Method for calibrating zero position of inertial navigation and optical axis in photoelectric platform

Abstract

The invention relates to the technical field of inertial measurement, in particular to a method for calibrating zero positions of inertial navigation and an optical axis in a photoelectric platform, which comprises the following steps of: S1, vertically mounting a leaning surface in the course direction of the inertial navigation; and S2, performing three-axis calibration on inertial navigation. And S3, attaching the first reflecting mirror to the mounting leaning surface. S4, a theodolite is placed in front of the first reflector, and emergent light of the theodolite coincides with reflected light of the theodolite. And S5, attaching a second reflecting mirror to the inertial navigation mounting leaning surface of the photoelectric platform. S6, the second reflecting mirror can be perpendicular to the optical axis of the theodolite. And S7, aligning the imaging center of the optical system with emergent light of the theodolite. And S8, installing the inertial navigation inside the photoelectric platform, wherein the inertial navigation is consistent with the position and the direction of the inertial navigation on the inertial navigation calibration zero position tool during calibration. The calibration tool has the advantages that the boss and the mounting leaning surface of the boss are additionally arranged on the hexahedron tool, the axial direction determined when inertial navigation is calibrated is associated with an optical system of a photoelectric platform through the reflection effect of the reflecting mirror, and therefore calibration is completed.

Description

Technical Field

[0001] The invention relates to the technical field of inertial measurement, and in particular to a method for calibrating an inertial guide and an optical axis zero position in an optoelectronic platform. Background Art

[0002] In the field of high-precision aerial remote sensing mapping and reconnaissance, installing an inertial navigation system inside the optoelectronic platform can effectively avoid the transmission error between the shock absorber and the aircraft inertial navigation system caused by the deformation of the shock absorber, provide the optical system with higher-precision navigation information, and effectively improve the observation accuracy of the optical imaging system.

[0003] At present, in actual use, inertial navigation can output navigation information after alignment is completed. However, if a high-precision output is to be maintained, it is necessary to enter the combined navigation state. The inertial navigation carrier needs to be in motion and needs to generate linear motion to change the position. Then, based on the satellite navigation information, the accumulated error of pure inertial solution is eliminated. Otherwise, it is easy to drift after a period of time and deviate from the true value, especially the heading angle drift is more serious. The calibration of the optical system usually needs to be completed in the laboratory through high-precision optical detection equipment, and a high level of static conditions needs to be maintained. On the other hand, the data output by the inertial navigation are all abstract and conceptual regulations. For example, the attitude angle is the angle relative to the horizontal plane, and the heading angle is the angle between the forward axis of the inertial navigation and the north direction in the geographic coordinates. The measurement of the north is more abstract and cumbersome, and it is difficult to directly connect with the optical system.

[0004] Therefore, in actual use, if the inertial navigation output information is directly used for calibration with the optical system, the effect of improving the measurement accuracy in actual use will be limited; and the calibration and alignment of the inertial navigation and optical system belongs to the category of cross-industry fields, there are few related studies, and the theoretical feasibility is not high. Summary of the invention

[0005] In view of this, the invention aims to provide a method for calibrating the zero position of the inertial navigation and the optical axis in the optoelectronic platform, and the geometric relationship is materialized by the inertial navigation calibration zero position tooling, combined with a reflector and an autocollimation theodolite. At the same time, the mounting surface in the optoelectronic platform is used to realize the calibration of the zero position of the inertial navigation and the optical axis.

[0006] To achieve the above-mentioned purpose, the technical solution created by the present invention is implemented as follows: a method for calibrating the zero position of the inertial navigation system and the optical axis in the optoelectronic platform, based on the inertial navigation calibration zero position tooling, so that the inertial navigation system and the optical system are associated with each other, and the inertial navigation calibration zero position tooling includes: a hexahedron tooling and a boss, the boss is arranged on the hexahedron tooling, and the side of the boss facing the heading of the inertial navigation system is used as the mounting surface; the method for calibrating the zero position of the inertial navigation system and the optical axis in the optoelectronic platform includes the following steps: S1.Align the heading direction of the inertial navigation system vertically with the mounting surface of the boss, ensure that the mounting surface of the inertial navigation system fits the mounting surface of the boss, and fasten the inertial navigation system to the inertial navigation system zero position calibration fixture.

