Multi-channel sampling value consistency correction method and system of power system device

Abstract

The invention relates to the technical field of power system devices, and provides a multi-channel sampling value consistency correction method and system of a power system device, and the method comprises the steps: carrying out the test grouping of channels of the same type in the device, and appointing a test grouping reference channel; specifying unique reference channels of the same type in the device; specifying a unique reference channel of the device; calculating to obtain first relative values of all channels in the test group; calculating to obtain second relative values of all channels in the same type; calculating to obtain a module value relative value in the third relative values of all channels in the same type; calculating to obtain a phase difference in the third relative values of all channels in the same type; calculating to obtain a relative time difference; storing the third relative value of each channel and the relative time difference of each channel as correction parameters; calculating to obtain a sampling value after consistency correction; and calculating to obtain a phasor value after consistency correction. According to the invention, the problem of inconsistent multi-channel sampling values of the power system device can be effectively solved.

Description

Technical Field

[0001] The present invention relates to the technical field of power system devices, and in particular to a method and system for calibrating consistency of multi-channel sampling values ​​of a power system device. Background Art

[0002] The device converts analog signals into digital quantities through digital sampling. Digital sampling includes analog quantity conversion, filtering, analog-to-digital conversion circuits and other links. There are certain errors in each link. The small CT and VT inside the device are used for current analog quantity conversion and voltage analog quantity conversion respectively, and their errors are more difficult to control accurately. The product standard of power system relay protection devices stipulates that the accuracy requirements of a single current analog quantity channel are that the angle difference is not greater than ±60', the relative error of the amplitude is not greater than 2.5%, or the absolute error is not greater than 0.02 times the rated value, which is the highest level that can be achieved in production process control at present. In the functions of the device that require multi-channel sampling values ​​to participate in the calculation, the sampling values ​​of the multiple channels should achieve the best consistency with each other, otherwise the inconsistency caused by the discrete type that only controls the accuracy of a single channel will have an adverse effect on the function. For example, the differential protection function in the device should be as small as possible during normal operation. Since the consistency of the analog channel of the device is not yet optimal, in engineering applications, the unbalanced current is often displayed large. First, the operating personnel are very confused about this. Second, the unbalanced current alarm threshold value is set large, and the fault with unclear abnormal characteristics of the analog channel cannot be found. Third, the performance of the differential protection function is reduced. Therefore, the inconsistency problem needs to be solved urgently. Moreover, with the rapid development of new power systems, the adaptability of the device faces severe challenges, and the severity of the inconsistency problem is becoming more and more prominent. How to achieve the optimal consistency of the multi-channel sampling values ​​of the device economically and efficiently under economic constraints to ensure the safe and stable operation of the power system, there is currently no relevant economic and practical technology. Summary of the invention

[0003] The purpose of the present invention is to solve at least one technical problem in the background technology and to provide a method and system for calibrating consistency of multi-channel sampling values ​​of an electric power system device.

[0004] To achieve the above object, the present invention provides a method for calibrating consistency of multi-channel sampling values ​​of an electric power system device, comprising:

[0005] Conduct test grouping for the same type of channels in the device, and designate one channel in each test group as the test group reference channel;

[0006] Designate one channel among the channels of the same type in the device as the only reference channel of the same type;

[0007] Designate a channel in the device as the only reference channel of the device;

[0008] Apply a fixed value of excitation to each test group, and calculate the first relative value of all channels in the test group, wherein the reference of the first relative value is the reference channel of the test group;

[0009] Based on the first relative value and the phasor values ​​of all channels in the test group at the same moment that have been saved in the process of calculating the first relative value, the second relative value of all channels of the same type is calculated, wherein the reference of the second relative value is the only reference channel of the same type;

[0010] Based on the relative value of the modulus value in the second relative value and the excitation amount of the fixed value applied to each unique reference channel of the same type, the relative value of the modulus value in the third relative value of all channels of the same type is calculated, wherein the reference of the relative value of the modulus value in the third relative value is the excitation amount of the fixed value applied;

[0011] Based on the phase difference in the second relative value and the excitation amount of a fixed value applied to the unique reference channel of the same type and the unique reference channel of the device at the same time, the phase difference in the third relative value of all channels of the same type is calculated, wherein the reference of the phase difference in the third relative value is the unique reference channel of the device;

[0012] Calculating a relative time difference based on the phase difference in the third relative value and the frequency parameter of the excitation amount of the applied fixed value;

[0013] storing the third relative value of each channel and the relative time difference of each channel as correction parameters;

[0014] Based on the correction parameters, a consistency correction calculation is performed on the original sampling value of each channel to obtain a sampling value after consistency correction;

[0015] Based on the correction parameters, a consistency correction calculation is performed on the original phasor value of each channel to obtain a phasor value after consistency correction.

[0016] According to one aspect of the present invention, the testing grouping of channels of the same type in the device comprises:

[0017] The number of experimental groups is greater than or equal to 1;

[0018] Any two test groups of the same type of channel can be connected through a common channel or transitions between other test groups and common channels;

[0019] The number of channels in each test group is greater than or equal to 2 and less than or equal to the maximum number of channels in the same type of test group.

[0020] According to one aspect of the present invention, applying a fixed value of the stimulus amount to each test group includes:

[0021] If the channels in the test group are current analog channel types, the small CTs of all current analog channels in the test group are connected end to end and connected in series to ensure that they are all input with the same polarity. The current output of the test instrument is connected to the beginning and end of the small CT in series to apply a fixed value of excitation.

[0022] According to one aspect of the present invention, applying a fixed value of the stimulus amount to each test group further comprises:

[0023] If the channels in the test group are voltage analog channel type, the small VTs of all voltage analog channels in the test group are connected in parallel to ensure that they are all input with the same polarity. The voltage output of the test instrument is connected to the first and last ends of the small VT after parallel connection to apply a fixed value of excitation.

[0024] According to one aspect of the present invention, applying a fixed value of excitation to each test group to calculate the first relative value of all channels in the test group includes:

[0025] After applying the correct stimulus amount to the corresponding test group, select to enter the correction parameter calculation process of the corresponding test group consistency correction;

[0026] Use the original sampling values ​​to calculate and save the phasor values ​​of all channels in the corresponding test group at the same time;

[0027] Determine whether the modulus values ​​of the phasor values ​​of all channels in the corresponding test group are within the range of the applied fixed value of the excitation;

[0028] If so, taking the corresponding test group reference channel as the reference, the first relative value of all channels in the corresponding test group relative to the reference is calculated using the phasor value;

[0029] Determine whether the first relative values ​​of all channels in the corresponding test group are within a reasonable range;

[0030] If so, the first relative value is available.

[0031] According to one aspect of the present invention, the range of the fixed value of the stimulus applied to each test group is:

[0032] [(1-W F )*I e1 *K1,(1+W F )*I e1 *K2];

[0033] Among them, W F I is the channel ratio difference limit percentage of the device, e1 is the effective value of the fixed value of the stimulus applied to the test group, K1 is the reliability coefficient of the lower limit of the modulus value range; K2 is the reliability coefficient of the upper limit of the modulus value range.

[0034] According to one aspect of the present invention, the value range of the lower limit reliability coefficient K1 of the modulus value range is: 0.8≤K1≤0.98.

[0035] According to one aspect of the present invention, the value range of the upper limit reliability coefficient K2 of the modulus value range is: 1.02≤K2≤1.2.

[0036] According to one aspect of the present invention, it is characterized in that the reasonable range includes:

[0037] Reasonable range of specific modulus relative value:

[0038] Among them, W F is the channel ratio difference limit percentage of the device, K3 is the lower limit reliability coefficient of the module value relative value; K4 is the upper limit reliability coefficient of the module value relative value.

[0039] According to one aspect of the present invention, the value range of the lower limit reliability coefficient K3 of the relative value of the modulus value is: 0.9≤K3≤0.98.

[0040] According to one aspect of the present invention, the value range of the upper limit reliability coefficient K4 of the relative value of the modulus value is: 1.02≤K4≤1.1.

[0041] According to one aspect of the present invention, the reasonable range also includes:

[0042] Reasonable range of specific phase difference: ≤2*W Δθ *K5;

[0043] Among them, K5 is the phase difference range reliability coefficient; W Δθ It is the channel phase difference limit of the device.

[0044] According to one aspect of the present invention, the phase difference range reliability coefficient K5 has a value range of: 1.01≤K5≤1.1.

[0045] According to one aspect of the present invention, when the second relative value is calculated, the following operations are performed on the test groups respectively:

[0046] Based on the phasor values ​​of all channels in the test group at the same moment that have been saved in the first relative value calculation process, the relative value between the test group reference channel and the unique reference channel of the same type is calculated; if the test group reference channel and the unique reference channel of the same type are not in the same test group, the relative value between the test group reference channel and the unique reference channel of the same type needs to be obtained by superposition calculation through the connection of the common channels between the test groups;

[0047] The second relative values ​​of all channels in the test group are calculated using the relative value between the test group reference channel and the only reference channel of the same type and the first relative value.

[0048] According to one aspect of the present invention, the superposition calculation includes:

[0049] Step 1: Use the saved phasor values ​​of all channels in the test group at the same time to calculate the relative value between the test group reference channel and another test group common channel with it;

[0050] Step 2: Determine whether another test group contains a unique reference channel of the same type;

[0051] Step 3: If yes, use the saved phasor values ​​of all channels in another test group at the same time to calculate the relative value between the common channel of another test group and the unique reference channel of the same type in another test group; superimpose all the calculated relative values ​​connected by the common channel to obtain the relative value between the reference channel of the test group and the unique reference channel of the same type, and the superposition calculation is completed;

[0052] Step 4: If not, use the phasor values ​​of all channels in another test group at the same time that have been saved to calculate the relative value between the common channel of another test group and the common channel of the third test group that has a common channel with it;

[0053] Step 5: Repeat steps 2 to 4 and perform iterative calculations to obtain the corresponding relative values.

