Server testing method and device, storage medium and electronic equipment

Abstract

The embodiment of the invention provides a server testing method and device, a storage medium and electronic equipment, and the method comprises the steps: receiving a target testing request initiated by a connected target server; responding to the target test request, and detecting the matching degree between the first test item and the second test item provided by the test accompanying equipment; under the condition that the matching degree is used for indicating that the test accompanying equipment cannot realize the second test item, constructing target test equipment corresponding to the second test item by using the plurality of test devices; and controlling the target test equipment to test the second test item in the performance of the target server. By means of the server testing method and device, the problem that the server testing efficiency is low is solved, and then the effect of improving the server testing efficiency is achieved.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of computers, and more specifically, to a server testing method and device, a storage medium, and an electronic device. Background Art

[0002] In order to ensure the product quality of the server, the performance of the server will be tested. In the related art, when the function of the companion test board is tested through the MCIO interface deployed on the motherboard to be tested, the function of the companion test board is limited. When a companion test board is connected to the motherboard to be tested, only the test items allowed by the companion test board can be tested. It can be understood that in the related art, only some signals are covered (these signals are for testing the test items allowed by the companion test board), resulting in incomplete signal coverage.

[0003] When other test items of the server need to be tested, other accompanying test boards need to be replaced or the tests need to be performed separately and manually. In this way, the complexity of testing the server is high, resulting in low testing efficiency of the server. Summary of the invention

[0004] The embodiments of the present application provide a server testing method and device, a storage medium and an electronic device to at least solve the problem of low server testing efficiency in the related art.

[0005] According to an embodiment of the present application, a server testing method is provided, wherein a controller and a plurality of testing devices are deployed in a server testing device, the controller is used to connect a server to be tested and a companion testing device respectively, the companion testing device is used to test a first test item in the performance of the server to be tested, the method is applied to the controller, and the method comprises: receiving a target test request initiated by a connected target server, wherein the target test request is used to request to test a second test item in the performance of the target server; responding to the target test request, detecting a matching degree between the first test item and the second test item provided by the companion testing device, wherein the matching degree is used to indicate whether the companion testing device can implement the second test item; in a case where the matching degree is used to indicate that the companion testing device fails to implement the second test item, using the plurality of testing devices to construct a target test device corresponding to the second test item; and controlling the target test device to test the second test item in the performance of the target server.

[0006] In an exemplary embodiment, the use of the multiple test devices to construct a target test device corresponding to the second test item includes: searching for a target test device corresponding to a third test item from test items and test devices having a corresponding relationship, wherein the third test item is a test item in the performance of the target server that the companion test device cannot implement in the second test item; and constructing the target test device using the target test device and the companion test device.

[0007] In an exemplary embodiment, the use of the target test device and the companion test device to construct the target test device includes: when the target test device includes N test devices, the target test device is constructed using the N test devices and the companion test device by performing the following steps, wherein N is a positive integer: extracting the target connection relationship corresponding to the third test item and the N test devices from test items, test devices, and connection relationships having corresponding relationships; connecting the N test devices according to the target connection relationship to obtain a candidate test device; and determining the candidate test device and the companion test device as the target test device.

[0008] In an exemplary embodiment, controlling the target test device to test the second test item in the performance of the target server includes: controlling the candidate test device to extract the target test signal corresponding to the third test item in the performance of the target server according to the test item type corresponding to the third test item in the performance of the target server; controlling the candidate test device to test the third test item in the performance of the target server using the target test signal, and controlling the companion test device to test the test items in the second test item in the performance of the target server except the third test item.

[0009] In an exemplary embodiment, the method of controlling the candidate test device to extract the target test signal corresponding to the third test item in the performance of the target server according to the test item type corresponding to the third test item in the performance of the target server includes: when the test item type includes a bus link type and / or a signal frequency type, generating and initiating a signal generation instruction to the target server, wherein the signal generation instruction is used to instruct the target server to generate the target test signal and receive the target test signal returned by the target server in response to the signal generation instruction; and when the test item type includes a server control type, controlling the candidate test device to generate the target test signal.

[0010] In an exemplary embodiment, an operational amplifier device and a frequency divider device are deployed in the candidate test device, and the controller is connected to the operational amplifier device and the frequency divider device. The control of the candidate test device to use the target test signal to test the third test item in the performance of the target server includes: when the test item type includes a signal frequency type, the target test signal received and returned by the target server is input into the operational amplifier device to obtain an operational amplifier test signal, wherein the operational amplifier device is used to adjust the amplitude of the signal input into the operational amplifier device according to the operational amplifier coefficient, and the value obtained by dividing the first amplitude of the operational amplifier test signal by the second amplitude of the target test signal is equal to the operational amplifier coefficient; the operational amplifier test signal is input into the frequency divider device to obtain a frequency divider test signal, wherein the frequency divider device is used to adjust the frequency of the signal input into the frequency divider device according to the frequency divider coefficient, and the value obtained by dividing the first frequency of the frequency divider test signal by the second frequency of the operational amplifier test signal is equal to the frequency divider coefficient, wherein the controller is configured to allow processing of signals with an amplitude of the first amplitude and a frequency of the first frequency; the signal frequency item of the target server is tested according to the frequency divider test signal, wherein , the third test item in the performance of the target server includes the signal frequency item; a first bus device is deployed in the target server, a second bus device is deployed in the candidate test device, the controller is connected to the second bus device, the first bus device is connected to the second bus device, and the control of the candidate test device uses the target test signal to test the third test item in the performance of the target server, including: when the test item type includes a bus link type, detecting a candidate address of the second bus device, generating and initiating a target query instruction to the target server, wherein the target query instruction is used to instruct the target server to search for an address corresponding to the second bus device in a reference address set, the reference address set is used to record the addresses of the bus devices mounted on the target server, receiving a reference address of the second bus device returned by the target server in response to the target query instruction, comparing the candidate address and the reference address, and when the candidate address and the reference address are consistent, determining that the bus link item in the performance of the target server is normal, wherein the third test item in the performance of the target server includes the bus link item.

