Chip test data analysis chart determination method and device, electronic equipment and medium

Abstract

The invention provides a chip test data analysis chart determination method and device, electronic equipment and a medium, and the method is applied to chip post-silicon verification equipment, and comprises the steps: obtaining to-be-processed chip test data in response to a click operation for an analysis chart configuration interface; responding to the selection operation, and skipping to a statistical rule configuration interface of the target chart type; responding to selection operation of test items, test conditions and aggregation operation modes and input operation of a test condition range screening expression, and generating a statistical rule in the target chart type chart; and skipping back to the analysis chart configuration interface, responding to the click operation, and determining a chip test data analysis chart of the target chart type of the to-be-processed chip test data based on the to-be-processed chip test data and the statistical rule. Therefore, the chip test data analysis chart is automatically generated based on the statistical rule automatically generated by user configuration, the generation efficiency of the chip test data analysis chart is improved, and then the statistical analysis efficiency of the chip test result is improved.

Description

Technical Field

[0001] The present application relates to the field of semiconductor testing technology, and in particular to a method, device, electronic device and medium for determining a chip test data analysis chart. Background Art

[0002] Statistical analysis of chip test results is the process of organizing, analyzing and interpreting chip test data. Statistical analysis of chip test results helps to understand the performance, stability and possible problems of the chip, and can make decisions or improvements on chip production and optimization based on the statistical analysis results. It is crucial to ensure chip quality, diagnose problems, optimize performance and support decision-making.

[0003] The existing statistical analysis of chip test results requires manual copying of the original chip test data into Excel, manual writing of formulas and rules in Excel to calculate the required statistical results and generate tables, and then use of the chart function in Excel to draw scatter plots to obtain chip test data analysis charts to determine whether the chip is qualified. Since different test conditions and statistical methods require different formulas and rules to be written, each time a batch of chips is tested, it is necessary to manually copy the chip test data and reset the formulas and rules. Manual operation to draw chip test data analysis charts is labor-intensive, time-consuming, and prone to errors. The generation efficiency of chip test data analysis charts is low, which in turn leads to low efficiency in the statistical analysis of chip test results. Summary of the invention

[0004] In view of this, the embodiments of the present application at least provide a method, device, electronic device and medium for determining a chip test data analysis chart, which automatically generates a chip test data analysis chart based on statistical rules automatically generated by user configuration, thereby improving the efficiency of generating chip test data analysis charts and further improving the efficiency of statistical analysis of chip test results.

[0005] This application mainly includes the following aspects:

[0006] In a first aspect, an embodiment of the present application provides a method for determining a chip test data analysis chart, which is applied to a chip post-silicon verification device, and the method includes:

[0007] In response to a user clicking a test data acquisition button in a chip test data analysis chart configuration interface, the chip test data to be processed is acquired;

[0008] In response to the user's selection operation of a chart type in the chip test data analysis chart configuration interface, jump to a statistical rule configuration interface of a target chart type; the target chart type includes at least one of a cross table and a scatter plot;

[0009] In response to the user's selection operation of the test items, test conditions, and aggregation operation mode of the chip test data to be processed in the statistical rule configuration interface of the target chart type, and the input operation of the test condition range screening expression, the statistical rules of the chip test data to be processed in the chart of the target chart type are generated;

[0010] Jump back to the chip test data analysis chart configuration interface, respond to the user's click operation on the chart generation button in the chip test data analysis chart configuration interface, and determine the chip test data analysis chart of the target chart type of the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in the chart of the target chart type.

[0011] In a second aspect, an embodiment of the present application further provides a chip test data analysis chart determination device, which is applied to a chip post-silicon verification device, and the chip test data analysis chart determination device includes:

[0012] The data acquisition module is used to respond to the user's click operation on the test data acquisition button in the chip test data analysis chart configuration interface to acquire the chip test data to be processed;

[0013] A chart selection module, for responding to a user's selection operation of a chart type in the chip test data analysis chart configuration interface, and jumping to a statistical rule configuration interface of a target chart type; the target chart type includes at least one of a cross table and a scatter plot;

[0014] A rule generation module, for responding to a user's selection operation of a test item, a test condition, an aggregation operation mode, and an input operation of a test condition range screening expression for the chip test data to be processed in a statistical rule configuration interface of the target chart type, and generating statistical rules for the chip test data to be processed in a chart of the target chart type;

[0015] A chart determination module is used to jump back to the chip test data analysis chart configuration interface, respond to the user's click operation on the chart generation button in the chip test data analysis chart configuration interface, and determine the chip test data analysis chart of the target chart type of the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in the chart of the target chart type.

[0016] In a third aspect, an embodiment of the present application further provides an electronic device, comprising: a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate through the bus, and the machine-readable instructions are executed by the processor to execute the steps of the chip test data analysis chart determination method as described above.

[0017] In a fourth aspect, an embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the chip test data analysis chart determination method as described above are executed.

[0018] The test data analysis chart determination method, device, electronic device and medium provided in the embodiments of the present application, wherein the method is applied to chip post-silicon verification equipment, including: in response to a user clicking a test data acquisition button in a chip test data analysis chart configuration interface, acquiring chip test data to be processed; in response to a user selecting a chart type in the chip test data analysis chart configuration interface, jumping to a statistical rule configuration interface of a target chart type; the target chart type includes at least one of a cross table and a scatter plot; in response to a user selecting a test item, a test condition, an aggregation operation method and an inputting operation of a test condition range screening expression for the chip test data to be processed in the statistical rule configuration interface of the target chart type, generating statistical rules for the chip test data to be processed in a chart of the target chart type; jumping back to the chip test data analysis chart configuration interface, in response to a user clicking a chart generation button in the chip test data analysis chart configuration interface, determining a chip test data analysis chart of the target chart type for the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in the chart of the target chart type. In this way, chip test data analysis charts are automatically generated based on the statistical rules automatically generated based on user configuration, which improves the efficiency of generating chip test data analysis charts, and further improves the efficiency of statistical analysis of chip test results.

[0019] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0021] Figure 1 A flow chart showing a method for determining a chip test data analysis chart provided in an embodiment of the present application is shown;

[0022] Figure 2 A schematic diagram of a field adding interface in an embodiment of the present application is shown;

[0023] Figure 3 A schematic diagram of a cross-tabulation statistical rule configuration interface in an embodiment of the present application is shown;

[0024] Figure 4 A schematic diagram showing a cross table of chip test data to be processed in an embodiment of the present application is shown;

[0025] Figure 5 A schematic diagram of a scatter plot statistical rule configuration interface in an embodiment of the present application is shown;

[0026] Figure 6 A schematic diagram showing a scatter plot of chip test data to be processed in an embodiment of the present application;

[0027] Figure 7 The overall flow chart of the chip test data analysis chart determination method provided in the embodiment of the present application is shown;

[0028] Figure 8 One of the functional module diagrams of a chip test data analysis chart determination device provided in an embodiment of the present application is shown;

[0029] Fig. 9 A second functional module diagram of a device for determining a chip test data analysis chart provided in an embodiment of the present application is shown;

[0030] Fig.10 A schematic structural diagram of an electronic device provided in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0031] In order to make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. The components of the embodiments of the present application usually described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.

[0032] In order to enable those skilled in the art to use the content of this application, the following implementation is provided in conjunction with a specific application scenario "statistical analysis of chip test data in a post-silicon laboratory". For those skilled in the art, the general principles defined herein can be applied to other embodiments and application scenarios without departing from the spirit and scope of this application. Although this application is mainly described around "statistical analysis of chip test data in a post-silicon laboratory", it should be understood that this is only an exemplary embodiment.