[0054] According to one aspect of the present invention, the calculating the relative time difference comprises:

[0055] Find the channel in which the phase difference in the third relative value is the minimum among all channels;

[0056] Taking the channel with the minimum value as the reference, calculate the phase difference of all channels relative to the reference;

[0057] The phase difference based on the channel with the minimum value is converted into a relative time difference using the frequency parameter of the applied fixed value excitation amount.

[0058] According to one aspect of the present invention, when the relative value of the modulus value in the third relative value is calculated, the following operations are performed on the unique reference channels of the same type respectively:

[0059] After applying the correct excitation amount to the corresponding unique reference channel of the same type, select to enter the correction parameter calculation process of the corresponding unique reference channel modulus of the same type;

[0060] The effective value of the corresponding unique reference channel of the same type is calculated, and the relative value of the modulus between the corresponding unique reference channel of the same type and the applied fixed value of the excitation is calculated by using the effective value;

[0061] Determine whether the relative value of the modulus is within a reasonable range;

[0062] If so, the relative value of the modulus between the corresponding unique reference channel of the same type and the applied fixed value of the excitation amount and the relative value of the modulus in the second relative value are used to calculate the relative value of the modulus in the third relative value of all channels of the same type.

[0063] According to one aspect of the present invention, when the phase difference in the third relative value is calculated, the following operations are performed on the same type of unique reference channels respectively:

[0064] After the correct excitation amount is applied to the corresponding unique reference channel of the same type and the unique reference channel of the device, the correction parameter calculation process of the corresponding unified unique reference channel of the same type is selected;

[0065] Calculate and obtain the corresponding phasor values ​​of the same type of unique reference channel and the device's unique reference channel at the same time;

[0066] The phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device is calculated by using the phasor value, and the phase difference between the corresponding unique reference channel of the same type and the fixed value of the excitation quantity applied by the unique reference channel of the device is subtracted from the phase difference;

[0067] Determine whether the phase difference is within a reasonable range;

[0068] If so, the phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device and the phase difference in the second relative value are used to calculate the phase difference in the third relative value of all channels of the same type.

[0069] According to one aspect of the present invention, obtaining the sampling value after consistency correction includes:

[0070] Using the relative value of the modulus value of each channel in the correction parameter, the original sampling value of each channel is corrected and calculated to obtain the sampling value of each channel after the relative value of the modulus value is corrected;

[0071] The relative time difference of each channel in the correction parameter is used to perform interpolation calculation of the relative time difference on the sampling value of each channel after the relative value correction of the modulus value, so as to obtain the sampling value after consistency correction.

[0072] According to one aspect of the present invention, obtaining the phasor value after consistency correction includes:

[0073] The modulus and phase angle of the original phasor value of each channel are corrected and calculated using the relative value of the modulus value and the phase difference of each channel in the correction parameters to obtain the phasor value after consistency correction.

[0074] To achieve the above object, the present invention also provides a multi-channel sampling value consistency correction system for a power system device, comprising:

[0075] The test group reference channel designation module performs test grouping on the channels of the same type in the device and designates one channel in each test group as the test group reference channel;

[0076] A module for designating a unique reference channel of the same type, which designates one channel among the channels of the same type in the device as the unique reference channel of the same type;

[0077] A device unique reference channel designation module, which designates a channel in the device as the device unique reference channel;

[0078] A first relative value calculation module applies a fixed value of excitation to each test group, and calculates the first relative value of all channels in the test group, wherein the reference of the first relative value is the reference channel of the test group;

[0079] A second relative value calculation module, based on the first relative value and the phasor values ​​of all channels in the test group at the same time that have been saved in the process of calculating the first relative value, calculates the second relative value of all channels in the same type, wherein the reference of the second relative value is the only reference channel of the same type;

[0080] A module for calculating a relative value of a modulus in a third relative value, which calculates relative values ​​of modulus in the third relative values ​​of all channels of the same type based on the relative value of the modulus in the second relative value and the excitation amount of a fixed value applied to each unique reference channel of the same type, wherein the reference of the relative value of the modulus in the third relative value is the excitation amount of the fixed value applied;

[0081] A phase difference calculation module in a third relative value, based on the phase difference in the second relative value and the excitation amount of a fixed value applied simultaneously to a unique reference channel of the same type and a unique reference channel of the device, calculates the phase difference in the third relative value of all channels of the same type, wherein the reference of the phase difference in the third relative value is the unique reference channel of the device;

[0082] A relative time difference calculation module, which calculates the relative time difference based on the phase difference in the third relative value and the frequency parameter of the excitation amount of the applied fixed value;

[0083] A correction parameter acquisition module, storing the third relative value of each channel and the relative time difference of each channel as correction parameters;

[0084] A sampling value acquisition module performs consistency correction calculation on the original sampling value of each channel based on the correction parameter to obtain a sampling value after consistency correction;

[0085] The phasor value acquisition module performs consistency correction calculation on the original phasor value of each channel based on the correction parameter to obtain the phasor value after consistency correction.

[0086] To achieve the above-mentioned purpose, the present invention also provides an electronic device, including a processor, a memory, and a computer program stored in the memory and executable on the processor, wherein when the computer program is executed by the processor, the multi-channel sampling value consistency correction method of the power system device as described above is implemented.

[0087] To achieve the above-mentioned purpose, the present invention also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the multi-channel sampling value consistency correction method of the power system device as described above is implemented.

[0088] According to the solution of the present invention, the present invention effectively solves the problem of inconsistent multi-channel sampling values ​​of power system devices, such as reducing the unbalanced current of differential protection, ensuring the safe and reliable operation of the power system, and the method is economical and practical;

[0089] The present invention is based on the digital processing capability that the digital device already has, does not increase the hardware cost of the device and the cost of auxiliary equipment, and can achieve the optimal consistency of multi-channel sampling values ​​of the power system device, including the optimal consistency between multiple channels and between multiple channels and standard input sources, by only increasing the software function and coordinating with conventional tests;

[0090] The present invention has the advantages of the same environment, the same signal source input, the same time, the same algorithm, and online calculation, and ensures optimal consistency in terms of method. BRIEF DESCRIPTION OF THE DRAWINGS

[0091] Figure 1 A flowchart schematically showing a method for calibrating consistency of multi-channel sampling values ​​of an electric power system device according to an embodiment of the present invention;

[0092] Figure 2 A flowchart of the calculation of correction parameters for consistency correction of the device in Example 1 of the present invention;

[0093] Figure 3 This is a flow chart of performing operations to calculate relative values ​​for all test groups respectively according to Embodiment 1 of the present invention;

[0094] Figure 4 A flowchart of unifying the relative values ​​of all channels of the same type in Example 1 of the present invention;

[0095] Figure 5 This is a flowchart of calculation of correction parameters for the modulus of a unique reference channel of the same type as in Example 1 of the present invention;

[0096] Figure 6 This is a flowchart of the calculation of the correction parameters of the same type of unified and unique reference channel in Example 1 of the present invention;

[0097] Figure 7 This is a flow chart of calculating the relative time difference in embodiment 1 of the present invention;

[0098] Figure 8 This is a flow chart of calling correction parameters in Example 1 of the present invention;

[0099] Fig. 9 This is a flow chart of performing consistency correction on the original sampling values ​​according to Embodiment 1 of the present invention;

[0100] Fig.10 Schematic diagram of the sampling value consistency correction calculation of two-point linear interpolation in Example 1 of the present invention. DETAILED DESCRIPTION

[0101] The present invention will now be discussed with reference to exemplary embodiments. It should be understood that the embodiments discussed are only to enable those skilled in the art to better understand and thus implement the present invention, rather than implying any limitation on the scope of the present invention.

[0102] As used herein, the term “including” and variations thereof are to be interpreted as open-ended terms meaning “including, but not limited to.” The term “based on” is to be interpreted as “based, at least in part, on.” The terms “one embodiment” and “an embodiment” are to be interpreted as “at least one embodiment.”

[0103] Figure 1 The flowchart schematically shows a method for calibrating the consistency of multi-channel sampling values ​​of a power system device according to an embodiment of the present invention. Figure 1 As shown, in this embodiment, a multi-channel sampling value consistency correction method of a power system device includes:

[0104] Conduct test grouping for the same type of channels in the device, and designate one channel in each test group as the test group reference channel;

[0105] Designate one channel among the channels of the same type in the device as the only reference channel of the same type;

[0106] Designate a channel in the device as the only reference channel of the device;

[0107] Apply a fixed value of excitation to each test group, and calculate the first relative value of all channels in the test group, wherein the reference of the first relative value is the reference channel of the test group;

[0108] Based on the first relative value and the phasor values ​​of all channels in the test group at the same moment that have been saved in the process of calculating the first relative value, the second relative value of all channels of the same type is calculated, wherein the reference of the second relative value is the only reference channel of the same type;

[0109] Based on the relative value of the modulus value in the second relative value and the excitation amount of the fixed value applied to each unique reference channel of the same type, the relative value of the modulus value in the third relative value of all channels of the same type is calculated, wherein the reference of the relative value of the modulus value in the third relative value is the excitation amount of the fixed value applied;

[0110] Based on the phase difference in the second relative value and the excitation amount of a fixed value applied to the unique reference channel of the same type and the unique reference channel of the device at the same time, the phase difference in the third relative value of all channels of the same type is calculated, wherein the reference of the phase difference in the third relative value is the unique reference channel of the device;

[0111] Calculating a relative time difference based on the phase difference in the third relative value and the frequency parameter of the excitation amount of the applied fixed value;

[0112] storing the third relative value of each channel and the relative time difference of each channel as correction parameters;

[0113] Based on the correction parameters, a consistency correction calculation is performed on the original sampling value of each channel to obtain a sampling value after consistency correction;

[0114] Based on the correction parameters, a consistency correction calculation is performed on the original phasor value of each channel to obtain a phasor value after consistency correction.

[0115] It should be noted that the types include: current analog channel type, voltage analog channel type, protection current analog channel type, measurement current analog channel type, protection voltage analog channel type, measurement voltage analog channel type, etc.

