A signal processor testing device

Abstract

The present invention relates to the field of product testing, and in particular to a signal processor testing device, which realizes comprehensive testing of products and improves the accuracy and efficiency of comprehensive testing. The scheme includes a measurement and control unit, a clock generating unit, a communication interface testing unit, a high-speed AD testing unit, a DDS waveform testing unit, a strobe testing unit, a bit instruction testing unit and an interface unit, wherein the communication interface testing unit, the high-speed AD testing unit, the DDS waveform testing unit, the strobe testing unit and the bit instruction testing unit are connected between the measurement and control unit and the interface unit, the clock generating unit is connected to the interface unit, and the interface unit is connected to the product to be tested. The measurement and control unit is used to receive MES tasks, control test software and test instruments to test the product to be tested, complete the collection and uploading of test data, and burn and debug DSP or FPGA software on the product to be tested. The present invention is suitable for comprehensive product testing.

Description

Technical Field

[0001] The invention relates to the field of product testing, and in particular to a signal processor testing device. Background Art

[0002] Existing test devices have basically realized automated testing of products, such as communication interface, pulse signal frequency, high-speed AD&DA automated testing, control instruction testing, etc. Compared with manual testing, automated testing improves the accuracy and efficiency of product testing.

[0003] For example, a pulse signal frequency measuring device disclosed in CN109490624A includes: an A / D unit, namely an ADC (Analog-to-Digital Converter), a signal processing unit and an interface unit. The A / D sampling unit conditions the input intermediate frequency pulse signal and sends it to the signal processing unit for demodulation processing; the signal processing unit includes a microprocessing module, an operation processing module, a frequency conversion control module, a data transmission module and a monitoring module, which are respectively used to calculate the pulse frequency, pulse repetition frequency, pulse width information and the external frequency hopping source frequency output value of the intermediate frequency pulse signal, and send them to the interface unit; the interface unit sends the calculation result input by the signal processing unit to the display control unit of the external host computer for use. The accuracy of the pulse frequency test is improved.

[0004] For example, a position control instruction converter test bench disclosed in CN201754168U includes a host data processing computer,

[0005] Decision control computer, function expansion circuit board, power supply and distribution system, the upper data processing computer is composed of a general-purpose computer, the decision control computer adopts a linear pipeline array architecture based on FPGA (Field Programmable Gate Array) + DSP (Digital Signal Processor), the upper data processing computer and the decision control computer are connected through a USB2.0 interface; the decision control computer and the function expansion circuit board are connected through an IO interface, the function expansion circuit board includes control signal input, multi-channel instruction signal output, code synchronization, frame synchronization signal output and group signal input, and the program-controlled power output in the power supply and distribution system is controlled according to the control signal of the decision control computer. The test bench can automatically, quickly and efficiently detect the position-controlled instruction converter.

[0006] However, most of the current testing devices can only test one aspect of the product, and their adaptability and comprehensive testing capabilities are insufficient. When a multifunctional comprehensive test is required on a product, multiple different testing devices are required, and the accuracy and efficiency of the comprehensive test are not high. Summary of the invention

[0007] The purpose of the present invention is to overcome the shortcomings of the prior art and provide a signal processor testing device, which realizes comprehensive testing of products and improves the accuracy and efficiency of the comprehensive testing.

[0008] The present invention adopts the following technical scheme to achieve the above-mentioned purpose. The present invention provides a signal processor test device, including a measurement and control unit, a clock generating unit, a communication interface test unit, a high-speed AD test unit, a DDS waveform test unit, a strobe pulse test unit, a bit instruction test unit and an interface unit. The communication interface test unit, the high-speed AD test unit, the DDS (Direct Digital Synthesis) waveform test unit, the strobe pulse test unit and the bit instruction test unit are connected between the measurement and control unit and the interface unit, the clock generating unit is connected to the interface unit, and the interface unit is connected to a product to be tested.

[0009] Furthermore, the measurement and control unit is used to receive MES (Manufacturing Execution System) tasks, control the test software and test instruments to test the product to be tested, complete the collection and upload of test data, and burn and debug the DSP or FPGA software of the product to be tested.

