagram of the three-dimensional structure of the training track group of the present invention;

[0044] Figure 7 is a schematic diagram of the three-dimensional structure of the test track group of the present invention at a first viewing angle;

[0045] Figure 8 is a schematic diagram of the three-dimensional structure of the test track group of the present invention at a second viewing angle;

[0046] Fig. 9 It is a schematic diagram of the principle of the shape memory alloy wire training and performance testing platform of the present invention;

[0047] The symbols in the figure are:

[0048] 1. Training and testing mechanism; 1a. Test track group; 1b. Training track group; 101. First guide rail; 102. First slider; 103. Second slider; 104. Second guide rail; 105. Mounting base; 106. Third slider; 107. Fourth slider; 108. Fifth slider; 109. Support seat; 110. Pulley; 111. Optical axis; 112. First hook platform; 113. Second hook platform; 114. Light shield; 115. Connecting hook; 116. SMA wire; 117. SMA wire fixing platform; 118. Pull rope; 119, load heavy objects; 2, SMA wire power supply mechanism; 201, SMA wire power supply; 202, relay; 203, first mounting bracket; 3, data acquisition mechanism; 301, data acquisition card; 302, infrared thermometer; 303, robotic arm; 304, data acquisition power supply; 305, current sensor; 306, voltage sensor; 307, displacement sensor; 308, force sensor; 309, second mounting bracket; 4, test platform; 401, movable table; 402, breadboard. DETAILED DESCRIPTION

[0049] The following will be combined with the drawings in the embodiments of the present application to clearly describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments in the present application belong to the scope of protection of this application.

[0050] In the description of the present application, it should be noted that the terms used herein are only for describing specific embodiments, and are not intended to limit the exemplary embodiments according to the present application. For ease of description, the sizes of the various parts shown in the drawings are not drawn according to the actual proportional relationship. The technology, methods and equipment known to ordinary technicians in the relevant field may not be discussed in detail, but in appropriate cases, the technology, methods and equipment should be regarded as part of the authorization specification. In all examples shown and discussed here, any specific value should be interpreted as merely exemplary, rather than as a limitation. Therefore, other examples of the exemplary embodiments may have different values. It should be noted that similar numbers and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0051] It should be noted that the terms "first", "second", etc. in the specification and claims of the present application are used to distinguish similar objects, and are not used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable under appropriate circumstances, so that the embodiments of the present application can be implemented in an order other than those illustrated or described here, and the objects distinguished by "first", "second", etc. are generally of one type, and the number of objects is not limited. For example, the first object can be one or more. In addition, "and / or" in the specification and claims represents at least one of the connected objects, and the character " / " generally indicates that the objects associated with each other are in an "or" relationship.

[0052] It should be noted that, in the description of the present application, the orientation or positional relationship indicated by terms such as "front, back, up, down, left, right", "lateral, vertical, perpendicular, horizontal" and "top, bottom" are usually based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description. Unless otherwise stated, these orientation words do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the scope of protection of the present application; the orientation words "inside and outside" refer to the inside and outside relative to the contour of each component itself.

[0053] It should be noted that, in the present application, the terms "comprise", "include" or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprises one..." does not exclude the presence of other identical elements in the process, method, article or device including the element. In addition, it should be noted that the scope of the method and device in the embodiment of the present application is not limited to performing functions in the order shown or discussed, and may also include performing functions in a substantially simultaneous manner or in reverse order according to the functions involved, for example, the described method may be performed in an order different from that described, and various steps may also be added, omitted, or combined. In addition, the features described with reference to certain examples may be combined in other examples.

[0054] like Figures 1 to 9 As shown, a shape memory alloy wire training and performance testing platform comprises:

[0055] A training and testing mechanism 1, comprising a plurality of test track groups 1a and a training track group 1b, wherein the test track group 1a is used to perform performance testing on the SMA wire 116, and the training track group 1b is used to perform thermomechanical training on the SMA wire 116;

[0056] The SMA wire power supply mechanism 2 includes a plurality of SMA wire power supplies 201 and relays 202. The SMA wire power supplies 201 are respectively connected to each SMA wire 116 and the relays 202. The on / off state of each SMA wire 116 can be controlled by the relays 202.

[0057] The data acquisition mechanism 3 includes a data acquisition card 301, an infrared thermometer 302, a data acquisition power supply 304, a current sensor 305, a voltage sensor 306, a displacement sensor 307 and a force sensor 308. The data acquisition power supply 304 can supply power to other components in the data acquisition mechanism 3. The infrared thermometer 302, the current sensor 305, the voltage sensor 306, the displacement sensor 307 and the force sensor 308 are connected to the data acquisition card 301. The data acquisition card 301 can synchronously collect data detected by various detection devices.

