Multimeter capable of photographing and recording and circuit board testing system and method

Abstract

The embodiment of the invention provides a universal meter capable of photographing and recording and a circuit board testing system and method, and the method comprises the steps: measuring a target element and / or a target site on a circuit board through a meter pen in the universal meter, so as to obtain corresponding measurement information; a miniature camera in a universal meter is used for photographing the area where the target element and / or the target site is located, so that a local circuit picture is obtained; searching and determining the target element and / or the target site on the local circuit photo in a pre-stored complete circuit photo by using a searching module in a data processing terminal; and recording the measurement information and an association relationship between the measurement information and the target element and / or the target site by using a recording module in a data processing terminal. According to the embodiment of the invention, the image information of the to-be-measured target element and / or the target site is acquired and marked through the miniature camera integrated on the meter pen, so that the real-time corresponding recording of the measured data is realized.

Description

Technical Field

[0001] The embodiments of the present invention relate to an electrical variable measurement technology, and more particularly to a multimeter capable of taking photos and recording, and a circuit board testing system and method. Background Art

[0002] A multimeter, also known as a multimeter or multiplexer, is an instrument that uses a common head and integrates a voltmeter, ammeter, and ohmmeter. In practical applications, multimeter users often need to record test results instantly. The manual recording process is cumbersome, and associating the measured data with the measurement points increases the difficulty. Therefore, a more convenient recording method is needed. Summary of the invention

[0003] The present invention provides a multimeter and circuit board testing system and method capable of taking photos and recording. The system obtains image information of a target component and / or target position to be measured through a micro camera installed on a test lead, and marks the measurement data in the image, thereby realizing real-time corresponding recording of the measurement data.

[0004] In a first aspect, an embodiment of the present invention provides a multimeter capable of taking photos and recording, comprising:

[0005] Test leads are used to measure target components and / or target locations on a circuit board to obtain corresponding measurement information;

[0006] The miniature camera is mounted on the side wall of the test lead, with its lens facing the tip of the test lead, and is used to take photos of the target component and / or the target site to obtain a local circuit photo.

[0007] Furthermore, the multimeter body is provided with a first power supply and a first communication module, and the multimeter body is used to display the measurement results, adjust the measurement mode and range, and supply power to the test leads, and is also used to transmit the measurement information to the outside;

[0008] The micro camera is also connected to an independent second power supply and a second communication module. The second power supply is used to supply power to the micro camera, and the second communication module is used to transmit photos and measurement information to a data processing terminal.

[0009] Furthermore, the button is arranged on the side wall of the test lead, and the button is electrically connected to the micro camera;

[0010] The button is configured to trigger and generate an on instruction to control the operation of the miniature camera.

[0011] In a second aspect, an embodiment of the present invention further provides a circuit board testing system, including a multimeter pen capable of taking photos and recording, and also including a data processing terminal;

[0012] The data processing terminal is respectively connected to the test leads in the multimeter and the micro camera for communication;

[0013] The data processing terminal includes a search module and a record module;

[0014] The search module is used to search and determine the target element and / or target site on the local circuit photo in the pre-stored complete circuit photo;

[0015] The recording module is used to record the measurement information and the association relationship between the measurement information and the target element and / or the target site.

[0016] Furthermore, the search module includes:

[0017] A preprocessing unit, used for preprocessing the local circuit photos and the overall circuit photos;

[0018] A feature recognition unit, used to recognize feature points of the pre-processed local circuit photo and the overall circuit photo;

[0019] A region search unit, used to search for a region matching the preprocessed local circuit photo in the preprocessed overall circuit photo according to the feature points, and obtain at least one similar region;

[0020] A similarity evaluation unit, used for evaluating the similarity between each similar area and the local circuit photo;

[0021] A region determination unit, used to determine a similar region with the highest similarity as a target region on the overall circuit photo corresponding to the local circuit photo;

[0022] The target determination unit is used to determine the target element and / or target site on the local circuit photograph in the target area.

[0023] In a third aspect, an embodiment of the present invention further provides a circuit board testing method, the method comprising:

[0024] Use the test leads in the multimeter to measure the target components and / or target locations on the circuit board to obtain corresponding measurement information;

[0025] Use a micro camera in the multimeter to take a picture of the target component and / or the area where the target site is located to obtain a local circuit picture;

[0026] Using a search module in the data processing terminal, search and determine the target element and / or target site on the partial circuit photo in the pre-stored complete circuit photo;

[0027] The recording module in the data processing terminal is used to record the measurement information and the association relationship between the measurement information and the target element and / or the target site.