[0116] It should be noted that the relative value and correction parameter correspond to the frequency parameter and the fixed value parameter. The corresponding relationship is not explicitly indicated by default. It is obvious to expand according to the content of the present invention only when multiple frequencies and / or fixed values ​​are required.

[0117] Further, preferably, the fixed value is a rated value.

[0118] According to one embodiment of the present invention, testing groups of channels of the same type in a device includes:

[0119] The number of experimental groups is greater than or equal to 1;

[0120] Any two test groups of the same type of channel can be connected through a common channel or transitions between other test groups and common channels;

[0121] The number of channels in each test group is greater than or equal to 2 and less than or equal to the maximum number of channels in the same type of test group.

[0122] Further, as a preference, the reference channel of all test groups of the same type is the only reference channel of the same type;

[0123] Further, preferably, the number of common channels between two test groups is less than or equal to 1;

[0124] Further, as a preference, the number of channels in the test group is grouped according to the maximum number of channels in the test group of the same type;

[0125] It should be noted that the common channels are channels included in both test groups; the maximum number of channels in the same type of test group is the maximum number of channels that can be simultaneously applied with a fixed value of excitation by the single-port output of the test instrument used. In this case, the requirements for the output accuracy of the test instrument can be reduced, which is determined by the load capacity of the test instrument used;

[0126] Furthermore, according to an embodiment of the present invention, the maximum number of channels of the same type of test group is determined by consulting the test instrument manufacturer.

[0127] Taking a device with 14 current analog channels as an example, it is determined that the maximum number of channels of the same type of test grouping of current analog channels is 5, as shown in Table 1. The preferred test grouping results are: the number of test groups of current analog channels is 4, the number of channels of the test groups of current analog channels are 5, 5, 5, and 2 respectively, and the same type of unique reference channel, test group reference channel, and common channel are all current analog channel 1;

[0128]

[0129] Table 1

[0130] Note: In Table 1, ▲ is the only reference channel of the same type, △ is the reference channel of the test group, ◎ is the common channel, and ● is the channel included in the test group.

[0131] Further, preferably, the unique reference channel of the device is one of the unique reference channels of the same type.

[0132] Further, according to an embodiment of the present invention, applying a fixed value of incentive amount to each test group includes:

[0133] If the channels in the test group are current analog channel types, the small CTs of all current analog channels in the test group are connected end to end and connected in series to ensure that they are all input with the same polarity. The current output of the test instrument is connected to the beginning and end of the small CT in series to apply a fixed value of excitation.

[0134] Further, according to an embodiment of the present invention, applying a fixed value of incentive amount to each test group further includes:

[0135] If the channels in the test group are voltage analog channel type, the small VTs of all voltage analog channels in the test group are connected in parallel to ensure that they are all input with the same polarity. The voltage output of the test instrument is connected to the first and last ends of the small VT after parallel connection to apply a fixed value of excitation.

[0136] Further, according to an embodiment of the present invention, a fixed value of excitation is applied to each test group, and the first relative values ​​of all channels in the test group are calculated, including:

[0137] After applying the correct stimulus amount to the corresponding test group, select to enter the correction parameter calculation process of the corresponding test group consistency correction;

[0138] Use the original sampling values ​​to calculate and save the phasor values ​​of all channels in the corresponding test group at the same time;

[0139] Determine whether the modulus values ​​of the phasor values ​​of all channels in the corresponding test group are within the range of the applied fixed value of the excitation;

[0140] If so, taking the corresponding test group reference channel as the reference, the first relative value of all channels in the corresponding test group relative to the reference is calculated using the phasor value;

[0141] Determine whether the first relative values ​​of all channels in the corresponding test group are within a reasonable range;

[0142] If so, the first relative value is available.

[0143] Further, according to an embodiment of the present invention, the range of the fixed value of the stimulus amount applied to each test group is:

[0144] [(1-W F )*I e1 *K1,(1+W F )*I e1 *K2];

[0145] Among them, W F I is the channel ratio difference limit percentage of the device,e1 is the effective value of the fixed value of the stimulus applied to the test group, K1 is the reliability coefficient of the lower limit of the modulus value range; K2 is the reliability coefficient of the upper limit of the modulus value range.

[0146] Further, according to an embodiment of the present invention, the value range of the lower limit reliability coefficient K1 of the modulus value range is: 0.8≤K1≤0.98.

[0147] Further, according to an embodiment of the present invention, the value range of the upper limit reliability coefficient K2 of the modulus value range is: 1.02≤K2≤1.2.

[0148] Further, according to an embodiment of the present invention, the reasonable range includes:

[0149] Reasonable range of specific modulus relative value:

[0150] Among them, W F is the channel ratio difference limit percentage of the device, K3 is the lower limit reliability coefficient of the module value relative value; K4 is the upper limit reliability coefficient of the module value relative value.

[0151] Further, according to an embodiment of the present invention, the value range of the lower limit reliability coefficient K3 of the relative value of the module value is: 0.9≤K3≤0.98.

[0152] Further, according to an embodiment of the present invention, the value range of the upper limit reliability coefficient K4 of the relative value of the module value is: 1.02≤K4≤1.1.

[0153] Further, according to an embodiment of the present invention, the reasonable range also includes:

[0154] Reasonable range of specific phase difference: ≤2*W Δθ *K5;

[0155] Among them, K5 is the phase difference range reliability coefficient; W Δθ It is the channel phase difference limit of the device.

[0156] Further, according to an embodiment of the present invention, the value range of the phase difference range reliability coefficient K5 is: 1.01≤K5≤1.1.

[0157] Further, according to an embodiment of the present invention, when the second relative value is calculated, the following operations are performed on the test groups respectively:

[0158] Based on the phasor values ​​of all channels in the test group at the same moment that have been saved in the first relative value calculation process, the relative value between the test group reference channel and the unique reference channel of the same type is calculated; if the test group reference channel and the unique reference channel of the same type are not in the same test group, the relative value between the test group reference channel and the unique reference channel of the same type needs to be obtained by superposition calculation through the connection of the common channels between the test groups;

[0159] The second relative values ​​of all channels in the test group are calculated using the relative value between the test group reference channel and the only reference channel of the same type and the first relative value.

[0160] Further, according to an embodiment of the present invention, the superposition calculation includes:

[0161] Step 1: Use the saved phasor values ​​of all channels in the test group at the same time to calculate the relative value between the test group reference channel and another test group common channel with it;

[0162] Step 2: Determine whether another test group contains a unique reference channel of the same type;

[0163] Step 3: If yes, use the saved phasor values ​​of all channels in another test group at the same time to calculate the relative value between the common channel of another test group and the unique reference channel of the same type in another test group; superimpose all the calculated relative values ​​connected by the common channel to obtain the relative value between the reference channel of the test group and the unique reference channel of the same type, and the superposition calculation is completed;

[0164] Step 4: If not, use the phasor values ​​of all channels in another test group at the same time that have been saved to calculate the relative value between the common channel of another test group and the common channel of the third test group that has a common channel with it;

[0165] Step 5: Repeat steps 2 to 4 and perform iterative calculations to obtain the corresponding relative values.

[0166] Further, according to an embodiment of the present invention, calculating the relative time difference includes:

[0167] Find the channel in which the phase difference in the third relative value is the minimum among all channels;

[0168] Taking the channel with the minimum value as the reference, calculate the phase difference of all channels relative to the reference;

[0169] The phase difference based on the channel with the minimum value is converted into a relative time difference using the frequency parameter of the applied fixed value excitation amount.

[0170] Further, according to an embodiment of the present invention, when the relative value of the modulus value in the third relative value is calculated, the following operations are performed on the unique reference channels of the same type respectively:

[0171] After applying the correct excitation amount to the corresponding unique reference channel of the same type, select to enter the correction parameter calculation process of the corresponding unique reference channel modulus of the same type;

[0172] The effective value of the corresponding unique reference channel of the same type is calculated, and the relative value of the modulus between the corresponding unique reference channel of the same type and the applied fixed value of the excitation is calculated by using the effective value;

[0173] Determine whether the relative value of the modulus is within a reasonable range;

[0174] If so, the relative value of the modulus between the corresponding unique reference channel of the same type and the applied fixed value of the excitation amount and the relative value of the modulus in the second relative value are used to calculate the relative value of the modulus in the third relative value of all channels of the same type.

[0175] Further, according to an embodiment of the present invention, when the phase difference in the third relative value is calculated, the following operations are performed on the same type of unique reference channels respectively:

[0176] After the correct excitation amount is applied to the corresponding unique reference channel of the same type and the unique reference channel of the device, the correction parameter calculation process of the corresponding unified unique reference channel of the same type is selected;

[0177] Calculate and obtain the corresponding phasor values ​​of the same type of unique reference channel and the device's unique reference channel at the same time;

[0178] The phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device is calculated by using the phasor value, and the phase difference between the corresponding unique reference channel of the same type and the fixed value of the excitation quantity applied by the unique reference channel of the device is subtracted from the phase difference;

[0179] Determine whether the phase difference is within a reasonable range;

[0180] If so, the phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device and the phase difference in the second relative value are used to calculate the phase difference in the third relative value of all channels of the same type.

[0181] Further, according to an embodiment of the present invention, obtaining the sampling value after consistency correction includes:

[0182] Using the relative value of the modulus value of each channel in the correction parameter, the original sampling value of each channel is corrected and calculated to obtain the sampling value of each channel after the relative value of the modulus value is corrected;

[0183] The relative time difference of each channel in the correction parameter is used to perform interpolation calculation of the relative time difference on the sampling value of each channel after the relative value correction of the modulus value, so as to obtain the sampling value after consistency correction.

[0184] Further, according to an embodiment of the present invention, obtaining the phasor value after consistency correction includes:

[0185] The modulus and phase angle of the original phasor value of each channel are corrected and calculated using the relative value of the modulus value and the phase difference of each channel in the correction parameters to obtain the phasor value after consistency correction.

