High-performance multichannel NTC temperature sensor reaction time tester

Abstract

The invention relates to a high-performance multichannel NTC (Negative Temperature Coefficient) temperature sensor reaction time tester, and aims to solve the problems of low testing efficiency and the like in NTC temperature sensor testing in the prior art. The tester comprises a multi-channel NTC temperature sensor interface, a single-chip microcomputer control unit, a touch screen interface, a power supply circuit, an indicating lamp, a buzzer and the like. Through the multi-channel interface, the tester can be connected with and test a plurality of NTC temperature sensors at the same time, and the test efficiency is remarkably improved. The single-chip microcomputer control unit adopts a high-precision algorithm to process sensor data, so that the accuracy of a test result is ensured. The touch screen interface provides a visual and easy-to-use user interface, so that a user can easily set test parameters, check test results and know the detection state of the sensor in real time. And the indicating lamp and the buzzer provide visual and auditory feedback, so that the user experience is further enhanced.

Description

Technical Field

[0001] The invention relates to the technical field of NTC temperature sensor testing, in particular to a high-performance multi-channel NTC temperature sensor reaction time tester. Background Art

[0002] With the rapid development of modern industry and technology, temperature sensors are an important part of industrial automation, environmental monitoring, medical equipment and other fields, and their performance and testing methods are increasingly valued. As a common thermistor temperature sensor, NTC (Negative Temperature Coefficient) temperature sensor is widely used in various temperature measurement and control systems due to its fast response speed, high sensitivity and affordable price.

[0003] However, there are still some urgent problems to be solved in the current NTC temperature sensor testing technology. Most traditional testing methods use single-channel test equipment, which can only test one sensor at a time. This is not only inefficient, but also cannot meet the needs of fast testing on large-scale sensor networks or production lines. In addition, traditional test equipment often uses relatively simple algorithms in data processing, resulting in the accuracy of test results that needs to be improved.

[0004] In order to solve the above problems, it is necessary to develop a high-performance, multi-channel, easy-to-operate NTC temperature sensor reaction time tester that can provide accurate test results. Summary of the invention

[0005] In order to solve the problems of the prior art, the present invention provides a high-performance multi-channel NTC temperature sensor reaction time tester. The tester should have multi-channel testing capabilities, be able to test multiple sensors at the same time, and improve testing efficiency; at the same time, use high-precision algorithms to process sensor data to ensure the accuracy of test results; in addition, it should also provide an intuitive and easy-to-use user interface and interactive experience, so that users can easily set test parameters, view test results, and understand the detection status of the sensor in real time.

[0006] In order to solve the above technical problems, the present invention is implemented by the following technical solutions: a high-performance multi-channel NTC temperature sensor reaction time tester, comprising:

[0007] Multi-channel NTC temperature sensor interface, used to connect NTC temperature sensor for testing;

[0008] A single-chip control unit, used to receive digital signals and calculate the current temperature;

[0009] HMI touch screen interface, used to connect to the HMI touch screen to display user input and display test results;

[0010] The power supply circuit provides power to the microcontroller control unit;

[0011] Indicator light, used to display the detection status of the NTC temperature sensor;

[0012] Buzzer, used to respond to the detection status of the NTC temperature sensor.

[0013] In this embodiment, the preparation stage:

[0014] Make sure the high performance multi-channel NTC temperature sensor reaction time tester is properly connected to the power supply and is in standby mode.

[0015] Connect the NTC temperature sensor to be tested to the tester through the multi-channel NTC temperature sensor interface. The tester should support parallel connection of multiple sensors so that multiple sensors can be tested simultaneously.

[0016] Setting stage: Enter the setting interface of the tester through the HMI touch screen connected through the HMI touch screen interface.

[0017] In the setting interface, set the corresponding parameters according to the test requirements, such as test temperature range, test time interval, alarm threshold, etc.

[0018] After confirming that the settings are correct, save and exit the settings interface and return to the main test interface.

[0019] Testing phase: In the main test interface, click the Start Test button and the tester will start working.

[0020] The MCU control unit will receive the digital signal from the NTC temperature sensor and calculate the current temperature according to the preset algorithm.

[0021] The HMI touch screen will display key information such as the current temperature and test time of each sensor in real time.

[0022] The indicator light will light up or go out according to the detection status of the sensor to intuitively display the status of the sensor (such as normal, abnormal, etc.).

[0023] If the temperature of the sensor exceeds the preset alarm threshold, the buzzer will sound an alarm to alert the operator.

[0024] Result analysis phase: After the test is completed, the HMI touch screen will display the test results of each sensor, including statistical information such as maximum temperature, minimum temperature, and average temperature.

