Test device

Abstract

The invention discloses a test device. The device is used for testing the electromagnetic anti-interference capability of the to-be-tested device. The test equipment comprises a test cavity, a power supply module and a power supply connector. And a test cavity is arranged in the test cavity. The test cavity is used for placing to-be-tested equipment. A mounting hole is formed in the side wall of the test cavity. The power supply module is located outside the test cavity. The power supply connector comprises a first connector and a second connector. The first connector is mounted at the mounting hole and connected with the power supply module. The first joint includes a first housing. The first shell is a metal shell. The first housing and the test cavity are connected to form a grounding loop. The second connector is located in the testing cavity and connected with the first connector. The second connector is electrically connected with to-be-tested equipment through a power line. In the test equipment, the power supply connector for supplying power to the to-be-tested equipment comprises the first connector and the second connector, and the first shell of the first connector is connected with the test cavity to form the grounding loop, so that electromagnetic conduction radiation is effectively reduced, and the influence of a power line on a test result is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of electronic equipment testing, and in particular to a testing device. Background Art

[0002] In the relevant technology, the components of electronic equipment need to have a certain electromagnetic interference resistance capability, namely EMS. Otherwise, in a strong electromagnetic environment, the electronic equipment will experience abnormal situations such as control board chip damage, program crash, display screen flickering, button false triggering, etc., which requires these components of the electronic equipment to be able to withstand a certain amount of electromagnetic interference.

[0003] When testing electronic equipment, it is necessary to supply power to the electronic equipment. However, during the test, the placement of the power cord of the electronic equipment often affects the test effect. Summary of the invention

[0004] The embodiment of the present invention provides a testing device for testing the electromagnetic anti-interference capability of a device to be tested.

[0005] A testing device provided by an embodiment of the present invention includes:

[0006] A test cavity, wherein a test cavity is provided in the test cavity, the test cavity is used to place the device to be tested, and a mounting hole is provided on a side wall of the test cavity;

[0007] a power supply module, the power supply module being located outside the test cavity, and;

[0008] A power supply connector, the power supply connector includes a first connector and a second connector, the first connector is installed at the mounting hole and connected to the power supply module, the first connector includes a first shell, the first shell is a metal shell, the first shell is connected to the test cavity to form a grounding loop, the second connector is located in the test cavity and connected to the first connector, and the second connector is used to electrically connect the device under test through a power cord.

[0009] In the above test equipment, the power supply connector for supplying power to the device under test includes a first connector and a second connector. The first shell of the first connector is connected to the test cavity to form a grounding loop, which effectively reduces electromagnetic conduction radiation and reduces the influence of the power line on the test results.

[0010] In some embodiments, the power line includes a metal wire, an insulating layer and a shielding layer from the inside to the outside, the insulating layer covers the metal wire, and the shielding layer covers the insulating layer.

[0011] In some embodiments, the power cord comprises:

[0012] A protective layer covers the shielding layer.

[0013] In some embodiments, an inner wall of the mounting hole is provided with an internal thread, and the first housing is provided with an external thread, and the external thread is connected to the internal thread.

[0014] In certain embodiments, the testing device comprises:

[0015] A sealing ring is used to seal and connect the first housing and the test cavity.

[0016] In some embodiments, the first connector is provided with a slot, and the second connector comprises a plug, and the plug is inserted into the slot.

[0017] In some embodiments, a first fool-proofing portion is provided on the first housing, and a second fool-proofing portion is provided on the second connector. When the first fool-proofing portion and the second fool-proofing portion are cooperatively connected, the first connector is connected to the second connector.

[0018] In certain embodiments, the testing device comprises:

[0019] A radio frequency module, wherein the radio frequency module is used to generate a radio frequency signal;

[0020] An antenna, the antenna is connected to the radio frequency module, and the antenna is used to feed the radio frequency signal into the test cavity;

[0021] A heat dissipation component, the heat dissipation component is used to dissipate heat for the radio frequency module and the power supply module, and;

[0022] An electrical room, wherein the electrical room is located outside the test cavity, and the power supply module, the radio frequency module and the heat dissipation component are located inside the electrical room.