[0011] In an exemplary embodiment, a voltage divider holding device is deployed in the candidate test device, the controller is connected to the voltage divider holding device, and the control of the candidate test device uses the target test signal to test the third test item in the performance of the target server includes: when the test item type includes a server control type, initiating the target test signal to the target server, wherein the target server is configured to respond to the received target test signal and output a target power supply signal with a first voltage to power the candidate test device; inputting the target power supply signal with a voltage of the first voltage provided by the target server into the voltage divider holding device to obtain a voltage divider power supply signal, wherein the voltage divider holding device is used to adjust the voltage of the signal input to the voltage divider holding device according to a voltage divider coefficient, and a value obtained by dividing the second voltage of the voltage divider power supply signal by the first voltage of the target power supply signal is equal to the voltage divider coefficient; testing the power supply item in the performance of the target server according to the voltage divider power signal, wherein the third test item in the performance of the target server includes the power supply item.

[0012] According to another embodiment of the present application, a server testing device is provided, comprising: a controller and a plurality of testing devices are deployed in the server testing device, the controller is used to connect the server to be tested and the accompanying testing device respectively, the accompanying testing device is used to test a first test item in the performance of the server to be tested, the device is applied to the controller, and the device comprises: a receiving module, used to receive a target test request initiated by the connected target server, wherein the target test request is used to request to test a second test item in the performance of the target server; a detection module, used to respond to the target test request and detect a matching degree between the first test item and the second test item provided by the accompanying testing device, wherein the matching degree is used to indicate whether the accompanying testing device can implement the second test item; a construction module, used to use the plurality of testing devices to construct a target test device corresponding to the second test item when the matching degree is used to indicate that the accompanying testing device fails to implement the second test item;

[0013] The control module is used to control the target test device to test the second test item in the performance of the target server.

[0014] According to another embodiment of the present application, a computer-readable storage medium is provided, in which a computer program is stored, wherein the computer program is configured to execute the steps of any of the above method embodiments when run.

[0015] According to another embodiment of the present application, an electronic device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0016] According to another embodiment of the present application, a computer program product is provided, including a computer program, and when the computer program is executed by a processor, the steps in any of the above method embodiments are implemented.

[0017] Through the present application, the test items in the performance of the server that can be implemented by the accompanying test device are limited. In the case that the accompanying test device fails to implement the test items in the performance of the server that is desired to be tested, it is possible but not limited to constructing a test device that can implement the test items in the performance of the server that is desired to be tested through the test devices deployed in the server test device. The constructed test device is used to test the test items that cannot be implemented by the accompanying test device, thereby expanding the test scope of the test items in the performance of the server that can be implemented, avoiding the need to replace the accompanying test device to implement the testing of the unachievable test items, reducing the time required for testing the server, and solving the problem of low testing efficiency of the server, thereby achieving the effect of improving the testing efficiency of the server. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a hardware structure block diagram of a server device of a server testing method according to an embodiment of the present application;

[0019] Figure 2 is a flow chart of a method for testing a server according to an embodiment of the present application;

[0020] Figure 3 is a front schematic diagram of an optional server testing device according to an embodiment of the present application;

[0021] Figure 4 is a schematic diagram of the back side of an optional server testing device according to an embodiment of the present application;

[0022] Figure 5 This is a connection diagram of an optional server to be tested, a server testing device, and a companion testing device according to an embodiment of the present application;

[0023] Figure 6 is a schematic diagram of an optional server testing method according to an embodiment of the present application;

[0024] Figure 7 It is a structural block diagram of a server testing device according to an embodiment of the present application. DETAILED DESCRIPTION

[0025] The embodiments of the present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0026] It should be noted that the terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.

[0027] The method embodiments provided in the embodiments of the present application can be executed in a server device or a similar computing device. Taking running on a server device as an example, Figure 1 1 is a hardware structure block diagram of a server device of a server testing method according to an embodiment of the present application. Figure 1 As shown, the server device may include one or more ( Figure 1 Only one is shown in the figure) a processor 102 (the processor 102 may include but is not limited to a processing device such as a microprocessor MCU or a programmable logic device FPGA) and a memory 104 for storing data, wherein the server device may also include a transmission device 106 and an input / output device 108 for communication functions. It can be understood by those skilled in the art that Figure 1 The structure shown is only for illustration and does not limit the structure of the above server device. Figure 1 More or fewer components as shown, or with Figure 1 Different configurations shown.

[0028] The memory 104 can be used to store computer programs, for example, software programs and modules of application software, such as the computer program corresponding to the test method of the server in the embodiment of the present application. The processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, that is, to implement the above method. The memory 104 may include a high-speed random access memory, and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory 104 may further include a memory remotely arranged relative to the processor 102, and these remote memories may be connected to the server device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0029] The transmission device 106 is used to receive or send data via a network. The specific example of the above network may include a wireless network provided by a communication provider of a server device. In one example, the transmission device 106 includes a network adapter (Network Interface Controller, referred to as NIC), which can be connected to other network devices through a base station so as to communicate with the Internet. In one example, the transmission device 106 can be a radio frequency (Radio Frequency, referred to as RF) module, which is used to communicate with the Internet wirelessly.

[0030] First, the terms involved in the embodiments of the present application are explained as follows:

[0031] MCU: Microcontroller Unit, microcontroller unit, also known as single-chip microcomputer (Single Chip Microcomputer) or single-chip microcomputer.

[0032] PCBA: printed circuit board assembly, assembled printed circuit board.

[0033] Motherboard: Motherboard is one of the most basic and important components of a computer. The motherboard is generally a rectangular circuit board on which the main circuit systems of the computer are installed.

[0034] USB: Universal Serial Bus, a technical specification for input and output.

[0035] I2C: Inter-Integrated Circuit, integrated circuit bus.

[0036] PCI-E 5.0: Peripheral Component Interconnect Express 5.0, the fifth generation of peripheral component interconnect, also known as the fifth generation PCIe, PCIe 5, PCI v5 or simply PCIe 5.0.

[0037] PCI-E slot: The full name is PCI-Express slot, which is a high-speed serial computer expansion bus slot. Compared with traditional slots, PCI-E slot has a higher data transmission rate and uses a point-to-point serial connection method.