[0025] Operators can evaluate the performance of the sensor based on the test results to determine whether it meets the usage requirements.

[0026] In a specific implementation, the multi-channel NTC temperature sensor interface supports parallel detection of at least five sensors. Compared with traditional equipment that can only detect one NTC temperature sensor at a time, the device effectively improves the testing efficiency of the product.

[0027] In a specific implementation, the single chip microcomputer program adopts a modular design to support detection of multiple sensor types, and the user can change the detection parameters through the HMI touch screen.

[0028] In a specific implementation, the single-chip microcomputer control unit, the multi-channel NTC temperature sensor interface, the HMI touch screen interface and the power supply circuit are integrated into an MCU main control board for easy assembly and use.

[0029] In a specific implementation, the MCU main control board, the HMI touch screen, the indicator light and the buzzer are installed inside the housing to fix the positions of the components.

[0030] In a specific implementation, the MCU main control board is configured as a detachable structure, and is used to install an adapted MCU main control board for performing detection operations for different types of sensors.

[0031] The beneficial effects of the present invention are:

[0032] 1. The present invention can connect and test multiple sensors at the same time by designing a multi-channel NTC temperature sensor interface, thereby greatly shortening the test cycle and improving the test efficiency. This is undoubtedly a huge advantage for application scenarios that require a large number of sensor tests; the single-chip control unit uses a high-precision algorithm to process the digital signal from the sensor, which can accurately calculate the current temperature and monitor the sensor's response time in real time. This high-precision data processing capability ensures the accuracy of the test results and provides a reliable basis for subsequent sensor performance evaluation;

[0033] 2. The introduction of the touch screen interface enables users to intuitively set test parameters, view test results, and understand the detection status of the sensor in real time. This user-friendly design greatly reduces the difficulty of operation and improves the user experience. At the same time, the settings of indicator lights and buzzers also provide users with intuitive visual and auditory feedback, further enhancing the user experience; since this tester can test multiple sensors at the same time, it can significantly reduce the number of test equipment, thereby reducing testing costs. In addition, the high accuracy and stability of the tester also reduce the cost of repeated testing caused by inaccurate testing;

[0034] 3. This tester supports the detection of multiple sensor types, and users can easily change the detection parameters through the touch screen to adapt to different test requirements. This flexibility enables the tester to be widely used in various fields to meet the test needs in different scenarios. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 It is a schematic diagram of the system structure of the present invention.

[0036] Figure 2 It is a schematic diagram of the single chip microcomputer programming flow of the present invention.

[0037] Figure 3 It is a schematic diagram of the principle of the single chip microcomputer of the present invention.

[0038] Figure 4 It is a schematic diagram of the power supply circuit principle of the present invention.

[0039] Figure 5 It is a schematic diagram of the front structure of the circuit board of the present invention.

[0040] Figure 6 It is a schematic diagram of the back structure of the circuit board of the present invention.

[0041] Figure 7 It is a schematic diagram of the housing installation structure of the present invention.

[0042] Figures 1 to 7 In: 1. MCU main control board; 2. Power module; 3. NTC temperature sensor; 4. HMI touch screen; 5. Buzzer; 6. Indicator light; 7. Housing. DETAILED DESCRIPTION

[0043] The following will be combined with the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0044] like Figures 1 to 7 A high-performance multi-channel NTC temperature sensor reaction time tester shown includes: a multi-channel NTC temperature sensor interface for connecting the NTC temperature sensor for testing; a single-chip microcomputer control unit for receiving digital signals and calculating the current temperature; an HMI touch screen interface for connecting the HMI touch screen to display user input and display test results; a power supply circuit for providing power to the single-chip microcomputer control unit; an indicator light for displaying the detection status of the NTC temperature sensor; and a buzzer for responding to the detection status of the NTC temperature sensor.

[0045] In this embodiment: the working principle of the high-performance multi-channel NTC temperature sensor response time tester is mainly based on the characteristics of the NTC temperature sensor and the data processing capability of the single-chip control unit.

[0046] NTC temperature sensor features:

[0047] NTC (Negative Temperature Coefficient) temperature sensor is a thermistor whose resistance decreases as the temperature increases.

[0048] When the temperature changes, the resistance value of the NTC temperature sensor changes accordingly, thereby changing the current or voltage in the circuit.

[0049] By measuring the change in current or voltage in the circuit, the change in temperature can be measured indirectly.

[0050] MCU control unit data processing:

[0051] The microcontroller control unit receives a digital signal from the NTC temperature sensor (usually by converting the analog signal into a digital signal through an ADC analog-to-digital converter).

