Test device

Abstract

The invention discloses test equipment. The test equipment is used for testing the anti-electromagnetic interference capability of to-be-tested equipment, and comprises a test cavity which is internally provided with a test cavity and is used for accommodating the to-be-tested equipment; an antenna assembly; the radio frequency module is electrically connected with the antenna assembly, the radio frequency module is used for outputting a radio frequency signal, and the antenna assembly is used for feeding the radio frequency signal into the test cavity; the rotating assembly comprises a fixing disc located in the testing cavity, the fixing disc is used for fixing the to-be-tested equipment, and the rotating assembly is used for driving the fixing disc to drive the to-be-tested equipment to rotate in the testing cavity. The test equipment is provided with the rotating assembly, the radio frequency signal can be simulated into electromagnetic radiation in the test process, and the electromagnetic radiation has certain directivity, so that the rotating assembly can be used for driving the fixed disc to drive the equipment to be tested to rotate, and different parts of the equipment to be tested can be interfered by expected electromagnetic radiation; and the accuracy of a test result is ensured.

Description

Technical Field

[0001] The present invention relates to the technical field of equipment testing, and in particular to a testing equipment. Background Art

[0002] In the design process of electromagnetic wave related products such as mobile phone communications, WIFI signals, and wireless energy transmission, electromagnetic compatibility (EMC) is an issue that must be considered. Because different electromagnetic wave energies may generate noise signals and interfere with each other, how to avoid interference and maintain normal operation is an indispensable part of electromagnetic research. Therefore, it is necessary to test the equipment against electromagnetic radiation interference. During the test process, how to ensure the accuracy of the test results has become a technical problem to be solved. Summary of the invention

[0003] An embodiment of the present invention provides a testing device.

[0004] A testing device according to an embodiment of the present invention is used to test the anti-electromagnetic interference capability of a device to be tested, and the testing device comprises:

[0005] A test cavity, wherein a test cavity is provided in the test cavity, and the test cavity is used to accommodate the device to be tested;

[0006] Antenna assembly;

[0007] A radio frequency module, the radio frequency module is electrically connected to the antenna assembly, the radio frequency module is used to output a radio frequency signal, and the antenna assembly is used to feed the radio frequency signal into the test cavity;

[0008] The rotating assembly includes a fixed disk located in the test cavity, the fixed disk is used to fix the device under test, and the rotating assembly is used to drive the fixed disk to drive the device under test to rotate in the test cavity.

[0009] The above-mentioned test equipment has a rotating component. During the test, the radio frequency signal can be simulated as electromagnetic radiation. Since electromagnetic radiation has a certain directionality, the rotating component can be used to drive the fixed disk to drive the device under test to rotate, so that different parts of the device under test can be subject to the expected electromagnetic radiation interference, thereby ensuring the accuracy of the test results.

[0010] In some embodiments, the rotating assembly includes a first rotating assembly, the fixed disk includes a first fixed disk, the first rotating assembly includes a first motor and a first connecting shaft, the first motor is located outside the test chamber, the first connecting shaft connects the first fixed disk and the first motor, the first fixed disk is arranged in a horizontal direction, and the first motor is used to drive the first connecting shaft to rotate to drive the first fixed disk and the device under test to rotate.

[0011] In some embodiments, the rotating assembly includes a second rotating assembly, the fixed disk includes a second fixed disk, the second rotating assembly includes a second motor and a second connecting shaft, the second motor is located outside the test chamber, the second connecting shaft connects the second fixed disk and the second motor, the second fixed disk is arranged in a vertical direction, and the second motor is used to drive the second connecting shaft to rotate to drive the second fixed disk and the device under test to rotate.

[0012] In some embodiments, two of the second fixing plates are used to clamp and fix the device under test, and each of the second fixing plates is connected to a second connecting shaft.

[0013] In certain embodiments, the fixing plate includes a dielectric fixing plate and / or a conductive fixing plate.

[0014] In some embodiments, the testing device includes a controller and an operating component, the controller is electrically connected to the operating component and the RF module, the operating component is used to set the parameters of the RF signal, and the controller is used to obtain the parameters of the RF signal and control the RF module to output the RF signal according to the parameters of the RF signal, and the parameters of the RF signal include at least one of frequency, phase and power.

