Detector testing device

Abstract

The invention provides a detector testing device, relates to the field of infrared detectors, and aims to efficiently complete the preparation process of detector testing. The detector feeding device comprises a test base, a test base outer frame, a pressing mechanism, a pulling mechanism and a first jacking mechanism. The edge of the test base is provided with a first blocking structure. A second blocking structure is arranged at one end of the testing base outer frame. The first jacking mechanism is configured to jack the test base until the first blocking structure abuts against the second blocking structure. The first end of the pulling mechanism is connected with the pressing mechanism, the second end of the pulling mechanism is connected with the first jacking mechanism, the pulling mechanism is installed on the test base outer frame and can move in the first direction relative to the test base outer frame, and the pulling mechanism is configured to pull the pressing mechanism to descend in the first direction relative to the test base outer frame. And the pressing mechanism is in contact with the plurality of detectors.

Description

Technical Field

[0001] The invention relates to the field of infrared detectors, and in particular to a detector testing device. Background Art

[0002] One of the most basic and core steps in the infrared detector test device is to connect and power on the infrared detector with the corresponding data acquisition and processing circuit. In order to ensure the tightness of the connection between the infrared detector and the corresponding data acquisition and processing circuit, a clamping device is usually provided in the detector test device to clamp the corresponding data acquisition and processing circuit of the infrared detector. However, the implementation method in the prior art is complex in structure, high in cost, single in function, difficult to operate and low in efficiency. Summary of the invention

[0003] An embodiment of the present invention provides a detector testing device, aiming to efficiently complete the preparation process of the detector test.

[0004] To achieve the above object, the embodiments of the present invention adopt the following technical solutions:

[0005] The present application provides a detector testing device, including a test base, a test base outer frame, a clamping mechanism, a pulling mechanism and a first lifting mechanism. The test base is used to place multiple detectors. A first blocking structure is provided at the edge of the test base. The test base can be moved into the test base outer frame. A second blocking structure is provided at one end of the test base outer frame. When the test base is located in the test base outer frame, the test base is located on a side of the first lifting mechanism close to the second blocking structure, and the first lifting mechanism is configured to lift the test base until the first blocking structure and the second blocking structure abut against each other. The clamping mechanism is provided at one end of the test base outer frame having the second blocking structure. When the test base is located in the test base outer frame, the clamping mechanism is located on a side of the test base away from the first lifting mechanism. The first end of the pulling mechanism is connected to the clamping mechanism, the second end of the pulling mechanism is connected to the first lifting mechanism, the pulling mechanism is installed on the test base outer frame, and can move relative to the test base outer frame along a first direction, and the first direction is the relative arrangement direction of the first end and the second end of the pulling mechanism. After the first blocking structure and the second blocking structure abut against each other, the first lifting mechanism is further configured to continue lifting the test base to pull the pulling mechanism to descend along the first direction relative to the test base outer frame. The pulling mechanism is configured to pull the clamping mechanism to descend along the first direction relative to the test base outer frame until the clamping mechanism contacts the plurality of detectors.

[0006] The first lifting mechanism lifts the test base, and the test base and the multiple detectors located on the test base rise. When the first blocking structure at the edge of the test base and the second blocking structure of the test base outer frame are offset, the test base and the multiple detectors located on the test base cannot continue to rise. In this case, the first lifting mechanism continues to lift the test base, which will be affected by the reaction force of the test base. Driven by the reaction force of the test base, the pulling mechanism descends along the first direction relative to the test base outer frame, driving the descent of the clamping mechanism connected above the pulling mechanism until the clamping mechanism contacts the multiple detectors, and finally the multiple detectors are clamped. Since the operator only needs to place the multiple detectors at the corresponding positions on the upper surface of the test base and control the first lifting mechanism to work, it is relatively simple to use. In addition, since the compression and power-on of multiple detectors can be completed at one time, the time required for the preparation work before completing the infrared detector performance test can be saved, so for the entire detector test, the efficiency is improved.

[0007] As a possible implementation, the test base includes a fixed plate, a bearing mechanism and a guide mechanism. The bearing mechanism is arranged on a side of the fixed plate away from the first lifting mechanism. The surface of the bearing mechanism facing away from the fixed plate is used to place multiple detectors. A first slot is provided on the fixed plate, and at least part of the first lifting mechanism can pass through the first slot and abut against the surface of the bearing mechanism facing the fixed plate. The guide mechanism extends along a first direction, and the guide mechanism is connected to the fixed plate and the bearing mechanism, and the guide mechanism is configured to make the bearing mechanism move relative to the fixed plate along the first direction.

[0008] As a possible implementation, the bearing mechanism includes a test fixture, a first base plate, and a plurality of support columns. The test fixture and the first base plate are arranged opposite to each other and spaced apart in a first direction, the first base plate is closer to the fixed plate than the test fixture, and the plurality of support columns are connected between the test fixture and the first base plate. The test fixture includes a first surface and a second surface arranged opposite to each other in the first direction, the first surface is used to place a plurality of detectors, and two opposite side surfaces of the test fixture have bosses, the bosses are arranged close to the second surface, and the bosses form a first blocking structure.

[0009] As a possible implementation, the guide mechanism includes a first guide mechanism and a second guide mechanism that cooperate with each other, the first guide mechanism is connected to the fixed plate, the second guide mechanism is connected to the first base plate, and the second guide mechanism can move in a first direction relative to the first guide mechanism.

[0010] As a possible implementation manner, the first guide mechanism is a bearing guide rod, the second guide mechanism is a bearing, and the bearing guide rod is inserted into the bearing.

[0011] As a possible implementation, the detector test device also includes a movable base plate and a first movable mechanism. The test base is arranged on the movable base plate, and a second slot is arranged on the movable base plate. At least part of the first lifting mechanism can pass through the second slot and abut against the surface of the bearing mechanism facing the fixed plate. The first movable mechanism is arranged on a side of the movable base plate close to the test base and is connected to the fixed plate. The first movable mechanism is configured to drive the test base to move in a direction close to or away from the outer frame of the test base.

[0012] As a possible implementation, the first moving mechanism includes: a first guide rail, a second guide rail and a driving module. The first guide rail and the second guide rail are arranged in parallel and are arranged on a side of the moving base plate close to the test base. The first guide rail is slidably connected to the fixed plate, and the second guide rail is slidably connected to the fixed plate, and the second slot is arranged between the first guide rail and the second guide rail. The driving module is connected to the fixed plate, and the driving module is configured to drive the fixed plate to move along the first guide rail and the second guide rail.