[0038] MCIO: Mini Cool Edge IO, multi-channel input / output, is an interface technology that combines multiple physical channels into one high-speed data stream.

[0039] Riser card: an expansion card that expands the server's PCI-E slot to an appropriate position.

[0040] In this embodiment, a server testing method is provided. A controller and a plurality of testing devices are deployed in a server testing device. The controller is used to connect a server to be tested and a companion testing device respectively. The companion testing device is used to test a first test item in the performance of the server to be tested. The method is applied to the controller. Figure 2 is a flow chart of a method for testing a server according to an embodiment of the present application, such as Figure 2 As shown, the process includes the following steps:

[0041] Step S202, receiving a target test request initiated by the connected target server, wherein the target test request is used to request to test a second test item in the performance of the target server;

[0042] Step S204, responding to the target test request, detecting a matching degree between the first test item and the second test item provided by the accompanying test device, wherein the matching degree is used to indicate whether the accompanying test device can implement the second test item;

[0043] Step S206, when the matching degree indicates that the companion test device fails to implement the second test item, constructing a target test device corresponding to the second test item using the multiple test devices;

[0044] Step S208: Control the target test device to test the second test item in the performance of the target server.

[0045] Through the above steps, the test items in the performance of the server that can be achieved by the accompanying test device are limited. In the case that the accompanying test device fails to achieve the test items in the performance of the server that is desired to be tested, it is possible but not limited to constructing a test device that can achieve the test items in the performance of the server that is desired to be tested through the test devices deployed in the server test device. The constructed test device is used to test the test items that cannot be achieved by the accompanying test device, thereby expanding the test scope of the test items in the performance of the server that can be achieved, avoiding the need to replace the accompanying test device to test the unachievable test items, reducing the time required for testing the server, and solving the problem of low testing efficiency of the server, thereby achieving the effect of improving the testing efficiency of the server.

[0046] In the technical solution provided in the above step S202, the controller may be but is not limited to being connected to each of the multiple test devices, and the accompanying test device may be but is not limited to being used to test one or more test items in the performance of the server to be tested.

[0047] Optionally, in this embodiment, the companion test device may include but is not limited to a bus device. For example, the companion test device may include but is not limited to a PCIe companion test board. In this case, the first test item may include but is not limited to testing the performance of the PCIe link of the server to be tested.

[0048] In the technical solution provided in the above step S204, the matching degree between the first test item and the second test item provided by the accompanying test device can be detected in the following manner but is not limited to: searching for the second test item from the first test item, and in the case where the second test item is found from the first test item, determining the matching degree as a complete match; in the case where only some test items in the second test item are found from the first test item, determining the matching degree as a value obtained by dividing the number of the found test items by the number of the second test items.

[0049] In the technical solution provided in the above step S206, when the matching degree is used to indicate that the accompanying test device can implement the second test item, it can be indicated that the second test item is included in the first test item. In this case, the accompanying test device is used to test the second test item in the performance of the target server.

[0050] Optionally, in this embodiment, when the matching degree is used to indicate that the accompanying test device fails to implement the second test item, it may indicate that the accompanying test device can only implement some of the second test items, or the accompanying test device cannot implement all of the second test items.

[0051] Figure 3 is a front schematic diagram of an optional server testing device according to an embodiment of the present application, Figure 4 is a schematic diagram of the back side of an optional server testing device according to an embodiment of the present application, combined with Figure 3 and Figure 4 As shown, the X16MCIO interface can be but is not limited to being deployed on the server to be tested. The server test device in the embodiment of the present application is connected to the server through the gold finger on the lower side (for example, Figure 3 The top slot (J2 position) is connected to the X16MCIO interface of the server motherboard to be tested. Figure 3 The accompanying test device (for example, a PCI-E card) is connected to the J1 position in the middle to detect the specified bandwidth and rate of the PCI-E 5.0 high-speed signal.

[0052] I2C detection chip ( Figure 4 The test components include the I2C detection chip, which is used to simulate the I2C data transmission back to the motherboard. Figure 4The test component includes a redundant detection chip at the U8 / U9 position in the middle, which is used to test the redundant PCIE 100MCLK signal on the MCIO interface. The two chips amplify the signal and divide the signal by 16 (or 4-division, 8-division, etc., which are multiples of 2, and the embodiment of the present application is not limited to this) and send it to the controller (for example, MCU module) to detect the clock frequency.

[0053] Through the MCU module of the present invention ( Figure 3 After the detection of the U1 position in the middle, the input frequency is calculated to accurately determine whether the detection signal frequency is normal, and the signal is processed centrally to complete the detection of the sideband signal, including Cl k signal (clock signal), control signal, etc. The detection result can be transmitted through the USB interface ( Figure 3 The J3 position in the middle) is output, and the PCIE recognition is forced to be disconnected through the MCU module, so that the LED ( Figure 3 The red light is on at position D11 in the middle.

[0054] It should be noted that the server testing method in the embodiment of the present application can also be used for but is not limited to diagnostic testing of various types of equipment such as server riser cards, cables, personal computers, switches, etc.

[0055] In an exemplary embodiment, the target test device corresponding to the second test item can be constructed using the multiple test devices in the following manner, but is not limited to: searching for a target test device corresponding to a third test item from test items and test devices having a corresponding relationship, wherein the third test item is a test item in the performance of the target server that the companion test device fails to implement in the second test item; and constructing the target test device using the target test device and the companion test device.

[0056] Optionally, in this embodiment, the correspondence between the test items and the test devices may include but is not limited to one test item corresponding to one test device, or one test item corresponding to multiple test devices, or multiple test items corresponding to one test device. It can be understood that the target test device may include but is not limited to one or more test devices.

[0057] Optionally, in this embodiment, when the third test item is the same as the second test item in the performance of the target server, it can be indicated that the companion test device is completely unable to implement the second test item in the performance of the target server. In this case, the target test device is constructed using the target test device.

[0058] In this way, the corresponding test equipment is constructed by the test device to implement the test items that the accompanying test equipment cannot implement, and the accompanying test equipment is fully utilized to test the performance of the server with the test items that it can implement, thereby improving the utilization rate of the test resources of the accompanying test equipment.