[0015] In some embodiments, the test device includes a controller and a communication module, the controller is electrically connected to the communication module and the RF module, the communication module is used to receive parameters of the RF signal sent by a preset terminal, and the controller is used to obtain the parameters of the RF signal and control the RF module to output the RF signal according to the parameters of the RF signal, and the parameters of the RF signal include at least one of frequency, phase and power.

[0016] In some embodiments, the test equipment includes an electrical room and a heat dissipation assembly, the electrical room is located outside the test cavity, the heat dissipation assembly and the RF module are located in the electrical room, and the heat dissipation assembly is used to dissipate heat for the RF module.

[0017] In some embodiments, the heat dissipation assembly includes an air guide and a heat dissipation fan, the air guide covers the RF module, the air guide is provided with an air inlet and an air outlet, and the air inlet is arranged corresponding to the heat dissipation fan.

[0018] In some embodiments, the testing device further includes a power supply module, which is electrically connected to the RF module, the heat dissipation fan and the rotating assembly, and the power supply module is located above the air guide and is thermally connected to the air guide.

[0019] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying creative work.

[0021] Figure 1 It is an exploded schematic diagram of a testing device according to an embodiment of the present invention;

[0022] Figure 2 It is a schematic structural diagram of a testing device according to an embodiment of the present invention.

[0023] Component Symbols:

[0024] Test equipment-100, test cavity-12, antenna assembly-14, RF module-16, rotating assembly-18, test cavity-20, fixed disk-22, antenna-24, base-26, control panel-28, operating assembly-30, door body-32, opening-34, first rotating assembly-36, first fixed disk-38, first motor-40, first connecting shaft-42, second rotating assembly-44, second fixed disk-46, second motor-48, second connecting shaft-50, clamping space-52, controller-54, touch display screen-56, communication module-58, electrical room-60, heat dissipation assembly-62, air guide-64, heat dissipation fan-66, air inlet-68, air outlet-70, air inlet end-72, air outlet end-74, power supply module-76, device under test-200. DETAILED DESCRIPTION

[0025] The embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0026] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0027] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected" and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection. It can be a mechanical connection or an electrical connection. It can be directly connected or indirectly connected through an intermediate medium. It can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0028] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0029] The disclosure below provides many different embodiments or examples to realize different structures of the present invention. In order to simplify the disclosure of the present invention, the parts and settings of specific examples are described below. Of course, they are only examples, and the purpose is not to limit the present invention. In addition, the present invention can repeat reference numbers and / or reference letters in different examples, and this repetition is for the purpose of simplicity and clarity, which itself does not indicate the relationship between the various embodiments and / or settings discussed. In addition, the present invention provides various specific examples of processes and materials, but those of ordinary skill in the art can be aware of the application of other processes and / or the use of other materials.

[0030] Please refer to Figure 1 to Figure 2 A test device 100 provided in an embodiment of the present invention is used to test the anti-electromagnetic interference capability of a device under test 200. The test device 100 includes a test cavity 12, an antenna assembly 14, a radio frequency module 16, and a rotating assembly 18. A test cavity 20 is provided in the test cavity 12, and the test cavity 20 is used to accommodate the device under test 200. The radio frequency module 16 is electrically connected to the antenna assembly 14, and the radio frequency module 16 is used to output a radio frequency signal. The antenna assembly 14 is used to feed the radio frequency signal into the test cavity 20. The rotating assembly 18 includes a fixed disk 22 located in the test cavity 20, and the fixed disk 22 is used to fix the device under test 200. The rotating assembly 18 is used to drive the fixed disk 22 to drive the device under test 200 to rotate in the test cavity 20.

[0031] The above-mentioned test equipment 100 has a rotating component 18. During the test process, the radio frequency signal can be simulated as electromagnetic radiation. Since electromagnetic radiation has a certain directionality, the rotating component 18 can be used to drive the fixed disk 22 to drive the device under test 200 to rotate, so that different parts of the device under test 200 can be subjected to the expected electromagnetic radiation interference, thereby ensuring the accuracy of the test results.

[0032] Specifically, in one embodiment, the device under test 200 may include but is not limited to a control panel, a display screen, a chip, a circuit board or an electronic device, which is not specifically limited herein. The volume of the test device 100 of the embodiment of the present invention is similar to the volume of a built-in oven, which can meet the test of small and medium-sized devices under test 200.