[0186] Furthermore, in order to achieve the above-mentioned object, the present invention also provides a multi-channel sampling value consistency correction system for a power system device, comprising:

[0187] The test group reference channel designation module performs test grouping on the channels of the same type in the device and designates one channel in each test group as the test group reference channel;

[0188] A module for designating a unique reference channel of the same type, which designates one channel among the channels of the same type in the device as the unique reference channel of the same type;

[0189] A device unique reference channel designation module, which designates a channel in the device as the device unique reference channel;

[0190] A first relative value calculation module applies a fixed value of excitation to each test group, and calculates the first relative value of all channels in the test group, wherein the reference of the first relative value is the reference channel of the test group;

[0191] A second relative value calculation module, based on the first relative value and the phasor values ​​of all channels in the test group at the same time that have been saved in the process of calculating the first relative value, calculates the second relative value of all channels in the same type, wherein the reference of the second relative value is the only reference channel of the same type;

[0192] A module for calculating a relative value of a modulus in a third relative value, which calculates relative values ​​of modulus in the third relative values ​​of all channels of the same type based on the relative value of the modulus in the second relative value and the excitation amount of a fixed value applied to each unique reference channel of the same type, wherein the reference of the relative value of the modulus in the third relative value is the excitation amount of the fixed value applied;

[0193] A phase difference calculation module in a third relative value, based on the phase difference in the second relative value and the excitation amount of a fixed value applied simultaneously to a unique reference channel of the same type and a unique reference channel of the device, calculates the phase difference in the third relative value of all channels of the same type, wherein the reference of the phase difference in the third relative value is the unique reference channel of the device;

[0194] A relative time difference calculation module, which calculates the relative time difference based on the phase difference in the third relative value and the frequency parameter of the excitation amount of the applied fixed value;

[0195] A correction parameter acquisition module, storing the third relative value of each channel and the relative time difference of each channel as correction parameters;

[0196] A sampling value acquisition module performs consistency correction calculation on the original sampling value of each channel based on the correction parameter to obtain a sampling value after consistency correction;

[0197] The phasor value acquisition module performs consistency correction calculation on the original phasor value of each channel based on the correction parameter to obtain the phasor value after consistency correction.

[0198] The multi-channel sampling value consistency correction system of the above-mentioned power system device according to the present invention can implement the multi-channel sampling value consistency correction method of the above-mentioned power system device. The specific method steps are as described above and will not be repeated here.

[0199] Furthermore, to achieve the above-mentioned purpose, the present invention also provides an electronic device, including a processor, a memory, and a computer program stored in the memory and executable on the processor, wherein when the computer program is executed by the processor, the multi-channel sampling value consistency correction method of the power system device as described above is implemented.

[0200] Furthermore, to achieve the above-mentioned purpose, the present invention also provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the multi-channel sampling value consistency correction method of the power system device as described above is implemented.

[0201] According to the above scheme of the present invention, the present invention effectively solves the problem of inconsistent multi-channel sampling values ​​of power system devices, such as reducing the unbalanced current of differential protection, ensuring the safe and reliable operation of the power system, and the method is economical and practical;

[0202] The present invention is based on the digital processing capability that the digital device already has, does not increase the hardware cost of the device and the cost of auxiliary equipment, and can achieve the optimal consistency of the multi-channel sampling values ​​of the device, including the optimal consistency between multiple channels and between multiple channels and standard input sources, by only adding software functions and coordinating with conventional tests.

[0203] The present invention has the advantages of the same environment, the same signal source input, the same time, the same algorithm, and online calculation, and ensures optimal consistency from a methodological perspective.

[0204] Based on the above solution of the present invention, the solution of the present invention is described in detail in the following in combination with the accompanying drawings in the form of a specific embodiment.

[0205] Example 1

[0206] The consistency correction method of multi-channel sampling values ​​of power system devices is shown in the flowchart Figure 2 As shown, including:

[0207] Step 101, determine whether the test state process of calibration parameter calculation is completed, if so, proceed to the next step 102, if not, jump to step 107 to start the test state process of calibration parameter calculation;

[0208] Step 102, select the calibration parameter calculation function for consistency calibration as needed, if selected, proceed to the next step 103, if not selected, jump to step 126 to call the calibration parameters;

[0209] The selection is based on the need. If the hardware related to the device and sampling is not changed or the calculated and saved correction parameter data is not lost, and the analog channel of the device is qualified in the conventional test, theoretically, the device only needs to be selected once during the factory test in its entire life cycle. This method provides a selection function, which requires human judgment. The present invention does not limit the specific implementation method, but as a preference, the selection function is implemented by human-computer dialogue.

[0210] Step 103, set all calculation flags corresponding to this calculation to unsuccessful;

[0211] Step 104, test grouping the channels of the same type in the device, and designating one channel in each test group as a test group reference channel;

[0212] Step 105, designating one channel among the channels of the same type in the device as the only reference channel of the same type;

[0213] Step 106, designating a channel in the device as the only reference channel of the device;

[0214] The test groups, common channels, designated reference channels, etc. of the device of Example 1 are shown in Table 2 and Table 3:

[0215]

[0216] Table 2

[0217] Note: In Table 2, ▲ is the only reference channel of the same type of current analog channel, △ is the reference channel of the test group, ◎ is the common channel, and ● is the channel included in the test group;

[0218]

[0219] Table 3

[0220] Note: In Table 3, ▲ is the only reference channel of the same type as the voltage analog channel, △ is the reference channel of the test group, ● is the channel included in the test group, and ⊙ is the only reference channel of the device.

[0221] Step 107, start the test state process of calibration parameter calculation;

[0222] Step 108, select to force the end of the test state process of the calibration parameter calculation. If selected, jump to step 125 to end the test state process of the calibration parameter calculation. If not selected, go to the next step 109;

[0223] Step 109, applying a fixed value of excitation to each test group, and calculating the first relative value of all channels in the test group, wherein the reference of the first relative value is the reference channel of the test group. The present invention does not limit the specific implementation method, but as a preferred embodiment, the flow chart is as follows: Figure 3 As shown, including:

[0224] Step 201, determine whether the calibration parameter calculation flag of the currently executed test group consistency calibration is successful, if so, jump to step 212 to determine whether all calibration parameter calculation processes of the test group consistency calibration are fully executed, if not, go to the next step 202;

[0225] Step 202, determining whether the correction parameter calculation process of the currently executed test group consistency correction is completed, if so, proceeding to the next step 203, if not, jumping to step 204 to start the corresponding correction parameter calculation process of the test group consistency correction;

[0226] Step 203, in combination with the operation of the test instrument, after applying the correct stimulus amount to the corresponding test group, select to enter the correction parameter calculation process of the corresponding test group consistency correction. If selected, enter the next step 204. If not selected, jump to step 212 to determine whether all the correction parameter calculation processes of the test group consistency correction are fully executed;

[0227] It should be noted that the corresponding test group corresponds to the test group to which the fixed value of the stimulus is applied, and corresponds to the currently executed test group; the currently executed test group is the test group to which the current cycle executes the same process in all test groups;

[0228] Step 204, starting the correction parameter calculation process for the corresponding test group consistency correction;

[0229] Step 205, using the original sampling values ​​to calculate and save the phasor values ​​of all channels in the corresponding test group at the same time;

[0230] Taking the devices in Table 2 and Table 3 as an example, the calculated phasor values ​​include: I[j][z][c] ∠θ [j][z][c] ;

[0231] Wherein, j is the channel number, the current channel number range is [1,14], and the voltage channel number range is [1,6]; z is the test group number, the current analog channel type test group number range is [1,4], and the voltage analog channel type test group number range is [1]; c is the channel type number, number 1 represents the current analog channel type, and number 2 represents the voltage analog channel type; I [j][z][c] is the magnitude of the phasor value, θ [j][z][c] is the phase angle of the phasor value;

[0232] It should be noted that the calculation of the phasor value corresponds to the frequency of the applied fixed value excitation quantity. The present invention does not limit the specific implementation method, but as a preference, a high-precision algorithm is used, and the algorithms for calculating all phasor values ​​must be unified;

[0233] Step 206, judging whether the modulus values ​​of the phasor values ​​of all channels in the corresponding test group are within the range of the applied fixed value of the excitation value, if so, proceeding to the next step 207, if not, jumping to step 210 to prompt and save the correction parameter calculation flag of the corresponding test group consistency correction as unsuccessful;

[0234] The range of the excitation amount for applying a fixed value to each test group is:

[0235] [(1-W F )*I e1 *K1,(1+W F )*I e1 *K2];

[0236] Among them, W F I is the channel ratio difference limit percentage of the device, e1 is the effective value of the fixed value of the stimulus applied to the test group, K1 is the reliability coefficient of the lower limit of the modulus range, and K2 is the reliability coefficient of the upper limit of the modulus range;

[0237] The value range of the lower limit reliability coefficient K1 of the modulus value range is: 0.8≤K1≤0.98. Further, as a preferred method, the selection principle is to take a lower value as much as possible;

[0238] The value range of the upper limit reliability coefficient K2 of the modulus value range is: 1.02≤K2≤1.2. Further, as a preferred embodiment, the selection principle is to take a high value as much as possible.