[0007] S2. Use the inertial navigation calibration zero position tool to calibrate the pitch axis, heading axis and roll axis of the inertial navigation.

[0008] S3. Remove the inertial navigation system and attach the first reflector to the mounting surface of the boss.

[0009] S4. Place a theodolite at a preset position in front of the first reflector, and ensure that the optical axis of the theodolite is perpendicular to the mirror surface of the first reflector; adjust the theodolite so that the emitted light of the theodolite coincides with the reflected light.

[0010] S5. Place the optoelectronic platform between the first reflector and the theodolite, and attach the second reflector to the inertial navigation mounting surface of the optoelectronic platform.

[0011] S6. Adjust the axis system of the optoelectronic platform so that the second reflector can be perpendicular to the optical axis of the theodolite. At this time, the forward axis of the inertial navigation in the calibration phase is the direction of the optical axis.

[0012] S7. Ensure that the base of the optoelectronic platform remains stationary, rotate the axis system of the optoelectronic platform, align the imaging center of the optical system of the optoelectronic platform with the outgoing light of the theodolite, and complete the alignment of the optical axis of the optical system with the optical axis of the theodolite; at this time, set the angle of the optoelectronic platform to zero position, thereby completing the zero position alignment and calibration of the optical system and the inertial navigation.

[0013] S8. Install the inertial navigation system inside the optoelectronic platform so that the inertial navigation system fits against the inertial navigation system installation surface of the optoelectronic platform to ensure that the installation position and direction of the inertial navigation system on the optoelectronic platform are consistent with the position and direction of the inertial navigation system calibrated in step S2.

[0014] Furthermore, the height of the boss is greater than or equal to a first preset height.

[0015] Furthermore, the first preset height is 5 mm.

[0016] Furthermore, the verticality between the mounting surface of the boss and the surface of the inertial navigation calibration zero position tooling mounting boss is smaller than a first preset angle.

[0017] Furthermore, the first preset angle is 30″.

[0018] Furthermore, the parallelism between the mounting surface of the boss and a surface in the inertial navigation calibration zero position tooling that is parallel to the mounting surface is less than a first preset value.

[0019] Furthermore, the first preset value is 0.015 mm.

[0020] Furthermore, the optoelectronic platform is an optoelectronic stabilized platform or an optoelectronic pod or an optoelectronic turret or a gimbal.

[0021] Furthermore, the theodolite includes an emitting light tube and a lens tube for observing incident light.

[0022] Compared with the prior art, the invention can achieve the following beneficial effects: by adding a boss and its mounting surface to the hexahedral tooling, the axial direction determined by the inertial navigation during calibration is presented in the specific form of a mechanical mounting surface, so that the abstract concept originally defined by humans is visualized in a form visible to the naked eye. When the optical system is installed inside the spacecraft, there will also be installation errors. Through the reflection effect of the reflector, it is associated with the optical system of the optoelectronic platform, thereby completing the calibration. The method is simple to operate and easy to implement. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] The drawings constituting part of the present invention are used to provide a further understanding of the present invention. The exemplary embodiments and descriptions of the present invention are used to explain the present invention and do not constitute an improper limitation on the present invention. In the drawings: Figure 1 It is a structural schematic diagram of the installation of an inertial navigation system and an inertial navigation system calibration zero position tooling provided according to an embodiment of the present invention; Figure 2 It is a structural schematic diagram of the installation of a reflector and an inertial navigation calibration zero position tooling provided in an embodiment of the present invention; Figure 3 is a schematic structural diagram of a self-collimating theodolite provided by an embodiment of the present invention and a mirror surface of a reflector being perpendicular; Figure 4 It is a schematic structural diagram of an optical system of an optoelectronic stabilization platform provided according to an embodiment of the present invention being aligned with a self-collimating theodolite.

[0024] The reference numerals include: 1. hexahedral tooling; 2. boss; 3. mounting surface; 4. inertial navigation; 5. first reflector; 6. autocollimation theodolite; 7. optoelectronic platform; 8. optical system. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical solution and advantages of the invention more clear, the invention is further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described here are only used to explain the invention and do not constitute a limitation of the invention.