[0033] A test cavity 20 is formed in the test cavity 12, and a device under test 200 can be accommodated in the test cavity 20 and fixed on a fixing plate 22. The radio frequency signal output by the radio frequency module 16 can form electromagnetic radiation. The device under test 200 can be interfered by the radio frequency signal output by the test device 100, and an electromagnetic susceptibility (EMS) test is performed.

[0034] Optionally, the test cavity 12 is made of a material having the ability to shield radio frequency signals, such as a metal cavity. Further, the test cavity 12 may include a body made of plastic material and a metal layer covering the surface of the body to reduce manufacturing costs and reduce weight. Further, optionally, the wall of the test cavity 12 close to the test cavity 20 may be covered with an absorbing layer to absorb radio frequency signals radiated to the wall and reduce reflection of radio frequency signals.

[0035] In one embodiment, the radio frequency signal includes but is not limited to a radio frequency signal in the microwave frequency band. The radio frequency module 16 may include a signal generating circuit, an incident power detection circuit, and a reflected power detection circuit. The signal generating circuit may include components such as a crystal oscillator, an amplifier, a circulator, and a phase shifter. The incident power detection circuit is used to detect the power of the radio frequency signal incident into the test cavity 20. The radio frequency module 16 may adjust the radio frequency signal output by the signal generating circuit according to the data fed back by the incident power detection circuit, so that the power of the radio frequency signal incident into the test cavity 20 is close to the target power (set power) or equal to the target power.

[0036] The reflected power detection circuit is used to detect the power of the RF signal reflected by the test cavity 20 , and the RF module 16 can determine the energy of the RF signal absorbed by the device under test 200 based on the data fed back by the incident power detection circuit and the reflected power detection circuit.

[0037] Please refer to Figure 1 The antenna assembly 14 may include an antenna 24 and a base 26, the base 26 is mounted on a side plate (such as a top plate) of the test cavity 12, and the antenna 24 is mounted on the base 26. Optionally, the antenna 24 may extend into the test cavity 20 in whole or in part. The antenna 24 may be an array antenna 24 or other types of antennas 24, which are not specifically limited herein. The number of antennas 24 may be one, two, or more than two, which are not specifically limited herein. Optionally, the antenna 24 is a broadband antenna 24.

[0038] exist Figure 1 In the embodiment, the test device 100 further includes a control panel 28 mounted on the test cavity 12, and the control panel 28 is electrically connected to the RF module 16 and the rotating assembly 18. The control panel 28 may include operating components 30 such as buttons and a touch screen, and the operator may set the parameters of the RF signal through the operating components 30, such as the frequency band, phase, power, etc. of the RF signal, so as to generate a variety of RF signals within a certain frequency band, and thus simulate the complex electromagnetic interference scenario of the device under test 200 in the actual environment.

[0039] The test device 100 further includes a door body 32. An opening 34 is provided on one side of the test chamber 20. The door body 32 is rotatably mounted at the opening 34 to open or close the opening 34. When the door body 32 opens the opening 34, the operator can take and place the device under test 200. When the door body 32 is closed, the test can be performed. The door body 32 is used to prevent the radio frequency signal from leaking from the test chamber 20 into the air, thereby improving the safety of the test process.

[0040] The RF module 16 generates a corresponding RF signal according to the set RF signal parameters, and the antenna assembly 14 feeds the RF signal into the test cavity 20 to generate electromagnetic interference to the device under test 200 .

[0041] When radio frequency signals are radiated, they have a certain directionality. If the device under test 200 is fixed in the test chamber 20, the radiation intensity received by different surfaces of the device under test 200 will be different. It is possible that under electromagnetic interference in the current direction, the working state of the device under test 200 is normal, and under electromagnetic interference in another direction, the working state of the device under test 200 is abnormal, which leads to inaccurate test results.

[0042] The rotating assembly 18 can drive the fixed disk 22 to drive the device under test 200 to rotate, so that the angle of the device under test 200 can be adjusted. The device under test 200 is interfered by electromagnetic radiation of basically the same intensity in different directions, so that the device under test 200 can be tested under uniform field strength, ensuring that the field strength acting on different surfaces of the device under test 200 is uniform, thereby improving the accuracy of the test results. Moreover, the test results can also reflect in which direction the surface or component of the device under test 200 does not have the ability to resist electromagnetic interference, thereby allowing the operator to quickly locate the problem point and improve efficiency.

[0043] During the test, the rotating component 18 can control the device under test 200 to rotate at a constant speed for one circle, or it can rotate the device under test 200 to a certain position and then stop, and then radiate the radio frequency signal, obtain the test result of the position, and then rotate the device under test 200 to another position and stop, and then radiate the radio frequency signal, and so on, to complete the test of all test frequency bands.