[0028] Further, using a search module in the data processing terminal, searching and determining a target element and / or a target site on a partial circuit photo in a pre-stored complete circuit photo includes:

[0029] Preprocessing local circuit photos and overall circuit photos;

[0030] Identify feature points of pre-processed local circuit photos and overall circuit photos;

[0031] According to the feature points, searching for an area matching the preprocessed local circuit photo in the preprocessed overall circuit photo to obtain at least one similar area;

[0032] Evaluate the similarity between each similar area and the local circuit photo;

[0033] Determine the similar region with the highest similarity as the target region of the corresponding local circuit photo on the overall circuit photo;

[0034] A target element and / or a target site is determined on the partial circuit photograph in the target region.

[0035] Further, the recording module in the data processing terminal is used to record the measurement information and the association between the measurement information and the target element and / or the target site, including at least one of the following methods:

[0036] Record the target elements and / or target sites and measurement information in a table format;

[0037] The measurement information corresponding to the target element and / or the target site is marked in the target area on the overall circuit photo, wherein the target area is the area including the target element and / or the target site.

[0038] Furthermore, before using the test leads in the multimeter to measure the target components and / or target locations on the circuit board to obtain corresponding measurement information, the method further includes:

[0039] Get a complete circuit photo of the circuit board;

[0040] Determine the basic structural information on the complete circuit photo; wherein the basic structural information includes at least one of chip model, chip pin, chip size, circuit board silk screen, circuit board number and routing direction;

[0041] When the basic structure information on the complete circuit photo is compared and consistent with the preset circuit diagram in the preset database, extract the preset circuit diagram;

[0042] Based on this, the search module in the data processing terminal is used to search and determine the target components and / or target sites on the local circuit photo according to the pre-stored complete circuit photo, which can be replaced by:

[0043] Using a search module in the data processing terminal, search and determine the target element and / or target site on the local circuit photo on the extracted preset circuit diagram;

[0044] Using the recording module in the data processing terminal, the measurement information and the association between the measurement information and the target element and / or the target site can be replaced by:

[0045] The recording module in the data processing terminal is used to record the measurement information corresponding to the target element and / or the target position on the extracted preset circuit diagram.

[0046] Furthermore, after searching and determining the target element and / or target site on the local circuit photo on the extracted preset circuit diagram using the search module in the data processing terminal, the method further includes:

[0047] Determining that the target element and / or the target site is in an abnormal state according to standard measurement information of the target element and / or the target site on the preset circuit diagram and the measurement information;

[0048] The abnormal status is marked on the corresponding target element and / or target location on the extracted preset circuit diagram.

[0049] The embodiment of the present invention provides a multimeter and a circuit board testing system and method capable of taking photos and recording, the method comprising: using the test leads in the multimeter to measure the target element and / or target site on the circuit board to obtain corresponding measurement information; using the micro camera in the multimeter to take photos of the area where the target element and / or target site are located to obtain a local circuit photo; using the search module in the data processing terminal to search and determine the target element and / or target site on the local circuit photo in the pre-stored complete circuit photo; using the recording module in the data processing terminal to record the measurement information and the association between the measurement information and the target element and / or target site. The embodiment of the present invention realizes the acquisition and real-time marking of the image information of the target element and site by the micro camera set on the test lead, thereby ensuring the accurate correspondence between the measurement data and the actual circuit components. Through intuitive image recording, the traceability of the test results is enhanced, which provides convenience for fault diagnosis and maintenance of the circuit board. In addition, the method also optimizes the entire circuit board testing process by reducing the errors of manual recording and improving the efficiency of data recording, thereby significantly improving the quality and efficiency of the testing work. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] Figure 1 A schematic structural diagram of a multimeter capable of taking photos and recording provided by an embodiment of the present invention;

[0051] Figure 2 A circuit board testing system provided by an embodiment of the present invention;

[0052] Figure 3 A schematic diagram of a circuit board testing method provided by an embodiment of the present invention;

[0053] Figure 4 A schematic diagram of a flow chart of another circuit board testing method provided by an embodiment of the present invention;

[0054] Figure 5 A schematic flow chart of another circuit board testing method provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0055] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only parts related to the present invention, rather than all structures, are shown in the accompanying drawings.

[0056] The terms used in the embodiments of the present invention are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. It should be noted that the directional words such as "upper", "lower", "left", "right" and the like described in the embodiments of the present invention are described at the angles shown in the accompanying drawings and should not be understood as limitations on the embodiments of the present invention. In addition, in the context, it is also necessary to understand that when it is mentioned that an element is formed "on" or "under" another element, it can not only be directly formed "on" or "under" another element, but also indirectly formed "on" or "under" another element through an intermediate element. The terms "first", "second", etc. are only used for descriptive purposes and do not represent any order, quantity or importance, but are only used to distinguish different components. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood in specific circumstances.