[0010] Furthermore, the clock generating unit provides a sampling clock and a DDS clock for the product to be tested. The sampling clocks are 80 MHz and 100 MHz respectively, and the DDS clocks are 240 MHz and 800 MHz, which are respectively referenced with the 80 MHz clock and the 100 MHz clock. The clock generating unit uses the 100 MHz clock as a reference, and adopts a frequency multiplication and division method to generate 800 MHz, 80 MHz and 240 MHz clock signals respectively, and then passes through filtering, amplification, and buffer circuits to complete the conditioning of the amplitude and spectrum of the clock signal.

[0011] Furthermore, the communication interface test unit is used to test the function and transmission correctness of the telemetry interface, flight control interface, wave control interface, frequency synthesis interface and USB interface of the test product according to their respective communication protocols, including ARINC-429 serial port communication function, UART (Universal Asynchronous Receiver / Transmitter) communication function and SPI synchronous communication function;

[0012] The test of ARINC-429 serial port communication function is that the rising edge from low level to high level during synchronous transmission, the interface starts to work, the transmission level format is bipolar three-state return-to-zero code, the word interval is 4, the transmission rate is 100kbps±5%, and 32 words are received in one K2 cycle. The test process is that the measurement and control unit controls the 429 board to send and receive, and controls the switch matrix to switch, completing the sending and receiving of multiple product sequence data;

[0013] The test process of UART communication function and SPI (Serial Peripheral Interface) synchronous communication function is that the measurement and control unit controls the digital communication test board to send and receive, and controls the switch matrix to switch, so as to complete the function detection of multiple products to be tested.

[0014] Furthermore, the high-speed AD test unit is used to test the performance of the A / D sampling circuit of the product to be tested, including the amplitude and phase consistency of the AD channels, the isolation between channels, and the dynamic range of a single signal;

[0015] During the test, the signal source provides 4 intermediate frequency signals with the same amplitude and phase, 4 of which are sent to the 4 AD high-speed sampling channels of the product to be tested. The product to be tested collects, processes and calculates the signals to obtain the amplitude and phase consistency, isolation between channels, and the spurious-free dynamic range parameters of the signals. These signals are sent back to the measurement and control unit through the flight control communication interface for management and display, and are switched through the time-sharing measurement matrix interface.

[0016] The test index of channel amplitude and phase consistency is measured and calibrated by the processor inside the product to be tested. At the same time, it is required that the phase and amplitude consistency of the 4-way signal entering the AD channel meet the index requirements of the product to be tested. The isolation measurement between channels requires that the isolation of the 4-way input signal of the AD channel is greater than 70 dB when the switch is closed or open.

[0017] Furthermore, the DDS waveform test unit is used to test the two-way radar transmission intermediate frequency signals generated by the product to be tested, and the test signal parameter waveform forms are sine wave, single frequency pulse train, linear frequency modulation and phase encoding;

[0018] During the test process, the spectrum analyzer automatically measures the frequency, amplitude, non-harmonic spurious and second harmonic of the DDS signal of the product to be tested. The measurement and control unit controls the product to be tested, the spectrum analyzer and the switch switching equipment to coordinate the equipment and the product to be tested. The measurement data of the spectrum analyzer is read out and sent back to the test device for management and display through the communication interface of the spectrum analyzer. The linear frequency modulation, nonlinear frequency modulation and phase encoding signal parameters generated by DDS are measured and sent to the AD channel of the product to be tested for sampling, demodulation and calculation processing to obtain the pulse width and period parameters of the pulse modulation signal, which are then sent back to the measurement and control unit for management and display.

[0019] Furthermore, the testing process specifically includes:

[0020] An 8x1 RF switch is used to simultaneously connect 8 products to be tested, measure 4 products to be tested at the same time, and switch the products to be tested one by one for testing. Through 8 2x1 switches, the test of products with 2-channel DDS output is completed.