[0013] As a possible implementation, the test base frame includes a side plate and a reference plate. The side plate is arranged along a first direction, the reference plate is arranged on a side of the side plate close to the clamping mechanism, and a portion of the reference plate forms a second blocking structure. The side plate is provided with a third slot, the reference plate is provided with a fourth slot, and the pulling mechanism passes through the fourth slot and the third slot in sequence along the first direction.

[0014] As a possible implementation method, the detector testing device also includes an elastic member, which is arranged between the clamping mechanism and the reference plate. The pulling mechanism is passed through the elastic member. The elastic member is configured to push the clamping mechanism to rise and return to its initial position after the pulling mechanism stops pulling the clamping mechanism down.

[0015] As a possible implementation, the detector test device also includes: a first limiting structure, a second limiting structure, a third limiting structure and a fourth limiting structure. The first limiting structure is arranged on a side of the reference plate close to the first lifting mechanism. The second limiting structure passes through the reference plate. The second limiting structure is arranged in the first limiting structure and can move along the first direction relative to the first limiting structure. One end of the second limiting structure is connected to the clamping mechanism, and the second end of the second limiting structure is blocked outside the end of the first limiting structure away from the reference plate. The third limiting structure and the fourth limiting structure. The third limiting structure passes through the reference plate.

[0016] The third limiting structure can move relative to the reference plate along the first direction. The fourth limiting structure is arranged between the clamping mechanism and the reference plate.

[0017] The position of the fourth limiting structure on the third limiting structure is adjustable.

[0018] As a possible implementation, the detector test device also includes a movable base plate, and the test base outer frame also includes a second base plate. The second base plate is located on the side of the movable base plate away from the clamping mechanism, and the movable base plate is provided with a fifth slot, and one end of the side plate away from the clamping mechanism passes through the fifth slot and is connected to the second base plate. The detector test device also includes a second movable mechanism, and the second movable mechanism includes a support seat, a first motion structure, a second motion structure, and a second lifting mechanism. The support seat is arranged on the side of the movable base plate close to the test base, and is arranged on the outer side of the side plate. The first motion structure is connected to the side of the support seat close to the side plate. The second motion structure is connected to the side of the side plate close to the support seat, and cooperates with the first motion structure. The second lifting mechanism is arranged on the side of the second base plate away from the clamping mechanism. The second lifting mechanism is configured to lift the test base outer frame and drive the second motion structure to move relative to the first motion structure along the first direction.

[0019] As a possible implementation, the first motion structure includes a third guide rail and a fifth limiting structure. The second motion structure includes an adapter plate slidably connected to the third guide rail, and the third guide rail is arranged along the first direction. The fifth limiting structure is arranged on the third guide rail, and the position of the fifth limiting structure on the third guide rail is adjustable. The adapter plate is located on a side of the fifth limiting structure close to the second bottom plate, and the adapter plate can move along the third guide rail until it abuts against the fifth limiting structure.

[0020] As a possible implementation, the detector testing device also includes a lifting mechanism mounting plate, the first lifting mechanism is arranged on a side of the lifting mechanism mounting plate close to the clamping mechanism, and the second end of the pulling mechanism is connected to the first lifting mechanism through the lifting mechanism mounting plate. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 A schematic diagram of a detector testing device provided in an embodiment of the present application;

[0022] Figure 2 A schematic diagram of a detector testing device provided in an embodiment of the present application;

[0023] Figure 3 A schematic diagram of a detector testing device provided in an embodiment of the present application;

[0024] Figure 4 A schematic diagram of a detector loading device provided in an embodiment of the present application;

[0025] Figure 5 A schematic diagram of a detector testing device provided in an embodiment of the present application.

[0026] Description of reference numerals: test base 1; test base outer frame 2; clamping mechanism 3; lifting mechanism mounting plate 4; pulling mechanism 5; first lifting mechanism 6; second moving mechanism 10; second lifting mechanism 103; fifth limiting structure 104; bearing mechanism 13; fixing plate 12; guide mechanism 14, first slot 121; test fixture 131; first bottom plate 132; support column 133; support seat 101; test needle seat 111; side plate 21; reference plate 2 2; third slot 211; movable bottom plate 91; first moving mechanism 9, first motion structure 102; second slot 911; first guide rail 921; second guide rail 922; drive module 925; fourth slot 212; reset assembly 7; pressing plate 31; second motion structure 105; pressing plate adapter plate 32; first limiting structure 81; second limiting structure 82; third limiting structure 83; fourth limiting structure 84; second bottom plate 23; fifth slot 912; DETAILED DESCRIPTION

[0027] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0028] Unless the context requires otherwise, throughout the specification and claims, the term "including" is to be interpreted as an open, inclusive meaning, that is, "including, but not limited to". In the description of the specification, the terms "one embodiment", "some embodiments", "exemplary embodiments", "examples" or "some examples" and the like are intended to indicate that specific features, structures, materials or characteristics associated with the embodiment or example are included in at least one embodiment or example of the present disclosure. The schematic representations of the above terms do not necessarily refer to the same embodiment or example. In addition, the specific features, structures, materials or characteristics described may be included in any one or more embodiments or examples in any appropriate manner.

[0029] As used herein, "parallel", "perpendicular", and "equal" include the situations described and situations similar to the situations described, and the range of the similar situations is within the acceptable deviation range, wherein the acceptable deviation range is determined by a person of ordinary skill in the art taking into account the measurement in question and the errors associated with the measurement of a particular quantity (i.e., the limitations of the measurement system). For example, "parallel" includes absolute parallelism and approximate parallelism, wherein the acceptable deviation range of approximate parallelism may be, for example, a deviation within 5°; "perpendicular" includes absolute perpendicularity and approximate perpendicularity, wherein the acceptable deviation range of approximate perpendicularity may also be, for example, a deviation within 5°. "Equal" includes absolute equality and approximate equality, wherein the acceptable deviation range of approximate equality may be, for example, the difference between the two equalities is less than or equal to 5% of either one.

[0030] The terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "plurality" means two or more.

