A aging test socket cleaning device

Abstract

The present application discloses an aging test socket cleaning device, which belongs to the field of probe cleaning technology. It mainly includes a conveyor belt; a cleaning mechanism, the cleaning mechanism has a cleaning seat for cleaning metal probes and a cleaning plate for supporting and placing the cleaning seat; the cleaning seat has a cleaning tank, the inner bottom end of the cleaning tank is provided with a first sponge, and the inner wall side of the cleaning tank is provided with a metal sheet; a moving unit The moving unit has two groups of clamps for clamping the packaging test board, and a second cylinder that drives the two groups of clamps to approach each other, and a first cylinder that pushes the packaging test board for cleaning; a drying mechanism, which is installed on the cleaning mechanism; and multiple groups of wiping units, which are installed on a sliding frame. The aging test socket cleaning device of the present application can move the clamped packaging test board to a specified position through the moving unit, and then the oxides on the metal probes of the packaging test board can be cleaned through the cleaning mechanism.

Description

Technical Field

[0001] The present application relates to the technical field of probe cleaning, and in particular to an aging test socket cleaning device. Background Art

[0002] In chip testing, the probe is usually installed on a test fixture (also called a test socket). The test socket is a key component that connects the chip and the test equipment during chip testing. The tip of the probe will contact the pins or test solder joints of the chip (solder balls). It is used in conjunction with automatic test equipment (ATE). ATE can send various stimulus signals and transmit them to the chip through the probe, while receiving feedback signals from the chip, so as to test the functions and performance parameters of the chip, such as whether the logical functions of the chip are correct, whether the operating speed meets the standards, and many other key indicators;

[0003] Among them, the package test socket is the core component of the package test board, and its main function is to provide reliable physical connection and electrical contact during the chip testing process. These sockets have a precise contact structure, usually composed of multiple tiny metal probes or springs, which can accurately dock with the pins or solder balls of the chip to ensure the stability and accuracy of signal transmission;

[0004] However, the electrical contact between the probe and the solder ball is used to test the relevant electrical properties of the semiconductor component and evaluate whether its function is normal. Since the solder ball on the bottom of the chip to be tested is made of metal material, during repeated testing, the metal oxide and other organic materials on the solder ball will accumulate on the probe tip after the probe tip repeatedly contacts the solder ball. When these impurities accumulate to a certain amount, they need to be cleaned in time, otherwise they will affect the characteristics of the probe tip, making the test results inaccurate. Even when the deposition is serious, the test probe on the entire test socket needs to be replaced. Therefore, it is necessary to provide an aging test socket cleaning device to solve the above problems.

[0005] It should be noted that the above information disclosed in this background technology section is only for understanding the background technology of the present application concept, and therefore, it may contain information that does not constitute the prior art. Summary of the invention

[0006] Based on the above problems existing in the prior art, the problem to be solved by the present application is: to provide an aging test socket cleaning device, which can clean the metal probe with a cleaning liquid while avoiding corrosion to the metal probe caused by the long-term residual cleaning liquid.

[0007] The technical solution adopted by the present application to solve its technical problems is: an aging test socket cleaning device, including a conveyor belt, the conveyor belt has a track; a cleaning mechanism, the cleaning mechanism is installed at the lower end of the conveyor belt, the cleaning mechanism has a cleaning seat for cleaning the metal probe and a cleaning plate for supporting and placing the cleaning seat; the cleaning seat has a cleaning groove, the inner bottom end of the cleaning groove is provided with a first sponge, and the inner wall side of the cleaning groove is provided with a metal sheet; a moving unit, the moving unit is installed on the cleaning mechanism, the moving unit has two groups of clamping plates for clamping the package test board, and a second cylinder driving the two groups of clamping plates to approach each other, and a first cylinder pushing the package test board for cleaning; a drying mechanism, the drying mechanism is installed on the cleaning mechanism, the drying mechanism includes: a support frame, the support frame is installed on the cleaning mechanism, the support frame has a boss, and the boss is provided with a mounting hole; a side frame, the side frame is installed on the side of the support frame, and the side of the side frame A third air cylinder is installed, and a sliding frame is installed at the telescopic end of the third air cylinder; multiple groups of wiping units are installed on the sliding frame, and the wiping units include: a fixed tube, which is installed on the sliding frame, the fixed tube has a through inner cavity, and an air nozzle connected to the inner cavity is axially arranged on the outer wall of the fixed tube, one end of the fixed tube is closed, and the other end is connected to an external air supply device; a sleeve, which is rotatably sleeved on the fixed tube, and the sleeve has multiple groups of through holes along the axial direction, the air nozzle is located inside the sleeve and corresponds to the through holes, and multiple groups of second sponges are fixedly arranged at the position where the outer ring of the sleeve is different from the through holes; a control unit, which is installed on the cleaning mechanism, and the control unit has a control board; wherein: the conveyor belt is suitable for conveying the packaging test board, the cleaning mechanism is suitable for cleaning the oxide on the metal probe of the packaging test board, and the drying mechanism is suitable for wiping and drying the cleaned metal probe.

