ICT test fixture

By designing adjustable placement and inspection components, the problem of existing ICT test fixtures requiring replacement of fixed panels is solved, and damage is avoided in probe detection, achieving flexible fixation and probe position of different models of test boards Adjust to ensure that the probe is not subject to pressure damage and clean after detection.

CN119165198AInactive Publication Date: 2024-12-20SHENZHEN XINFULIAN INTELLIGENT TECH CO LTD
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Patent Information

Application Number
CN202411141767.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-08-20
Publication Date
2024-12-20
Estimated Expiration
Not applicable · inactive patent

AI Technical Summary

Technical Problem

When using the existing ICT test fixture, different fixed panels need to be replaced according to different models of test boards, which makes it inconvenient to use, and the probe is easily damaged due to excessive pressure during the detection process.

Method used

An ICT test fixture was designed, including adjustable placement and testing components. Through structures such as silicone pads, elastic snap rings, limiting plates and airbags, flexible fixing and adjustment of probe positions of different models of test boards. , avoid excessive pressure on the probe.

Benefits of technology

It realizes flexible fixation and adjustment of probe position of different models of test boards, reduces the types of fixed panels, avoids probe damage, and cleans the probe head after the detection is completed.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention discloses an ICT test fixture, and relates to the technical field of ICT test fixtures, the ICT test fixture comprises a placement assembly, the placement assembly comprises a base, a placement groove, a silica gel pad, a through hole, a slot, a snap ring, an insertion rod, a clamping groove and a positioning rod, the placement groove is formed in the middle of the base, the silica gel pad is arranged in the placement groove, the through hole is formed in the surface of the silica gel pad, the slot is formed below the placement groove, and the clamping ring is arranged in the slot. A clamping ring is connected to the middle of the inserting groove, an inserting rod is arranged in the inserting groove, and a clamping groove is formed in the outer side of the inserting rod. When the device is used, the device can be adjusted according to the model of a to-be-tested board, so that detection boards of different models can be placed and fixed, excessive fixed panels do not need to be manufactured, the occupied space of the device is reduced, the applicability of the device is improved, the positions of the probes can be adjusted according to the model of the to-be-tested board when the device is used, and the detection efficiency is improved. And the head of the probe is cleaned after detection is completed, and the probe is prevented from being damaged due to excessive pressure during detection.
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Description

Technical Field

[0001] The present invention relates to the technical field of ICT test fixtures, and in particular to an ICT test fixture. Background Art

[0002] ICT test fixture is the abbreviation of Integrated Circuit Tester, which is an online detection and test fixture. It is a standard test equipment that tests the electrical performance and electrical connection of online components to check manufacturing defects and component failures. ICT test fixture can perform analog device function and digital device logic function tests with high fault coverage. A dedicated needle bed needs to be made for each single board. This needle bed is called ICT test fixture in industrial production.

[0003] When using the existing ICT test fixture, different types of test boards need to be fixed with different fixing panels, which makes it inconvenient to fix different types of test boards with the same fixing panel.

[0004] Therefore, in view of this, the existing structure and deficiencies are studied and improved, and an ICT test fixture is proposed. Summary of the invention

[0005] The purpose of the present invention is to provide an ICT test fixture to solve the problems raised in the above background technology.

[0006] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: an ICT test fixture, comprising a placement component, the placement component comprising a base, a placement groove, a silicone pad, a through hole, a slot, a clamping ring, an insertion rod, a clamping groove and a positioning rod, a placement groove is provided in the middle of the base, and a silicone pad is provided in the placement groove, a through hole is opened on the surface of the silicone pad, a slot is provided below the placement groove, and a clamping ring is connected to the middle of the slot, an insertion rod is provided in the slot, and a clamping groove is provided on the outside of the insertion rod, and one end of the insertion rod is connected to the positioning rod.

[0007] Furthermore, the insertion rod is slidably connected to the base through a slot, and the clamping ring is clamped and connected to the insertion rod through a slot, the clamping ring is made of elastic rubber, the insertion rod passes through the silicone pad through a through hole, and the diameter of the positioning rod is smaller than the diameter of the insertion rod.

[0008] Furthermore, the base is symmetrically connected to support rods at the four corners, and a limiting component is arranged in the middle of the support rod, the limiting component includes a base plate and a sliding hole, the support rod is arranged in the middle of the base plate, and the sliding holes are symmetrically arranged at the four corners of the base plate, the base plate is slidably connected to the support rod through the sliding hole, and the base plate is concave in shape.