[0031] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "connected" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances. In addition, when describing the pipeline, the "connected" and "connection" used in the present invention have the meaning of conduction. The specific meaning needs to be understood in conjunction with the context.

[0032] In the embodiments of the present invention, words such as "exemplary" or "for example" are used to indicate examples, illustrations or explanations. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present invention should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0033] In recent years, with the rapid development of optoelectronic technology and electronic technology in the communications industry, infrared detector technology has been increasingly and widely used in different fields. According to the working principle, infrared detectors can be divided into two categories: non-cooled detectors and cooled detectors. Cooled detectors are mainly used in fields such as meteorological monitoring, while non-cooled detectors are more widely used in the civilian field.

[0034] In order to ensure the factory quality of infrared detectors (hereinafter referred to as detectors), it is necessary to perform corresponding tests on the detectors, such as the need to perform a response rate test on the detectors. In the relevant tests of the detectors, a data acquisition module is usually also included. The data acquisition module is connected to multiple detectors respectively to collect the response data made by each detector. For example, when the detector is tested for response rate, when the radiation emitted by the black body target surface hits multiple infrared detectors, the data acquisition module can collect the voltage response of each connected infrared detector to the radiation emitted by the black body target surface. After computer processing, the performance of each infrared detector regarding the response rate is obtained.

[0035] Therefore, in order to accurately and quickly complete the test of infrared detectors, it is first necessary to connect the detector to the corresponding data acquisition and processing circuits and power them on. Since the technology of calculating detector performance based on detector response is already very mature, the time it takes for computers to process data is difficult to further shorten. Therefore, the shorter the time it takes to complete the step of connecting the detector to the corresponding data acquisition and processing circuits, the more detector performance tests can be completed per unit time, and the higher the detection efficiency will be.

[0036] Based on this idea, the present application proposes a detector testing device, for example, Figure 1 See Figure 1 The detector testing device 100 includes a test base 1 , a test base outer frame 2 , a pressing mechanism 3 , a pulling mechanism 5 and a first lifting mechanism 6 .

[0037] The test base 1 is used to place multiple detectors. A first blocking structure is provided at the edge of the test base 1. The test base 1 can be moved into the test base outer frame 2. A second blocking structure is provided at one end of the test base outer frame 2. When the test base 1 is located in the test base outer frame 2, the test base 1 is located on the side of the first lifting mechanism 6 close to the second blocking structure. The first lifting mechanism 6 is configured to lift the test base 1 until the surface of the first blocking structure close to the second blocking structure abuts against the surface of the second blocking structure close to the first blocking structure. The clamping mechanism 3 is provided at one end of the test base outer frame 2 having the second blocking structure. When the test base 1 is located in the test base outer frame 2, the clamping mechanism 3 is located on the side of the test base 1 facing away from the first lifting mechanism 6.

[0038] The test base 1 can be moved to the inside of the test base outer frame 2, and can also be moved to the outside of the test base outer frame 2. When the test base 1 is moved to the inside of the test base outer frame 2, the operator can press the detector by operating the first lifting mechanism 6, so that the virtual connection detector placed on the test base 1 can be connected to the corresponding data acquisition and processing circuit for power. When the test base 1 is moved to the outside of the test base outer frame 2, the operator can perform loading and unloading operations more conveniently.

[0039] The first blocking structure of the test base 1 matches the second blocking layer of the test base outer frame 2. When the first lifting mechanism 6 lifts the test base, the test base 1 will move toward the direction close to the clamping mechanism 3, that is, Figure 1 The first blocking structure of the test base 1 and the second blocking layer of the test base outer frame 2 are matched with each other, so that the position of the test base 1 is relatively fixed and cannot continue to move along the positive direction of y.

[0040] After the first blocking structure and the second blocking structure are against each other, the first lifting mechanism 6 is further configured to continue lifting the test base 1 to pull the pulling mechanism 5 downward along the first direction relative to the test base outer frame 2. When the surface of the first blocking structure close to the second blocking structure and the surface of the second blocking structure close to the first blocking structure are against each other, there is a distance between the clamping mechanism 3 and the detector on the test base 1. At this time, the first lifting mechanism 6 is still lifting the test base 1. While the test base 1 is subjected to the force from the first lifting mechanism 6, a force of the same magnitude and opposite direction is also fed back to the first lifting mechanism 6, which is called a reaction force. Since the first blocking structure of the test base 1 and the second blocking layer of the test base outer frame 2 are matched with each other, the position of the test base 1 is relatively fixed. Therefore, at this time, the first lifting mechanism 6 continues to lift the test base 1 upward and will not cause the test base 1 to continue to rise. The first lifting mechanism 6 will move downward under the influence of the reaction force, that is, along Figure 1 Movement in the negative y direction.

[0041] Since the first end of the pulling mechanism 5 is connected to the clamping mechanism 3, and the second end of the pulling mechanism 5 is connected to the first lifting mechanism 6, the pulling mechanism 5 is installed on the test base outer frame 2, and can move relative to the test base outer frame 2 along the first direction, the first direction is the relative arrangement direction of the first end and the second end of the pulling mechanism 5, that is, Figure 1 The direction of the y-axis specifically includes the positive direction of y and the negative direction of y. The positive direction of y is the direction indicated by the arrow in the figure. The pulling mechanism 5 is configured to pull the pressing mechanism 3 downward relative to the test base outer frame 2 along the first direction, that is, along Figure 1 The negative direction of y decreases until the clamping mechanism 3 contacts multiple detectors.

[0042] As a possible implementation, the first lifting mechanism 6 is a cylinder. When the first lifting mechanism 6 is lifting, the piston rod of the cylinder is continuously extended. When the first lifting mechanism 6 finishes lifting, the piston rod of the cylinder is retracted. During the whole process, the lifting state is maintained by the piston rod of the cylinder being extended. Only when the clamping mechanism needs to be reset, that is, when the test is completed and the clamping mechanism is separated from the test base, the piston rod of the cylinder is retracted.