[0057] The term “including” and its variations used in the present invention are open inclusions, that is, “including but not limited to.” The term “based on” means “based at least in part on.” The term “one embodiment” means “at least one embodiment.”

[0058] It should be noted that the concepts such as "first" and "second" mentioned in the present invention are only used to distinguish the corresponding contents, and are not used to limit the order or interdependence.

[0059] It should be noted that the modifications of "one" and "plurality" mentioned in the present invention are illustrative rather than restrictive, and those skilled in the art should understand that, unless otherwise clearly indicated in the context, it should be understood as "one or more".

[0060] Figure 1 A schematic diagram of the structure of a multimeter capable of photographing and recording provided by an embodiment of the present invention.

[0061] like Figure 1 As shown, the multimeter capable of taking photos and recording includes:

[0062] Test leads 11 are used to measure target components and / or target locations on a circuit board to obtain corresponding measurement information;

[0063] The micro camera 12 is mounted on the side wall of the test lead 11 , and the lens of the micro camera 12 faces the tip of the test lead 11 , and is used to take pictures of the target component and / or the target site to obtain a local circuit picture.

[0064] Among them, the measurement information can be electrical parameters such as voltage, current, resistance, etc.; the micro camera can be understood as a small camera device set on the test leads of a multimeter; the local circuit photo can be understood as a specific area of ​​a circuit board taken by a micro camera, which area contains the target component and / or target site to be measured and the front end of the test lead; the target component and / or target site can be any electronic component or connection point on the circuit board, and the circuit board can be part of any type of electronic device.

[0065] The technical solution of the embodiment of the present invention first uses a test lead to test the electrical parameters of the target component and / or target location on the circuit board, and then uses a micro camera to obtain photos containing the target component and / or target location and the front end of the test lead. In this way, a more intuitive corresponding record of the measurement data and image information can be achieved, which helps to quickly identify and locate the problem area, thereby making more accurate repair or replacement decisions.

[0066] Optionally, it also includes a multimeter body 13, a power supply and a communication module of the miniature camera, and the multimeter body 13 is electrically connected to the test lead 11;

[0067] The multimeter body 13 is provided with a first power supply 16 and a first communication module 17. The multimeter body 13 is used to display the measurement results, adjust the measurement mode and range, and supply power to the test leads, and is also used to transmit the measurement information to the outside.

[0068] The micro camera 12 is also connected to an independent second power supply 14 and a second communication module 15. The second power supply 14 is used to supply power to the micro camera 12, and the second communication module 15 is used to transmit photos and measurement information to a data processing terminal.

[0069] Among them, the first power supply 16 is used to supply power to the first communication module 17; the second power supply 14 is used to supply power to the micro camera 12 and the second communication module 15; the first communication module 17 is used to transmit measurement information to the second communication module 15 or the data processing terminal 21; the second communication module 15 is used to transmit photos and measurement information to the data processing terminal 21.

[0070] Specifically, in addition to the basic functions of the existing multimeter, the multimeter body 13 is additionally provided with a first power supply 16 and a first communication module 17 , and data communication between the multimeter body 13 and the data processing terminal 21 or the second communication module 15 is achieved through the first communication module 17 .

[0071] Optionally, the multimeter pen 11 capable of taking photos and recording may further include:

[0072] A button 18, which is disposed on the side wall of the test lead 11 and is electrically connected to the micro camera 12;

[0073] The button 18 is configured to trigger the generation of an on instruction to control the micro camera 12 to operate.

[0074] Specifically, the button 18 disposed on the side of the test lead 11 can control the micro camera 12 to photograph the target components and / or target locations on the target circuit board, and provide circuit photos for subsequent data recording.

[0075] Based on the above-mentioned multimeter capable of taking photos and recording, an embodiment of the present invention further provides a circuit board testing system. Figure 2 is a system for implementing the circuit board testing method of the embodiment of the present invention, referring to Figure 2 , the system of the circuit board testing method includes any one of the multimeter pen 11 capable of taking photos and recording as provided in the above embodiments, and also includes a data processing terminal 21;

[0076] The data processing terminal 21 is respectively connected to the test leads in the multimeter and the micro camera for communication;

[0077] The data processing terminal 21 includes a search module 22 and a recording module 23;

[0078] The search module 22 is used to search and determine the target element and / or target site on the partial circuit photo in the pre-stored complete circuit photo;

[0079] The recording module 23 is used to record the measurement information and the association relationship between the measurement information and the target element and / or the target site.

[0080] Among them, the data processing terminal can be a computer or a mobile device; the search module can be understood as a software program running on the data processing terminal for analyzing local images and overall images to determine the location of the local image; the recording module can be understood as a data module for creating a historical record of maintenance and testing with all measurement record data and photos, which helps to track the status changes of the circuit board and perform future maintenance and upgrades.