[0009] Furthermore, the limit assembly also includes an installation groove, a installation strip, a limit plate and a positioning hole. The installation groove is symmetrically opened on the inner side of the substrate, and the installation strip is slidably connected in the installation groove. The limit plate is connected between the installation strips, and the positioning holes are symmetrically arranged at the four corners of the limit plate. The installation strip is connected to the substrate through the installation groove.

[0010] Furthermore, the limiting assembly also includes a fixing groove, a shifting groove, a fixing spring, a fixing card and a shifting block. A fixing groove is opened on one side of the installation groove, and a shifting groove is opened on one side of the fixing groove. A fixing spring is connected in the fixing groove, and a fixing card is connected to the other end of the fixing spring, and a shifting block is connected to one side of the fixing card.

[0011] Furthermore, the fixing card is elastically connected to the fixing slot via a fixing spring, and the fixing card is slidably connected to the base plate via the fixing slot, one end of the fixing card away from the fixing spring is located in the mounting slot, and the shifting block is slidably connected to the base plate via the shifting slot.

[0012] Furthermore, the upper end of the support rod is connected to a top plate, and the center of the top plate is connected to a lifting rod, and the lower end of the lifting rod is provided with a detection component.

[0013] Furthermore, the detection assembly includes a detection plate, a sleeve and an airbag. Two detection plates are arranged at the lower end of the lifting rod, and a sleeve is connected between the detection plates. An airbag is connected to one side of the detection plate close to the lifting rod, and the airbag is connected to the top plate. The airbag is made of elastic material.

[0014] Furthermore, the detection component also includes an air cavity, a solenoid valve and a nozzle. The air cavity is arranged inside the detection plate connected to the airbag, and the solenoid valve is arranged near the air cavity of the sleeve. The nozzle is arranged at one end of the sleeve away from the control valve.

[0015] Furthermore, the detection assembly also includes a reset spring and a probe. The reset spring is connected inside the sleeve, and the other end of the reset spring is connected to the probe. The probe is elastically connected to the sleeve through the reset spring, and the probe is slidably connected to the sleeve.

[0016] The present invention provides an ICT test fixture, which has the following beneficial effects: when in use, the device can be adjusted according to the model of the board to be tested, so that different models of boards to be tested can be placed and fixed, without the need to manufacture too many fixed panels, reducing the space occupied by the device and improving the applicability of the device; when in use, the probe position can be adjusted according to the model of the board to be tested, and the probe head can be cleaned after the test is completed, thereby preventing the probe from being damaged due to excessive pressure during the test.

[0017] 1. When the present invention is in use, the position of the positioning rod can be adjusted according to the model of the board to be tested so that it can be aligned with the fixing hole on the board to be tested. When adjusting the position of the positioning rod, it is only necessary to grasp the positioning rod, pull the insertion rod out of the slot, then pass the insertion rod through the through hole through the silicone pad, and insert it into the slot corresponding to the position of the fixing hole on the board to be tested. When the insertion rod is inserted again, the insertion rod can squeeze the clamping ring. When the insertion rod is fully inserted into the slot, the clamping ring is flush with the clamping slot. At this time, the clamping ring rebounds under the action of its own elasticity, and can be clamped into the clamping slot to limit the insertion rod, thereby fixing the insertion rod in the slot, and then aligning the fixing hole on the board to be tested with the positioning rod and placing it in the placement slot, the positioning rod can limit the position of the board to be tested, and the silicone pad can avoid excessive force when fixing the board to be tested and causing pressure loss. In summary, when in use, the position of the positioning rod can be adjusted according to the model of the board to be tested, so as to position boards of different models to be tested and avoid them from being subjected to pressure loss.