[0023] In some embodiments, the heat dissipation assembly includes:

[0024] Cooling fan, and;

[0025] An air guide member, wherein the air guide member covers the radio frequency module, and the air guide member is provided with an air inlet and an air outlet, and the air inlet is arranged corresponding to the heat dissipation fan.

[0026] In some embodiments, the power supply module is disposed above the air guide, and the power supply module and the air guide are thermally connected.

[0027] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0029] Figure 1 is a schematic structural diagram of a test device according to an embodiment of the present invention;

[0030] Figure 2 is a schematic structural diagram of a test chamber according to an embodiment of the present invention;

[0031] Figure 3 is a schematic structural diagram of a power supply connector according to an embodiment of the present invention;

[0032] Figure 4 is a schematic structural diagram of a power line according to an embodiment of the present invention;

[0033] Figure 5 is another structural schematic diagram of a test chamber according to an embodiment of the present invention;

[0034] Figure 6 is an exploded schematic diagram of a testing device according to an embodiment of the present invention.

[0035] Description of main component symbols:

[0036] Test equipment-100, test cavity-10, test cavity-11, door body-12, power supply module-20, power supply connector-30, first connector-31, external thread-311, first shell-312, first wire-313, slot-314, second connector-32, second shell-321, second wire-322, plug-323, grip ring-324, positioning mark-325, power cord-40, metal wire-41, insulation layer-42, shielding layer-43, protective layer-44, electrical room-60, heat dissipation assembly-70, air guide-71, air inlet-711, air outlet-712, heat dissipation fan-72, RF module-80, antenna-81, control panel-90. DETAILED DESCRIPTION

[0037] The embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0038] The disclosure below provides many different embodiments or examples to realize different structures of the present invention. In order to simplify the disclosure of the present invention, the parts and settings of specific examples are described below. Of course, they are only examples, and the purpose is not to limit the present invention. In addition, the present invention can repeat reference numbers and / or reference letters in different examples, and this repetition is for the purpose of simplicity and clarity, which itself does not indicate the relationship between the various embodiments and / or settings discussed. In addition, the present invention provides various specific examples of processes and materials, but those of ordinary skill in the art can be aware of the application of other processes and / or the use of other materials.

[0039] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more features. In the description of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0040] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiments or examples are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0041] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0042] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0043] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection. It can be a mechanical connection or an electrical connection. It can be directly connected or indirectly connected through an intermediate medium. It can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0044] See also Figures 1 to 3 A test device 100 according to an embodiment of the present invention is used to test the electromagnetic anti-interference capability of a device to be tested (not shown). The test device 100 includes a test cavity 10, a power supply module 20 and a power supply connector 30. A test cavity 11 is provided in the test cavity 10. The test cavity 11 is used to place the device to be tested. The side wall of the test cavity 11 is provided with a mounting hole. The power supply module 20 is located outside the test cavity 11. The power supply connector 30 includes a first connector 31 and a second connector 32. The first connector 31 is installed at the mounting hole and connected to the power supply module 20. The first connector 31 includes a first shell 312, which is a metal shell. The first shell 312 is connected to the test cavity 10 to form a grounding loop. The second connector 32 is located in the test cavity 11 and is connected to the first connector 31. The second connector 32 is used to electrically connect the device to be tested through a power cord 40.

[0045] In the above-mentioned test equipment 100, the power supply connector 30 for supplying power to the device under test includes a first connector 31 and a second connector 32. The first shell 312 of the first connector 31 is connected to the test cavity 10 to form a grounding loop, which effectively reduces electromagnetic conduction radiation and reduces the influence of the power cord 40 on the test results.