[0021] Furthermore, the strobe pulse test unit is used to test the synchronization pulse parameters and mutual delay relationship generated by the product to be tested. During the test process, the 4-channel oscilloscope completes the measurement of the amplitude, frequency, pulse width and delay parameters of the strobe pulse. The measurement and control unit controls the product to be tested, the oscilloscope, and the switch switching device to complete the coordination work between the device and the product to be tested, reads the measurement data of the oscilloscope, and sends it back to the measurement and control unit through the communication interface of the oscilloscope for management;

[0022] Use a 4-channel oscilloscope to measure the output pulse signal of the product to be tested. One channel of the 4-channel oscilloscope is used as the input of the reference pulse, one channel is used as the measurement signal of the double-ended to single-ended conversion of the differential signal, and the other two channels are used as differential signal measurements to measure the level amplitude of the differential signal.

[0023] Furthermore, the bit instruction test unit tests the bit instruction output level index of the product to be tested, and only determines the level of the output level during measurement.

[0024] The beneficial effects of the present invention are:

[0025] The signal processor test device provided by the present invention comprises a measurement and control unit, a clock generating unit, a communication interface test unit, a high-speed AD test unit, a DDS waveform test unit, a strobe pulse test unit, a bit instruction test unit and an interface unit. The communication interface test unit, the high-speed AD test unit, the DDS waveform test unit, the strobe pulse test unit and the bit instruction test unit are connected between the measurement and control unit and the interface unit, the clock generating unit is connected to the interface unit, and the interface unit is connected to a product to be tested. Through the synergistic effect of each unit, a comprehensive test of the product is achieved, thereby improving the accuracy and efficiency of the comprehensive test. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a structural block diagram of a signal processor testing device provided by an embodiment of the present invention;

[0027] Figure 2 It is a flow chart of ARINC-429 serial port communication function test provided by an embodiment of the present invention;

[0028] Figure 3 It is a principle block diagram of a UART / SPI communication interface switch provided by an embodiment of the present invention;

[0029] Figure 4 is a principle block diagram of an intermediate frequency input switch provided by an embodiment of the present invention;

[0030] Figure 5 is a principle block diagram of a DDS signal test switch provided by an embodiment of the present invention;

[0031] Figure 6 The present invention provides a DDS strobe switch principle block diagram. DETAILED DESCRIPTION

[0032] To make the purpose, technical solution and advantages of the embodiments of the present invention more clear, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention.

[0033] The present invention provides a signal processor testing device, such as Figure 1 As shown, it includes a measurement and control unit, a clock generating unit, a communication interface test unit, a high-speed AD test unit, a DDS waveform test unit, a strobe pulse test unit, a bit instruction test unit, an interface unit, a power supply unit and a burning unit. The communication interface test unit, the high-speed AD test unit, the DDS waveform test unit, the strobe pulse test unit and the bit instruction test unit are connected between the measurement and control unit and the interface unit, the clock generating unit is connected to the interface unit, the interface unit is connected to the product to be tested, and the power supply unit is respectively connected to the measurement and control unit and the interface unit.

[0034] The main function of the measurement and control unit is to receive MES tasks, control the test software and test instruments to automatically test the product with one click, complete the collection and upload of test data, and be able to burn and debug the DSP / FPGA software of the product.

[0035] The clock generation unit can provide the required clock signals for four products at the same time, such as sampling clock, DDS clock, etc. The sampling clock is 80MHz and 100MHz respectively, and the DDS clock is 240MHz and 800MHz, which are respectively correlated with the 80MHz clock and 100MHz clock.

[0036] The unit uses the 100MHz clock as the reference, and adopts the frequency multiplication and division method to generate 800MHz, 80MHz and 240MHz clock signals respectively. After filtering, amplification, 1×4 buffer circuit, etc., the amplitude and spectrum of the clock signal are conditioned to meet the needs of simultaneous measurement of 4 products.

[0037] The communication interface test unit can test the function and transmission correctness of the product's telemetry interface, flight control interface, wave control interface, frequency synthesis interface, USB interface, etc. according to their respective communication protocols, including ARINC-429 serial port communication function, UART communication function, and SPI synchronous communication function.

[0038] The test process of ARINC-429 serial port communication function is as follows Figure 2 As shown, when synchronous transmission is performed, the interface starts to work at the rising edge of the K2 signal from low level to high level. The transmission level format is bipolar three-state return-to-zero code, the word interval is 4, the transmission rate is 100kbps±5%, and 32 words can be received in one K2 cycle. The test process is that the measurement and control unit controls the 429 communication board to send and receive, and controls the switch matrix to switch, completing the sending and receiving of the sequential data of 4 products. The 429 communication board and the measurement and control unit both contain PCIe (Peripheral Component Interconnect Express, a high-speed serial computer expansion bus standard) interface.