[0018] 2. Before placing the board to be tested, the present invention replaces the limit plate according to the model of the board to be tested, so that the positioning hole on the limit plate is consistent with the position of the positioning rod. When replacing the limit plate, first slide the dial block in the dial slot to pull the fixing card out of the installation slot, release the restriction on the installation bar, and then the limit plate can be pulled out from the base plate, and then the new limit plate can be installed in the base plate. When installing the limit plate, align the installation bar with the installation slot and insert it. The installation bar can be pressed into the fixing slot through the inclined surface of the fixing card, and the fixing spring is compressed. When the limit plate is fully inserted into the base plate, the fixing card is It can rebound into the installation groove under the action of the fixing spring to limit the installation bar, thereby fixing the limit plate. When placing the board to be tested, first lift the base plate on the support rod through the sliding hole to facilitate the placement of the board to be tested. After the placement is completed, release the base plate, and the base plate can automatically slide down under the action of gravity, and make the positioning rod pass through the positioning hole, so that the limit plate limits the board to be tested and the detection position of the board to be tested is exposed, which is convenient for its detection. In summary, when in use, the limit plate can be easily replaced to fix different types of boards to be tested.

[0019] 3. During detection, the present invention first closes the electromagnetic valve in the corresponding sleeve according to the detection position on the board to be tested, and then the lifting rod drives the detection board to descend. The airbag is stretched as the detection board descends, and the air in the sleeve above the non-detection area can be drawn into the airbag through the air cavity and the electromagnetic valve, thereby sucking the probe into the sleeve through negative pressure to avoid the probe from contacting the non-detection area of ​​the board to be tested. Since the electromagnetic valve of the sleeve above the detection area is closed, the probe will remain protruding outside the sleeve, and will contact the board to be tested as the detection board descends, thereby detecting it. When the probe contacts the board to be tested, as the probe is subjected to force, it can slide in the sleeve and compress the reset spring, so that the reset spring buffers the force applied to the probe, thereby avoiding the probe from being subjected to force. The pressure is too high and the probe is damaged. After the detection is completed, the solenoid valves are fully opened, and the lifting rod drives the detection plate to rise. The probe can be reset under the action of air pressure and reset spring. After the detection plate rises to its initial position, it continues to rise. The airbag is squeezed and the gas can be squeezed into the sleeve from the solenoid valve through the air cavity, so that the probe moves and the nozzle is opened. The air can leave the sleeve from the nozzle and form a fast airflow to blow the probe head, thereby cleaning the probe head. After cleaning, the lifting rod drives the detection plate to return to its initial position, which is convenient for the next detection. In summary, when using, the probe can be adjusted according to the model of the board to be tested, and the force on the probe can be buffered during detection to avoid damage to the probe, and the probe head can be cleaned after the detection is completed. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 This is a schematic diagram of the overall three-dimensional structure of an ICT test fixture of the present invention;

[0021] Figure 2 This is a schematic diagram of a half-cut three-dimensional exploded structure of a base of an ICT test fixture of the present invention;

[0022] Figure 3 This is a schematic diagram of the three-dimensional exploded structure of a substrate of an ICT test fixture of the present invention;

[0023] Figure 4 A schematic diagram of a cross-sectional top view of a substrate of an ICT test fixture of the present invention;

[0024] Figure 5 This is a schematic diagram of the overall cross-sectional front view structure of an ICT test fixture of the present invention;

[0025] Figure 6 It is a schematic diagram of the cross-sectional front view structure of a detection board of an ICT test fixture of the present invention;

[0026] Figure 7 It is a schematic diagram of the cross-sectional front view of a sleeve of an ICT test fixture of the present invention.

[0027] In the figure: 1. placement component; 101. base; 102. placement groove; 103. silicone pad; 104. through hole; 105. slot; 106. snap ring; 107. plug rod; 108. slot; 109. positioning rod; 2. support rod; 3. limit assembly; 301. base plate; 302. sliding hole; 303. mounting groove; 304. mounting strip; 305. limit plate; 306. positioning hole; 307. fixing groove; 308. shifting groove; 309. fixing spring; 310. fixing card; 311. shifting block; 4. top plate; 5. lifting rod; 6. detection component; 601. detection plate; 602. sleeve; 603. air bag; 604. air cavity; 605. solenoid valve; 606. nozzle; 607. reset spring; 608. probe. DETAILED DESCRIPTION

[0028] See also Figures 1 to 7 The present invention provides a technical solution: an ICT test fixture, including a placement component 1, the placement component 1 includes a base 101, a placement groove 102, a silicone pad 103, a through hole 104, a slot 105, a snap ring 106, an insertion rod 107, a slot 108 and a positioning rod 109, a placement groove 102 is arranged in the middle of the base 101, and a silicone pad 103 is arranged in the placement groove 102, a through hole 104 is opened on the surface of the silicone pad 103, a slot 105 is arranged below the placement groove 102, and a snap ring 106 is connected to the middle of the slot 105, a plug 107 is arranged in the slot 105, and a slot 108 is arranged on the outside of the plug 107, and a positioning rod 109 is connected to one end of the plug 107.