[0059] In an exemplary embodiment, when the target test device includes N test devices, the target test device can be constructed using the N test devices and the companion test device by performing the following steps, but is not limited to: extracting the target connection relationship corresponding to the third test item and the N test devices from the test items, test devices and connection relationships having corresponding relationships; connecting the N test devices according to the target connection relationship to obtain a candidate test device; and determining the candidate test device and the companion test device as the target test device.

[0060] Optionally, in this embodiment, the target connection relationship may include but is not limited to including the connection order and connection method between N test devices. For example, the target connection relationship may include but is not limited to indicating that the i-th test device among the N test devices is connected to at least one test device among the N test devices except the i-th test device (for example, the connection method and the connection order), or is not connected, or the i-th test device is not connected to the j-th test device among the N test devices, etc.

[0061] Optionally, in this embodiment, when the second test item in the performance of the target server is completely different from the first test item provided by the companion test device, the candidate test device may be determined as the target test device, but is not limited to being determined.

[0062] In this way, corresponding test equipment is constructed according to the test items, the test devices required for the test, and the corresponding connection relationships. Different test components can be reused to construct different test equipment to test different test items, thereby improving the utilization rate of the test components.

[0063] In the technical solution provided in the above step S208, it is possible but not limited to testing the test items to implement testing of the corresponding part of the performance of the server. For example, when the test items include the bit error rate and transmission rate of the PCIe link, by testing whether the bit error rate and transmission rate of the PCIe link meet the transmission requirements (for example, the bit error rate is less than or equal to the bit error rate threshold, and the transmission rate is greater than or equal to the transmission rate threshold), it is possible to implement testing of the performance of the PCIe data link corresponding to the performance of the server.

[0064] In an exemplary embodiment, the target test device may be controlled to test the second test item in the performance of the target server in the following manner, but is not limited to: based on the test item type corresponding to the third test item in the performance of the target server, the candidate test device is controlled to extract the target test signal corresponding to the third test item in the performance of the target server; the candidate test device is controlled to use the target test signal to test the third test item in the performance of the target server, and the accompanying test device is controlled to test the test items in the second test item in the performance of the target server except the third test item.

[0065] Optionally, in this embodiment, different test items may correspond to, but are not limited to, different test item types; or, different test items may correspond to, but are not limited to, the same test item type; for example, test item 1 and test item 2 both correspond to test item type 1.

[0066] Optionally, in this embodiment, when the third test item in the performance of the target server is the same as the second test item in the performance of the target server, it may indicate that the companion test device is completely unable to test the second test item in the performance of the target server. In this case, the candidate test device is controlled to use the target test signal to test the second test item in the performance of the target server.

[0067] In an exemplary embodiment, the candidate test device can be controlled to extract the target test signal corresponding to the third test item in the performance of the target server according to the test item type corresponding to the third test item in the performance of the target server in the following manner, but is not limited to: when the test item type includes a bus link type and / or a signal frequency type, a signal generation instruction is generated and initiated to the target server, wherein the signal generation instruction is used to instruct the target server to generate the target test signal and receive the target test signal returned by the target server in response to the signal generation instruction; when the test item type includes a server control type, the candidate test device is controlled to generate the target test signal.

[0068] Optionally, in this embodiment, the candidate test device can be controlled to generate the target test signal in the following manner, but is not limited to: when the target test device is obtained by connecting N test devices according to a target connection relationship, the target test device is controlled to generate the target test signal by executing the following steps, when the test item type includes a server control type, wherein N is a positive integer: screening a reference test device from the N test devices, wherein the reference test device is a test device among the N test devices that is allowed to generate the target test signal; controlling the reference test device to generate the target test signal, it should be noted that the first reference test device may be the first test device in the target connection relationship, or may not be the first test device in the target connection relationship.

[0069] Optionally, in this embodiment, when the test item type includes a server control type, the candidate test device can be controlled to generate the target test signal in the following manner, but not limited to: control the first reference test device among N test devices to generate a start test signal, input the start test signal into a second reference test device (which may be one or more test devices among the N test devices except the first reference test device), and determine the test signal output by the second reference test device as the target test signal, wherein, when the second reference test device includes multiple test devices, the output of the previous test device in the second reference test device is used as the input of the next test device, and the test signal output by the last test device in the second reference test device is determined as the target test signal.

[0070] In this way, the test signal required for the second test item in testing the performance of the target server is automatically generated by the server test device, which reduces the time for obtaining the test signal and improves the efficiency of obtaining the test signal.

[0071] In an exemplary embodiment, an operational amplifier device and a frequency divider device are deployed in the candidate test device, and the controller is connected to the operational amplifier device and the frequency divider device. The controller can control the candidate test device to use the target test signal to test the third test item in the performance of the target server in the following manner, but is not limited to: when the test item type includes a signal frequency type, the target test signal received and returned by the target server is input into the operational amplifier device to obtain an operational amplifier test signal, wherein the operational amplifier device is used to adjust the amplitude of the signal input into the operational amplifier device according to the operational amplifier coefficient, and the first amplitude of the operational amplifier test signal is divided by the target frequency type. The value obtained by the second amplitude of the test signal is equal to the operational amplifier coefficient; the operational amplifier test signal is input into the frequency dividing device to obtain a frequency dividing test signal, wherein the frequency dividing device is used to adjust the frequency of the signal input into the frequency dividing device according to the frequency dividing coefficient, and the value obtained by dividing the first frequency of the frequency dividing test signal by the second frequency of the operational amplifier test signal is equal to the frequency dividing coefficient, wherein the controller is configured to allow processing of a signal having an amplitude of the first amplitude and a frequency of the first frequency; the signal frequency item of the target server is tested according to the frequency dividing test signal, wherein the third test item in the performance of the target server includes the signal frequency item;

[0072] A first bus device is deployed in the target server, a second bus device is deployed in the candidate test device, the controller is connected to the second bus device, and the first bus device is connected to the second bus device. The candidate test device can be controlled to use the target test signal to test the third test item in the performance of the target server in the following manner, but is not limited to: when the test item type includes a bus link type, the candidate address of the second bus device is detected, and a target query instruction is generated and initiated to the target server, wherein the target query instruction is used to instruct the target server to search for the address corresponding to the second bus device in a reference address set, and the reference address set is used to record the addresses of the bus devices mounted on the target server, receive the reference address of the second bus device returned by the target server in response to the target query instruction, compare the candidate address and the reference address, and when the candidate address and the reference address are consistent, determine that the bus link item in the performance of the target server is normal, wherein the third test item in the performance of the target server includes the bus link item.

