Diamond anvil machining measuring equipment and method for high-pressure physical research

Abstract

The invention discloses a diamond anvil machining and measuring device and method for high-pressure physical research, and the device comprises a high-power microscope which is used for observing the machining process of a diamond anvil sample in real time; the angle adjuster is used for adjusting the angle of the diamond anvil cell sample clamped on the stone turning arm; the angle adjuster is mounted on the horizontal bidirectional moving platform, so that the position of the angle adjuster can be adjusted in the X-axis direction and the Y-axis direction, and the position of the diamond anvil cell sample under the high-power microscope can be adjusted. By means of the real-time observation function of the high-power microscope, the size, shape and precision of the diamond anvil cell can be directly monitored in the machining process, the error problem caused by the fact that a low-power magnifier cannot accurately observe in traditional equipment is avoided, the machining error is effectively controlled within + / -1 micrometer, and the requirement for ultra-precision machining is met.

Description

Technical Field

[0001] The invention relates to the field of diamond measurement and processing, and in particular to a diamond anvil processing and measuring device and a measuring method for high-pressure physics research. Background Art

[0002] In high-pressure physics research, diamond anvil cells are an important tool that are widely used to generate ultra-high pressure conditions. However, the processing accuracy of diamond anvil cells is extremely high, especially in micron-level processing. Traditional processing equipment and testing methods are difficult to meet the current precision processing needs.

[0003] Traditional diamond processing usually uses a 14x magnifying glass for operation and observation. However, the resolution of a 14x magnifying glass is not enough to support the requirements of ultra-precision processing. In actual processing, we usually need to control the size of the diamond top table to a 16-sided perfect circle shape of 300 microns, 100 microns, 50 microns or 30 microns, and the processing error is required to be controlled within ±1 micron. Due to the limited resolution of traditional equipment, such high-precision processing is often difficult to achieve, resulting in substandard processing quality.

[0004] In addition, during the diamond anvil processing, traditional testing methods have serious efficiency problems. Usually, after completing a processing, the diamond anvil needs to be removed from the diamond turning arm and the size, roundness and accuracy of the processing table are measured by independent stone measuring equipment. After the measurement is completed, the anvil is reinstalled into the turning arm to continue processing. This multiple disassembly and assembly not only wastes time, but also causes slight deviations in the sample during the disassembly and assembly process, further affecting the processing accuracy, making it difficult to achieve ultra-precision products that meet the requirements. Summary of the invention

[0005] In order to solve the above problems, the present invention provides a diamond anvil processing and measuring equipment and method for high-pressure physics research. Through the real-time observation function of a high-power microscope, a precise angle adjuster, a horizontal two-way movable platform and an integrated diamond turning arm, the size and shape of the diamond anvil sample can be directly measured and adjusted during the processing, avoiding the traditional multiple disassembly and assembly steps, improving the processing efficiency, and significantly improving the accuracy.

[0006] The present invention is realized by the following technical scheme: a diamond anvil processing and measuring device for high-pressure physics research, the device comprising: High-power microscope for real-time observation of the processing of diamond anvil samples; An angle adjuster, used for adjusting the angle of the diamond anvil sample clamped on the turning arm; A horizontal two-way moving platform, on which the angle adjuster is mounted, so as to adjust the position of the angle adjuster in the X-axis and Y-axis directions, thereby adjusting the position of the diamond anvil sample under a high-power microscope; A diamond turning arm is slidably mounted on the angle adjuster and is used for fixing and processing a diamond anvil sample.

[0007] As a preferred technical solution, the magnification of the high-power microscope is at least 14 times, so as to observe 16-sided round diamond anvil samples with diameters of 300 microns, 100 microns, 50 microns and 30 microns.

[0008] As a preferred technical solution, the diamond turning arm has: A cross head, used to control the angle and processing direction of the diamond anvil sample; A horizontal adjustment component, used for adjusting the horizontal position of the diamond turning arm; Mounting hole, used to install the nozzle for clamping the diamond anvil sample.