[0033] In the actual chip production process in the field of semiconductor testing technology, companies need to perform statistical analysis on chip test data after chip testing in the post-silicon laboratory. For example, to determine whether a chip is qualified, it is necessary to count the minimum and maximum jitter ranges of the same chip under the same conditions, as well as the maximum and minimum values ​​and other statistical information.

[0034] At present, most semiconductor companies save chip test data as files, such as Standard Test Data Format (STDF), character-separated values ​​(CSV) or Excel format. However, these data usually only contain raw test data such as test item data, test condition data, and chip test data of the test item under test conditions. Therefore, companies usually copy the raw test data into Microsoft Excel software, use Excel formulas to calculate the required statistical results, and then use Excel's chart function to draw a scatter plot, also known as an XY chart, to analyze the statistical results and scatter plots to determine whether the chip is qualified. Although this method can achieve the purpose, using Excel for statistical analysis requires users to have certain skills, and different formulas and rules may need to be written for different test conditions and statistical methods, which increases the time and workload of data processing; in addition, each time a batch of chips is tested, the data needs to be manually copied and the formulas need to be reset, which is prone to errors and inconsistencies. Therefore, the generation efficiency of chip test data analysis charts is low, which in turn leads to low efficiency in statistical analysis of chip test results.

[0035] In view of this, an embodiment of the present application provides a chip test data analysis chart determination method, which is applied to chip post-silicon verification equipment. Its basic principle is: in response to a user's click operation on a test data acquisition button in a chip test data analysis chart configuration interface, obtain the chip test data to be processed; in response to a user's selection operation on a chart type in the chip test data analysis chart configuration interface, jump to the statistical rule configuration interface of a target chart type; the target chart type includes at least one of a cross table and a scatter plot; in response to a user's selection operation on a test item, a test condition, an aggregation operation method for the chip test data to be processed in the statistical rule configuration interface of the target chart type, and an input operation on a test condition range screening expression, generate statistical rules for the chip test data to be processed in a chart of the target chart type; jump back to the chip test data analysis chart configuration interface, respond to a user's click operation on a chart generation button in the chip test data analysis chart configuration interface, and determine a chip test data analysis chart of the target chart type for the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in the chart of the target chart type. In this way, chip test data analysis charts are automatically generated based on the statistical rules automatically generated based on user configuration, which improves the efficiency of generating chip test data analysis charts, and further improves the efficiency of statistical analysis of chip test results.

[0036] The following is a detailed description of a chip test data analysis chart determination method provided in an embodiment of the present application. Figure 1 , Figure 1 The present invention provides a flowchart of a chip test data analysis chart determination method provided in an embodiment of the present invention, and the chip test data analysis chart determination method is applied to chip post-silicon verification equipment. Figure 1 As shown, the chip test data analysis chart determination method provided in the embodiment of the present application includes the following steps:

[0037] S101, in response to a user clicking a test data acquisition button in a chip test data analysis chart configuration interface, to acquire chip test data to be processed.

[0038] In the embodiment of the present application, the post-silicon validation device is a device for debugging the manufactured chips in the laboratory, which is used to locate some errors that are not found in the traditional pre-silicon validation (Pre-Silicon Validation) stage, such as simulation verification, formal verification, Universal Verification Methodology (UVM), etc., as well as some errors introduced in the chip manufacturing process. The post-silicon validation device can be a personal computer (PC), an industrial control computer or an embedded computer, etc., which is not specifically limited here. The embodiment of the present application is equipped with a set of user-friendly configuration interfaces in the post-silicon validation device, so that the user can configure the chip test data analysis charts in these configuration interfaces through the post-silicon validation device.

[0039] In this step, the user clicks the test data acquisition button in the chip test data analysis chart configuration interface, and the post-silicon verification device responds to the click operation on the test data acquisition button to obtain the chip test data to be processed from the target database; wherein the target database is a temporary database for temporarily storing the chip test data to be processed, and after the chip test data analysis chart of the chip test data to be processed is generated, the chip test data to be processed is deleted from the target database.

[0040] S102: In response to the user's selection operation on the chart type in the chip test data analysis chart configuration interface, jump to the statistical rule configuration interface of the target chart type; the target chart type includes at least one of a cross table and a scatter plot.

[0041] In this step, the user selects the target chart type of the test data analysis chart to be generated in the chip test data analysis chart configuration interface. In the embodiment of the present application, the target chart type includes at least one of a cross table and a scatter plot. Specifically, a cross table or a scatter plot or both can be selected in the form. The post-silicon verification device responds to the selection operation for the target chart type and jumps to the statistical rule configuration interface of the target chart type, so that the user can configure the statistical rules in the target chart type chart in the statistical rule interface.

[0042] S103: In response to the user's selection operation of test items, test conditions, and aggregation operation methods for the chip test data to be processed in the statistical rule configuration interface of the target chart type, and the input operation of the test condition range screening expression, statistical rules for the chip test data to be processed in the chart of the target chart type are generated.

[0043] In this step, the user selects the test items, test conditions and aggregation operation methods in the test data to be processed that he wants to analyze statistically in the statistical rule configuration interface of the target chart type after the jump, and enters the test condition range screening expression in the statistical rule configuration interface of the target chart type after the jump. The post-silicon verification device responds to the selection operation of the test items, test conditions, and aggregation operation methods for the chip test data to be processed and the input operation of the test condition range screening expression, and automatically generates the statistical rules of the chip test data to be processed in the chart of the target chart type. Here, for each test chip, since the chip test data to be processed includes multiple chip test data of the same chip under different test items and different test conditions, in order to perform statistical analysis on the chip test data, it is necessary to count the statistical results of the chip test data of the same chip under the same conditions according to the aggregation operation method determined according to actual needs, that is, the statistical rules of the chip test data to be processed in the chart of the target chart type, here, the aggregation operation method determined according to actual needs includes summing, maximum value, minimum value, average value, variance, median and other aggregation operation methods for chip test data, and the operation formulas of each aggregation operation method are stored in the memory of the post-silicon verification device. In this way, users can easily configure the statistical rules for the chip test data to be processed in the chart of the target chart type in the statistical rule configuration interface. After the configuration is completed, the corresponding statistical rules are automatically generated. There is no need for users to manually process data and write complex formulas and rules, avoiding inconsistencies and errors introduced by manual operations and improving the efficiency of generating chip test data analysis charts.

[0044] S104: Jump back to the chip test data analysis chart configuration interface, respond to the user's click operation on the chart generation button in the chip test data analysis chart configuration interface, and determine the chip test data analysis chart of the target chart type for the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in the chart of the target chart type.

[0045] In this step, after the configuration of the statistical rule configuration interface of the target chart type is completed, jump back to the chip test data analysis chart configuration interface, the user clicks the chart generation button in the chip test chart configuration interface, and the post-silicon verification device responds to the click operation on the chart generation button, and automatically generates a chip test data analysis chart of the target chart type for the chip test data to be processed based on the statistical rules of the chip test data to be processed acquired in S101 and the chip test data to be processed configured in S103. Among them, the generated chip test data analysis chart includes the statistical result information of each chip test data under the same test item, the same test condition, and the same test condition screening range after aggregation operation according to the set aggregation operation method, so that the user can perform statistical analysis of the chip test results according to the statistical result information in the chip test data analysis chart, so as to achieve the effects of quality assurance, problem diagnosis, performance optimization and decision support in the chip design and production process. Specifically:

[0046] Quality Assurance: By performing statistical analysis on chip test results, the quality level of the chip can be evaluated to ensure that the produced chips meet the specification requirements and improve product quality and reliability.

[0047] Problem diagnosis: When chip test results are abnormal, statistical analysis helps to identify the problem. By analyzing the distribution characteristics and trends of test data, the root cause of the problem can be traced and solved in a timely manner, improving the efficiency of troubleshooting.

