Film capacitor core package overvoltage test device and method

Abstract

The present invention provides a film capacitor core package overvoltage test device and method, belonging to the field of capacitor core package testing technology. A film capacitor core package overvoltage test device includes a shell, a test cavity, a heating unit, an operation panel, a protective door, a placement plate, a positioning part, a threading groove, a mounting groove, a rotating rod, a toggle part and a resistance piece; the present invention drives a semicircular resistance plate through a rotating rod to tightly resist the lead wire during the test to seal the threading groove, maintain a constant temperature in the test cavity and prevent test errors, and releases the resistance on the lead wire after the test so as to easily remove the capacitor core package and separate the positioning plate, thereby avoiding the problem of difficulty in removing the capacitor core package due to adhesion of the molten material. Such a design makes the entire test process smoother and improves the test efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of capacitor core package testing, and in particular to a device and method for testing an overvoltage of a film capacitor core package. Background Art

[0002] Film capacitors support ripple current and clamp voltage spikes in circuits. During operation, the circuit will have non-periodic pulse voltage and ripple voltage of a certain frequency. If these voltages exceed the voltage resistance of the film capacitor, the film will break down. Although film capacitors have certain self-healing capabilities, excessive breakdown will cause the film capacitor to fail.

[0003] In order to meet the national standard requirements for overvoltage capability, in the process of producing film capacitor core packages, overvoltage tests must be carried out under high temperature conditions to test their bearing capacity, insulation performance and safety. When conducting high temperature withstand voltage tests, traditional capacitor core packages are usually placed in an oven, and the two leads welded on the capacitor core package are led out of the preset outlet slots of the oven to connect to the external power supply test equipment. However, in order to ensure that the pre-welded leads on the capacitor core package can smoothly pass through the outlet slots to the outside of the oven, the diameter of the outlet slots must be designed to be larger than the size of the lead connection terminals. Although this design facilitates the passage of the leads, it will also cause the heat inside the oven to easily overflow to the outside through the outlet slots, thereby affecting the constancy of the temperature in the oven, introducing test errors, and ultimately reducing test efficiency. To this end, in response to this problem, the present invention proposes a film capacitor core package overvoltage test device and method. Summary of the invention

[0004] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide a film capacitor core package overvoltage testing device and method that can overcome the above problems or at least partially solve the above problems.

[0005] In order to solve the above technical problems, the basic concept of the technical solution adopted by the present invention is: a film capacitor core package overpressure test device, comprising a shell and a test cavity opened in the shell, the top wall of the test cavity is provided with a heating unit, the shell is provided with an operation panel electrically connected to the heating unit, the shell is provided with a protective door for sealing the test cavity, the test cavity is provided with a corresponding placement plate located below the heating unit, the placement plate is provided with a placement groove, the placement groove is provided with a corresponding positioning portion above the placement groove, the shell is provided with a pair of threading grooves, the leads welded on the capacitor core package can pass through the threading grooves and the corresponding power supply test of the shell outside The device is connected to the shell and also includes a mounting groove opened on one side of the shell, the side wall of the test cavity is rotatably provided with a rotating rod extending to the inside of the mounting groove, the rotating rod is provided with a toggle portion located inside the mounting groove, and a resistance member is provided between the side wall of the threading groove and the inside of the mounting groove, which is used to link with the toggle portion in a first state and a second state, when the toggle portion is in the first state, the resistance member contacts the lead surface, and at the same time, the positioning portion is sleeved and located at the top position of the capacitor core package, when the toggle portion is in the second state, the resistance member does not contact the lead surface, and at the same time, the positioning portion is sleeved and located in the middle position of the capacitor core package.

[0006] Preferably, the heating unit includes a heating frame fixed on the top wall of the test chamber, a plurality of equidistantly distributed heating tubes are installed between the inner walls of the heating frame, a matching protective net is provided at the bottom opening of the heating frame, corresponding temperature probes are installed at the four corners of the bottom of the heating frame, and the temperature probes and the heating tubes are electrically connected to the operation panel respectively.