[0044] In some embodiments, the rotating assembly 18 includes a first rotating assembly 36, the fixed disk 22 includes a first fixed disk 38, the first rotating assembly 36 includes a first motor 40 and a first connecting shaft 42, the first motor 40 is located outside the test chamber 20, the first connecting shaft 42 connects the first fixed disk 38 and the first motor 40, the first fixed disk 38 is arranged in a horizontal direction, and the first motor 40 is used to drive the first connecting shaft 42 to rotate to drive the first fixed disk 38 and the device under test 200 to rotate.

[0045] In this way, the device under test 200 can be driven to rotate in the horizontal direction.

[0046] Specifically, the first motor 40 can be installed outside the bottom plate of the test chamber 12, which can reduce the influence of electromagnetic radiation on the first motor 40. One end of the first connecting shaft 42 is connected to the first motor 40, and the other end is connected to the first fixed plate 38. When the first motor 40 is working, it drives the first connecting shaft 42 to rotate, and then drives the first fixed plate 38 and the device under test 200 to rotate in the horizontal direction.

[0047] Optionally, the first fixing plate 38 is located in the middle of the test cavity 20 in the horizontal direction. When the device under test 200 is placed on the first fixing plate 38 , the device under test 200 is approximately located in the middle of the test cavity 20 (the middle of the vertical direction and the middle of the horizontal direction).

[0048] The first motor 40 includes but is not limited to a brushless DC motor, a stepper motor, etc. The device under test 200 can be fixed on the first fixing plate 38 by fasteners such as bolts, straps, clips, and tapes.

[0049] In some embodiments, the rotating assembly 18 includes a second rotating assembly 44, the fixed disk 22 includes a second fixed disk 46, the second rotating assembly 44 includes a second motor 48 and a second connecting shaft 50, the second motor 48 is located outside the test chamber 20, the second connecting shaft 50 connects the second fixed disk 46 and the second motor 48, the second fixed disk 46 is arranged in a vertical direction, and the second motor 48 is used to drive the second connecting shaft 50 to rotate to drive the second fixed disk 46 and the device under test 200 to rotate.

[0050] In this way, the device under test 200 can be driven to rotate in the vertical direction.

[0051] Specifically, the second motor 48 can be installed outside the side plate (such as the left plate and / or the right plate) of the test chamber 12, which can reduce the influence of electromagnetic radiation on the second motor 48. One end of the second connecting shaft 50 is connected to the second motor 48, and the other end is connected to the second fixed plate 46. When the second motor 48 is working, it drives the second connecting shaft 50 to rotate, thereby driving the second fixed plate 46 and the device under test 200 to rotate in the vertical direction.

[0052] Optionally, when the device under test 200 is placed on the second fixing plate 46 , the device under test 200 is approximately located at a middle position of the test cavity 20 (a middle position in the vertical direction and a middle position in the horizontal direction).

[0053] The second motor 48 includes, but is not limited to, a brushless DC motor, a stepper motor, and the like.

[0054] exist Figure 2 In the embodiment, the testing device 100 includes a first rotating assembly 36 and a second rotating assembly 44, so that more testing requirements can be met.

[0055] In some implementations, the two second fixing plates 46 are used to clamp and fix the device under test 200 , and each second fixing plate 46 is connected to a second connecting shaft 50 .

[0056] In this way, the two second fixing plates 46 can be used to fix the device under test 200, thereby reducing the use of additional components.

[0057] Specifically, in Figure 2 In the figure, two second fixing plates 46 are arranged at intervals in the horizontal direction, and a clamping space 52 is formed between the two second fixing plates 46. The clamping space 52 can clamp and fix the device under test 200, without using an additional fixing structure to fix the device under test 200, thereby reducing the use of additional components and reducing costs.

[0058] Optionally, the second connecting shaft 50 may be a telescopic shaft, and when the device to be tested 200 is not clamped, the two second connecting shafts 50 are relatively long, and the distance between the two second fixing plates 46 is relatively short. When the device to be tested 200 is clamped, the second connecting shaft 50 may be manually or electrically driven to shorten, so that the distance between the two second fixing plates 46 is increased, the clamping space 52 is increased, the device to be tested 200 is placed in the clamping space 52, and then the two second connecting shafts 50 are extended, and the device to be tested 200 is clamped and fixed by the two second fixing plates 46.