[0058] Specifically, Fig. 9 As shown, in the shape memory alloy wire training and performance testing platform, the positive and negative electrodes of the data acquisition power supply 304 are respectively connected to the two ends of the SMA wire 116, and the current sensor 305 is connected in series between the data acquisition power supply 304 and the SMA wire 116, so that the measuring port of the current sensor 305 forms an electrical connection with the SMA wire 116, and the current can flow through the SMA wire 116 and be detected by the current sensor 305; the voltage sensor 306 is connected in parallel to the two ends of the test SMA wire 116 to measure the voltage at the two ends of the SMA wire 116.

[0059] In addition, the infrared thermometer 302 is arranged near the SMA wire 116 through the mechanical arm 303, and can measure the temperature of the SMA wire 116; the displacement sensor 307 is arranged above the SMA wire 116, and a light baffle 114 that can move with the end of the SMA wire 116 is arranged at the other end of the SMA wire 116, and the displacement sensor 307 can measure the displacement of the SMA wire 116, that is, the wire length through the light baffle 114; the force sensor 308 is fixedly arranged in the training and testing mechanism 1, and its measuring port is connected to one end of the SMA wire 116, so that the force sensor 308 can measure the tension of the SMA wire 116.

[0060] Preferably, since the training track group 1b may not be subjected to temperature measurement, an infrared thermometer 302 may be provided only near the SMA wire 116 in the test track group 1a.

[0061] Furthermore, the SMA wire power supply mechanism 2 further includes:

[0062] The first mounting frame 203 is a multi-layer structure, and the SMA wire power supply 201 is mounted on the first mounting frame 203 .

[0063] Preferably, the SMA wire power supply 201 is installed layer by layer on the first mounting frame 203 , so that the floor space occupied by the SMA wire power supply mechanism 2 can be saved.

[0064] As some examples of the present invention, the SMA wire power supply mechanism 2 includes: 2 to 8 SMA wire power supplies 201 and an equal number of relays 202, the relays 202 and the SMA wire power supplies 201 are connected one-to-one, each group of SMA wire power supplies 201 and relays 202 are respectively connected to different SMA wires 116, and independently control the circuits flowing through each SMA wire 116.

[0065] Similarly, the data collection mechanism 3 also includes:

[0066] The second mounting frame 309 is a multi-layer structure. The data acquisition card 301, data acquisition power supply 304, current sensor 305, and voltage sensor 306 are connected according to the aforementioned circuit and placed in each layer of the second mounting frame 309. This not only saves floor space, but also makes it easier for the operator to observe and adjust the working status of each component.

[0067] Furthermore, the shape memory alloy wire training and performance testing platform also includes:

[0068] A test platform 4, which includes a movable table 401 and a breadboard 402;

[0069] The breadboard 402 is arranged on the desktop of the movable table body 401, and the training and testing mechanism 1, the SMA wire power supply mechanism 2 and the data acquisition mechanism 3 are also arranged on the desktop of the movable table body 401. In this way, the shape memory alloy wire training and performance testing platform becomes a movable whole and is easy to use.

[0070] Preferably, a corresponding circuit is provided in the breadboard 402 to electrically connect the components in the training and testing mechanism 1, the SMA wire power supply mechanism 2 and the data acquisition mechanism 3 in a set manner, so that the structure of the shape memory alloy wire training and performance testing platform can be simplified.

[0071] Furthermore, the training track group 1b includes:

[0072] A guide rail, and a plurality of sliders arranged on the guide rail, wherein the sliders can slide along the guide rail and can be fixed at any position on the guide rail;

[0073] One end of the SMA wire 116 is fixed by a slider, and the other end is connected to a pulling rope 118. A load weight 119 is provided at one end of the pulling rope 118 away from the SMA wire 116. The load weight 119 can apply a load to the SMA wire 116.

[0074] During training, the SMA wire 116 is supplied with current through the SMA wire power supply mechanism 2 , and at the same time, the relevant parameters of the training process are synchronously collected through the data collection mechanism 3 .

[0075] As some other embodiments of the present invention, the training and testing mechanism 1 can also adopt a servo motor loading method instead of a heavy object loading method, which can achieve a more convenient change in the loading load size.