[0073] Optionally, in this embodiment, the signal frequency item of the target server can be tested according to the frequency division test signal in the following manner, but not limited to: multiplying the first frequency of the frequency division test signal by the frequency division coefficient to obtain a first candidate test signal, and multiplying the amplitude of the first candidate test signal by the operational amplifier coefficient to obtain a second candidate test signal, comparing the amplitude and frequency of the second candidate test signal with the amplitude and frequency of the reference test signal, and determining that the signal frequency item is normal when the difference between the amplitude of the second candidate test signal and the amplitude of the reference test signal is less than or equal to a first difference threshold, and the second difference between the frequency of the second candidate test signal and the amplitude of the reference test signal is less than or equal to a second difference threshold.

[0074] Optionally, in this embodiment, the first bus device and the second bus device may include but are not limited to a bus link. As an optional example, the first bus device and the second bus device may include but are not limited to devices that satisfy the I2C bus protocol. When the candidate address and the reference address are inconsistent, it is determined that the bus link item in the performance of the target server is abnormal. It can be understood that the I2C link of the target server may be abnormal.

[0075] In an exemplary embodiment, a voltage divider holding device is deployed in the candidate test device, and the controller is connected to the voltage divider holding device. The controller can control the candidate test device to use the target test signal to test the third test item in the performance of the target server in the following manner, but is not limited to: when the test item type includes a server control type, the target test signal is initiated to the target server, wherein the target server is configured to respond to the received target test signal and output a target power supply signal with a first voltage to power the candidate test device; the target power supply signal with a voltage of the first voltage provided by the target server is input into the voltage divider holding device to obtain a voltage divider power supply signal, wherein the voltage divider holding device is used to adjust the voltage of the signal input to the voltage divider holding device according to a voltage divider coefficient, and a value obtained by dividing the second voltage of the voltage divider power supply signal by the first voltage of the target power supply signal is equal to the voltage divider coefficient; according to the voltage divider power supply signal, the power supply item in the performance of the target server is tested, wherein the third test item in the performance of the target server includes the power supply item.

[0076] Optionally, in this embodiment, the power supply item in the performance of the target server can be tested according to the divided power supply signal in the following manner, but not limited to: multiplying the second voltage of the divided power supply signal by the voltage division coefficient to obtain a candidate power supply signal, comparing the third voltage of the candidate power supply signal with the first voltage of the reference power supply signal, and determining that the power supply item in the performance of the target server is normal when the voltage difference between the third voltage and the first voltage is less than or equal to the voltage difference threshold.

[0077] Optionally, in this embodiment, the target test device also includes a power supply conversion device, and the controller is connected to the power supply conversion device. The above method also includes: inputting the received target power supply signal into the power supply conversion device to obtain a converted power supply signal, wherein the power supply conversion device is used to adjust the voltage of the power supply signal input to the power supply conversion device according to a voltage division coefficient, and the value obtained by dividing the third voltage of the converted power supply signal by the first voltage of the target power supply signal is equal to the voltage division coefficient, and the third voltage is equal to the second voltage.

[0078] In this way, all signals of the x16 MCIO interface of the motherboard of the server to be tested can be fully covered, ensuring the test coverage and improving the product quality of the server. The accompanying test equipment (for example, PCI-E 5.0 test card) is transferred to the motherboard to be tested through the server test equipment, reducing the loss of the accompanying test equipment (for example, PCI-E 5.0 test card) and greatly reducing the test cost.

[0079] In order to better understand the implementation process of the server testing method in the embodiment of the present application, the server testing method in the embodiment of the present application is explained and illustrated in combination with optional embodiments below, which can be applicable to but not limited to the embodiment of the present application.

[0080] Figure 5 FIG. 1 is a schematic diagram of a connection between an optional server to be tested, a server testing device, and a companion testing device according to an embodiment of the present application. Figure 5 As shown, the server to be tested may be but is not limited to being deployed with a MICO interface and a USB interface, the server test equipment is deployed with a MICO gold finger interface, a USB interface and a standard PCIe interface, the server test equipment is connected to the server to be tested through the MICO gold finger interface, and the server test equipment is connected to the accompanying test equipment (for example, a PCIe test card) through a standard PCIe interface.

[0081] The server test equipment is equipped with an MCU module (equivalent to a controller), an op amp module (equivalent to an op amp device), a divider module (equivalent to a divider device), an 12C module (equivalent to a second bus device), a voltage divider holding module (equivalent to a voltage divider holding device), a power supply conversion module (equivalent to a power supply conversion device), a USB module and an LED module, wherein the I2C detection chip includes an 12C module, and the PCIE redundancy detection chip includes an op amp module and a divider module.

[0082] Figure 6 is a schematic diagram of an optional server testing method according to an embodiment of the present application, combined with Figure 5 , Figure 6 As shown, the mainboard to be tested in the server to be tested can be, but is not limited to, connected as a host computer to a controller (eg, MCU module) in the server test equipment via an X16 MCU interface.

[0083] The server test equipment may include, but is not limited to, a controller (e.g., an MCU module), a USB interface, an LED light, a PCI-E slot light, and the like. The server test equipment may be connected to, but is not limited to, the X16 MCIO interface of the motherboard to be tested, and a companion test equipment (e.g., a PCI-E 5.0 test card) may be inserted into the PCI-E slot of the server test equipment. The controller (e.g., an MCU module) may be used, but is not limited to, to obtain and calculate the signal frequency of the sideband signal of the X16 MCIO interface of the motherboard to be tested in real time, and in combination with the developed driver, the obtained inspection results may be written into the cache of the MCU, and the signal may be forwarded as a hub of the PCI-E5.0 high-speed signal and the I2C signal.