[0239] Step 207, taking the corresponding test group reference channel as the reference, the first relative value of all channels in the corresponding test group relative to the reference is calculated using the phasor value; taking the device in Table 2 and Table 3 as an example, the specific calculation of the device channel type 1 test group 1 includes: Δθ[j][1][1] =θ [j][1][1] -θ [2][1][1] , j∈[1,5];

[0240] Among them, Δθ [j][1][1] is the phase difference in the first relative value of all channels in channel type 1 test group 1 relative to the reference, K [j][1][1] is the modulus relative value in the first relative value of all channels in channel type 1 test group 1 relative to the reference, and the reference channel of channel type 1 test group 1 is current channel number 2;

[0241] Step 208, judging whether the first relative values ​​of all channels in the corresponding test group are within a reasonable range, if so, proceeding to the next step 209, if not, jumping to step 210 to prompt and save the correction parameter calculation flag of the corresponding test group consistency correction as unsuccessful;

[0242] The reasonable range includes:

[0243] The reasonable range of specific modulus relative values ​​is:

[0244] Among them, W F is the channel ratio difference limit percentage of the device, K3 is the lower limit reliability coefficient of the module value relative value, and K4 is the upper limit reliability coefficient of the module value relative value;

[0245] The value range of the lower limit reliability coefficient K3 of the relative value of the modulus value is: 0.9≤K3≤0.98. Further, as a preferred method, the selection principle is to take a high value as much as possible;

[0246] The value range of the upper limit reliability coefficient K4 of the relative value of the modulus value is: 1.02≤K4≤1.1. Further, as a preferred embodiment, the selection principle is to take a lower value as much as possible.

[0247] The reasonable range also includes:

[0248] The reasonable range of specific phase difference is: ≤2*W Δθ *K5;

[0249] Among them, K5 is the phase difference range reliability coefficient, W Δθ is the channel phase difference limit of the device;

[0250] The value range of the phase difference range reliability coefficient K5 is: 1.01≤K5≤1.1. Furthermore, as a preferred embodiment, the selection principle is to take a lower value as much as possible.

[0251] Step 209, prompting and saving the correction parameter calculation flag of the corresponding test group consistency correction as successful, jumping to step 211 to end the correction parameter calculation process of the corresponding test group consistency correction;

[0252] Step 210, prompting and saving the correction parameter calculation flag of the corresponding test group consistency correction as unsuccessful;

[0253] Step 211, ending the correction parameter calculation process of the corresponding test group consistency correction;

[0254] Step 212, determine whether the correction parameter calculation process of all test group consistency corrections has been fully executed. If so, proceed to the next step 110 to determine whether the correction parameter calculation flags of all test group consistency corrections of the same type currently being executed are all successful. If not, jump to step 201 to determine whether the correction parameter calculation flag of the test group consistency correction currently being executed is successful, and continue the correction parameter calculation process of other test group consistency corrections.

[0255] Step 110, determine whether the calibration parameter calculation flags of all the test group consistency calibrations of the same type currently being executed are all successful, if so, proceed to the next step 111, if not, jump to step 112 to determine whether all the above two steps of the same type are all executed;

[0256] Step 111, based on the first relative value and the phasor values ​​of all channels in the test group at the same time that have been saved in the process of calculating the first relative value, calculate the second relative value of all channels in the same type, wherein the reference of the second relative value is the only reference channel of the same type; the present invention does not limit the specific implementation method, but as a preferred embodiment, the flow chart is as follows Figure 4 As shown, including:

[0257] Step 301, determine whether the currently executed test group contains a unique reference channel of the same type, if so, proceed to the next step 302, if not, jump to step 305 to find other test groups of the same type that have a common channel with the currently executed test group;

[0258] Step 302, using the saved phasor values ​​of all channels in the currently executed test group at the same time, calculate the relative value between the reference channel of the currently executed test group and the only reference channel of the same type; taking the devices in Tables 2 and 3 as an example, the currently executed test group is channel type 1 test group 2, and the specific calculation includes: Δα [2][1] =θ [8][2][1] -θ [7][2][1] , j∈[5,9];

[0259] Among them, Δα [2][1] is the phase difference in relative value between the reference channel of test group 2 of channel type 1 and the only reference channel of the same type, M [2][1]It is the relative value of the modulus value in the relative value between the reference channel of test group 2 of channel type 1 and the only reference channel of the same type. The reference channel of test group 2 of channel type 1 is current channel number 8, and the only reference channel of the same type of channel type 1 is current channel number 7;

[0260] Step 303, using the relative value between the reference channel of the currently executed test group and the only reference channel of the same type and the first relative value to calculate the second relative value of all channels in the currently executed test group; taking the devices in Tables 2 and 3 as an example, the currently executed test group is channel type 1 test group 2, and the specific calculation includes: Δσ [j][1] =Δθ [j][2][1] +Δα [2][1] , H [j][1] =K [j][2][1] *M [2][1] , j∈[5,9];

[0261] Among them, Δσ [j][1] is the phase difference in the second relative value of channel type 1 channel number j, H [j][1] is the modulus relative value in the second relative value of channel type 1 channel number j;

[0262] Step 304, prompting and saving the flag of the currently executed test group unified benchmark calculation as successful, jumping to step 314 to end the currently executed test group unified benchmark calculation process;

[0263] Step 305, find the remaining test groups of the same type that have a common channel with the currently executed test group. If found, go to the next step 306. If not found, jump to step 316 to prompt a unified benchmark abnormality. Taking the devices in Tables 2 and 3 as an example, the currently executed test group is the channel type 1 test group 3 of the device, then the test groups found are: channel type 1 test group 2 whose common channel is current channel number 9, and channel type 1 test group 4 whose common channel is current channel number 13;

[0264] Step 306, using the saved phasor values ​​of all channels in the currently executed test group at the same time, calculate the relative value between the reference channel of the currently executed test group and the common channel of the found test group; taking the device in Table 2 and Table 3 as an example, the currently executed test group is the channel type 1 test group 3 of the device, if the found channel type 1 test group 2 is used, the specific calculation includes: k = 1, Δg [k] =θ

[12] [3][1] -θ [9][3][1] ,

[0265] Where, Δg [k] , G [k]They are the phase difference and modulus relative value in the relative value between the reference channel of channel type 1 test group 3 and the common channel current channel number 9, which are calculated using the phasor values ​​of all channels in channel type 1 test group 3 that have been saved at the same time; the common channel of channel type 1 test group 3 and channel type 1 test group 2 is current channel number 9; the reference channel of channel type 1 test group 3 is current channel number 12;

[0266] Step 307, determine whether the found test group contains a unique reference channel of the same type, if so, go to the next step 308, if not, jump to step 312 to continue to find other test groups of the same type that have a common channel with the last found test group; taking the devices in Tables 2 and 3 as an example, the currently executed test group is the channel type 1 test group 3 of the device, if the found channel type 1 test group 2 is used for judgment, the judgment result is yes, if the found channel type 1 test group 4 is used for judgment, the judgment result is no;

[0267] Step 308, using the saved phasor values ​​of all channels in the found test group at the same time, calculate the relative value between the common channel of the found test group and the unique reference channel of the same type; taking the device in Table 2 and Table 3 as an example, the currently executed test group is the channel type 1 test group 3 of the device, and the found channel type 1 test group 2 is used for judgment, and the judgment result is yes, the specific calculation includes: k = k + 1, Δg [k] =θ [9][2][1] -θ [7][2][1] ,

[0268] Where, Δg [k] , G [k] They are the phase difference and modulus relative value in the relative value between the common channel current channel number 9 and the only reference channel of the same type of channel type 1, which are calculated using the phasor values ​​of all channels in the test group 2 of channel type 1 that have been saved at the same time; the common channel of the test group 3 of channel type 1 and the test group 2 of channel type 1 is the current channel number 9; the only reference channel of the same type of channel type 1 is the current channel number 7;

[0269] Step 309, superimpose all the calculated relative values ​​connected by the common channel to obtain the relative value between the reference channel of the currently executed test group and the unique reference channel of the same type; taking the device of Table 2 and Table 3 as an example, the currently executed test group is the channel type 1 test group 3 of the device, and the channel type 1 test group 2 found is used for judgment, and the judgment result is yes, and the specific calculation includes:

[0270] Among them, Δα [3][1]is the phase difference in relative value between the reference channel of channel type 1 test group 3 and the only reference channel of the same type, M [3][1] The relative value of the modulus value in the relative value between the reference channel of test group 3 of channel type 1 and the only reference channel of the same type;

[0271] Step 310, using the relative value between the reference channel of the currently executed test group and the unique reference channel of the same type and the first relative value to calculate the second relative value of all channels in the test group; taking the devices in Tables 2 and 3 as an example, the currently executed test group is the channel type 1 test group 3 of the device, and the channel type 1 test group 2 found is used for judgment, and the judgment result is yes, the specific calculation includes: Δσ [j][1] =Δθ [j][3][1] +Δα [3][1] , H [j][1] =K [j][3][1] *M [3][1] , j∈[9,13];

[0272] Step 311, prompting and saving the flag of the currently executed test group unified benchmark calculation as successful, jumping to step 314 to end the currently executed test group unified benchmark calculation process;

[0273] Step 312, continue to find the remaining test groups of the same type that have a common channel with the test group found last time, if found, jump to step 307 to determine whether the found test group contains a unique reference channel of the same type, if not found, go to the next step 313; taking the device of Table 2 and Table 3 as an example, the test group currently being executed is the channel type 1 test group 3 of the device, if the channel type 1 test group 4 found in step 305 is used for judgment first, the result of continuing to find the remaining test groups of the same type that have a common channel with the test group 4 found last time is that it is not found, and go to the next step 313;

[0274] Step 313, determine whether the test grouping found in step 305 has executed all the above seven steps. If so, jump to step 316 to prompt that the unified reference is abnormal. If not, jump to step 306 and use the phasor values ​​of all channels in the currently executed test grouping that have been saved at the same time to calculate the relative value between the reference channel of the currently executed test grouping and the common channel of the found test grouping, and continue to use other test groups of the test grouping found in step 305; taking the devices in Tables 2 and 3 as an example, the currently executed test grouping is the channel type 1 test grouping 3 of the device. If the channel type 1 test grouping 4 found in step 305 is used for judgment first, the result of judging whether the test grouping found in step 305 has executed all the above seven steps is no, jump to step 306, and continue to use the channel type 1 test grouping 2 found in step 305;

[0275] Step 314, ending the currently executed test group unified benchmark calculation process;

[0276] Step 315, determine whether all the unified benchmark calculation flags of the same type of test groups are all successful. If so, jump to step 112 to determine whether all the above two steps of the same type are all executed. If not, jump to step 301 to determine whether the currently executed test group contains a unique benchmark channel of the same type, and continue to perform the unified benchmark calculation process of other test groups;

[0277] Step 316, prompting that the unified benchmark is abnormal, jumps to step 125 to end the test state process of calibration parameter calculation.