[0059] exist Figure 2 In the embodiment, two ends of each second connecting shaft 50 are respectively connected to a second motor 48 and a second fixing plate 46. It is understood that in other embodiments, a single second motor 48 can drive two second connecting shafts 50 to rotate simultaneously.

[0060] In certain embodiments, the fixing plate 22 includes a dielectric fixing plate 22 and / or a conductive fixing plate 22 .

[0061] In this way, the use environment of the device under test 200 can be simulated more realistically.

[0062] Specifically, in one embodiment, the fixing plate 22 includes a first fixing plate 38, and the first fixing plate 38 may be a dielectric fixing plate 22 or a conductive fixing plate 22. When the device under test 200 is applied to a dielectric component, the first fixing plate 38 may be a dielectric fixing plate 22. When the device under test 200 is applied to a conductive component, the first fixing plate 38 may be a conductive fixing plate 22.

[0063] In one embodiment, the fixing plate 22 includes a second fixing plate 46, and the second fixing plate 46 may be a dielectric fixing plate 22 or a conductive fixing plate 22. When the device under test 200 is applied to a dielectric component, the second fixing plate 46 may be a dielectric fixing plate 22. When the device under test 200 is applied to a conductive component, the second fixing plate 46 may be a conductive fixing plate 22.

[0064] In one embodiment, the fixing plate 22 includes a first fixing plate 38 and a second fixing plate 46. The first fixing plate 38 may be a dielectric fixing plate 22 or a conductive fixing plate 22, and the second fixing plate 46 may be a dielectric fixing plate 22 or a conductive fixing plate 22. When the device under test 200 is applied to a dielectric component, the first fixing plate 38 and the second fixing plate 46 may be a dielectric fixing plate 22. When the device under test 200 is applied to a conductive component, the first fixing plate 38 and the second fixing plate 46 may be a conductive fixing plate 22. In one embodiment, the first fixing plate 38 may be a dielectric fixing plate 22, and the second fixing plate 46 may be a conductive fixing plate 22. When the device under test 200 is applied to a dielectric component, the first fixing plate 38 is used to fix the device under test 200. When the device under test 200 is applied to a conductive component, the second fixing plate 46 is used to fix the device under test 200. In one embodiment, the second fixing plate 46 may be a dielectric fixing plate 22, and the first fixing plate 38 may be a conductive fixing plate 22. When the device under test 200 is applied to a dielectric component, the second fixing plate 46 is used to fix the device under test 200. When the device under test 200 is applied to a conductive component, the first fixing plate 38 is used to fix the device under test 200.

[0065] In some embodiments, the test device 100 includes a controller 54 and an operating component 30, the controller 54 is electrically connected to the operating component 30 and the RF module 16, the operating component 30 is used to set the parameters of the RF signal, and the controller 54 is used to obtain the parameters of the RF signal and control the RF module 16 to output the RF signal according to the parameters of the RF signal, and the parameters of the RF signal include at least one of frequency, phase and power.

[0066] In this way, it is convenient for the operator to set the radio frequency signal parameters on the testing device 100 .

[0067] Specifically, the test device 100 includes a control panel 28, and the controller 54 and the operating component 30 can be arranged on the control panel 28. The operating component 30 includes but is not limited to operating components 30 such as buttons and touch screens. The operator can input the parameters of the radio frequency signal through the operating component 30, and the operating component 30 sets the parameters of the radio frequency signal according to the operator's input, for example, setting at least one of the frequency band, phase, and power of the radio frequency signal to generate a variety of radio frequency signals within a certain frequency band range, which can simulate the complex electromagnetic interference scenario of the device under test 200 in the actual environment.

[0068] In one embodiment, the control panel 28 includes a touch screen display 56 that can display input controls and parameters of the RF signal set by the operator.

[0069] The controller 54 is used to obtain the parameters of the RF signal and control the RF module 16 to output the RF signal according to the parameters of the RF signal, so that the output RF signal meets the test requirements.

[0070] The parameters of the radio frequency signal include at least one of frequency, phase and power. In one embodiment, the parameters of the radio frequency signal include frequency, phase or power. In one embodiment, the parameters of the radio frequency signal include any two or three of frequency, phase and power. It is understood that the parameters not set by the operator can be replaced by the test device 100 using default parameters.