[0048] Performance optimization: Through statistical analysis of test results, the performance bottlenecks and room for improvement of the chip can be identified, and then the design and manufacturing processes can be optimized to improve the performance and efficiency of the chip.

[0049] Decision support: Statistical analysis provides objective data support and helps make reasonable decisions. For example, before a product is released, statistical analysis of chip test results can help determine whether the release criteria are met and whether further improvements or adjustments are needed.

[0050] Furthermore, before step S101, the method further includes:

[0051] Step a1, in response to the user clicking the select file button in the chip test data analysis chart configuration interface, jump to the file selection interface.

[0052] In an embodiment of the present application, since semiconductor companies usually save chip test data as files in various file formats in a local or remote server, before obtaining the chip test data to be processed, it is necessary to convert the original chip test data in various file formats into chip test data to be processed in a unified format.

[0053] In this step, the user first clicks the Select File button in the chip test data analysis chart configuration interface. The post-silicon verification device responds to the click operation on the Select File button and jumps to the file selection interface so that the user can select and parse the original chip test data file in the file selection interface to obtain the original chip test data.

[0054] Step a2, in response to the user's selection operation on the original chip test data file and the file format in the file selection interface, the original chip test data file is parsed according to the parsing algorithm corresponding to the file format to obtain the original chip test data.

[0055] In this step, the user selects the original chip test data file on the local or remote server in the file selection interface, and selects the parsing algorithm corresponding to the selected original chip test data file. The post-silicon verification device responds to the selection operation for the original chip test data file and the file format, calls the parsing algorithm to parse the original chip test data file, and obtains the original chip test data. The memory of the post-silicon verification device in the embodiment of the present application has some commonly used types of parsing algorithms built in, such as STDF parsing algorithm, Char CSV parsing algorithm, Design Verification Test (DVT) parsing algorithm, Data Log parsing algorithm, etc. Users can also write their own parsing algorithms and add them to the memory of the post-silicon verification device.

[0056] Step a3, jump back to the chip test data analysis chart configuration interface, respond to the user's click operation on the field addition button in the chip test data analysis chart configuration interface, and jump to the field addition interface.

[0057] In this step, after obtaining the original chip test data, jump back to the chip test data analysis chart configuration interface, the user clicks the field add button in the chip test data analysis chart configuration interface, and the post-silicon verification device responds to the click operation on the field add button and jumps to the field add interface so that the user can add fields in the field add interface and determine the field name, data type and mapping relationship of each added field in the chip test data to be processed with the fields in the original chip test data.

[0058] Step a4, responds to the user's input operation of the field name, data type and mapping relationship of each field added in the field adding interface, determines the field name, data type and mapping relationship of each added field in the chip test data to be processed and the field in the original chip test data, and converts the original chip test data into the chip test data to be processed.

[0059] In this step, the user enters the field name, data type and mapping relationship of each added field in the field adding interface. The post-silicon verification device responds to the input operation of the field name, data type and mapping relationship of each added field, determines each added field name and data type as the field name and data type in the chip test data to be processed, determines the added mapping relationship as the mapping relationship between the field in the chip test data to be processed and the field in the original chip test data, and automatically converts the original chip test data into the chip test data to be processed, and stores it in the target database.

[0060] Specifically, see Figure 2 , Figure 2 This is a schematic diagram of the field adding interface in the embodiment of the present application, such as Figure 2 As shown, each added field includes a field name, a data type, and a mapping relationship. The field name is the name of the field in the test data to be processed that needs to be saved in the target database; the data type is the data type of the data to be saved in the target database, and the embodiment of the present application supports all data types of the database; the mapping relationship is the field name in the original test data file corresponding to the name of the field in the test data to be processed, which can be a table header, a test condition, a test item, or an expression.

[0061] Among them, the table header includes the configuration information in the original chip test data, such as chip ID, device ID, test platform, tester, etc.; the test conditions include the test condition information in the original chip test data, such as temperature, current, voltage, etc.; the test items include the names of the test items in the original chip test data; the expression includes a new field formed by combining the fields of the original test data file, including three types: splicing, calculation and replacement. Users can choose the appropriate type for configuration according to actual needs.

[0062] Among them, splicing is to use the splicing symbol to splice at least two fields selected by the user into a new field; operation is to add, subtract, multiply or divide a value to the field selected by the user to obtain a new field; replacement is to replace the specified content of a field with new content.

[0063] Furthermore, after determining the field name, data type and mapping relationship of each added field in the chip test data to be processed and the field in the original chip test data, the field name, data type and mapping relationship of each added field in the chip test data to be processed and the field in the original chip test data can also be stored in the memory of the post-silicon verification device. When the original chip test data of the same file type is obtained again, the field name, data type and mapping relationship added historically can be directly called to convert the original chip test data into the chip test data to be processed and store it in the target database.

[0064] Furthermore, if Figure 2 As shown, the user can also click the field add button, field modify button or field delete button in the field add interface to add, modify or delete the field name, data type and mapping relationship. The post-silicon verification device responds to the click operation on the field add button, field modify button or field delete button, as well as the input, modification or deletion operation on the field name, data type and mapping relationship of the field, and adds, modifies or deletes the corresponding field information.

[0065] Further, when the chart type is a cross table, step S103 includes:

[0066] Step b1, in response to a user's selection operation on a test item in a statistical rule configuration interface of a cross table, determining at least one test item field in the horizontal direction of the cross table.

[0067] In the present application, please refer to Figure 3 , Figure 3 Schematic diagram of the statistical rule configuration interface of the cross table in the embodiment of the present application. Figure 3 As shown, in the embodiment of the present application, the statistical rule configuration interface of the cross-table includes the test items (Test Items) that need to be counted, the corresponding test conditions (Rows) horizontally, the corresponding test conditions (Columns) vertically, the aggregation operation method (Aggregations) for the chip test data, a drop-down list for selecting the vertical column display order (Order By), and an input box for the test condition range filter expression (Filters).

[0068] In this step, the user selects at least one test item field in the drop-down list of test items to be counted in the statistical rule configuration interface of the cross table. The post-silicon verification device responds to the selection operation of at least one test item field in the drop-down list of test items to be counted and determines at least one test item field in the horizontal direction of the cross table.

[0069] Step b2, in response to the user's selection operation on the horizontal test condition in the statistical rule configuration interface of the cross table, determining at least one horizontal test condition field of the cross table.

[0070] In this step, the user selects at least one test condition field in the drop-down list of the test conditions corresponding to the horizontal direction in the statistical rule configuration interface of the cross table. The post-silicon verification device responds to the selection operation of at least one test condition field in the drop-down list of the test conditions corresponding to the horizontal direction and determines at least one test condition field in the horizontal direction of the cross table.

[0071] Step b3, in response to the user's selection operation on the vertical test condition in the statistical rule configuration interface of the cross table, determining at least one test condition field in the vertical direction of the cross table.

[0072] In this step, the user selects at least one test condition field in the drop-down list of the test condition corresponding to the vertical direction in the statistical rule configuration interface of the cross table. The post-silicon verification device responds to the selection operation of at least one test condition field in the drop-down list of the test condition corresponding to the vertical direction, and determines at least one test condition field in the vertical direction of the cross table. The test condition field corresponding to the horizontal direction must be different from the test condition field corresponding to the vertical direction.

[0073] Step b4, in response to the user's selection operation of the aggregation operation mode in the statistical rule configuration interface of the cross table, at least one aggregation operation mode in the vertical direction of the cross table is determined.

[0074] In this step, the user selects at least one aggregation operation method in the drop-down list of aggregation operation methods in the statistical rule configuration interface of the cross table. The post-silicon verification device responds to the selection operation of at least one aggregation operation method in the drop-down list of aggregation operation methods and determines at least one aggregation operation method in the vertical direction of the cross table.