[0046] In one embodiment, the test device 100 can form an electromagnetic interference environment in the test cavity 10. The test cavity 11 is used to place the device under test. The device under test includes but is not limited to chips, circuit boards, display screens, etc. In the electromagnetic interference environment, if the electromagnetic susceptibility (EMS) of the device under test does not meet the requirements, the device under test will show abnormal conditions such as screen flickering, screen distortion, abnormal temperature, program crash, button mis-triggering or abnormal sound, which is conducive to screening out design solutions with poor electromagnetic susceptibility and improving the device under test according to the abnormal conditions.

[0047] In addition, the mounting hole on the side wall of the test cavity 11 can be installed with the first connector 31. The device under test is connected to the power supply module 20 through the power cord 40, the second connector 32 and the first connector 31 in sequence, so that the power supply module 20 supplies energy to the device under test. According to the power supply demand of the device under test, the power supply module 20 can provide AC current or DC current to the device under test. During the test process, the power cord 40 in the test cavity 11 will receive the electromagnetic interference in the test cavity 11, and transmit the electromagnetic interference to the device under test, so that it is impossible to distinguish whether the abnormal state presented by the device under test is caused by the power cord 40 or by the electromagnetic interference radiated by the antenna 81. Therefore, by connecting the metal shell of the first connector 31 to the test cavity 10 to form a ground loop, an anti-electromagnetic shielding structure can be formed, thereby preventing the electromagnetic interference environment from interfering with the power cord 40 at the connector.

[0048] In one embodiment, the test chamber 10 further includes a door 12, one side of the test chamber 10 is provided with an opening, and the door 12 is rotatably mounted at the opening to open or close the opening. When the door 12 is opened, the tester can take and place the device to be tested. When the door 12 is closed, the test can be performed. The door 12 is used to prevent the radio frequency signal from leaking from the test chamber 11 into the air, thereby improving the safety of the detection process.

[0049] In some embodiments, the material of the test cavity 10 is a material that has the function of shielding the propagation of electromagnetic waves. This can avoid the leakage of electromagnetic waves when detecting the device to be tested, thereby avoiding the adverse effects of electromagnetic waves on nearby testers, and can also ensure the accuracy of detecting the device to be tested. The test cavity 10 can be a test cavity 10 made of metal material, or a test cavity 10 with a metal layer on the surface of a plastic material, which is not limited here. The test cavity 10 made of metal material is strong and durable; the test cavity 10 with a metal layer on the surface of a plastic material is light in weight, low in cost, and easy to move. The material of the test cavity 10 and the wall of the entire electromagnetic compatibility test device 100 can be selected according to actual conditions, which is not limited here.

[0050] Also, see Figure 3In one embodiment, the first connector 31 further includes a first wire 313. The first wire 313 is connected to the power supply module 20. The second connector 32 includes a second housing 321 and a second wire 322. The second wire 322 is connected to the metal wire 41 of the power cord 40. The second housing 321 may also be a metal housing. The second housing 321 is electrically connected to the first housing 312, and is connected to the test cavity 10 through the first housing 312 to form a grounding loop, so that the second housing 321 can cooperate with the first housing 312 to form an anti-electromagnetic shielding structure on the outer layer of the power connector 30.

[0051] See also Figure 4 In some embodiments, the power line 40 includes a metal wire 41, an insulating layer 42 and a shielding layer 43 from the inside to the outside. The insulating layer 42 covers the metal wire 41. The shielding layer 43 covers the insulating layer 42.

[0052] In this way, the test accuracy can be improved.

[0053] Specifically, see Figure 4 In one embodiment, the metal wire 41 may be copper or aluminum to play a role in current transmission. Of course, the metal wire 41 may also be made of more expensive materials such as silver or gold. By arranging an insulating layer 42 outside the metal wire 41, it is possible to avoid electrical connection between the metal wire 41 and the shielding layer 43 and loss of shielding effect. In another embodiment, the power cord 40 may include multiple strands of metal wires 41, and the insulating layer 42 is sleeved outside each strand of metal wire 41 to avoid electrical connection between the multiple strands of metal wires 41 and form a short circuit. The insulating layer 42 may be made of materials such as polyethylene, polyvinyl chloride or rubber. In another embodiment, the shielding layer 43 may be made of copper or tinned copper wire. Arranging the shielding layer 43 outside the metal wire 41 can prevent the metal wire 41 from receiving electromagnetic interference, thereby ensuring accurate testing.