[0029] See also Figures 1 to 4The plug rod 107 is slidably connected to the base 101 through the slot 105, and the snap ring 106 is snap-connected to the plug rod 107 through the slot 108. The snap ring 106 is made of elastic rubber. The plug rod 107 passes through the silicone pad 103 through the through hole 104, and the diameter of the positioning rod 109 is smaller than the diameter of the plug rod 107. The four corners of the base 101 are symmetrically connected to the support rod 2, and a limit assembly 3 is set in the middle of the support rod 2. The limit assembly 3 includes a base plate 301 and a sliding hole 302, a base plate 301 is arranged in the middle of the support rod 2, and sliding holes 302 are symmetrically arranged at the four corners of the base plate 301, the base plate 301 is slidably connected to the support rod 2 through the sliding holes 302, and the base plate 301 is concave-shaped, the limiting assembly 3 also includes a mounting groove 303, a mounting strip 304, a limiting plate 305 and a positioning hole 306, the inner side of the base plate 301 is symmetrically provided with a mounting groove 303, and the mounting strip 304 is slidably connected in the mounting groove 303, and the mounting strip 304 is slidably connected in the mounting groove 303, and the mounting strip 304 is slidably connected in the mounting groove 303. 04, and the limiting plate 305 is connected between them, and the limiting plate 305 is symmetrically provided with positioning holes 306 at the four corners, the mounting strip 304 is engaged and connected with the base plate 301 through the mounting slot 303, the limiting assembly 3 also includes a fixing slot 307, a shifting slot 308, a fixing spring 309, a fixing card 310 and a shifting block 311, a fixing slot 307 is provided on one side of the mounting slot 303, and a shifting slot 308 is provided on one side of the fixing slot 307, a fixing spring 309 is connected in the fixing slot 307, and a fixing card 310 is connected at the other end of the fixing spring 309, and a shifting block 311 is connected at one side of the fixing card 310, the fixing card 310 is elastically connected to the fixing slot 307 through the fixing spring 309, and the fixing card 310 is engaged and slidably connected with the base plate 301 through the fixing slot 307, the end of the fixing card 310 away from the fixing spring 309 is located in the mounting slot 303, and the shifting block 311 is slidably connected with the base plate 301 through the shifting slot 308;

[0030] The specific operation is as follows. When in use, the position of the positioning rod 109 can be adjusted according to the model of the board to be tested so that it can be aligned with the fixing hole on the board to be tested. When adjusting the position of the positioning rod 109, just grab the positioning rod 109, pull the insertion rod 107 out of the slot 105, and then pass the insertion rod 107 through the through hole 104 through the silicone pad 103, and insert it into the slot 105 corresponding to the fixed hole position on the board to be tested. When the insertion rod 107 is inserted, the insertion rod 107 can squeeze the clamping ring 106. When the insertion rod 107 is fully inserted into the slot 105, the clamping ring 106 is flush with the clamping groove 108. At this time, the clamping ring 106 rebounds under the action of its own elasticity. , it can be inserted into the card slot 108 to limit the insertion rod 107, so that the insertion rod 107 is fixed in the slot 105, and then the fixing hole on the board to be tested is aligned with the positioning rod 109 and placed in the placement slot 102, the positioning rod 109 can limit the position of the board to be tested, and the silicone pad 103 can avoid excessive force when fixing the board to be tested and causing pressure loss. In summary, when in use, the position of the positioning rod 109 can be adjusted according to the model of the board to be tested, so as to position the boards to be tested of different models and avoid them from being subjected to pressure damage. Before placing the board to be tested, the limiting plate 305 is replaced according to the model of the board to be tested so that the limiting plate 305 can be replaced according to the model of the board to be tested. The positioning hole 306 on the plate 305 is consistent with the position of the positioning rod 109. When replacing the limit plate 305, first slide the push block 311 in the push slot 308 to pull the fixing card 310 out of the installation slot 303, release the restriction on the installation strip 304, and then the limit plate 305 can be pulled out from the base plate 301, and then the new limit plate 305 can be installed in the base plate 301. When installing the limit plate 305, align the installation strip 304 with the installation slot 303 and insert it. The installation strip 304 can be pressed into the fixing slot 307 through the inclined surface of the fixing card 310, and the fixing spring 309 is compressed. When the limit plate 305 is fully inserted into the base plate 301, the fixing card 310 can be The fixing spring 309 rebounds into the mounting groove 303 to restrict the mounting strip 304, thereby fixing the limiting plate 305. When placing the board to be tested, the base plate 301 is first raised on the support rod 2 through the sliding hole 302 to facilitate the placement of the board to be tested. After the placement is completed, the base plate 301 is released, and the base plate 301 can automatically slide down under the action of gravity, and the positioning rod 109 passes through the positioning hole 306, so that the limiting plate 305 restricts the board to be tested and exposes the detection position of the board to be tested, which is convenient for its detection. In summary, when in use, the limiting plate 305 can be easily replaced to fix different types of boards to be tested.