[0026] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments may be combined with each other.

[0027] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, the terms "first", "second", etc. are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, features defined as "first", "second", etc. may explicitly or implicitly include one or more of the features. In the description of the present invention, unless otherwise specified, "multiple" means two or more.

[0028] In the description of the invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the invention can be understood according to specific circumstances.

[0029] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments.

[0030] An embodiment of the present invention provides a method for calibrating the zero position of an inertial navigation system and an optical axis in an optoelectronic platform. The inertial navigation system calibration is completed by an inertial navigation system calibration zero position tooling, and the inertial navigation system mounting surface inside the optoelectronic platform 7 is used to associate the calibrated zero position of the inertial navigation system 4 with the optical system 8 of the optoelectronic platform 7 through a first reflector 5, a second reflector and an autocollimation theodolite 6, thereby realizing the calibration of the inertial navigation system 4 and the zero position of the optical axis.

[0031] like Figure 1 As shown, the inertial navigation calibration zero position tooling includes: a hexahedral tooling 1 and a boss 2, and the boss 2 is arranged on the hexahedral tooling 1. The hexahedral tooling 1 and the boss 2 are integrally formed.

[0032] When calibrating the inertial navigation system 4, the inertial navigation system 4 is placed on the hexahedral fixture 1 and adjusted according to the heading of the inertial navigation system 4 so that the boss 2 is perpendicular to the heading of the inertial navigation system 4. Figure 1The arrow on the upper surface of the inertial navigation system 4 is the heading of the inertial navigation system 4). The side of the boss 2 facing the heading of the inertial navigation system 4 serves as the mounting surface 3. The height of the boss 2 is greater than or equal to the first preset height. The verticality between the mounting surface 3 of the boss 2 and the surface used to mount the boss 2 in the inertial navigation zero position calibration tooling is less than the first preset angle. The parallelism error between the mounting surface 3 of the boss 2 and the surface parallel to the mounting surface 3 in the inertial navigation zero position calibration tooling is less than the first preset value.

[0033] In the production process of the high-precision inertial navigation device itself, calibration is mainly divided into measurement accuracy calibration, temperature drift calibration and axis system orthogonality calibration, among which the axis system orthogonality calibration is mainly fixed to a rigid hexahedron fixture 1, the six faces of the fixture have high surface flatness, and each edge is orthogonal to each other. Through the rotation process on the rotating table, the angle between the plane perpendicular to the current rotation axis of the inertial navigation and the horizontal plane is measured, and then the corresponding rotation plane of the plane is corrected to ensure that it is a horizontal plane. The gyroscope in this direction inside uses this plane as a reference when sensing rotation.

[0034] Because during the calibration process, the inertial navigation system 4 and the hexahedral fixture 1 are installed through two-dimensional surface contact, which can only limit the two directions of relative movement between the inertial navigation system 4 and the calibration fixture. For the inertial navigation system 4 with a three-axis gyroscope inside, there is still a lack of limitation in the third dimension, that is, the inertial navigation system 4 can have a certain degree of horizontal rotation relative to the calibration fixture during the installation on the calibration fixture. Even if it is corrected during the calibration process, after the calibration is completed, during the actual use process of installing it inside the optoelectronic platform 7, it is still easy to produce installation errors of rotation within the contact surface, resulting in poor accuracy in subsequent use.

[0035] Although the mounting surface 3 can be designed on the inertial navigation system 4 in production, if the calibration tooling still uses the traditional tooling, even if the tooling is installed on the calibration turntable or platform with the mounting surface, the mounting surface actually does not play a big role, and the parallel relationship between the axis of the inertial navigation system 4 and the tooling in this direction cannot be guaranteed. In the calibration process, the axis of the tooling is actually corrected, so there is still an error in orthogonality of the inertial navigation system 4. On the other hand, the installation and adjustment of the inertial navigation system 4 (including calibration) and the optical system 8 are usually carried out independently. After the optical system 8 and the inertial navigation system 4 are loaded together in the optoelectronic platform 7, since the installation position, installation reference surface and installation method of the optical system 8 are usually different from those of the inertial navigation system 4, there will also be installation errors between the optical system 8 and the inertial navigation system 4. It is difficult to eliminate the installation errors, especially the error between the heading zero position of the inertial navigation system 4 (i.e. the direction of the forward axis of the inertial navigation system 4) and the azimuth zero position of the optical axis.