[0081] Specifically, the search module in the data processing terminal uses an image recognition algorithm to identify target components and locations in the local photo, compare the local circuit photo with the feature points of the pre-stored complete circuit diagram, and then determine its position in the complete circuit diagram photo.

[0082] Furthermore, the search module 22 includes:

[0083] A preprocessing unit, used for preprocessing the local circuit photos and the overall circuit photos;

[0084] A feature recognition unit, used to recognize feature points of the pre-processed local circuit photo and the overall circuit photo;

[0085] A region search unit, used to search for a region matching the preprocessed local circuit photo in the preprocessed overall circuit photo according to the feature points, and obtain at least one similar region;

[0086] A similarity evaluation unit, used for evaluating the similarity between each similar area and the local circuit photo;

[0087] A region determination unit, used to determine a similar region with the highest similarity as a target region on the overall circuit photo corresponding to the local circuit photo;

[0088] The target determination unit is used to determine the target element and / or target site on the local circuit photograph in the target area.

[0089] Among them, the preprocessing unit can be understood as a module that performs preliminary processing on the captured local circuit photos and overall circuit photos to facilitate subsequent feature recognition and area matching; the feature recognition unit can be understood as a module responsible for identifying key feature points from the preprocessed image; the area search unit can be understood as a module that uses feature point information to search for areas that match the local circuit photos in the preprocessed overall circuit photos; the similarity evaluation unit can be understood as a module that evaluates the similarity between the found similar areas and the local circuit photos; the area determination unit can be understood as a module that determines the area with the highest similarity as the target area corresponding to the local circuit photo on the overall circuit photo; the target determination unit can be understood as a module that accurately marks the target components and / or target sites on the local circuit photo in the determined target area.

[0090] Specifically, first, a preprocessing unit performs preprocessing steps for the purpose of improving image quality or preparing for subsequent processing steps, which include, but are not limited to, denoising, contrast adjustment, edge enhancement and other steps; secondly, a feature recognition unit extracts feature points of the local circuit photo and the overall circuit photo; then, an area search unit obtains similar areas based on feature point matching; then, a similarity evaluation unit evaluates the similarity between each similar area and the local circuit photo; then, an area determination unit determines the similar area with the highest similarity as the target area; finally, a target determination unit determines the target element and / or target site on the local circuit photo in the target area.

[0091] Based on the above circuit board testing system, an embodiment of the present invention further provides a circuit board testing method. Figure 3 The present invention is a flow chart of a circuit board testing method provided by an embodiment of the present invention. The present invention can be applied to situations where the measurement data needs to be recorded in real time in correspondence with the target components and / or target locations to be measured. The method can be performed by the multimeter capable of taking photos and recording and the data processing terminal provided by the embodiment of the present invention. The data processing terminal can be implemented in the form of hardware or software. The method specifically includes:

[0092] S110: Use the test leads in the multimeter to measure the target components and / or target locations on the circuit board to obtain corresponding measurement information.

[0093] Specifically, after selecting a suitable measurement mode, the positive and negative electrodes of the test leads in the multimeter are used to contact the target element and / or target location to measure the corresponding voltage, current and / or resistance.

[0094] S120, using a micro camera in the multimeter to take a picture of the target component and / or the area where the target site is located to obtain a picture of a local circuit.

[0095] Specifically, a micro camera in a multimeter is used to take a photo of the target element and / or the target site to obtain a local circuit photo. This step can be performed before the measurement step, or during or after the measurement. The local circuit photo obtained will be used for subsequent image recognition and data association.

[0096] S130 , using a search module in the data processing terminal, searching for and determining a target component and / or a target location on the partial circuit photo in the pre-stored complete circuit photo.

[0097] Specifically, the search module in the data processing terminal compares the feature points of the local circuit photo with the pre-stored complete circuit diagram through an image recognition algorithm, and identifies the positions of the target components and sites in the local photo in the complete circuit diagram photo.

[0098] S140 , using a recording module in the data processing terminal to record the measurement information and the association relationship between the measurement information and the target element and / or the target site.

[0099] Specifically, the recording module in the data processing terminal will store the measured electrical parameters and associate them with the target components and locations identified in the local circuit photo. A database or data structure can be created to store this information and allow users or systems to query related measurement data based on components or locations.

[0100] The technical solution of the embodiment of the present invention first uses the micro camera in the multimeter to take a photo of the area where the target component and / or the target site is located, then obtains the image of the target component and / or the target site through the local circuit photo, and finally determines the specific position of the target component and / or the target site image by comparing it with the pre-stored complete circuit photo, thereby realizing the corresponding record of the measurement information and the correlation between the measurement information and the target component and / or the target site, thereby helping the user to quickly and intuitively measure and record circuit information.