[0076] Specifically, the training track group 1b includes:

[0077] A first guide rail 101, which is a track structure extending in a horizontal direction;

[0078] A third slider 106, a first slider 102, and a fourth slider 107 are sequentially arranged on the first guide rail 101, and the third slider 106, the first slider 102, and the fourth slider 107 can slide along the first guide rail 101 and can be fixed at any position on the first guide rail 101;

[0079] and, a second guide rail 104, which is disposed on the first slider 102, wherein the second guide rail 104 is parallel to the first guide rail 101 and is also a track structure extending in the horizontal direction;

[0080] A second slider 103 is disposed on the second guide rail 104 , and the second slider 103 can slide along the second guide rail 104 ;

[0081] One end of the SMA wire 116 is connected to the third slider 106 , and the other end is connected to the second slider 103 . The pulling rope 118 is also connected to the second slider 103 , so that the pulling rope 118 can drive the SMA wire 116 to move through the second slider 103 .

[0082] Preferably, there are two first sliders 102, and a mounting substrate 105 is provided on the two first sliders 102, and the two first sliders 102 are connected as a whole through the mounting substrate 105, and a second guide rail 104 is provided on the mounting substrate 105, and a second slider 103 is provided on the second guide rail 104. In order to meet the needs of use, the second guide rail 104 has a certain length to reserve enough space for the sliding of the second slider 103. This method of providing two first sliders 102 can reduce the material used for the first slider 102 and the sliding resistance; at the same time, when it is necessary to adjust the length of the second guide rail 104, it is only necessary to replace the mounting substrate 105 and the second guide rail 104 of appropriate length.

[0083] Furthermore, an SMA wire fixing platform 117 is disposed on the third sliding block 106 , and an end of the SMA wire 116 is connected to the SMA wire fixing platform 117 .

[0084] Furthermore, a first hook platform 112 and a second hook platform 113 are provided on the second slider 103, and the first hook platform 112 and the second hook platform 113 are sequentially arranged on the second slider 103 along the length direction of the second guide rail 104, and are fixedly connected to the second slider 103; wherein, the first hook platform 112 is connected to the end of the SMA wire 116, and the second hook platform 113 is connected to the pulling rope 118, and the first hook platform 112 and the second hook platform 113 facilitate the connection between the SMA wire 116 and the pulling rope 118 and the second slider 103.

[0085] As some examples of the present invention, a groove is provided on the first hook platform 112 , and a clamping block is provided at the end of the SMA wire 116 , and the clamping block is clamped on the groove to achieve a quick connection between the SMA wire 116 and the second slider 103 .

[0086] As some examples of the present invention, a connection hook 115 is provided on the second hook platform 113 , and the pulling rope 118 is hooked on the connection hook 115 , so as to realize a quick connection between the pulling rope 118 and the second slider 103 .

[0087] Furthermore, the fourth slider 107 includes:

[0088] Two supporting seats 109 arranged opposite to each other;

[0089] An optical axis 111, which is arranged between the two support seats 109 along the horizontal direction;

[0090] a pulley 110 disposed on the optical axis 111;

[0091] The pulling rope 118 passes around the pulley 110 and then extends in the vertical direction, so that the shape memory alloy wire training and performance testing platform can use the gravity of the loading weight 119 to apply a load to the SMA wire 116 .

[0092] Furthermore, in addition to having the same structure as the training track group 1b, the test track group 1a also includes:

[0093] A fifth slider 108 is arranged on the first guide rail 101. The fifth slider 108 is located between the third slider 106 and the first slider 102. A displacement sensor 307 is arranged on the fifth slider 108. A light baffle 114 is arranged at the end where the SMA wire 116 is connected to the traction rope 118. The light baffle 114 can move with the end of the SMA wire 116. The displacement sensor 307 can obtain the length of the SMA wire 116 by detecting the position of the light baffle 114.

[0094] Preferably, a avoidance structure, such as an L-shaped plate structure, is provided on the fifth sliding block 108 . The avoidance structure allows the SMA wire 116 to pass through and can provide a mounting platform for the displacement sensor 307 .

[0095] According to the existing shape memory alloy wire training and performance testing means, it can be determined that during the training and performance testing process, the first slider 102, the third slider 106, the fourth slider 107 and the fifth slider 108 should first slide to the set position and be fixed to the first guide rail 101, and the position of the second slider 103 always remains in a slidable state. The testing and training process is consistent with the prior art and will not be repeated here.

[0096] In addition, the force sensor 308 is disposed on the first slider 102 , and the end of the SMA wire 116 is connected to the force sensor 308 , so that the force sensor 308 can measure the tension applied to the SMA wire 116 .