[0036] In order to solve the above problems, the present invention provides a method for calibrating the zero position of the inertial navigation system and the optical axis in an optoelectronic platform.

[0037] The present invention defines the direction in which the X-axis extends as the forward axis of the inertial navigation system 4. Since the clockwise angle between the inertial navigation system 4 and the true north in the horizontal plane is the heading angle, the forward axis is also called the heading axis. The method for calibrating the zero position of the inertial navigation system 4 and the optical axis in the optoelectronic platform 7 comprises the following steps: S1. Align the heading direction of the inertial navigation system 4 vertically with the mounting surface 3 of the boss 2, ensure that the mounting surface of the inertial navigation system 4 fits the mounting surface 3 of the boss 2, and fasten the inertial navigation system 4 to the inertial navigation system zero position calibration fixture. Figure 1 shown.

[0038] INS-4 is the abbreviation of Inertial Navigation System, an autonomous navigation system that does not rely on external information and does not radiate energy to the outside.

[0039] The inertial navigation system 4 may also be an inertial measurement unit, and its working principle includes a combination of a micro-electromechanical system (MEMS), optical fiber or laser gyroscope and an accelerometer. The circuit for realizing the solution function may be separated from the inertial measurement unit, that is, the inertial navigation system 4 may also be the measurement part of a split inertial navigation system.

[0040] The inertial navigation system 4 includes three gyroscopes and three accelerometers, namely, a heading gyroscope, a pitch gyroscope, and a roll gyroscope, and corresponding heading accelerometers, pitch accelerometers, and roll accelerometers. The planes measured by the heading gyroscope, the pitch gyroscope, and the roll gyroscope are orthogonal to each other, and the accelerometers in the three directions are also orthogonal to each other.

[0041] S2. Use the inertial navigation calibration zero position fixture to calibrate the pitch axis, heading axis and roll axis of the inertial navigation 4. After the calibration is completed, the verticality and parallelism between the pointing direction of each axis (pitch axis, heading axis and roll axis) of the inertial navigation 4 and the inertial navigation calibration zero position fixture have reached a high accuracy. At the same time, the pitch angle and roll angle of the inertial navigation 4 are both in a horizontal state, ensuring the accuracy of the calibration.

[0042] The calibration steps are as follows: S21. Obtain the gyro angular rate on each axis when the inertial navigation system 4 rotates along the three orthogonal axes of the inertial navigation calibration zero position fixture. In order to obtain the gyro angular rate corresponding to each axis when the inertial navigation system 4 rotates along the three orthogonal axes (pitch axis, heading axis and roll axis) of the inertial navigation calibration zero position fixture, we directly collect the output data of the gyro and average the data on each axis.

[0043] S22. Based on the gyro angular rate and environmental parameters, the coupling error coefficient and scaling factor of the gyro on each axis are calculated to calculate the orthogonality error, wherein the environmental parameters include the earth's rotation angular rate and the geographic latitude in the current calibration environment.

[0044] S23. Obtain the position measurement values ​​of the gyro outputs on each axis and the accelerometer outputs on each axis corresponding to the inertial navigation system 4 at the preset rotation position of the inertial navigation system calibration zero position tooling.

[0045] Transposition refers to the process of flipping the hexahedron so that the three orthogonal axes of the inertial navigation system 4 are placed in different positions on the platform in different directions during position calibration. Preset transposition refers to the presetting of the position formed by flipping the hexahedron. Position measurement refers to the output value of the gyroscope and accelerometer on each axis after the hexahedron is placed on the platform and left to stand.

[0046] S24. Based on the angular velocity measurement value output by the gyro, combined with the known coupling error coefficient (used to describe the mutual influence between different axes) and the scale factor (used to convert the gyro output signal into the actual angular velocity value), and considering other factors that may affect the zero deviation (such as temperature, vibration, etc.), the zero deviation of the gyroscope on each axis is obtained.