[0009] As a preferred technical solution, the angle adjuster includes an arc-shaped base and a movable base, the upper end surface of the arc-shaped base is an arc-shaped surface, an arc-shaped adjustment groove is arranged on the arc-shaped surface along the arc-shaped surface, an adjustment slider is arranged at the position corresponding to the arc-shaped adjustment groove at the bottom of the movable base, the adjustment slider is slidably installed in the arc-shaped adjustment groove, and the movable base can adjust the angle along the arc-shaped surface of the arc-shaped base.

[0010] As a preferred technical solution, angle scale values ​​are provided on the arc-shaped base.

[0011] As a preferred technical solution, a horizontal slide groove is arranged on the upper end of the movable base, and a horizontal slider is arranged at the position corresponding to the horizontal slide groove at the bottom of the diamond turning arm. The horizontal slider is slidably installed in the horizontal slide groove, and the diamond turning arm can adjust its position along the horizontal slide groove.

[0012] The present invention provides a method for processing and measuring a diamond anvil for high pressure physics research, the method comprising the following steps: 1. Fixing the diamond anvil sample on the diamond turning arm; 2. Adjusting the diamond turning arm and the diamond anvil sample to a suitable position under a high-power microscope by means of the angle adjuster; 3. Using a high-power microscope to observe the processing process of the sample in real time; 4. Adjust the sample position in the X-axis and Y-axis directions through the horizontal two-way moving platform to ensure the best observation effect; 5. Based on real-time observation under a high-power microscope, the sample is precisely processed and the processing details are adjusted to ensure the processing accuracy of the sample; 6. During the processing, use a high-power microscope to measure the size and shape of the sample to avoid multiple disassembly and assembly, thereby improving processing efficiency and accuracy.

[0013] The beneficial effects of the present invention are as follows: the present invention can directly monitor the size, shape and precision of the diamond anvil during the processing process through the real-time observation function of the high-power microscope, avoiding the error problem caused by the inability to accurately observe the low-power magnifying glass of the traditional equipment, effectively controlling the processing error within ±1 micron, and meeting the requirements of ultra-precision processing; The present invention integrates a high-power microscope, an angle adjuster, a horizontal two-way moving platform and a diamond turning arm, avoiding the steps of multiple disassembly and assembly for measurement in the traditional method. By directly measuring and adjusting during the processing, the time spent on disassembly and assembly of samples is greatly reduced, and the processing efficiency is significantly improved.

[0014] In traditional equipment, multiple disassembly and assembly of the diamond anvil easily introduces positional deviation, affecting the final processing accuracy. The present invention avoids frequent disassembly and assembly operations through one-time clamping and real-time monitoring, thereby reducing the errors that may occur during the processing and ensuring processing accuracy and consistency.

[0015] The present invention uses an integrated angle adjuster and a horizontal two-way movable platform, so that an operator can conveniently adjust the angle and position of the diamond anvil, the operation is simple, and processing and adjustment can be quickly performed according to real-time observation results, thereby reducing the difficulty of operation.

[0016] The equipment of the present invention can continuously and stably perform ultra-precision machining, is suitable for diamond anvil processing with extremely high precision requirements, and is particularly suitable for industrial environments requiring efficient and high-precision production. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0018] Figure 1 It is a structural schematic diagram of a diamond turning arm and an angle adjuster of the present invention; Description of reference numerals: 1. Arc base; 2. Movable base; 3. Horizontal slide; 4. Angle adjuster; 5. Cross head; 6. Diamond turning arm; 7. Horizontal adjustment assembly. DETAILED DESCRIPTION

[0019] All features disclosed in this specification, or steps in all methods or processes disclosed, except mutually exclusive features and / or steps, can be combined in any manner.

[0020] Any feature disclosed in this specification (including any additional claims, abstract and drawings), unless otherwise stated, may be replaced by other equivalent or alternative features with similar purposes. That is, unless otherwise stated, each feature is only an example of a series of equivalent or similar features.