[0101] Figure 4 The flowchart of another circuit board testing method provided by an embodiment of the present invention is a refinement or optimization of the above embodiment. Specifically, S130 in the above embodiment, using the search module in the data processing terminal to search and determine the target component and / or target site on the local circuit photo in the pre-stored complete circuit photo, can be specifically refined as follows:

[0102] Preprocessing local circuit photos and overall circuit photos;

[0103] Identify feature points of pre-processed local circuit photos and overall circuit photos;

[0104] According to the feature points, searching for an area matching the preprocessed local circuit photo in the preprocessed overall circuit photo to obtain at least one similar area;

[0105] Evaluate the similarity between each similar area and the local circuit photo;

[0106] Determine the similar region with the highest similarity as the target region of the corresponding local circuit photo on the overall circuit photo;

[0107] A target element and / or a target site is determined on the partial circuit photograph in the target region.

[0108] like Figure 4 As shown, the method may specifically include the following steps:

[0109] S210: Use the test leads in the multimeter to measure the target components and / or target locations on the circuit board to obtain corresponding measurement information.

[0110] S220, using a micro camera in the multimeter to take a picture of the target component and / or the area where the target site is located to obtain a local circuit picture.

[0111] S230: Preprocess the local circuit photo and the overall circuit photo.

[0112] Specifically, the local circuit photo and the overall circuit photo are preprocessed, including: using image processing algorithms to remove image noise, adjusting image contrast to enhance the recognizability of components on the circuit board; correcting lens or other imaging distortions of the circuit photo; and adjusting the position and direction of the local circuit photo based on the corrected overall circuit photo to ensure spatial consistency between the local circuit photo and the overall circuit photo.

[0113] S240: Identify feature points of the pre-processed local circuit photo and the overall circuit photo.

[0114] Among them, feature points can be significant points in the image that are detected and identified by the algorithm, and these points remain stable under image transformation.

[0115] Specifically, an image recognition algorithm model is constructed using image processing software such as opencv or halcon to identify key points in the image. For example, feature points can be obtained by using the FAST (Features from Accelerated Segment Test) fast corner detection method.

[0116] S250 . Search, based on the feature points, in the preprocessed overall circuit photo for an area that matches the preprocessed partial circuit photo, to obtain at least one similar area.

[0117] The searching for similar regions may be understood as finding regions in the overall circuit photo that match the feature points of the local circuit photo.

[0118] Specifically, the process of searching for the matching area can use feature point descriptors and matching algorithms to find an area in the overall circuit photo that matches the local photo.

[0119] S260, evaluating the similarity between each similar region and the local circuit photo.

[0120] The similarity evaluation may be performed by comparing the number of feature points in the potential matching area in the local circuit photo and the overall circuit photo.

[0121] Specifically, the number of matching pairs between feature points in the local circuit photo and feature points in the potential matching area in the overall circuit photo is calculated, the distance between descriptor vectors is used to evaluate the similarity between feature points, and the RANSAC algorithm is used to identify and exclude inconsistent matching pairs.

[0122] S270: Determine the similar region with the highest similarity as the target region on the overall circuit photo corresponding to the local circuit photo.

[0123] Among them, the similar region with the highest similarity can be understood as the region with the highest score in the similarity evaluation.

[0124] Specifically, all potential similar regions are sorted according to their similarity scores, and the region with the highest similarity score is selected as the candidate target region, combined with the layout of components in the circuit board and the direction of the circuit to ensure that the selected target region is accurate.

[0125] S280: Determine a target element and / or a target site on the local circuit photograph in the target area.

[0126] Specifically, the feature points in the local circuit photo are mapped to the feature points of the target area in the overall circuit photo, and the image recognition algorithm is used to identify and classify the components based on the previously determined matching relationship. On the basis of identifying the components, specific locations on the components are further determined, which may be the pins, pads or other key connection points of the components.

[0127] S290, using a recording module in the data processing terminal to record the measurement information and the association relationship between the measurement information and the target element and / or the target site.

[0128] Optionally, the recording module in the data processing terminal is used to record the measurement information and the association between the measurement information and the target element and / or the target site, including at least one of the following methods:

[0129] Record the target elements and / or target sites and their measurement information in a table format;

[0130] The measurement information corresponding to the target element and / or the target site is marked in the target area on the overall circuit photo, wherein the target area is the area including the target element and / or the target site.

[0131] Among them, the record of the target component / site includes: component / site identification, component / site type, and position coordinates; the record of measurement information includes: voltage, current, resistance, and measurement time; different graphics, colors, or labels can be used to distinguish different components or sites during annotation.