[0007] Preferably, a pair of vertical triangular bars are installed on the two opposite side walls of the test cavity, and each of the vertical triangular bars is provided with a plurality of equidistant triangular grooves for cooperating with the placement plate to slide along the inner wall of the triangular groove and abut against the inner wall of the test cavity.

[0008] Preferably, the shell is connected to a connecting plate that seals the outer port of the mounting slot, a driving unit electrically connected to the operation panel is installed on the connecting plate, and an output end of the driving unit is connected to one end of the rotating rod located inside the mounting slot.

[0009] Preferably, the toggle portion comprises a toggle plate fixedly connected to the rotating rod, a pair of extension plates are fixed to the toggle plate, and a semicircular toggle plate which is linked to the abutment member is fixedly connected to one side of the extension plate.

[0010] Preferably, the resistance member includes a pair of limiting guide rods fixed between the inner walls of the installation groove, a pair of movable plates are slidably connected between the surfaces of the two limiting guide rods, a pair of springs sleeved on the limiting guide rods are fixed between each of the movable plates and the inner walls corresponding to the installation groove, and a resistance block sliding along the inner wall of the threading groove is fixedly connected to the movable plate, when the toggle part is in the first state, the circular toggle plate horizontally abuts against one side of the movable plate, and when the toggle part is in the second state, the circular toggle plate vertically corresponds to between the two limiting guide rods, and the movable plate fits against the surface of the toggle disk.

[0011] Preferably, a semicircular contact opening is formed at one end of the contact block located inside the threading groove, and a surface of the inner wall of the threading groove corresponding to the semicircular contact opening is in a semicircular structure.

[0012] Preferably, a cam located inside the test chamber is fixed on the rotating rod, a U-shaped toggle block is fitted on the cam, an L-shaped support plate sliding on the placement plate is fixedly connected to the U-shaped toggle block, a lifting plate located below the bottom of the placement plate is fixedly connected to one side of the L-shaped support plate, a pair of lifting rods sliding on the placement plate are fixed between the top of the lifting plate and the bottom of the positioning portion, and a pair of springs sleeved on the lifting rods are fixedly connected between the top of the lifting plate and the bottom of the placement plate.

[0013] Preferably, the positioning portion comprises a positioning plate fixedly connected to the top end of the lifting rod, the positioning plate is provided with a positioning groove matching the shape of the capacitor core package, and a strip-shaped extension edge is fixedly connected to the edge of the top of the positioning plate.

[0014] The present invention also provides a film capacitor core package overvoltage test method, comprising the following steps:

[0015] S1. Before the capacitor core pack enters the test chamber for testing, it must first be tested using an LCR bridge. The specific test content includes its capacity, loss tangent value, and insulation resistance value;

[0016] S2. Subsequently, the capacitor core package to be tested is placed in the placement groove from the top of the positioning part;

[0017] S3. Then, the two leads pre-welded on the capacitor core package are led out to the outside through the corresponding threading grooves on the shell, and connected to the positive and negative poles of the external power supply test equipment;

[0018] S4, starting the heating unit through the operation panel to control the preset temperature and time in the test chamber and the preset voltage applied by the external power supply test equipment;

[0019] S5. Finally, during the test, observe the electrical performance of the capacitor core package, including the size of the leakage current and whether there are abnormal phenomena such as melting, smoking, fire or short circuit.