[0075] Step b5, in response to the user inputting the test condition range screening expression in the statistical rule configuration interface of the cross table, determining the screening range of at least one selected test condition field in the vertical direction of the cross table.

[0076] In this step, the user enters at least one selected test condition range filter expression in the test condition range filter expression input box in the cross table statistical rule configuration interface. The post-silicon verification device responds to the input operation of at least one selected test condition range filter expression in the test condition range filter expression input box to determine the filter range of at least one selected test condition field in the vertical direction of the cross table.

[0077] Step b6, aggregate the test data of each test item field within the screening range of each test condition field and each selected test condition field according to each aggregation operation mode, and determine the statistical rules of the chip test data to be processed in the cross table.

[0078] In this step, for each test chip, since the chip test data to be processed includes multiple chip test data of the same chip under different test items and different test conditions, in order to perform statistical analysis on the chip test data, it is necessary to count the chip test data of the same chip under the same conditions and aggregate the statistical results according to the aggregation operation method determined according to actual needs, that is, the statistical rules of the chip test data to be processed in the chart of the target chart type. Here, the test data of each test item field under the screening range of each test condition field and each selected test condition field are aggregated according to each aggregation operation method, and determined as the statistical rules of the chip test data to be processed in the cross table.

[0079] Furthermore, the statistical rules of the chip test data to be processed in the cross table also include the display order of the vertical columns of the cross table.

[0080] Further, when the chart type is a cross table, step S104 includes:

[0081] Step c1, determining the display content of the row dimension area of ​​the cross table according to the test item data and test condition data corresponding to each test item field and each test condition field in the horizontal direction of the cross table in the statistical rules in the chip test data to be processed.

[0082] In the present application, please refer to Figure 4 4 is a schematic diagram of a cross table of chip test data to be processed in an embodiment of the present application. Figure 4 As shown, the cross-tab of the chip test data to be processed includes three display areas: a row dimension area, a column dimension area and a numerical area. Among them, the row dimension area is used to display the test item data of each test item field in the horizontal direction of the cross-tab and the test condition data of each test condition field in the horizontal direction of the cross-tab, the column dimension area is used to display the test condition data of each test condition field in the vertical direction of the cross-tab, the identifier of each aggregation operation method in the vertical direction of the cross-tab and the screening range of each selected test condition field in the vertical direction of the cross-tab, and the numerical area is used to display the aggregation operation results of the test data of each test item field in the cross-tab under the screening range of each test condition field and each selected test condition field in the vertical direction of the cross-tab according to each aggregation operation method.

[0083] In this step, if Figure 4 As shown, the test item data corresponding to each test item field in the horizontal direction of the cross table in the statistical rules in the test data of the chip to be processed are displayed in sequence in the rows corresponding to the test item field columns in the row dimension area; for each row corresponding to the test item data, the test condition data corresponding to each test condition field in the horizontal direction of the cross table in the statistical rules in the test data of the chip to be processed are displayed in sequence in the rows corresponding to the test condition field columns in the row dimension area, so as to obtain the display content of the row dimension area of ​​the cross table.

[0084] Step c2, determining the display content of the column dimension area of ​​the cross table according to the test condition data corresponding to each test condition field in the vertical direction of the cross table in the chip test data to be processed, each aggregation operation method for the chip test data, and the screening range of each selected test condition field in the statistical rules.

[0085] In this step, if Figure 4 As shown, the test condition data corresponding to each test condition field in the vertical direction of the cross table in the statistical rules in the chip test data to be processed are displayed in sequence in the columns corresponding to each test condition field row in the column dimension area; for each column corresponding to the test condition data, the identifiers of each aggregation operation method for the chip test data in the vertical direction of the cross table in the statistical rules are displayed in sequence in the columns corresponding to the aggregation operation method row in the column dimension area; for each column corresponding to the identifier of the aggregation operation method, the filter ranges of each selected test condition field in the vertical direction of the cross table in the statistical rules are displayed in sequence in the columns corresponding to the filter range rows of the selected test condition field in the column dimension area, so as to determine the display content of the column dimension area of ​​the cross table.

[0086] Step c3, for each test item field in the statistical rule, determine the display content of the numerical area of ​​the cross table according to the aggregation operation results of each aggregation operation method based on all test data that meet the screening range of the test condition field under each test condition data in the chip test data to be processed.

[0087] In this step, if Figure 4 As shown, for each test item field in the statistical rule, all test data that meet the screening range of the test condition field under each test condition data of the test item field in the test data of the chip to be processed are displayed in the cells where the corresponding horizontal test condition data rows in the corresponding horizontal test item data rows and the corresponding aggregation operation method identifiers in the vertical test condition data columns and the corresponding screening range columns of the selected test condition fields intersect in the numerical area of ​​the cross table according to the aggregation operation results of each aggregation operation method, so as to determine the display content of the numerical area of ​​the cross table.

[0088] Step c4, determining the cross table of the chip test data to be processed according to the display content of the row dimension area, the display content of the column dimension area and the display content of the value area of ​​the cross table.

[0089] In this step, the display content of the row dimension area, the display content of the column dimension area, and the display content of the value area of ​​the cross table are combined to generate a cross table of the chip test data to be processed.

[0090] Furthermore, when the chart type is a cross table, step S104 further includes:

[0091] According to the display order of the vertical columns of the cross table in the statistical rules, the display content of the column dimension area of ​​the cross table is displayed in the display order of the vertical columns of the cross table.

[0092] Further, when the chart type is a scatter chart, step S103 includes:

[0093] Step d1, in response to a user's selection operation on a horizontal axis test condition in a statistical rule configuration interface of a scatter plot, determining at least one test condition field of the horizontal axis of the scatter plot.

[0094] In the present application, please refer to Figure 5 , Figure 5 Schematic diagram of the statistical rule configuration interface of the scatter plot in the embodiment of the present application. Figure 5 As shown, in the embodiment of the present application, the statistical rule configuration interface of the scatter plot includes split dimensions (Trellis By), horizontal axis test conditions (X Axis), vertical axis display content (Y Axis), legend marks (Color By), vertical axis aggregation operations (Y Axis Aggregations), a drop-down list for selecting the grouping method (Order By), and an input box for the test condition range filter expression (Filters).

[0095] In this step, the user selects at least one test condition field in the drop-down list of the horizontal axis test condition in the statistical rule configuration interface of the scatter plot. The post-silicon verification device responds to the selection operation of at least one test condition field in the drop-down list of the horizontal axis test condition to determine at least one test condition field of the horizontal axis of the scatter plot.

[0096] Step d2, in response to the user's selection operation on the vertical axis display content in the statistical rule configuration interface of the scatter plot, determining at least one test item field of the vertical axis of the scatter plot.

[0097] In this step, the user selects at least one test item field in the drop-down list of the vertical axis display content in the statistical rule configuration interface of the scatter plot. The post-silicon verification device responds to the selection operation of at least one test item field in the drop-down list of the vertical axis display content and determines at least one test item field of the vertical axis of the scatter plot.

[0098] Step d3, in response to the user's selection operation of the vertical axis aggregation operation mode in the statistical rule configuration interface of the scatter plot, the aggregation operation mode of the vertical axis of the scatter plot is determined.

[0099] In this step, the user selects an aggregation operation method in the vertical axis aggregation operation method drop-down list in the scatter plot statistical rule configuration interface. The post-silicon verification device responds to the selection operation of the aggregation operation method in the vertical axis aggregation operation method drop-down list and determines the aggregation operation method of the vertical axis of the scatter plot.

[0100] Step d4, in response to the user inputting the test condition range screening expression in the statistical rule configuration interface of the scatter plot, determining the screening range of at least one selected test condition field on the horizontal axis of the scatter plot.