[0278] It should be noted that the currently executed test group is the test group that is currently executed in the cycle. All test groups of the same type execute the same process in a cycle.

[0279] Step 112, determine whether all the above two steps of the same type are fully executed, if so, proceed to the next step 113, if not, jump to step 110 to determine whether all the calibration parameter calculation flags of the currently executed test groups of the same type are all successful, and continue to execute the above two steps of other similar types;

[0280] The same type currently being executed, all the same types are looped to execute one round of step 110 and step 111, which is the same type currently being looped;

[0281] Step 113, based on the relative value of the modulus value in the second relative value and the excitation amount of the fixed value applied to each unique reference channel of the same type, the relative value of the modulus value in the third relative value of all channels of the same type is calculated, wherein the reference of the relative value of the modulus value in the third relative value is the excitation amount of the fixed value applied. The present invention does not limit the specific implementation method, but as a preferred embodiment, the flow chart is as follows: Figure 5 As shown, including:

[0282] Step 401, determine whether the calibration parameter calculation flag of the currently executed unique reference channel modulus of the same type is successful, if so, jump to step 412 to determine whether all calibration parameter calculation processes of the unique reference channel modulus of the same type are fully executed, if not, enter the next step 402;

[0283] Step 402, determining whether the calibration parameter calculation process of the same type of unique reference channel modulus value currently being executed is completed, if so, proceeding to the next step 403, if not, jumping to step 405 to start the calibration parameter calculation process of the corresponding same type of unique reference channel modulus value;

[0284] Step 403, determining whether all the unified benchmark calculation flags of the test groups of the same type currently being executed are all successful, if so, proceeding to the next step 404, if not, jumping to step 412 to determine whether all the calibration parameter calculation processes of the same type of unique benchmark channel modulus values ​​are all executed;

[0285] Step 404, in combination with the operation of the test instrument, after applying the correct excitation amount to the corresponding unique reference channel of the same type, select to enter the correction parameter calculation process of the corresponding unique reference channel modulus of the same type. If selected, enter the next step 405. If not selected, jump to step 412 to determine whether all the correction parameter calculation processes of the unique reference channel modulus of the same type have been fully executed;

[0286] Step 405, starting the correction parameter calculation process of the corresponding unique reference channel modulus of the same type;

[0287] Step 406, calculate the effective value of the corresponding unique reference channel of the same type, and use the effective value to calculate the relative value of the modulus between the corresponding unique reference channel of the same type and the applied fixed value of the excitation amount; taking the devices of Table 2 and Table 3 as an example, the currently executed unique reference channel of the same type is type 1, and the specific calculation includes:

[0288] Among them, B [1] The relative value of the modulus between the only reference channel of the same type as channel type 1 and the fixed value stimulus applied in the test, N [1] is the calculated effective value of the only reference channel of the same type as channel type 1, I e[1] It is the effective value of the fixed excitation amount applied to the only reference channel of the same type as channel type 1;

[0289] Step 407, judging whether the relative value of the modulus value is within a reasonable range, if so, proceeding to the next step 408, if not, jumping to step 410 to prompt and save the corresponding calibration parameter calculation flag of the same type unique reference channel modulus value as unsuccessful;

[0290] Step 408, using the relative value of the modulus between the corresponding unique reference channel of the same type and the applied fixed value of the excitation, and the relative value of the modulus in the second relative value, calculate the relative value of the modulus in the third relative value of all channels of the same type; taking the devices of Table 2 and Table 3 as an example, the currently executed unique reference channel of the same type is type 1, and the specific calculation includes: H [j][1] =H [j][1] *B [1] , j∈[1,14];

[0291] Among them, H [j][1] becomes the modulus relative value in the third relative value of channel type 1 channel number j;

[0292] Step 409, prompting and saving the correction parameter calculation flag of the corresponding unique reference channel modulus of the same type as success, jumping to step 411 to end the correction parameter calculation process of the corresponding unique reference channel modulus of the same type;

[0293] Step 410, prompting and saving the calibration parameter calculation flag of the corresponding unique reference channel modulus of the same type as unsuccessful;

[0294] Step 411, ending the correction parameter calculation process of the corresponding unique reference channel modulus of the same type;

[0295] Step 412, determine whether the correction parameter calculation process of all the same type of unique reference channel module values ​​is fully executed. If so, go to the next step 114 to calculate the phase difference in the third relative value of all channels of the same type based on the phase difference in the second relative value and the fixed value of excitation applied to the same type of unique reference channel and the device unique reference channel. If not, jump to step 401 to determine whether the correction parameter calculation flag of the currently executed unique reference channel module value of the same type is successful, and continue the correction parameter calculation process of other same type unique reference channel module values.

[0296] The corresponding same type corresponds to the same type of the fixed value of the stimulus applied in the test, and corresponds to the same type currently being executed; the same type currently being executed, all the same types loop through the same process, and is the same type currently being executed.

[0297] Step 114, based on the phase difference in the second relative value and the excitation amount of a fixed value applied to the unique reference channel of the same type and the unique reference channel of the device at the same time, the phase difference in the third relative value of all channels of the same type is calculated, wherein the reference of the phase difference in the third relative value is the unique reference channel of the device. The present invention does not limit the specific implementation method, but as a preferred embodiment, the flow chart is as follows: Figure 6 As shown, including:

[0298] Step 501, determine whether the calibration parameter calculation flag of the currently executed unified and unique reference channel of the same type is successful, if so, jump to step 513 to determine whether all calibration parameter calculation processes of the unified and unique reference channels of the same type are fully executed, if not, enter the next step 502;

[0299] Step 502, determining whether the calibration parameter calculation process of the same type of unified and unique reference channel currently being executed is completed, if so, proceeding to the next step 503, if not, jumping to step 505 to start the calibration parameter calculation process of the corresponding same type of unified and unique reference channel;

[0300] Step 503, determine whether all the unified reference calculation flags of the test groups of the same type currently being executed are all successful, if so, go to the next step 504, if not, jump to step 513 to determine whether all the calibration parameter calculation processes of the same type of unified unique reference channels are all executed;

[0301] Step 504, in combination with the operation of the test instrument, after applying the correct excitation amount to the corresponding unique reference channel of the same type and the unique reference channel of the device, select to enter the correction parameter calculation process of the corresponding unified unique reference channel of the same type. If selected, enter the next step 505. If not selected, jump to step 513 to determine whether all the correction parameter calculation processes of the unified unique reference channels of the same type have been fully executed;

[0302] Step 505, starting the calibration parameter calculation process of the corresponding unified and unique reference channel of the same type;

[0303] Step 506, calculate and obtain the phasor value of the corresponding unique reference channel of the same type and the unique reference channel of the device at the same time; taking the devices in Table 2 and Table 3 as an example, the specific calculation results include: V [c] ∠v [c] , U∠u, c∈[1,2];

[0304] Among them, V [c] ∠v [c] is the phasor value of the only reference channel of the same type, and U∠u is the phasor value of the only reference channel of the device;

[0305] Step 507, the phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device is calculated by using the phasor value, and the phase difference is then subtracted from the phase difference between the excitation amount of the corresponding unique reference channel of the same type and the fixed value applied by the unique reference channel of the device; taking the devices in Table 2 and Table 3 as an example, the specific calculation includes: Δβ [c] =v [c] -us [c] , c∈[1,2];

[0306] Among them, Δβ [c] is the phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device, s [c] The phase difference between the fixed value of the excitation amount applied by the corresponding unique reference channel of the same type and the unique reference channel of the device;

[0307] Step 508, determine whether the phase difference is within a reasonable range, if yes, proceed to the next step 509, if no, jump to step 511 to prompt and save the corresponding unified calibration parameter calculation flag of the same type and unique reference channel as unsuccessful;

[0308] Step 509, using the phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device, and the phase difference in the second relative value, calculate the phase difference in the third relative value of all channels of the same type; taking the devices in Table 2 and Table 3 as an example, the specific calculation includes: Δσ [j][c] =Δσ [j][c] +Δβ [c] , j∈[1,14] or j∈[1,6], c∈[1,2];

[0309] Among them, Δσ [j][c] becomes the phase difference in the third relative value of channel type c channel number j;

[0310] Step 510, prompting and saving the calibration parameter calculation flag of the corresponding unified and unique reference channel of the same type as success, and jumping to step 512 to end the calibration parameter calculation process of the corresponding unified and unique reference channel of the same type;

[0311] Step 511, prompting and saving the calibration parameter calculation flag of the corresponding unified and unique reference channel of the same type as unsuccessful;

[0312] Step 512, ending the calibration parameter calculation process of the corresponding unified and unique reference channel of the same type;

[0313] Step 513, judging whether all the correction parameter calculation processes of the same type of unified and unique reference channels are fully executed, if so, proceeding to the next step 115 to calculate the relative time difference based on the phase difference in the third relative value and the frequency parameter of the excitation amount of the applied fixed value, if not, jumping to step 501 to judge whether the correction parameter calculation flag of the currently executed unified and unique reference channel of the same type is successful, and continuing the correction parameter calculation process of other unified and unique reference channels of the same type;

[0314] The corresponding same type corresponds to the same type of the excitation amount applied in the test, and corresponds to the same type currently being executed; the same type currently being executed, all the same types loop through the same process, and is the same type currently being executed.