[0031] See also Figures 5 to 7, the upper end of the support rod 2 is connected to the top plate 4, and the center of the top plate 4 is connected to the lifting rod 5, the lower end of the lifting rod 5 is provided with a detection component 6, the detection component 6 includes a detection plate 601, a sleeve 602 and an airbag 603, two detection plates 601 are provided at the lower end of the lifting rod 5, and the sleeve 602 is connected between the detection plates 601, the side of the detection plate 601 close to the lifting rod 5 is connected to the airbag 603, and the airbag 603 is connected to the top plate 4, the airbag 603 is made of elastic material, the detection component 6 also includes an air cavity 604, a solenoid valve 605 and The detection plate 601 connected to the air bag 603 is provided with an air cavity 604 inside, and the sleeve 602 is provided with an electromagnetic valve 605 near the air cavity 604, and the end of the sleeve 602 away from the control valve is provided with a nozzle 606, and the detection component 6 also includes a reset spring 607 and a probe 608, the sleeve 602 is connected with the reset spring 607, and the other end of the reset spring 607 is connected with the probe 608, the probe 608 is elastically connected to the sleeve 602 through the reset spring 607, and the probe 608 is slidably connected to the sleeve 602;

[0032] The specific operation is as follows. During the detection, the electromagnetic valve 605 in the corresponding sleeve 602 is first closed according to the detection position on the board to be tested, and then the lifting rod 5 drives the detection plate 601 to descend. The airbag 603 is stretched as the detection plate 601 descends, and the air in the sleeve 602 above the non-detection area can be sucked into the airbag 603 through the air cavity 604 and the electromagnetic valve 605, so that the probe 608 is sucked into the sleeve 602 through the negative pressure to prevent the probe 608 from contacting the non-detection area of ​​the board to be tested. Since the electromagnetic valve 605 is closed, the sleeve 602 above the detection area will remain protruding from the outside of the sleeve 602, and will contact the board to be tested as the detection plate 601 descends, thereby detecting it. When the probe 608 contacts the board to be tested, as the probe 608 is subjected to force, it can slide in the sleeve 602 and compress the reset spring 607, so that the reset spring 607 buffers the force applied to the probe 608, avoiding The probe 608 is damaged due to excessive pressure. After the detection is completed, the solenoid valve 605 is fully opened, and the lifting rod 5 drives the detection plate 601 to rise. The probe 608 can be reset under the action of air pressure and the reset spring 607. After the detection plate 601 rises to the initial position, it continues to rise. The airbag 603 is squeezed and the gas can be squeezed from the solenoid valve 605 into the sleeve 602 through the air cavity 604, so that the probe 608 moves and the nozzle 606 is opened. The air can leave the sleeve 602 from the nozzle 606 and form a fast airflow to blow the head of the probe 608, thereby cleaning the head of the probe 608. After cleaning, the lifting rod 5 drives the detection plate 601 to restore the initial position to facilitate the next detection. In summary, when in use, the probe 608 can be adjusted according to the model of the board to be tested, and the force on the probe 608 can be buffered during the detection to avoid damage to the probe 608, and the head of the probe 608 can be cleaned after the detection is completed.