[0101] In this step, the user enters at least one selected test condition range filter expression in the test condition range filter expression input box in the statistical rule configuration interface of the scatter plot. The post-silicon verification device responds to the input operation of at least one selected test condition range filter expression in the test condition range filter expression input box to determine the filter range of at least one selected test condition field on the horizontal axis of the scatter plot.

[0102] Step d5, aggregate the test data of each test item field within the screening range of each test condition field and each selected test condition field according to the aggregation operation method of the vertical axis, and determine the statistical rules of the chip test data to be processed in the scatter plot.

[0103] In this step, for each test chip, since the test data of the chip to be processed includes multiple chip test data of the same chip under different test items and different test conditions, in order to perform statistical analysis on the chip test data, it is necessary to count the chip test data of the same chip under the same conditions and aggregate the statistical results according to the aggregation operation method determined according to actual needs, that is, the statistical rules of the chip test data to be processed in the chart of the target chart type. Here, the test data of each test item field under the screening range of each test condition field and each selected test condition field are aggregated according to the aggregation operation method of the vertical axis, and determined as the statistical rules of the chip test data to be processed in the scatter plot.

[0104] Further, when the chart type is a scatter chart, step S104 includes:

[0105] Step e1, determining the display content of the horizontal axis area of ​​the scatter plot according to the test condition data corresponding to each test condition field on the horizontal axis of the scatter plot in the chip test data to be processed and the screening range of each selected test condition field in the statistical rule.

[0106] In the present application, please refer to Figure 6 , Figure 6 FIG. 1 is a schematic diagram of a scatter plot of chip test data to be processed in an embodiment of the present application. Figure 6As shown, the scatter plot of the chip test data to be processed includes three display areas: a horizontal axis area, a vertical axis area and a scatter area. The horizontal axis area is used to display the test condition data of each test condition field on the horizontal axis of the scatter plot, the identifier of each aggregation operation method and the screening range of each selected test condition field. The vertical axis area is used to display the value of the aggregation operation result aggregated according to the vertical axis aggregation operation method. The scatter area is used to display the positions of the scatter points of the aggregation operation result of the test data of each test item field of the scatter plot under the screening range of each test condition field and each selected test condition field according to the vertical axis aggregation operation method.

[0107] In this step, if Figure 6 As shown, the test condition data corresponding to each test condition field on the horizontal axis of the scatter plot in the statistical rules in the test data of the chip to be processed are displayed in sequence under the horizontal axis coordinates at equal intervals corresponding to the horizontal axis area; the screening range of each selected test condition field on the horizontal axis of the scatter plot in the statistical rules is displayed under the coordinate axis of the horizontal axis area to determine the display content of the horizontal axis area of ​​the scatter plot.

[0108] Step e2, according to the statistical rules, each test item field on the vertical axis of the scatter plot, each test condition field on the horizontal axis of the scatter plot, and all test data that meet the screening range of the test condition field under the test condition data corresponding to the test condition field in the chip test data to be processed are aggregated according to the aggregation operation result of the vertical axis, to determine the display content of the vertical axis area of ​​the scatter plot and the display content of the scatter area.

[0109] In this step, if Figure 6 As shown, the maximum and minimum values ​​of the aggregation operation results of the aggregation operation method of the vertical axis of each test item field on the vertical axis of the scatter plot in the statistical rule under the test condition data corresponding to each test condition field on the horizontal axis of the scatter plot in the test data of the chip to be processed, are used as the maximum and minimum values ​​of the vertical axis coordinates of the vertical axis area, and the values ​​of the aggregation operation results between the maximum and minimum values ​​of the vertical axis coordinates of the vertical axis area are evenly divided to determine the display content of the vertical axis area of ​​the scatter plot; the test data that meet the screening range of the test condition field under the test condition data corresponding to each test condition field on the horizontal axis of the scatter plot in the statistical rule under the test condition data corresponding to each test condition field on the horizontal axis of the scatter plot in the test data of the chip to be processed are aggregated according to the aggregation operation method of the vertical axis, and the horizontal axis coordinates corresponding to the test condition data corresponding to each test condition field on the horizontal axis of the scatter plot in the test data of the chip to be processed are used as the horizontal axis coordinates of each scatter point in the scatter area, and the values ​​of the corresponding aggregation operation results are used as the vertical axis coordinates of each scatter point in the scatter area, to determine the display content of the scatter area of ​​the scatter plot.

[0110] Step e3, determining a scatter plot of the chip test data to be processed according to the display content of the horizontal axis area, the display content of the vertical axis area and the display content of the scatter area of ​​the scatter plot.

[0111] In this step, the display content of the horizontal axis area, the display content of the vertical axis area and the display content of the scatter area of ​​the scatter plot are combined to generate a scatter plot of the chip test data to be processed.

[0112] Furthermore, when the chart type is a scatter chart, step S103 further includes:

[0113] Step f1, responding to the user's selection operation on the splitting dimension in the statistical rule configuration interface of the scatter plot, determining the splitting dimension field of the scatter plot.

[0114] In this step, the user selects a split dimension field in the split dimension drop-down list in the scatter plot statistical rule configuration interface. The post-silicon verification device responds to the selection operation of the split dimension field in the split dimension drop-down list to determine the split dimension field of the scatter plot.

[0115] Step f2, responding to the user's selection operation on the legend mark in the statistical rule configuration interface of the scatter plot, determining the legend mark field of the scatter plot.

[0116] In this step, the user selects a legend mark field in the legend mark drop-down list in the scatter plot statistical rule configuration interface. The post-silicon verification device responds to the selection operation of the legend mark field in the legend mark drop-down list to determine the legend mark field of the scatter plot.

[0117] Step f3, responding to the user's selection operation of the scatter plot grouping method in the statistical rule configuration interface of the scatter plot, determining the grouping method of the scatter plot; the grouping method of the scatter plot includes any one of grouping according to the splitting dimension and grouping according to the legend mark.

[0118] In this step, the user selects a grouping method in the drop-down list of grouping methods in the statistical rule configuration interface of the scatter plot; the grouping methods of the scatter plot include grouping by split dimension and grouping by legend mark. The post-silicon verification equipment responds to the selection operation of the grouping method in the drop-down list of grouping methods to determine whether the grouping method of the scatter plot is Trellis By or Color By.

[0119] Step f4, generates multiple scatter plots according to each split dimension data of the split dimension field, generates multiple legend marks on the same scatter plot according to each legend mark data of the legend mark field, and groups the scatter plots according to the grouping method of the scatter plots, to determine the statistical rules of the chip test data to be processed in the scatter plots.

[0120] In this step, in order to more comprehensively display the statistical analysis results of the chip test data through the scatter plot, the user can also configure multiple scatter plots according to the split dimension field according to the needs, or display the legend marks of the scatter points marked with different colors and names on the same scatter plot according to the legend mark field. In order to facilitate the management of the chip test data scatter plot, the user can also classify the chip test data scatter plot according to any one of the split dimensions and legend marks. Here, multiple scatter plots are generated according to the split dimension data of the split dimension field, multiple legend marks on the same scatter plot are generated according to the legend mark data of the legend mark field, and the scatter plots are grouped according to the grouping method of the scatter plot, which is determined as the statistical rule of the chip test data to be processed in the scatter plot.

[0121] Further, after determining the chip test data analysis chart of the target chart type of the chip test data to be processed, the method further includes:

[0122] Display the chip test data analysis chart of the target chart type of the determined chip test data to be processed in a preset page in the post-silicon verification equipment; and / or export the chip test data analysis chart of the target chart type of the determined chip test data to be processed to Excel to generate a report of the chip test data analysis chart; so that users can view and analyze.