[0008] Furthermore, a cleaning platform is arranged at the lower end of the conveyor belt, the cleaning platform has a top plate, the moving unit comprises a plurality of groups of through rods movably penetrating the top plate, one end of the plurality of groups of through rods is connected to a mounting plate, a first spring is sleeved on the through rod, one end of the first spring is connected to the upper surface of the mounting plate, and the other end of the first spring is connected to the bottom surface of the top plate;

[0009] A motor is installed on one side of the mounting plate close to the cleaning plate, a lead screw is installed on the output end of the motor, a slide is threadedly connected to the lead screw, a slide is transmission-connected to the lead screw, a slideway is installed on the mounting plate, the slide is slidably connected to the slideway, and side panels are installed on both sides of the slideway.

[0010] Furthermore, slide rails are installed on both sides of the side frame and the boss, a slider adapted to be used with the slide rails is installed on the bottom surface of the slide frame, and the wiping unit includes a support installed on the slide frame.

[0011] Furthermore, a rack is installed on one side of the control panel, and the rack has a smooth section at both ends, and the rack has meshing teeth at the center position. A gear is sleeved on the end of the sleeve away from the support, and the smooth section on the upper end of the rack is defined as a first smooth area, and the smooth section on the lower end of the rack is defined as a second smooth area.

[0012] Furthermore, the control panel has a first slide groove opened vertically, a control rod is hingedly installed on the side frame, the control rod has a sliding ball, the sliding ball is in the first slide groove in a default state, the sliding ball is made of elastic material, and a first switch is arranged in the first slide groove.

[0013] Furthermore, a second chute is connected to the first chute, and a bottom position of the second chute is lower than a bottom position of the first chute;

[0014] A third slide groove is connected to the second slide groove, the bottom position of the third slide groove is lower than the bottom position of the second slide groove, a first step is provided between the third slide groove and the second slide groove, a first vertex is provided at the connection between the third slide groove and the second slide groove, and the first vertex is located in the third slide groove.

[0015] Furthermore, a fourth slide groove is connected to the third slide groove, the bottom position of the fourth slide groove is lower than the bottom position of the third slide groove, a second step is provided between the fourth slide groove and the third slide groove, and a stationary point for the sliding ball to stay at the connection between the third slide groove and the fourth slide groove, and the stationary point is located in the fourth slide groove.

[0016] Furthermore, a fifth slide groove is connected to the fourth slide groove, the bottom height of the fifth slide groove is lower than the bottom height of the fourth slide groove, a third step is provided between the fourth slide groove and the fifth slide groove, and a second vertex is provided at the connection point between the fourth slide groove and the fifth slide groove.

[0017] Furthermore, the fifth slide groove is connected to the first slide groove, and a transition slope is provided at the connection point between the fifth slide groove and the first slide groove. The transition slope gradually increases along the position close to the first slide groove, and the highest position of the transition slope is higher than the bottom position of the first slide groove and forms a fourth step.

[0018] Furthermore, a protrusion is slidably mounted on the rack, the protrusion has a conical surface, a waist groove matching the diameter of the protrusion is opened in the fifth slide groove, a second spring is connected between one end of the inner wall of the protrusion, and a second switch is provided on a surface of the protrusion close to the second vertex.

[0019] The beneficial effects of the present application are as follows: the present application provides an aging test socket cleaning device, which is suitable for conveying a packaging test board through a conveyor belt, can move the clamped packaging test board to a specified position through a moving unit, can clean the oxide on the metal probe of the packaging test board through a cleaning mechanism, and can wipe and dry the cleaned metal probe through a drying mechanism.

[0020] In addition to the above-described purposes, features and advantages, the present application also has other purposes, features and advantages. The present application will be further described in detail with reference to the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] The drawings constituting part of the present application are used to provide a further understanding of the present application. The exemplary embodiments and descriptions of the present application are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0022] Figure 1 It is an overall schematic diagram of an aging test socket cleaning device in this application;

[0023] Figure 2 for Figure 1 Working diagram of

[0024] Figure 3 for Figure 2 Schematic diagram of the local structure;

[0025] Figure 4 for Figure 3 Schematic diagram of the bottom structure;

[0026] Figure 5 for Figure 2 Schematic diagram of the local structure;

[0027] Figure 6 for Figure 4 A magnified schematic diagram of the middle A area;

[0028] Figure 7 for Figure 5 A magnified schematic diagram of the middle B area;

[0029] Figure 8 for Figure 5 Schematic diagram of the structure of the medium drying mechanism;

[0030] Fig. 9 for Figure 8Enlarged schematic diagram of the middle C area;

[0031] Fig.10 This is a schematic diagram of the packaging test board structure;

[0032] Among them, the reference numerals in the figure are:

[0033] 1. Conveying mechanism; 101. Conveyor belt; 102. Slip rail;