[0020] After adopting the above technical scheme, the present invention has the following beneficial effects compared with the prior art: during the test process, the present invention drives a pair of semicircular abutment plates in the toggle part to abut between the two moving plates through the rotating rod, so that the abutment block can tightly abut the lead wire passing through the threading groove. Such a design can seal the threading groove, ensure the constant temperature in the test chamber, and at the same time, prevent problems such as poor contact, short circuit and test error caused by loose lead wires, provide a stable and reliable side-view environment for the high-temperature withstand voltage test of the capacitor core package, and thus improve the accuracy of the high-temperature withstand voltage test of the capacitor core package;

[0021] After the test is completed, a pair of semicircular resistance plates in the toggle part are driven by the rotating rod to be vertically located between the two limiting guide rods in order to release the resistance of the resistance block to the lead wire, so that the capacitor core package can be easily removed from the test cavity after completing the high temperature and voltage withstand test. In addition, under the two states switched by the semicircular resistance plate, the positioning plate can also be smoothly separated from the capacitor core package after the test is completed, thereby avoiding the problem of difficulty in removing the capacitor core package due to adhesion of the molten material. This design makes the entire testing process smoother and improves the testing efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 A front view of a film capacitor core overvoltage test device provided by the present invention;

[0023] Figure 2 A schematic diagram of the connection structure between the positioning part and the placement plate of a film capacitor core package overvoltage test device provided by the present invention Figure 1 ;

[0024] Figure 3 A schematic diagram of the connection structure between a heating unit and a top wall of a side-view cavity of a film capacitor core package overvoltage test device provided by the present invention;

[0025] Figure 4 A schematic diagram of the connection structure between the toggle plate and the moving plate of a film capacitor core package overvoltage test device provided by the present invention Figure 1 ;

[0026] Figure 5 A schematic diagram of the connection structure between the threading groove and the abutment block of a film capacitor core package overvoltage test device provided by the present invention Figure 1 ;

[0027] Figure 6A schematic diagram of an explosion structure of a placement plate and a test chamber connected to an overpressure test device for a film capacitor core package provided by the present invention;

[0028] Figure 7 A schematic diagram of the connection structure of an L-shaped support plate and a placement plate of a film capacitor core package overvoltage test device provided by the present invention;

[0029] Figure 8 A schematic diagram of the connection structure between the positioning part and the placement plate of a film capacitor core package overvoltage test device provided by the present invention Figure 2 ;

[0030] Fig. 9 A schematic diagram of a top-sectional structure of a shell of a film capacitor core package overvoltage test device provided by the present invention;

[0031] Fig.10 For the present invention Fig. 9 A schematic diagram of the partially enlarged structure at center A;

[0032] Fig.11 A schematic diagram of the connection structure between the toggle plate and the moving plate of a film capacitor core package overvoltage test device provided by the present invention Figure 2 ;

[0033] Fig.12 A schematic diagram of the connection structure between the threading groove and the abutment block of a film capacitor core package overvoltage test device provided by the present invention Figure 2 .

[0034] In the figure: 1. shell; 11. test chamber; 12. operation panel; 13. protection door; 14. threading groove; 15. installation groove; 16. vertical triangle bar; 17. triangle groove; 2. heating unit; 21. heating frame; 22. heating tube; 23. protection net; 24. temperature probe; 3. placement plate; 31. placement groove; 4. positioning part; 41. positioning plate; 42. positioning groove; 43. extension edge; 5. rotating rod; 51. connecting plate; 52. driving part; 6. toggle part; 61. toggle plate; 62. extension plate; 63. toggle plate; 64. cam; 65. U-shaped toggle block; 66. L-shaped support plate; 67. lifting plate; 68. lifting rod; 69. spring two; 7. resistance; 71. limit guide rod; 72. moving plate; 73. spring one; 74. resistance block; 75. semicircular resistance opening. DETAILED DESCRIPTION

[0035] The present invention is further described in detail below in conjunction with the accompanying drawings and embodiments so that those skilled in the art can implement the invention with reference to the description.

[0036] It should be understood that terms such as “having”, “including” and “comprising” used herein do not exclude the existence or addition of one or more other elements or combinations thereof.

[0037] In the description of the present invention, the terms "lateral", "longitudinal", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside" and "outside" etc. to indicate directions or positional relationships are based on the directions or positional relationships shown in the accompanying drawings and are only for the convenience of describing the present invention and simplifying the description. They do not indicate or imply that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore should not be understood as a limitation on the present invention.