[0315] Step 115, based on the phase difference in the third relative value and the frequency parameter of the applied fixed value excitation amount, the relative time difference is calculated; the present invention does not limit the specific implementation method, but as a preferred embodiment, the flow chart is as follows Figure 7 As shown, the calculation of the relative time difference includes:

[0316] Step 601, finding a channel in which the phase difference in the third relative value is the minimum among all channels;

[0317] Step 602, taking the channel with the minimum value as the reference, calculate the phase difference of all channels relative to the reference; taking the devices in Table 2 and Table 3 as an example, assuming that the channel with the minimum value is channel number 3 of channel type 1, the specific calculation includes: Δα [j][c] =Δσ [j][c] -σ [3][1] , j∈[1,14] or j∈[1,6], c∈[1,2];

[0318] Among them, Δα [j][c] The phase difference of each channel relative to the minimum channel, in radians;

[0319] Step 603, using the frequency parameter of the applied fixed value excitation amount, convert the phase difference relative to the channel with the minimum value as the reference into a relative time difference; taking the devices in Table 2 and Table 3 as an example, assuming that the channel with the minimum phase difference is channel number 3 of channel type 1, the specific calculation includes: j∈[1,14] or j∈[1,6], c∈[1,2];

[0320] Where, ΔT [j][c] is the relative time difference in milliseconds, f e is the frequency of the applied fixed value excitation.

[0321] Step 116, determining whether the process of storing the calibration parameters is finished, if so, proceeding to the next step 117, if not, jumping to step 119 to start the process of storing the calibration parameters;

[0322] Step 117, determine whether all calculation flags corresponding to the current calculation are all successful, if so, go to the next step 118, if not, jump to step 126 to call the calibration parameters;

[0323] Step 118, storing the third relative value of each channel and the relative time difference of each channel as correction parameters;

[0324] Step 119, start the process of storing the calibration parameters;

[0325] Step 120, determining whether the result of storing the calibration parameters is fed back, if so, proceeding to the next step 121, if not, jumping to step 126 to call the calibration parameters;

[0326] Step 121, judging whether the result of storing the calibration parameters is successful, if so, proceeding to the next step 122, if not, jumping to step 123 to prompt that the storage of the calibration parameters is unsuccessful, and issuing a device abnormality alarm signal;

[0327] Step 122, prompting that the calibration parameters are stored successfully and the device needs to be restarted, and then jumping to step 124 to end the calibration parameters storage process;

[0328] Step 123, prompting that the storage of the calibration parameters is unsuccessful, and issuing a device abnormality alarm signal;

[0329] Step 124, ending the process of storing the calibration parameters;

[0330] Step 125, ending the test state process of calibration parameter calculation;

[0331] Step 126, calling the calibration parameters; the present invention does not limit the specific implementation method, but as a preferred embodiment, the flow chart is as follows Figure 8 As shown, including:

[0332] Step 701, determine whether the calibration parameter calling process is finished, if yes, go to the next step 702, if no, jump to step 705 to start calling the calibration parameter process;

[0333] Step 702, determine whether the calibration parameter abnormality alarm flag of the device is on, if so, jump to other steps of the normal operation state process of step 129, if not, go to the next step 703;

[0334] The correction parameter abnormality alarm flag of the device is set to no when the device is turned on, and is set to no when the device performs an alarm reset operation.

[0335] Step 703, determine whether the call correction parameter flag is successful, if yes, jump to step 127, perform consistency correction calculation on the original sampling value of each channel based on the correction parameter, and obtain the sampling value after consistency correction, if no, go to the next step 704;

[0336] The call correction parameter flag is set to unsuccessful when the device is turned on.

[0337] Step 704, calling the calibration parameters that have been successfully saved;

[0338] Step 705, start calling the calibration parameter process;

[0339] Step 706, determine whether the called calibration parameter data is ready, if so, proceed to the next step 707, if not, jump to other steps of the normal operation state process of step 129;

[0340] Step 707, determine whether the calibration parameter data is correct, if so, proceed to the next step 708, if not, jump to step 709 to save the calibration parameter abnormality alarm flag of the device as yes, and issue a device abnormality alarm signal;

[0341] The data processing method for safely and reliably storing and judging whether the correction parameter data is correct is very common in the device. Similar data processing methods include the system parameters and constant value data of the device. The present invention does not limit the specific implementation method, but preferably, the data processing method according to the system parameters is used.

[0342] Step 708, save the calibration parameter call flag as successful, and jump to step 711 to end the calibration parameter call process;

[0343] Step 709, save the calibration parameter abnormality alarm flag of the device as yes, and send a device abnormality alarm signal;

[0344] Step 710, ending the process of calling the calibration parameters, and jumping to other steps of the normal operation state process of step 129;

[0345] Step 711, ending the process of calling the calibration parameters;

[0346] Step 127, based on the correction parameters, performing consistency correction calculation on the original sampling value of each channel to obtain a sampling value after consistency correction;

[0347] The present invention does not limit the specific implementation method, but as a preferred embodiment, the flow chart is as follows Fig. 9 As shown, the sampling values ​​after consistency correction include:

[0348] Step 801, using the relative value of the modulus of each channel in the correction parameter, the original sampled value of each channel is corrected and calculated to obtain the sampled value of each channel after the relative value of the modulus is corrected; taking the devices in Table 2 and Table 3 as an example, the specific calculation includes: j∈[1,14] or j∈[1,6], c∈[1,2];

[0349] Among them, u [j][c][t] is the original sampling value at time t, x [j][c][t] It is the sample value after relative modulus correction at time t.

[0350] Step 802, using the relative time difference of each channel in the correction parameter, interpolation calculation of the relative time difference is performed on the sampled value of each channel after the relative value correction of the modulus value, to obtain the sampled value after consistency correction; further, as a preferred method, a two-point linear interpolation method is adopted, taking the devices in Table 2 and Table 3 as an example, the specific calculation includes: j∈[1,14] or j∈[1,6], c∈[1,2], such as Fig.10 As shown, the dotted line is a waveform diagram of the sampling value after consistency correction, and the solid line is a waveform diagram of the sampling value after modulus relative value correction;

[0351] Among them, i [j][c][t]is the sampling value after consistency correction at time t, x [j][c][t] is the sample value after relative value correction of the modulus at time t, is the sampling value of the previous sampling time at time t after the relative value correction of the modulus value, t s The sampling interval is in milliseconds.

[0352] Step 128, based on the correction parameters, performing consistency correction calculation on the original phasor value of each channel to obtain a phasor value after consistency correction;

[0353] The present invention does not limit the specific implementation method, but preferably, the phasor value after consistency correction includes:

[0354] The relative value of the modulus value and the phase difference of each channel in the correction parameters are used to correct the modulus and the phase angle of the original phasor value of each channel, respectively, to obtain the phasor value after consistency correction; taking the devices in Table 2 and Table 3 as an example, the specific calculation includes: α [j][c][t] =γ [j][c][t] -Δσ [j][c] , j∈[1,14] or j∈[1,6], c∈[1,2];

[0355] Among them, U [j][c][t] is the modulus of the original phasor value at time t, γ [j][c][t] is the angle of the original phasor value at time t, X [j][c][t] is the modulus of the phasor value after consistency correction at time t, α [j][c][t] is the phase angle of the phasor value after consistency correction at time t.

[0356] Step 129, other steps of the routine operation state process, jump to step 101 to determine whether the test state process of calibration parameter calculation is completed, and continue to the next cycle.

[0357] Those skilled in the art will appreciate that the modules and algorithm steps described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0358] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described devices and equipment can refer to the corresponding processes in the aforementioned method implementation methods, and will not be repeated here.

[0359] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the modules is only a logical function division. There may be other division methods in actual implementation, such as multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or modules, which can be electrical, mechanical or other forms.

[0360] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical modules, that is, they may be located in one place or distributed on multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the embodiments of the present invention.

[0361] In addition, each functional module in the embodiment of the present invention may be integrated into one processing module, or each module may exist physically separately, or two or more modules may be integrated into one module.

[0362] If the functions are implemented in the form of software function modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the energy-saving signal sending / receiving method of each embodiment of the present invention. The aforementioned storage medium includes: various media that can store program codes, such as USB flash drives, mobile hard disks, ROM, RAM, magnetic disks, or optical disks.

[0363] The above description is only a preferred embodiment of the present application and an explanation of the technical principles used. Those skilled in the art should understand that the scope of the invention involved in the present application is not limited to the technical solution formed by a specific combination of the above technical features, but should also cover other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the inventive concept. For example, the above features are replaced with the technical features with similar functions disclosed in this application (but not limited to) by each other.

[0364] It should be understood that the size of the serial numbers of each step in the content of the invention and the implementation methods of the present invention does not absolutely mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the implementation methods of the present invention.

Claims

1. A method for calibrating consistency of multi-channel sampling values ​​of a power system device, characterized in that: include: Conduct test grouping for the same type of channels in the device, and designate one channel in each test group as the test group reference channel; Designate one channel among the channels of the same type in the device as the only reference channel of the same type; Designate a channel in the device as the only reference channel of the device; Apply a fixed value of excitation to each test group, and calculate the first relative value of all channels in the test group, wherein the reference of the first relative value is the reference channel of the test group; Based on the first relative value and the phasor values ​​of all channels in the test group at the same moment that have been saved in the process of calculating the first relative value, the second relative value of all channels of the same type is calculated, wherein the reference of the second relative value is the only reference channel of the same type; Based on the relative value of the modulus value in the second relative value and the excitation amount of the fixed value applied to each unique reference channel of the same type, the relative value of the modulus value in the third relative value of all channels of the same type is calculated, wherein the reference of the relative value of the modulus value in the third relative value is the excitation amount of the fixed value applied; Based on the phase difference in the second relative value and the excitation amount of a fixed value applied to the unique reference channel of the same type and the unique reference channel of the device at the same time, the phase difference in the third relative value of all channels of the same type is calculated, wherein the reference of the phase difference in the third relative value is the unique reference channel of the device; Calculating a relative time difference based on the phase difference in the third relative value and the frequency parameter of the excitation amount of the applied fixed value; storing the third relative value of each channel and the relative time difference of each channel as correction parameters; Based on the correction parameters, a consistency correction calculation is performed on the original sampling value of each channel to obtain a sampling value after consistency correction; Based on the correction parameters, a consistency correction calculation is performed on the original phasor value of each channel to obtain a phasor value after consistency correction.

2. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 1, characterized in that: The testing grouping of channels of the same type in the device comprises: The number of experimental groups is greater than or equal to 1; Any two test groups of the same type of channel can be connected through a common channel or transitions between other test groups and common channels; The number of channels in each test group is greater than or equal to 2 and less than or equal to the maximum number of channels in the same type of test group.

3. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 1, characterized in that: The fixed value of stimulus applied to each test group includes: If the channels in the test group are current analog channel types, the small CTs of all current analog channels in the test group are connected end to end and connected in series to ensure that they are all input with the same polarity. The current output of the test instrument is connected to the beginning and end of the small CT in series to apply a fixed value of excitation.

4. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 1, characterized in that: The fixed value of stimulus applied to each test group also includes: If the channels in the test group are voltage analog channel type, the small VTs of all voltage analog channels in the test group are connected in parallel to ensure that they are all input with the same polarity. The voltage output of the test instrument is connected to the first and last ends of the small VT after parallel connection to apply a fixed value of excitation.

5. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 1, characterized in that: The step of applying a fixed value of excitation to each test group and calculating the first relative value of all channels in the test group includes: After applying the correct stimulus amount to the corresponding test group, select to enter the correction parameter calculation process of the corresponding test group consistency correction; Use the original sampling values ​​to calculate and save the phasor values ​​of all channels in the corresponding test group at the same time; Determine whether the modulus values ​​of the phasor values ​​of all channels in the corresponding test group are within the range of the applied fixed value of the excitation; If so, taking the corresponding test group reference channel as the reference, the first relative value of all channels in the corresponding test group relative to the reference is calculated using the phasor value; Determine whether the first relative values ​​of all channels in the corresponding test group are within a reasonable range; If so, the first relative value is available.

6. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 5, characterized in that: The range of the excitation amount for applying a fixed value to each test group is: [(1-W F )*AND e1 *K1,(1+W F )*AND e1 *K2]; Among them, W F I is the channel ratio difference limit percentage of the device, e1 is the effective value of the fixed value of the stimulus applied to the test group, K1 is the reliability coefficient of the lower limit of the modulus value range; K2 is the reliability coefficient of the upper limit of the modulus value range.

7. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 6, characterized in that: The value range of the lower limit reliability coefficient K1 of the module value range is: 0.8≤K1≤0.

98.

8. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 6, characterized in that: The value range of the upper limit reliability coefficient K2 of the module value range is: 1.02≤K2≤1.

2.

9. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 5, characterized in that: The reasonable range includes: Reasonable range of specific modulus relative value: Among them, W F is the channel ratio difference limit percentage of the device, K3 is the lower limit reliability coefficient of the module value relative value; K4 is the upper limit reliability coefficient of the module value relative value.

10. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 9, characterized in that: The value range of the lower limit reliability coefficient K3 of the relative value of the module value is: 0.9≤K3≤0.

98.

11. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 9, characterized in that: The value range of the upper limit reliability coefficient K4 of the relative value of the module value is: 1.02≤K4≤1.

1.

12. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 5, characterized in that: The reasonable scope also includes: Reasonable range of specific phase difference: ≤2*W Δθ *K5; Among them, K5 is the phase difference range reliability coefficient; W Δθ It is the channel phase difference limit of the device.

13. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 12, characterized in that: The value range of the phase difference range reliability coefficient K5 is: 1.01≤K5≤1.

1.

14. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 1, characterized in that: When the second relative value is calculated, the following operations are performed on the test groups respectively: Based on the phasor values ​​of all channels in the test group at the same time that have been saved in the first relative value calculation process, the relative value between the reference channel of the test group and the only reference channel of the same type is calculated; If the test group reference channel and the same type of unique reference channel are not in the same test group, it is necessary to perform superposition calculation through the connection of common channels between the test groups to obtain the relative value between the test group reference channel and the same type of unique reference channel; The second relative values ​​of all channels in the test group are calculated using the relative value between the test group reference channel and the only reference channel of the same type and the first relative value.

15. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 14, characterized in that: The superposition calculation includes: Step 1: Use the saved phasor values ​​of all channels in the test group at the same time to calculate the relative value between the test group reference channel and another test group common channel with it; Step 2: Determine whether another test group contains a unique reference channel of the same type; Step 3: If yes, use the saved phasor values ​​of all channels in another test group at the same time to calculate the relative value between the common channel of another test group and the unique reference channel of the same type in another test group; superimpose all the calculated relative values ​​connected by the common channel to obtain the relative value between the reference channel of the test group and the unique reference channel of the same type, and the superposition calculation is completed; Step 4: If not, use the saved phasor values ​​of all channels in another test group at the same time to calculate the relative value between the common channel of another test group and the common channel of the third test group with which it has a common channel; Step 5: Repeat steps 2 to 4 and perform iterative calculations to obtain the corresponding relative values.

16. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 1, characterized in that: The calculation of the relative time difference comprises: Find the channel in which the phase difference in the third relative value is the minimum among all channels; Taking the channel with the minimum value as the reference, calculate the phase difference of all channels relative to the reference; The phase difference based on the channel with the minimum value is converted into a relative time difference using the frequency parameter of the applied fixed value excitation amount.

17. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 1, characterized in that: When the relative value of the modulus value in the third relative value is calculated, the following operations are performed on the unique reference channels of the same type respectively: After applying the correct excitation amount to the corresponding unique reference channel of the same type, select to enter the correction parameter calculation process of the corresponding unique reference channel modulus of the same type; The effective value of the corresponding unique reference channel of the same type is calculated, and the relative value of the modulus between the corresponding unique reference channel of the same type and the applied fixed value of the excitation is calculated by using the effective value; Determine whether the relative value of the modulus is within a reasonable range; If so, the relative value of the modulus between the corresponding unique reference channel of the same type and the applied fixed value of the excitation amount and the relative value of the modulus in the second relative value are used to calculate the relative value of the modulus in the third relative value of all channels of the same type.

18. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 1, characterized in that: When the phase difference in the third relative value is calculated, the following operations are performed on the same type of unique reference channels respectively: After the correct excitation amount is applied to the corresponding unique reference channel of the same type and the unique reference channel of the device, the correction parameter calculation process of the corresponding unified unique reference channel of the same type is selected; Calculate and obtain the corresponding phasor values ​​of the same type of unique reference channel and the device's unique reference channel at the same time; The phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device is calculated by using the phasor value, and the phase difference between the corresponding unique reference channel of the same type and the fixed value of the excitation quantity applied by the unique reference channel of the device is subtracted from the phase difference; Determine whether the phase difference is within a reasonable range; If so, the phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device and the phase difference in the second relative value are used to calculate the phase difference in the third relative value of all channels of the same type.

19. The method for calibrating consistency of multi-channel sampling values ​​of a power system device according to claim 1, characterized in that: The sampling values ​​after consistency correction include: Using the relative value of the modulus value of each channel in the correction parameter, the original sampling value of each channel is corrected and calculated to obtain the sampling value of each channel after the relative value of the modulus value is corrected; The relative time difference of each channel in the correction parameter is used to perform interpolation calculation of the relative time difference on the sampling value of each channel after the relative value correction of the modulus value, so as to obtain the sampling value after consistency correction.

20. The method for calibrating consistency of multi-channel sampling values ​​of an electric power system device according to any one of claims 1 to 19, characterized in that: The phasor value after consistency correction includes: The modulus and phase angle of the original phasor value of each channel are corrected and calculated using the relative value of the modulus value and the phase difference of each channel in the correction parameters to obtain the phasor value after consistency correction.

21. A multi-channel sampling value consistency correction system for a power system device, characterized in that: include: The test group reference channel designation module performs test grouping on the channels of the same type in the device and designates one channel in each test group as the test group reference channel; A module for designating a unique reference channel of the same type, which designates one channel among the channels of the same type in the device as the unique reference channel of the same type; A device unique reference channel designation module, which designates a channel in the device as the device unique reference channel; A first relative value calculation module applies a fixed value of excitation to each test group, and calculates the first relative value of all channels in the test group, wherein the reference of the first relative value is the reference channel of the test group; A second relative value calculation module, based on the first relative value and the phasor values ​​of all channels in the test group at the same time that have been saved in the process of calculating the first relative value, calculates the second relative value of all channels in the same type, wherein the reference of the second relative value is the only reference channel of the same type; A module for calculating a relative value of a modulus in a third relative value, which calculates relative values ​​of modulus in the third relative values ​​of all channels of the same type based on the relative value of the modulus in the second relative value and the excitation amount of a fixed value applied to each unique reference channel of the same type, wherein the reference of the relative value of the modulus in the third relative value is the excitation amount of the fixed value applied; A phase difference calculation module in a third relative value, based on the phase difference in the second relative value and the excitation amount of a fixed value applied simultaneously to a unique reference channel of the same type and a unique reference channel of the device, calculates the phase difference in the third relative value of all channels of the same type, wherein the reference of the phase difference in the third relative value is the unique reference channel of the device; A relative time difference calculation module, which calculates the relative time difference based on the phase difference in the third relative value and the frequency parameter of the excitation amount of the applied fixed value; A correction parameter acquisition module, storing the third relative value of each channel and the relative time difference of each channel as correction parameters; A sampling value acquisition module performs consistency correction calculation on the original sampling value of each channel based on the correction parameters to obtain a sampling value after consistency correction; The phasor value acquisition module performs consistency correction calculation on the original phasor value of each channel based on the correction parameter to obtain the phasor value after consistency correction.

22. An electronic device, characterized in that It includes a processor, a memory, and a computer program stored in the memory and executable on the processor, wherein when the computer program is executed by the processor, a multi-channel sampling value consistency correction method for an electric power system device as described in any one of claims 1 to 20 is implemented.

23. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the multi-channel sampling value consistency correction method of the power system device according to any one of claims 1 to 20 is implemented.

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