[0034] 2. Cleaning mechanism; 201. Cleaning table; 202. First cylinder; 203. Through rod; 204. First spring; 205. Mounting plate; 206. Motor; 207. Screw rod; 208. Slide plate; 209. Side plate; 210. Second cylinder; 211. Clamping plate; 212. Support seat; 213. Cleaning plate; 214. Cleaning seat; 215. Metal sheet; 216. First sponge;

[0035] 3. Drying mechanism; 301. Support frame; 302. Mounting hole; 303. Side frame; 304. Third cylinder; 305. Slide rail; 306. Sliding frame; 307. Sliding block; 308. Support; 309. Fixed pipe; 310. Air nozzle; 312. Sleeve; 313. Through hole; 314. Second sponge; 315. Control board; 316. First slide slot; 317. Second slide slot; 318. First vertex; 319. Third slide slot; 320. Stationary point; 321. Fourth slide slot; 322. Second vertex; 323. Fifth slide slot; 324. Rack; 325. Smooth section; 326. Protrusion; 327. Waist slot; 328. Second spring; 329. Control rod; 330. Gear;

[0036] 4. Package test board; 401. Package test socket; 402. Metal probe. DETAILED DESCRIPTION

[0037] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0038] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present application.

[0039] like Fig.10As shown, the package test socket 401 is the core component of the package test board 4, wherein a plurality of sets of package test sockets 401 are installed on the package test board 4, and their main function is to provide reliable physical connection and electrical contact during the chip test process. These sockets have a precise contact structure, usually composed of a plurality of tiny metal probes 402 or springs, which can accurately dock with the pins or solder balls of the chip;

[0040] During repeated testing, after the tip of the metal probe 402 repeatedly contacts the solder ball, metal oxides and other organic materials on the solder ball will accumulate on the tip of the probe. When these impurities accumulate to a certain amount, they need to be cleaned in time. The cleaning equipment in this application is mainly used to clean the metal probe 402.

[0041] Embodiment 1: This embodiment describes the structure and working principle of a burn-in test socket cleaning device, specifically:

[0042] like Figure 1-Figure 4 and Figure 6 As shown, the present application provides a burn-in test socket cleaning device, including a conveying mechanism 1, the conveying mechanism 1 includes a conveyor belt 101, the conveyor belt 101 is used to convey a package test board 4, and a track 102 is arranged on the conveyor belt 101, the track 102 is used to support the package test board 4;

[0043] A cleaning mechanism 2 is provided at the lower end of the conveying mechanism 1, and the cleaning mechanism 2 is used to clean the oxide attached to the tip of the metal probe 402, and the cleaning mechanism 2 includes a cleaning table 201 provided at the lower end of the conveying mechanism 1, the bottom of the cleaning table 201 is installed on the ground, and the cleaning table 201 has a top plate (not shown in the figure), and a support seat 212 is fixedly installed at the middle position of the cleaning table 201, a cleaning plate 213 is fixedly installed on the support seat 212, and a plurality of groups of cleaning seats 214 are fixedly installed on the cleaning plate 213, and the number of the cleaning seats 214 is the same as the number of the packaging test sockets 401 on the packaging test board 4;

[0044] The cleaning seat 214 has a cleaning tank (not shown in the figure), which is suitable for storing a cleaning solution, which can be an electrolyte solution, and a first sponge 216 is provided at the bottom of the cleaning tank, which is suitable for being soaked in the cleaning solution, and a metal sheet 215 is provided on the side of the inner wall of the cleaning tank, which is suitable for being connected to the negative electrode of an external DC power supply, and the metal probe 402 of the package test socket 401 is suitable for being connected to the positive electrode of the external DC power supply;

[0045] Thus, when the metal probe 402 is inserted into the cleaning tank, by turning on the DC power supply, the hydrogen ions in the cleaning solution will move toward the tip of the metal probe 402 under the action of the electric field, react chemically with the metal oxide, and dissolve it. The dissolved metal oxide ions will move toward the negative electrode under the action of the electric field, and will be adsorbed by the first sponge 216 during the movement.

[0046] Meanwhile, a moving unit is installed on the top plate, and the moving unit includes a plurality of groups of through rods 203 that are movable through the top plate, and a mounting plate 205 is fixedly connected to one end of the plurality of through rods 203, and a first spring 204 is sleeved on the through rods 203, one end of the first spring 204 is connected to the upper surface of the mounting plate 205, and the other end of the first spring 204 is connected to the bottom surface of the top plate, and the first spring 204 is suitable for supporting the mounting plate 205;

[0047] A motor 206 is installed on one side of the mounting plate 205 close to the cleaning plate 213, and a screw rod 207 is installed on the output end of the motor 206. The screw rod 207 is suitable for rotating with the motor 206. At the same time, a slide plate 208 is transmission-connected to the screw rod 207, and a slideway (not shown in the figure) is fixedly installed on the mounting plate 205. The slide plate 208 is slidably connected to the slideway, so that the slide plate 208 is suitable for linearly moving on the slideway driven by the screw rod 207 to adjust the position of the slide plate 208, so that the slide plate 208 is located directly above the packaging test board 4;