[0033] In summary, when using this ICT test fixture, first adjust the position of the positioning rod 109 according to the model of the board to be tested so that it can be aligned with the fixing hole on the board to be tested. When adjusting the position of the positioning rod 109, just grab the positioning rod 109, pull the insertion rod 107 out of the slot 105, and then pass the insertion rod 107 through the through hole 104 through the silicone pad 103, and insert it into the slot 105 corresponding to the fixed hole position on the board to be tested. When the insertion rod 107 is inserted, the insertion rod 107 can squeeze the retaining ring 106. When the insertion rod 107 is fully inserted into the slot 105, the retaining ring 106 is flush with the slot 108. At this time, the retaining ring 106 rebounds under the action of its own elasticity, and can be clamped into the slot 108 to restrict the insertion rod 107, thereby The insert rod 107 is fixed in the slot 105, and then the fixing hole on the board to be tested is aligned with the positioning rod 109 and placed in the placement slot 102. The positioning rod 109 can limit the position of the board to be tested, and the silicone pad 103 can avoid excessive force when fixing the board to be tested and causing pressure loss. When adjusting the position of the positioning rod 109, the limit plate 305 can be replaced synchronously to make the positioning hole 306 on the limit plate 305 consistent with the position of the positioning rod 109. When replacing the limit plate 305, first slide the dial block 311 in the dial slot 308, pull the fixing card 310 out of the installation slot 303, release the restriction on the installation strip 304, and then the limit plate 305 can be pulled out from the base plate 301, and then the new limit plate 305 can be installed in the base plate 3 01, when installing the limit plate 305, align the installation strip 304 with the installation slot 303 and insert it. The installation strip 304 can be pressed into the fixing slot 307 through the inclined surface of the fixing card 310, and the fixing spring 309 is compressed. When the limit plate 305 is fully inserted into the base plate 301, the fixing card 310 can rebound into the installation slot 303 under the action of the fixing spring 309, and limit the installation strip 304, thereby fixing the limit plate 305. When placing the board to be tested, first lift the base plate 301 on the support rod 2 through the sliding hole 302 to facilitate the placement of the board to be tested. After the placement is completed, release the base plate 301, and the base plate 301 can automatically slide down under the action of gravity, and allow the positioning rod 109 to pass through the positioning hole 306, so that the limit plate 305 is positioned to the board to be tested. The test plate is restricted and the detection position of the board to be tested is exposed to facilitate its detection. During the detection, the electromagnetic valve 605 in the corresponding sleeve 602 is closed according to the detection position on the board to be tested, and then the lifting rod 5 drives the detection plate 601 to descend. The airbag 603 is stretched as the detection plate 601 descends, and the air in the sleeve 602 above the non-detection area can be drawn into the airbag 603 through the air cavity 604 and the electromagnetic valve 605, so that the probe 608 is sucked into the sleeve 602 through the negative pressure to prevent the probe 608 from contacting the non-detection area of ​​the board to be tested. Since the electromagnetic valve 605 of the sleeve 602 above the detection area is closed, the probe 608 will remain protruding from the outside of the sleeve 602, and contact the board to be tested as the detection plate 601 descends.Thus, the probe 608 can be inspected, and when the probe 608 contacts the board to be tested, as the probe 608 is stressed, it can slide in the sleeve 602 and compress the reset spring 607, so that the reset spring 607 buffers the stress on the probe 608, and prevents the probe 608 from being damaged due to excessive pressure. After the inspection is completed, the solenoid valve 605 is fully opened, and the lifting rod 5 drives the inspection plate 601 to rise, and the probe 608 can be reset under the action of air pressure and the reset spring 607. After the inspection plate 601 rises to the initial position and continues to rise, the airbag 603 is squeezed and the gas can be squeezed from the solenoid valve 605 into the sleeve 602 through the air cavity 604, so that the probe 608 moves and the nozzle 606 is opened, and the air can leave the sleeve 602 from the nozzle 606, and form a fast airflow to blow the head of the probe 608, so as to clean the head of the probe 608. After the cleaning is completed, the lifting rod 5 drives the inspection plate 601 to return to the initial position, which is convenient for the next inspection.

[0034] The embodiments of the present invention are given for the purpose of illustration and description, and are not intended to be exhaustive or to limit the invention to the disclosed forms. Many modifications and variations will be apparent to those of ordinary skill in the art. The embodiments are selected and described in order to better illustrate the principles and practical applications of the present invention and to enable those of ordinary skill in the art to understand the present invention and thereby design various embodiments with various modifications suitable for specific uses.