[0054] See also Figure 4 In some embodiments, the power line 40 includes a protective layer 44 . The protective layer 44 covers the shielding layer 43 .

[0055] In this way, the power line 40 can be protected.

[0056] Specifically, see Figure 4In one embodiment, a protective layer 44 is provided outside the shielding layer 43 to protect the power cord 40 and prevent short circuit or electromagnetic interference of the power cord 40. During the normal use of the test device 100, the power cord 40 may be subjected to mechanical damage such as bending, extrusion or cutting, or to harsh working environments such as high temperature and humidity. Therefore, in order to ensure the normal operation of the power cord 40, a waterproof, flame-retardant and flexible protective layer 44 may be selected to cover the shielding layer 43. The protective layer 44 may be made of a rubber material with higher elasticity and flexibility, or a plastic material with better mechanical properties and waterproofness.

[0057] See also Figure 2 and Figure 3 In some embodiments, the inner wall of the mounting hole is provided with an internal thread. The first housing 312 is provided with an external thread 311. The external thread 311 is connected to the internal thread.

[0058] In this way, it is convenient to install or remove the first connector 31 .

[0059] Specifically, see Figure 2 and Figure 3 In one embodiment, the first connector 31 can be conveniently installed on the test cavity 10 by threading the mounting hole with the first shell 312. In the case where the first shell 312 is mechanically damaged or corroded so that the metal shell cannot form an effective anti-electromagnetic shielding effect, the damaged first connector 31 can be removed by screwing out the thread, and the replacement first connector 31 can be fastened to the test cavity 10 by threading, and the threaded connection can also ensure that the first shell 312 is electrically connected to the test cavity 10. Of course, the first connector 31 can also be fixed to the side wall of the test cavity 11 by screws or welding.

[0060] Also, see Figure 5 In another embodiment, the first connector 31 can be made into a power socket. The first connector 31 includes a plurality of slots 314. The first housing 312 is a metal housing, thereby forming a ground loop with the test cavity 10. Accordingly, the second connector 32 can be made into a power plug, and is electrically connected to the first housing 312 using a metal housing. The power supply module 20 supplies power to the device under test through the power supply connector 30 and the power cord 40.

[0061] In some embodiments, the testing device 100 includes a sealing ring that seals and connects the first housing 312 and the testing chamber 10 .

[0062] In this way, the anti-electromagnetic shielding effect can be enhanced.

[0063] Specifically, see Figure 2In one embodiment, when the first joint 31 is connected to the mounting hole by a threaded connection or other movable connection methods, a small gap may exist between the first shell 312 and the mounting hole. The gap between the first shell 312 and the mounting hole will affect the anti-electromagnetic shielding effect to a certain extent, and thus affect the test results. Therefore, in the case of high requirements for the test results, by providing a sealing ring between the first shell 312 and the side wall of the test cavity 11, the sealing effect of the first joint 31 can be enhanced, thereby enhancing the anti-electromagnetic shielding effect. In addition, the addition of a sealing ring can also improve the waterproof and dustproof performance of the first joint 31, thereby ensuring the normal operation of the test device 100 in a temperature and humidity environment.

[0064] See also Figure 2 and Figure 3 In some embodiments, the first connector 31 is provided with a slot 314 . The second connector 32 includes a plug 323 . The plug 323 is inserted into the slot 314 .

[0065] In this way, the connection modes of the first joint 31 and the second joint 32 can be more diverse.