[0048] Side plates 209 are fixedly installed on both sides of the slide plate 208, and a second cylinder 210 is fixedly installed on one side of the side plate 209 close to the cleaning plate 213, and a clamping plate 211 is fixedly installed at the output end of the second cylinder 210. The two sets of clamping plates 211 are suitable for moving closer to or farther away from each other along with the output end of the second cylinder 210, so as to clamp the packaging test board 4;

[0049] Meanwhile, a first cylinder 202 is fixedly mounted on the top plate. When the telescopic end of the first cylinder 202 is extended, it is suitable for contacting the mounting plate 205, thereby pushing the mounting plate 205 to move in the vertical direction, so that the slide plate 208 on the mounting plate 205 is close to the packaging test board 4, and after the telescopic end of the first cylinder 202 is reset, the mounting plate 205 is restored to the initial position under the action of the first spring 204;

[0050] In summary: during cleaning, the packaging test board 4 is conveyed to one side of the cleaning board 213 by starting the conveyor belt 101, and the motor 206 is synchronously started to drive the screw 207 to rotate, so that the slide plate 208 moves to the top of the packaging test board 4, and then the first cylinder 202 is started to push the mounting plate 205 downward to drive the slide plate 208 to approach the packaging test board 4, and then the second cylinder 210 is started to drive the two sets of clamping plates 211 to clamp the packaging test board 4;

[0051] Then, the first cylinder 202 and the motor 206 are reset again in sequence to drive the clamped packaging test board 4 to move to the top of the cleaning board 213;

[0052] Finally, the first cylinder 202 is started again to drive the package test board 4 to move downward, so that the metal probe 402 of the package test socket 401 extends into the cleaning liquid in the cleaning tank, and then the metal sheet 215 is connected to the negative pole of the external DC power supply, and the metal probe 402 of the package test socket 401 is connected to the positive pole of the external DC power supply, and by turning on the DC power supply, the hydrogen ions in the cleaning liquid will move to the tip of the metal probe 402 under the action of the electric field, and react chemically with the metal oxide to dissolve it. The dissolved metal oxide ions will move to the negative pole under the action of the electric field, and will be adsorbed by the first sponge 216 during the movement process to clean the oxides copied on the metal probe 402, so that the metal probe 402 can make the detection signal more accurate in the electronic circuit detection.

[0053] Embodiment 2: In the above embodiment, the tip of the metal probe 402 is cleaned by a cleaning liquid. When the metal probe 402 is taken out of the cleaning liquid, the cleaning liquid remains on the metal probe 402. If the cleaning liquid stays for a long time, it may corrode the metal probe 402 or affect the accuracy of the subsequent test.

[0054] In order to solve the above problems, Figure 3 and Figure 5-Figure 9 As shown, a drying mechanism 3 is installed on the top plate, and the drying mechanism 3 is used to dry the cleaned metal probe 402, and the drying mechanism 3 includes a support frame 301 fixedly installed on the top plate close to the cleaning plate 213, and the support frame 301 has a boss (not marked in the figure), and a mounting hole 302 is opened on the boss, and the mounting hole 302 is located between the cleaning mechanism 2 and the mounting plate 205, and the mounting hole 302 is suitable for the packaging test board 4 to pass through as a whole, so as not to interfere with the packaging test board 4 entering the cleaning mechanism 2 for cleaning:

[0055] A side frame 303 is fixedly installed on the side of the support frame 301, and a third cylinder 304 is fixedly installed on the side of the side frame 303, a sliding frame 306 is fixedly installed on the telescopic end of the third cylinder 304, and slide rails 305 are installed on both sides of the side frame 303 and the boss, and a slider 307 adapted to be used with the slide rail 305 is installed on the bottom surface of the sliding frame 306, and the sliding frame 306 is suitable for linearly sliding on the slide rail 305 through the slider 307, so that when the third cylinder 304 is extended, the sliding frame 306 is suitable for being located directly above the mounting hole 302, and when the third cylinder 304 is retracted, the sliding frame 306 is located on one side of the mounting hole 302;

[0056] A plurality of wiping units are mounted on the sliding frame 306. The wiping units include a support 308 fixedly mounted on the sliding frame 306. A fixed tube 309 is fixedly mounted on the support 308. The fixed tube 309 has a through inner cavity (not shown in the figure), and an air nozzle 310 connected to the inner cavity is axially arranged on the outer wall of the fixed tube 309. It should be noted that one end of the fixed tube 309 is closed, and the other end is connected to an external air supply device, so that the external air supply device can pass the airflow to the air nozzle 310 through the inner cavity of the fixed tube 309, and spray it out through the air nozzle 310.