[0038] Example 1: Reference Figure 1-Figure 7 A film capacitor core package overvoltage test device comprises a shell 1 and a test cavity 11 opened in the shell 1, a heating unit 2 is arranged on the top wall of the test cavity 11, an operation panel 12 electrically connected to the heating unit 2 is arranged on the shell 1, the heating unit 2 comprises a heating frame 21 fixed on the top wall of the test cavity 11, a plurality of heating tubes 22 equidistantly distributed are installed between the inner walls of the heating frame 21, a matching protective net 23 is arranged at the bottom opening of the heating frame 21, corresponding temperature probes 24 are installed at the four corners of the bottom of the heating frame 21, the temperature probe 24 and the heating tube 22 are electrically connected to the operation panel 12 respectively, a protective door 13 for sealing the test cavity 11 is arranged on the shell 1, a transparent window is arranged on the protective door 13, a corresponding placement plate 3 is arranged below the heating unit 2 in the test cavity 11, a placement groove 31 is arranged on the placement plate 3, a pair of threading grooves 14 are arranged on the shell 1, and the leads for welding on the capacitor core package can be connected to the corresponding power supply test equipment outside the shell 1 through the threading grooves 14.

[0039] When the above technical solution is used, the capacitor core package needs to be tested by an LCR bridge first. The specific test contents include its capacity, loss tangent value and insulation resistance value. Through the LCR bridge test, potential defects in the capacitor core package, such as internal short circuit and poor insulation, can be discovered in time, thereby preventing these defects from causing unnecessary damage or safety accidents in subsequent tests. At the same time, the test also ensures that only capacitor core packages that meet the requirements will be allowed to enter the subsequent testing stage.

[0040] Next, open the protective door 13 on the shell 1, and place the capacitor core package to be tested in the placement slot 31, and then lead the two leads welded on the capacitor core package to the outside of the shell 1 through the corresponding threading slots 14 on the shell 1, and connect them to the positive and negative terminals of the external power supply test equipment. Then start the heating tube 22 and the temperature probe 24 through the operation panel 12 to maintain the temperature in the test chamber 11 at 105 degrees Celsius and keep this temperature for two hours. Finally, apply 2.1 times the rated voltage to the positive and negative poles of the capacitor core package through the external power supply test equipment for testing. In this test process, the specifications of the capacitor core package are 600V and 500μF. The capacitor core package is composed of five core packages with the same specifications of 600V and 100μF connected in parallel. Each core package is carefully made of 2515 turns of metallized polypropylene safety film with a thickness of 2.9μm, a width of 30mm, and a 1.5mm edge. According to the rated voltage of the capacitor core package of 600V, the applied test voltage is 2.1x600=1260VDC, the boost time is set to 20 seconds, the hold time is set to 32 seconds, and the step-down time is set to 8 seconds. If the leakage current of the capacitor core package is detected to be less than or equal to 1A, and there is no melting, smoking, fire or short circuit, the capacitor core package is judged to be a qualified product. After the test, the capacitor core package is tested again using the LCR bridge to measure and record its capacity, loss tangent value and insulation resistance value to further verify whether its performance meets the requirements.

[0041] Reference Figure 2 and Figure 8 Furthermore, a corresponding positioning portion 4 is provided above the placement groove 31. It is assumed that a hole matching the shape and size of the capacitor core package is provided on the positioning portion 4, and the positioning portion 4 is fixed above the top of the placement plate 3 by a support rod. In this way, the capacitor core package can be stably placed in the placement groove 31 through the hole on the positioning portion 4, thereby preventing the capacitor core package from shaking or shifting during the test, resulting in inaccurate measurement results.