[0071] In some embodiments, the test device 100 includes a controller 54 and a communication module 58, the controller 54 is electrically connected to the communication module 58 and the RF module 16, the communication module 58 is used to receive the parameters of the RF signal sent by the preset terminal, the controller 54 is used to obtain the parameters of the RF signal and control the RF module 16 to output the RF signal according to the parameters of the RF signal, and the parameters of the RF signal include at least one of frequency, phase and power.

[0072] In this way, the operator can control the test device 100 to set the RF signal parameters without being at the test site.

[0073] Specifically, the operator can set the parameters of the radio frequency signal without being at the test site. The preset terminal includes but is not limited to cloud servers, mobile phones, tablet computers, personal computers, wearable smart devices and other terminals. Optionally, the preset terminal can be pre-bound to the test device 100. During the test, the controller 54 can use the communication module 58 to receive the control instructions sent by the preset terminal, and the controller 54 parses the control instructions to obtain the parameters of the radio frequency signal. The communication module 58 can communicate with the preset terminal in a wired or wireless manner, which is not specifically limited here. In one embodiment, the communication module 58 includes but is not limited to a WIFI module, a Bluetooth module, a mobile communication module 58, etc.

[0074] The controller 54 is used to control the RF module 16 to output the RF signal according to the parameters of the RF signal, so that the output RF signal meets the test requirements.

[0075] The parameters of the radio frequency signal include at least one of frequency, phase and power. In one embodiment, the parameters of the radio frequency signal include frequency, phase or power. In one embodiment, the parameters of the radio frequency signal include any two or three of frequency, phase and power. It is understood that the parameters not set by the operator can be replaced by the test device 100 using default parameters.

[0076] The test device 100 may also utilize the communication module 58 to send the test result to a preset terminal, so that the preset terminal can manage the multiple devices under test 200 in a unified manner.

[0077] In one embodiment, the communication module 58 is installed on the control panel 28 . It is understood that in other embodiments, the communication module 58 may also be installed at other locations of the test device 100 , and is not limited to being installed on the control panel 28 .

[0078] The test results may include whether the device under test 200 works normally under certain RF signal interference. For example, under RF signal interference of power A1, phase B1 and power C1, in which direction is the working state of the device under test 200 normal and in which direction is abnormal. Under RF signal interference of power A2, phase B2 and power C2, in which direction is the working state of the device under test 200 abnormal and in which direction is normal, etc.

[0079] The direction or position of the device under test 200 can be determined based on the motor of the rotating assembly 18. For example, a reference zero angle can be set, and the direction or position of the device under test 200 can be determined based on the motor angle relative to the reference zero angle.

[0080] During the test, whether the working state of the device under test 200 is normal or abnormal can be determined by collecting images of the device under test 200, collecting sounds emitted by the device under test 200, collecting the temperature of the device under test 200, etc. For example, the image of the device under test 200 can be collected by a camera, and image recognition technology can be used to identify whether the device under test 200 has abnormal phenomena such as screen flickering, screen distortion, or black screen. The sound emitted by the device under test 200 can be collected by a sound sensor to determine whether the device under test 200 has abnormal phenomena such as component cracking. The temperature of the device under test 200 can be collected by a temperature sensor to determine whether the device under test 200 has an abnormal phenomenon of over-temperature.

[0081] In some embodiments, the test device 100 includes an electrical chamber 60 and a heat dissipation assembly 62 . The electrical chamber 60 is located outside the test cavity 20 . The heat dissipation assembly 62 and the RF module 16 are located inside the electrical chamber 60 . The heat dissipation assembly 62 is used to dissipate heat for the RF module 16 .

[0082] In this way, it is possible to avoid the temperature of the RF module 16 increasing and thus reducing the accuracy of the RF module 16 in adjusting the RF signal.

[0083] Specifically, the RF module 16 needs to output RF signals when it is working, and its temperature rises quickly. When the temperature of the RF module 16 is high, the internal components of the RF module 16 are affected by the high temperature, and the accuracy of regulating the RF signal will be reduced. By setting the heat dissipation component 62, when the RF module 16 is working, the heat dissipation component 62 can be started to dissipate heat for the RF module 16, thereby ensuring the accuracy of regulating the RF signal by the RF module 16. At the same time, it can also prevent the components of the RF module 16 from aging too quickly due to excessive temperature, thereby reducing its failure rate and extending the service life of the RF module 16.