[0097] The working principle of the shape memory alloy wire training and performance testing platform of the present invention is as follows: Fig. 9As shown, a loading weight 119 is used as a fixed load of the SMA wire 116, and the temperature of the SMA wire 116 and the occurrence of the shape memory effect are controlled by energizing the SMA wire 116. In this process, a current sensor 305, a voltage sensor 306, an infrared thermometer 302, a displacement sensor 307 and a force sensor 308 are used to record data, and the data of each sensor are output to the data acquisition card 301, so as to achieve synchronization of various data in the acquisition time. This method of using the data acquisition card 301 to collect various data measured during the experiment can synchronously obtain multiple types of data on the same time axis, which is convenient for data analysis and calculation, and can also flexibly adjust the data sampling frequency.

[0098] In addition, the existing shape memory alloy wire training and testing platform generally uses thermocouples to measure the temperature of the alloy wire. Thermocouples are contact temperature measurement methods, and need to be glued to the shape memory alloy wire to measure the temperature. When the shape memory alloy wire is displaced, the position of the thermocouple will change, affecting the accuracy of the temperature measurement; at the same time, the adhesion of the thermocouple will also change the convection heat transfer conditions of the shape memory alloy wire, affecting the temperature rise characteristics of the shape memory alloy wire under the natural convection heat transfer conditions; at the same time, the shape memory alloy wire experiment and training process needs to be energized to control the temperature, and the object being measured is charged, which will affect the accuracy of the thermocouple measurement results. The temperature measurement method of the present invention uses an infrared thermometer to measure the temperature. This non-contact temperature measurement method will not affect the normal heat transfer of the alloy wire. At the same time, the infrared thermometer can freely select multiple measurement points, and the sampling frequency is high. In the study of the thermal-mechanical properties of the shape memory alloy wire, it can more conveniently and accurately reflect the temperature field of the alloy wire.

[0099] Furthermore, the shape memory alloy wire training and performance testing platform of the present invention adopts a structure in which each shape memory alloy wire corresponds to one track and multiple tracks are laid in parallel, making it possible to train and test multiple shape memory alloy wires at the same time.

[0100] On this basis, the test track group 1a and the training track group 1b of the present invention have a simple structure and a small width, which greatly reduces the volume of a single track and makes the space utilization efficiency of the entire training and performance testing platform high; at the same time, the present invention also optimizes the layout of the power supply, various sensors and the data acquisition card 301, making it more convenient to adjust the power supply current and voltage, and the entire training and testing platform occupies a smaller area and space.

[0101] In summary, the shape memory alloy wire training and performance testing platform described in the present invention provides a testing device that can synchronously measure multiple data such as current, voltage, wire length change, tension and temperature, and improves the temperature measurement method, which can make temperature measurement more accurate and better meet the needs of multi-point temperature measurement in scientific research. The volume of a single shape memory alloy wire test track in the present invention is relatively small, and multiple test track groups 1a and training track groups 1b can be built in parallel, and different SMA wires 116 can be trained and tested at the same time, which is efficient and easy to operate.

[0102] The embodiments of the present application are described above in conjunction with the accompanying drawings. In the absence of conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of the present application, ordinary technicians in this field can also make many forms without departing from the purpose of the present application and the scope of protection of the claims, all of which are within the protection of the present application.

Claims

1. A shape memory alloy wire training and performance testing platform, characterized in that: include: A training and testing mechanism (1) comprises a plurality of test track groups (1a) and a training track group (1b), wherein the test track group (1a) is used to perform performance testing on an SMA wire (116), and the training track group (1b) is used to perform thermomechanical training on the SMA wire (116); An SMA wire power supply mechanism (2), comprising a plurality of SMA wire power supplies (201) and relays (202), wherein the SMA wire power supplies (201) are respectively connected to each SMA wire (116) and the relays (202), and the on / off state of each SMA wire (116) can be controlled via the relays (202); A data acquisition mechanism (3) comprises a data acquisition card (301), an infrared thermometer (302), a data acquisition power supply (304), a current sensor (305), a voltage sensor (306), a displacement sensor (307) and a force sensor (308); the data acquisition power supply (304) can supply power to other components in the data acquisition mechanism (3); the infrared thermometer (302), the current sensor (305), the voltage sensor (306), the displacement sensor (307) and the force sensor (308) are connected to the data acquisition card (301); and the data acquisition card (301) can synchronously acquire data detected by various detection devices.