[0057] A sleeve 312 is rotatably sleeved on the fixed tube 309, and a plurality of through holes 313 are axially provided on the sleeve 312. It should be noted that the air nozzle 310 is located inside the sleeve 312 and corresponds to the through holes 313, so that the air nozzle 310 does not affect the rotation of the sleeve 312, and in the initial state, the air jet direction of the air nozzle 310 is vertically upward.

[0058] And at the position where the outer circle of the sleeve 312 and the through hole 313 differ by 90 degrees, multiple groups of second sponges 314 are fixedly arranged, and the second sponges 314 can be fixedly connected with the sleeve 312 by bonding. It should be noted that the second sponges 314 are in a horizontal position in the initial state, and can be rotated to a vertical position with the sleeve 312. When the second sponges 314 are in the vertical position, the air nozzle 310 can be blocked;

[0059] In summary, when the metal probe 402 is reset after cleaning, in order to remove the residual cleaning liquid on the metal probe 402, the third cylinder 304 is started to drive the sliding frame 306 to move so that the sliding frame 306 is located directly above the mounting hole 302;

[0060] At this time, the first cylinder 202 is started to push the mounting plate 205 downward again, and the metal probe 402 is driven to move downward. When the metal probe 402 is close to the wiping unit, the sleeve 312 can be driven to rotate first, so that the second sponge 314 is in a vertical position, until the metal probe 402 contacts the second sponge 314, so that the cleaning liquid on the metal probe 402 can be removed;

[0061] Then the first cylinder 202 is reset, and the mounting plate 205 drives the metal probe 402 to rise and reset under the action of the first spring 204. During the process of the metal probe 402 rising and resetting, the driving sleeve 312 is rotated and reset, so that the through hole 313 is aligned with the bottom of the metal probe 402.

[0062] At this time, the air supply device is started, so that the air flow is ejected from the through hole 313 via the air nozzle 310 to perform air drying on the metal probe 402 .

[0063] In the above process, how to drive the sleeve 312 to move to cooperate with the cleaning operation of the metal probe 402 is described in the following parts of this application, specifically:

[0064] like Figure 7-Figure 9 As shown, a control unit is installed at the bottom surface of the slide plate 208, and the number of the control units is the same as the number of the wiping units;

[0065] The control unit includes a control board 315 fixedly mounted on the bottom surface of the slide plate 208, and a rack 324 fixedly mounted on one side of the control board 315. The rack 324 has a smooth section 325 at both ends, and the rack 324 has meshing teeth at the center. At the same time, a gear 330 is fixedly sleeved on the end of the sleeve 312 away from the support 308. It should be noted that Fig. 9 For example, the smooth section 325 at the upper end of the rack 324 is defined as the first smooth area, and the smooth section 325 at the lower end of the rack 324 is defined as the second smooth area;

[0066] In the initial state, the gear 330 is located in the first smooth zone. When the first cylinder 202 is activated to push the mounting plate 205 downward, the control plate 315 moves downward synchronously until the gear 330 and the rack 324 are meshed with each other.

[0067] As the meshing teeth of the gear 330 and the rack 324 mesh, the sleeve 312 is driven to rotate counterclockwise, and the sleeve 312 completes a 90-degree rotation, and the second sponge 314 is in a vertical state. At the same time, the meshing teeth of the rack 324 pass over the gear 330. At this time, the metal probe 402 on the package test board 4 gradually contacts the second sponge 314, and the cleaning liquid remaining on the metal probe 402 is absorbed by the second sponge 314.

[0068] As the first cylinder 202 is reset again, the mounting plate 205 is reset under the action of the first spring 204, that is, the control plate 315 is gradually driven away from the wiping unit, thereby driving the rack 324 to move up synchronously, and then driving the gear 330 to rotate in the opposite direction, so that the through hole 313 on the sleeve 312 corresponds to the air jet of the air nozzle 310, and the air jet dries the metal probe 402 at this time.

[0069] In order to control the timing of the rotation of the sleeve 312, as Figure 7-Figure 9 As shown, a first slide groove 316 is vertically opened on the other side of the control panel 315, and a control rod 329 is hingedly installed on the side frame 303. The control rod 329 has a sliding ball (not shown in the figure). The sliding ball is in the first slide groove 316 in a default state, and the sliding ball is made of elastic material. A first switch (not shown in the figure) is arranged in the first slide groove 316, and the first switch is used to control the closing of the air nozzle 310;

[0070] A second chute 317 is connected to the first chute 316, and the bottom of the second chute 317 is lower than the bottom of the first chute 316, so that after the sliding ball slides from the first chute 316 into the second chute 317, it cannot return from the second chute 317 to the first chute 316;

[0071] A third chute 319 is connected to the second chute 317, the bottom of the third chute 319 is lower than the bottom of the second chute 317, and a first step (not shown in the figure) is provided between the third chute 319 and the second chute 317, so that after the sliding ball slides from the second chute 317 into the third chute 319, it cannot return from the third chute 319 to the second chute 317, and a first vertex 318 is provided at the connection between the third chute 319 and the second chute 317, and the first vertex 318 is located in the third chute 319;