[0066] Specifically, see Figure 2 and Figure 3 In one embodiment, the first connector 31 and the second connector 32 are electrically connected through the cooperation of the slot 314 and the plug 323, so that the device under test is connected to the power supply module 20. In some embodiments, a stable and safe plug 323 can be formed by injection molding, or a flexible and detachable plug 323 can be formed by assembly. In other embodiments, the plug 323 can be a two-core power plug 323, or a three-core power plug 323, or a multi-core power plug 323. The plug 323 can specifically be a plug or a pin. The slot 314 can be adaptively selected to match the type and form of the plug 323. In another embodiment, the second connector 32 may include a grip ring 324, which is arranged on the periphery of the second connector 32 and has a plurality of protrusions. The grip ring 324 has a large friction coefficient, so that it is convenient for the tester to insert the plug 323 into the slot 314 by holding the grip ring 324.

[0067] In some embodiments, a first foolproof portion is provided on the first housing 312. A second foolproof portion is provided on the second connector 32. When the first foolproof portion and the second foolproof portion are matched and connected, the first connector 31 is connected to the second connector 32.

[0068] In this way, the safety of the power supply connector 30 can be improved.

[0069] Specifically, in one embodiment, the test device 100 can test a variety of devices to be tested, and each device to be tested requires a different power supply. If the same power supply connector 30 is used, it will not be able to meet multiple voltage or current requirements. In some embodiments, the test cavity 10 may include a plurality of mounting holes, and a power supply connector 30 is respectively arranged in the plurality of mounting holes, and the power supply module 20 can provide different voltage or current requirements for different power supply connectors 30. In one embodiment, in order to prevent the second connector 32 from being inserted into an unmatched first connector 31, a first anti-fool portion and a second anti-fool portion that are matched may be provided between the first connector 31 and the second connector 32 of the same power supply connector 30, so as to prevent the first connector 31 from being electrically connected to the second connector 32 when the first connector 31 is inserted into an unmatched second connector 32. The first anti-fool portion may be a protrusion, which may prevent the unmatched second connector 32 from being further inserted, thereby preventing damage to the device to be tested caused by excessive voltage input. The second anti-fool portion may be a groove corresponding to the shape of the protrusion. When the first connector 31 and the second connector 32 are correctly matched, the protrusion can be accommodated in the groove to electrically connect the first connector 31 and the second connector 32, so that the power supply module 20 can supply energy to the device under test with a suitable voltage or current. Of course, the first foolproof part can also be a groove, and the second foolproof part can be a protrusion. For example, the second foolproof part can be a positioning pin, and the first foolproof part can be a pin groove.

[0070] In addition, in another embodiment, the power connector 30 may further include a positioning mark 325. There may be two positioning marks 325, which are respectively arranged on the first shell 312 and the second shell 321. The positioning mark 325 may be used to indicate whether the slot 314 and the plug 323 are in the correct posture. The positioning mark 325 may be a color mark, so that the posture of the slot 314 and the plug 323 can be judged visually. The positioning mark 325 may also be a convex or concave, so that the posture of the slot 314 and the plug 323 can be judged by touch. The positioning mark 325 may also be a fluorescent mark, so that it is convenient for testers to connect the slot 314 and the plug 323 in low light conditions.

[0071] See also Figure 1 and Figure 6 In some embodiments, the test device 100 includes a radio frequency module 80, an antenna 81, a heat dissipation assembly 70, and an electrical chamber 60. The radio frequency module 80 is used to generate a radio frequency signal. The antenna 81 is connected to the radio frequency module 80. The antenna 81 is used to feed the radio frequency signal into the test chamber 11. The heat dissipation assembly 70 is used to dissipate heat for the radio frequency module 80 and the power supply module 20. The electrical chamber 60 is located outside the test chamber 11. The power supply module 20, the radio frequency module 80, and the heat dissipation assembly 70 are located in the electrical chamber 60.

[0072] In this way, it is possible to avoid the temperature of the RF module 80 increasing and thus reducing the accuracy of the RF module 80 in adjusting the RF signal.