[0123] The following is a specific example to further illustrate the method for determining the chip test data analysis chart provided in the embodiment of the present application:

[0124] See also Figure 7 , Figure 7 This is a schematic diagram of the overall process of the chip test data analysis chart determination method provided in the embodiment of the present application, and the method is applied to post-silicon verification equipment. Figure 7 As shown, the method includes:

[0125] S701, select the original chip test data file and file format in the file selection interface.

[0126] In this step, the original chip test data file is consistent with the file format, and the original chip test data file is parsed through the corresponding file format to obtain the original chip test data.

[0127] S702, adding fields in the field adding interface to obtain chip test data to be processed.

[0128] In this step, add field names, data types, and mapping relationships, establish mapping relationships between fields in the original chip test data file and fields in the chip test data to be processed, and automatically convert the original chip test data into the chip test data to be processed and store it in the target database for subsequent use.

[0129] S703, configuring the statistical rules of the cross table in the statistical rule configuration interface of the cross table.

[0130] In this step, according to the mapping relationship in S702, at least one test item field, at least one table row test condition field, at least one table column test condition field, at least one aggregation operation method and at least one screening expression of the selected test condition field are determined to configure the statistical rules of the cross table.

[0131] S704, configuring the statistical rules of the scatter plot in the statistical rule configuration interface of the scatter plot.

[0132] In this step, according to the mapping relationship in S702, determine the chart splitting dimension field, at least one test condition field on the horizontal axis, at least one test item field on the vertical axis, the legend mark field, the vertical axis aggregation operation method, the grouping method, and the filtering expression of at least one test condition field on the horizontal axis, and configure the statistical rules of the scatter plot.

[0133] S705, click the chart generation button in the test data analysis chart configuration interface to generate a cross table and a scatter plot.

[0134] In this step, based on the chip test data to be processed obtained in S702, the statistical rules of the cross table configured in S703, and the statistical rules of the scatter plot configured in S704, click the chart generation button in the test data analysis chart configuration interface to generate a cross table and a scatter plot.

[0135] S706, export the cross table and scatter plot.

[0136] In this step, the determined cross-tab and scatter plot can be displayed on the first page and the second page preset in the post-silicon verification device, or the determined cross-tab and scatter plot can be exported to Excel to generate a chip test data analysis chart report.

[0137] The embodiment of the present application provides a method for determining a chip test data analysis chart, which is applied to a chip post-silicon verification device, including: in response to a user's click operation on a test data acquisition button in a chip test data analysis chart configuration interface, obtaining chip test data to be processed; in response to a user's selection operation on a chart type in a chip test data analysis chart configuration interface, jumping to a statistical rule configuration interface of a target chart type; the target chart type includes at least one of a cross table and a scatter plot; in response to a user's selection operation on a test item, a test condition, an aggregation operation mode of the chip test data to be processed in a statistical rule configuration interface of a target chart type, and an input operation on a test condition range screening expression, generating statistical rules of the chip test data to be processed in a chart of the target chart type; jumping back to the chip test data analysis chart configuration interface, in response to a user's click operation on a chart generation button in a chip test data analysis chart configuration interface, determining a chip test data analysis chart of the target chart type of the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in a chart of the target chart type. In this way, a chip test data analysis chart is automatically generated based on the statistical rules automatically generated by user configuration, which improves the efficiency of generating chip test data analysis charts, thereby improving the efficiency of statistical analysis of chip test results.

[0138] Based on the same application concept, the embodiments of the present application also provide a chip test data analysis chart determination device corresponding to the chip test data analysis chart determination method provided in the above embodiments. Since the principle of solving the problem by the device in the embodiments of the present application is similar to the chip test data analysis chart determination method in the above embodiments of the present application, the implementation of the device can refer to the implementation of the method, and the repeated parts will not be repeated.

[0139] See also Figure 8 , Figure 8 This is one of the functional module diagrams of a chip test data analysis chart determination device provided in an embodiment of the present application, wherein the device is applied to chip post-silicon verification equipment. Figure 8 As shown, the chip test data analysis chart determination device 800 includes:

[0140] The data acquisition module 810 is used to respond to the user's click operation on the test data acquisition button in the chip test data analysis chart configuration interface to acquire the chip test data to be processed.

[0141] The chart selection module 820 is used to respond to the user's selection operation on the chart type in the chip test data analysis chart configuration interface and jump to the statistical rule configuration interface of the target chart type; the target chart type includes at least one of a cross table and a scatter plot.

[0142] The rule generation module 830 is used to respond to the user's selection operation of the test items, test conditions, and aggregation operation methods of the chip test data to be processed in the statistical rule configuration interface of the target chart type, as well as the input operation of the test condition range screening expression, to generate statistical rules for the chip test data to be processed in the chart of the target chart type.

[0143] The chart determination module 840 is used to jump back to the chip test data analysis chart configuration interface, respond to the user's click operation on the chart generation button in the chip test data analysis chart configuration interface, and determine the chip test data analysis chart of the target chart type of the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in the chart of the target chart type.

[0144] For further information, see Fig. 9 , Fig. 9 This is a second functional module diagram of a chip test data analysis chart determination device provided in an embodiment of the present application. Fig. 9 As shown, the chip test data analysis chart determination device 800 also includes:

[0145] The file selection module 850 is used to respond to the user's click operation on the file selection button in the chip test data analysis chart configuration interface and jump to the file selection interface.

[0146] The file parsing module 860 is used to respond to the user's selection operation on the original chip test data file and the file format in the file selection interface, parse the original chip test data file according to the parsing algorithm corresponding to the file format, and obtain the original chip test data.

[0147] The field adding module 870 is used to jump back to the chip test data analysis chart configuration interface, respond to the user's click operation on the field adding button in the chip test data analysis chart configuration interface, and jump to the field adding interface.

[0148] The data conversion module 880 is used to respond to the user's input operation on the field name, data type and mapping relationship of each field added in the field adding interface, determine the field name, data type and mapping relationship of each added field in the chip test data to be processed and the field in the original chip test data, and convert the original chip test data into the chip test data to be processed.

[0149] Further, when the chart type is a cross table, the rule generation module 830 is used to respond to the user's selection operation of the test items, test conditions, and aggregation operation mode of the chip test data to be processed in the statistical rule configuration interface of the target chart type, and the input operation of the test condition range screening expression, and generate the statistical rules of the chip test data to be processed in the chart of the target chart type. The rule generation module 830 is specifically used to:

[0150] In response to the user's selection operation on the test items in the statistical rule configuration interface of the cross-table, at least one test item field in the horizontal direction of the cross-table is determined; in response to the user's selection operation on the horizontal test conditions in the statistical rule configuration interface of the cross-table, at least one test condition field in the horizontal direction of the cross-table is determined; in response to the user's selection operation on the vertical test conditions in the statistical rule configuration interface of the cross-table, at least one test condition field in the vertical direction of the cross-table is determined; in response to the user's selection operation on the aggregation operation mode in the statistical rule configuration interface of the cross-table, at least one aggregation operation mode in the vertical direction of the cross-table is determined; in response to the user's input operation on the test condition range filtering expression in the statistical rule configuration interface of the cross-table, the filtering range of at least one selected test condition field in the vertical direction of the cross-table is determined; the test data of each test item field under the filtering range of each test condition field and each selected test condition field are aggregated according to each aggregation operation mode respectively, and determined as the statistical rules of the chip test data to be processed in the cross-table.