[0072] A fourth chute 321 is connected to the third chute 319, the bottom of the fourth chute 321 is lower than the bottom of the third chute 319, and a second step (not shown in the figure) is provided between the fourth chute 321 and the third chute 319, so that after the sliding ball slides from the third chute 319 into the fourth chute 321, it cannot return from the fourth chute 321 to the third chute 319, and a stationary point 320 for the sliding ball to stay is provided at the connection between the third chute 319 and the fourth chute 321, and the stationary point 320 is located in the fourth chute 321;

[0073] Therefore, when the clamped package test board 4 is driven to move downward by starting the first cylinder 202, so that the clamped package test board 4 passes through the mounting hole 302, so that the metal probe 402 extends into the cleaning liquid, the sliding ball slides from the first sliding groove 316 into the second sliding groove 317 and abuts against the first vertex 318, and after the metal probe 402 and the metal sheet 215 are energized to clean the tip of the metal probe 402, the telescopic end of the first cylinder 202 is reset, so that the mounting plate 205 is reset under the action of the first spring 204, and the sliding ball stays at the stationary point 320 from the first vertex 318, and the cleaning liquid is attached to the metal probe 402;

[0074] Continue to refer Figure 7-Figure 9 A fifth slide groove 323 is connected to the fourth slide groove 321, and the bottom height of the fifth slide groove 323 is lower than the bottom height of the fourth slide groove 321. A third step (not shown in the figure) is provided between the fourth slide groove 321 and the fifth slide groove 323, so that after the sliding ball slides from the fourth slide groove 321 into the fifth slide groove 323, it cannot return from the fifth slide groove 323 to the fourth slide groove 321. A second vertex 322 is provided at the connection between the fourth slide groove 321 and the fifth slide groove 323;

[0075] At the same time, the fifth slide groove 323 is connected to the first slide groove 316, and a transition slope (not shown in the figure) is arranged at the connection between the fifth slide groove 323 and the first slide groove 316. The transition slope gradually increases along the position close to the first slide groove 316, and the highest position of the transition slope is higher than the groove bottom position of the first slide groove 316 and forms a fourth step. The fourth step is used to limit the initial movement of the sliding ball, so that the sliding ball can only move from the first slide groove 316 to the second slide groove 317 during the initial movement.

[0076] A protrusion 326 is slidably mounted on the rack 324, and the protrusion 326 has a conical surface. A waist groove 327 matching the diameter of the protrusion 326 is provided on the transition slope in the fifth slide groove 323, and a second spring 328 is connected between one end of the inner wall of the protrusion 326. The second spring 328 is used to support the protrusion 326 so that the protrusion 326 is abutted against a top end of the inner wall of the waist groove 327 in the initial state. A second switch (not shown in the figure) is provided on a surface of the protrusion 326 close to the second vertex 322, and the second switch is used to control the start of the air nozzle 310.

[0077] It should be noted that the protrusion 326 can be slidably mounted on the rack 324 by providing a guide rail on the rack 324 and a slide seat on the protrusion 326;

[0078] Therefore, after the two groups of clamping plates 211 clamp the package test board 4, the clamped package test board 4 is driven to move downward by starting the first cylinder 202, and the control plate 315 is driven to move downward synchronously, so that the clamped package test board 4 passes through the mounting hole 302, so that the metal probe 402 extends into the cleaning liquid;

[0079] At this time, the sliding ball slides from the first sliding groove 316 into the second sliding groove 317 and abuts against the first vertex 318. After the metal probe 402 and the metal sheet 215 are energized to clean the tip of the metal probe 402, the telescopic end of the first cylinder 202 is reset, so that the mounting plate 205 is reset under the action of the first spring 204. At this time, the sliding ball stays at the stationary point 320 from the first vertex 318, and the cleaning liquid is attached to the metal probe 402.

[0080] Then the third cylinder 304 is started again to drive the sliding frame 306 to move, so that the sliding frame 306 moves to the right below the slide plate 208. At this time, since the gear 330 is in the first smooth area, the first cylinder 202 is started again to push the mounting plate 205 to move downward. As the mounting plate 205 moves downward, the control plate 315 moves downward synchronously. At this time, the sliding ball synchronously slides from the stationary point 320 to the fourth sliding groove 321 and gradually moves to the second vertex 322.