[0084] In one embodiment, the heat dissipation component 62 can use liquid cooling to dissipate heat from the RF module 16. In one embodiment, the heat dissipation component 62 can use air cooling to dissipate heat from the RF module 16. In one embodiment, the heat dissipation component 62 can use liquid cooling and air cooling to dissipate heat from the RF module 16.

[0085] The antenna assembly 14 may also be at least partially disposed in the electrical chamber 60, and the heat dissipation assembly 62 may also dissipate heat for the antenna assembly 14. It is understandable that the heat dissipation assembly 62 may dissipate heat for other components in the electrical chamber 60 in addition to dissipating heat for the RF module 16 and the antenna assembly 14.

[0086] In some embodiments, the heat dissipation assembly 62 includes an air guide 64 and a heat dissipation fan 66 . The air guide 64 covers the RF module 16 . The air guide 64 is provided with an air inlet 68 and an air outlet 70 . The air inlet 68 is arranged corresponding to the heat dissipation fan 66 .

[0087] In this way, the heat dissipation component 62 can dissipate the heat of the RF module 16 by air cooling.

[0088] Specifically, the heat dissipation fan 66 can provide wind when working. The wind blown by the heat dissipation fan 66 enters the interior of the air guide 64, and can take away the heat of the RF module 16 to cool it down. The air inlet 68 of the air guide 64 is correspondingly arranged with the heat dissipation fan 66 so that the heat dissipation fan 66 can send the generated wind into the air guide 64. After the wind takes away the heat of the RF module 16, it can be discharged from the air outlet 70 of the air guide 64, thereby reducing the temperature of the RF module 16 and the electrical room 60.

[0089] exist Figure 1 In the figure, the air guide 64 includes an air inlet end 72 and an air outlet end 74. The air inlet end 72 is provided with an air inlet 68, and the air outlet end 74 is provided with an air outlet 70. The area of ​​the air inlet 68 is larger than the area of ​​the air outlet 70. Along the direction from the air inlet end 72 to the air outlet end 74, the internal flow channel of the air guide 64 is in a gradually contracting shape, so that the wind can be accelerated in the air guide 64, so as to speed up the removal of the heat of the RF module 16 and improve the heat dissipation efficiency.

[0090] In some embodiments, the testing device 100 further includes a power supply module 76 , which is electrically connected to the RF module 16 , the heat dissipation fan 66 , and the rotating assembly 18 . The power supply module 76 is located above the air guide 64 and is thermally connected to the air guide 64 .

[0091] In this way, the power supply module 76 can be cooled to ensure that the power supply module 76 operates within a normal temperature range.

[0092] Specifically, the power supply module 76 can be connected to the air guide 64 via thermal conductive adhesive. The power supply module 76 can transfer heat to the air guide 64 via the thermal conductive adhesive. The heat is dissipated from the surface of the air guide 64 and the wind in the internal flow channel of the air guide 64 is used to take the heat away, thereby improving the heat dissipation efficiency of the power supply module 76.

[0093] The power supply module 76 is electrically connected to various components and parts of the test device 100, including but not limited to the RF module 16, the control panel 28, the heat dissipation component 62, the rotating component 18, etc. A socket is also provided in the test cavity 20, and the power supply module 76 can also be electrically connected to the socket in the test cavity 20, and the power plug of the device under test 200 can be inserted into the socket, so that the power supply module 76 provides the device under test 200 with the power (DC and / or AC) required for operation, so that the device under test 200 can work, so that the anti-electromagnetic interference capability of the device under test 200 can be tested.

[0094] When testing the device 200 under test, 1. the RF module 16 can configure the RF signal at the first frequency point within the set test frequency band according to the information fed back by the control panel 28 (such as the parameters of the RF signal);

[0095] 2. Combined with the pre-built-in program setting of the test device 100, the RF signal is given to a group of antennas 24 and is set to a specific phase assignment. The RF signal can also be given to multiple groups of antennas 24 in sequence, each group of antennas 24 has its corresponding phase assignment, and the same group of antennas 24 can be given multiple groups of corresponding phase assignments, so that the RF signal is radiated into the test cavity 20;

[0096] 3. The RF module 16 may switch to the next frequency point and continue the operation in step 2 until all frequency points in the test frequency band are used for testing.