[0043] The first lifting mechanism lifts the test base, and the piston rod of the cylinder continues to extend, pushing the test base and the multiple detectors on the test base upward to rise in the first direction. When the first blocking structure and the second blocking structure are in contact, the test base and the multiple detectors on the test base cannot continue to rise in the first direction. In such a scenario, the first lifting mechanism continues to lift the test base, and the piston rod of the cylinder continues to extend. The first lifting mechanism is subjected to a reaction force from the test base. Since the first lifting mechanism is connected to the second end of the pulling mechanism, and the first end of the pulling mechanism is connected to the clamping mechanism, the first lifting mechanism is driven by the reaction force of the test base to descend in the first direction relative to the outer frame of the test base, driving the pulling mechanism to descend in the first direction. The downward movement of the pulling mechanism in the first direction also drives the clamping mechanism connected above the pulling mechanism to descend in the first direction. The distance between the clamping mechanism and the detectors above the test base gradually decreases, and finally the multiple detectors are clamped.

[0044] Since the operator only needs to place multiple detectors at corresponding positions on the test base and control the first lifting mechanism to work during the whole process, it is relatively simple to use. In addition, since multiple detectors can be pressed and powered on at one time, the time required for the preparation work before the infrared detector performance test can be saved, so the efficiency of the entire detector test is improved.

[0045] In some embodiments, Figure 3 As shown, the detector testing device also includes a lifting mechanism mounting plate 4, a first lifting mechanism 6 is arranged on a side of the lifting mechanism mounting plate 4 close to the clamping mechanism 3, and a second end of the pulling mechanism 5 is connected to the first lifting mechanism 6 through the lifting mechanism mounting plate 4.

[0046] As a possible implementation, the test base includes a fixing plate, a bearing mechanism and a guiding mechanism. Figure 2 As shown, the bearing mechanism 13 is arranged on the side of the fixing plate 12 away from the first lifting mechanism 6. The surface of the bearing mechanism 13 away from the fixing plate 12 is used to place multiple detectors. Figure 4 and Figure 2The fixing plate 12 is provided with a first slot 121, and at least a portion of the first lifting mechanism 6 can pass through the first slot 121 and abut against the surface of the bearing mechanism 13 facing the fixing plate 12. The guide mechanism 14 extends along the first direction, and the guide mechanism 14 is connected to the fixing plate 12 and the bearing mechanism 13, and the guide mechanism 14 is configured to enable the bearing mechanism 14 to move relative to the fixing plate 12 along the first direction.

[0047] The provision of the first slot 121 ensures that when the first lifting mechanism 6 performs a lifting operation, the piston rod in the cylinder will not be blocked by the fixing plate 12 and can extend from the first slot 121 to press against the bottom of the supporting mechanism 13 .

[0048] More specifically, Figure 2 As shown, the bearing mechanism 13 includes a test fixture 131, a first bottom plate 132 and a plurality of support columns 133. The test fixture 131 and the first bottom plate 132 are arranged opposite to each other and spaced apart in the first direction, the first bottom plate 132 is closer to the fixing plate 12 than the test fixture 131, and the plurality of support columns 133 are connected between the test fixture 131 and the first bottom plate 132. The test fixture 131 includes a first surface and a second surface arranged opposite to each other in the first direction, the first surface is used to place a plurality of detectors, and two opposite side surfaces of the test fixture 131 have bosses, the bosses are arranged close to the second surface, and the bosses form a first blocking structure.

[0049] The first lifting mechanism lifts the test base essentially through the first slot on the fixed plate to lift the first floor of the test base, and the piston rod extends through the first slot to contact the first bottom plate above the fixed plate, and under the action of the guide mechanism, the test base is accurately lifted along the first direction. Multiple support columns play a supporting role for the test base as a whole.

[0050] In some embodiments, the test fixture 131 includes a plurality of test needle holders installed through the first surface and the second surface, and the test needle holders are connected to the hardware and circuits related to the detector measurement below. The test needle holders act as interfaces, and each test needle holder corresponds to a detector. When the detector is pressed by the pressing mechanism, the detector is connected to the hardware and circuits related to the detector measurement below the test needle holder through the test needle holder, completing the preparation work for the detector test.

[0051] As a possible implementation, the test fixture 131 may be provided with different sizes and numbers of test pin holders 111 and different data acquisition and processing circuits connected to the test pin holders 111 according to the different models of the detector to be tested and the different test contents. The matching with the detector to be tested can be achieved by simply replacing the test fixture 131 corresponding to the model of the detector to be tested and the test contents.

[0052] As a possible implementation, Figure 1As shown, the test base frame 2 includes a side plate 21 and a reference plate 22. The side plate 21 is arranged along the first direction, and the reference plate 22 is arranged on a side of the side plate 21 close to the clamping mechanism 3, and a part of the reference plate 22 forms a second blocking structure. The test fixture 131 has bosses on two opposite sides, and the bosses are arranged close to the second surface, and the bosses form a first blocking structure, such as Figure 2 As shown in the dashed box.

[0053] Reference Figure 1 The width of the reference plate 22 is greater than the width of the side plate 21, and the part of the reference plate 22 protruding from the side plate 21 forms a second blocking structure. The two reference plates 22 of the two side plates 21 form two second blocking structures, which match the two first blocking structures formed on the two opposite sides of the test fixture 131. When the test base rises a certain distance inside the outer frame of the test base, the boss abuts against the reference plate 22 protruding from the side plate 21, resulting in the upward trend of the test base being limited by the second blocking structure.

[0054] As a possible implementation method, a pin is provided on the boss, and a pin control corresponding to the pin is provided at the edge of the test fixture 131. The pin hole and the corresponding pin can realize the quick connection and disassembly between the test fixture 131 and the test base 1, and realize precise positioning and installation.

[0055] As a possible implementation, refer to Figure 1 and Figure 4 , the pulling mechanism 5 is a connecting rod. The test base outer frame 2 is provided with a fourth slot 212 and a third slot 211, the side plate 21 is provided with a third slot 211, the reference plate 22 is provided with a fourth slot 212, and the pulling mechanism 5 passes through the fourth slot 212 and the third slot 211 in sequence along the first direction. The connecting rod is installed in the third slot 211 of the test base outer frame 2 through the fourth slot 212. The dimension of the third slot 211 in the first direction is smaller than the dimension of the test base outer frame 2 in the first direction, and is larger than the dimension of the connecting rod along the first direction. Since the dimension of the third slot 211 in the first direction is smaller than the dimension of the test base outer frame 2 in the first direction, and is larger than the dimension of the connecting rod along the first direction, it is ensured that the connecting rod can move relative to the test base outer frame 2 in the third slot 211 along the first direction. The top end of the connecting rod, that is, the first end of the pulling mechanism 5, is fixedly connected to the clamping mechanism 3. The lower end of the connecting rod is connected to the jacking mechanism mounting plate 4, Figure 1 Four connecting rods are shown in the figure, and part of each connecting rod passes through the outer frame 2 of the test base, and the upper end is connected to the clamping mechanism 3, and the lower end is connected to the jacking mechanism mounting plate 4. While pulling the clamping mechanism 3, it is also reused as a guiding mechanism to ensure the precise descent of the clamping mechanism 3 along the first direction (y direction).