[0042] At the same time, it is also considered that if the placement plate 3 and the inner wall of the test cavity 11 are fixedly designed, then after the capacitor core package completes the high temperature and voltage withstand test, it is necessary to wait for a long time for the capacitor core package to cool naturally before it can be taken out of the test cavity 11, which may affect the subsequent test efficiency of the capacitor core package. In order to solve this problem, a pair of vertical triangular bars 16 are installed on the opposite side walls of the test cavity 11, and each vertical triangular bar 16 is provided with a plurality of equidistant triangular grooves 17 to cooperate with the placement plate 3 to slide along the inner wall of the triangular groove 17 and contact the inner wall of the test cavity 11. When the capacitor core package completes the high temperature and voltage withstand test, it can be easily Pull the bottom of the placement plate 3 to make the placement plate 3 slide out of the triangular groove 17 of the corresponding vertical triangular bar 16 until it is completely separated from the outside of the shell 1. In this way, the capacitor core package placed on the placement plate 3 can be cooled outside the shell 1, which is faster than the cooling speed inside the shell 1. At the same time, in the process of pulling the placement plate 3, since the heating unit 2 is located directly above the capacitor core package, the bottom temperature of the placement plate 3 is relatively low, and will not cause scalding problems. This design not only improves the test efficiency of the capacitor core package, but also ensures the safety of the operator, making the entire test process more convenient and efficient.

[0043] Example 2: Reference Figure 1-Figure 12Considering the two leads welded on the capacitor core package, if they are to pass smoothly through the threading groove 14 to the outside of the shell 1 and connect to the external power supply test equipment, the diameter of the threading groove 14 must be designed to be larger than the size of the lead connection terminal. This will cause the heat in the test cavity 11 to easily overflow from the threading groove 14 to the outside, causing errors in the constant temperature in the test cavity 11 and affecting the test efficiency. Therefore, based on this problem, on the basis of the above embodiment, it also includes a mounting groove 15 opened on one side of the shell 1, and the side wall of the test cavity 11 is rotatably provided with a rotating rod 5 extending to the inside of the mounting groove 15. The shell 1 is connected to a connecting plate 51 that seals the outer port of the mounting groove 15, and a driving part 52 electrically connected to the operation panel 12 is installed on the connecting plate 51. The output end of the driving part 52 is connected to one end of the rotating rod 5 located inside the mounting groove 15. The rotating rod 5 is provided with a toggle part 6 located inside the mounting groove 15, and the toggle part 6 includes a toggle disk 61 fixedly connected to the rotating rod 5. A pair of extension plates 62 are fixed on the disk 61, and a semicircular toggle plate 63 that is linked with the abutment 7 is fixedly connected to one side of the extension plate 62. Abutment 7 is provided between the side wall of the threading groove 14 and the inside of the mounting groove 15, which is used to link with the toggle part 6 in the first state and the second state. The abutment 7 includes a pair of limiting guide rods 71 ​​fixed between the inner walls of the mounting groove 15, and a pair of moving plates 72 are slidably connected between the surfaces of the two limiting guide rods 71, and each moving plate 72 is connected to the mounting groove 15. A pair of springs 73 sleeved on the limiting guide rod 71 are fixed between the corresponding inner walls. A resisting block 74 sliding along the inner wall of the threading groove 14 is fixedly connected to the movable plate 72. A semicircular resisting opening 75 is provided at one end of the resisting block 74 located inside the threading groove 14. The inner wall of the threading groove 14 corresponding to the semicircular resisting opening 75 has a semicircular structure. When the toggle portion 6 corresponds to the first state, the circular toggle plate 63 horizontally resists against one side of the movable plate 72, and the resisting member 7 contacts the surface of the lead wire. Figure 4 When the toggle portion 6 corresponds to the second state, the circular toggle plate 63 corresponds vertically between the two limit guide rods 71, the moving plate 72 fits the surface of the toggle plate 61, and the abutment member 7 does not contact the surface of the lead wire.