[0039] UART communication interface test uses asynchronous serial communication, and the communication protocol is 1 bit start bit, 1 bit stop bit, and 8 bits data bit. There are five groups of channels for differential transmission, and the 3-way transmission rate is 10Mbps, 4Mbps, and 5Mbps respectively, and the 2-way receiving rate is 4Mbps and 5Mbps respectively.

[0040] SPI synchronous communication interface test uses SPI synchronous communication, and the communication protocol is SPI synchronous serial communication protocol. There are two groups of channels for differential transmission, and the transmission rate is 20Mbps.

[0041] The test process of UART communication interface test and SPI synchronous communication interface test is that the measurement and control unit controls the digital communication test board to send and receive, and controls the switch matrix to switch, completing the functional test of 8 products. Figure 3 shown.

[0042] The high-speed AD test unit is mainly used to test the performance of the product's A / D sampling circuit, including AD channel amplitude and phase consistency, channel-to-channel isolation, single signal dynamic range, etc.

[0043] The test process is that the signal source provides 4 intermediate frequency signals with the same amplitude and phase. The intermediate frequency input switch principle is as follows: Figure 4 As shown, 4 of them are sent to the 4 AD high-speed sampling channels of the product. The product collects, processes and calculates the signals to obtain the amplitude and phase consistency, isolation between channels, and the spurious-free dynamic range parameters of the signals, which are sent back to the measurement and control unit through the flight control communication interface for management and display. Through the time-sharing measurement matrix interface (high-speed A / D measurement) switching, 8 products are measured in time.

[0044] The test index of channel amplitude and phase consistency is mainly measured and calibrated by the processor inside the product; at the same time, the phase and amplitude consistency of the 4-way signal entering the AD channel must meet the product index requirements. The isolation measurement between channels requires that the isolation of the 4-way input signal of the AD channel when the switch is closed / open must be greater than 70 dB to meet the requirements of the isolation measurement between AD channels. When the switch is open, the 50Ω load matching at the input end of the product must be considered.

[0045] The main function of the 2-to-1 switch is to complete the self-closed loop test of the product, that is, the measurement of the parameters of the pulse modulation signal (such as pulse, linear frequency modulation, nonlinear frequency modulation, phase encoding, etc.) generated by DDS.

[0046] The DDS waveform test unit mainly tests the two-way radar transmission intermediate frequency signals generated by the product. The waveform of the tested signal parameters is in the form of sine wave, single-frequency pulse train, linear frequency modulation, phase encoding, etc. Figure 5 shown.

[0047] The test process is that the spectrum analyzer measures the frequency, amplitude, non-harmonic spurious and second harmonic of the DDS signal automatically measured by the product, and the measurement and control unit controls the product, spectrum analyzer and switch switching equipment to complete the coordination of system equipment and products; the measurement data of the spectrum analyzer is read out and sent back to the test system for management and display through the communication interface of the spectrum analyzer. The linear frequency modulation, nonlinear frequency modulation, phase encoding and other signal parameters (such as pulse width, period, etc.) generated by DDS are measured and sent to the AD channel of the product for sampling, demodulation (compression), calculation and other processing, and then the pulse width, period and other parameters of the pulse modulation signal are sent back to the measurement and control unit through the flight control interface for management and display.

[0048] Use a spectrum analyzer to measure the spectrum purity indicators of the product's DDS signal output (frequency, amplitude, non-harmonic spurious, and second harmonic measurement); use an 8x1 RF switch to connect 8 products at the same time, measure 4 products at the same time, and switch the products one by one for testing. 8 2x1 switches can complete the test of products with 2-way DDS output.

[0049] Utilizing the sampling, demodulation (compression), calculation and other functions of the device's AD channel, the DDS modulated signal (such as pulse, linear frequency modulation, nonlinear frequency modulation) generated by it is sent to the product's AD receiving channel through 2x1 switch control for self-closed loop testing, and then transmitted back to the measurement and control unit for management and display through the 429 communication interface.