[0132] Specifically, when recorded in a table, the table can list the component / site identification, component / site type, position coordinates, measurement value, and measurement time of the target component and / or target site. When marking the measurement information in the target area on the overall circuit photo, different graphics can be selected for marking according to the component / site type, such as rectangles for resistors, circles for capacitors, etc. For different measurement parameters, different colors can be used to distinguish, such as red for voltage, blue for current, and green for resistance. In the target area near the image of the target component or site, the measurement parameters and specific values ​​are superimposed in clear fonts. At the same time, in order to ensure the accuracy and readability of the annotation, a scale and direction mark can be added to the photo so that the actual position and size of the component or site can be accurately determined when necessary.

[0133] The technical solution of the embodiment of the present invention first pre-processes the circuit photo and obtains the feature points in the circuit photo, then obtains at least one similar area by comparing the feature points, and finally evaluates and determines that the similar area with the highest similarity is the target area of ​​the corresponding local circuit photo on the overall circuit photo, and then finally obtains the specific position of the target component and / or target site in the overall image, thereby improving the accuracy of target component and site identification in circuit board testing and enhancing the traceability and reliability of test results.

[0134] Figure 5 A flow chart of another circuit board testing method provided by an embodiment of the present invention is provided. The embodiment of the present invention is also a refinement or optimization of the above embodiment. Specifically, before using the test leads in a multimeter to measure the target components and / or target locations on the circuit board to obtain the corresponding measurement information, the following steps may be added:

[0135] Get a complete circuit photo of the circuit board;

[0136] Determine the basic structural information on the complete circuit photo; wherein the basic structural information includes at least one of chip model, chip pin, chip size, circuit board silk screen, circuit board number and routing direction;

[0137] When the basic structure information on the complete circuit photo is compared and consistent with the preset circuit diagram in the preset database, extract the preset circuit diagram;

[0138] Based on this, the search module in the data processing terminal is used to search and determine the target components and / or target sites on the local circuit photo according to the pre-stored complete circuit photo, which can be replaced by:

[0139] Using a search module in the data processing terminal, search and determine the target element and / or target site on the local circuit photo on the extracted preset circuit diagram;

[0140] Using the recording module in the data processing terminal, the measurement information and the association between the measurement information and the target element and / or the target site can be replaced by:

[0141] The recording module in the data processing terminal is used to record the measurement information corresponding to the target element and / or the target position on the extracted preset circuit diagram.

[0142] like Figure 5 As shown, the method includes:

[0143] S310. Obtain a complete circuit photo of the circuit board.

[0144] Among them, the complete circuit photo of the circuit board can be understood as an image containing all circuit components and layouts in the entire circuit board.

[0145] Specifically, the entire circuit board is photographed by a miniature camera installed on the test lead to obtain images of all its circuit components and layouts.

[0146] S320, determining basic structural information on the complete circuit photo; wherein the basic structural information includes at least one of chip model, chip pin, chip size, circuit board silk screen, circuit board number and routing direction.

[0147] Specifically, the complete circuit photo is read by the recognition module of the data processing terminal, and the basic structure information of the circuit board is jointly determined according to at least one of the chip model, chip pin, chip size, circuit board silk screen, circuit board number and wiring direction in the photo.

[0148] S330: When the basic structure information on the complete circuit photo is consistent with the preset circuit diagram in the preset database, extract the preset circuit diagram.

[0149] The preset circuit diagram can be understood as an electronic version of the circuit board designed in the preset database, which includes all the design details of the circuit board, such as component layout, connection lines, etc.

[0150] Specifically, a specific query algorithm or software tool is used to search the preset circuit diagrams in the database to find the circuit diagram that best matches the actual circuit board photo. After the initial match, a manual or automatic verification step is performed to ensure that the selected preset circuit diagram does match the actual circuit board. When the circuit diagram comparison is confirmed to be consistent, the corresponding preset circuit diagram is extracted from the database.

[0151] S340: Use the test leads in the multimeter to measure the target components and / or target locations on the circuit board to obtain corresponding measurement information.

[0152] S350, using a micro camera in the multimeter to take a picture of the target component and / or the area where the target site is located to obtain a local circuit picture.

[0153] S360: Using a search module in the data processing terminal, search and determine a target component and / or a target location on the local circuit photo on the extracted preset circuit diagram.

[0154] The preset circuit diagram can be understood as a complete circuit diagram preset in the database that contains component information, connection relationships, signal types and other information.

[0155] Specifically, the search module uses image recognition and matching technology to quickly locate the target component and / or target site on the local circuit photo in the preset database circuit diagram.