[0056] It should be noted that when the operator places the detector on the test needle holder of the test fixture, the detector and the test needle holder are in a virtual connection state, and the detector is not electrically connected to the data acquisition and processing circuit under the test needle holder of the test fixture. When the first lifting mechanism lifts the test base until the first blocking structure and the second blocking structure are against each other, the detector and the test needle holder are still in a virtual connection state. The first lifting mechanism continues to lift the test base, and driven by the reaction force of the test base, the pulling mechanism descends along the first direction relative to the outer frame of the test base, driving the clamping mechanism connected above the pulling mechanism to also descend along the first direction, and the distance between the clamping mechanism and the detector in the first direction continues to decrease until the clamping mechanism fits with the detector, tightly connecting the detector with the pressed-in test needle holder, and realizing the electrical connection between the detector and the data acquisition and processing circuit under the test needle holder.

[0057] As a possible implementation, Figure 2 As shown, the guide mechanism 14 includes a first guide mechanism 141 and a second guide mechanism 142 that cooperate with each other. The first guide mechanism 141 is connected to the fixed plate 12, and the second guide mechanism 142 is connected to the first bottom plate 132. The second guide mechanism 142 can move along the first direction relative to the first guide mechanism 141.

[0058] In some embodiments, reference Figure 2 The first guide mechanism 141 is a bearing guide rod, and the second guide mechanism 142 is a bearing matched with the bearing guide rod, and the bearing guide rod is penetrated in the bearing. Figure 1 Four bearing guides are shown with four bearings and one bearing guide is shown with one bearing.

[0059] The bearing guide rod penetrates the bottom of the bearing mechanism 13, and the bottom end of the bearing guide rod is connected to the fixed plate 12. The first bottom plate 132 of the bearing mechanism 13 is sleeved on the bearing guide rod, and the bearing is also sleeved on the bearing guide rod and is located above the bearing mechanism 13. When the first lifting mechanism 6 performs the lifting operation, the piston rod in the cylinder pushes the first bottom plate 132 of the bearing mechanism 13 and the bearing above the first bottom plate 132, and moves upward along the bearing guide rod, thereby driving the test fixture located above the first bottom plate 132 and connected to the first bottom plate through a plurality of support columns to move upward, so that the distance between the detector located above the test fixture and the clamping mechanism 3 is gradually reduced. Since the bearing guide rod is arranged along the first direction (y direction), and the first bottom plate of the bearing mechanism 13 is movably clamped between the bearing guide rod and the bearing, the accurate rise of the test base outer frame 2 during the lifting process is guaranteed, and the parallelism of the clamping mechanism 3 with the test base 1 is also guaranteed when the clamping mechanism 3 is pressed down.

[0060] In some embodiments, Figure 2As shown, the detector test device also includes a moving base plate 91 and a first moving mechanism 9. The test base 1 is arranged on the moving base plate 91, and the moving base plate 91 is provided with a second slot 911, such as Figure 4 As shown. At least part of the first lifting mechanism 6 can pass through the second slot 911 and abut against the surface of the bearing mechanism 13 facing the fixed plate 12. The first moving mechanism 9 is arranged on the side of the moving bottom plate 91 close to the test base 1 and is connected to the fixed plate 12. The first moving mechanism 9 is configured to drive the test base 1 to move toward or away from the test base outer frame 2.

[0061] The first moving mechanism 9 can drive the test base 1 to move toward or away from the test base outer frame 2. When the first moving mechanism 9 drives the test base 1 to move toward the test base outer frame 2, it is convenient for the test base 1 to move into the test base outer frame 2 for testing. When the first moving mechanism 9 drives the test base 1 to move away from the test base outer frame 2, it is convenient for the test base 1 to move outside the test base outer frame 2 to replace the detector to be tested. The first moving mechanism 9 can drive the test base 1 to move toward or away from the test base outer frame 2, which is also referred to as moving in the second direction below, that is, moving in the second direction. Figure 2 Movement in the x direction.

[0062] Specifically, the first moving mechanism 9 can drive the test base 1 to move, and the first moving mechanism 9 drives the fixed plate 12 to move along the second direction (x direction). Since the supporting mechanism 13 of the test base is arranged above the fixed plate 12, when the first moving mechanism 9 drives the fixed plate 12 to move along the second direction (x direction), the supporting mechanism located above the fixed plate can also move along the second direction, that is, the test base 1 moves along the second direction.

[0063] The movable base plate 91 is provided with a second slot 911 which enables the first lifting mechanism 6 to be lifted when the test base 1 is located in the test base outer frame 2, thereby ensuring that during the lifting operation of the first lifting mechanism 6, the piston rod of the cylinder can sequentially pass through the second slot 911 and the first slot 121 and touch the first base plate 132 of the supporting mechanism 13.

[0064] As a possible implementation, Figure 2As shown, the first moving mechanism 9 includes: a first guide rail 921, a second guide rail 922 and a driving module 925. The first guide rail 921 and the second guide rail 922 are arranged in parallel, and are arranged on the side of the moving base plate 91 close to the test base 1. The first guide rail 921 and the fixed plate 12 are slidably connected, and the second guide rail 922 and the fixed plate 12 are slidably connected. The second slot 911 is arranged between the first guide rail 921 and the second guide rail 922. The driving module 925 is connected to the fixed plate 12, and the driving module 925 is configured to drive the fixed plate 12 to move along the first guide rail 921 and the second guide rail 922.