[0044] The above technical solution starts the driving part 52 using the servo motor through the operation panel 12, and cooperates with the rotating rod 5 to drive a pair of semicircular toggle plates 63 on the toggle disk 61 to horizontally contact the surface of the moving plate 72. The moving plate 72 will drive the contact block 74 to slide along the inner wall of the threading groove 14 under the horizontal contact of the semicircular toggle plates 63, and tightly contact the leads welded on the capacitor against the semicircular inner wall of the threading groove 14. This action not only realizes the effective sealing of the threading groove 14, ensures the constant temperature in the test cavity 11, thereby improving the accuracy of the high temperature withstand voltage test of the capacitor core package, but also prevents problems such as poor contact, short circuit and test error caused by loose leads, and provides a stable and reliable testing environment for the high temperature withstand voltage test of the capacitor core package.

[0045] As the rotating rod 5 continues to drive the pair of semicircular toggle plates 63 on the toggle disk 61 to rotate, the pair of semicircular toggle plates 63 on the toggle disk 61 will vertically correspond to the two limit guide rods 71. At this time, the movable plate 72 will be attached to the surface of the toggle disk 61 under the elastic reset of the spring 73 without the interference restriction of the semicircular toggle plates 63. During this reset process, the movable plate 72 will also drive the interference block 74 to gradually move away from the arc-shaped inner wall of the threading groove 14, thereby forming an appropriate spacing between the threading groove 14 and the interference block 74, which can facilitate the corresponding wiring terminals on the outside of the shell 1 to pass smoothly through the threading groove 14, and help the capacitor core package to be easily removed from the inside of the test cavity 11 after completing the high temperature and voltage withstand test.

[0046] It should be noted that the driving part 52 drives the rotating rod 5 to rotate counterclockwise or clockwise by 90 degrees each time. Such a design enables the semicircular toggle plate 63 on the toggle disk 61 to accurately switch between the two states.

[0047] Example 3: Reference Figure 2 , Figure 7 and Figure 8 On the basis of the above embodiment, a cam 64 located inside the test cavity 11 is fixed on the rotating rod 5, a U-shaped toggle block 65 is attached to the cam 64, an L-shaped support plate 66 sliding on the placement plate 3 is fixedly connected to the U-shaped toggle block 65, a lifting plate 67 located below the bottom of the placement plate 3 is fixedly connected to one side of the L-shaped support plate 66, a pair of lifting rods 68 sliding on the placement plate 3 are fixed between the top of the lifting plate 67 and the bottom of the positioning portion 4, a pair of springs 69 sleeved on the lifting rods 68 are fixedly connected between the top of the lifting plate 67 and the bottom of the placement plate 3, the positioning portion 4 includes a positioning plate 41 fixedly connected to the top of the lifting rod 68, a positioning groove 42 matching the shape of the capacitor core package is provided on the positioning plate 41, and a strip-shaped extension edge 43 is fixedly connected to the edge of the top of the positioning plate 41.

[0048] When the rotating rod 5 drives a pair of semicircular toggle plates 63 on the toggle disk 61 to horizontally contact between the two moving plates 72, the tip of the cam 64 on the rotating rod 5 contacts the bottom of the U-shaped toggle block 65, so that the U-shaped toggle block 65, under the squeezing of the cam 64, will drive the L-shaped support plate 66 to drive the lifting rod 68 on the lifting plate 67 to push the positioning plate 41 to slide upward along the surface of the capacitor core package, so that the positioning plate 41 can be close to the top of the capacitor core package. On the one hand, it can improve the stability of the placement of the capacitor core package. On the other hand, under the action of the positioning plate 41 and the extension edge 43, it can also prevent the melt from dripping directly into the placement groove 31 when the capacitor core package melts, but in the area formed by the positioning plate 41 and the extension edge 43, thereby avoiding the problem of unstable subsequent placement of the capacitor core package.