[0151] Further, when the chart type is a cross table, the chart determination module 840 is used to jump back to the chip test data analysis chart configuration interface, respond to the user's click operation on the chart generation button in the chip test data analysis chart configuration interface, and determine the chip test data analysis chart of the target chart type of the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in the chart of the target chart type. The chart determination module 840 is specifically used to:

[0152] Determine the display content of the row dimension area of ​​the cross-tab according to the test item data and test condition data corresponding to each test item field and each test condition field in the horizontal direction of the cross-tab in the statistical rules in the chip test data to be processed; determine the display content of the column dimension area of ​​the cross-tab according to the test condition data corresponding to each test condition field in the vertical direction of the cross-tab in the statistical rules in the chip test data to be processed, each aggregation operation method for the chip test data, and the screening range of each selected test condition field; for each test item field in the statistical rules, determine the display content of the value area of ​​the cross-tab according to the aggregation operation results of each aggregation operation method based on all test data that meet the screening range of the test condition field under each test condition data in the chip test data to be processed; determine the cross-tab of the chip test data to be processed according to the display content of the row dimension area, the display content of the column dimension area, and the display content of the value area of ​​the cross-tab.

[0153] Further, when the chart type is a scatter plot, the rule generation module 830 is used to respond to the user's selection operation of the test items, test conditions, and aggregation operation mode of the chip test data to be processed in the statistical rule configuration interface of the target chart type, and the input operation of the test condition range screening expression, and generate the statistical rules of the chip test data to be processed in the chart of the target chart type. The rule generation module 830 is specifically used to:

[0154] In response to the user's selection operation on the horizontal axis test conditions in the statistical rule configuration interface of the scatter plot, at least one test condition field on the horizontal axis of the scatter plot is determined; in response to the user's selection operation on the vertical axis display content in the statistical rule configuration interface of the scatter plot, at least one test item field on the vertical axis of the scatter plot is determined; in response to the user's selection operation on the vertical axis aggregation operation mode in the statistical rule configuration interface of the scatter plot, the aggregation operation mode of the vertical axis of the scatter plot is determined; in response to the user's input operation on the test condition range filtering expression in the statistical rule configuration interface of the scatter plot, the filtering range of at least one selected test condition field on the horizontal axis of the scatter plot is determined; the test data of each test item field under the filtering range of each test condition field and each selected test condition field are aggregated according to the aggregation operation mode of the vertical axis to determine the statistical rule of the test data of the chip to be processed in the scatter plot.

[0155] Furthermore, when the chart type is a scatter plot, the chart determination module 840 is used to jump back to the chip test data analysis chart configuration interface, respond to the user's click operation on the chart generation button in the chip test data analysis chart configuration interface, and determine the chip test data analysis chart of the target chart type of the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in the chart of the target chart type. The chart determination module 840 is specifically used to:

[0156] Determine the display content of the horizontal axis area of ​​the scatter plot according to the test condition data corresponding to each test condition field on the horizontal axis of the scatter plot in the chip test data to be processed and the screening range of each selected test condition field in the statistical rules; determine the display content of the vertical axis area of ​​the scatter plot and the display content of the scatter point area according to the aggregation operation result of all test data that meet the screening range of the test condition field under the test condition data corresponding to each test condition field on the horizontal axis of the scatter plot in the chip test data to be processed according to the aggregation operation method of the vertical axis; determine the scatter plot of the chip test data to be processed according to the display content of the horizontal axis area, the display content of the vertical axis area and the display content of the scatter point area of ​​the scatter plot.

[0157] Further, when the chart type is a scatter plot, when the rule generation module 830 is used to generate statistical rules for the chip test data to be processed in a chart of the target chart type, the rule generation module 830 is also used to:

[0158] In response to the user's selection operation on the split dimension in the statistical rule configuration interface of the scatter plot, the split dimension field of the scatter plot is determined; in response to the user's selection operation on the legend mark in the statistical rule configuration interface of the scatter plot, the legend mark field of the scatter plot is determined; in response to the user's selection operation on the scatter plot grouping method in the statistical rule configuration interface of the scatter plot, the grouping method of the scatter plot is determined; the grouping method of the scatter plot includes any one of grouping according to the split dimension and grouping according to the legend mark; multiple scatter plots are generated according to each split dimension data of the split dimension field, multiple legend marks on the same scatter plot are generated according to each legend mark data of the legend mark field, and the scatter plot is grouped according to the grouping method of the scatter plot, and the statistical rules of the chip test data to be processed in the scatter plot are determined.

[0159] The test data analysis chart determination device provided in the embodiment of the present application is applied to chip post-silicon verification equipment, including: a data acquisition module, which is used to respond to the user's click operation on the test data acquisition button in the chip test data analysis chart configuration interface to acquire the chip test data to be processed; a chart selection module, which is used to respond to the user's selection operation on the chart type in the chip test data analysis chart configuration interface, and jump to the statistical rule configuration interface of the target chart type; the target chart type includes at least one of a cross table and a scatter chart; a rule generation module, which is used to respond to the user's selection operation on the test items, test conditions, and aggregation operation methods of the chip test data to be processed in the statistical rule configuration interface of the target chart type, and the input operation of the test condition range screening expression, and generate the statistical rules of the chip test data to be processed in the chart of the target chart type; a chart determination module, which is used to jump back to the chip test data analysis chart configuration interface, respond to the user's click operation on the chart generation button in the chip test data analysis chart configuration interface, and determine the chip test data analysis chart of the target chart type of the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in the chart of the target chart type. In this way, chip test data analysis charts are automatically generated based on the statistical rules automatically generated based on user configuration, which improves the efficiency of generating chip test data analysis charts, and further improves the efficiency of statistical analysis of chip test results.

[0160] Based on the same application idea, please refer to Fig.10 , Fig.10 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application is shown in FIG. Fig.10 As shown, the electronic device 1000 includes a processor 1010 , a memory 1020 and a bus 1030 .

[0161] The memory 1020 stores machine-readable instructions executable by the processor 1010. When the electronic device 1000 is running, the processor 1010 communicates with the memory 1020 through the bus 1030. The machine-readable instructions are executed by the processor 1010 when running to perform the steps of the chip test data analysis chart determination method provided in the above embodiment. The specific implementation method can be found in the method embodiment, which will not be repeated here.

[0162] Based on the same application concept, an embodiment of the present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the chip test data analysis chart determination method provided in the above embodiment are executed. The specific implementation method can be found in the method embodiment, which will not be repeated here.

[0163] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described devices and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0164] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of the devices or units can be electrical, mechanical or other forms.

[0165] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0166] In addition, each functional unit in the embodiments provided in the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0167] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0168] It should be noted that similar numbers and letters represent similar items in the following figures. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description and are not to be understood as indicating or implying relative importance.

[0169] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present application, which are used to illustrate the technical solutions of the present application, rather than to limit them. The protection scope of the present application is not limited thereto. Although the present application is described in detail with reference to the above-mentioned embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above-mentioned embodiments within the technical scope disclosed in the present application, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application. They should all be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A method for determining a chip test data analysis chart, characterized in that: Applied to chip post-silicon verification equipment, the method comprises: In response to a user clicking a test data acquisition button in a chip test data analysis chart configuration interface, the chip test data to be processed is acquired; In response to the user's selection operation of a chart type in the chip test data analysis chart configuration interface, jump to a statistical rule configuration interface of a target chart type; the target chart type includes at least one of a cross table and a scatter plot; In response to the user's selection operation of the test items, test conditions, and aggregation operation mode of the chip test data to be processed in the statistical rule configuration interface of the target chart type, and the input operation of the test condition range screening expression, the statistical rules of the chip test data to be processed in the chart of the target chart type are generated; Jump back to the chip test data analysis chart configuration interface, respond to the user's click operation on the chart generation button in the chip test data analysis chart configuration interface, and determine the chip test data analysis chart of the target chart type of the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in the chart of the target chart type.