[0065] The first guide rail 921 and the second guide rail 922 mainly play a supporting and guiding role for the test base 1, ensuring the precision of the test base moving in the second direction. The drive module 925 is a power source for the test base to move in the second direction (x direction). As a possible implementation method, the upper surface of the drive module 925 is a drive track, and the motor in the drive module 925 drives the fixed plate to move in the second direction (x direction) on the drive track. In order to make the movement of the test base in the second direction smoother, the first sliding structure 923 and the second sliding structure 924 are externally connected to the fixed plate 12, respectively connected to the first guide rail 921 and the second guide rail 922. While the motor in the drive module 925 drives the fixed plate to move in the second direction (x direction) on the drive track, the first sliding structure 923 and the second sliding structure 924 move in the same direction and synchronously on the first guide rail 921 and the second guide rail 922. In some embodiments, the first sliding structure 923 and the second sliding structure 924 are sliders.

[0066] As a possible implementation, buffers are provided at both ends of the driving track on the upper surface of the driving module 925 to provide buffering when the test base moves to the top in the second direction, so as to extend the service life. In other embodiments, the position of the buffer can be adjusted on the driving track to achieve position limiting of the test base during movement in the second direction, thereby improving the flexibility of the first moving structure.

[0067] As a possible implementation, Figure 3 As shown, the detector test device further includes a reset assembly 7. Set between the clamping mechanism 3 and the reference plate 22, the reset assembly 7 is configured to push the clamping mechanism 3 up to restore to the initial position after the pulling mechanism 5 stops pulling the clamping mechanism 3 down.

[0068] The initial position refers to the position of the clamping mechanism when it is not pulled, and at this time, there is a certain distance between the clamping mechanism and the test fixture of the test base. In some embodiments, the reset assembly includes an elastic member, and the pulling mechanism is inserted into the elastic member. For example, Figure 3 As shown, the elastic member is a spring. Figure 3Four springs are shown, one spring is connected to a pulling mechanism 5. When the first lifting mechanism 6 is not performing the lifting operation, the spring is in a free state, so that the clamping mechanism 3 is floatingly connected above the outer frame 2 of the test base. When the first lifting mechanism 6 continues to lift and drives the pulling mechanism 5 to move downward along the first direction, the spring is compressed and deformed under the drive of the pulling mechanism 5, and the clamping mechanism 3 descends along the first direction. When the first lifting mechanism 6 finishes lifting and the piston rod of the cylinder contracts, the reaction force disappears because the piston rod no longer contacts the first bottom plate 132 of the bearing mechanism 13. At this time, the spring changes from a compressed state to a free state, driving the pulling mechanism 5 and the lifting mechanism mounting plate 4 to move upward along the first direction, so that the clamping mechanism returns to its initial position.

[0069] As a possible implementation, Figure 3 As shown, the clamping mechanism 3 includes a pressing plate 31 and a pressing plate adapter plate 32. Figure 3 The clamping mechanism 3 includes two pressure plate adapter plates 32, the pressure plate 31 is arranged above the pressure plate adapter plate 32, the pressure plate adapter plate 32 is provided with a hole for the reset component 7 to pass through, and the pressure plate adapter plate 32 is connected to the pulling mechanism 5 through the reset component 7.

[0070] As a possible implementation, Figure 3 As shown, the detector test device also includes: a first limiting structure 81 and a second limiting structure 82. The first limiting structure 81 is arranged on the side of the reference plate 22 close to the first lifting mechanism 6. The second limiting structure 82 penetrates the reference plate 22. The second limiting structure 82 is penetrated in the first limiting structure 81 and can move along the first direction relative to the first limiting structure 81. One end of the second limiting structure 82 is connected to the clamping mechanism 3, and the second end of the second limiting structure 82 is blocked outside the end of the first limiting structure 81 away from the reference plate 22.

[0071] In some embodiments, the first limiting structure 81 is a bearing, and the second limiting structure 82 is a bearing guide rod. The bearing guide rod and the bearing are matched with each other, and the bottom of the bearing guide rod is a flange end face. Figure 3 Four bearing guide rods and four bearings are shown in FIG. The first limiting structure 81 and the second limiting structure 82 are mainly used to keep the reset assembly 7 at a certain height so that the elastic member is kept in a compressed state.

[0072] When the first bottom plate 132 of the test base 1 is in contact with the fixed plate 12, the first lifting mechanism 6 does not perform the lifting operation, and the flange end face at the bottom of the bearing guide rod is movably connected to the corresponding bearing. Since the top of the bearing guide rod is connected to the clamping mechanism 3, when the flange end face at the bottom of the bearing guide rod is movably connected to the corresponding bearing, the clamping mechanism 3 will be limited, reducing the pressure of the spring bearing the clamping mechanism 3 in the natural state, thereby extending the service life. When the first lifting mechanism 6 performs the lifting operation, the clamping mechanism 3 moves downward along the first direction, driving the bearing guide rod to move downward, and the flange end face at the bottom of the bearing guide rod is disconnected from the corresponding bearing. When the first lifting mechanism 6 ends the lifting operation, the spring drives the pulling mechanism 5, the clamping mechanism 3 and the bearing guide rod to move upward along the first direction. The flange end face at the bottom of the bearing guide rod is movably connected to the corresponding bearing again, ensuring the floating connection of the clamping mechanism 3.

[0073] As a possible implementation, Figure 3 As shown, the detector test device also includes: a third limiting structure 83 and a fourth limiting structure 84. The third limiting structure 83 penetrates the reference plate 22. The third limiting structure 83 can move along the first direction relative to the reference plate 22. The fourth limiting structure 84 is arranged between the clamping mechanism 3 and the reference plate 22. The position of the fourth limiting structure 84 on the third limiting structure 83 is adjustable.

[0074] The adjustable position of the fourth limiting structure 84 on the third limiting structure 83 means that the fourth limiting structure 84 is movably connected to the third limiting structure 83, and the maximum distance that the clamping mechanism 3 descends along the first direction can be adjusted by adjusting the position of the fourth limiting structure 84 on the third limiting structure 83.

[0075] As a possible implementation, refer to Figure 3 The third limiting structure 83 is a buffer, and the buffer has a threaded structure, and the fourth limiting structure is a nut. The nut matches the threaded structure on the buffer, and the buffer can provide buffering during the movement of the clamping mechanism 3 along the first direction. By rotating the nut and adjusting the position of the nut on the buffer, the maximum distance that the clamping mechanism 3 descends along the first direction can be adjusted. In the case of the third limiting structure 83 and the fourth limiting structure 84, the maximum distance that the clamping mechanism 3 descends along the first direction is the distance between the nut and the clamping mechanism 3. In the case of the absence of the third limiting structure 83 and the fourth limiting structure 84, the maximum distance that the clamping mechanism 3 descends along the first direction is the distance between the reference plate 22 and the clamping mechanism 3.