[0156] Exemplarily, computer vision libraries including OpenCV are used to identify and locate target components through filtering, grayscale conversion, edge detection, binarization, morphological operations and other steps.

[0157] S370. Using a recording module in the data processing terminal, record measurement information corresponding to the target element and / or target position on the extracted preset circuit diagram.

[0158] Specifically, the recording module associates and records the target components and locations identified by the search module with the corresponding components and locations in the preset circuit diagram, ensuring that the recorded information corresponds one-to-one with the actual components.

[0159] The technical solution of the embodiment of the present invention first obtains a complete circuit photo of the circuit board, and then determines the basic structural information in the circuit photo, including but not limited to chip model, chip pin, chip size, circuit board silk screen, circuit board number and routing direction. Subsequently, these basic structural information are used as key data, accurately matched with the preset circuit diagram in the preset database, and the electronic version drawings that conform to the actual circuit board are quickly retrieved. On this basis, the search module in the data processing terminal is used to accurately identify and locate the target components and / or target sites on the local circuit photo. Finally, the recording module is used to record detailed measurement information on the preset circuit diagram to ensure the accuracy and completeness of the test data. The technical solution of the embodiment of the present invention realizes the optimization of the circuit board test process, improves the accuracy of the target component and site identification, and also enhances the traceability and reliability of the test results. In addition, the present solution can selectively mark the measurement information directly in the target area of ​​the circuit photo or record it in a table. Such an intuitive representation method not only helps to quickly identify and locate potential problem areas, but also provides strong data support for subsequent maintenance or replacement decisions, thereby significantly improving the work efficiency of circuit board testing and maintenance.

[0160] Optionally, the refinement process of the above embodiment may be further limited.

[0161] In the above embodiment, S360, after searching and determining the target element and / or target site on the local circuit photo on the extracted preset circuit diagram using the search module in the data processing terminal, the following contents are also included: determining that the target element and / or target site is in an abnormal state according to the standard measurement information and measurement information of the target element and / or target site on the preset circuit diagram; marking the abnormal state of the corresponding target element and / or target site on the extracted preset circuit diagram. Specifically, it can be:

[0162] S361. Determine that the target element and / or target site is in an abnormal state according to standard measurement information and measurement information of the target element and / or target site on the preset circuit diagram.

[0163] Among them, standard measurement information can be understood as theoretical measurement values ​​at target elements and / or target locations according to circuit design, and abnormal status can be understood as the status of elements or locations that do not meet the expected working status.

[0164] Specifically, by comparing the measurement information of the target element and / or the target site with the standard measurement information, if a deviation is found, it is considered that the target element and / or the target site is in an abnormal state.

[0165] S362: marking abnormal status of corresponding target components and / or target locations on the extracted preset circuit diagram.

[0166] The abnormal state marking can be understood as marking the corresponding target components or target sites on the preset circuit diagram using the marking tool in the data processing terminal. These marks can be color codes, annotations or special symbols for easy identification and subsequent processing.

[0167] Specifically, based on the result of comparing the measurement information of the target element and / or the target site with the standard measurement information, an abnormal state remark is marked on the target element and / or the target site.

[0168] For example, during a circuit board test, if the component to be tested is a 200-ohm resistor, and when a multimeter is used to measure it, it is found that the current across the resistor is 0, it is marked as "200-ohm resistor open circuit".

[0169] The above steps compare the measurement information with the standard measurement information, determine whether the target component and / or target site is in an abnormal state, and mark the abnormal state on the preset circuit diagram, thereby achieving accurate testing and fault diagnosis of the circuit board, reducing the complexity and error rate of manual operation, and improving the overall quality and efficiency of circuit board testing.

[0170] Note that the above are only preferred embodiments of the present invention and the technical principles used. It should be understood by those skilled in the art that the present invention is not limited to the above specific embodiments, and that various obvious changes, readjustments, combinations and substitutions can be made by those skilled in the art without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments, but also includes more other effective embodiments without departing from the concept of the present invention, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. A multimeter capable of taking photos and recording, characterized in that: include: Test leads are used to measure target components and / or target locations on a circuit board to obtain corresponding measurement information; A micro camera is mounted on the side wall of the test lead, with the lens of the micro camera facing the tip of the test lead, and is used to take pictures of the target element and / or the area where the target site is located to obtain a local circuit picture.

2. The multimeter pen according to claim 1, characterized in that: It also includes a multimeter body, a power supply and a communication module of the miniature camera, wherein the multimeter body is electrically connected to the test leads; The multimeter body is provided with a first power supply and a first communication module, and the multimeter body is used to display the measurement results, adjust the measurement mode and range, and supply power to the test leads, and is also used to transmit the measurement information to the outside; The micro camera is also connected to an independent second power supply and a second communication module, wherein the second power supply is used to supply power to the micro camera, and the second communication module is used to transmit the photos and measurement information to a data processing terminal.