[0073] Specifically, see Figure 1 and Figure 6 In one embodiment, the electrical room 60 can be arranged above the test cavity 10, and the electrical room 60 is separated from the test cavity 10. In this way, the electrical room 60 will not affect the test results of the device under test, thereby ensuring the accuracy of the test results. Placing the power supply module 20, the RF module 80 and the heat dissipation assembly 70 in the electrical room 60 can improve the utilization rate of the space. The RF module 80 contains a signal generating circuit composed of components such as a crystal oscillator, an amplifier, a circulator, a phase shifter, and corresponding incident and reflected power detection circuits. It outputs a RF signal when it is working, and the RF signal frequency band includes but is not limited to the microwave frequency band. The temperature of the RF module 80 rises quickly. When the temperature of the RF module 80 is high, the internal components of the RF module 80 are affected by the high temperature, and the adjustment accuracy of the RF signal will be reduced. By setting the heat dissipation component 70, when the temperature of the RF module 80 exceeds the temperature threshold, the heat dissipation component 70 can be started to dissipate heat for the RF module 80, thereby ensuring the accuracy of the RF module 80 in adjusting the RF signal. At the same time, it can also prevent the components of the RF module 80 from aging too quickly due to excessive temperature, thereby reducing its failure rate and extending the service life of the RF module 80. The antenna 81 can be at least partially arranged in the electrical chamber 60 to feed the RF signal into the test chamber 11. The heat dissipation component 70 can also dissipate heat for the antenna 81. It is understandable that the heat dissipation component 70 can dissipate heat for other components in the electrical chamber 60 in addition to dissipating heat for the RF module 80 and the antenna 81. Of course, the antenna 81 can be placed entirely in the test chamber 10, or a portion can be placed in the test chamber 10, and the other portion can be located outside the test chamber 10, which is not limited here.

[0074] In another embodiment, the heat dissipation component 70 can use liquid cooling to dissipate heat for the RF module 80 and the power supply module 20. In yet another embodiment, the heat dissipation component 70 can use air cooling to dissipate heat for the RF module 80 and the power supply module 20. In yet another embodiment, the heat dissipation component 70 can use liquid cooling and air cooling to dissipate heat for the RF module 80 and the power supply module 20.

[0075] See also Figure 6 In some embodiments, the heat dissipation assembly 70 includes an air guide 71 and a heat dissipation fan 72. The air guide 71 covers the radio frequency module 80. The air guide 71 is provided with an air inlet 711 and an air outlet 712. The air inlet 711 is provided corresponding to the heat dissipation fan 72.

[0076] In this way, the heat dissipation component 70 can dissipate the heat of the RF module 80 by air cooling.

[0077] Specifically, see Figure 6 In one embodiment, the heat dissipation fan 72 can provide wind when working. The wind blown by the heat dissipation fan 72 enters the interior of the air guide 71, which can take away the heat of the RF module 80 and cool it down. The air inlet 711 of the air guide 71 is arranged corresponding to the heat dissipation fan 72 so that the heat dissipation fan 72 can send the generated wind into the air guide 71. After the wind takes away the heat of the RF module 80, it can be discharged from the air outlet 712 of the air guide 71, thereby reducing the temperature of the RF module 80 and the electrical chamber 60. In another embodiment, the area of ​​the air inlet 711 is larger than the area of ​​the air outlet 712, and the internal flow channel of the air guide 71 is in a gradually contracting shape along the direction from the air inlet 711 to the air outlet 712, so that the wind can be accelerated in the air guide 71, speeding up the removal of heat from the RF module 80 and other components and parts, and improving the heat dissipation efficiency. In another embodiment, the heat dissipation fan 72 is arranged in the electrical chamber 60, and the heat dissipation fan 72 includes but is not limited to a centrifugal fan, a cross-flow fan, an axial flow fan, and a mixed flow fan. The number of the heat dissipation fans 72 can be one, two, or more than two, which is not limited here.