[0084] The motherboard under test also acts as a host computer to detect the quality, bandwidth, rate, etc. of the PCI-E signal. If the MCU fails to check, the control LED lights up red and informs the motherboard under test (host computer) of the result through the USB interface.

[0085] In the case where it is necessary to test the test items other than the quality, bandwidth and rate of the PCI-E signal, the test items can be tested by the test device deployed in the server test equipment, for example, in the case where it is desired to test whether the I2C link in the performance of the server is normal, it can be simulated by the I2C detection chip. The I2C data (for example, the I2C signal) is sent back to the mainboard, and the mainboard to be tested will actively scan all I2C modules (equivalent to the first main line device) on the mainboard to be tested when it is powered on. The server test equipment is designed with an I2C module (equivalent to the second bus device) and has a specific unique address. When the mainboard to be tested scans the address of the I2C module on the server test device (equivalent to the target address), the corresponding interruption inside the module will be triggered. On the one hand, the I2C module will reply to the mainboard to be tested. The ACK signal of the address exists, so that the mainboard to be tested determines whether the current scan address exists. On the other hand, the I2C module transmits the scanned information (for example, the scanned address) to the MCU module, and the MCU module can be used to judge whether the I2C is scanned normally later, so as to judge whether the I2C link is normal.

[0086] For another example, if you want to test the frequency of the clock signal (CLK signal) in the performance of the server, the MCIO interface has multiple 100M CLK signal inputs. You can, but are not limited to, select one of the CLKs for the PCIE test card to work, and the remaining CLKs are detected by the MCU (equivalent to the controller) after frequency division. Since the 100M CLK has a fast signal frequency and low signal amplitude, the MCU will not be able to identify and detect the normal frequency if it is directly connected to the MCU. Therefore, the server test equipment first connects the CLK input signal to the operational amplifier module (equivalent to the operational amplifier device) to increase the signal amplitude, and then connects to a 16-frequency division module (equivalent to the frequency division device). This module can reduce the input frequency to 1 / 16 times the input frequency, that is, after frequency division, the signal frequency becomes 6.25M. The MCU can collect the real frequency of this signal after frequency division through functions such as input capture, and then obtain the real signal source frequency through inverse calculation.

[0087] If it is necessary to cover other sideband control signals to improve the test items of the server performance, the working state of MICO can be set, but is not limited to, including the following:

[0088] 1) The access presence signal of the MCIO device. After the server test equipment is connected to the server to be tested, it will immediately pull down the signal. When the server to be tested detects that the signal is low, it recognizes the presence status. Many logics of the server to be tested will depend on whether the presence is normal, so it is important to determine whether it is in place.

[0089] 2) Enable signals for logical interactions, such as whether to enable power supply, require some signals in the sideband signal to be in a high or low state. The server test equipment will pull up or down such signals according to the requirements of the server to be tested.

[0090] 3) The sign signal of whether the MCIO power supply is normal. In order to ensure the normal working logic of the server to be tested, the server test equipment simulates the normal working state, pulls up or down the state of this type of signal, so that the server to be tested can perform logical judgment normally.

[0091] 4) BIOS recognizes the identification signal of PCIEX4 / X8 / X16. The device will set the high and low states of such signals according to the test requirements, so as to determine the working state that needs to be configured when the BIOS starts the self-test.

[0092] Through the vertical design adopted in the embodiment of the present application, the remaining interfaces that are blocked in the traditional solution can also be exposed, so that they can be tested simultaneously with the mainboard X16 MCIO interface, reducing the test complexity, and improving the signal coverage of the X16 MCIO interface through signal amplification chip detection and MCU module operation, so that the spare signals can also be detected together; at the same time, the design reduces the use of PCI-E cards, reduces testing costs, and reduces occupied space.

[0093] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes a number of instructions for a terminal device (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in each embodiment of the present application.

[0094] In this embodiment, a testing device for a server is also provided, which is used to implement the above-mentioned embodiments and preferred implementation modes, and the descriptions that have been made will not be repeated. As used below, the term "module" can implement a combination of software and / or hardware of a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, the implementation of hardware, or a combination of software and hardware, is also possible and conceivable.

[0095] In this embodiment, a server testing device is also provided. A controller and a plurality of testing devices are deployed in the server testing device. The controller is used to connect the server to be tested and the accompanying testing device respectively. The accompanying testing device is used to test a first test item in the performance of the server to be tested. The device is applied to the controller. Figure 7 is a structural block diagram of a server testing device according to an embodiment of the present application, such as Figure 7 As shown, the device comprises:

[0096] The receiving module 702 is used to receive a target test request initiated by the connected target server, wherein the target test request is used to request to test a second test item in the performance of the target server;

[0097] A detection module 704 is used to respond to the target test request and detect a matching degree between the first test item and the second test item provided by the accompanying test device, wherein the matching degree is used to indicate whether the accompanying test device can implement the second test item;

[0098] A construction module 706, configured to construct a target test device corresponding to the second test item using the multiple test devices when the matching degree indicates that the companion test device fails to implement the second test item;

[0099] The control module 708 is used to control the target test device to test the second test item in the performance of the target server.

[0100] Through the above-mentioned device, the test items in the performance of the server that can be implemented by the accompanying test device are limited. In the case that the accompanying test device fails to implement the test items in the performance of the server that is desired to be tested, it is possible but not limited to constructing a test device that can implement the test items in the performance of the server that is desired to be tested through the test devices deployed in the server test device. The constructed test device is used to test the test items that cannot be implemented by the accompanying test device, thereby expanding the test scope of the test items in the performance of the server that can be implemented, avoiding the need to replace the accompanying test device to implement the testing of the unachievable test items, reducing the time required for testing the server, and solving the problem of low testing efficiency of the server, thereby achieving the effect of improving the testing efficiency of the server.

[0101] In an exemplary embodiment, the construction module includes:

[0102] A searching unit, configured to search for a target test device corresponding to a third test item from test items and test devices having a corresponding relationship, wherein the third test item is a test item in the performance of the target server that the accompanying test device fails to implement in the second test item;

[0103] A construction unit is used to construct the target test device using the target test device and the companion test device.