[0047] S25. Calculate the coupling error coefficient, scale factor and zero position deviation of the accelerometer on each axis based on the position measurement value output by the accelerometer.

[0048] S3. Remove the inertial navigation system 4 and fit the first reflector 5 tightly onto the mounting surface 3 of the boss 2. Figure 2 shown.

[0049] S4. Place an autocollimation theodolite 6 at a preset position in front of the first reflector 5, ensure that the autocollimation theodolite 6 is perpendicular to the mirror surface of the first reflector 5, and adjust the autocollimation theodolite 6 so that the emitted light of the autocollimation theodolite 6 coincides with the reflected light (i.e., adjust the autocollimation theodolite 6 so that the light it emits returns along the original path after passing through the first reflector 5). This step can make the forward axis of the inertial navigation system 4 in the calibration phase consistent with the optical axis of the autocollimation theodolite 6. Figure 3 shown.

[0050] In this embodiment, the autocollimation theodolite 6 is placed at a preset position in front of the first reflector 5 . In other embodiments, a light pipe may also be placed at a preset position in front of the first reflector 5 .

[0051] S5. Place the optoelectronic platform 7 between the first reflector 5 and the autocollimation theodolite 6, and fit the second reflector tightly against the inertial navigation mounting surface of the optoelectronic platform 7. Figure 4 shown.

[0052] A convex block is provided inside the photoelectric platform 7, and the surface of the convex block on which the inertial navigation system 4 is mounted is defined as the inertial navigation system mounting support surface.

[0053] S6. Adjust the axis system of the optoelectronic platform 7 so that the second reflector is perpendicular to the optical axis of the autocollimation theodolite 6. At this time, the forward axis of the inertial navigation system 4 in the calibration stage is the direction of the optical axis. However, due to factors such as installation and adjustment, the optical axis of the optical system 8 of the optoelectronic platform 7 and the optical axis of the autocollimation theodolite 6 usually cannot coincide or align at this time. Record the angle value (α, β, γ) output by the optoelectronic platform 7 at this time.

[0054] S7. Ensure that the base of the optoelectronic platform 7 does not move, rotate the axis system of the optoelectronic platform 7, align the imaging center of the optical system 8 of the optoelectronic platform 7 with the outgoing light of the autocollimation theodolite 6, and complete the alignment of the optical axis of the optical system 8 with the optical axis of the autocollimation theodolite 6. At this time, set the angle of the optoelectronic platform 7 to zero position, thereby completing the alignment and calibration of the zero position of the optical system 8 and the inertial navigation system 4. The angle value (α, β, γ) is the error angle between the optical system 8 and the inertial navigation system 4, which can be substituted into the calculation in the subsequent observation process.

[0055] The axis system of the optoelectronic platform 7 usually includes a pitch axis, a yaw axis and a roll axis. However, some optoelectronic platforms 7 have two axis systems, including only a pitch axis and a yaw axis.

[0056] The above error angle is calculated based on the machine system or geographic system. Another error calibration method can be based on the base system of the optoelectronic platform. In this case, the axis system of the optoelectronic platform 7 can be called the pitch axis, azimuth axis and roll axis. For a two-axis optoelectronic platform, there are only the pitch axis and azimuth axis. Only the rotation of the azimuth axis and the pitch axis can be calibrated, that is, only the angle value (α, β) is recorded as the error.

[0057] S8. Install the inertial navigation system 4 inside the optoelectronic platform 7 according to actual use requirements. During installation, ensure that the inertial navigation system 4 fits onto the inertial navigation installation surface inside the optoelectronic platform 7 and fixes it to ensure that the installation position and direction of the inertial navigation system 4 on the optoelectronic platform 7 are consistent with the position and direction when calibrated on the inertial navigation zero position tooling.

[0058] Furthermore, the first preset height is 5 mm.

[0059] Furthermore, the first preset angle is 30″.

[0060] Furthermore, the first preset value is 0.015 mm.