[0076] As a possible implementation, Figure 4As shown, the outer frame of the test base also includes a second bottom plate 23. The second bottom plate 23 is located on the side of the movable bottom plate 91 away from the clamping mechanism 3, and the movable bottom plate 91 is provided with a fifth slot 912. One end of the side plate 21 away from the clamping mechanism passes through the fifth slot 912 and is connected to the second bottom plate 23. The test device of the detector also includes a second moving mechanism 10, which includes a support seat 101, a first moving structure 102, a second moving structure 105 and a second lifting mechanism 103.

[0077] The support seat 101 is arranged on a side of the movable bottom plate 91 close to the test base 1, and is arranged on the outer side of the side plate 21. The first motion structure 102 is connected to a side of the support seat 101 close to the side plate 21. The second motion structure 105 is connected to a side of the side plate 21 close to the support seat 101, and cooperates with the first motion structure 102. The second lifting mechanism 103 is arranged on a side of the second bottom plate 23 away from the clamping mechanism 3. The second lifting mechanism 103 is configured to lift the test base outer frame 2, and drive the second motion structure 105 to move relative to the first motion structure 102 along the first direction.

[0078] As a possible implementation, the first motion structure 102 includes a third guide rail arranged along the first direction, and the second motion structure 105 includes an adapter plate slidably connected to the third guide rail. The support seat 101 is arranged on the movable base plate 91, and is used to provide vertical guide support for the third guide rail arranged along the first direction (y direction) on the support seat 101. The adapter plate is slidably connected to the third guide rail, which means that the adapter plate can slide on the third guide rail along the first direction (y direction). Since the adapter plate is connected to the side plate 21 of the test base frame, when the adapter plate slides on the third guide rail along the first direction (y direction), the test base frame is driven to slide on the third guide rail along the first direction (y direction).

[0079] As a possible implementation method, the second lifting mechanism 103 is a cylinder. When the second lifting mechanism 103 lifts the test base outer frame 2, the piston rod extending from the cylinder pushes the second bottom plate 23 of the test base outer frame 2, driving the adapter plate to slide along the first direction (y direction) on the third guide rail, thereby driving the test base outer frame to slide along the first direction (y direction) on the third guide rail.

[0080] Figure 4 Two sets of first motion structures 102 are shown in the figure. The setting of the first motion structure 102 ensures the accurate guidance of the second lifting mechanism 103 when lifting the test base outer frame 2 as a whole. It is suitable for adjusting the height of the test base before and after the switching of the test tooling such as the lens or the diaphragm during the detector test.

[0081] As a possible implementation, Figure 3As shown, the detector test device also includes a fifth limiting structure 104, which is adjustable on the third guide rail. The adapter plate is located on the side of the fifth limiting structure 104 close to the second bottom plate 23, and the adapter plate can move along the third guide rail until it abuts against the fifth limiting structure 104.

[0082] In some embodiments, the fifth limiting structure 104 is an adjustable limiting block, which is used to adjust the lifting height of the test base outer frame 2. When the fifth limiting structure 104 is provided on the third guide rail, the second lifting mechanism lifts the test base outer frame 2 along the first direction to a maximum of the position of the fifth limiting structure 104 on the third guide rail.

[0083] The present application also provides a detector testing device, exemplarily, as Figure 5 See Figure 5 , the detector testing device 200 also includes a lens assembly 30 and a black body assembly 40. The lens assembly 30 is arranged above the clamping mechanism, and a plurality of lenses are arranged on the lens assembly 30. The black body assembly 40 is arranged above the lens assembly 30, and a plurality of black bodies are arranged on the black body assembly 40. The lens assembly 30 can move in at least one direction of a first direction and a second direction, so that the plurality of lenses on the lens assembly 30 correspond to the plurality of detectors on the upper surface of the test base one by one. The black body assembly 40 can move in at least one direction of a first direction and a second direction, so that within the field of view of each detector on the upper surface of the test base, the infrared radiation emitted by at least one black body on the black body assembly is received uniformly.

[0084] The detector is placed on the test base fixture of the test base. After the test base is moved into the outer frame of the test base by the first moving mechanism, the first lifting mechanism lifts the moving base upward to clamp and power on the detector. After the detector is clamped and powered on, the test lens is automatically switched through the lens assembly. The blackbody assembly can be installed with multiple blackbodies of different temperatures. The blackbody assembly can move blackbodies of different temperatures to the top of the test base, align the detector after clamping and powering on, and collect data at different temperatures to complete the test of different target temperatures.

[0085] The detector testing device provided in the embodiment of the present application has a simple structural design, and has strong compatibility between the packaging form of the test product and the test conditions, which can effectively reduce the production test cost and improve the product test accuracy.

[0086] Those skilled in the art will readily appreciate other embodiments of the present application after considering the specification and practicing the invention disclosed herein. The present application is intended to cover any modification, use or adaptation of the present application, which follows the general principles of the present application and includes common knowledge or customary technical means in the art that are not disclosed in the present application.

[0087] Finally, it should be noted that the above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions within the technical scope disclosed in the present application should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A detector testing device, characterized in that: include: A test base (1), the test base being used to place a plurality of detectors; A first blocking structure is provided at the edge of the test base; A test base outer frame (2), wherein the test base can be moved into the test base outer frame; a second blocking structure is provided at one end of the test base outer frame; a first lifting mechanism (6), wherein when the test base is located in the outer frame of the test base, the test base is located on a side of the first lifting mechanism close to the second blocking structure, and the first lifting mechanism is configured to lift the test base until the first blocking structure and the second blocking structure abut against each other; A clamping mechanism (3) is arranged at one end of the test base outer frame having the second blocking structure; when the test base is located in the test base outer frame, the clamping mechanism is located at a side of the test base away from the first lifting mechanism; A pulling mechanism (5), wherein the first end of the pulling mechanism is connected to the clamping mechanism, and the second end of the pulling mechanism is connected to the first lifting mechanism. The pulling mechanism is installed on the test base frame and can move relative to the test base frame along a first direction, wherein the first direction is the relative direction of the first end and the second end of the pulling mechanism. After the first blocking structure and the second blocking structure abut against each other, the first lifting mechanism is further configured to continue lifting the test base to pull the pulling mechanism downward relative to the test base frame along the first direction. The pulling mechanism is configured to pull the clamping mechanism downward relative to the test base frame along the first direction until the clamping mechanism contacts the plurality of detectors.