[0050] The strobe pulse test unit mainly tests the synchronization pulse parameters and mutual delay relationship generated by the product.

[0051] The test process is to use a 4-channel oscilloscope to measure the amplitude, frequency, pulse width, delay and other parameters of the strobe pulse. The measurement and control unit controls the product, oscilloscope, and switch switching equipment to complete the coordination of system equipment and products; read the measurement data of the oscilloscope and send it back to the measurement and control unit through the oscilloscope's communication interface for management.

[0052] Use a 4-channel oscilloscope to measure the output pulse signal of the product. Since the signal is an LVDS signal (differential signal), a pair of differential signals are measured simultaneously during measurement, that is, the oscilloscope must be at least a 2-channel oscilloscope. Using a 4-channel oscilloscope in this device can improve test efficiency. One channel of the oscilloscope is used as the input of the reference pulse, one is used as the measurement signal of the double-ended to single-ended conversion of the LVDS signal (differential signal) (mainly to measure delay and pulse width), and the other two are used as LVDS signals (differential signals) to measure the level amplitude of the differential signal. This device can simultaneously detect indicators such as differential signal amplitude, phase delay, and frequency. The principle of DDS selection pulse switching is as follows: Figure 6 shown.

[0053] The bit instruction test unit mainly tests the bit instruction output level indicators (including: H / L level) of the product. Since the signal is a TTL signal, only the level (H / L level) is judged during measurement.

[0054] The test process is that the digital communication control test board provides 16-channel bit command signals for the product, and the equipment simultaneously measures the 16-channel bit command output level indicators of 4 products. The communication interface switch principle block diagram is consistent with the UART / SPI communication interface test.

[0055] The power supply unit can supply power to 4 sets of products at the same time, and can connect 8 sets of products at the same time. It can also control the on / off, voltage / current of the programmable power supply, and monitor the voltage / current value of each line.

[0056] A standard 19-inch 35U cabinet is used. The equipment is required to have a 220V external power supply and a total load power of no less than 500W.

[0057] The test system of the present invention includes three parts:

[0058] Test controller: PXI industrial computer + system software + application software;

[0059] Automatic test system: function and equipment switching switch + TPS test software, installed inside the cabinet;

[0060] Test instruments: 4-channel oscilloscope, low-noise signal source, spectrum analyzer, programmable power supply, clock generator.

[0061] The instruments include: spectrum analyzer, oscilloscope, signal input / output interface of signal source, 3 programmable power supplies, 19-inch display, mouse / keyboard; industrial computer, switch, clock generator, time-sharing switch matrix circuit module, all installed inside the cabinet.

[0062] The above is only a preferred embodiment of the present invention. It should be understood that the present invention is not limited to the form disclosed herein, and should not be regarded as excluding other embodiments, but can be used in various other combinations, modifications and environments, and can be modified within the scope of the concept described herein through the above teachings or the technology or knowledge of the relevant field. The changes and modifications made by those skilled in the art shall not deviate from the spirit and scope of the present invention, and shall be within the scope of protection of the claims attached to the present invention.