2. The shape memory alloy wire training and performance testing platform according to claim 1, characterized in that: The training track group (1b) and the test track group (1a) include: A first guide rail (101), which is a track structure extending in a horizontal direction; A third slider (106), a first slider (102), and a fourth slider (107) are sequentially arranged on the first guide rail (101); the third slider (106), the first slider (102), and the fourth slider (107) can slide along the first guide rail (101) and can be fixed at any position on the first guide rail (101); and, a second guide rail (104), which is arranged on the first sliding block (102), the second guide rail (104) being parallel to the first guide rail (101) and also being a track structure extending in the horizontal direction; A second sliding block (103), which is arranged on the second guide rail (104), and the second sliding block (103) is capable of sliding along the second guide rail (104); One end of the SMA wire (116) is connected to the third slider (106), and the other end is connected to the second slider (103). The pulling rope (118) is also connected to the second slider (103). A load weight (119) is provided at one end of the pulling rope (118) away from the SMA wire (116). The load weight (119) can apply a load to the SMA wire (116).

3. The shape memory alloy wire training and performance testing platform according to claim 2, characterized in that: There are two first sliders (102), and a mounting substrate (105) is arranged on the two first sliders (102). The two first sliders (102) are connected as a whole through the mounting substrate (105), and a second guide rail (104) is arranged on the mounting substrate (105).

4. The shape memory alloy wire training and performance testing platform according to claim 2, characterized in that: A first hook platform (112) and a second hook platform (113) are arranged on the second slider (103); the first hook platform (112) and the second hook platform (113) are arranged in sequence along the length direction of the second guide rail (104), and are fixedly connected to the second slider (103); wherein the first hook platform (112) is detachably connected to the end of the SMA wire (116), and the second hook platform (113) is detachably connected to the pulling rope (118).

5. The shape memory alloy wire training and performance testing platform according to claim 2, characterized in that: The test track set (1a) further comprises: A fifth slider (108) is arranged on the first guide rail (101), the fifth slider (108) is located between the third slider (106) and the first slider (102), a displacement sensor (307) is arranged on the fifth slider (108), a light shielding plate (114) is arranged at the end of the SMA wire (116), and the displacement sensor (307) can obtain the length of the SMA wire (116) by detecting the position of the light shielding plate (114).

6. The shape memory alloy wire training and performance testing platform according to claim 1, characterized in that: The positive and negative electrodes of the data acquisition power supply (304) are respectively connected to the two ends of the SMA wire (116); the current sensor (305) is connected in series between the data acquisition power supply (304) and the SMA wire (116), so that the measuring port of the current sensor (305) forms an electrical connection with the SMA wire (116), and the current can flow through the SMA wire (116) and be detected by the current sensor (305); the voltage sensor (306) is connected in parallel to the two ends of the test SMA wire (116) to measure the voltage at the two ends of the SMA wire (116).

7. The shape memory alloy wire training and performance testing platform according to claim 1, characterized in that: The infrared thermometer (302) is arranged near the SMA wire (116) through a mechanical arm (303) and is capable of measuring the temperature of the SMA wire (116); The displacement sensor (307) is arranged above the SMA wire (116), and a light shielding plate (114) that can move with the end of the SMA wire (116) is arranged at the other end of the SMA wire (116), and the displacement sensor (307) can measure the length of the SMA wire (116) through the light shielding plate (114); The force sensor (308) is fixedly arranged in the training and testing mechanism (1), and its measuring port is connected to one end of the SMA wire (116), so that the force sensor (308) can measure the tension of the SMA wire (116).

8. The shape memory alloy wire training and performance testing platform according to claim 1, characterized in that: The SMA wire power supply mechanism (2) further comprises: The first mounting frame (203) is a multi-layer structure, and the SMA wire power supply (201) is mounted on the first mounting frame (203).

9. The shape memory alloy wire training and performance testing platform according to claim 1, characterized in that: The data collection mechanism (3) further comprises: The second mounting frame (309) is a multi-layer structure. The data acquisition card (301), data acquisition power supply (304), current sensor (305), and voltage sensor (306) are connected according to the aforementioned circuit and are placed in each layer of the second mounting frame (309).

10. The shape memory alloy wire training and performance testing platform according to claim 1, characterized in that: The shape memory alloy wire training and performance testing platform also includes: A test platform (4), comprising a movable table (401) and a breadboard (402); The training and testing mechanism (1), the SMA wire power supply mechanism (2), the data acquisition mechanism (3), and the breadboard (402) are arranged on the desktop of the movable table body (401).

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