[0021] like Figure 1 As shown, a diamond anvil processing and measuring device for high-pressure physics research of the present invention comprises: High-power microscope, used to observe the processing process of diamond anvil samples in real time, clearly presents 16-sided circular patterns of 300um, 100um, 50um, 30um, etc., and provides functions such as size measurement; An angle adjuster 4, used for adjusting the angle of the diamond anvil sample clamped on the turning arm; A horizontal two-way movable platform, on which the angle adjuster 4 is mounted, so as to adjust the position of the angle adjuster 4 in the X-axis and Y-axis directions, thereby adjusting the position of the diamond anvil sample under a high-power microscope; The diamond turning arm 6 is slidably mounted on the angle adjuster 4 and is used to fix and process the diamond anvil sample. The diamond turning arm 6 cooperates with the angle adjuster 4 so that the small table of the sample can be perfectly hammered under the high-power microscope. By adjusting the clarity of the high-power microscope, a good pattern display can be obtained, which is convenient for processing and various tests.

[0022] The magnification of the high-power microscope is at least 14 times, so as to observe 16-sided round diamond anvil samples with diameters of 300 microns, 100 microns, 50 microns and 30 microns.

[0023] Diamond turning arm 6 has: A cross head 5, used to control the angle and processing direction of the diamond anvil sample; The horizontal adjustment component 7 is used to adjust the horizontal position of the diamond turning arm 6. The angle adjuster 4 is placed on the mobile platform and can be easily moved horizontally, making it more convenient to perform the image presentation; Mounting hole, used to install the nozzle for clamping the diamond anvil sample.

[0024] The angle adjuster 4 includes an arc-shaped base 1 and a movable base 2. The upper end surface of the arc-shaped base 1 is an arc-shaped surface, and an arc-shaped adjustment groove is arranged along the arc-shaped surface. An adjustment slider is arranged at the bottom of the movable base 2 corresponding to the arc-shaped adjustment groove. The adjustment slider is slidably installed in the arc-shaped adjustment groove, and the movable base 2 can adjust the angle along the arc-shaped surface of the arc-shaped base 1. In order to facilitate the adjustment of the angle value, in this embodiment, an angle scale value is arranged on the arc-shaped base 1, and the position of the movable action relative to the arc-shaped base 1 can be manually adjusted.

[0025] Among them, a horizontal slide groove 3 is arranged at the upper end of the movable base 2, and a horizontal slider is arranged at the position corresponding to the horizontal slide groove 3 at the bottom of the diamond turning arm 6. The horizontal slider is slidably installed in the horizontal slide groove 3, and the diamond turning arm 6 can adjust its position along the horizontal slide groove 3.

[0026] The present invention provides a method for processing and measuring a diamond anvil for high pressure physics research, the method comprising the following steps: 1. Fixing the diamond anvil sample on the diamond turning arm; 2. Adjusting the diamond turning arm and the diamond anvil sample to a suitable position under a high-power microscope by means of the angle adjuster; 3. Using a high-power microscope to observe the processing process of the sample in real time; 4. Adjust the sample position in the X-axis and Y-axis directions through the horizontal two-way moving platform to ensure the best observation effect; 5. Based on real-time observation under a high-power microscope, the sample is precisely processed and the processing details are adjusted to ensure the processing accuracy of the sample; 6. During the processing, use a high-power microscope to measure the size and shape of the sample to avoid multiple disassembly and assembly, thereby improving processing efficiency and accuracy.

[0027] The equipment of the present invention can clearly present various details in the processing process, which is convenient for processing and testing. The specific effect diagram is as follows: The most important thing is that in the process of processing a 16-sided circle, it is necessary to measure and process at the same time. The equipment of the present invention can avoid multiple disassembly and assembly, and various index parameters in the processing process can be mastered in real time. Purposeful repairs and corresponding size control can be carried out, which greatly improves the processing efficiency, is easy to operate, and has higher accuracy. It is very suitable for use in production and processing workshops.