Claims

1. A signal processor testing device, characterized in that: It includes a measurement and control unit, a clock generating unit, a communication interface test unit, a high-speed AD test unit, a DDS waveform test unit, a strobe pulse test unit, a bit instruction test unit and an interface unit, wherein the communication interface test unit, the high-speed AD test unit, the DDS waveform test unit, the strobe pulse test unit and the bit instruction test unit are connected between the measurement and control unit and the interface unit, the clock generating unit is connected to the interface unit, and the interface unit is connected to the product to be tested; The communication interface test unit is used to test the telemetry interface, flight control interface, wave control interface, frequency synthesis interface and USB interface of the test product for function and transmission correctness according to their respective communication protocols, including ARINC-429 serial port communication function, UART communication function and SPI synchronous communication function; The test of ARINC-429 serial port communication function is that the rising edge from low level to high level during synchronous transmission, the interface starts to work, the transmission level format is bipolar three-state return-to-zero code, the word interval is 4, the transmission rate is 100kbps±5%, and 32 words are received in one cycle. The test process is that the measurement and control unit controls the 429 board to send and receive, and controls the switch matrix to switch, completing the sending and receiving of multiple product sequence data; The test process of UART communication function and SPI synchronous communication function is that the measurement and control unit controls the digital communication test board to send and receive, and controls the switch matrix to switch, completing the function detection of multiple products to be tested; The high-speed AD test unit is used to test the A / D sampling circuit performance of the product to be tested, including the AD channel amplitude and phase consistency, inter-channel isolation and single signal dynamic range; During the test, the signal source provides 4 intermediate frequency signals with the same amplitude and phase, 4 of which are sent to the 4 AD high-speed sampling channels of the product to be tested. The product to be tested collects, processes and calculates the signals to obtain the amplitude and phase consistency, isolation between channels, and the spurious-free dynamic range parameters of the signals. These signals are sent back to the measurement and control unit through the flight control communication interface for management and display, and are switched through the time-sharing measurement matrix interface. The test index of channel amplitude and phase consistency is measured and calibrated by the processor inside the product to be tested. At the same time, it is required that the phase and amplitude consistency of the 4-way signal entering the AD channel meet the index requirements of the product to be tested. The isolation measurement between channels requires that the isolation of the 4-way input signal of the AD channel is greater than 70 dB when the switch is closed or open; The DDS waveform test unit is used to test the two-way radar transmission intermediate frequency signals generated by the product to be tested, and the test signal parameter waveform forms are sine wave, single frequency pulse train, linear frequency modulation and phase encoding; During the test, the spectrum analyzer automatically measures the frequency, amplitude, non-harmonic spurious and second harmonic of the DDS signal of the product to be tested. The measurement and control unit controls the product to be tested, the spectrum analyzer and the switch device to coordinate the equipment and the product to be tested. The measurement data of the spectrum analyzer is read out and sent back to the test device for management and display through the communication interface of the spectrum analyzer. The linear frequency modulation, nonlinear frequency modulation and phase encoding signal parameters generated by DDS are measured and sent to the AD channel of the product to be tested for sampling, demodulation and calculation processing to obtain the pulse width and period parameters of the pulse modulation signal, which are then sent back to the measurement and control unit for management and display. The strobe pulse test unit is used to test the synchronization pulse parameters and mutual delay relationship generated by the product to be tested. During the test process, the 4-channel oscilloscope completes the measurement of the amplitude, frequency, pulse width and delay parameters of the strobe pulse. The measurement and control unit controls the product to be tested, the oscilloscope, and the switch switching device to complete the coordination work between the device and the product to be tested, reads the measurement data of the oscilloscope, and sends it back to the measurement and control unit through the communication interface of the oscilloscope for management; Use a 4-channel oscilloscope to measure the output pulse signal of the product to be tested. One channel of the 4-channel oscilloscope is used as the input of the reference pulse, one channel is used as the measurement signal of the double-ended to single-ended conversion of the differential signal, and the other two channels are used as differential signal measurements to measure the level amplitude of the differential signal. The bit instruction test unit tests the bit instruction output level index of the product to be tested, and only determines the level of the output level during measurement.

2. The signal processor testing device according to claim 1, characterized in that: The measurement and control unit is used to receive MES tasks, control the test software and test instruments to test the product to be tested, complete the collection and upload of test data, and burn and debug the DSP or FPGA software of the product to be tested.

3. The signal processor testing device according to claim 1, characterized in that: The clock generating unit provides a sampling clock and a DDS clock for the product to be tested. The sampling clocks are 80MHz and 100MHz respectively, and the DDS clocks are 240MHz and 800MHz, which are respectively referenced with the 80MHz clock and the 100MHz clock. The clock generating unit uses the 100MHz clock as a reference, and adopts a frequency multiplication and division method to generate 800MHz, 80MHz and 240MHz clock signals respectively. After filtering, amplification, and buffering circuits, the amplitude and spectrum of the clock signal are conditioned.

4. The signal processor testing device according to claim 1, characterized in that: The testing process specifically includes: An 8x1 RF switch is used to simultaneously connect 8 products to be tested, measure 4 products to be tested at the same time, and switch the products to be tested one by one for testing. Through 8 2x1 switches, the test of products with 2-channel DDS output is completed.

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