2. The chip test data analysis chart determination method according to claim 1, characterized in that: In response to a user clicking a test data acquisition button in a chip test data analysis chart configuration interface, before acquiring the chip test data to be processed, the method further includes: In response to the user clicking the select file button in the chip test data analysis chart configuration interface, jump to the file selection interface; In response to the user's selection operation on the original chip test data file and the file format in the file selection interface, the original chip test data file is parsed according to the parsing algorithm corresponding to the file format to obtain the original chip test data; Jump back to the chip test data analysis chart configuration interface, and in response to the user clicking the field adding button in the chip test data analysis chart configuration interface, jump to the field adding interface; In response to the user's input operation on the field name, data type and mapping relationship of each field added in the field adding interface, the field name, data type and mapping relationship of each added field in the chip test data to be processed and the field in the original chip test data are determined, and the original chip test data is converted into the chip test data to be processed.

3. The chip test data analysis chart determination method according to claim 1, characterized in that: When the chart type is a cross table, the response to the user's selection operation of the test items, test conditions, and aggregation operation mode of the chip test data to be processed in the statistical rule configuration interface of the target chart type and the input operation of the test condition range screening expression to generate the statistical rules of the chip test data to be processed in the chart of the target chart type includes: In response to a user's selection operation on a test item in a statistical rule configuration interface of a cross table, determining at least one test item field in a horizontal direction of the cross table; In response to a user's selection operation on a horizontal test condition in a statistical rule configuration interface of a cross table, determining at least one test condition field in the horizontal direction of the cross table; In response to a user's selection operation on a vertical test condition in a statistical rule configuration interface of a cross table, determining at least one test condition field in the vertical direction of the cross table; In response to a user's selection operation of an aggregation operation mode in a cross-table statistical rule configuration interface, determining at least one aggregation operation mode in the vertical direction of the cross-table; In response to a user input operation of a test condition range screening expression in a statistical rule configuration interface for a cross table, a screening range of at least one selected test condition field in a vertical direction of the cross table is determined; The test data of each test item field within the screening range of each test condition field and each selected test condition field are aggregated according to each of the aggregation operation modes to determine the statistical rules of the chip test data to be processed in the cross table.

4. The chip test data analysis chart determination method according to claim 3, characterized in that: The method of responding to a user's click operation on a chart generation button in the chip test data analysis chart configuration interface, and determining a chip test data analysis chart of the target chart type for the chip test data to be processed based on the chip test data to be processed and a statistical rule of the chip test data to be processed in a chart of the target chart type, comprises: Determine the display content of the row dimension area of ​​the cross table according to the test item data and test condition data corresponding to each test item field and each test condition field in the horizontal direction of the cross table in the statistical rules in the test data of the chip to be processed; Determine the display content of the column dimension area of ​​the cross table according to the test condition data corresponding to each test condition field in the vertical direction of the cross table in the statistical rules in the chip test data to be processed, each aggregation operation mode for the chip test data, and the screening range of each selected test condition field; For each test item field in the statistical rule, determine the display content of the value area of ​​the cross table according to the aggregation operation results of each aggregation operation mode based on all test data that meet the screening range of the test condition field under each test condition data in the chip test data to be processed; The cross table of the chip test data to be processed is determined according to the display content of the row dimension area, the display content of the column dimension area and the display content of the value area of ​​the cross table.

5. The chip test data analysis chart determination method according to claim 1, characterized in that: When the chart type is a scatter chart, the response to the user's selection operation of the test items, test conditions, and aggregation operation mode of the chip test data to be processed in the statistical rule configuration interface of the target chart type and the input operation of the test condition range screening expression to generate the statistical rules of the chip test data to be processed in the chart of the target chart type includes: In response to a user's selection operation on a horizontal axis test condition in a statistical rule configuration interface of a scatter plot, determining at least one test condition field of a horizontal axis of the scatter plot; In response to a user's selection operation on the vertical axis display content in the statistical rule configuration interface of the scatter plot, determining at least one test item field of the vertical axis of the scatter plot; In response to the user's selection operation of the vertical axis aggregation operation mode in the statistical rule configuration interface of the scatter plot, the aggregation operation mode of the vertical axis of the scatter plot is determined; In response to a user input operation of a test condition range screening expression in a statistical rule configuration interface for a scatter plot, a screening range of at least one selected test condition field on a horizontal axis of the scatter plot is determined; The test data of each test item field within the screening range of each test condition field and each selected test condition field are aggregated according to the aggregation operation method of the vertical axis to determine the statistical rules of the test data of the chip to be processed in the scatter plot.

6. The chip test data analysis chart determination method according to claim 5, characterized in that: The method of responding to a user's click operation on a chart generation button in the chip test data analysis chart configuration interface, and determining a chip test data analysis chart of the target chart type for the chip test data to be processed based on the chip test data to be processed and a statistical rule of the chip test data to be processed in a chart of the target chart type, comprises: Determine the display content of the horizontal axis area of ​​the scatter plot according to the test condition data corresponding to each test condition field on the horizontal axis of the scatter plot in the statistical rule in the test data of the chip to be processed and the screening range of each selected test condition field; Determine the display content of the vertical axis area of ​​the scatter plot and the display content of the scatter area according to the aggregate operation result of all test data that meet the screening range of the test condition field under the test condition data corresponding to each test item field on the vertical axis of the scatter plot in the statistical rule and each test condition field on the horizontal axis of the scatter plot in the test data of the chip to be processed according to the aggregate operation method of the vertical axis; A scatter plot of the chip test data to be processed is determined according to the display content of the horizontal axis area, the display content of the vertical axis area, and the display content of the scatter area of ​​the scatter plot.

7. The chip test data analysis chart determination method according to claim 5, characterized in that: When the chart type is a scatter plot, the generating of the statistical rules of the chip test data to be processed in the chart of the target chart type further includes: In response to the user's selection operation on the split dimension in the statistical rule configuration interface of the scatter plot, determine the split dimension field of the scatter plot; In response to a user's selection operation on a legend mark in a statistical rule configuration interface of a scatter plot, a legend mark field of the scatter plot is determined; In response to a user's selection operation of a scatter plot grouping method in a statistical rule configuration interface for a scatter plot, a scatter plot grouping method is determined; the scatter plot grouping method includes any one of grouping according to a split dimension and grouping according to a legend mark; Multiple scatter plots are generated according to the respective split dimension data of the split dimension field, multiple legend marks are generated on the same scatter plot according to the respective legend mark data of the legend mark field, and the scatter plots are grouped according to the grouping method of the scatter plots to determine the statistical rules of the chip test data to be processed in the scatter plots.

8. A device for determining a chip test data analysis chart, characterized in that: Applied to chip post-silicon verification equipment, the chip test data analysis chart determination device comprises: The data acquisition module is used to respond to the user's click operation on the test data acquisition button in the chip test data analysis chart configuration interface to acquire the chip test data to be processed; A chart selection module, for responding to a user's selection operation of a chart type in the chip test data analysis chart configuration interface, and jumping to a statistical rule configuration interface of a target chart type; the target chart type includes at least one of a cross table and a scatter plot; A rule generation module, for responding to a user's selection operation of a test item, a test condition, an aggregation operation mode, and an input operation of a test condition range screening expression for the chip test data to be processed in a statistical rule configuration interface of the target chart type, and generating statistical rules for the chip test data to be processed in a chart of the target chart type; A chart determination module is used to jump back to the chip test data analysis chart configuration interface, respond to the user's click operation on the chart generation button in the chip test data analysis chart configuration interface, and determine the chip test data analysis chart of the target chart type of the chip test data to be processed based on the chip test data to be processed and the statistical rules of the chip test data to be processed in the chart of the target chart type.

9. An electronic device, characterized in that: include: A processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate through the bus, and the machine-readable instructions are executed by the processor to execute the steps of the chip test data analysis chart determination method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the chip test data analysis chart determination method according to any one of claims 1 to 7 are executed.

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