[0049] When the rotating rod 5 drives a pair of semicircular toggle plates 63 on the toggle disk 61 to be vertically located between the two limiting guide rods 71, the tip of the cam 64 on the rotating rod 5 will be out of contact with the bottom of the U-shaped toggle block 65, and the arc end corresponding to the tip of the cam 64 will contact the bottom of the U-shaped toggle block 65. During this process, the L-shaped support plate 66 begins to reset under the elastic force of the spring 2 69. The L-shaped support plate 66 drives the lifting rod 68 on the lifting plate 67 to pull the positioning plate 41 to slide downward along the surface of the capacitor core package, so that the positioning plate 41 is close to the middle position of the capacitor core package, thereby pulling off the molten material that may adhere to the positioning plate 41 and the capacitor core package. In this way, even if the capacitor core package melts during the test, it will not be difficult to remove due to the adhesion of the molten material to the positioning plate 41.

[0050] It should be noted that the above-mentioned molten material adhered between the positioning plate 41 and the capacitor core package is usually unevenly distributed, that is, this unevenly distributed molten material does not form a continuous and strong adhesion layer on the entire contact surface, and therefore will not cause excessively strong adhesion between the positioning plate 41 and the capacitor core package. The adhesion is relatively weak, so under the action of elastic force, the molten material is more easily pulled apart in the area with weaker adhesion.

[0051] In addition, the U-shaped toggle block 65 fixed on the L-shaped support plate 66 is vertically attached to the surface of the cam 64 , so the two rotation states of the toggle portion 6 will not affect the placement plate 3 from sliding out of the triangular groove 17 on the vertical triangular bar 16 .

[0052] The above embodiments only express several implementation methods of the present invention, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the present invention, which are equivalent modifications and improvements made to the above embodiments based on the essential technology of the present invention, and all of them belong to the protection scope of the present invention.

Claims

1. A film capacitor core overvoltage test device, characterized in that: include: Housing (1); as well as A test cavity (11) is provided in the shell (1), a heating unit (2) is provided on the top wall of the test cavity (11), an operation panel (12) electrically connected to the heating unit (2) is provided on the shell (1), a protective door (13) for sealing the test cavity (11) is provided on the shell (1), a corresponding placement plate (3) is provided in the test cavity (11) and is located below the heating unit (2), a placement groove (31) is provided on the placement plate (3), a corresponding positioning portion (4) is provided above the placement groove (31), and a pair of threading grooves (14) are provided on the shell (1), and leads for welding on a capacitor core package can be connected to corresponding power supply test equipment outside the shell (1) through the threading grooves (14); and further comprising: A mounting groove (15) is provided on one side of the housing (1); a rotating rod (5) is rotatably provided on the side wall of the test cavity (11) and extends into the interior of the mounting groove (15); a toggle portion (6) is provided on the rotating rod (5) and is located inside the mounting groove (15); and a resisting member (7) is provided between the side wall of the threading groove (14) and the interior of the mounting groove (15) for linkage with the toggle portion (6) in a first state and a second state; When the toggle portion (6) is in the first state, the abutment member (7) contacts the surface of the lead wire, and at the same time, the positioning portion (4) is sleeved and located at the top of the capacitor core package; When the toggle portion (6) is in the second state, the abutment member (7) is not in contact with the surface of the lead wire, and at the same time, the positioning portion (4) is sleeved and located in the middle of the capacitor core package; The abutment member (7) comprises a pair of limiting guide rods (71) fixed between the inner walls of the installation groove (15); a pair of movable plates (72) are slidably connected between the surfaces of the two limiting guide rods (71); a pair of springs (73) sleeved on the limiting guide rods (71) are fixed between each movable plate (72) and the inner wall corresponding to the installation groove (15); and a limiting block (74) is fixedly connected to the movable plate (72) and slides along the inner wall of the threading groove (14).

2. A film capacitor core overvoltage test device according to claim 1, characterized in that: The heating unit (2) comprises a heating frame (21) fixed on the top wall of the test cavity (11), a plurality of heating tubes (22) are installed between the inner walls of the heating frame (21) and are distributed at equal intervals, a matching protective net (23) is provided at the bottom opening of the heating frame (21), and corresponding temperature probes (24) are installed at the four corners of the bottom of the heating frame (21), and the temperature probes (24) and the heating tubes (22) are respectively electrically connected to the operation panel (12).