[0104] In an exemplary embodiment, the construction unit is used to: when the target test device includes N test devices, construct the target test device using the N test devices and the companion test device by performing the following steps, wherein N is a positive integer:

[0105] Extracting a target connection relationship corresponding to the third test item and the N test devices from the test items, test devices, and connection relationships having corresponding relationships;

[0106] Connect the N test devices according to the target connection relationship to obtain candidate test devices;

[0107] The candidate test device and the accompanying test device are determined as the target test device.

[0108] In an exemplary embodiment, the control module includes:

[0109] an extraction unit, configured to control the candidate test device to extract a target test signal corresponding to the third test item in the performance of the target server according to the test item type corresponding to the third test item in the performance of the target server;

[0110] The testing unit is used to control the candidate testing device to test the third test item in the performance of the target server using the target test signal, and control the accompanying testing device to test the test items in the second test items in the performance of the target server except the third test item.

[0111] In an exemplary embodiment, the extraction unit is used to:

[0112] In the case where the test item type includes a bus link type and / or a signal frequency type, generating and initiating a signal generation instruction to the target server, wherein the signal generation instruction is used to instruct the target server to generate the target test signal, and receiving the target test signal returned by the target server in response to the signal generation instruction;

[0113] In a case where the test item type includes a server control type, the candidate test device is controlled to generate the target test signal.

[0114] In an exemplary embodiment, an operational amplifier device and a frequency divider device are deployed in the candidate test device, the controller is connected to the operational amplifier device and the frequency divider device, and the test unit is used to: when the test item type includes a signal frequency type, input the target test signal returned by the target server received into the operational amplifier device to obtain an operational amplifier test signal, wherein the operational amplifier device is used to adjust the amplitude of the signal input into the operational amplifier device according to the operational amplifier coefficient, and the value obtained by dividing the first amplitude of the operational amplifier test signal by the second amplitude of the target test signal is equal to the operational amplifier coefficient; input the operational amplifier test signal into the frequency divider device to obtain a frequency division test signal, wherein the frequency division device is used to adjust the frequency of the signal input into the frequency division device according to the frequency division coefficient, and the value obtained by dividing the first frequency of the frequency division test signal by the second frequency of the operational amplifier test signal is equal to the frequency division coefficient, wherein the controller is configured to allow processing of a signal with an amplitude of the first amplitude and a frequency of the first frequency; test the signal frequency item of the target server according to the frequency division test signal, wherein the third test item in the performance of the target server includes the signal frequency item;

[0115] A first bus device is deployed in the target server, a second bus device is deployed in the candidate test device, the controller is connected to the second bus device, the first bus device is connected to the second bus device, and the test unit is further used to: when the test item type includes a bus link type, detect the candidate address of the second bus device, generate and initiate a target query instruction to the target server, wherein the target query instruction is used to instruct the target server to search for the address corresponding to the second bus device in a reference address set, the reference address set is used to record the addresses of the bus devices mounted on the target server, receive the reference address of the second bus device returned by the target server in response to the target query instruction, compare the candidate address and the reference address, and when the candidate address and the reference address are consistent, determine that the bus link item in the performance of the target server is normal, wherein the third test item in the performance of the target server includes the bus link item.

[0116] In an exemplary embodiment, a voltage division holding device is disposed in the candidate test device, the controller is connected to the voltage division holding device, and the test unit is further used for:

[0117] In the case where the test item type includes a server control type, initiating the target test signal to the target server, wherein the target server is configured to output a target power supply signal with a first voltage in response to the received target test signal to power the candidate test device;

[0118] Inputting the target power supply signal provided by the target server with the first voltage into a voltage divider holding device to obtain a voltage divider power supply signal, wherein the voltage divider holding device is used to adjust the voltage of the signal input to the voltage divider holding device according to a voltage divider coefficient, and a value obtained by dividing the second voltage of the voltage divider power signal by the first voltage of the target power supply signal is equal to the voltage divider coefficient;

[0119] A power supply item in the performance of the target server is tested according to the divided voltage power supply signal, wherein the third test item in the performance of the target server includes the power supply item.

[0120] It should be noted that the above modules can be implemented by software or hardware. For the latter, it can be implemented in the following ways, but not limited to: the above modules are all located in the same processor; or the above modules are located in different processors in any combination.

[0121] An embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to execute the steps of any of the above method embodiments when running.

[0122] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk.

[0123] An embodiment of the present application further provides an electronic device, including a memory and a processor, wherein a computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0124] In an exemplary embodiment, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor, and the input / output device is connected to the processor.

[0125] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps in any one of the above method embodiments are implemented.

[0126] An embodiment of the present application further provides another computer program product, including a non-volatile computer-readable storage medium, wherein the non-volatile computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in any of the above method embodiments are implemented.

[0127] An embodiment of the present application also provides a computer program, which includes computer instructions stored in a computer-readable storage medium; a processor of a computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the computer device performs the steps in any one of the above method embodiments.

[0128] For specific examples in this embodiment, reference may be made to the examples described in the above embodiments and exemplary implementation modes, and this embodiment will not be described in detail herein.

[0129] Obviously, those skilled in the art should understand that the above modules or steps of the present application can be implemented by a general computing device, they can be concentrated on a single computing device, or distributed on a network composed of multiple computing devices, they can be implemented by a program code executable by a computing device, so that they can be stored in a storage device and executed by the computing device, and in some cases, the steps shown or described can be executed in a different order from that herein, or they can be made into individual integrated circuit modules, or multiple modules or steps therein can be made into a single integrated circuit module for implementation. Thus, the present application is not limited to any specific combination of hardware and software.

[0130] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the principles of the present application shall be included in the protection scope of the present application.