[0097] In summary, compared with the large systems such as microwave darkroom and TEM cell used in the related art, the test device 100 of the embodiment of the present invention has a simple structure and miniaturization, which greatly reduces the system cost. Moreover, the whole set of test equipment 100 is easy to move and occupies a small space, and can test the EMS performance of the device under test 200 by simulating a complex electromagnetic interference environment.

[0098] The test chamber 20 can be made to have different volume sizes to adapt to different test scenarios. In some examples, the volume of the test chamber 20 is 35L (liters), 70L or 150L, ​​which can be used to place devices 200 of different sizes, expand the range of test objects of the test equipment 100100, and is also easy to carry. The outer dimensions of the 70L test equipment 100 can be 600mm*600mm*570mm. However, the present design is not limited to this. In other embodiments, the volume of the test chamber 20 can also be configured to other values, which is not limited to this. Further optionally, the spatial dimensions of the test chamber 20 can be 350mm*340mm*320mm, or 480mm*420mm*360mm, or 650mm*600*400mm, which can be used to place devices 200 of different sizes. However, the present design is not limited to this. In other embodiments, the spatial dimensions of the test chamber 20 can also be customized to meet different test requirements, which is not specifically limited.

[0099] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiments or examples are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0100] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A test device for testing the anti-electromagnetic interference capability of a device under test, characterized in that: The test equipment includes: A test cavity, wherein a test cavity is provided in the test cavity, and the test cavity is used to accommodate the device to be tested; Antenna assembly; A radio frequency module, the radio frequency module is electrically connected to the antenna assembly, the radio frequency module is used to output a radio frequency signal, and the antenna assembly is used to feed the radio frequency signal into the test cavity; The rotating assembly includes a fixed disk located in the test cavity, the fixed disk is used to fix the device under test, and the rotating assembly is used to drive the fixed disk to drive the device under test to rotate in the test cavity.

2. The test device according to claim 1, characterized in that The rotating assembly includes a first rotating assembly, the fixed disk includes a first fixed disk, the first rotating assembly includes a first motor and a first connecting shaft, the first motor is located outside the test chamber, the first connecting shaft connects the first fixed disk and the first motor, the first fixed disk is arranged in a horizontal direction, and the first motor is used to drive the first connecting shaft to rotate to drive the first fixed disk and the device under test to rotate.

3. The testing device according to claim 1, characterized in that The rotating assembly includes a second rotating assembly, the fixed disk includes a second fixed disk, the second rotating assembly includes a second motor and a second connecting shaft, the second motor is located outside the test chamber, the second connecting shaft connects the second fixed disk and the second motor, the second fixed disk is arranged in a vertical direction, and the second motor is used to drive the second connecting shaft to rotate to drive the second fixed disk and the device under test to rotate.

4. The testing device according to claim 3, characterized in that The two second fixing plates are used to clamp and fix the device under test, and each of the second fixing plates is connected to a second connecting shaft.

5. The testing device according to claim 1, characterized in that The fixing plate includes a dielectric fixing plate and / or a conductive fixing plate.

6. The testing device according to claim 1, characterized in that The test device includes a controller and an operating component, the controller is electrically connected to the operating component and the RF module, the operating component is used to set the parameters of the RF signal, and the controller is used to obtain the parameters of the RF signal and control the RF module to output the RF signal according to the parameters of the RF signal, and the parameters of the RF signal include at least one of frequency, phase and power.

7. The testing device according to claim 1, characterized in that The test device includes a controller and a communication module, the controller is electrically connected to the communication module and the RF module, the communication module is used to receive parameters of the RF signal sent by a preset terminal, and the controller is used to obtain the parameters of the RF signal and control the RF module to output the RF signal according to the parameters of the RF signal, and the parameters of the RF signal include at least one of frequency, phase and power.

8. The testing device according to claim 1, characterized in that The test equipment comprises an electrical room and a heat dissipation assembly, wherein the electrical room is located outside the test cavity, the heat dissipation assembly and the radio frequency module are located in the electrical room, and the heat dissipation assembly is used for dissipating heat for the radio frequency module.

9. The testing device according to claim 8, characterized in that The heat dissipation component includes an air guide and a heat dissipation fan. The air guide covers the radio frequency module. The air guide is provided with an air inlet and an air outlet. The air inlet is arranged corresponding to the heat dissipation fan.

10. The testing device according to claim 9, characterized in that The testing device also includes a power supply module, which is electrically connected to the RF module, the heat dissipation fan and the rotating assembly. The power supply module is located above the air guide and is thermally connected to the air guide.

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