[0081] At the same time, the gear 330 meshes with the meshing teeth of the rack 324, thereby driving the sleeve 312 to rotate counterclockwise, and as the sliding ball moves to the half position of the fourth sliding groove 321, the sleeve 312 completes a 90-degree rotation, and makes the second sponge 314 perpendicular to the fixed tube 309, and at the same time, the meshing teeth of the rack 324 pass over the gear 330, and as the sliding ball continues to move toward the second vertex 322, the metal probe 402 on the package test board 4 gradually contacts the second sponge 314, and the cleaning liquid remaining on the metal probe 402 is absorbed by the second sponge 314;

[0082] As the first cylinder 202 is reset again, the mounting plate 205 is reset under the action of the first spring 204, that is, the control plate 315 is driven to gradually move away from the wiping unit, thereby driving the rack 324 to move upward synchronously, and then driving the gear 330 to rotate in the opposite direction, that is, the through hole 313 on the sleeve 312 corresponds to the air jet of the air nozzle 310. It should be noted that when the sliding ball slides from the second vertex 322 to the fifth sliding groove 323 and contacts the side of the protrusion 326, the sleeve 312 completes a reverse 90-degree rotation and the meshing teeth of the rack 324 pass over the gear 330, and the sliding ball contacts the side of the protrusion 326, pressing the second switch, and the air jet dries the metal probe 402 at this time;

[0083] As the mounting plate 205 continues to move upward, since a transition slope is provided at the intersection of the fifth slide groove 323 and the first slide groove 316, the protrusion 326 slides in the waist groove 327 and slides on the rack 324 driven by the sliding ball. At this time, the second spring 328 is gradually squeezed, and when the protrusion 326 slides to a top of the inner wall of the waist groove 327 close to the first slide groove 316, the protrusion 326 gradually becomes level with the transition slope surface in the waist groove 327 close to one end of the first slide groove 316. At this time, the sliding ball passes over the protrusion 326 and is reset under the action of the second spring 328. At the same time, the sliding ball returns to the first slide groove 316 from the fifth slide groove 323 and presses the first switch, so that the air nozzle 310 is closed, thereby completing the cleaning and drying of the metal probe 402 to avoid the cleaning liquid from staying for a long time, which may cause corrosion to the metal probe 402 or affect the test accuracy during subsequent use.