Claims

1. A server testing method, characterized in that: A controller and a plurality of test devices are deployed in the server test device, the controller is used to connect the server to be tested and the accompanying test device respectively, the accompanying test device is used to test the first test item in the performance of the server to be tested, the method is applied to the controller, and the method includes: Receiving a target test request initiated by the connected target server, wherein the target test request is used to request to test a second test item in the performance of the target server; In response to the target test request, detecting a matching degree between the first test item and the second test item provided by the accompanying test device, wherein the matching degree is used to indicate whether the accompanying test device can implement the second test item; In a case where the matching degree indicates that the companion test device fails to implement the second test item, constructing a target test device corresponding to the second test item using the plurality of test devices; The target test device is controlled to test the second test item in the performance of the target server.

2. The method according to claim 1, characterized in that The using the plurality of test devices to construct a target test device corresponding to the second test item includes: Searching for a target test device corresponding to a third test item from test items and test devices having a corresponding relationship, wherein the third test item is a test item in the performance of the target server that the accompanying test device fails to implement in the second test item; The target test device and the companion test device are used to construct the target test device.

3. The method according to claim 2, characterized in that The method of using the target test device and the accompanying test device to construct the target test device comprises: when the target test device includes N test devices, using the N test devices and the accompanying test device to construct the target test device by performing the following steps, wherein N is a positive integer: Extracting a target connection relationship corresponding to the third test item and the N test devices from the test items, test devices, and connection relationships having corresponding relationships; Connect the N test devices according to the target connection relationship to obtain candidate test devices; The candidate test device and the accompanying test device are determined as the target test device.

4. The method according to claim 1, characterized in that: The controlling the target test device to test the second test item in the performance of the target server includes: According to the test item type corresponding to the third test item in the performance of the target server, controlling the candidate test device to extract the target test signal corresponding to the third test item in the performance of the target server; The candidate test device is controlled to test the third test item in the performance of the target server using the target test signal, and the accompanying test device is controlled to test the test items in the second test items in the performance of the target server except the third test item.

5. The method according to claim 4, characterized in that The step of controlling the candidate test device to extract a target test signal corresponding to the third test item in the performance of the target server according to the test item type corresponding to the third test item in the performance of the target server comprises: In the case where the test item type includes a bus link type and / or a signal frequency type, generating and initiating a signal generation instruction to the target server, wherein the signal generation instruction is used to instruct the target server to generate the target test signal, and receiving the target test signal returned by the target server in response to the signal generation instruction; In a case where the test item type includes a server control type, the candidate test device is controlled to generate the target test signal.

6. The method according to claim 4, characterized in that An operational amplifier device and a frequency divider device are deployed in the candidate test device, and the controller is connected to the operational amplifier device and the frequency divider device. The control of the candidate test device to use the target test signal to test the third test item in the performance of the target server includes: when the test item type includes a signal frequency type, the target test signal returned by the target server is input into the operational amplifier device to obtain an operational amplifier test signal, wherein the operational amplifier device is used to adjust the amplitude of the signal input into the operational amplifier device according to the operational amplifier coefficient, and the first amplitude of the operational amplifier test signal is divided by the second amplitude of the target test signal. The obtained value is equal to the operational amplifier coefficient; the operational amplifier test signal is input into the frequency division device to obtain a frequency division test signal, wherein the frequency division device is used to adjust the frequency of the signal input into the frequency division device according to the frequency division coefficient, and the value obtained by dividing the first frequency of the frequency division test signal by the second frequency of the operational amplifier test signal is equal to the frequency division coefficient, wherein the controller is configured to allow processing of a signal having an amplitude of the first amplitude and a frequency of the first frequency; the signal frequency item of the target server is tested according to the frequency division test signal, wherein the third test item in the performance of the target server includes the signal frequency item; A first bus device is deployed in the target server, a second bus device is deployed in the candidate test device, the controller is connected to the second bus device, the first bus device is connected to the second bus device, and the control of the candidate test device uses the target test signal to test the third test item in the performance of the target server, including: when the test item type includes a bus link type, detecting a candidate address of the second bus device, generating and initiating a target query instruction to the target server, wherein the target query instruction is used to instruct the target server to search for an address corresponding to the second bus device in a reference address set, the reference address set is used to record the addresses of the bus devices mounted on the target server, receiving a reference address of the second bus device returned by the target server in response to the target query instruction, comparing the candidate address and the reference address, and when the candidate address and the reference address are consistent, determining that the bus link item in the performance of the target server is normal, wherein the third test item in the performance of the target server includes the bus link item.

7. The method according to claim 4, characterized in that The candidate test device is provided with a voltage divider holding device, the controller is connected to the voltage divider holding device, and the controlling the candidate test device to use the target test signal to test the third test item in the performance of the target server includes: In the case where the test item type includes a server control type, initiating the target test signal to the target server, wherein the target server is configured to output a target power supply signal with a first voltage in response to the received target test signal to power the candidate test device; Inputting the target power supply signal provided by the target server with the first voltage into a voltage divider holding device to obtain a voltage divider power supply signal, wherein the voltage divider holding device is used to adjust the voltage of the signal input to the voltage divider holding device according to a voltage divider coefficient, and a value obtained by dividing the second voltage of the voltage divider power signal by the first voltage of the target power supply signal is equal to the voltage divider coefficient; A power supply item in the performance of the target server is tested according to the divided voltage power supply signal, wherein the third test item in the performance of the target server includes the power supply item.

8. A server testing device, characterized in that: A controller and a plurality of test devices are deployed in the server test device, wherein the controller is used to connect the server to be tested and the accompanying test device respectively, and the accompanying test device is used to test the first test item in the performance of the server to be tested. The device is applied to the controller, and the device includes: A receiving module, configured to receive a target test request initiated by a connected target server, wherein the target test request is used to request a test of a second test item in the performance of the target server; a detection module, configured to respond to the target test request and detect a matching degree between the first test item and the second test item provided by the accompanying test device, wherein the matching degree is used to indicate whether the accompanying test device can implement the second test item; A construction module, configured to construct a target test device corresponding to the second test item using the multiple test devices when the matching degree indicates that the companion test device fails to implement the second test item; The control module is used to control the target test device to test the second test item in the performance of the target server.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein the computer program implements the steps of the method described in any one of claims 1 to 7 when executed by a processor.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method described in any one of claims 1 to 7 are implemented.

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