3. The multimeter pen according to claim 1, characterized in that: Buttons are also included; The button is arranged on the side wall of the test lead, and the button is electrically connected to the micro camera; The button is configured to trigger the generation of an on instruction to control the operation of the miniature camera.

4. A circuit board testing system, characterized in that: A multimeter pen capable of taking photos and recording as claimed in any one of claims 1 to 3, and also comprising a data processing terminal; The data processing terminal is respectively connected to the test leads in the multimeter and the micro camera for communication; The data processing terminal includes a search module and a recording module; The search module is used to search and determine the target element and / or the target site on the partial circuit photo in the pre-stored complete circuit photo; The recording module is used to record the measurement information and the association relationship between the measurement information and the target element and / or the target site.

5. The circuit board testing system according to claim 4, characterized in that: The search module includes: A preprocessing unit, used for preprocessing the local circuit photo and the overall circuit photo; A feature recognition unit, used to recognize feature points of the preprocessed local circuit photo and the overall circuit photo; A region search unit, configured to search, based on the feature points, in the preprocessed overall circuit photo for a region that matches the preprocessed partial circuit photo, to obtain at least one similar region; A similarity evaluation unit, used for evaluating the similarity between each of the similar regions and the local circuit photo; A region determination unit, configured to determine the similar region with the highest similarity as a target region on the overall circuit photo corresponding to the local circuit photo; A target determination unit is used to determine the target element and / or the target site on the local circuit photograph in the target area.

6. A circuit board testing method, characterized in that: The method is performed using the circuit board testing system as claimed in claim 4 or 5, comprising: Use the test leads in the multimeter to measure the target components and / or target locations on the circuit board to obtain corresponding measurement information; Using a micro camera in a multimeter to take a picture of the target element and / or the area where the target site is located to obtain a local circuit picture; Using a search module in a data processing terminal, searching and determining the target element and / or the target site on the partial circuit photo according to a pre-stored complete circuit photo; The measurement information and the association between the measurement information and the target element and / or the target site are recorded using a recording module in the data processing terminal.

7. The method according to claim 6, characterized in that Using a search module in a data processing terminal to search and determine the target element and / or the target site on the partial circuit photo in a pre-stored complete circuit photo includes: Preprocessing the local circuit photo and the overall circuit photo; Identifying feature points of the preprocessed local circuit photo and the overall circuit photo; According to the feature points, searching the preprocessed overall circuit photo for an area that matches the preprocessed partial circuit photo to obtain at least one similar area; Evaluating the similarity between each of the similar regions and the local circuit photo; Determine that the similar region with the highest similarity is the target region on the overall circuit photo corresponding to the local circuit photo; The target element and / or the target site on the partial circuit photograph is determined in the target area.

8. The method according to claim 6, characterized in that Using a recording module in a data processing terminal to record the measurement information and the association between the measurement information and the target element and / or the target site includes at least one of the following methods: Recording the target element and / or the target site and measurement information in a table form; The measurement information corresponding to the target element and / or the target site is marked in a target area on the overall circuit photo, wherein the target area is an area including the target element and / or the target site.

9. The method according to claim 6, characterized in that Before using the probes in the multimeter to measure the target components and / or target locations on the circuit board to obtain the corresponding measurement information, the following steps are also included: Obtain a complete circuit photograph of the circuit board; Determine the basic structural information on the complete circuit photo; wherein the basic structural information includes at least one of chip model, chip pin, chip size, circuit board silk screen, circuit board number and routing direction; When the basic structure information on the complete circuit photo is consistent with the preset circuit diagram in the preset database, extracting the preset circuit diagram; Based on this, using the search module in the data processing terminal, the target component and / or the target site on the partial circuit photo can be searched and determined according to the pre-stored complete circuit photo, which can be replaced by: Using a search module in the data processing terminal, search and determine the target element and / or the target site on the local circuit photo on the extracted preset circuit diagram; Using a recording module in a data processing terminal to record the measurement information and the association between the measurement information and the target element and / or the target site can be replaced by: The recording module in the data processing terminal is used to record the measurement information corresponding to the target element and / or the target site on the extracted preset circuit diagram.

10. The method according to claim 9, characterized in that After searching and determining the target element and / or the target site on the local circuit photo on the extracted preset circuit diagram using a search module in the data processing terminal, the method further includes: Determining that the target element and / or the target site is in an abnormal state according to standard measurement information of the target element and / or the target site on the preset circuit diagram and the measurement information; An abnormal state is marked corresponding to the target element and / or the target location on the extracted preset circuit diagram.

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