[0084] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. An aging test socket cleaning device, characterized in that: include: A conveyor belt (101), the conveyor belt (101) having a track (102); A cleaning mechanism (2), the cleaning mechanism (2) being installed at the lower end of the conveyor belt (101), the cleaning mechanism (2) comprising a cleaning seat (214) for cleaning the metal probe and a cleaning plate (213) for supporting and placing the cleaning seat (214); The cleaning seat (214) has a cleaning groove, a first sponge (216) is arranged at the inner bottom end of the cleaning groove, and a metal sheet (215) is arranged on the inner wall side of the cleaning groove; A moving unit, the moving unit being mounted on the cleaning mechanism (2), the moving unit comprising two groups of clamping plates (211) for clamping the packaging test board, a second cylinder (210) for driving the two groups of clamping plates (211) to approach each other, and a first cylinder (202) for pushing the packaging test board for cleaning; A drying mechanism (3), the drying mechanism (3) being mounted on the cleaning mechanism (2), the drying mechanism (3) comprising: a support frame (301), the support frame (301) being mounted on the cleaning mechanism (2), the support frame (301) having a boss, and a mounting hole (302) being formed on the boss; A side frame (303), the side frame (303) being mounted on a side of the support frame (301), a third cylinder (304) being mounted on the side of the side frame (303), and a sliding frame (306) being mounted on the telescopic end of the third cylinder (304); A plurality of wiping units, the wiping units being mounted on the sliding frame (306), the wiping units comprising: a fixed tube (309), the fixed tube (309) being mounted on the sliding frame (306), the fixed tube (309) having a through inner cavity, an air nozzle (310) being axially arranged on the outer wall of the fixed tube (309) and communicating with the inner cavity, one end of the fixed tube (309) being closed, and the other end being connected to an external air supply device; A sleeve (312), the sleeve (312) being rotatably sleeved on the fixed tube (309), the sleeve (312) being provided with a plurality of through holes (313) along the axial direction, the air nozzle (310) being located inside the sleeve (312) and corresponding to the through holes (313), and a plurality of second sponges (314) being fixedly arranged at a position where the outer ring of the sleeve (312) is 90 degrees away from the through holes (313); A control unit, the control unit is mounted on the cleaning mechanism (2), the control unit having a control panel (315); Wherein: the conveyor belt (101) is suitable for conveying the packaging test board, the cleaning mechanism (2) is suitable for cleaning the oxide on the metal probe of the packaging test board, and the drying mechanism (3) is suitable for wiping and drying the cleaned metal probe; Slide rails (305) are installed on both sides of the side frame (303) and the boss, a slider (307) adapted for use with the slide rails (305) is installed on the bottom surface of the slide frame (306), and the wiping unit includes a support (308) installed on the slide frame (306); A rack (324) is installed on one side of the control plate (315), and both ends of the rack (324) have a smooth section (325). The rack (324) has meshing teeth at the center. The end of the sleeve (312) away from the support (308) is sleeved with a gear (330). The smooth section (325) at the upper end of the rack (324) is defined as a first smooth area, and the smooth section (325) at the lower end of the rack (324) is defined as a second smooth area. The control panel (315) has a first slide groove (316) vertically opened, a control rod (329) is hingedly installed on the side frame (303), the control rod (329) has a sliding ball, the sliding ball is in the first slide groove (316) in a default state, the sliding ball is made of elastic material, and a first switch is arranged in the first slide groove (316); a second slide groove (317) is connected to the first slide groove (316), and the bottom position of the second slide groove (317) is lower than the bottom position of the first slide groove (316); The second slide groove (317) is connected to a third slide groove (319), the bottom position of the third slide groove (319) is lower than the bottom position of the second slide groove (317), a first step is provided between the third slide groove (319) and the second slide groove (317), a first vertex (318) is provided at the connection between the third slide groove (319) and the second slide groove (317), and the first vertex (318) is located in the third slide groove (319); The third slide groove (319) is connected to a fourth slide groove (321), the bottom position of the fourth slide groove (321) is lower than the bottom position of the third slide groove (319), a second step is provided between the fourth slide groove (321) and the third slide groove (319), and a stationary point (320) for the sliding ball to stay at the connection point between the third slide groove (319) and the fourth slide groove (321), and the stationary point (320) is located in the fourth slide groove (321); The fourth slide groove (321) is connected to a fifth slide groove (323), the bottom height of the fifth slide groove (323) is lower than the bottom height of the fourth slide groove (321), a third step is provided between the fourth slide groove (321) and the fifth slide groove (323), and a second vertex (322) is provided at the connection between the fourth slide groove (321) and the fifth slide groove (323); The fifth slide groove (323) is connected to the first slide groove (316), and a transition slope is provided at the connection point between the fifth slide groove (323) and the first slide groove (316). The transition slope gradually increases along a position close to the first slide groove (316), and the highest position of the transition slope is higher than the bottom position of the first slide groove (316) to form a fourth step; A protrusion (326) is slidably mounted on the rack (324), the protrusion (326) having a conical surface, a waist groove (327) adapted to the diameter of the protrusion (326) is provided in the fifth slide groove (323), a second spring (328) is connected between one end of the inner wall of the protrusion (326), and a second switch is provided on a surface of the protrusion (326) close to the second vertex (322); The first cylinder (202) pushes the mounting plate (205) and the control plate (315) downward, and the sliding ball slides from the stationary point (320) to the fourth sliding groove (321) to the second vertex (322). During this period, the gear (330) and the rack (324) are meshed, driving the sleeve (312) to rotate 90 degrees counterclockwise, so that the second sponge (314) is vertically fixed to the fixed tube (309). After the teeth of the rack (324) pass over the gear (330), the metal probe (402) contacts the second sponge (314) to absorb The residual cleaning liquid, the first cylinder (202) is reset, the mounting plate (205) is reset by the spring, the rack (324) is driven to move upward, the gear (330) is reversed, so that the through hole (313) of the sleeve (312) corresponds to the air jet of the air nozzle (310), the sliding ball slides to the fifth sliding groove (323) and contacts the protrusion (326), the sleeve (312) is reversed by 90 degrees, the teeth of the rack (324) pass over the gear (330), the sliding ball presses the second switch, and the air nozzle (310) air-dries the metal probe (402); The mounting plate (205) continues to move upward, and the protrusion (326) slides in the waist groove (327) and slides on the rack (324) driven by the sliding ball. At this time, the second spring (328) is gradually squeezed, and when the protrusion (326) slides to the top of the inner wall of the waist groove (327) close to the first sliding groove (316), the protrusion (326) gradually becomes level with the transition slope surface in the waist groove (327) close to one end of the first sliding groove (316). At this time, the sliding ball passes over the protrusion (326) and is reset under the action of the second spring (328). At the same time, the sliding ball returns to the first sliding groove (316) from the fifth sliding groove (323) and presses the first switch, so that the air nozzle (310) is closed, thereby completing the cleaning and drying of the metal probe (402) to avoid the cleaning liquid from staying for a long time, which may cause corrosion to the metal probe (402) or affect the test accuracy during subsequent use.

2. The burn-in test socket cleaning device according to claim 1, characterized in that: A cleaning platform (201) is arranged at the lower end of the conveyor belt (101), the cleaning platform (201) having a top plate, the moving unit comprising a plurality of groups of through rods (203) movably penetrating the top plate, one end of each of the plurality of through rods (203) being connected to a mounting plate (205), a first spring (204) being sleeved on the through rod (203), one end of the first spring (204) being connected to the upper surface of the mounting plate (205), and the other end of the first spring (204) being connected to the bottom surface of the top plate; A motor (206) is installed on one side of the mounting plate (205) close to the cleaning plate (213); a screw rod (207) is installed on the output end of the motor (206); a slide plate (208) is threadedly connected to the screw rod (207); the slide plate (208) is transmission-connected to the screw rod (207); a slideway is installed on the mounting plate (205); the slide plate (208) is slidably connected to the slideway; and side plates (209) are installed on both sides of the slide plate (208).

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