[0028] The present invention places the diamond anvil sample clamped by the diamond processing turning arm vertically under the high-power microscope lens through an angle adjuster, and perfectly displays various stages of sample processing through the high-power microscope. By adjusting the movable platform in two horizontal directions, the sample can be efficiently and quickly presented under the high-power microscope. The size and dimensions of the sample processing can be seen through the high-power microscope, and the details that need to be improved and optimized can be seen at a glance, thereby improving the processing efficiency. The device avoids repeated disassembly and assembly, and can achieve very high processing precision.

[0029] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that are not conceived through creative work should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope defined in the claims.

Claims

1. A diamond anvil processing and measuring device for high pressure physics research, characterized in that: The device comprises: High-power microscope for real-time observation of the processing of diamond anvil samples; An angle adjuster (4) for adjusting the angle of the diamond anvil sample clamped on the turning arm; A horizontal bidirectional movable platform, on which the angle adjuster (4) is mounted, so as to adjust the position of the angle adjuster (4) in the X-axis and Y-axis directions, thereby adjusting the position of the diamond anvil cell sample under a high-power microscope; A diamond turning arm (6) is slidably mounted on the angle adjuster (4) and is used for fixing and processing a diamond anvil sample.

2. The diamond anvil processing and measuring device for high pressure physics research according to claim 1, characterized in that: The magnification of the high-power microscope is at least 14 times, so as to observe 16-sided round diamond anvil samples with diameters of 300 microns, 100 microns, 50 microns and 30 microns.

3. The diamond anvil processing and measuring device for high pressure physics research according to claim 1, characterized in that: The diamond turning arm (6) has: A cross head (5) for controlling the angle and processing direction of the diamond anvil sample; A horizontal adjustment component (7) for adjusting the horizontal position of the diamond turning arm (6); Mounting hole, used to install the nozzle for clamping the diamond anvil sample.

4. The diamond anvil processing and measuring device for high pressure physics research according to claim 1, characterized in that: The angle adjuster (4) comprises an arc-shaped base (1) and a movable base (2); the upper end surface of the arc-shaped base (1) is an arc-shaped surface; an arc-shaped adjustment groove is arranged on the arc-shaped surface along the arc-shaped surface; an adjustment slider is arranged at a position corresponding to the arc-shaped adjustment groove at the bottom of the movable base (2); the adjustment slider is slidably installed in the arc-shaped adjustment groove; and the movable base (2) can be adjusted in angle along the arc-shaped surface of the arc-shaped base (1).

5. The diamond anvil processing and measuring device for high pressure physics research according to claim 4, characterized in that: The arc-shaped base (1) is provided with angle scale values.

6. The diamond anvil processing and measuring device for high pressure physics research according to claim 4, characterized in that: A horizontal slide groove (3) is arranged at the upper end of the movable base (2), and a horizontal slider is arranged at the bottom of the diamond turning arm (6) at a position corresponding to the horizontal slide groove (3). The horizontal slider is slidably installed in the horizontal slide groove (3), and the diamond turning arm (6) can adjust its position along the horizontal slide groove (3).

7. A method for processing and measuring diamond anvils for high pressure physics research, characterized in that: The method comprises the following steps:

1. Fixing the diamond anvil sample on the diamond turning arm (6); 2. adjusting the diamond turning arm (6) and the diamond anvil sample to a suitable position under a high-power microscope by means of the angle adjuster (4); 3. Using a high-power microscope to observe the processing process of the sample in real time; 4. Adjust the sample position in the X-axis and Y-axis directions through the horizontal two-way moving platform to ensure the best observation effect; 5. Based on real-time observation under a high-power microscope, the sample is precisely processed and the processing details are adjusted to ensure the processing accuracy of the sample; 6. During the processing, use a high-power microscope to measure the size and shape of the sample to avoid multiple disassembly and assembly, thereby improving processing efficiency and accuracy.

Images