[0052] According to the preset algorithm, the single chip control unit converts the digital signal into the corresponding temperature value.

[0053] The microcontroller control unit is also responsible for real-time processing of data from multiple sensors to ensure that the data from each sensor can be collected and processed accurately and in a timely manner.

[0054] HMI touch screen display and interaction: The HMI touch screen interface is used to connect the HMI touch screen to realize the interaction between the user and the tester.

[0055] The HMI touch screen can display key information such as setting parameters and test results input by the user.

[0056] The user can set up the tester, start testing, and perform other operations through the HMI touch screen.

[0057] Indicator light and buzzer feedback:

[0058] The indicator light is used to visually display the detection status of the NTC temperature sensor.

[0059] The buzzer is used to sound an alarm in certain situations (such as when the temperature exceeds the alarm threshold) to alert the operator.

[0060] In summary, the high-performance multi-channel NTC temperature sensor reaction time tester combines the characteristics of NTC temperature sensors, the data processing capabilities of the MCU control unit, and the interactive functions of the HMI touch screen to achieve fast and accurate testing of multiple NTC temperature sensors.

[0061] The multi-channel NTC temperature sensor interface supports parallel detection of at least 5 sensors. The MCU program adopts a modular design and supports the detection of multiple sensor types. Users can change the detection parameters through the HMI touch screen. The MCU control unit, multi-channel NTC temperature sensor interface, HMI touch screen interface and power supply circuit are integrated into the MCU main control board for easy assembly and use. The MCU main control board, HMI touch screen, indicator light and buzzer are installed inside the shell to fix the positions of each component. The MCU main control board is set as a detachable structure, which is used to install an adapted MCU main control board for detection operations for different types of sensors.

[0062] In summary, the high-performance multi-channel NTC temperature sensor reaction time tester is a comprehensive test equipment that integrates multiple functions such as multi-channel test interface, single-chip control unit, HMI touch screen display and interaction, power circuit, indicator light and buzzer feedback, etc. Its operation process includes preparation stage, setting stage, test stage and result analysis stage, through which multiple NTC temperature sensors can be tested quickly and accurately.

[0063] In principle, the tester uses the thermistor characteristics of the NTC temperature sensor to indirectly measure the temperature change by measuring the current or voltage change in the circuit. The MCU control unit receives the digital signal from the sensor and converts it into the corresponding temperature value according to the preset algorithm. At the same time, the MCU is also responsible for real-time processing of data from multiple sensors to ensure the accuracy and timeliness of the test. The HMI touch screen interface provides an interactive interface between the user and the tester, allowing the user to easily set test parameters, view test results, etc. The indicator light and buzzer provide intuitive visual and auditory feedback to help operators quickly understand the detection status of the sensor.

[0064] Therefore, the tester has the advantages of high test efficiency, accurate test results, and easy operation, and is suitable for occasions where multiple NTC temperature sensors need to be tested quickly and accurately.

[0065] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A high performance multi-channel NTC temperature sensor response time tester, It is characterized in that include: Multi-channel NTC temperature sensor interface, used to connect NTC temperature sensor for testing; A single-chip control unit, used to receive digital signals and calculate the current temperature; HMI touch screen interface, used to connect to the HMI touch screen to display user input and display test results; The power supply circuit provides power to the microcontroller control unit; Indicator light, used to display the detection status of the NTC temperature sensor; Buzzer, used to respond to the detection status of the NTC temperature sensor.

2. A high performance multi-channel NTC temperature sensor reaction time tester according to claim 1, Features: The multi-channel NTC temperature sensor interface supports parallel detection of at least 5 sensors.

3. A high performance multi-channel NTC temperature sensor reaction time tester according to claim 1, Features: The MCU program adopts a modular design and supports detection of multiple sensor types. Users can change the detection parameters through the HMI touch screen.

4. A high performance multi-channel NTC temperature sensor reaction time tester according to claim 1, Features: The single-chip microcomputer control unit, the multi-channel NTC temperature sensor interface, the HMI touch screen interface and the power supply circuit are integrated into an MCU main control board, which is easy to assemble and use.

5. A high performance multi-channel NTC temperature sensor reaction time tester according to claim 4, Features: The MCU main control board, HMI touch screen, indicator light and buzzer are installed inside the shell to fix the positions of the components.

6. A high performance multi-channel NTC temperature sensor reaction time tester according to claim 5, Features: The MCU main control board is configured as a detachable structure, and is used to install an adapted MCU main control board for different types of sensors to perform detection operations.

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