2. The detector testing device according to claim 1, characterized in that: The test base comprises: a fixing plate (12), a bearing mechanism (13) and a guiding mechanism (14); The bearing mechanism is arranged on a side of the fixing plate away from the first lifting mechanism; the surface of the bearing mechanism away from the fixing plate is used for placing the multiple detectors; The fixing plate is provided with a first slot, and at least a portion of the first lifting mechanism can pass through the first slot and abut against a surface of the bearing mechanism facing the fixing plate; The guide mechanism extends along the first direction and is connected to the fixing plate and the supporting mechanism. The guide mechanism is configured to enable the supporting mechanism to move relative to the fixing plate along the first direction.

3. The detector testing device according to claim 2, characterized in that: The bearing mechanism comprises: a test fixture (131), a first bottom plate and a plurality of supporting columns; The test fixture and the first bottom plate are arranged opposite to each other and spaced apart in the first direction, the first bottom plate is closer to the fixing plate than the test fixture, and the plurality of support columns are connected between the test fixture and the first bottom plate; The test fixture comprises a first surface and a second surface disposed opposite to each other in the first direction, the first surface being used for placing the plurality of detectors, and two opposite side surfaces of the test fixture having bosses disposed close to the second surface, the bosses forming the first blocking structure.

4. The detector testing device according to claim 3, characterized in that: The guide mechanism comprises a first guide mechanism (141) and a second guide mechanism (142) which cooperate with each other, the first guide mechanism is connected to a fixed plate, the second guide mechanism is connected to the first bottom plate, and the second guide mechanism can move along a first direction relative to the first guide mechanism.

5. The detector testing device according to claim 4, characterized in that: The first guide mechanism is a bearing guide rod, the second guide mechanism is a bearing, and the bearing guide rod is inserted into the bearing.

6. The detector testing device according to any one of claims 2 to 5, characterized in that: The detector testing device also includes: A movable bottom plate (91), the test base being arranged on the movable bottom plate, the movable bottom plate being provided with a second slot, at least a portion of the first lifting mechanism being able to pass through the second slot and abutting against a surface of the bearing mechanism facing the fixed plate; The first moving mechanism (9) is arranged on a side of the moving base plate close to the test base and connected to the fixed plate; the first moving mechanism is configured to drive the test base to move in a direction close to or away from the test base outer frame.

7. The detector testing device according to claim 6, characterized in that: The first moving mechanism comprises: A first guide rail and a second guide rail are arranged in parallel, and are arranged on a side of the movable base plate close to the test base. The first guide rail is slidably connected to the fixed plate, and the second guide rail is slidably connected to the fixed plate. The second slot is arranged between the first guide rail and the second guide rail. A driving module is connected to the fixing plate, and is configured to drive the fixing plate to move along the first guide rail and the second guide rail.

8. The detector testing device according to claim 1, characterized in that: The test base outer frame comprises: a side plate (21) and a reference plate (22); The side plate is arranged along the first direction, the reference plate is arranged on a side of the side plate close to the clamping mechanism, and a part of the reference plate forms the second blocking structure; The side plate is provided with a third slot, the reference plate is provided with a fourth slot, and the pulling mechanism passes through the fourth slot and the third slot in sequence along the first direction.

9. The detector testing device according to claim 8, characterized in that: The detector testing device also includes an elastic member, which is arranged between the clamping mechanism and the reference plate. The pulling mechanism is inserted into the elastic member. The elastic member is configured to push the clamping mechanism up to restore to an initial position after the pulling mechanism stops pulling the clamping mechanism down.

10. The detector testing device according to claim 8, characterized in that: The detector testing device also includes: A first limiting structure (81) is arranged on a side of the reference plate close to the first lifting mechanism; a second limiting structure (82) passing through the reference plate; the second limiting structure is arranged in the first limiting structure and can move relative to the first limiting structure along the first direction, one end of the second limiting structure is connected to the clamping mechanism, and the second end of the second limiting structure is blocked outside the end of the first limiting structure away from the reference plate; A third limiting structure (83) passes through the reference plate; the third limiting structure can move relative to the reference plate along the first direction; A fourth limiting structure (84) is arranged between the pressing mechanism and the reference plate; the position of the fourth limiting structure on the third limiting structure is adjustable.

11. The detector testing device according to any one of claims 8 to 10, characterized in that: The detector testing device also includes a movable bottom plate (91); The test base outer frame further includes: a second bottom plate, the second bottom plate is located at a side of the movable bottom plate away from the clamping mechanism, the movable bottom plate is provided with a fifth slot, and one end of the side plate away from the clamping mechanism passes through the fifth slot and is connected to the second bottom plate; The detector testing device further comprises: a second moving mechanism (10), wherein the second moving mechanism comprises: A support seat (101) is arranged on a side of the movable bottom plate close to the test base and on the outer side of the side plate; A first motion structure (102) connected to a side of the support base close to the side plate; A second motion structure (105) is connected to a side of the side plate close to the support seat and cooperates with the first motion structure; A second lifting mechanism (103) is arranged on a side of the second bottom plate away from the clamping mechanism; the second lifting mechanism is configured to lift the outer frame of the test base and drive the second motion structure to move relative to the first motion structure along the first direction.

12. The detector testing device according to claim 11, characterized in that: The first motion structure comprises a third guide rail (102) and a fifth limiting structure; the second motion structure comprises an adapter plate (15) slidably connected to the third guide rail; the third guide rail is arranged along the first direction; The fifth limiting structure is arranged on the third guide rail, and the position of the fifth limiting structure on the third guide rail is adjustable; The adapter plate is located on a side of the fifth limiting structure close to the second bottom plate, and the adapter plate can move along the third guide rail until it abuts against the fifth limiting structure.

13. The detector testing device according to claim 1, characterized in that: The detector testing device further comprises: a lifting mechanism mounting plate (4), wherein the first lifting mechanism is arranged on a side of the lifting mechanism mounting plate close to the clamping mechanism, and the second end of the pulling mechanism is connected to the first lifting mechanism via the lifting mechanism mounting plate.

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