3. The film capacitor core overvoltage test device according to claim 1, characterized in that: A pair of vertical triangular bars (16) are installed on opposite side walls of the test cavity (11), and each of the vertical triangular bars (16) is provided with a plurality of equidistant triangular grooves (17) for cooperating with the placement plate (3) to slide along the inner wall of the triangular groove (17) and abut against the inner wall of the test cavity (11).

4. The film capacitor core overvoltage test device according to claim 1, characterized in that: The housing (1) is connected to a connecting plate (51) that seals the outer end of the mounting groove (15); a driving unit (52) that is electrically connected to the operating panel (12) is mounted on the connecting plate (51); an output end of the driving unit (52) is connected to an end of the rotating rod (5) located inside the mounting groove (15).

5. The film capacitor core overvoltage test device according to claim 1, characterized in that: The toggle portion (6) comprises a toggle plate (61) fixedly connected to the rotating rod (5), a pair of extension plates (62) being fixedly connected to the toggle plate (61), and a semicircular toggle plate (63) linked to the abutment member (7) being fixedly connected to one side of the extension plate (62).

6. A film capacitor core overvoltage test device according to claim 5, characterized in that: When the toggle portion (6) is in the first state, the circular toggle plate (63) horizontally contacts one side of the movable plate (72); when the toggle portion (6) is in the second state, the circular toggle plate (63) vertically corresponds to between the two limit guide rods (71), and the movable plate (72) is in contact with the surface of the toggle plate (61).

7. A film capacitor core overvoltage test device according to claim 6, characterized in that: A semicircular contact opening (75) is formed at one end of the contact block (74) located inside the threading groove (14), and a side of the inner wall of the threading groove (14) corresponding to the semicircular contact opening (75) is in a semicircular structure.

8. The film capacitor core overvoltage test device according to claim 1, characterized in that: A cam (64) located inside the test cavity (11) is fixed on the rotating rod (5), a U-shaped toggle block (65) is attached to the cam (64), an L-shaped support plate (66) sliding on the placement plate (3) is fixedly connected to the U-shaped toggle block (65), a lifting plate (67) located below the bottom of the placement plate (3) is fixedly connected to one side of the L-shaped support plate (66), a pair of lifting rods (68) sliding on the placement plate (3) are fixed between the top of the lifting plate (67) and the bottom of the positioning portion (4), and a pair of springs (69) sleeved on the lifting rods (68) are fixedly connected between the top of the lifting plate (67) and the bottom of the placement plate (3).

9. A film capacitor core overvoltage test device according to claim 8, characterized in that: The positioning portion (4) comprises a positioning plate (41) fixedly connected to the top end of the lifting rod (68), the positioning plate (41) being provided with a positioning groove (42) matching the shape of the capacitor core package, and a strip-shaped extension edge (43) being fixedly connected to the edge of the top of the positioning plate (41).

10. A film capacitor core pack overvoltage test method, applied to a film capacitor core pack overvoltage test device according to claim 1, characterized in that: The following steps are involved: S1. Before the capacitor core pack enters the test chamber (11) for testing, the capacitor core pack must first be tested using an LCR bridge. The specific test contents include its capacity, loss tangent value, and insulation resistance value; S2. Subsequently, the capacitor core package to be tested is placed in the placement groove (31) from the top of the positioning portion (4); S3, then, lead the two leads pre-welded on the capacitor core package to the outside through the corresponding wire threading grooves (14) on the housing (1), and connect them to the positive and negative electrodes of the external power supply test equipment; S4, starting the heating unit (2) through the operation panel (12), controlling the preset temperature and time in the test chamber (11) and the preset voltage applied by the external power supply test equipment; S5. Finally, during the test, observe the electrical performance of the capacitor core package, including the leakage current and whether there is melting, smoking, fire or short circuit.

Images