[0078] See also Figure 6 In some embodiments, the power supply module 20 is disposed above the air guide 71. The power supply module 20 and the air guide 71 are thermally connected.

[0079] In this way, the power supply module 20 can be cooled by the air guide member 71 .

[0080] Specifically, see Figure 6 In one embodiment, the power supply module 20 is electrically connected to various components and parts of the test device 100, including but not limited to the RF module 80, the heat dissipation fan 72, the device to be tested, etc. In another embodiment, the test device 100 may also include a control panel 90. The tester can control the start or stop of the test through the control panel 90. The control panel 90 can also display the parameters of the current RF signal, and the parameters of the RF signal can be modified through the operation area on the control panel 90 to adjust the RF signal. The control panel 90 can also be provided with power by the power supply module 20. Therefore, the power supply module 20 has a large load and a faster temperature rise during operation. In order to ensure the normal operation of the power supply module 20, the air guide 71 can dissipate the heat of the power supply module 20. When the heat dissipation fan 72 is working, the efficiency of the air guide 71 in dissipating heat can be accelerated, further improving the heat dissipation efficiency of the power supply module 20. Optionally, the air guide 71 can be a metal part.

[0081] Although embodiments of the present invention have been shown and described, those skilled in the art will appreciate that various changes, combinations, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A test device for testing the electromagnetic anti-interference capability of a device under test, characterized in that: The test equipment includes: A test cavity, wherein a test cavity is provided in the test cavity, the test cavity is used to place the device to be tested, and a mounting hole is provided on a side wall of the test cavity; a power supply module, the power supply module being located outside the test cavity, and; A power supply connector, the power supply connector includes a first connector and a second connector, the first connector is installed at the mounting hole and connected to the power supply module, the first connector includes a first shell, the first shell is a metal shell, the first shell is connected to the test cavity to form a grounding loop, the second connector is located in the test cavity and connected to the first connector, and the second connector is used to electrically connect the device under test through a power cord.

2. The test device according to claim 1, characterized in that The power line comprises a metal wire, an insulating layer and a shielding layer in sequence from the inside to the outside. The insulating layer covers the metal wire, and the shielding layer covers the insulating layer.

3. The testing device according to claim 2, characterized in that The power cord comprises: A protective layer covers the shielding layer.

4. The testing device according to claim 1, characterized in that The inner wall of the mounting hole is provided with an internal thread, the first shell is provided with an external thread, and the external thread is connected to the internal thread.

5. The testing device according to claim 1, characterized in that The test equipment includes: A sealing ring is used to seal and connect the first housing and the test cavity.

6. The testing device according to claim 1, characterized in that The first connector is provided with a slot, and the second connector comprises a plug, and the plug is inserted into the slot.

7. The testing device according to claim 1, characterized in that The first housing is provided with a first fool-proofing portion, and the second connector is provided with a second fool-proofing portion. When the first fool-proofing portion is matched with the second fool-proofing portion, the first connector is connected with the second connector.

8. The testing device according to claim 1, characterized in that The test equipment includes: A radio frequency module, wherein the radio frequency module is used to generate a radio frequency signal; An antenna, the antenna is connected to the radio frequency module, and the antenna is used to feed the radio frequency signal into the test cavity; A heat dissipation component, the heat dissipation component is used to dissipate heat for the radio frequency module and the power supply module, and; An electrical room, wherein the electrical room is located outside the test cavity, and the power supply module, the radio frequency module and the heat dissipation component are located inside the electrical room.

9. The testing device according to claim 8, characterized in that The heat dissipation component comprises: Cooling fan, and; An air guide member, wherein the air guide member covers the radio frequency module, and the air guide member is provided with an air inlet and an air outlet, and the air inlet is arranged corresponding to the heat dissipation fan.

10. The testing device according to claim 9, characterized in that The power supply module is arranged above the air guide member, and the power supply module and the air guide member are connected in a heat-conducting manner.

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