Claims

1. An ICT test fixture, characterized in that: The invention comprises a placement component (1), wherein the placement component (1) comprises a base (101), a placement groove (102), a silicone pad (103), a through hole (104), a slot (105), a snap ring (106), an insertion rod (107), a slot (108) and a positioning rod (109). The base (101) is provided with a placement groove (102) in the middle, and a silicone pad (103) is provided in the placement groove (102). A through hole (104) is provided on the surface of the silicone pad (103). A slot (105) is provided below the placement groove (102), and a snap ring (106) is connected to the middle of the slot (105). An insertion rod (107) is provided in the slot (105), and a slot (108) is provided on the outside of the insertion rod (107). One end of the insertion rod (107) is connected to the positioning rod (109).

2. The ICT test fixture according to claim 1, characterized in that: The insertion rod (107) is slidably connected to the base (101) via the slot (105), and the snap ring (106) is snap-connected to the insertion rod (107) via the slot (108); the snap ring (106) is made of elastic rubber; the insertion rod (107) passes through the silicone pad (103) via the through hole (104), and the diameter of the positioning rod (109) is smaller than the diameter of the insertion rod (107).

3. The ICT test fixture according to claim 1, characterized in that: The base (101) is symmetrically connected to the support rod (2) at four corners, and a limit assembly (3) is arranged in the middle of the support rod (2), the limit assembly (3) comprises a base plate (301) and a sliding hole (302), the base plate (301) is arranged in the middle of the support rod (2), and the sliding holes (302) are symmetrically arranged at the four corners of the base plate (301), the base plate (301) is slidably connected to the support rod (2) through the sliding holes (302), and the base plate (301) is concave in shape.

4. The ICT test fixture according to claim 3, characterized in that: The limiting assembly (3) further comprises a mounting groove (303), a mounting strip (304), a limiting plate (305) and a positioning hole (306); the mounting groove (303) is symmetrically provided on the inner side of the base plate (301); the mounting strip (304) is slidably connected in the mounting groove (303); the limiting plate (305) is connected between the mounting strips (304); the positioning holes (306) are symmetrically provided at the four corners of the limiting plate (305); the mounting strip (304) is snap-fitted and connected to the base plate (301) via the mounting groove (303).

5. The ICT test fixture according to claim 4, characterized in that: The limiting assembly (3) further comprises a fixing groove (307), a shifting groove (308), a fixing spring (309), a fixing card (310) and a shifting block (311); a fixing groove (307) is provided on one side of the installation groove (303); a shifting groove (308) is provided on one side of the fixing groove (307); a fixing spring (309) is connected inside the fixing groove (307); a fixing card (310) is connected to the other end of the fixing spring (309); and a shifting block (311) is connected to one side of the fixing card (310).

6. The ICT test fixture according to claim 5, characterized in that: The fixing card (310) is elastically connected to the fixing groove (307) via a fixing spring (309), and the fixing card (310) is slidably connected to the base plate (301) via the fixing groove (307), one end of the fixing card (310) away from the fixing spring (309) is located in the installation groove (303), and the shifting block (311) is slidably connected to the base plate (301) via the shifting groove (308).

7. The ICT test fixture according to claim 3, characterized in that: The upper end of the support rod (2) is connected to a top plate (4), and the center of the top plate (4) is connected to a lifting rod (5), and the lower end of the lifting rod (5) is provided with a detection component (6).

8. The ICT test fixture according to claim 7, characterized in that: The detection assembly (6) comprises a detection plate (601), a sleeve (602) and an airbag (603); two detection plates (601) are arranged at the lower end of the lifting rod (5); the sleeve (602) is connected between the detection plates (601); the airbag (603) is connected to one side of the detection plate (601) close to the lifting rod (5); the airbag (603) is connected to the top plate (4); and the airbag (603) is made of elastic material.

9. The ICT test fixture according to claim 8, characterized in that: The detection component (6) also includes an air cavity (604), an electromagnetic valve (605) and a nozzle (606); the air cavity (604) is arranged inside the detection plate (601) connected to the air bag (603); the electromagnetic valve (605) is arranged near the air cavity (604) of the sleeve (602); and the nozzle (606) is arranged at one end of the sleeve (602) away from the control valve.

10. The ICT test fixture according to claim 8, characterized in that: The detection assembly (6) further comprises a reset spring (607) and a probe (608); the reset spring (607) is connected inside the sleeve (602), and the other end of the reset spring (607) is connected to the probe (608); the probe (608) is elastically connected to the sleeve (602) via the reset spring (607), and the probe (608) is slidably connected to the sleeve (602).