[0061] Furthermore, the optoelectronic platform 7 includes one or more of an optoelectronic stabilized platform, an optoelectronic pod, an optoelectronic turret and a gimbal.

[0062] Furthermore, the autocollimation theodolite 6 includes an emitting light tube and a lens tube for observing incident light.

[0063] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A method for calibrating the zero position of an inertial navigation system and an optical axis in an optoelectronic platform, based on an inertial navigation system calibration zero position tooling, so that the inertial navigation system and the optical system are associated, and the inertial navigation system calibration zero position tooling includes: A hexahedral tooling and a boss, wherein the boss is arranged on the hexahedral tooling, and a side of the boss facing the heading of the inertial navigation is used as a mounting surface; characterized in that the method for calibrating the zero position of the inertial navigation and the optical axis in the optoelectronic platform comprises the following steps: S1. Align the heading direction of the inertial navigation vertically with the mounting surface of the boss, ensure that the mounting surface of the inertial navigation fits the mounting surface of the boss, and fasten the inertial navigation to the inertial navigation zero position calibration tooling; S2. Calibrate the pitch axis, heading axis and roll axis of the inertial navigation system by using the inertial navigation zero position calibration tool; S3. Remove the inertial navigation system and attach the first reflector to the mounting surface of the boss; S4. placing a theodolite at a preset position in front of the first reflector, ensuring that the optical axis of the theodolite is perpendicular to the mirror surface of the first reflector; adjusting the theodolite so that the emitted light of the theodolite coincides with the reflected light; S5. placing the optoelectronic platform between the first reflector and the theodolite, and fitting the second reflector on the inertial navigation mounting surface of the optoelectronic platform; S6. Adjust the axis system of the optoelectronic platform so that the second reflector can be perpendicular to the optical axis of the theodolite. At this time, the forward axis of the inertial navigation in the calibration stage is the direction of the optical axis; S7. Ensure that the base of the optoelectronic platform is stationary, rotate the axis system of the optoelectronic platform, make the imaging center of the optical system of the optoelectronic platform face the outgoing light of the theodolite, and complete the alignment of the optical axis of the optical system with the optical axis of the theodolite; at this time, set the angle of the optoelectronic platform to zero position, thereby completing the zero position alignment and calibration of the optical system and the inertial navigation; S8. Install the inertial navigation system inside the optoelectronic platform so that the inertial navigation system fits against the inertial navigation system installation surface of the optoelectronic platform to ensure that the installation position and direction of the inertial navigation system on the optoelectronic platform are consistent with the position and direction of the inertial navigation system calibrated in step S2.

2. The method for calibrating the inertial navigation and optical axis zero position of an optoelectronic platform according to claim 1, characterized in that: The height of the boss is greater than or equal to a first preset height.

3. The method for calibrating the inertial navigation and optical axis zero position of the optoelectronic platform according to claim 2, characterized in that: The first preset height is 5 mm.

4. The method for calibrating the inertial navigation and optical axis zero position of an optoelectronic platform according to claim 1, characterized in that: The verticality between the mounting surface of the boss and the surface of the inertial navigation calibration zero position tooling on which the boss is mounted is less than a first preset angle.

5. The method for calibrating the inertial navigation and the optical axis zero position of the optoelectronic platform according to claim 4, characterized in that: The first preset angle is 30″.

6. The method for calibrating the inertial navigation and the optical axis zero position of the optoelectronic platform according to claim 4, characterized in that: The parallelism between the mounting surface of the boss and a surface in the inertial navigation calibration zero position tooling that is parallel to the mounting surface is less than a first preset value.

7. The method for calibrating the inertial navigation system and the optical axis zero position in an optoelectronic platform according to claim 6, characterized in that: The first preset value is 0.015 mm.

8. The method for calibrating the inertial navigation and optical axis zero position of an optoelectronic platform according to claim 1, characterized in that: The optoelectronic platform is an optoelectronic stabilized platform or an optoelectronic pod or an optoelectronic turret or a pan / tilt platform.

9. The method for calibrating the inertial navigation and optical axis zero position of an optoelectronic platform according to claim 1, characterized in that: The theodolite comprises an emitting light tube and a lens tube for observing incident light.

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